The NCV48220 is very low quiescent current 150 mA LDO
regulator with integrated battery voltage charge pump boost converter
for automotive applications requiring full functionality during battery
voltage drop events (e.g. cranking). The NCV48220 require very low
number of external components. Very low quiescent current as low as
35 mAtypical for NCV48220 makes it suitable for applications
permanently connected to battery requiring very low quiescent
current. The Enable function can be used for further decrease of
quiescent current down to 1 mA. The NCV48220 contains protection
functions as current limit, thermal shutdown and reverse bias current
protection.
Features
• Output Voltage: 5 V
• LDO Output Current: up to 150 mA
• Very Wide Input Voltage Operation Range: from 3 V to 40 V
• Very Low Quiescent Current:typ 35 mA
• Enable Function (1.0 mA max quiescent current when disabled)
• Microprocessor Compatible Control Functions:
♦ Reset Output
• AEC−Q100 Grade 1 Qualified and PPAP Capable
• Protection Features:
♦ Current Limitation
♦ Thermal Shutdown
♦ Reverse Bias Output Current
• This is a Pb−Free Device
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MARKING
DIAGRAMS
8
8
1
A= Assembly Location
L= Wafer Lot
Y= Year
W= Work Week
G= Pb−Free Package
(Note: Microdot may be in either location)
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 14 of this data sheet.
Charge Pump Output Voltage (Input Voltage of LDO).
Charge Pump Input Voltage.
Reset Output. 30 kW internal Pull−up resistor connected between RO and V
out of regulation. See ELECTRICAL CHARACTERISTICS table for delay time specifications.
out
Regulated Output Voltage of LDO.
18
V
CP
C+
C−
V
in
SOIC−8
V
out
RO
EN
GND
. RO goes Low when V
out
out
is
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3
NCV48220
MAXIMUM RATINGS
RatingSymbolMinMaxUnit
Charge Pump Input Voltage DC (Note 1)V
Charge Pump Input Voltage (Note 2)
Load Dump − Suppressed
Charge Pump Output VoltageV
Positive Flying Capacitor VoltageV
Negative Flying Capacitor VoltageV
Regulated Output VoltageV
Enable Input Voltage DC
DC
in
U
S
CP
C+
C−
out
V
EN
Transient, t < 100 ms
Reset Output VoltageV
Maximum Junction TemperatureT
Storage Temperature RangeT
RO
J(max)
STG
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Refer to ELECTRICAL CHARACTERISTICS and APPLICATION INFORMATION for Safe Operating Area.
2. Load Dump Test B (with centralized load dump suppression) according to ISO16750−2 standard. Guaranteed by design. Not tested in
production. Passed Class A according to ISO16750−1.
−0.340V
−45V
−0.316V
−0.316V
−0.37V
−0.37V
−0.3
−
40
45
−0.37V
−150°C
−55150°C
V
ESD CAPABILITY (Note 3)
RatingSymbolMinMaxUnit
ESD Capability, Human Body ModelESD
HBM
−22kV
3. This device series incorporates ESD protection and is tested by the following methods:
ESD Human Body Model tested per AEC−Q100−002 (JS−001−2010)
Field Induced Charge Device Model ESD characterization is not performed on plastic molded packages with body sizes <50mm
to the inability of a small package body to acquire and retain enough charge to meet the minimum CDM discharge current waveform
characteristic defined in JEDEC JS−002−2014.
LEAD SOLDERING TEMPERATURE AND MSL (Note 4)
Rating
Moisture Sensitivity LevelMSL1−
4. For more information, please refer to our Soldering and Mounting Techniques Reference Manual, SOLDERRM/D
SymbolMinMaxUnit
THERMAL CHARACTERISTICS
RatingSymbolValueUnit
Thermal Characteristics, SOIC−8
5. Values based on 1s0p board with copper area of 645 mm2 (or 1 in2) of 1 oz copper thickness and FR4 PCB substrate.
6. Values based on 2s2p board with copper area of 645 mm
layers and FR4 PCB substrate.
(or 1 in2) of 1 oz copper thickness for inner layers, 2 oz copper thickness for single
106
62.5
74
59.5
2
°C/W
due
RECOMMENDED OPERATING RANGES
RatingSymbolMinMaxUnit
Charge Pump Input VoltageV
LDO Input VoltageV
Junction TemperatureT
in
CP
J
3.040V
3.514V
−40150°C
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
7. Performance guaranteed over the indicated operating temperature range by design and/or characterization tested at T
pulse techniques are used during testing to maintain the junction temperature as close to ambient as possible.
8. Measured when output voltage falls 100 mV below the regulated voltage at V
9. Reset Delay Times can be chosen from list: 0, 2, 4, 8, 16, 32, 64, 128 ms (Reset Delay Time 0 ms represents Power Good function) and
= 13.5 V.
CP
[TJ. Low duty cycle
A
these delay times are factory preset.
10.Values based on design and/or characterization.
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