NSC ADC0803LCWM, ADC0803LCV, ADC0803LCN, ADC0803LCJ, ADC0805LCN Datasheet

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TL/H/5671
ADC0801/ADC0802/ADC0803/ADC0804/ADC0805
8-Bit mP Compatible A/D Converters
December 1994
ADC0801/ADC0802/ADC0803/ADC0804/ADC0805 8-Bit mP Compatible A/D Converters
General Description
The ADC0801, ADC0802, ADC0803, ADC0804 and ADC0805 are CMOS 8-bit successive approximation A/D converters that use a differential potentiometric ladderÐ similar to the 256R products. These converters are de­signed to allow operation with the NSC800 and INS8080A derivative control bus with TRI-STATE
É
output latches di­rectly driving the data bus. These A/Ds appear like memory locations or I/O ports to the microprocessor and no inter­facing logic is needed.
Differential analog voltage inputs allow increasing the com­mon-mode rejection and offsetting the analog zero input voltage value. In addition, the voltage reference input can be adjusted to allow encoding any smaller analog voltage span to the full 8 bits of resolution.
Features
Y
Compatible with 8080 mP derivativesÐno interfacing logic needed - access time - 135 ns
Y
Easy interface to all microprocessors, or operates ‘‘stand alone’’
Y
Differential analog voltage inputs
Y
Logic inputs and outputs meet both MOS and TTL volt­age level specifications
Y
Works with 2.5V (LM336) voltage reference
Y
On-chip clock generator
Y
0V to 5V analog input voltage range with single 5V supply
Y
No zero adjust required
Y
0.3×standard width 20-pin DIP package
Y
20-pin molded chip carrier or small outline package
Y
Operates ratiometrically or with 5 VDC, 2.5 VDC, or ana­log span adjusted voltage reference
Key Specifications
Y
Resolution 8 bits
Y
Total error
g
(/4 LSB,g(/2 LSB andg1 LSB
Y
Conversion time 100 ms
Typical Applications
TL/H/5671– 1
8080 Interface
TL/H/5671– 31
Error Specification (Includes Full-Scale,
Zero Error, and Non-Linearity)
Part
Full-
V
REF
/2e2.500 VDCV
REF
/2eNo Connection
Number
Scale
(No Adjustments) (No Adjustments)
Adjusted
ADC0801g(/4 LSB
ADC0802
g
(/2 LSB
ADC0803g(/2 LSB
ADC0804
g
1 LSB
ADC0805
g
1 LSB
TRI-STATEÉis a registered trademark of National Semiconductor Corp. Z-80
É
is a registered trademark of Zilog Corp.
C
1995 National Semiconductor Corporation RRD-B30M115/Printed in U. S. A.
Absolute Maximum Ratings (Notes1&2)
If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications.
Supply Voltage (V
CC
) (Note 3) 6.5V
Voltage
Logic Control Inputs
b
0.3V toa18V
At Other Input and Outputs
b
0.3V to (V
CC
a
0.3V)
Lead Temp. (Soldering, 10 seconds)
Dual-In-Line Package (plastic) 260
§
C
Dual-In-Line Package (ceramic) 300
§
C
Surface Mount Package
Vapor Phase (60 seconds) 215
§
C
Infrared (15 seconds) 220
§
C
Storage Temperature Range
b
65§Ctoa150§C
Package Dissipation at T
A
e
25§C 875 mW
ESD Susceptibility (Note 10) 800V
Operating Ratings (Notes1&2)
Temperature Range T
MIN
s
T
A
s
T
MAX
ADC0801/02LJ, ADC0802LJ/883b55§CsT
A
s
a
125§C
ADC0801/02/03/04LCJ
b
40§CsT
A
s
a
85§C
ADC0801/02/03/05LCN
b
40§CsT
A
s
a
85§C
ADC0804LCN 0
§
CsT
A
s
a
70§C
ADC0802/03/04LCV 0
§
CsT
A
s
a
70§C
ADC0802/03/04LCWM 0
§
CsT
A
s
a
70§C
Range of V
CC
4.5 VDCto 6.3 V
DC
Electrical Characteristics
The following specifications apply for V
CC
e
5VDC,T
MIN
s
T
A
s
T
MAX
and f
CLK
e
640 kHz unless otherwise specified.
