P00 to P03:Port 0COM0 to COM3:Common output 0 to 3
P10 to P13:Port 1V
P20 to P23:Port 2BIAS:LCD power supply bias control
P30 to P33:Port 3LCDCL:LCD clock
P50 to P53:Port 5SYNC:LCD synchronization
P60 to P63:Port 6TI0 to TI2:Timer input 0 to 2
P80 to P83:Port 8PTO0 to PTO2:Programmable timer output 0 to 2
P90 to P93:Port 9BUZ:Buzzer clock
KR0 to KR3:Key return 0 to 3PCL:Programmable clock
SCK:Serial clockINT0, 1, 4:External vectored interrupt 0, 1, 4
SI:Serial inputINT2:External test input 2
SO:Serial outputX1, X2:Main system clock oscillation 1, 2
SB0, SB1:Serial data bus 0, 1XT1, XT2:Subsystem clock oscillation 1, 2
RESET:ResetV
MD0 to MD3:Mode selection 0 to 3V
D0 to D7:Data bus 0 to 7Vss:Ground
S0 to S23:Segment output 0 to 23
LC0 toVLC2:LCD power supply 0 to 2
PP:Programming power supply
DD:Positive power supply
(valid for detecting both rising and falling edges)
INT0InputP10Edge detection vectored interrupt
input (detection edge is selectable)asynchronous is
INT0/P10 can be used to select aselectable
INT1P11
INT2InputP12/TI1/TI2Rising edge detection testable input Asynchronous
KR0 to KR3I/OP60 to P63Parallel falling edge detection testable inputInput<F>-A
X1Input—Ceramic/crystal resonator connection for main system——
X2—
XT1Input—Crystal resonator connection for subsystem clock oscillation.——
XT2—
RESETInput—System reset input (low-level active)—<B>
MD0 to MD3InputP30 to P33Mode selection for program memory (PROM) write/verifyInputE-B
D0 to D3I/O
D4 to D7P50 to P53M-E
Note 2
VPP
VDD——Positive power supply——
Vss——Ground potential——
P60/KR0 to P63/KR3
——Programmable power supply voltage applied for program——
noise eliminator.
clock oscillation. If using an external clock, input the signal
to X1 and input the inverted signal to X2.
If using an external clock, input the signal to XT1 and input
the inverted signal to XT2. XT1 can be used as a 1-bit (test)
input.
Data bus for program memory (PROM) write/verifyInput<F>-A
PP pin does not operate correctly when it is not connected to the VDD pin during normal operation.
Data Sheet U11369EJ3V0DS
9
µ
PD75P3116
3.2 Non-Port Pins (2/2)
Pin NameI/OAlternateFunctionStatusI/O Circuit
FunctionAfter ResetType
S0 to S15
S16 to S19
S20 to S23
COM0 to COM3
VLC0 toVLC2——Power supply for driving LCD——
BIASOutput—Output for external split resistor cutNote 2—
Note 3
LCDCL
Note 3
SYNC
Output—Segment signal outputNote 1G-A
Output P93 to P90Segment signal outputInputH
Output P83 to P80Segment signal outputInputH
Output—Common signal outputNote 1G-B
Output P30/MD0Clock output for driving external expansion driverInputE-B
Output P31/MD1Clock output for synchronization of external expansion driverInputE-B
Notes 1. VLCX (X = 0, 1, 2) is selected as the input source for the display outputs as shown below.
S0 to S23: V
LC1, COM0 to COM2: VLC2, COM3: VLC0
2. When the split resistor is incorporated:Low level
When the split resistor is not incorporated: High impedance
3. These pins are provided for future system expansion. Currently, only P30 and P31 are used.
10
Data Sheet U11369EJ3V0DS
3.3 Pin I/O Circuits
The I/O circuits for the µPD75P3116’s pins are shown in abbreviated form below.
Type AType D
V
DD
µ
PD75P3116
V
DD
IN
P-ch
N-ch
CMOS standard input buffer
IN
Data
Output
disable
Push-pull output that can be set to high impedance output
(with both P-ch and N-ch OFF).
Type E-BType B
P.U.R.
enable
Data
Type D
Output
disable
P-ch
N-ch
V
DD
OUT
P.U.R.
P-ch
IN/OUT
Schmitt-triggered input with hysteresis characteristics.
Type B-CType F-A
V
DD
P.U.R.
P-ch
IN
P.U.R. : Pull-Up Resistor
P.U.R.
enable
Data
Output
disable
Type A
P.U.R. : Pull-Up Resistor
P.U.R.
enable
Type D
Type B
P.U.R. : Pull-Up Resistor
V
DD
P.U.R.
