High Efficiency 3 A
Synchronous Buck Dual
LED Driver with Integrated
High Side Switch and
Current Sensing for
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Automotive Front Lighting
Description
The NCV78825 is a single−chip and high efficient Synchronous
Buck Dual LED Driver designed for automotive front lighting
applications like high beam, low beam, DRL (daytime running light),
turn indicator, fog light, static cornering, etc. The NCV78825 is in
particular designed for high current LEDs and provides a complete
solution to drive 2 LED strings of up−to 60 V. It includes 2
independent current regulators for the LED strings and required
diagnostic features for automotive front lighting with a minimum of
external components – the chip doesn’t need any external sense
resistor for the buck current regulation. The available output current
and voltages can be customized per individual LED string. When more
than 2 LED channels are required on 1 module, then 2, 3 or more
devices NCV78825 can be combined; also with NCV787x3 devices –
the predecessor of the NCV78825. Thanks to the SPI
programmability, one single hardware configuration can support
various application platforms.
Features
A= Assembly Location
WL= Wafer Lot
YY= Year
WW= Work Week
G= Pb−Free Package
• Single Chip
• Buck Topology
• 2 LED Strings up−to 60 V
• High Current Capability up to 3 A DC per Output
See detailed ordering and shipping information on page 2 o
this data sheet.
ORDERING INFORMATION
• Integrated High Side Switch
• Low Side Pre−driver for External NMOS Device
• High Overall Efficiency
• Minimum of External Components
• Integrated High Accuracy Current Sensing
• Integrated Switched Mode Buck Current Regulator
• Average Current Regulation Through the LEDs
• High Operating Frequencies to Reduce Inductor Sizes
• Low EMC Emission for LED Switching and Dimming
ypical Applications
• High Beam
• Low Beam
• DRL
• Position or Park Light
• Turn Indicator
• Fog
• Static Cornering
• SPI Interface for Dynamic Control of System Parameters
*For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting
Techniques Reference Manual, SOLDERRM/D.
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specification Brochure, BRD8011/D.
TYPICAL APPLICATION SCHEMATIC
VBOOST
C_M3V
†
μC
VIO of MCU
R_SDO
VDRIVE
C_DRV
C_DD
VINBCK1
VBOOST
LBCKSW1
VDRIVE
VDD_C
RSTB
LEDCTRL1
LEDCTRL2
SCLK
SDI
SDO
CSB
TEST
NCV78825
TEST1
TEST2
VBOOSTM3V
GND
LSFET1
GNDS1
VLED1
VINBCK2
LBCKSW2
LSFET2
GNDS2
VLED2
EXPOSED
PAD
R_LED_1
R_LED_2
Figure 1. Typical Application Schematic
L_BCK_1
T_LS 1
C_LED_1
L_BCK_2
T_LS 2
C_LED_2
LED−string 1
C_BCK_1
LED−string 2
C_BCK_2
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NCV78825
Table 2. EXTERNAL COMPONENTS
Component
L_BCK_xBuck regulator coil (see BUCK REGULATOR chapter for details)47 (22)μH
C_BCK_x
C_M3V
C_DD
C_DRV
C_LED_x
R_LED_x
R_SDO
T_LSx
1. Pin TEST has to be connected to ground. TEST1 and TEST2 pins can be connected to ground or left floating.
2. C_LED_x is optional. If used, time constant of the C_LED_x and R_LED_x filter has to be lower than minimal LEDCTRLx PWM time for proper
VLED measurement.
3. R_LED_x is necessary to ensure Absolute maximum ratings of IVLEDx current (see Table 4).
4. GNDSx pins have to be star connections to the corresponding S of the external LS FET.
Buck regulator output capacitor (see BUCK REGULATOR chapter for details)220nF
Capacitor for M3V regulator470 (see Table 8)nF
VDD decoupling capacitor470 (see Table 7)nF
V
decoupling capacitor470nF
DRIVE
Optional VLEDx pin filter capacitor (Note 2)1nF
VLEDx pin serial resistor (Notes 2 and 3)1kΩ
SPI pull−up resistor1kΩ
Buck regulator low side switch (LS FET)NVTFS5C680NL,
1
2SDOSPI data outputMV open−drain
3SCLKSPI clockMV in
4SDISPI data inputMV in
5CSBSPI chip select (chip select bar)MV in
6LSFET1Buck 1 driver output for ext. low side switchMV out
7GNDS1Buck 1 ground sense for ext. low side switchMV out
8, 11, 14, 16, 21, 23, 26GND/NCGND/NC connection in applicationNC
9VBOOSTBooster input voltage pinHV supply
10VBOOSTM3VVBOOSTM3V regulator output pinHV out (supply)
12LBCKSW11Buck 1 switch outputHV out
13LBCKSW12Buck 1 switch outputHV out
15VLED1LED String 1 Forward Voltage Sense InputHV in
17VINBCK11Buck 1 high voltage supplyHV supply
18VINBCK12Buck 1 high voltage supplyHV supply
19VINBCK22Buck 2 high voltage supplyHV supply
20VINBCK21Buck 2 high voltage supplyHV supply
22VLED2LED String 2 Forward Voltage Sense InputHV in
24LBCKSW22Buck 2 switch outputHV out
Pin NameDescriptionI/O Type
RSTBExternal reset signalMV in
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NCV78825
Table 3. PIN DESCRIPTION (continued)
Pin No.
SSOP36−EP
25LBCKSW21Buck 2 switch outputHV out
27VDD_C3.3 V logic supplyLV supply
28TEST2Internal function. To be tied to GND or left openLV in/out
29GNDGroundGround
30GNDS2Buck 2 ground sense for ext. low side switchMV out
31LSFET2Buck 2 driver output for ext. low side switchMV out
32VDRIVEPre−driver supplyMV supply
33TEST1Internal function. To be tied to GND or left openLV in/out
34TESTInternal function. To be tied to GNDLV in
35LEDCTRL2LED string 2 enableMV in
36LEDCTRL1LED string 1 enableMV in
EPEXPOSED PADTo be tied to GND
Table 4. ABSOLUTE MAXIMUM RATINGS
Characteristic
VBOOST Supply VoltageV
VINBCKx Supply Voltage (Note 1)VINBCKxMax of
VBOOSTM3V Supply Voltage (Note 2)VBOOSTM3VMax of V
VDRIVE Supply VoltageVDRIVE−0.312V
LSFETx Voltage (Note 3)LSFETx−0.3Min of VDRIVE + 0.3, 12V
VLED Sense VoltageVLEDx−0.3Min of V
Logic Supply Voltage (Note 4)V
Medium Voltage IO PinsIOMV−0.37.0V
Test Pins (Note 5)TESTx−0.3Min of V
Buck Switch Low Side (Note 1)LBCKSWx−2VINBCKx + 0.3V
VLED Sink/source CurrentIVLEDx−3030mA
Storage Temperature (Note 6)T
The Exposed Pad (Note 7)EXPADGND − 0.3GND + 0.3V
The LS Pre−driver Sense GND VoltageGNDSxGND − 0.3GND + 0.3V
Electrostatic Discharge on Component
Level Human Body Model (Note 8)
Electrostatic Discharge on Component
Level Charge Device Model (Note 8)
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. V(VINBCKx − LBCKSWx) < 70 V, the driver in off state.
2. The VBOOSTM3V regulator in off state.
3. The LSFETx driver in HiZ state.
4. Absolute maximum rating for pins: VDD, TEST. Also valid for relative difference VBOOST − VBOOSTM3V.
5. Absolute maximum rating for pins: TEST1, TEST2.
6. For limited time up to 100 hours. Otherwise the max storage temperature is 85°C.
7. The exposed pad must be hard wired to GND pin in the application to ensure both electrical and thermal connection.
8. This device series incorporates ESD protection and is tested by the following methods:
ESD Human Body Model tested per AECQ100002 (EIA−JESD22A114−B)
ESD Charge Device Model tested per EIA−JESD22C101
Latchup Current Maximum Rating: 100 mA per JEDEC standard: JESD78
SymbolMinMaxUnit
BOOST
DD
STRG
V
ESD_HBM
V
ESD_CDM
VBOOSTM3V − 0.3, −0.3
−0.368V
Min of V
BOOST
− 3.6, −0.3Min of V
BOOST
BOOST
BOOST
−0.33.6V
DD
−50150°C
−2+2kV
−500+500V
I/O TypeDescriptionPin Name
+ 0.3, 68V
+ 0.3, 68V
+ 0.3, 68V
+ 0.3, 3.6V
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NCV78825
Operating ranges define the limits for functional
operation and parametric characteristics of the device. A
mission profile (Note 1) is a substantial part of the operation
conditions; hence the Customer must contact
ON Semiconductor in order to mutually agree in writing on
the allowed missions profile(s) in the application.
Table 5. RECOMMENDED OPERATING RANGES
Characteristic
Boost Supply VoltageV
VINBCKx Supply Voltage (Note 2)VINBCKxV
VDRIVE Voltage SupplyVDRIVE4.510V
Buck Switch Peak Output CurrentI_LBCKSW3.8A
Functional Operating Junction
Temperature Range (Note 3)
Parametric Operating Junction
Temperature Range (Note 4)
The Exposed Pad Connection (Note 5)EXPOSED_PADGND − 0.1GNDGND + 0.1V
The LS Pre−driver Sense GND Voltage
(Note 6)
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
1. A mission profile describes the application specific conditions such as, but not limited to, the cumulative operating conditions over life time,
the system power dissipation, the system’s environmental conditions, the thermal design of the customer’s system, the modes, in which the
device is operated by the customer, etc. No more than 100 cumulated hours in life time above T
2. Hard connection of VINBCKx to VBOOST on PCB.
3. The circuit functionality is not guaranteed outside the functional operating junction temperature range. Also please note that the device is
verified on bench for operation up to 170°C but that the production test guarantees 155°C only.
