Philips bc857m_series Datasheet

Page 1
DATA SH EET
DISCRETE SEMICONDUCTORS
BOTTOM VIEW
BC857M series
PNP general purpose transistors
Product data sheet Supersedes data of 2003 Jul 15
2004 Mar 10
Page 2
NXP Semiconductors Product data sheet
PNP general purpose transistors BC857M series

FEATURES

• Leadless ultra small plastic package mm × 0.6 mm × 0.5 mm)
(1
• Board space 1.3 × 0.9 mm
• Power dissipation comparable to SOT23.

APPLICATIONS

• General purpose small signal DC
• Low and medium frequency AC applications
• Mobile communications, digital (still) cameras, PDAs,
PCMCIA cards.

DESCRIPTION

PNP general purpose transistor in a SOT883 leadless ultra small plastic package. NPN complement: BC847M series.

MARKING

T YPE NUMBER MARKING CODE
BC857AM D1 BC857BM D2 BC857CM D3

QUICK REFERENCE DATA

SYMBOL PARAMETER MAX. UNIT
V I I
CEO C CM
collector-emitter voltage −45 V collector current (DC) −100 mA peak collector current −200 mA

PINNING

PIN DESCRIPTION
1 base 2 emitter 3 collector
handbook, halfpage
2
1
Bottom view
3
MAM469
3
1
2
Fig.1 Simplified outline (SOT883) and symbol.

ORDERING INFORMATION

PACKAGE
T YPE NUMBER
NAME DESCRIPTION VERSION
BC857AM − Leadless ultra small plastic package; 3 solder lands; bo dy
x 0.6 x 0.5 mm
BC857BM
1.0
BC857CM
SOT883
2004 Mar 10 2
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NXP Semiconductors Product data sheet
PNP general purpose transistors BC857M series

LIMITING VALUES

In accordance with the Absolute Maximum System (IEC 60134).
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V V V I I I P
T T T
CBO CEO
EBO C CM BM
tot
stg
j
amb
collector-base voltage open emitter − −50 V collector-emitter voltage open base − −45 V emitter-base voltage open collector − −5 V collector current (DC) − −100 mA peak collector current − −200 mA peak base current − −100 mA total power dissipation T
amb
≤ 25 °C note 1 − 250 mW note 2 − 430 mW
storage temperature −65 +150 °C junction temperature − 150 °C operating ambient temperature −65 +150 °C
Notes
1. Refer to SOT883 standard mounting conditions (footprint), FR4 with 60 μm copper strip line.
2. Device mounted on a FR4 printed-circuit board, sin gle- sid ed copper, mounting pad for collector 1 cm2.

THERMAL CHARACTERISTICS

SYMBOL PARAMETER CONDITIONS VALUE UNIT
R
th(j-a)
thermal resistance from junction to ambient in free air
note 1 500 K/W note 2 290 K/W
Notes
1. Refer to SOT883 standard mounting conditions (footprint), FR4 with 60 μm copper strip line.
2. Device mounted on a FR4 printed-circuit board, sin gle- sid ed copper, mounting pad for collector 1 cm2.
2004 Mar 10 3
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NXP Semiconductors Product data sheet
PNP general purpose transistors BC857M series

CHARACTERISTICS

T
= 25 °C unless otherwise specified.
amb
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
I
CBO
I
EBO
h
FE
V
BE
V
CEsat
C
c
f
T
F noise figure IC = −200 μA; VCE = −5 V;
collector-base cut-off curren t VCB = −30 V; IE = 0 − −15 nA
VCB = −30 V; IE = 0; Tj = 150 °C − −5 μA emitter-base cut-off current VEB = −5 V; IC = 0 − −100 nA DC current gain VCE = −5 V; IC = −2 mA
BC857AM 125 250 BC857BM 220 475 BC857CM 420 800
base-emitter voltage IC = −2 mA; VCE = −5 V −600 −750 mV
IC = −10 mA; VCE = −5 V − −820 mV collector-emitter saturation voltage IC = −10 mA; IB = −0.5 mA − −200 mV
IC = −100 mA; IB = −5 mA; note 1 − −400 mV collector capacitance IE = ie = 0; VCB = −10 V; f = 1 MHz − 2.5 pF transition frequency VCE = −5 V; IC = −10 mA;
= 100 MHz
f
100 − MHz
− 10 dB
R
= 2 kΩ; f = 1 kHz; B = 200 Hz
S
Note
1. Pulse test: tp ≤ 300 μs; δ ≤ 0.02.
2004 Mar 10 4
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NXP Semiconductors Product data sheet
PNP general purpose transistors BC857M series