P-ch
IN/OUT
(Continued)
Data Sheet U11369EJ3V0DS
11
Type F-BType H
VDD
P.U.R.
µ
PD75P3116
(Continued)
Output
disable
(P)
Data
Output
disable
Output
disable
(N)
P.U.R. : Pull-Up Resistor
VLC0
VLC1
SEG
data
V
LC2
P-ch
N-ch
P-ch
N-ch
enable
P-ch
N-ch
P.U.R.
VDD
P-ch
N-ch
N-chP-ch
N-ch
P-ch
IN/OUT
OUT
SEG
data
Data
Output
disable
Type M-CType G-A
Output
disable
Data
Type G-A
Type E-B
P.U.R.
enable
N-ch
P-ch
N-ch
IN/OUT
VDD
P.U.R.
P-ch
IN/OUT
Type G-B
COM
V
LC0
VLC1
data
VLC2
P-ch
N-ch
N-ch
P-ch
N-ch
P-ch
N-ch
N-ch
P.U.R. : Pull-Up Resistor
Type M-E
IN/OUT
Data
Output
disable
N-chP-ch
P-chN-ch
OUT
Input instruction
Pull-up resistor that operates only when an input
Note
instruction is executed. (The current flows from
VDD to a pin when the pin is at low level.)
VDD
P-ch
P.U.R.
N-ch
Note
Voltage
controller
(+13 V
withstanding
voltage)
(+13 V
withstanding
voltage)
12
Data Sheet U11369EJ3V0DS
3.4 Recommended Connection of Unused Pins
Table 3-1. List of Unused Pin Connections
PinRecommended Connection
P00/INT4Connect to Vss or VDD.
P01/SCKInput:Independently connect to Vss or VDD via a resistor.
P02/SO/SB0Output: Leave open.
P03/SI/SB1Connect to Vss.
P10/INT0 and P11/INT1Connect to Vss or VDD.
P12/TI1/TI2/INT2
P13/TI0
P20/PTO0Input:Independently connect to Vss or VDD via a resistor.
P21/PTO1Output: Leave open.
P22/PTO2/PCL
P23/BUZ
P30/LCDCL/MD0
P31/SYNC/MD1
P32/MD2
P33/MD3
P50/D4 to P53/D7Input:Connect to Vss.
P60/KR0/D0 to P63/KR3/D3Input:Independently connect to Vss or VDD via a resistor.
S0 to S15Leave open.
COM0 to COM3
S16/P93 to S19/P90Input:Independently connect to Vss or VDD via a resistor.
S20/P83 to S23/P80Output: Leave open.
VLC0 to VLC2Connect to Vss.
BIASConnect to Vss only when none of VLC0, VLC1 or VLC2 is used.
Note
XT1
Note
XT2
VPPAlways connect to VDD directly.
Output: Connect to Vss.
Output: Leave open.
In other cases, leave open.
Connect to Vss.
Leave open.
µ
PD75P3116
Note When the subsystem clock is not used, select SOS.0 = 1 (on-chip feedback
resistor not used).
Data Sheet U11369EJ3V0DS
13
µ
PD75P3116
4. Mk I AND Mk II MODE SELECTION FUNCTION
Setting the stack bank selection (SBS) register for the µPD75P3116 enables the program memory to be switched
between the Mk I mode and Mk II mode. This function is applicable when using the
µ
PD753104, 753106, or 753108.
When bit 3 of SBS is set to 1: Sets the Mk I mode (supports the Mk I mode for the
When bit 3 of SBS is set to 0: Sets the Mk II mode (supports the Mk II mode for the µPD753104, 753106, and 753108)
4.1 Differences Between Mk I Mode and Mk II Mode
Table 4-1 lists the differences between the Mk I mode and the Mk II mode for the
Table 4-1. Differences Between Mk I Mode and Mk II Mode
ItemMk I ModeMk II Mode
Program counterPC13-0
Program memory (bytes)16384
Data memory (bits)512 × 4
StackStack bankSelectable via memory banks 0 and 1
TBR or TCALLreferenced
Execute (taddr)(taddr+1) instructionsinstruction
Operation
(n=0 to 3, 5, 6, 8, 9)
(n=2 to 3, 5, 6, 8, 9)
←
MBE, RBE, PC13, 12
Addressing
Skip
Condition
- - - - - - - - - - - -
Notes 1. Setting MBE = 0 or MBE = 1, MBS = 15 is required during the execution of the IN or OUT instruction.