4. The parametric characteristics of the circuit are not guaranteed outside the Parametric operating junction temperature range.
5. The exposed pad must be hard wired to GND pin in an application to ensure both electrical and thermal connection.
6. The hard connection of the GNDSx pins on the PCB, mainly to the S of the LS NMOS device
corresponding S of the LS NMOS max +/− 0.2 mV.
SymbolMinTypMaxUnit
BOOST
T
JF
T
JP
GNDSxGND − 0.1GNDGND + 0.1mV
667V
− 0.1V
BOOST
−40155°C
−40150°C
BOOST
V
.
tw
+ 0.1V
BOOST
the voltage difference between the pin and
Table 6. THERMAL RESISTANCE
Characteristic
Thermal Resistance Junction to Exposed Pad (Note 1)SSOP36−EPRthjp−3.5−°C/W
1. Includes also typical solder thickness under the Exposed Pad (EP).
PackageSymbolMinTypMaxUnit
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NCV78825
ELECTRICAL CHARACTERISTICS
Table 7. VDD: 3.3 V LOW VOLTAGE ANALOG AND DIGITAL SUPPLY
CharacteristicSymbolConditionsMinTypMaxUnit
The Regulator Output VoltageVDD3.053.453.6V
VDD External Decoupling CapC_DD0.30.472.2μF
The VDRIVE Current Consumption (Note 2)I_VDRIVE815mA
Output Current LimitationVDD_ILIM15160mA
POR Toggle Level on VDD RisingPOR
POR Toggle Level on VDD FallingPOR
POR HysteresisPOR
OTP UV Toggle Level on VBOOSTOTP_UV1315V
OTP UV Toggle Level HysteresisOTP_UV_HYST0.010.20.75V
1. All Min and Max parameters are guaranteed over full junction temperature (TJP) range (−40 °C; 150 °C), unless otherwise specified.
2. Only internal consumption, Excluding LS NMOS gate charge current.
3V_H
3V_L
3V_HYST
Table 8. VBOOSTM3V: HIGH SIDE AUXILIARY SUPPLY
Characteristic
VBOOSTM3V Regulator Output VoltageV
DC Output Current Capability (Note 1)M3V_IOUT7.542mA
Output Current LimitationM3V_ILIM300mA
VBOOSTM3V External Decoupling CapC_M3VReferenced to VBOOST0.10.472.2
VBOOSTM3V Ext. Decoupling Cap. ESRC_M3V_ESRReferenced to VBOOST200
VBSTM3V POR Level, Falling EdgeM3V_PORLReferenced to VBOOST−2.7−1.8V
VBSTM3V POR Level, Rising EdgeM3V_PORHReferenced to VBOOST−2.4−1.8V
VBSTM3V POR Level HysteresisM3V_PORHYST0.05V
VBOOST POR LevelM3V_VBSTPORVBOOST goes down3.55.5V
1. VBOOST = 68 V, f
= 2 MHz, maximum total gate charge for both activated BUCK channels Qgate = 20 nC
BUCK
SymbolConditionsMinTypMaxUnit
BSTM3V
Referenced to VBOOST−3.6−3.3−3.0V
2.73.05V
2.452.8V
0.010.20.75V
mF
mW
Table 9. OSC10M: SYSTEM OSCILLATOR CLOCK
CharacteristicSymbolConditionsMinTypMaxUnit
System Oscillator FrequencyFOSC10M81012MHz
Table 10. ADC FOR MEASURING VBOOST, VDD, VLED1, VLED2, TEMP
Characteristic
ADC ResolutionADC_RES8Bits
Integral Nonlinearity (INL)ADC_INLBest fitting straight line method−1.51.5LSB
Differential Nonlinearity (DNL)ADC_DNLBest fitting straight line method−22LSB
Full Path Gain Error for
Measurements of VLEDx,
VBOOST
Offset at Output of ADCADC_OFFS−22LSB
Time for 1 SAR ConversionADC_CONVFull conversion of 8 bits6.67810
ADC Full Scale for VDD
Measurement
ADC Full Scale for VLEDx
Measurement
ADC Full Scale for VLEDx
Measurement
ADC Full Scale for VLEDx
Measurement
SymbolConditionsMinTypMaxUnit
ADC_GE−3.253.25%
ADCFS_VDD3.8744.13V
ADCFS_VLED00The VLED range code is “00”67.7257072.275V
ADCFS_VLED01The VLED range code is “01”48.3755051.625V
ADCFS_VLED10The VLED range code is “10”38.7004041.300V
OpenLEDx Detection TimeTON_OPEN405060
Buck Minimum TON TimeTON_MINFor
Delay from BUCKx ISENS
Comparator Input Voltage
Balance to BUCKx Switch
Going OFF
1. Measured as comparator DC threshold value, without comparator delay and switch falling slope.
OCDR42437mA
OCDR54875mA
TC_00[BUCKx_TOFF = 00000]50
TC_31[BUCKx_TOFF = 11111]5
TOFF_ERRWTC = Toff × VCOIL @ VLED > 2
Toff > 350 ns, Toff temperature
dependency relative to Thot =
155°C, see Figure 8
dTC
VLED_LMT1.621.81.98V
TC_ZCD−2.8−1.2−0.2mV
TC_ZCD_FT2080ns
OVD_THRLBCKSWx−VINBCKx, rising
OVD_FT100ns
HSVT_THR0.6V
HSVT_FT45ns
ISENSCMP_DELISENS cmp. over−drive ramp >
5 bits, exponential decrease7.16%
VINBCKx – LBCKSWx < 2.4 V,
no failure at LBCKSWx pin
for Slope = 1.25 A/μs, @125°C
V,
V,
Toff > 350 ns
V,
Toff 350 ns
edge
1 mV/10 ns,
−10+10%
−15+15%
−35+35ns
100200mV
50250ns
45ns
ms × V
ms × V
ms
Table 13. BUCK REGULATOR – LS SWITCH PRE−DRIVER
Characteristic
Top Switch RonRont40
Bottom Switch RonRonb8
The Pull Down ResistorLS_PUD10
LS FET Gate Voltage Threshold LevelLS_VTComparator level for non−overlap
LS FET Gate Voltage Comparator
Propagation Delay
The Maximum Reverse Polarity CurrentLS_IREVLSx_IREV_NOCTRL = 1300mA
SymbolConditionsMinTypMaxUnit
0.4V
control when LS−>off, HS−>on
LS_DEL10ns
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NCV78825
Table 13. BUCK REGULATOR – LS SWITCH PRE−DRIVER (continued)
CharacteristicUnitMaxTypMinConditionsSymbol
The non−overlap Time LS−off to HS−on
1. The time from detection of the LS switch in off state (pre−driver voltage at LS_VT threshold), to start of switching HS on.
Table 14. 5 V TOLERANT DIGITAL INPUTS (SCLK, CSB, SDI, LEDCTRL1, LEDCTRL2, RSTB)
Characteristic
High−level Input VoltageVINHI2V
Low−level Input VoltageVINLO0.8V
Pull Resistance (Note 1)Rpull40160
LED PWM Propagation Delay (Note 2)BUCKx_SW_DELActivation time of the BUCKx
5. Range 1: Comp. delay [ns] = (0.04 × Temp [ °C] + 40) × Slope × 16 [A/us, range 5] ^ (−0.17)
*in lower ranges, the same current slope (A/μs) translates into a higher voltage slope (V/μs) at the input of the comparator,
because of the higher Rdson. Resulting equations for all ranges:
−40degC
25degC
85degC
125degC
150degC
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NCV78825
DETAILED OPERATING DESCRIPTION
Supply Concept in General
Two voltages have to be brought to the NCV78825 chip
– low voltage VDRIVE supply and high voltage VBOOST
for providing energy to the buck regulators. More detailed
description follows.
VDRIVE Supply
The VDRIVE supply voltage represents power for the
complete LS pre−driver block as well as for VDD supply.
The selection of external LS FET is driven by available
voltage for VDRIVE supply. There is not implemented any
voltage monitor on VDRIVE supply.
VBOOSTM3V Supply
The VBOOSTM3V is the high side auxiliary supply for
driving the gates of the buck regulator’s integrated
high−side P−MOSFET switches. This supply receives
energy directly from the VBOOST pin, which has to be
connected by low impedance track to input pins of both buck
channels VINBCKx.
The dedicated Power−On−Reset circuit (POR) of
high−side P−MOSFET switches monitors correct voltage
level of both this auxiliary supply and VBOOST voltage in
order to guarantee correct control of integrated switches.
VDD Supply
The VDD supply is the low voltage digital and analog
supply for the chip and derives energy from VDRIVE supply
voltage. NCV78825 contains internal VDD regulator.
The Power−On−Reset circuit (POR) monitors the VDD
voltage and RSTB pin to control the out−of−reset and reset
entering state. At power−up, the chip will exit from reset
state when VDD > POR3V_H and RSTB pin is in “log. 1”.
No SPI communication is possible in reset state.
VBOOST Supply
The VBOOST supply voltage is the main high voltage
supply for the chip. The voltage is supposed to be provided
by booster chip such as NCV78702/3 or NCV78763 in the
application. VINBCKx pins have to be connected by low
impedance track to this supply to ensure proper buck
performance.