Parameter Conditions Min Typ Max Units
ADC0801: Total Adjusted Error (Note 8) With Full-Scale Adj.
g
(/4 LSB
(See Section 2.5.2)
ADC0802: Total Unadjusted Error (Note 8) V
REF
/2e2.500 V
DC
g
(/2 LSB
ADC0803: Total Adjusted Error (Note 8) With Full-Scale Adj.
g
(/2 LSB
(See Section 2.5.2)
ADC0804: Total Unadjusted Error (Note 8) V
REF
/2e2.500 V
DC
g
1 LSB
ADC0805: Total Unadjusted Error (Note 8) V
REF
/2-No Connection
g
1 LSB
V
REF
/2 Input Resistance (Pin 9) ADC0801/02/03/05 2.5 8.0 kX
ADC0804 (Note 9) 0.75 1.1 kX
Analog Input Voltage Range (Note 4) V(a)orV(b) Gnd–0.05 V
CC
a
0.05 V
DC
DC Common-Mode Error Over Analog Input Voltage
g
(/16
g
(/8 LSB
Range
Power Supply Sensitivity V
CC
e
5V
DC
g
10% Over
g
(/16
g
(/8 LSB Allowed VIN(a) and VIN(b) Voltage Range (Note 4)
AC Electrical Characteristics
The following specifications apply for V
CC
e
5VDCand T
A
e
25§C unless otherwise specified.
Symbol Parameter Conditions Min Typ Max Units
T
C
Conversion Time f
CLK
e
640 kHz (Note 6) 103 114 ms
T
C
Conversion Time (Note 5, 6) 66 73 1/f
CLK
f
CLK
Clock Frequency V
CC
e
5V, (Note 5) 100 640 1460 kHz
Clock Duty Cycle (Note 5) 40 60 %
CR Conversion Rate in Free-Running INTR tied to WR with 8770 9708 conv/s
Mode CS
e
0VDC,f
CLK
e
640 kHz
t
W(WR)L
Width of WR Input (Start Pulse Width) CSe0VDC(Note 7) 100 ns
t
ACC
Access Time (Delay from Falling C
L
e
100 pF 135 200 ns
Edge of RD
to Output Data Valid)
t1H,t
0H
TRI-STATE Control (Delay C
L
e
10 pF, R
L
e
10k 125 200 ns
from Rising Edge of RD
to (See TRI-STATE Test
Hi-Z State) Circuits)
tWI,t
RI
Delay from Falling Edge 300 450 ns of WR or RD to Reset of INTR
C
IN
Input Capacitance of Logic 5 7.5 pF Control Inputs
C
OUT
TRI-STATE Output 5 7.5 pF Capacitance (Data Buffers)
CONTROL INPUTS[Note: CLK IN (Pin 4) is the input of a Schmitt trigger circuit and is therefore specified separately
]
VIN(1) Logical ‘‘1’’ Input Voltage V
CC
e
5.25 V
DC
2.0 15 V
DC
(Except Pin 4 CLK IN)
2
AC Electrical Characteristics (Continued)
The following specifications apply for V
CC
e
5VDCand T
MIN
s
T
A
s
T
MAX
, unless otherwise specified.