2. The TBR and TCALL instructions are assembler quasi-directives for the GETI instruction table definitions.
3. The sections in double boxes are only supported in the Mk II mode. The other sections are only supported in
the Mk I mode.
Data Sheet U11369EJ3V0DS
27
µ
PD75P3116
8. ONE-TIME PROM (PROGRAM MEMORY) WRITE AND VERIFY
The program memory contained in the µPD75P3116 is a 16384 × 8-bit one-time PROM that can be electrically written
one time only. The pins listed in the table below are used for this PROM’s write/verify operations. Clock input from the
X1 pin is used instead of address input as a method for updating addresses.
PinFunction
VPPPin where program voltage is applied during program memory
X1, X2Clock input pins for address updating during program memory
MD0 to MD3Operation mode selection pin for program memory write/verify
D0/P60 to D3/P638-bit data I/O pins for program memory write/verify
(lower 4 bits)
D4/P50 to D7/P53
(higher 4 bits)
DDPin where power supply voltage is applied. Apply 1.8 to 5.5 V
V
Caution Pins not used for program memory write/verify should be connected to Vss.
write/verify (usually VDD potential)
write/verify. Input the X1 pin’s inverted signal to the X2 pin.
in normal operation mode and +6 V for program memory write/
verify.
8.1 Operation Modes for Program Memory Write/Verify
When +6 V is applied to the V
DD pin and +12.5 V to the VPP pin, the
µ
PD75P3116 enters the program memory write/
verify mode. The following operation modes can be specified by setting pins MD0 to MD3 as shown below.
Operation Mode SpecificationOperation Mode
VPPVDDMD0MD1MD2MD3
+12.5 V+6 VHLHLZero-clear program memory address
LHHHWrite mode
LLHHVerify mode
H×HHProgram inhibit mode
×: L or H
28
Data Sheet U11369EJ3V0DS
8.2 Program Memory Write Procedure
Program memory can be written at high speed using the following procedure.
(1) Pull down unused pins to Vss via resistors. Set the X1 pin to low.
(2) Supply 5 V to the V
DD and VPP pins.
(3) Wait 10 µs.
(4) Select the program memory address zero-clear mode.
(5) Supply 6 V to V
DD and 12.5 V to VPP.
(6) Write data in the 1 ms write mode.
(7) Select the verify mode. If the data is written, go to (8) and if not, repeat (6) and (7).
(8) Additional write. (X: Number of write operations from (6) and (7)) × 1 ms
(9) Apply four pulses to the X1 pin to increment the program memory address by one.
(10) Repeat (6) to (9) until the end address is reached.
(11) Select the program memory address zero-clear mode.
(12) Return the V
DD- and VPP-pin voltages to 5 V.
(13) Turn off the power.
The following figure shows steps (2) to (9).
µ
PD75P3116
V
PP
VDD + 1
V
DD
X1
D0/P60 to D3/P63
D4/P50 to D7/P53
MD0/P30
MD1/P31
MD2/P32
X repetitions
Additional
WriteVerify
V
PP
V
DD
DD
V
Data input
Data
output
write
Data input
Address
increment
MD3/P33
Data Sheet U11369EJ3V0DS
29
µ
PD75P3116
8.3 Program Memory Read Procedure
µ
PD75P3116 can read program memory contents using the following procedure.
The
(1) Pull down unused pins to V
(2) Supply 5 V to the V
(3) Wait 10
µ
s.
DD and VPP pins.
SS via resistors. Set the X1 pin to low.
(4) Select the program memory address zero-clear mode.
(5) Supply 6 V to V
DD and 12.5 V to VPP.
(6) Select the verify mode. Apply four pulses to the X1 pin. The data stored in one address will be output every four
clock pulses.
(7) Select the program memory address zero-clear mode.
(8) Return the V
DD- and VPP-pin voltages to 5 V.
(9) Turn off the power.
The following figure shows steps (2) to (7).
VPP
VDD
D0/P60 to D3/P63
D4/P50 to D7/P53
VPP
VDD
VDD + 1
V
DD
X1
MD0/P30
MD1/P31
MD2/P32
MD3/P33
Data outputData output
“L”
30
Data Sheet U11369EJ3V0DS
µ
PD75P3116
8.4 One-Time PROM Screening
Due to its structure, the one-time PROM cannot be fully tested before shipment by NEC. Therefore, NEC recommends
that after the required data is written and the PROM is stored under the temperature and time conditions shown below,
the PROM should be verified via screening.