The VBOOST voltage is monitored by under−voltage
comparator to check sufficient zapping voltage at VBOOST
pin during OTP programming operation.
Module Startup
A limited transient activation of the buck switch inside the
NCV78825 device can be measured at module startup, when
supply voltages VBOOST and VDRIVE rise for the first
time and voltage regulators VDD and M3V pass POR
thresholds.
In rare application cases a limited energy transfer to the
buck circuit, may build a voltage on the output capacitor
which reaching the LED voltage threshold, resulting in a
weak light output pulse. The pulse duration can be
suppressed by using slower VBOOST slope, smaller M3V
capacitor, bigger output capacitor value and VDRIVE
supply connection before VBOOST supply.
Internal Clock Generation – OSC10M
An internal RC clock named OSC10M is used to run all
the digital functions in the chip. The clock is trimmed in the
factory prior to delivery. Its accuracy is guaranteed under
full operating conditions and is independent from external
component selection (refer to Table 9 for details). All
timings depend on OSC10M accuracy.
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NCV78825
BUCK REGULATOR
General
The NCV78825 contains two high−current integrated
buck current regulators, which are the sources for the LED
strings. The bucks are powered from the external booster
regulator.
Buck Current Regulation Principle
Each buck controls the individual inductor peak current
(I
BUCKpeak
(ΔI
BUCKpkpk
current through the LED string, independently from the
string voltage. The buck average current is in fact described
by the formula:
This is graphically exemplified by Figure 10.
)and incorporates a constant ripple
) control circuit to ensure also stable average
DI
BUCK
I
BUCK
AVG
I
BUCK
peak
pkpk
2
(eq. 1)
The parameter I
BUCKpeak
is programmable through the
device by means of the internal registers for range selection
BUCKx_ISENS_THR[2:0] and current threshold code
BUCKx_VTHR[8:0]. The range setting will be applied only
after the setting of the current threshold in order to allow
smooth changes of peak current.
The formula that defines the total ripple current over the
buck inductor is also hereby reported:
(V
V
I
BUCK
pkpk
T
OFF
In the formula above, T
time, V
is the LED voltage feedback sensed at the
LED
LED
L
BUCK
OFF
NCV78825 VLEDx pin and L
value. The parameter T
OFF
× V
)
DIODE
T
represents the buck switch off
is the buck inductance
BUCK
is programmable by SPI
COIL
V
COIL
BUCK
(eq. 2)
off
L
(BUCKx_TOFF[4:0] register), with values related to Table
12. In order to achieve a constant ripple current value, the
device varies the T
V
sensed at the device pin, according to the selected
COIL
factor T
OFF
× V
COIL
time inversely proportional to the
OFF
.
As a consequence to the constant ripple control and
variable off time, the buck switching frequency depends on
the boost voltage and LED voltage in the following way:
Figure 10. Buck Regulator Controlled
Average Current
f
BUCK
(V
BOOST
V
V
BOOST
LED
)
T
If the offset cancelation of the peak current comparator is
not disabled by BUCKx_OFF_CMP_DIS bit, the inductor
Toff = constant
Toff = constant
Figure 11. Peak Current Comparator Offset Cancelation
The LED average current in time (DC) is equal to the buck
time average current. Therefore, to achieve a given LED
current target, it is sufficient to know the buck peak current
and the buck current ripple. A rule of thumb is to count a
minimum of 50% ripple reduction by means of the capacitor
C
and this is normally obtained with a low cost ceramic
BUCK
component ranging from 100 nF to 470 nF (such values are
1
OFF
(V
BOOST
V
V
BOOST
LED
V
)
COIL
T
V
off
COIL
peak current will vary from cycle−to−cycle as depicted on
Figure 11.
Toff = constant
Typical LED current
2x Peak current comparator offset
Fixed peak level
typically used at connector sides anyway, so this is included
in a standard BOM). The use of C
is a cost effective
BUCK
way to improve EMC performances without the need to
increase the value of L
, which would be certainly a far
BUCK
more expensive solution. The following figure reports a
typical example waveform:
(eq. 3)
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NCV78825
Figure 12. LED Current AC Components Filtered out by Output Impedance (Oscilloscope Snapshot)
SW Compensation of the Buck Current Accuracy
In order to ensure buck current accuracy as specified in
Table 12, set of constants trimmed during manufacturing
process is available. Microcontroller should use them in the
following way:
To reach ±9 % accuracy (±7 % for Range 5) over whole
temperature operating range:
• All ranges: BUCKx_ISENS_TRIM[6:0] =
BUCKx_ISENS_RNG[6:0]
• BUCKx_ISENS_RNG[6:0] is trimming constant for
the highest current range (Range 5) at hot temperature
• BUCKx_ISENS_RNG[6:0] constant is loaded into
BUCKx_ISENS_TRIM[6:0] register automatically
after the reset of the device
To reach ±7 % accuracy over whole temperature operating
range:
• BUCKx_ISENS_Dx[3:0] registers, meaning delta of
the trimming constant with respect to the higher current
range at hot temperature, have to be used. Trimming
constant for the particular range at hot temperature can
be then calculated as:
Where delta of the trimming constant
BUCKx_ISENS_Dx[3:0] is signed, coded as two’s
complement. Range of this constant is decadic <−8; 7>,
binary <1000; 0111>.
Calculated trimming constant of selected range (y) has to
be then written into trimming SPI register:
BUCKx_ISENS_TRIM[6:0] = BUCKx_Ry_trim_hot
To reach ±4 % accuracy over whole temperature operating
range:
• In addition to BUCKx_ISENS_Dx[3:0] registers, the
BUCK_ISENS_TCx[3:0] registers, meaning
temperature coefficient for the appropriate range, have
to be used. Trimming value for a certain temperature
can be then calculated as:
• Range 5:
BUCK1_R5_trim = BUCK1_R5_trim_hot
× (Tj – Thot) + kQ × (Tj – Thot)2,
+ k
L1
BUCK2_R5_trim = BUCK2_R5_trim_hot
× (Tj – Thot) + kQ × (Tj – Thot)
+ k
L3
2
• Range 4:
BUCK1_R4_trim = BUCK1_R4_trim_hot
× (Tj – Thot) + kQ × (Tj – Thot)2,
+ k
L1
BUCK2_R4_trim = BUCK2_R4_trim_hot
× (Tj – Thot) + kQ × (Tj – Thot)
+ k
L3
2
• Range 3:
BUCK1_R3_trim = BUCK1_R3_trim_hot
× (Tj – Thot) + kQ × (Tj – Thot)2,
+ k
L1
BUCK2_R3_trim = BUCK2_R3_trim_hot
× (Tj – Thot) + kQ × (Tj – Thot)
+ k
L3
2
• Range 2:
BUCK1_R2_trim = BUCK1_R2_trim_hot
× (Tj – Thot) + kQ × (Tj – Thot)2,
+ k
L0
BUCK2_R2_trim = BUCK2_R2_trim_hot
× (Tj – Thot) + kQ × (Tj – Thot)2,
+ k
L2
• Range 1:
BUCK1_R1_trim = BUCK1_R1_trim_hot
× (Tj – Thot) + kQ × (Tj – Thot)2,
+ k
L0
BUCK2_R1_trim = BUCK2_R1_trim_hot
× (Tj – Thot) + kQ × (Tj – Thot)
+ k
L2
Where buck temperature coefficient
BUCK_ISENS_TCx[3:0] is signed, coded as two’s
complement. Range of this constant is decadic <−8; 7>,
binary <1000; 0111>
2
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NCV78825
• k
is linear coefficient for each current range
Lx
calculated:
k
= (BUCK_ISENS_TCx[3:0] –
Lx
k
(200°C)2)/(−200°C) [code/°C]
Q x
• k
is quadratic constant for all current ranges:
Q
k
= 1.2 × 10
Q
−4
[code/(°C)2]
• Tj is junction temperature in °C calculated from
VTEMP[7:0] SPI register value according to the
equation defined in chapter ADC: Device Temperature
ADC: V
TEMP
• Thot temperature is constant equal to 155°C
Calculated trimming constant of selected range (y) has to
be then written into trimming SPI register:
VBOOST
supply
C
M3V
VBOOSTM3VVBOOST
VBOOSTM3V
reg.
BUCKx_ISENS_TRIM[6:0] = BUCKx_Ry_trim
The BUCKx_ISENS_TRIM[6:0] SPI register allows
compensation of the peak current app. in range ±40 % from
actual value according to the following equation:
IBUCKx = (ITHRx_000 +
δITHRx × BUCKx_VTHR[8:0]) × (1 + 0.4 × (
(BUCKx_ISENS_TRIM[6:0] − 63)/63)),
Where ITHRx_000 is current for VTHR code 0 in ITHRx
range (see Table 12), δITHRx code step in range ITHRx
(see Table 12).
The complete buck circuit diagram follows:
VINBCKx
POWER STAGE
Driver
HSVt
cmp
Digital
Control
Zero Cross Detector
Isense/OC /
OVD
Constant Ripple
Control
Figure 13. Buck Regulator Circuit Diagram
The zero−cross−detection (ZCD) comparator is
implemented for the case when VLED is low (< 1.8 V typ.)
to ensure proper Toff time termination just at the moment
when the coil current decreases to zero (boundary
conduction mode).
LBCKSWx
ZCD
LSFETx
GNDSx
VLEDx
L
M
Dbulk
LED string
C
ZCD is also used in normal buck mode when LS switch is
functional for proper determination of LS switch activation
and also deactivation when LS switch should be disabled in
reverse buck current mode.
