Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage 6V
Output Current 30 mA
Maximum Junction Temperature +125˚C
Storage Temperature Range −65˚C to +150˚C
Lead Temperature
(Soldering 10 seconds) +300˚C
ESD Rating (Human body Model) 1000V
Package Thermal Resistance
θ
JA
Surface Mount AJE 125˚C
θ
JC
Surface Mount AJE 105˚C/W
Reliability Information
Transistor Count 72
MTTF 254 Mhr
Recommended Operating
Conditions
Supply Voltage Range (VCC–VEE) +4.5V to +5.5V
Electrical Characteristics
(VCC= 0V, VEE= −5V; unless otherwise specified).
Parameter Conditions
Typ
+25˚C
Min/Max
+25˚C
Min/Max
0˚C to
+70˚C
Min/Max
−40˚C to
+85˚C
Units
STATIC PERFORMANCE
Supply Current, Loaded (Notes 5, 7) 39 - - - mA
Supply Current, Unloaded (Note 3) 34 28/37 26/39 26/39 mA
Output HIGH Voltage (V
OH
) (Note 3) −1.7 −2.0/1.4 −2.0/1.4 −2.0/1.4 V
Output Low Voltage (V
OL
) (Note 3) −3.3 −3.6/3.0 −3.6/3.0 −3.6/3.0 V
Input Bias Current (Note 4) 10 30 50 50 µA
Output Swing (Note 3) 1.65 1.55/1.75 1.53/1.77 1.51/1.79 V
Common Mode Input Range Upper Limit −0.7 −0.8 −0.8 −0.8 V
Common Mode Input Range Lower Limit −2.6 −2.5 −2.5 −2.5 V
Minimum Differential Input Swing (Note 5) 200 200 200 200 mV
Power Supply Rejection Ratio (Note 3) 26 20 20 20 dB
AC PERFORMANCE
Output Rise and Fall Time (Notes 3, 6, 7) 650 425/825 400/850 400/850 ps
Overshoot (Note 5) 5
%
Propagation Delay (Note 5) 1.0 ns
Duty Cycle Distortion (Note 5) 50 ps
Residual Jitter (Note 5) 25 - - - ps
pp
MISCELLANEOUS PERFORMANCE
Input Capacitance (Note 5) 1.0 pF
Output Resistance (Note 5) 10 Ω
Output Inductance (Note 5) 6 nH
Note 1: “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the devices
should be operated at these limits. The table of “Electrical Characteristics” specifies conditions of device operation.
Note 2: Min/max ratings are based on product characterization and simulation. Individual parameters are tested as noted. Outgoing quality levels are determined
from tested parameters.
Note 3: Spec is 100%tested at +25˚C, sampled tested at +85˚C.
Note 4: Spec is 100%tested at +35˚C at wafer probe.
Note 5: Spec is guaranteed by design.
Note 6: Measured between the 20%and 80%levels of the waveform.
Note 7: Measured with both outputs driving 150Ω, AC coupled at 270 Mbps.
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