Storage TemperatureStorage Time
125˚C24 hours
NEC offers QTOP microcontrollers for which one-time PROM writing, marking, screening, and verification are provided
at additional cost. For further details, contact an NEC sales representative.
Data Sheet U11369EJ3V0DS
31
µµ
µ
PD75P3116
µµ
9. ELECTRICAL SPECIFICATIONS
Absolute Maximum Ratings (TA = 25˚C)
ParameterSymbolTest ConditionsRatingUnit
Power supply voltageVDD–0.3 to +7.0V
PROM power supplyV
voltage
Input voltageV
Output voltageV
Output current, highI
Output current, lowIOLPer pin30mA
Operating ambientTA–40 to +85
temperature
Storage temperatureTstg–65 to +150˚C
PP–0.3 to +13.5V
I1Except port 5–0.3 to VDD + 0.3V
VI2Port 5 (N-ch open drain)–0.3 to +14V
O–0.3 to VDD + 0.3V
OHPer pin–10mA
Total of all pins–30mA
Total of all pins220mA
Note
˚C
Note When LCD is driven in normal mode: TA = –10 to +85˚C
Caution Product quality may suffer if the absolute maximum rating is exceeded even momentarily for any
parameter. That is, the absolute maximum ratings are rated values at which the product is on
the verge of suffering physical damage, and therefore the product must be used under conditions
that ensure that the absolute maximum ratings are not exceeded.
Capacitance (T
ParameterSymbolTest ConditionsMIN.TYP.MAX.Unit
Input capacitanceCINf = 1 MHz15pF
Output capacitanceCOUTUnmeasured pins returned to 0 V.15pF
I/O capacitanceCIO15pF
A = 25˚C, VDD = 0 V)
32
Data Sheet U11369EJ3V0DS
µµ
µ
PD75P3116
µµ
Main System Clock Oscillator Characteristics (TA = –40 to +85°C, VDD = 1.8 to 5.5 V)
OscillationAfter VDD reaches oscil-4ms
stabilization time
Note 1
Note 3
lation voltage range MIN.
OscillationVDD = 4.5 to 5.5 V10ms
stabilization time
Note 3
VDD = 1.8 to 5.5 V30
ExternalX1 input1.0
clockfrequency (fx)
X1
X2
Note 1
X1 input83.3500ns
high-/low-level width
(t
XH, tXL)
6.0
6.0
6.0
Note 2
Note 2
MHz
MHz
MHz
Notes 1.Indicates only oscillator characteristics. Refer to AC Characteristics for instruction execution time.
2.When the power supply voltage is 1.8 V ≤ V
DD < 2.7 V and the oscillation frequency is 4.19 MHz < fx
≤ 6.0 MHz, setting the processor clock control register (PCC) to 0011 makes 1 machine cycle less than
the required 0.95 µs. Therefore, set PCC to a value other than 0011.
3.The oscillation stabilization time is necessary for oscillation to stabilize after applying V
DD or releasing
the STOP mode.
Caution When using the main system clock oscillator, wire as follows in the area enclosed by the broken
lines in the above figures to avoid an adverse effect from wiring capacitance.
• Keep the wiring length as short as possible.
• Do not cross the wiring with the other signal lines.
• Do not route the wiring near a signal line through which a high fluctuating current flows.
• Always make the ground point of the oscillator capacitor the same potential as V
DD.
• Do not ground the capacitor to a ground pattern through which a high current flows.
• Do not fetch signals from the oscillator.
Data Sheet U11369EJ3V0DS
33
µ
PD75P3116
Subsystem Clock Oscillator Characteristics (TA = –40 to +85˚C, VDD = 1.8 to 5.5 V)
OscillationVDD = 4.5 to 5.5 V1.02s
stabilization time
Note 1
Note 2
VDD = 1.8 to 5.5 V10
ExternalXT1 input frequency32100kHz
clock(fXT)
XT1
XT2
Note 1
XT1 input high-/low-level
515
µ
s
width (tXTH, tXTL)
Notes 1.Indicates only oscillator characteristics. Refer to AC Characteristics for instruction execution time.
2.The oscillation stabilization time is necessary for oscillation to stabilize after applying V
DD.
Caution When using the subsystem clock oscillator, wire as follows in the area enclosed by the broken lines
in the above figures to avoid an adverse effect from wiring capacitance.
• Keep the wiring length as short as possible.
• Do not cross the wiring with the other signal lines.
• Do not route the wiring near a signal line through which a high fluctuating current flows.