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20
NCV78825
HSVt Comparator
The HSVt comparator senses the gate voltage of the HS
switch and is used together with ZCD comparator for proper
activation of the LS switch. The comparator indicates that
gate voltage of the HS switch is at its Vt voltage, so it is safe
to turn LS switch on without risk of cross−current from
VBOOST/VINBCKx to ground.
Over Current Protection
Being a current regulator, the NCV78825 buck is by
nature preventing overcurrent in all normal situations.
However, in order to protect the system from overcurrent
even in case of failures, protection mechanism is available.
This protection is based on internal sensing over the buck
switch: when the peak current rises above the limit (situated
above OCDRx level, see Table 12), an internal counter starts
to increment at each period, until the count written in
BUCK_OC_OCCMP_THR[1:0] + 1 is attained. The
counter is reset if the buck channel is disabled and also at
each dimming cycle. From the moment the count is reached
onwards, the buck is kept continuously off, until the SPI
error flag OCLEDx is read. After reading the flag, the buck
channel “x” is automatically re−enabled and will try to
regulate the current again.
Over Voltage Detector
The OVD comparator ensures switching ON the HS
switch in case, that LBCKSWx pin is externally overdriven
over the VINBCKx potential. This feature prevents possible
HS switch bulk current and associated power loss or even
latch−up.
LS pre−driver
The LS pre−driver drives external NMOS device that is
performing synchronous rectification. The main advantage
is more efficient buck performance by minimizing voltage
drop across the flyback diode. The pre−driver is supplied
from VDRIVE pin, so its output is either switched to
VDRIVE or to GNDSx based on the required state of the LS
switch.
Implemented pull−down resistor ensures off state of the
LS switch in case that there is no supply of the device.
The LS pre−driver also contains the output voltage
monitor, the comparator indicating that LS switch gate
voltage is below a certain threshold voltage. The switching
on of the LS driver (LS pre−driver output is switched to
VDRIVE) is in normal continuous buck mode determined
by ZCD or HSVt comparator, the faster event activates the
LS switch.
The different buck modes and corresponding LS switch
functionality is implemented as follows:
• Buck output current discontinuous mode,
(VLED>VLED_LMT, LSx_IREV_NOCTRL = 0) the
LS driver is switched off as soon as the voltage drop
across the LS switch rises above ZCD threshold and
stays off till end of the corresponding Toff period
• Buck output current discontinuous mode,
(VLED>VLED_LMT, LSx_IREV_NOCTRL = 1) the
LS driver stays on till end of the Toff period regardless
of the ZCD state. The maximum buck output reverse
current (LS_IREV) is not sensed by the chip. It is
responsibility of application to guarantee that the
current will never exceed the specified value
• VLED_LOW is active,
(VLED<VLED_LMT, LSx_VLEDLOW_ENA = 0) the
LS driver is deactivated immediately, the bulk diode of
the LS switch is working as a flyback diode
• VLED_LOW is active,
(VLED<VLED_LMT, LSx_VLEDLOW_ENA = 1) the
LS driver stays functional like in case of high VLED
voltage (VLED>VLED_LMT)
• LS driver is disabled (LSx_DRV_ENA = 0), the LS
pre−driver output is switched to GNDSx, the LS switch
is kept off
Non−overlap Control of HS and LS Switches
The Non−overlap time is controlled in such a way, that HS
switch is activated just at the moment when gate voltage of
the LS switch is below its threshold voltage still with some
safety non−overlap time (see Table 13 for details). The
different non−overlap times can be selected by LS
non−overlap mode selection SPI bits:
• Adaptive mode (LSx_NO_MD[1:0] = “00” or “01”),
the switching off of the LS driver and switching on of
the HS driver is controlled by the self−adaptation
circuitry. This circuitry ensures, that the HS switch is
switched on just at the moment when gate voltage of
the LS FET passes through a LS_VT threshold when
the LS FET is surely off.
During settling time, the LS FET can be switched off
earlier than in balanced state, but the LS FET on time is
corrected for the next buck period in such a way, that
the balanced state should be reached.
During settling time, the LS FET can be switched off
later than in balanced state, but the LS FET on time is
corrected for the next buck period in such a way, that
the balanced state should be reached. As a
consequence, the Toff time must be extended just for
this buck period to prevent the cross−current
• Fixed mode (LSx_NO_MD[1:0] = “10” or “11”), the
switching off of the LS driver and switching on of the
HS driver is controlled by constant time as fixed
percentage of Toff time regardless of the LS FET
parasitics and switch−off time. In case of improper
application setup, the fixed non−overlap time can be too
short for given Toff time. In such case Toff time is
automatically extended just to prevent cross−current
(LS switch is still on, but HS switch should be already
switched on)
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21
LBCKSW
I
COIL
HSVt_CMP
ZCD
HS_ON
LS_ON
NCV78825
T
OFF
LS_vt
Figure 14. Adaptive HS/LS Non-overlap Control
Paralleling the Bucks for Higher Current Capability
Different buck channels can be paralleled at the module
output (after the buck inductors) for higher currentcapability on a unique channel, summing up together the
individual DC currents.
The Buck channels can be configured to a master−slave
synchronization mode by SPI bit BUCK_SYNC set to “1”.
Then, the Buck 1 performs as in the normal mode, the
Buck 2 “ON” phase starts when Buck1 “ON” phase finishes
(Buck 1 peak current reached) and also Buck 2 “OFF” phase
is synchronized with this signal from the master (Buck 2
Toff generator is not used). Only adaptive non−overlap
control for Buck 2 is allowed (LS2_NO_MD[1:0] = “00” or
“01”). If fixed non−overlap is set (LS2_NO_MD[1:0] =
“10” or “11”) then LS2_NO_MD[1:0] = “01” is set in the
device automatically. The duty cycle has to be less than 50%
for proper synchronous operation. This mode of operation is
suitable for further improvement of EMC performance, but
for the cost of worse Buck 2 average current accuracy.
Dimming
The NCV78825 supports both analog and digital
dimming (or so called PWM dimming). Analog dimming is
performed by controlling the LED amplitude current during
operation. This can be done by means of changing the peak
current level and/or the T
OFF
× V
constants by SPI
COIL
commands (see Buck Regulator section).
In this section, only the PWM dimming is described as this
is the preferred method to maintain the desired LED color
temperature for a given current rating. In PWM dimming,
the LED current waveform frequency is constant and the
duty cycle is set according to the required light intensity. In
Wait for LS_vt – Toff extended
order to avoid the beats effect, the dimming frequency
should be set at “high enough” values, typically above
300 Hz.
PWM dimming is controlled externally by means of
LEDCTRLx inputs.
External Dimming
The two independent control inputs LEDCTRLx handle
the dimming signals for the related channel “x”. In external
dimming, the buck activation is transparently linked to the
logic status of the LEDCTRLx pins. The only difference is
the controlled phase shift of typical 5.5 μs (see
BUCKx_SW_DEL parameter in Table 14) that allows
synchronized measurements of the VLEDx pins via the
ADC (see dedicated section for more details). As the phase
shift is applied both to rising edges and falling edges, with
a very limited jitter, the PWM duty cycle is not affected.
Apart from the phase shift and the system clock OSC10M,
there is no limitation to the PWM duty cycle values or
resolutions at the bucks, which is a copy of the reference
provided at the inputs.
ZOOM: buck inductor switching current
DIM_DUT = DIM_TON / DIM_T = DIM_T
DIM_T
ON
DIM_T
Figure 15. Buck Current Digital or PWM Dimming
ON
x F
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22
NCV78825
ADC
General
The built−in analog to digital converter (ADC) is an 8−bit
capacitor based successive approximation register (SAR).
This embedded peripheral can be used to provide the
following measurements to the external Micro Controller
Unit (MCU):
• VBOOST voltage: sampled at the VBOOST pin
• VDD voltage: sampled at the VDD pin
• VLED1ON, VLED2ON voltages
• VLED1 and VLED2 voltages
• VTEMP measurement (chip temperature)
The internal NCV78825 ADC state machine samples all
the above channels automatically, taking care for setting the
analog MUX and storing the converted values in memory.
The external MCU can readout all ADC measured values via
the SPI interface, in order to take application specific
decisions. Please note that none of the MCU SPI commands
interfere with the internal ADC state machine sample and
conversion operations: the MCU will always get the last
available data at the moment of the register read.
VDDsample & convert
V
sample & convert
BOOST
Update LED_SEL_DUR count;
When counter ripples, trigger
VLEDx interrupt for once
V
sample & convert
TEMP
V
sample & convert
BOOST
points marked with a rhombus, with a minimum cadence
corresponding to the number of the elapsed ADC sequences
(forced interrupt). In formulas:
T
VLEDx_INT_forced
LED_SEL_DUR[8 : 0] T
ADC_SEQ
(eq. 4)
In general, prior to the forced interrupt status, the
VLEDxON ADC interrupts are generated when a falling
edge on the control line for the buck channel “x” is detected
by the device. In case of external dimming, this interrupt
start signal corresponds to the LEDCTRLx falling edge
together with a controlled phase delay (Table 14). The
purpose of the phase delay is to allow completion the
ongoing ADC conversion before starting the one linked to
the VLEDx interrupt: if at the moment of the conversion
LEDCTRLx pin is logic high, then the updated registers are
VLEDxON[7:0] and VLEDx[7:0]; otherwise, if
LEDCTRLx pin is logic low, the only register refreshed is
VLEDx[7:0]. This mechanism is handled automatically by
the NCV78825 logic without need of intervention from the
user, thus drastically reducing the MCU cycles and
embedded firmware and CPU cycles overhead that would be
otherwise required.