Symbol Parameter Conditions Min Typ Max Units
CONTROL INPUTS[Note: CLK IN (Pin 4) is the input of a Schmitt trigger circuit and is therefore specified separately
]
VIN(0) Logical ‘‘0’’ Input Voltage V
CC
e
4.75 V
DC
0.8 V
DC
(Except Pin 4 CLK IN)
IIN(1) Logical ‘‘1’’ Input Current V
IN
e
5V
DC
0.005 1 mA
DC
(All Inputs)
IIN(0) Logical ‘‘0’’ Input Current V
IN
e
0V
DC
b
1
b
0.005 mA
DC
(All Inputs)
CLOCK IN AND CLOCK R
V
T
a
CLK IN (Pin 4) Positive Going 2.7 3.1 3.5 V
DC
Threshold Voltage
V
T
b
CLK IN (Pin 4) Negative 1.5 1.8 2.1 V
DC
Going Threshold Voltage
V
H
CLK IN (Pin 4) Hysteresis 0.6 1.3 2.0 V
DC
(V
T
a)b
(V
T
b
)
V
OUT
(0) Logical ‘‘0’’ CLK R Output I
O
e
360 mA 0.4 V
DC
Voltage V
CC
e
4.75 V
DC
V
OUT
(1) Logical ‘‘1’’ CLK R Output I
O
eb
360 mA 2.4 V
DC
Voltage V
CC
e
4.75 V
DC
DATA OUTPUTS AND INTR
V
OUT
(0) Logical ‘‘0’’ Output Voltage
Data Outputs I
OUT
e
1.6 mA, V
CC
e
4.75 V
DC
0.4 V
DC
INTR Output I
OUT
e
1.0 mA, V
CC
e
4.75 V
DC
0.4 V
DC
V
OUT
(1) Logical ‘‘1’’ Output Voltage I
O
eb
360 mA, V
CC
e
4.75 V
DC
2.4 V
DC
V
OUT
(1) Logical ‘‘1’’ Output Voltage I
O
eb
10 mA, V
CC
e
4.75 V
DC
4.5 V
DC
I
OUT
TRI-STATE Disabled Output V
OUT
e
0V
DC
b
3 mA
DC
Leakage (All Data Buffers) V
OUT
e
5V
DC
3 mA
DC
I
SOURCE
V
OUT
Short to Gnd, T
A
e
25§C 4.5 6 mA
DC
I
SINK
V
OUT
Short to VCC,T
A
e
25§C 9.0 16 mA
DC
POWER SUPPLY
I
CC
Supply Current (Includes f
CLK
e
640 kHz,
Ladder Current) V
REF
/2eNC, T
A
e
25§C
and CS
e
5V ADC0801/02/03/04LCJ/05 1.1 1.8 mA ADC0804LCN/LCV/LCWM 1.9 2.5 mA
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating the device beyond its specified operating conditions.
Note 2: All voltages are measured with respect to Gnd, unless otherwise specified. The separate A Gnd point should always be wired to the D Gnd.
Note 3: A zener diode exists, internally, from V
CC
to Gnd and has a typical breakdown voltage of 7 VDC.
Note 4: For V
IN
(b)tVIN(a) the digital output code will be 0000 0000. Two on-chip diodes are tied to each analog input (see block diagram) which will forward
conduct for analog input voltages one diode drop below ground or one diode drop greater than the V
CC
supply. Be careful, during testing at low VCClevels (4.5V), as high level analog inputs (5V) can cause this input diode to conduct – especially at elevated temperatures, and cause errors for analog inputs near full-scale. The spec allows 50 mV forward bias of either diode. This means that as long as the analog V
IN
does not exceed the supply voltage by more than 50 mV, the output
code will be correct. To achieve an absolute 0 V
DC
to5VDCinput voltage range will therefore require a minimum supply voltage of 4.950 VDCover temperature
variations, initial tolerance and loading.
Note 5: Accuracy is guaranteed at f
CLK
e
640 kHz. At higher clock frequencies accuracy can degrade. For lower clock frequencies, the duty cycle limits can be
extended so long as the minimum clock high time interval or minimum clock low time interval is no less than 275 ns.
Note 6: With an asynchronous start pulse, up to 8 clock periods may be required before the internal clock phases are proper to start the conversion process. The start request is internally latched, see
Figure 2
and section 2.0.
Note 7: The CS
input is assumed to bracket the WR strobe input and therefore timing is dependent on the WR pulse width. An arbitrarily wide pulse width will hold
the converter in a reset mode and the start of conversion is initiated by the low to high transition of the WR
pulse (see timing diagrams).
Note 8: None of these A/Ds requires a zero adjust (see section 2.5.1). To obtain zero code at other analog input voltages see section 2.5 and
Figure 5
.
Note 9: The V
REF
/2 pin is the center point of a two-resistor divider connected from VCCto ground. In all versions of the ADC0801, ADC0802, ADC0803, and
ADC0805, and in the ADC0804LCJ, each resistor is typically 16 kX. In all versions of the ADC0804 except the ADC0804LCJ, each resistor is typically 2.2 kX.
Note 10: Human body model, 100 pF discharged through a 1.5 kX resistor.