• Always make the ground point of the oscillator capacitor the same potential as V
DD.
• Do not ground the capacitor to a ground pattern through which a high current flows.
• Do not fetch signals from the oscillator.
The subsystem clock oscillator is designed as a low amplification circuit to provide low consumption
current, and is more liable to misoperation by noise than the main system clock oscillator. Special
care should therefore be taken regarding the wiring method when the subsystem clock is used.
34
Data Sheet U11369EJ3V0DS
DC Characteristics (TA = –40 to +85˚C, VDD = 1.8 to 5.5 V)
VDD = 5.0 V ±10%
VDD = 3.0 V ±10%
HALT modeVDD = 5.0 V ±10%0.72.0mA
VDD = 5.0 V ±10%
VDD = 3.0 V ±10%
HALT modeVDD = 5.0 V ±10%0.651.8mA
0±0.2V
Note 5
Note 6
V
DD = 3.0 V ±10%0.250.8mA
Note 5
Note 6
3.29.5mA
0.551.6mA
2.57.5mA
0.451.35mA
VDD = 3.0 V ±10%0.220.7mA
IDD332.768 kHz
Crystal oscillation
IDD4HALT mode
IDD5XT1 = 0 V
Note 7
Low-voltageVDD = 3.0 V ±10%45130
Note 8
mode
VDD = 2.0 V ±10%2055
VDD = 3.0 V, TA = 25˚C
Low current
consumption
Note 9
mode
Note 10
VDD = 5.0 V ±10%0.0510
VDD = 3.0 V ±10%42120
VDD = 3.0 V, TA = 25˚C
Note 8
VDD = 3.0 V ±10%
VDD = 2.0 V ±10%
VDD = 3.0 V, TA = 25˚C
VDD = 3.0 V ±10%
VDD = 3.0 V,
TA = 25˚C
Lowvoltage
mode
Low
current
consumption mode
Note 9
4590
4285
5.518
2.27
5.512
4.012
4.08
STOP modeVDD = 3.0 VTA = –40 to +85˚C0.025
±10%
TA = 25˚C0.023
DDV
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
Notes 1.Set to VAC0 = 0 when the low current consumption mode and the stop mode are used. If VAC0 = 1
µ
is set, the current increases for approx. 1
A.
2.The voltage deviation is the difference from the output voltage corresponding to the ideal value of the
segment and common outputs (VLCDn; n = 0, 1, 2).
3.Not including currents flowing through on-chip pull-up resistors.
4.Including oscillation of the subsystem clock.
5.When the processor clock control register (PCC) is set to 0011 and the device is operated in the high-
speed mode.
6.When PCC is set to 0000 and the device is operated in the low-speed mode.
7.When the system clock control register (SCC) is set to 1001 and the device is operated on the
subsystem clock, with main system clock oscillation stopped.
8.When the sub-oscillator control register (SOS) is set to 0000.
9.When SOS is set to 0010.
10. When SOS is set to 00 ×1 and the feedback resistor of the sub-oscillator is not used (×: Don’t care).
36
Data Sheet U11369EJ3V0DS
AC Characteristics (TA = –40 to +85˚C, VDD = 1.8 to 5.5 V)
y
ParameterSymbolTest ConditionsMIN.TYP. MAX.Unit
µ
PD75P3116
CPU clock cyclet
Note 1
time
(Min. instruction execution
time = 1 machine cycle)
TI0, TI1, TI2 inputfTIVDD = 2.7 to 5.5 V01.0MHz
frequencyV
TI0, TI1, TI2 inputt
high-/low-level widthVDD = 1.8 to 5.5 V1.8
Interrupt input high-/
low-level widthIM02 = 110
RESET low-level widthtRSL10
Notes 1.The cycle time (minimum instruction
execution time) of the CPU clock
(Φ) is determined by the oscillation
frequency of the connected
CYOperating onVDD = 2.7 to 5.5 V0.6764
main system clockVDD = 1.8 to 5.5 V0.9564
Operating on subsystem clock114122125
DD = 1.8 to 5.5 V0275kHz
TIH, tTILVDD = 2.7 to 5.5 V0.48
tINTH, tINTL
INT0IM02 = 0Note 2
INT1, 2, 410
KR0 to KR710
CY
vs. V
DD
t
(Main system clock operation)
64
60
resonator (and external clock), the
system clock control register (SCC)
and the processor clock control
register (PCC). The figure on the
right indicates the cycle time t
versus supply voltage VDD
characteristics with the main system
clock operating.