To avoid loss of data linked to the ADC main sequence,
one LED channel is served at a time also when interrupt
requests from both channels are received in a row and a full
sequence is required to go through to enable a new interrupt
VLEDx. In addition, possible conflicts are solved by using
a defined priority (channel pre−selection). Out of reset, the
default selection is given to channel “1”. Then an internal
flag keeps priority tracking, toggling at each time between
channels pre−selection. Therefore, up to two dimming
periods will b e required to obtain a full measurement update
of the two channels. This is not considered however a
limitation, as typical periods for dimming signals are in the
order of 1 ms period, thus allowing very fast failure
detection.
A flow chart referring to the ADC interrupts is also
displayed (see Figure 17).
Figure 16. ADC Sample and Conversion
Main Sequence
Referring to the figure above, the typical rate for a full
SAR plus digital conversion per channel is 8 μs (T able 10).
For instance, each new VBOOST ADC converted sample
occurs at 16 μs typical rate, whereas for both the VBB and
VTEMP channel the sampling rate is typically 32 μs, that is
to say a complete cycle of the depicted sequence. This time
is referred to as TADC_SEQ.
If the SPI setting LED_SEL_DUR[8:0] is not zero, then
interrupts for the VLEDx measurements are allowed at the
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23
NCV78825
LEDx sample & convert
Toggle channel “x” selection
NO
Interrupts Enabled
NO
Proceed to next step in the
Figure 17. ADC VLEDx Interrupt Sequence
YES
V
second channel do not serve
immediately and complete
VLEDx
Synchronization
signal?
YES
In case of interrupt on
the ADC sequence first
ADC sequence
All NCV78825 ADC registers data integrity is protected
by ODD parity on the bit 8 (that is to say the 9th bit if
counting from the least significant bit named “0”). Please
refer to the SPI map section for further details.
Logic Supply Voltage ADC: V
DD
The logic supply voltage is sampled at VDD pin. The
(8−bit) conversion ratio is 4/255 (V/dec) = 0.0157 (V/dec)
typical. The converted value can be found in the SPI register
VDD[7:0], protected with ODD parity bit.
Boost Voltage ADC: V
BOOST
This measure refers to the boost voltage at the VBOOST
pin, with an 8 bit conversion ratio of 70/255 (V/dec) = 0.274
(V/dec) typical, inside the SPI register VBOOST[7:0]. The
value is protected by ODD parity bit. This measurement can
be used by the MCU for diagnostics and booster control loop
monitoring.
Device Temperature ADC: V
TEMP
By means of the VTEMP measurement, the MCU can
monitor the device junction temperature (T
) over time. The
J
conversion formula is:
TJ (VTEMP[7 : 0] 50.5)0.805
(eq. 5)
VTEMP[7:0] is the value read out directly from the
related 8bit−SPI register (please refer to the SPI map). The
value is also used internally by the device for the thermalwarning and thermal shutdown functions. More details on
these two can be found in the dedicated sections in this
document. The value is protected by ODD parity bit.
LED String Voltages ADC: V
LEDx
, V
LEDxON
The voltage at the pins VLEDx (1, 2) is measured. There
are 4 ranges available, that can be selected by means of
ADC_VLEDx_RNG_SEL[1:0] register, to obtain higher
resolution for LED voltage measurement.
Conversion ratios in dependency on selected range are:
0x0:70/255 (V/dec) = 0.274 (V/dec)
0x1:50/255 (V/dec) = 0.196 (V/dec)
0x2:40/255 (V/dec) = 0.157 (V/dec)
0x3:30/255 (V/dec) = 0.118 (V/dec)
This information, found in registers VLEDxON[7:0] and
VLEDx[7:0], can be used by the MCU to infer about the
LED string status, for example, individual shorted LEDs. As
for the other ADC registers, the values are protected by
ODD parity.
Please note that in the case of constant LEDCTRLx inputs
and no dimming (in other words dimming duty cycle equals
to 0% or 100%) the VLEDx interrupt is forced with a rate
equal to, given in the ADC general section. This feature can
be exploited by MCU embedded algorithm diagnostics to
read the LED channels voltage even when in OFF state,
before module outputs activation (module startup
pre−check).
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24
NCV78825
DIAGNOSTICS
The NCV78825 features a wide range of embedded
diagnostic features. Their description follows. Please also
refer to the previous SPI section for more details.
w Thermal Warning:
This mechanism detects a user−programmable junction
temperature which is in principle close, but lower, to
the chip maximum allowed, thus providing the
information that some action (power de−rating) is
required to prevent overheating that would cause
Thermal Shutdown. A typical power de−rating
technique consists in reducing the output dimming duty
cycle in function of the temperature: the higher the
temperature above the thermal warning, the lower the
duty cycle. The thermal warning flag (TW) is given in
status register 0x16 and is latched. When VTEMP[7:0]
raises to or above THERMAL_WARNING_THR[7:0]
threshold, the TW flag is set. At power up the default
thermal warning threshold is typically 159°C (SPI code
179)
w Thermal Shutdown:
This safety mechanism intends to protect the device
from damage caused by overheating, by disabling the
both buck channels. The diagnostic is displayed per
means of the TSD bit in status register 0x16 (latched).
Once occurred, the thermal shutdown condition is
exited when the temperature drops below the thermal
warning level, thus providing hysteresis for thermal
shutdown recovery process. Outputs are re−enabled
automatically if BUCKx_TSD_AUT_RCRV_EN = 1,
respectively can be re−enabled by rising edge on
BUCKx_EN if BUCKx_TSD_AUT_RCRV_EN = 0.
The application thermal design should be made as such
to avoid the thermal shutdown in the worst case
conditions. The thermal shutdown level is not user
programmable and is factory trimmed (see ADC_TSD
in Table 10)
w SPI Error:
In case of SPI communication errors the SPIERR bit in
status register 0x16 is set. The bit is latched. For more
details, please refer to section “SPI protocol: framing
and parity error”
w Open LEDx String:
Individual open LED diagnostic flags indicate whether
the “x” string is detected open. The detection is based
on a counter overflow of typical 50 μs when the related
channel is activated. Both OPENLED1 and
OPENLED2 flags (latched) are contained in status
register 0x15. Please note that the open detection does
not disable the buck channel(s)
w Short LEDx String:
A short circuit detection is available independently for
each LED channel per means of the flag SHORTLEDx
(latched, status register 0x15). The detection is based
on the voltage measured at the VLEDx pins via a
dedicated internal comparator: when the voltage drops
below the VLED_LMT threshold (1.8 V typ. , see
Table 11) the related flag is set. Note that the detection
is active when buck channel is enabled and inactive
during the 1
of low VLEDx voltage the Toff time is terminated
immediately when the inductor current reaches zero.
This improves the dimming behavior via external short
switches (pixel control)
st
switching period after enabling. In case
w Overcurrent on Channel x:
This diagnostics protects the LEDx and the buck
channel x electronics from overcurrent. As the
overcurrent is detected, the OCLEDx flag (latched,
status register 0x15) is raised and the related buck
channel is disabled. More details about the detection
mechanisms and parameters are given in section “Buck
Overcurrent Protection”
w Buckx Status:
Register BUCKx_STATUS shows the actual status of
Buckx output. When BUCKx_STATUS is 1, the
corresponding output regulates current to the LED
w LEDCTRLx Pin Status:
SPI registers LED1VAL resp. LED2VAL indicate the
actual logic level of the debounced LEDCTRLx pins.
These signals follow the output of 200 ns digital
debouncers implemented on LEDCTRLx pins
w Buckx Running at Minimum TON Time:
Register BUCKx_MIN_TON (latched) indicates that
minimal TON time is detected on the corresponding
channel. It is clear by read flag. This information can be
used for detection of transition period during which the
BUCKx output current decreases due to the change of
BUCKx_VTHR code or BUCKx_ISENS_THR range
w Buckx TON Time Duration:
SPI register BUCKx_TON_DUR[7:0] reflects the last
measured Buckx TON time (1LSB = 200 ns) on the
corresponding channel. When Buckx runs with TON
time < typ. 200 ns, the BUCKx_TON_DUR[7:0] SPI
register returns value 0x00. When Buckx is stopped, the
BUCKx_TON_DUR[7:0] register keeps the last
measured TON time
w HW Reset:
The out of reset condition is reported through the HWR
bit (latched). This bit is set only at each Power On
Reset (POR) and indicates the device is ready to
operate
Each diagnostic latched flag is cleared by read.
