DISCRETE SEMICONDUCTORS
DATA SHEET
handbook, 2 columns
M3D116
1N5059 to 1N5062
Controlled avalanche rectifiers
Product specification |
1996 Jun 19 |
Supersedes data of April 1992
File under Discrete Semiconductors, SC01
Philips Semiconductors |
Product specification |
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Controlled avalanche rectifiers |
1N5059 to 1N5062 |
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FEATURES
∙Glass passivated
∙High maximum operating temperature
∙Low leakage current
∙Excellent stability
∙Guaranteed avalanche energy absorption capability
∙Available in ammo-pack.
LIMITING VALUES
DESCRIPTION |
This package is hermetically sealed |
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Rugged glass package, using a high |
and fatigue free as coefficients of |
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expansion of all used parts are |
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temperature alloyed construction. |
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matched. |
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k |
a |
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MAM047 |
Fig.1 Simplified outline (SOD57) and symbol.
In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOL |
PARAMETER |
CONDITIONS |
MIN. |
MAX. |
UNIT |
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VRRM |
repetitive peak reverse voltage |
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1N5059 |
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− |
200 |
V |
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1N5060 |
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− |
400 |
V |
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1N5061 |
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− |
600 |
V |
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1N5062 |
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− |
800 |
V |
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VRWM |
crest working reverse voltage |
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1N5059 |
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− |
200 |
V |
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1N5060 |
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− |
400 |
V |
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1N5061 |
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− |
600 |
V |
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1N5062 |
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− |
800 |
V |
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VR |
continuous reverse voltage |
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1N5059 |
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− |
200 |
V |
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1N5060 |
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− |
400 |
V |
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1N5061 |
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− |
600 |
V |
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1N5062 |
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− |
800 |
V |
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IF(AV) |
average forward current |
Ttp = 45 °C; |
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2.0 |
A |
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lead length = 10 mm; |
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averaged over any 20 ms |
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period; see Figs 2 and 4 |
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Tamb = 80 °C; PCB mounting |
− |
0.8 |
A |
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(see Fig.9); averaged over any |
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20 ms period; see Figs 3 and 4 |
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IFSM |
non-repetitive peak forward current |
t = 10 ms half sinewave |
− |
50 |
A |
ERSM |
non-repetitive peak reverse avalanche |
L = 120 mH; Tj = Tj max prior to |
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20 |
mJ |
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energy |
surge; inductive load switched off |
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Tstg |
storage temperature |
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−65 |
+175 |
°C |
Tj |
junction temperature |
see Fig.5 |
−65 |
+175 |
°C |
1996 Jun 19 |
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Philips Semiconductors |
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Product specification |
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Controlled avalanche rectifiers |
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1N5059 to 1N5062 |
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ELECTRICAL CHARACTERISTICS |
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Tj = 25 °C; unless otherwise specified. |
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SYMBOL |
PARAMETER |
CONDITIONS |
MIN. |
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TYP. |
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MAX. |
UNIT |
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VF |
forward voltage |
IF = 1 A; Tj = Tj max; see Fig.6 |
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0.8 |
V |
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IF = 1 A; see Fig.6 |
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1.0 |
V |
V(BR)R |
reverse avalanche |
IR = 0.1 mA |
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breakdown voltage |
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1N5059 |
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225 |
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- |
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V |
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1N5060 |
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450 |
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- |
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- |
V |
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1N5061 |
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650 |
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- |
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- |
V |
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1N5062 |
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900 |
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- |
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V |
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IR |
reverse current |
VR = VRRMmax; see Fig.7 |
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1 |
mA |
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VR = VRRMmax; Tj = 165 °C; see Fig.7 |
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150 |
mA |
trr |
reverse recovery time |
when switched from IF = 0.5 A to IR = 1 A; |
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3 |
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ms |
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measured at IR = 0.25 A; see Fig.10 |
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Cd |
diode capacitance |
VR = 0 V; f = 1 MHz; see Fig.8 |
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50 |
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pF |
THERMAL CHARACTERISTICS
SYMBOL |
PARAMETER |
CONDITIONS |
VALUE |
UNIT |
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Rth j-tp |
thermal resistance from junction to tie-point |
lead length = 10 mm |
46 |
K/W |
Rth j-a |
thermal resistance from junction to ambient |
note 1 |
100 |
K/W |
Note
1.Device mounted on epoxy-glass printed-circuit board, 1.5 mm thick; thickness of copper ³40 mm, see Fig.9. For more information please refer to the “General Part of Handbook SC01”.
1996 Jun 19 |
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