Panasonic AN79N24, AN79N20, AN79N18, AN79N15, AN79N12 Datasheet

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AN79N00 Series
3-pin Negative Output Voltage Regulator (300mA Type)
Overview
The AN79N00 series is 3-pin fix ed neg ati ve output v olt­age regulators. Stabilized fix ed output volta ge is obtained from unstable DC input voltage without using an y exter­nal components. 12 types of output voltage are available ; –4V, –5V, –6V, –7V, –8V, –9V, –10V, –12V, –15V,
8.0
3.05
+0.5 – 0.1
Unit:mm
3.8
11.5max.15.0min.
Features
• No external components
• Output voltage : –4V, –5V, –6V, –7V, –8V, –9V, –10V, –12V, –15V, –18V, –20V, –24V
• Short-circuit current limiting built-in
• Thermal overload protection built-in
• Output transistor safe area compensation
Block Diagram
1.94
0.75±0.25
0.5±0.25
2.3
4.6
123
JEDEC : TO-126 (SSIP003-P-0000E)
1.44
3.5max.
0.5±0.1
1.76
1 : Common 2 : Input 3 : Output
Starter
Voltage Reference
Thermal Protection
+ Error Amp.
Current Limiter
R
R
R
Q
SC
1
2
1
1
3
Pass Tr.
2
Common
Output
Input
Absolute Maximum Ratings (Ta=25˚C)
Parameter Symbol Rating Unit
1
*
Input voltage
Power dissipation Operating ambient temperature Storage temperature
*
1 AN79N04, AN79N05, AN79N06, AN79N07, AN79N08, AN79N09, AN79N10, AN79N12, AN79N15, AN79N18
*
2 AN79N20, AN79N24
*
3 Follow the derating curve, When T
exceeds 150˚C, the internal circuit cuts off the output.
j
V
I
P
D
T
opr
T
stg
–35
2
*
–40
3
*
8
–20 to +80
–55 to +150
V
V W ˚C ˚C
Electrical Characteristics (Ta=25˚C)
AN79N04 (–4V Type)
·
Parameter Symbol Condition min typ max Output voltage Output voltage tolerance
Line regulation
Load regulation
Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage
Ripple rejection ratio Minimum input/output voltage difference
Output short circuit current Peak output current Output voltage temperature coefficient
V V
REG
REG
I
I
Bias (IN)
I
Bias (L)
V RR
V
DIF (min.)
I
O (Short)
I
O (Peak)
V
Bias
O
O
O
IN
L
no
/Ta
=25˚C
T
j
VI=–
6 to –25V, IO=5 to 200mA
=–6 to –25V, Tj=25˚C
V
I
=–7 to –17V, Tj=25˚C
V
I
=1 to 300mA, Tj=25˚C
I
O
=5 to 200mA, Tj=25˚C
I
O
=25˚C
T
j
=–7 to –25V, Tj=25˚C
V
I
=5 to 200mA, Tj=25˚C
I
O
f=10Hz to 100kHz
=–7 to –17V, IO=50mA,
V
I
f=120Hz
=200mA, Tj=25˚C
I
O
=–35V, Tj=25˚C
V
I
Tj=25˚C
=5mA
I
O
–3.84
–3.8
60
–4.16 V–4
–4.2
4
10
Note 1) The specified condition Tj=25˚C means that the test should be carried out with the test time so short (within 10ms) that the
drift in characteristic value due to the rise in chip junction temperature can be ignored.
Note 2) When not specified, VI=–9V, IO=100mA, CI=2µF, CO=1µF and Tj=0 to 125˚C
40 mV9 20 80 40
0.5
0.1
Unit
mV mV20 mV mA3
5
mA mA
µV100
mA10 mA500
mV/˚C– 0.4
V
dB
V1.1
Electrical Characteristics (Ta=25˚C)
AN79N05 (–5V Type)
·
Parameter Symbol Condition min typ max Output voltage Output voltage tolerance
Line regulation
Load regulation
Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage
Ripple rejection ratio Minimum input/output voltage difference
Output short circuit current Peak output current Output voltage temperature coefficient
Note 1) The specified condition T
=25˚C means that the test should be carried out with the test time so short (within 10ms) that the
j
drift in characteristic value due to the rise in chip junction temperature can be ignored.
Note 2) When not specified, VI=–10V, IO=100mA, CI=2µF, CO=1µF and Tj=0 to 125˚C
V V
REG
REG
I
Bias
I
Bias (IN)
I
Bias (L)
V RR
V
DIF (min.)
I
O (Short)
I
O (Peak)
O
O
Tj=25˚C VI=–
7 to –25V, IO=5 to 200mA
VI=–7 to –25V, Tj=25˚C
IN
L
=–8 to –18V, Tj=25˚C
V
I
I
=1 to 300mA, Tj=25˚C
O
IO=5 to 200mA, Tj=25˚C T
=25˚C
j
VI=–8 to –25V, Tj=25˚C IO=5 to 200mA, Tj=25˚C
no
f=10Hz to 100kHz
=–8 to –18V, IO=50mA,
V
I
f=120Hz
=200mA, Tj=25˚C
I
O
=–35V, Tj=25˚C
V
I
Tj=25˚C I
=5mA
O
–4.8
–4.75
60
10
125
– 0.4
Unit
–5.2 V–5
–5.25
V
50 mV10
5
30
100
50
0.5
0.1
mV mV20 mV mA3
5
mA mA
µV
dB
V1.1 mA10 mA500
mV/˚C∆VO/Ta
AN79N06 (–6V Type)
·
Parameter Symbol Condition min typ max Output voltage Output voltage tolerance
Line regulation
Load regulation
Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage
Ripple rejection ratio Minimum input/output voltage difference
Output short circuit current Peak output current Output voltage temperature coefficient
Note 1) The specified condition T
=25˚C means that the test should be carried out with the test time so short (within 10ms) that the
j
REG
REG
I
I
Bias (IN)
I
V RR
V
DIF (min.)
I
O (Short)
I
O (Peak)
V
O
V
O
Bias
Bias (L)
no
/Ta
O
Tj=25˚C VI=–
8 to –25V, IO=5 to 200mA
VI=–8 to –25V, Tj=25˚C
IN
L
=–9 to –19V, Tj=25˚C
V
I
I
=1 to 300mA, Tj=25˚C
O
IO=5 to 200mA, Tj=25˚C T
=25˚C
j
=–9 to –25V, Tj=25˚C
V
I
=5 to 200mA, Tj=25˚C
I
O
f=10Hz to 100kHz
=–9 to –19V, IO=50mA,
V
I
f=120Hz I
=200mA, Tj=25˚C
O
VI=–35V, Tj=25˚C Tj=25˚C
=5mA
I
O
drift in characteristic value due to the rise in chip junction temperature can be ignored.
Note 2) When not specified, VI=–11V, IO=100mA, CI=2µF, CO=1µF and Tj=0 to 125˚C
–5.75
–5.7
60
10
150
– 0.4
Unit
–6.25 V–6
–6.3
V
60 mV11
6
40
120
60
0.5
0.1
mV mV20 mV mA3
5
mA mA
µV
dB
V1.1 mA10 mA500
mV/˚C∆V
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