3
Typical Performance Characteristics
Logic Input Threshold Voltage vs. Supply Voltage
Delay From Falling Edge of RD
to Output Data Valid
vs. Load Capacitance
CLK IN Schmitt Trip Levels
vs. Supply Voltage
f
CLK
vs. Clock Capacitor
Full-Scale Error vs Conversion Time
Effect of Unadjusted Offset Error
vs. V
REF
/2 Voltage
Output Current vs Temperature
Power Supply Current vs Temperature (Note 9)
Linearity Error at Low
V
REF
/2 Voltages
TL/H/5671– 2
4
TRI-STATE Test Circuits and Waveforms
t
1H
t1H,C
L
e
10 pF
t
r
e
20 ns
t
0H
t0H,C
L
e
10 pF
t
r
e
20 ns
TL/H/5671– 3
Timing Diagrams (All timing is measured from the 50% voltage points)
Output Enable and Reset INTR
Note: Read strobe must occur 8 clock periods (8/f
CLK
) after assertion of interrupt to guarantee reset of INTR.
TL/H/5671– 4
5
Typical Applications (Continued)
6800 Interface Ratiometric with Full-Scale Adjust
Note: before using caps at VINor V
REF
/2,
see section 2.3.2 Input Bypass Capacitors.
Absolute with a 2.500V Reference
*For low power, see also LM385-2.5
Absolute with a 5V Reference
Zero-Shift and Span Adjust: 2V
s
V
IN
s
5V Span Adjust: 0VsV
IN
s
3V
TL/H/5671– 5
6
Typical Applications (Continued)
Directly Converting a Low-Level Signal
V
REF
/2e256 mV
A mP Interfaced Comparator
For: VIN(a)lVIN(b)
Output
e
FF
HEX
For: VIN(a)kVIN(b)
Output
e
00
HEX
1 mV Resolution with mP Controlled Range
V
REF
/2e128 mV
1 LSB
e
1mV
V
DAC
s
V
IN
s
(V
DAC
a
256 mV)
Digitizing a Current Flow
TL/H/5671– 6
7
Typical Applications (Continued)
Self-Clocking Multiple A/Ds
*Use a large R value
to reduce loading at CLK R output.
External Clocking
100 kHzsf
CLK
s
1460 kHz
Self-Clocking in Free-Running Mode
*After power-up, a momentary grounding
of the WR
input is needed to guarantee operation.
mP Interface for Free-Running A/D
Operating with ‘‘Automotive’’ Ratiometric Transducers
*VIN(b)e0.15 V
CC
15% of V
CC
s
V
XDR
s
85% of V
CC
Ratiometric with V
REF
/2 Forced
TL/H/5671– 7
8
Typical Applications (Continued)
mP Compatible Differential-Input Comparator with Pre-Set V
OS
(with or without Hysteresis)
*See
Figure 5
to select R value
DB7
e
‘‘1’’ for VIN(a)lVIN(b)a(V
REF
/2)
Omit circuitry within the dotted area if
hysteresis is not needed
Handlingg10V Analog Inputs
*Beckman InstrumentsÝ694-3-R10K resistor array
Low-Cost, mP Interfaced, Temperature-to-Digital Converter
mP Interfaced Temperature-to-Digital Converter
*Circuit values shown are for 0§CsT
A
s
a
128§C
**Can calibrate each sensor to allow easy replacement, then
A/D can be calibrated with a pre-set input voltage.
TL/H/5671– 8
9
Typical Applications (Continued)
Handling
g
5V Analog Inputs
TL/H/5671– 33
*Beckman InstrumentsÝ694-3-R10K resistor array
Read-Only Interface
TL/H/5671– 34
mP Interfaced Comparator with Hysteresis
TL/H/5671– 35
Analog Self-Test for a System
TL/H/5671– 36
Protecting the Input
TL/H/5671– 9
A Low-Cost, 3-Decade Logarithmic Converter
TL/H/5671– 37
*LM389 transistors
A, B, C, D
e
LM324A quad op amp
Diodes are 1N914
10
Typical Applications (Continued)
3-Decade Logarithmic A/D Converter
Noise Filtering the Analog Input
f
C
e
20 Hz
Uses Chebyshev implementation for steeper roll-off unity-gain, 2nd order, low-pass filter Adding a separate filter for each channel increases system response time if an analog multiplexer is used
Multiplexing Differential Inputs
Output Buffers with A/D Data Enabled
*A/D output data is updated 1 CLK period prior to assertion of INTR
Increasing Bus Drive and/or Reducing Time on Bus
*Allows output data to set-up at falling edge of CS
TL/H/5671– 10
11
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