ON Semiconductor NUF6406MN Technical data

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NUF6406MN
Low Capacitance 6 Line EMI Filter with ESD Protection
Features
EMI Filtering and ESD Protection
Integration of 30 Discrete Components
Compliance with IEC61000−4−2 (Level 4)
> 8.0 kV (Contact)
DFN Package, 1.35 x 3.0 mm
Moisture Sensitivity Level 1
ESD Ratings: Machine Model = C
Human Body Model = 3B
This is a Pb−Free Device*
Benefits
Reduces EMI/RFI Emissions on a Data Line
Integrated Solution Offers Cost and Space Savings in a DFN Package
Reduces Parasitic Inductances Which Offer a More “Ideal” Low Pass
Filter Response
Integrated Solution Improves System Reliability
Compatible Footprint to BGA or Flip−Chip Package
Applications
EMI Filtering and ESD Protection for Data Lines
Wireless Phones
PDAs and Handheld Products
Notebook Computers
LCD Displays
4321
GND
65
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1
Cd Cd
2
Cd Cd
3
Cd Cd
4
Cd Cd
5
Cd Cd
6
Cd Cd
(Top View)
MARKING
12
1
DFN12
CASE 506AD
6406 = Specific Device Code M
= Month G = Pb−Free Package (Note: Microdot may be in either location)
DIAGRAM
1
M
12
11
10
9
8
7
64 06
G
G
(Bottom View)
*For additional information on our Pb−Free strategy and soldering details, please
download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D.
© Semiconductor Components Industries, LLC, 2005
June, 2005 − Rev. 2
9101112 8 7
1 Publication Order Number:
ORDERING INFORMATION
Device Package Shipping
NUF6406MNT1G DFN12
(Pb−Free)
†For information on tape and reel specifications,
including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD801 1/D.
3000 / Tape & Ree
NUF6406MN/D
NUF6406MN
MAXIMUM RATINGS (T
ESD Discharge IEC61000−4−2 Contact Discharge V Operating Temperature Range T Storage Temperature Range T Maximum Lead Temperature for Soldering Purposes (1.8 in from case for 10 seconds) T
= 25°C unless otherwise noted)
J
Parameter
Symbol Value Unit
PP
OP
STG
L
8.0 kV
−40 to 85 °C
−55 to 150 °C 260 °C
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously . If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected.
ELECTRICAL CHARACTERISTICS (T
Parameter
Maximum Reverse Working Voltage V Breakdown Voltage V Leakage Current I Resistance R
= 25°C unless otherwise noted)
J
Symbol Test Conditions Min Typ Max Unit
RWM
BR R
A
IR = 1.0 mA 6.0 7.0 V
V
= 3.0 V 1.0
RWM
IR = 20 mA 85 100 115
5.0 V
A
Capacitance (Notes 1 and 2) Cd VR = 2.5 V, f = 1.0 MHz 13 16 pF Cut−Off Frequency (Note 3) f
3dB
Above this frequency,
appreciable attenuation occurs
138 MHz
1. Measured at 25°C, VR = 2.5 V, f = 1.0 MHz.
2. Total line capacitance is 2 times the Diode Capacitance (Cd).
3. 50 source and 50 load termination.
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