CY or 128/fx is set by setting the
2.2t
CY
6
5
4
[µs]
3
CY
2
Cycle time t
Guaranteed operation
range
interrupt mode register (IM0).
1
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
0.5
Data Sheet U11369EJ3V0DS
1023456
voltage VDD [V]
Suppl
37
Serial Transfer Operation
µµ
µ
PD75P3116
µµ
2-wire and 3-wire serial I/O mode (SCK...Internal clock output): (T
A = –40 to +85˚C, VDD = 1.8 to 5.5 V)
ParameterSymbolTest ConditionsMIN.TYP. MAX.Unit
SCK cycle timet
SCK high-/low-levelt
widthV
Note 1
SI
setup timetSIK1VDD = 2.7 to 5.5 V150ns
KCY1VDD = 2.7 to 5.5 V1300ns
V
DD = 1.8 to 5.5 V3800ns
KL1, tKH1VDD = 2.7 to 5.5 V
DD = 1.8 to 5.5 V
tKCY1/2–50
tKCY1/2–150
(to SCK↑)VDD = 1.8 to 5.5 V500ns
Note 1
SI
hold timetKSI1VDD = 2.7 to 5.5 V400ns
(from SCK↑)V
Note 1
SO
output delaytKSO1RL = 1 kΩ,VDD = 2.7 to 5.5 V0250ns
time from SCK↓CL = 100 pF
DD = 1.8 to 5.5 V600ns
Note 2
VDD = 1.8 to 5.5 V01000ns
Notes 1.In 2-wire serial I/O mode, read this parameter as SB0 or SB1 instead.
L and CL are the load resistance and load capacitance of the SO output lines, respectively.
2.R
2-wire and 3-wire serial I/O mode (SCK...External clock input): (TA = –40 to +85˚C, VDD = 1.8 to 5.5 V)
ParameterSymbolTest ConditionsMIN.TYP. MAX.Unit
SCK cycle timetKCY2VDD = 2.7 to 5.5 V800ns
ns
ns
VDD = 1.8 to 5.5 V3200ns
SCK high-/low-leveltKL2,tKH2VDD = 2.7 to 5.5 V400ns
widthVDD = 1.8 to 5.5 V1600ns
Note 1
SI
setup timetSIK2VDD = 2.7 to 5.5 V100ns
(to SCK↑)VDD = 1.8 to 5.5 V150ns
Note 1
SI
hold timetKSI2VDD = 2.7 to 5.5 V400ns
(from SCK↑)VDD = 1.8 to 5.5 V600ns
Note 1
SO
output delaytKSO2RL = 1 kΩ,VDD = 2.7 to 5.5 V0300ns
time from SCK↓CL = 100 pF
Note 2
VDD = 1.8 to 5.5 V01000ns
Notes 1.In 2-wire serial I/O mode, read this parameter as SB0 or SB1 instead.
2.RL and CL are the load resistance and load capacitance of the SO output lines, respectively.
38
Data Sheet U11369EJ3V0DS
µµ
µ
µµ
SBI mode (SCK...Internal clock output (master)): (TA = –40 to +85˚C, VDD = 1.8 to 5.5 V)
ParameterSymbolTest ConditionsMIN.TYP. MAX.Unit
PD75P3116
SCK cycle timet
SCK high-/low-leveltKL3,tKH3VDD = 2.7 to 5.5 V
widthV
SB0, 1 setup timet
(to SCK↑)V
SB0, 1 hold time (from SCK↑)
SB0, 1 output delaytKSO3RL = 1 kΩ,VDD = 2.7 to 5.5 V0250ns
time from SCK↓CL = 100 pF
SB0, 1↓ from SCK↑tKSBtKCY3ns
SCK↓ from SB0, 1↓t
SB0, 1 low-level widtht
SB0, 1 high-level widthtSBHtKCY3ns
KCY3VDD = 2.7 to 5.5 V1300ns
V
DD = 1.8 to 5.5 V3800ns
tKCY3/2–50
DD = 1.8 to 5.5 V
SIK3VDD = 2.7 to 5.5 V150ns
DD = 1.8 to 5.5 V500ns
tKSI3tKCY3/2ns
Note
SBKtKCY3ns
SBLtKCY3ns
VDD = 1.8 to 5.5 V01000ns
tKCY3/2–150
ns
ns
Note RL and CL are the load resistance and load capacitance of the SB0 and SB1 output lines, respectively.