A short summary table of the main diagnostic bits related
when temp falls below TW and
BUCKx_TSD_AUT_RCVR_EN = 1)
Mode = RESET (0)
OFF
LED is off
TSD = 1 (1)
Yes
Yes
OCLEDx = 1 or
BUCKx_EN = 0 (2)
BUCKx_TSD_AUT_RCVR_EN = 1 or
rising edge on BUCKx_EN detected) (3)
BUCKx_TSD_AUT_RCVR_EN = 1 or
rising edge on BUCKx_EN detected) and
(OCLEDx = 1 or BUCKx_EN = 0) (2)
OCLEDx = 0 and
BUCKx_EN = 1 (2)
NORMAL mode: LED is on if LEDCTRLx = 1
FSO/STANDALONE mode: LED is on
RECOVERY
LED is off
VTEMP < THERMAL EARNING_THR (1)
DIMMING
TSD = 1 (1)
TSD = 1 (1)
TSD
LED is off
Figure 18. LED Dimming State Diagram
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26
FUNCTIONAL MODE DESCRIPTION
Transition condition (priority level):
action executed when transition is performed
(0) − highest
(1)
(2)
(3) − lowest
NCV78825
POR (0)
RESET
SPI disabled
Dimming disabled
HWR := 1
RSTB = 0 and
(FSO_MD = 000 or
001 or 110 or 111) (1)
RSTB = 1 (1)
150μs timeout expired (3)
SPI pre−load from OTPs when
FSO_MD = 001 or 100 or 101
RSTB = 0 and
(FSO_MD = 010 or
011 or 100 or 101) and
OTP_CUST_LOCK = 1 (2)
SPI pre−load from OTPs
FSO := 1
INIT
SPI disabled
Dimming disabled
OTP refresh ongoing
150μs timeout expired
(
FSO_MD = 110 or111) and
OTP_CUST_LOCK = 1 (2)
SPI pre−load from OTPs
NORMAL
SPI enabled
Dimming: LEDCTRLx
(FSO_MD = 000 or 001) (1)
RSTB = 0 (1)
FSO := 1
FSO_MD = 000 or 001 (2)
RSTB = 1 or
RSTB = 0 (1)
STANDALONE
SPI disabled when
FSO_MD = 110
Dimming: BUCKx_EN
FSO
SPI disabled when
FSO_MD = 010 or 100
Dimming: BUCKx_EN
Figure 19. Functional Modes State Diagram
Reset
Asynchronous reset is caused either by POR (POR always
causes asynchronous reset − transition to reset state) or by
falling edge on RSTB pin (in normal/stand−alone mode,
when FSO_MD[2:0] = 000 or 001 or 110 or 111).
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Init and Normal mode
Normal mode is entered through Init state after internal
delay of 150 μs. In Init state, OTP refresh is performed. If
OTP bits for FSO_MD[2:0] register and OTP Lock Bit are
programmed, transition to FSO/SA mode is possible.
27
NCV78825
e
RSTB in normal or stand−alone mode
FSO/Stand−Alone Mode
FSO (Fail−Safe Operation)/Stand−Alone modes can be
used for two main purposes:
• Default power−up operation of the chip (Stand−Alone
functionality without external microcontroller or
preloading of the registers with default content for
default operation before microcontroller starts sending
SPI commands for chip settings)
• Fail−Safe functionality (chip functionality definition in
fail−safe mode when the external microcontroller
functionality is not guaranteed)
FSO/stand−alone function is controlled according to
Table 19. Entrance into FSO/Stand−alone mode is possible
only after customer OTP zapping when OTP Lock Bit is set.
After FSO mode activation, the FSO bit in status register
is set. FSO register is cleared by read register.
When FSO/Stand−Alone mode is activated, content of the
following SPI registers is preloaded from OTP memory:
BUCK1_VTHR[8:1]
BUCK1_ISENS_THR[1:0]
BUCK2_VTHR[8:1]
BUCK2_ISENS_THR[1:0]
BUCK1_TOFF[4:0]
BUCK2_TOFF[4:0]
BUCK1_EN
BUCK2_EN
FSO_MD[2:0]
BUCK1_TSD_AUT_RCVR_EN
BUCK2_TSD_AUT_RCVR_EN
BUCK_OC_OCCMP_THR[1:0]
BUCKx_ISENS_TRIM[6:0] register is preloaded from
corresponding BUCKx_ISENS_RNG[6:0] register.
In FSO (entered via falling edge on RSTB pin) and
Stand−Alone modes, BUCK1_EN & BUCK2_EN are
controlled from SPI register map (SPI registers are updated
from OTP’s after entrance into these modes).
BUCK1_EN and BUCK2_EN are supposed to be set ‘1’
for the BUCKx operation in the FSO/stand−alone mode.
When control registers are pre−loaded from OTP’s after
POR and FSO mode is not entered (valid for FSO_MD[2:0]
= 100 or 101), BUCK1_EN and BUCK2_EN are kept
inactive (‘0’) until the first valid SPI operation is finished
(even in FSO mode) to avoid potential activation of buck
regulators immediately after POR (to prevent undefined
state of LEDCTRLx pins in case MCU leaves POR later than
NCV78825).
In FSO and Stand−Alone modes, the logic level at
LEDCTRLx pins is ignored and external PWM dimming
with LEDCTRLx pins is not available. The outputs can be
dimmed only by means of BUCKx_EN register.
Prior to entrance into FSO mode, low level on RSTB pin
always generates reset of digital. Falling edge on RSTB pin
may generate either entrance into FSO mode or reset in
dependency on FSO_MD[2:0] register value.
Once FSO mode is entered via falling edge on RSTB pin,
reset function of RSTB pin is blocked until FSO mode is
exited. FSO mode can be exited by the rising edge on RSTB
pin or by writing FSO_MD[2:0] = 000 or 001 (possible only
in FSO modes, where SPI control register update is allowed:
FSO_MD[2:0] = 011 or 101).
In stand−alone mode (FSO_MD[2:0] = 110 or 1 1 1), RSTB
has always reset functionality.
During entrance into FSO mode, value of FSO_MD[2:0]
SPI register (preloaded from OTP at power up only) is
latched into internal register and all FSO related functions
are then controlled according to it. The purpose is to avoid
the reset of the device when FSO mode is active and
FSO_MD[2:0] is changed to value corresponding to
stand−alone mode, where RSTB pin has reset functionality.
The internal register is cleared after POR or when FSO mode
is exited.
POR
(internal)
RSTB
POR
(internal)
RSTB
Normal mode (SPI possible)
Power−up
Possible OTP pre−loadPossible OTP pre−load
RSTB in FSO mode
Normal mode (SPI possible)
Power−up
OTP pre−loadOTP pre−load
Figure 20. RSTB Pin Functionality in Normal, Stand−alone and FSO Modes
www.onsemi.com
Normal mode (no SPI)
FSO mode
(SPI possible/no SPI)
28
Normal mode
Reset mod
FSO modeNormal mode
OTP pre−load
NCV78825
Table 19. FSO MODES
FSO_MD[2:0]
000b = 0FSO mode disabled, registers are loaded with safe value = 0x00h after POR, default
− After the reset, control registers are loaded with 0x00h value
− Entrance into FSO mode is not possible unless dedicated SPI write command to change FSO_MD[2:0] value is
001b = 1FSO mode disabled, registers are loaded with data from OTP memory after POR
− After the reset, control registers are loaded with data stored in OTP memory (device’s OTP memory has to be
programmed, OTP Lock Bit has to be set). It reduces number of SPI transfers needed to configure the device
after the reset
− Entrance into FSO mode is not possible unless dedicated SPI write command to change FSO_MD[2:0] value is
sent
010b = 2FSO entered after falling edge on RSTB pin, registers are loaded with safe value = 0x00h except FSO_MD[2:0]
value after POR
− After FSO mode activation, control registers are loaded with data stored in OTP memory
− SPI register update (SPI write/read operation) in FSO mode is disabled (SPI write operation is blocked;
Diagnostig flags clearing of SPI registers is blocked; in case of invalid SPI frame, SPIERR flag is set)
− RSTB pin serves to enter/exit FSO mode
− LEDCTRLx pins are not functional (buck enable/disable only by means of BUCKx_EN SPI/OTP bits, external
PWM dimming not available)
011b = 3FSO entered after falling edge on RSTB pin, registers are loaded with safe value = 0x00h except FSO_MD[2:0]
value after POR
− After FSO mode activation, control registers are loaded with data stored in OTP memory
− SPI register update (SPI write/read operation) in FSO mode is enabled
− FSO mode can be exited by writing FSO_MD[2:0] = 000 or 001
− RSTB pins serves to enter/exit FSO mode
− LEDCTRLx pins are not functional (buck enable/disable only by means of BUCKx_EN SPI/OTP bits, external
PWM dimming not available)
100b = 4FSO entered after falling edge on RSTB pin, registers are loaded with data from OTP memory after POR
− After FSO mode activation, control registers are loaded with data stored in OTP memory
− SPI register update (SPI write/read operation) in FSO mode is disabled (SPI write operation is blocked;
Diagnostig flags clearing of SPI registers is blocked; in case of invalid SPI frame, SPIERR flag is set)
− RSTB pin serves to enter/exit FSO mode
− LEDCTRLx pins are not functional (buck enable/disable only by means of BUCKx_EN SPI/OTP bits, external
PWM dimming not available)
101b = 5FSO entered after falling edge on RSTB pin, registers are loaded with data from OTP memory after POR
− After FSO mode activation, control registers are loaded with data stored in OTP memory
− SPI register update (SPI write/read operation) in FSO mode is enabled
− FSO mode can be exited by writing FSO_MD[2:0] = 000 or 001
− RSTB pin serves to enter/exit FSO mode
− LEDCTRLx pins are not functional (buck enable/disable only by means of BUCKx_EN SPI/OTP bits, external
PWM dimming not available)
110b = 6SA (stand−alone)/FSO entered after POR (RSTB pin rising edge), registers are loaded with data from OTP memory
− After SA/FSO mode activation, control registers are loaded with data from OTP memory
− SPI register update (SPI write/read operation) in SA/FSO mode is disabled (SPI write operation is blocked;
Diagnostig flags clearing of SPI registers is blocked; in case of invalid SPI frame, SPIERR flag is set)
− RSTB pin has reset functionality
− LEDCTRLx pins are not functional (buck enable/disable only by means of BUCKx_EN SPI/OTP bits, external
PWM dimming not available)
111b = 7SA (stand−alone)/FSO entered after POR (RSTB pin rising edge), registers are loaded with data from OTP memory
− After SA/FSO mode activation, control registers are loaded with data from OTP memory
− SPI register update (SPI write/read operation) in SA/FSO mode is enabled
− FSO mode can be exited by writing FSO_MD[2:0] = 000 or 001
− RSTB pin has reset functionality
− LEDCTRLx pins are not functional (buck enable/disable only by means of BUCKx_EN SPI/OTP bits, external
PWM dimming not available)
Description
www.onsemi.com
29
NCV78825
High
T
SPI INTERFACE
General
The serial peripheral interface (SPI) is used to allow
an external microcontroller (MCU) to communicate
with the device. NCV78825 acts always as a slave and it
cannot initiate any transmission. The operation of the device
is configured and controlled by means of SPI registers,
which are observable for read and/or write from the master.