GRAPHICAL INFORMATION BC857AM

500
handbook, halfpage
h
FE 400
300
200
100
0
−2
−10
VCE = −5 V. (1) T
= 150 °C.
amb
(2) T
= 25 °C.
amb
(3) T
= −55 °C.
amb
Fig.2 DC current gain; typical values.
−10
MLE188
−1200
handbook, halfpage
V
BE
MLE189
(mV)
−1000
(1)
(1)
−800
(2)
(2)
(3)
−1
−1
−10 −10
2
IC (mA)
−10
3
−600
−400
−200
−10−2−10
(3)
−1
−1
−10 −10
2
IC (mA)
−10
3
VCE = −5 V. (1) T
= −55 °C.
amb
(2) T
= 25 °C.
amb
(3) T
= 150 °C.
amb
Fig.3 Base-emitter voltage as a function of
collector current; typical values.
4
−10
handbook, halfpage
V
CEsat
MLE190
(mV)
3
−10
−10
−10
2
−10
(2)
−1
−1 −10
(1)
(3)
2
−10 IC (mA)
IC/IB = 20. (1) T
= 150 °C.
amb
(2) T
= 25 °C.
amb
= −55 °C.
(3) T
amb
Fig.4 Collector-emitter saturation voltage as a
function of collector current; typical values.
−10
−1200
handbook, halfpage
V
BEsat
MLE191
(mV)
−1000
(1)
−800
−600
(2)
(3)
−400
3
−200
−1
−1−10
−10 −10
2
IC (mA)
−10
3
IC/IB = 20. (1) T
= −55 °C.
amb
(2) T
= 25 °C.
amb
= 150 °C.
(3) T
amb
Fig.5 Base-emitter saturation voltage as a
function of collector current; typical values.
2004 Mar 10 5
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NXP Semiconductors Product data sheet
PNP general purpose transistors BC857M series

GRAPHICAL INFORMATION BC857BM

1000
handbook, halfpage
h
FE
800
600
400
200
0
−2
−10
VCE = −5 V. (1) T
= 150 °C.
amb
(2) T
= 25 °C.
amb
(3) T
= −55 °C.
amb
Fig.6 DC current gain; typical values.
−10
MLE192
−1200
handbook, halfpage
V
BE
MLE193
(mV)
−1000
(1)
−800
(1)
(2)
−600
(2)
(3)
−1
−1
−10 −10
2
IC (mA)
−10
3
−400
−200
−10−2−10
−1
(3)
−1
−10 −10
2
IC (mA)
−10
3
VCE = −5 V. (1) T
= −55 °C.
amb
(2) T
= 25 °C.
amb
(3) T
= 150 °C.
amb
Fig.7 Base-emitter voltage as a function of
collector current; typical values.
4
−10
handbook, halfpage
V
CEsat
MLE194
(mV)
3
−10
−10
−10
2
−10
(2)
−1
−1 −10
(1)
(3)
2
−10 IC (mA)
IC/IB = 20. (1) T
= 150 °C.
amb
(2) T
= 25 °C.
amb
= −55 °C.
(3) T
amb
Fig.8 Collector-emitter saturation voltage as a
function of collector current; typical values.
−10
−1200
handbook, halfpage
V
BEsat
MLE195
(mV)
−1000
(1)
−800
−600
(2)
(3)
−400
3
−200
−1
−1−10
−10 −10
2
IC (mA)
−10
3
IC/IB = 20. (1) T
= −55 °C.
amb
(2) T
= 25 °C.
amb
= 150 °C.
(3) T
amb
Fig.9 Base-emitter saturation voltage as a
function of collector current; typical values.
2004 Mar 10 6
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NXP Semiconductors Product data sheet
PNP general purpose transistors BC857M series