SBI mode (SCK...External clock input (slave)): (T
ParameterSymbolTest ConditionsMIN.TYP. MAX.Unit
SCK cycle timetKCY4VDD = 2.7 to 5.5 V800ns
A = –40 to +85˚C, VDD = 1.8 to 5.5 V)
VDD = 1.8 to 5.5 V3200ns
SCK high-/low-leveltKL4,tKH4VDD = 2.7 to 5.5 V400ns
widthVDD = 1.8 to 5.5 V1600ns
SB0, 1 setup timetSIK4VDD = 2.7 to 5.5 V100ns
(to SCK↑)VDD = 1.8 to 5.5 V150ns
SB0, 1 hold time (from SCK↑)
SB0, 1 output delaytKSO4RL = 1 kΩ,VDD = 2.7 to 5.5 V0300ns
time from SCK↓CL = 100 pF
SB0, 1↓ from SCK↑tKSBtKCY4ns
SCK↓ from SB0, 1↓tSBKtKCY4ns
SB0, 1 low-level widthtSBLtKCY4ns
SB0, 1 high-level widthtSBHtKCY4ns
tKSI4tKCY4/2ns
Note
VDD = 1.8 to 5.5 V01000ns
Note RL and CL are the load resistance and load capacitance of the SB0 and SB1 output lines, respectively.
Data Sheet U11369EJ3V0DS
39
AC Timing Test Points (Excluding X1, XT1 Input)
µ
PD75P3116
Clock Timing
X1 input
VIH (MIN.)
IL (MAX.)
V
VOH (MIN.)
OL (MAX.)
V
tXL
1/fX
1/fXT
tXH
V
IH (MIN.)
IL (MAX.)
V
V
OH (MIN.)
OL (MAX.)
V
V
DD – 0.1 V
0.1 V
XT1 input
TI0, TI1, TI2 Timing
TI0, TI1, TI2
tXTL
tXTH
V
DD – 0.1 V
0.1 V
1/f
TI
t
TIL
t
TIH
40
Data Sheet U11369EJ3V0DS
Serial Transfer Timing
3-wire serial I/O mode
SCK
tKCY1, 2
tKL1, 2tKH1, 2
tSIK1, 2tKSI1, 2
µ
PD75P3116
SI
SO
2-wire serial I/O mode
SCK
SB0, 1
tKSO1, 2
Input data
tKL1, 2
tSIK1, 2
Output data
tKCY1, 2
tKH1, 2
tKSI1, 2
tKSO1, 2
Data Sheet U11369EJ3V0DS
41
Serial Transfer Timing
Bus release signal transfer
SCK
tKL3, 4
tKCY3, 4
tKH3, 4
µ
PD75P3116
SB0, 1
Command signal transfer
SCK
SB0, 1
tSBKtSBHtSBLtKSB
tKCY3, 4
tKL3, 4
tSBKtKSB
tKH3, 4
tSIK3, 4
tKSO3, 4
tSIK3, 4
tKSO3, 4
tKSI3, 4
tKSI3, 4
Interrupt input timing
INT0, 1, 2, 4
RESET input timing
42
tINTLtINTH
KR0 to 7
tRSL
RESET
Data Sheet U11369EJ3V0DS
µ
PD75P3116
Data Memory Stop Mode Low Supply Voltage Data Retention Characteristics (TA = –40 to +85˚C)
ParameterSymbolTest ConditionsMIN.TYP. MAX.Unit
Release signal set timetSREL0
Oscillation stabilizationtWAITRelease by RESET
wait time
Note 1
Release by interrupt request
215/f
Note 2
X
µ
ms
ms
s
Notes 1.The oscillation stabilization wait time is the time during which the CPU operation is stopped to prevent
unstable operation at the start of oscillation.
2.Depends on the basic interval timer mode register (BTM) settings (see the table below).
BTM3BTM2BTM1BTM0Wait Time
fx = 4.19 MHzfx = 6.0 MHz
—0002
—0112
—1012
—1112
20
/fx (approx. 250 ms)220/fx (approx. 175 ms)
17
/fx (approx. 31.3 ms)217/fx (approx. 21.8 ms)
15
/fx (approx. 7.81 ms)215/fx (approx. 5.46 ms)
13
/fx (approx. 1.95 ms)213/fx (approx. 1.37 ms)
Data Sheet U11369EJ3V0DS
43
Data Retention Timing (STOP Mode Release by RESET)
STOP mode
Data retention mode
Internal reset operation
HALT mode
µ
PD75P3116
Operating mode
VDD
tSREL
STOP instruction execution
RESET
tWAIT
Data Retention Timing (Standby Release Signal: STOP Mode Release by Interrupt Signal)
Input voltage, highVIH1Except X1 and X2 pins0.7VDDVDDV
VIH2X1, X2VDD – 0.5VDDV
Input voltage, lowVIL1Except X1 and X2 pins00.3VDDV
VIL2X1, X200.4V
Input leakage currentILIVIN = VIL or VIH10
Output voltage, highVOHIOH = –1 mAVDD – 1.0V
Output voltage, lowV
VDD power supply currentIDD30mA
V
PP power supply currentIPPMD0 = VIL, MD1 = VIH30mA
OLIOL = 1.6 mA0.4V
Cautions 1. Do not exceed +13.5 V for VPP, including the overshoot.
