The CBT3126 is a quad FET bus switch with independent line switches. Each switch is
disabled when the associated Output Enable (OE) input is LOW.
The CBT3126 is characterized for operation from −40 °Cto+85°C.
2.Features
n Standard ’126-type pinout
n Multiple package options
n 5 Ω switch connection between two ports
n TTL-compatible input levels
n Minimal propagation delay through the switch
n Latch-up protection exceeds 500 mA per JEDEC standard JESD78 class II level A
n ESD protection:
u HBM JESD22-A114E exceeds 2000 V
u MM JESD22-A115-A exceeds 200 V
u CDM JESD22-C101C exceeds 1000 V
n Specified from −40 °Cto+85°C
3.Ordering information
Table 1.Ordering information
Type numberTemperature rangePackage
NameDescriptionVersion
CBT3126D−40 °Cto+85°CSO14plastic small outline package; 14 leads;
body width 3.9 mm
CBT3126DB−40 °Cto+85°CSSOP14plastic shrink small outline package; 14 leads;
body width 5.3 mm
CBT3126PW−40 °Cto+85°CTSSOP14plastic thin shrink small outline package; 14 leads;
body width 4.4 mm
[1]
CBT3126DS−40 °Cto+85°CSSOP16
[1] Also known as QSOP16.
plastic shrink small outline package; 16 leads;
body width 3.9 mm; leadpitch 0.635 mm
Product data sheetRev. 04 — 12 October 20092 of 13
NXP Semiconductors
CBT3126
Quad FET bus switch
Table 2.Pin description
…continued
SymbolPinDescription
SOT108-1 SOT337-1 and SOT402-1 SOT519-1
GND78ground (0 V)
V
CC
1416positive supply voltage
n.c.-1, 9not connected
6.Functional description
Table 3.Function selection
H = HIGH voltage level; L = LOW voltage level.
InputsSwitch
nOE
LnA to nB disconnected
HnA to nB connected
7.Limiting values
Table 4.Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol ParameterConditionsMinMaxUnit
V
V
I
I
T
P
CC
I
SW
IK
stg
tot
supply voltage−0.5+7.0V
input voltage
[1]
−0.5+7.0V
switch currentcontinuous current through each switch-128mA
input clamping currentVI<0V−50-mA
storage temperature−65+150°C
total power dissipationT
= −40 °C to +125 °C
amb
SO14 package
SSOP14 and SSOP16 package
TSSOP14 package
[2]
[3]
-500mW
[4]
-500mW
[4]
-500mW
[1] The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.
[2] The package thermal impedance is calculated from JESD51-7.
[3] For SO14 package; P
[4] For SSOP14, SSOP16 and TSSOP14 packages; P
derates linearly with 8 mW/K above 70 °C.
tot
derates linearly with 5.5 mW/K above 70 °C.
tot
8.Recommended operating conditions
Table 5.Operating conditions
All unused control inputs of the device must be held at VCC or GND to ensure proper device operation.
input capacitancecontrol pins; VI= 3 V or 0 V-1.7-pF
off-state input/output capacitanceVO= 3 V or 0 V; nOE = V
ON resistanceVCC= 4.0 V
CC
-3.4-pF
[3]
VI= 2.4 V; II= 15 mA-1622Ω
= 4.5 V
V
CC
=0V; II=64mA-57Ω
V
I
=0V; II=30mA-57Ω
V
I
= 2.4 V; II= 15 mA-1015Ω
V
I
CBT3126
[1]
MaxUnit
[1] All typical values are measured at VCC=5V; T
[2] This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
[3] Measured by the voltage drop between the A and the B terminals at the indicated current through the switch. ON resistance is
determined by the lowest voltage of the two (A or B) terminals.
amb
=25°C.
10. Dynamic characteristics
Table 7.Dynamic characteristics
T
=−40°C to +85°C; VCC= 4.5 V to 5.5 V; for test circuit see Figure 8.
amb
SymbolParameterConditionsMinMaxUnit
t
pd
t
en
t
dis
[1] This parameter is warranted but not production tested. The propagation delay is based on the RC time constant of the typical ON
resistance of the switch and a load capacitance, when driven by an ideal voltage source (zero output impedance).
[2] t
PLH
t
PZL
t
PLZ
propagation delaynA to nB or nB to nA; see Figure 6
enable timenOE to nA or nB; see Figure 7
disable timenOE to nA or nB; see Figure 7
Product data sheetRev. 04 — 12 October 20095 of 13
NXP Semiconductors
12. Test information
negative
pulse
0 V
positive
pulse
0 V
CBT3126
Quad FET bus switch
t
V
CC
DUT
W
V
M
t
r
t
f
V
M
t
W
V
EXT
R
V
O
C
L
R
L
L
V
I
90 %
V
M
10 %
t
f
t
10 %
r
90 %
V
M
V
I
R
T
V
I
G
001aae331
Test data is given in Table 9.
Definitions for test circuit:
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to the output impedance Zo of the pulse generator.
V
= External voltage for measuring switching times.
EXT
Fig 8.Test circuit for measuring switching times
Table 9.Test data
Supply voltageInputLoadV
V
CC
V
I
tr, t
f
C
L
R
L
t
EXT
PLH
, t
PHL
t
PLZ
, t
PZL
t
PHZ
4.5 V to 5.5 VGND to 3.0 V≤ 2.5 ns50 pF500 Ωopen7.0 Vopen
CBT3126_420091012Product data sheet-CBT3126_3
Modifications:
CBT3126_320081209Product data sheet-CBT3126_2
CBT3126_220081023Product data sheet-CBT3126_1
CBT3126_120011212Product data sheet--
Product data sheetRev. 04 — 12 October 200911 of 13
NXP Semiconductors
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CBT3126
Quad FET bus switch
Document status
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