GRAPHICAL INFORMATION BC857CM

1000
handbook, halfpage
h
FE
800
600
400
200
0
−2
−10
VCE = −5 V. (1) T
= 150 °C.
amb
(2) T
= 25 °C.
amb
(3) T
= −55 °C.
amb
Fig.10 DC current gain; typical values.
−10
MLE196
(1)
−1200
handbook, halfpage
V
BE
(mV)
MLE197
−1000
(1)
−800
(2)
(2)
−600
(3)
(3)
−400
−200
−1
−1
−10 −10
2
IC (mA)
−10
3
−1
−1−10
−10 −10
2
IC (mA)
−10
3
VCE = −5 V. (1) T
= −55 °C.
amb
(2) T
= 25 °C.
amb
(3) T
= 150 °C.
amb
Fig.11 Base-emitter voltage as a function of
collector current; typical values.
4
−10
handbook, halfpage
V
CEsat
MLE198
(mV)
3
−10
−10
−10
2
−10
(2)
−1
−1 −10
(1)
(3)
2
−10 IC (mA)
IC/IB = 20. (1) T
= 150 °C.
amb
(2) T
= 25 °C.
amb
= −55 °C.
(3) T
amb
Fig.12 Collector-emitter saturation voltage as a
function of collector current; typical values.
−10
−1200
handbook, halfpage
V
BEsat
MLE199
(mV)
−1000
(1)
−800
−600
(2)
(3)
−400
−200
3
−1
−1−10
−10 −10
2
IC (mA)
−10
3
IC/IB = 20. (1) T
= −55 °C.
amb
(2) T
= 25 °C.
amb
= 150 °C.
(3) T
amb
Fig.13 Base-emitter saturation voltage as a
function of collector current; typical values.
2004 Mar 10 7
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NXP Semiconductors Product data sheet
L
3
PNP general purpose transistors BC857M series

PACKAGE OUTLINE

eadless ultra small plastic package; 3 solder lands; body 1.0 x 0.6 x 0.5 mm SOT88
L
2
b
e
1
e
1
E
L
1
3
b
1
A
A
1
D
0 0.5 1 mm
scale
DIMENSIONS (mm are the original dimensions)
A
(1)
UNIT
A
0.50
mm
0.46
Note
1. Including plating thickness
OUTLINE VERSION
SOT883 SC-101
max.
0.03
1
bb
0.20
0.12
IEC JEDEC JEITA
1
0.55
0.47
DE
0.62
0.55
eLL
1.02
0.35 0.65
0.95
REFERENCES
e
1
0.30
0.22
0.30
0.22
1
EUROPEAN
PROJECTION
ISSUE DATE
03-02-05 03-04-03
2004 Mar 10 8
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NXP Semiconductors Product data sheet
PNP general purpose transistors BC857M series

DATA SHEET STATUS

DOCUMENT
STATUS
Objective data sheet Development This document contains data from the objective specification for product
Preliminary data sheet Qualification This document contains data from the preliminary specification. Product data sheet Production This document contains the product specification.
Notes
1. Please consult the most recently issued document before initiating or comple ting a design.
2. The product status of device(s) desc ribed in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at
http://www.nxp.com.
URL
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accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information.
Right to make changes ⎯ NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof.
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Applications ⎯ Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modificati on .
(1)
PRODUCT STATUS
(2)
DEFINITION
development.
above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability.
Terms and conditions of sale ⎯ NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, including those pertaining to warranty, intellectual property rights infringement and limitation of liability, unless explicitly otherwise agreed to in writing by NXP Semiconductors. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail.
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Export control ⎯ This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from national authorities.
Quick reference data ⎯ The Quick reference data is an extract of the product data given in the Limiting values and Characteristics sections of this document, and as such is not complete, exhaustive or legally binding.
Limiting values ⎯ Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC the device. Limiting values are stress ratings only an d operation of the device at these or any other conditions
2004 Mar 10 9
60134) may cause permanent damage to
Page 10
NXP Semiconductors
Customer notification
This data sheet was changed to reflect the new company name NXP Semiconductors . No changes were made to the content, except for the legal definitions and disclaimers.
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Printed in The Netherlands R75/02/pp10 Date of release: 2004 Mar 10 Document order number: 9397 750 12839
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