ON Semiconductor C106M1, C106M, C106D1, C106D, C106B Datasheet

C106 Series
Preferred Devices
Sensitive Gate Silicon Controlled Rectifiers
Glassivated PNPN devices designed for high volume consumer applications such as temperature, light, and speed control; process and remote control, and warning systems where reliability of operation is important.
Glassivated Surface for Reliability and Uniformity
Power Rated at Economical Prices
Practical Level Triggering and Holding Characteristics
Flat, Rugged, Thermopad Construction for Low Thermal Resistance,
High Heat Dissipation and Durability
Sensitive Gate Triggering
Device Marking: Device Type, e.g., C106B, Date Code
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SCRs
4 AMPERES RMS
200 thru 600 VOLTS
G
A
K
MAXIMUM RATINGS (T
Rating Symbol Value Unit
Peak Repetitive Off–State Voltage (Note 1)
(Sine Wave, 50–60 Hz, R T
= –40° to 110°C)
C
On-State RMS Current
(180° Conduction Angles, T
Average On–State Current
(180° Conduction Angles, T
Peak Non-Repetitive Surge Current
(1/2 Cycle, Sine Wave, 60 Hz,
= +110°C)
T
J
Circuit Fusing Considerations (t = 8.3 ms) I2t 1.65 A2s Forward Peak Gate Power
(Pulse Width 1.0 µsec, T
Forward Average Gate Power
(Pulse Width 1.0 µsec, T
Forward Peak Gate Current
(Pulse Width 1.0 µsec, T
Operating Junction Temperature Range T
Storage Temperature Range T
Mounting Torque (Note 2) 6.0 in. lb.
1. V
2. Torque rating applies with use of compression washer (B52200F006).
and V
DRM
apply for zero or negative gate voltage; however, positive gate voltage shall not be applied concurrent with negative potential on the anode. Blocking voltages shall not be tested with a constant current source such that the voltage ratings of the devices are exceeded.
Mounting torque in excess of 6 in. lb. does not appreciably lower case-to-sink thermal resistance. Anode lead and heatsink contact pad are common.
for all types can be applied on a continuous basis. Ratings
RRM
= 25°C unless otherwise noted)
J
= 1 kΩ,
GK
C106B C106D, C106D1 C106M, C106M1
= 80°C)
C
= 80°C)
C
= 80°C)
C
= 80°C)
C
= 80°C)
C
V
V
I
T(RMS)
I
P
DRM,
RRM
T(AV)
I
TSM
P
GM
G(AV)
I
GM
stg
Volts
200 400 600
4.0 Amps
2.55 Amps
20 Amps
0.5 Watt
0.1 Watt
0.2 Amp
–40 to
J
+110
–40 to
+150
°C
°C
3
2
1
TO–225AA
(formerly TO–126)
CASE 077
STYLE 2
PIN ASSIGNMENT
1 2 3
Cathode
Anode
Gate
ORDERING INFORMATION
Device Package Shipping
C106B TO225AA 500/Box C106D TO225AA C106D1 TO225AA 500/Box
C106M TO225AA C106M1 TO225AA
Preferred devices are recommended choices for future use and best overall value.
500/Box
500/Box 500/Box
Semiconductor Components Industries, LLC, 2002
March, 2002 – Rev . 4
1 Publication Order Number:
C106/D
C106 Series
THERMAL CHARACTERISTICS (T
= 25°C unless otherwise noted.)
C
Characteristic
Thermal Resistance, Junction to Case R Thermal Resistance, Junction to Ambient R Maximum Lead Temperature for Soldering Purposes 1/8 from Case for 10 Seconds T
ELECTRICAL CHARACTERISTICS (T
Characteristic
= 25°C unless otherwise noted.)
C
Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Peak Repetitive Forward or Reverse Blocking Current
(V
= Rated V
AK
DRM
or V
, RGK = 1000 Ohms) TJ = 25°C
RRM
= 110°C
T
J
I
DRM
, I
RRM
ON CHARACTERISTICS
Peak Forward On–State Voltage (Note 3)
(I
= 4 A)
TM
Gate Trigger Current (Continuous dc) (Note 4)
(V
= 6 Vdc, RL = 100 Ohms) TJ = 25°C
AK
T
= –40°C
J
Peak Reverse Gate Voltage (IGR = 10 µA) V Gate Trigger Voltage (Continuous dc) (Note 4)
(V
= 6 Vdc, RL = 100 Ohms) TJ = 25°C
AK
= –40°C
T
J
Gate Non–Trigger Voltage (Continuous dc) (Note 4)
(V
= 12 V, RL = 100 Ohms, TJ = 110°C)
AK
Latching Current
= 12 V, IG = 20 mA) TJ = 25°C
(V
AK
T
= –40°C
J
Holding Current (VD = 12 Vdc)
(Initiating Current = 20 mA, Gate Open) T
= 25°C
J
= –40°C
T
J
T
= +110°C
J
V
I
GT
GRM
V
V
I
I
TM
GT
GD
L
H
DYNAMIC CHARACTERISTICS
Critical Rate–of–Rise of Off–State Voltage
(V
= Rated V
AK
= 110°C)
T
J
, Exponential Waveform, RGK = 1000 Ohms,
DRM
3. Pulse Test: Pulse Width ≤ 2.0 ms, Duty Cycle ≤ 2%.
is not included in measurement.