The NCV78825 SPI transfer size is 16 bits.
During an SPI transfer, the data is simultaneously
transmitted (shifted out serially) and received (shifted in
serially). A serial clock line (CLK) synchronizes shifting
and sampling of the information on the two serial data lines:
SDO and SDI. The SDO signal is the output from the Slave
(NCV78825), and the SDI signal is the output from the
Master.
A slave or chip select line (CSB) allows individual
selection of a slave SPI device in a time multiplexed
multiple−slave system.
The CSB line is active low. If an NCV78825 is not
selected, SDO is in high impedance state and it does not
interfere with SPI bus activities. Since the NCV78825
always clocks data out on the falling edge and samples data
in on rising edge of clock, the MCU SPI port must be
configured to match this operation.
The implemented SPI allows connection to multiple
slaves by means of star connection (CSB per slave) or by
means of daisy chain.
An SPI star connection requires a bus = (3 + N) total lines,
where N is the number of Slaves used, the SPI frame length
is 16 bits per communication.
NCV78825 dev#1
(SPI Slave)
NCV78825 dev#2
(SPI Slave)
NCV78825 dev#N
(SPI Slave)
MCU
(SPI Master)
CSB1
CSB2
Figure 21. SPI Star vs. Daisy Chain Connection
SPI Daisy Chain Mode
SPI daisy chain connection bus width is always four lines
independently on the number of slaves. However, the SPI
transfer frame length will be a multiple of the base frame
length so N × 16 bits per communication: the data will be
interpreted and read in by the devices at the moment the CSB
rises.
A diagram showing the data transfer between devices in
daisy chain connection is given further: CMDx represents
the 16−bit command frame on the data input line transmitted
by the Master, shifting via the chips’ shift registers through
the daisy chain. The chips interpret the command once the
chip select line rises.
The NCV78825 default power up communication mode
is “star”. In order to enable daisy chain mode, a multiple of
16 bits clock cycles must be sent to the devices. It is
recommended to keep SDI line low during this first SPI
frame. In order to come back to star mode the NOP register
(address 0x00) must be written with all ones, with the proper
MCU
(SPI Master)
MOSI
MISO SDO1
SDI2
SDO2
SDIN
NCV78825 dev#1
(SPI Slave)
NCV78825 dev#2
(SPI Slave)
NCV78825 dev#N
(SPI Slave)
data parity bit and parity framing bit: see SPI protocol for
details about parity and write operation.
COMMANDS IN THE SHIF
CSB
SCLK
DIN
DOUT
DIN
DOUT
DIN
DOUT
16
CYCLES
CMD1CMD2CMD3
1
1
X
2
2
3
3
CYCLES16CYCLES
CMD1
XX
XXX
Low
16
CMD2
CMD1
Figure 22. SPI Daisy Chain Data Shift Between
Slaves. The symbol ‘x’ Represents the Previous
Content of the SPI Shift Register Buffer
REGISTERS ARE
EXECUTED ON RISING
EDGE OF CSB
www.onsemi.com
30
NCV78825
SPI Transfer Format
Two types of SPI commands (to SDI pin of NCV78825)
from the micro controller can be distinguished: “Write to a
control register” and “Read from register (control or
status)”.
CSB
C
SDI
SDO
SCLK
M
D
S
P
I
E
R
R
S
P
I
E
R
R
A3A2A
C
A3A2A1A
M
D
C
A
M
4
D
A0D
P
1
0
A3A2A1A
D7D6D5D4D3D2D1D
D
9
8
D7D6D5D4D3D2D1D
D9D
8
P0 1 1
P
0
The frame protocol for the write operation:
Write; CMD = ‘1’
High
Low
0
Low
0
HIGH−Z
B
L
L
U
C
1
K
O
C
T
E
D
2
T
E
S
W
D
D
1
Low
Previous SPI WRITE command
resp. “SPIERR + 0x000hex”
after POR or SPI Command
PARITY/FRAMING Error
Previous SPI READ command
& NCV78825 status bits resp.
“SPIERR
Referring to the previous picture, the write frame coming
from the master (into the SDI) is composed from the
following fields:
• Bit[15] (MSB): CMD bit = 1 for write operation
• Bits[14:11]: 4 bits WRITE ADDRESS field
• Bit[10]: frame parity bit. It is ODD parity formed by
the negated XOR of all other bits in the frame
• Bits[9:0]: 10 bit DATA to write
Device in the same time replies to the master (on the
• If the previous command was a read, the response
frame summarizes the address used and an overall
diagnostic check (copy of the main detected errors, see
Figure 23 and Figure 24 for details)
• In case of previous SPI error, only the MSB bit will be
1, followed by zeros
• After power−on−reset all bits are zero
If parity bit in the frame is wrong, device will not perform
command and <SPI> flag will be set.
SDO):
• If the previous command was a write and no SPI error
had occurred, a copy of the command, address and data
written fields
www.onsemi.com
31
The frame protocol for the read operation:
s
CSB
C
A3A2A
SDI
SDO
A
M
4
D
S
B
P
U
I
C
E
K
R
O
R
C
1
L
L
T
E
E
S
D
D
D
2
1
Read; CMD = ‘0’
A
P
0
D8D7D6D5D4D3D
D
T
W
9
NCV78825
Low
Low
2
D1D
High
LED 1 = OPENLED1 or SHORTLED1
LED 2 = OPENLED2 or SHORTLED2
BUCKOC = OCLED1 or OCLED2
−> immediate value of STATUS BITS;
Dedicated SPI READ Command of the
STATUS Register has to be performed to
clear the value of read−by−clear STATUS bit
Low
Data from address A[4:0]
0
shall be returned
HIGH−Z
SCLK
P = not (CMD xor A4 xor A3 xor A2 xor A1 xor A0)
Figure 24. SPI Read Frame
Referring to the previous picture, the read frame coming
from the master (into the SDI) is composed from the
following fields:
• Bit[15] (MSB): CMD bit = 0 for read operation
• Bits[14:10]: 5 bits READ ADDRESS field
• Bit[10]: frame parity bit. It is ODD parity formed by
the negated XOR of all other bits in the frame
• Bits [8:0]: 9 bits zeroes field
Device in the same frame provides to the master (on the
SDO) data from the required address (in frame response),
thus achieving the lowest communication latency .
Low
SPI Framing and Parity Error
SPI communication framing error is detected by the
NCV78825 in the following situations:
• Not an integer multiple of 16 CLK pulses are received
during the active−low CSB signal
• LSB bits (8..0) of a read command are not all zero
• SPI parity errors, either on write or read operation
Once an SPI error occurs, the <SPI> flag can be reset only
by reading the status register in which it is contained (using
in the read frame the right communication parity bit).
Buck 1 Low Side Pre−driver Enable bit for low VLED voltage (< 1.8 V typ.).
0: LS1 Pre−driver disabled for low VLED.
1: LS1 Pre−driver enabled for low VLED.
Buck 2 Low Side Pre−driver Enable bit for low VLED voltage (< 1.8 V typ.).
0: LS2 Pre−driver disabled for low VLED.
1: LS2 Pre−driver enabled for low VLED.
www.onsemi.com
34
3. BUCK1_ISENS_THR[2:0]
Buck 1 Peak Current Range selection.
000: Range 1
001: Range 2
010: Range 3
011: Range 4
100: Range 5
The range setting will be applied only after the writing BUCK1 Peak Current value in BUCK1_VTHR[8:0] bits.
4. BUCK2_ISENS_THR[2:0]
Buck 2 Peak Current Range selection.
000: Range 1
001: Range 2
010: Range 3
011: Range 4
100: Range 5
The range setting will be applied only after the writing BUCK2 Peak Current value in BUCK2_VTHR[8:0] bits.
00: Over−current must be valid for more than 1 switching period
01: Over−current must be valid for more than 2 switching period
10: Over−current must be valid for more than 3 switching period
11: Over−current must be valid for more than 4 switching period
www.onsemi.com
35
BUCK2
_EN
5. FSO_MD[2:0] − Fail−Safe Operation / Stand−Alone mode selection (See Table 19 for details).
000: FSO mode disabled, Registers loaded with Safe values,
001: FSO mode disabled, Registers loaded from OTP memory
010: FSO mode enabled, Registers loaded with Safe values
011: FSO mode enabled, Registers loaded with Safe values, SPI update in FSO
100: FSO mode enabled, Registers loaded from OTP memory
101: FSO mode enabled, Registers loaded from OTP memory, SPI update in FSO
110: Stand−alone mode, Registers loaded from OTP memory
111: Stand−alone mode, Registers loaded from OTP memory, SPI update in FSO
1. ODD PARITY − Odd Parity Bit over Diagnostic bits.
2. OPENLED1 − Buck 1 Open LED string Flag, Latched
1: Too long TON time has been detected, TON > TON_OPEN (50 μs typ.)
3. SHORTLED1 − Buck 1 Short LED string Flag, Latched
1: Low string voltage has been detected, VLED1 < VLED_LMT (1.8 V typ.). Flag is cleared by read
4. OCLED1 − Buck 1 Over−Current LED string Flag, Latched
1: Too high current has been detected during 2 + BUCK_OC_OCCMP_THR[1:0] consecutive periods
5. OPENLED2 − Buck 2 Open LED string Flag, Latched
1: Too long TON time has been detected, TON > TON_OPEN (50 μs typ.)
6. SHORTLED2 − Buck 2 Short LED string Flag, Latched
1: Low string voltage has been detected, VLED2 < VLED_LMT (1.8 V typ.)
7. OCLED2 − Buck 2 Over−Current LED string Flag, Latched
1: Too high current has been detected during 2 + BUCK_OC_OCCMP_THR[1:0] consecutive periods
Name0ODD
PARITY
Reset0100000000
AccessRRRRRRRRRR
Flag is cleared by read
Over−current detection level, Range 1 = 305 mA (min value)
Over−current detection level, Range 2 = 609 mA (min value)
Over−current detection level, Range 3 = 1219 mA (min value)
Over−current detection level, Range 4 = 2437 mA (min value)
Over−current detection level, Range 5 = 4875 mA (min value)
Flag is cleared by read
Flag is cleared by read
Flag is cleared by read
Over−current detection level, Range 1 = 305 mA (min value)
Over−current detection level, Range 2 = 609 mA (min value)
Over−current detection level, Range 3 = 1219 mA (min value)
Over−current detection level, Range 4 = 2437 mA (min value)
Over−current detection level, Range 5 = 4875 mA (min value)
Flag is cleared by read
1. ODD PARITY − Odd Parity Bit over Trimming bits.
2. BUCK_ISENS_TC1[3:0] − Peak current temperature coefficient for Buck 1 and Ranges 3, 4, 5.
This coefficient is signed and stored as T wo’s complement.
1. ODD PARITY − Odd Parity Bit over Trimming bits.
2. BUCK_ISENS_TC3[3:0] − Peak current temperature coefficient for Buck 2 and Ranges 3, 4, 5.
This coefficient is signed and stored as T wo’s complement.
1. REVID[8:0] − Revision ID – identification of device.
REVID[4:3]: Full Mask Version
REVID[1:0]: Metal Tune
Name0REVID[8:0]
Reset01000XX0XX
AccessRRRRRRRRRR
0x108:The first silicon (P78825900)(Full Mask = 1, Metal Tune = 0)
0x109:The second silicon (NV78825−0)(Full Mask = 1, Metal Tune = 1)
0x10A:The third silicon (NV78825−0) (Full Mask = 1, Metal Tune = 2)
POR values (Reset field) of status registers are shown in
situation that FSO mode is not entered after POR. ‘X’
means that value after reset is defined during reset phase
(diagnostics) or is trimmed during manufacturing process.
www.onsemi.com
43
OTP MEMORY
Description
The OTP (Once Time Programmable) memory contains
40 bits which bear the most important application
dependent parameters and is user programmable via SPI
interface. The programming of these bits is typically done
at the end of the module manufacturing line.
OTP memory serves to store configuration data for
Fail−Safe or Stand−Alone functionality or default
configuration of the chip after power−up.
The OTP bits can be programmed only once, this is
ensured by dedicated OTP Lock Bit which is set during
programming.
The OTP bits addressed by SPI register
OTP_ADDR[1:0] are accessible (read only) in the SPI
register OTP_DATA[9:0] after OTP Refresh operation
(OTP_OPERATION[1:0] = 0x1) in the following way:
OTP_ADDR[1:0] = 0x0: OTP_DATA[9:0] = OTP[9:0]
OTP_ADDR[1:0] = 0x1: OTP_DATA[9:0] = OTP[19:10]
OTP_ADDR[1:0] = 0x2: OTP_DATA[9:0] = OTP[29:20]
OTP_ADDR[1:0] = 0x3: OTP_DATA[9:0] = OTP[39:30]
OTP Operations
The NCV78825 supports following operations with OTP
memory:
• OTP_OPERATION[1:0] = 0x0 or 0x3:
NOP (no operation)
• OTP_OPERATION[1:0] = 0x1:
OTP Refresh – refresh of the whole OTP memory
(40 bits). Data addressed by SPI register
OTP_ADDR[1:0] are available in SPI register
OTP_DATA[9:0] after the end of OTP Refresh
operation.
• OTP_OPERATION[1:0] = 0x2:
OTP Zap – data from SPI register (those listed in
Table 53) and OTP Lock Bit are programmed into OTP
memory. OTP Zap operation is allowed to be
performed only once − when OTP Lock Bit is
unprogrammed.
SPI status bit OTP_ACTIVE is set to “log. 1” when an
OTP operation is in progress.
OTP Programming Procedure
Following procedure should be applied to program OTP
memory:
• VBOOST voltage has to be in range between 15 V and
20 V with current capability at least 50 mA
• VDRIVE voltage has to be kept in range for normal
mode operation
• The junction temperature has to stay in range from
0 °C to 125 °C during OTP programming.
• SPI registers listed in Table 53 have to be written with
required content
• Content of the SPI registers (those listed in Table 53)
is programmed into the OTP memory by
OTP_OPERATION[1:0] = 0x2 SPI write command.
OTP Lock Bit is programmed automatically at the
same time to prevent any further OTP programming
OTP Programming Verification
OTP_FAIL bit in the SPI status register is set when
VBOOST under−voltage (see OTP_UV parameter) is
detected during OTP Zap operation. It is clear by read flag.
The OTP_BIAS_H and OTP_BIAS_L registers are used
to check proper OTP programming. After OTP
programming, the OTP content has to be the same as
programmed when OTP is read with OTP_BIAS_H = 1
and OTP_BIAS_L = 1.
Following procedure should be applied to verify OTP
content:
• VDD voltage has to be kept in range for normal mode
operation
• Write SPI registers OTP_BIAS_L = 1 and
OTP_BIAS_H = 0
• Write SPI register OTP_OPERATION[1:0] = 0x1
(OTP Refresh) for all OTP_ADDR[1:0] values and
check corresponding OTP_DATA[9:0] content which
has to match with previously programmed data
• Write SPI registers OTP_BIAS_L = 0 and
OTP_BIAS_H = 1
• Write SPI register OTP_OPERATION[1:0] = 0x1
(OTP Refresh) for all OTP_ADDR[1:0] values and
check corresponding OTP_DATA[9:0] content which
has to match with previously programmed data
• Programming is considered as successful when no
mismatch is observed
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44
PCB LAYOUT RECOMMENDATIONS
This section contains instructions for the NCV78825
PCB layout application design. Although this guide does
not claim to be exhaustive, these directions can help the
developer to reduce application noise impact and insuring
the best system operation
• External components for each BUCK channel have to
be placed as close as possible to NCV78825 device in
order to minimize switching loop − preferably all
components on same layer as NCV78825 device
• Power tracks have to be as short as possible with low
impedance. Special attention has to be paid for proper
routing of VINBCKx pins and VBOOST pin in order
to ensure same potential between these pins and right
functionality of M3V voltage regulator, especially at
high currents.
INPUT CAP
LS FET
• Switching loop created by Input Capacitor, internal
High Side Switch and external Low Side Switch has to
be minimized
• VDD and VDRIVE decoupling capacitors should be as
close as possible to NCV78825 device
• Shielding ground layer below external components of
Buck regulator can be created
• Exposed pad connection has to ensure perfect cooling
of the NCV78825 device
• Usage of double LS FET in one package for both
channels is not recommended because of increasing
switching loop area
1. DIMENSIONING AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.13 TOTAL IN
EXCESS OF THE b DIMENSION AT MMC.
4. DIMENSION b SHALL BE MEASURED BETWEEN 0.10 AND 0.25 FROM THE TIP.
5. DIMENSIONS D AND E1 DO NOT INCLUDE
MOLD FLASH, PROTRUSIONS OR GATE
BURRS. DIMENSIONS D AND E1 SHALL BE
DETERMINED AT DATUM H.
6. THIS CHAMFER FEATURE IS OPTIONAL. IF
IT IS NOT PRESENT, A PIN ONE IDENTIFIER
MUST BE LOACATED WITHIN THE INDICATED AREA.
MILLIMETERS
DIM MINMAX
---
A2.65
A1---0.10
A22.152.60
b0.180.30
c0.230.32
D10.30 BSC
D25.705.90
E10.30 BSC
c
E17.50 BSC
E23.904.10
e0.50 BSC
h0.250.75
L0.500.90
L20.25 BSC
M0 8
__
M15 15
__
GENERIC
MARKING DIAGRAM*
M
XXXXXXXXXX
L
*This information is generic. Please refer
to device data sheet for actual part
marking.
XXXXXXXXXX
XXXXXXXXXX
AWLYYWWG
XXXX = Specific Device Code
A= Assembly Location
WL= Wafer Lot
YY= Year
WW= Work Week
G= Pb−Free Package
1
0.50
PITCH
DIMENSIONS: MILLIMETERS
DOCUMENT NUMBER:
DESCRIPTION:
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