4. R
GK
dv/dt 8.0 V/µs
Symbol Max Unit
θ
JC
θ
JA L
– –
3.0 °C/W 75 °C/W
260 °C
– –
10
100
2.2 Volts
– –
15 35
200 500
6.0 Volts
0.4
0.5
0.60
0.75
0.8
1.0
0.2 Volts
– –
– – –
0.20
0.35
0.19
0.33
0.07
5.0
7.0
3.0
6.0
2.0
µA µA
µA
Volts
mA
mA
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2
C106 Series
Voltage Current Characteristic of SCR
+ Current
Anode +
Symbol Parameter
V
DRM
I
DRM
V
RRM
I
RRM
V
TM
I
H
110
100
90
°T , CASE TEMPERATURE ( C)
80
70
60
50
40
30
C
20 10
0 .4 .8 1.61.2 2.0 2.4 3.2
Peak Repetitive Off State Forward Voltage Peak Forward Blocking Current Peak Repetitive Off State Reverse Voltage Peak Reverse Blocking Current Peak On State Voltage Holding Current
HALF SINE WAVE RESISTIVE OR INDUCTIVE LOAD. 50 to 400 Hz
I
AVERAGE ONSTATE CURRENT (AMPERES)
T(AV)
Figure 1. Average Current Derating Figure 2. Maximum On–State Power Dissipation
DC
2.8
at V
I
RRM
RRM
Reverse Blocking Region
(off state)
Reverse Avalanche Region
Anode –
10
8
HALF SINE WAVE RESISTIVE OR INDUCTIVE LOAD 50 TO 400Hz.
6
4
2
0
(AV)
P , AVERAGE ONSTATE POWER DISSIPATION (WATTS)
0
3.6
4.0
V
TM
on state
I
H
I
at V
DRM
Forward Blocking Region
(off state)
JUNCTION TEMPERATURE 110°C
I
AVERAGE ONSTATE CURRENT (AMPERES)
T(AV)
+ Voltage
DRM
DC
3.6.4 .8 1.61.2 2.0 2.4 3.2 4.02.6
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3
C106 Series
100
I
, GATE TRIGGER CURRENT ( A)
GT
1
, JUNCTION TEMPERATURE (°C)
T
J
65
95-40 -25 -10 20535508010110
Figure 3. Typical Gate Trigger Current versus
Junction Temperature
1.0
0.9
0.8
0.7
1000
I
, HOLDING CURRENT ( A)
H
1000
I
100
10
, JUNCTION TEMPERATURE (°C)
T
J
Figure 4. Typical Holding Current versus
Junction Temperature
65
95-40 -25 -10 205355080
110
0.6
0.5
0.4
, GATE TRIGGER VOLTAGE (V)
GT
V
0.3
0.2
, JUNCTION TEMPERATURE (°C)
T
J
65
95-45 -25 -10 205355080
Figure 5. Typical Gate Trigger Voltage versus
Junction Temperature
110
100
, LATCHING CURRENT ( A)
L
10
, JUNCTION TEMPERATURE (°C)
T
J
65
95-40 -25 -10 205355080
110
Figure 6. Typical Latching Current versus
Junction Temperature
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4
C106 Series
Package Interchangeability
The dimensional diagrams below compare the critical dimensions of the ON Semiconductor C-106 package with competitive d evices. It has b een demonstrated that the smaller dimensions o f the ON Semiconductor package make it compatible in most lead-mount and chassis-mount applications. The user is advised to compare all critical dimensions for mounting compatibility.
.400
.295
____ .305
.145
____ .155
.148
____
.158
123
.050
____ .095
.020
____ .026
.425
____ .435
.575
____ .655
.040
.094 BSC
.025
____
.035
.115
____ .130
5 TYP
.095
____ .105
.015
____ .025
.045
____ .055
____ .360
.127
.135
____ .115
.385
____ .365
.420
____ .400
.105
____ .095
____
DIA
.123
.520
____ .480
.315
____ .285
.105
____ .095
.054
____ .046
.026
____
.019
.190
____ .170
ON Semiconductor C-106 Package
Competitive C-106 Package
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5
C106 Series
PACKAGE DIMENSIONS
TO–225AA
(formerly TO–126)
CASE 077–09
ISSUE W
–B–
–A–
K
F
M
U
Q
132
H
V
G
0.25 (0.010) B
S
D
2 PL
M
0.25 (0.010) B
A
C
J
R
M
M
A
M
M
M
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
DIM MIN MAX MIN MAX
A 0.425 0.435 10.80 11.04 B 0.295 0.305 7.50 7.74 C 0.095 0.105 2.42 2.66 D 0.020 0.026 0.51 0.66 F 0.115 0.130 2.93 3.30 G 0.094 BSC 2.39 BSC H 0.050 0.095 1.27 2.41 J 0.015 0.025 0.39 0.63 K 0.575 0.655 14.61 16.63
M 5 TYP 5 TYP

Q 0.148 0.158 3.76 4.01 R 0.045 0.065 1.15 1.65 S 0.025 0.035 0.64 0.88 U 0.145 0.155 3.69 3.93 V 0.040 --- 1.02 ---
STYLE 2:
PIN 1. CATHODE
2. ANODE
3. GATE
MILLIMETERSINCHES
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6
Notes
C106 Series
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7
C106 Series
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C106/D
8
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