DD must be applied before VPP, and cut after VPP.
2. V
µ
A
AC Programming Characteristics (T
ParameterSymbolTest ConditionsMIN.TYP.MAX.Unit
Address setup time
MD1 setup time (to MD0↓)tM1S2
Data setup time (to MD0↓)tDS2
Address hold time
Data hold time (from MD0↑)tDH2
Data output float delay time from MD0↑tDF0130ns
VPP setup time (to MD3↑)tVPS2
VDD setup time (to MD3↑)tVDS2
Initial program pulse widthtPW0.951.01.05ms
Additional program pulse widthtOPW0.9521.0ms
MD0 setup time (to MD1↑)tM0S2
Data output delay time from MD0↓tDVMD0 = MD1 = VIL1
MD1 hold time (from MD0↑)tM1HtM1H + tM1R≥ 50 µs2
MD1 recovery time (from MD0↓)tM1R2
Program counter reset timetPCR10
X1 input high-/low-level widthtXH,tXL0.125
X1 input frequencyfX4.19MHz
Initial mode set timetI2
MD3 setup time (to MD1↑)tM3S2
MD3 hold time (from MD1↓)tM3H2
MD3 setup time (to MD0↓)tM3SR
Data output delay time from Address
Data output hold time from Address
MD3 hold time (from MD0↑)tM3HR
Data output float delay time from MD3↓tDFR
During program memory read
During program memory read
During program memory read
During program memory read
During program memory read
2
0130ns
2
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
2
2
µ
s
µ
s
µ
s
Note The internal address signal is incremented by 1 at the rising edge of the fourth X1 input and is not connected to
a pin.
Data Sheet U11369EJ3V0DS
45
Program Memory Write Timing
t
VPS
V
PP
V
PP
V
DD
t
VDS
VDD + 1
V
DD
DD
V
X1
D0/P60 to D3/P60
D4/P50 to D7/P53
MD0/P30
MD1/P31
MD2/P32
MD3/P33
t
I
t
PCR
t
M3S
Data input
t
DS
t
t
M1S
µ
PD75P3116
t
XH
t
Data output
t
DH
PW
t
M1H
t
M1R
t
DVtDF
t
M0S
Data input
t
DS
t
OPW
XL
t
DH
t
AH
t
AS
Data input
t
M3H
Program Memory Read Timing
tVPS
VPP
VPP
VDD
VDD + 1
VDD
VDD
X1
D0/P60 to D3/P60
D4/P50 to D7/P53
tI
MD0/P30
MD1/P31
tPCR
MD2/P32
tVDS
tXH
tXL
tHAD
tDAD
Data outputData output
tDV
tM3HR
tDFR
46
tM3SR
MD3/P33
Data Sheet U11369EJ3V0DS
10. CHARACTERISTIC CURVES (REFERENCE VALUES)
DD
vs VDD (Main System Clock: 6.0 MHz Crystal Resonator)
I
10
5.0
1.0
0.5
µµ
µ
PD75P3116
µµ
(T
A
= 25°C)
PCC = 0011
PCC = 0010
PCC = 0001
PCC = 0000
Main system clock
HALT mode + 32 kHz oscillation
(mA)
DD
0.1
Supply current I
0.05
0.01
0.005
Subsystem clock operation
mode (SOS.1 = 0)
Main system clock STOP
mode + 32 kHz oscillation
(SOS.1 = 0) and
subsystem clock HALT mode
(SOS.1 = 0)
Main system clock STOP
mode + 32 kHz oscillation
(SOS.1 = 1) and subsystem
clock HALT mode (SOS.1 = 1)
XT1XT2X1X2
Crystal resonator
6.0 MHz
22 pF22 pF22 pF22 pF
Crystal resonator
32.768 kHz
330 kΩ
V
V
0.001
012345678
Supply voltage V
Data Sheet U11369EJ3V0DS
DD
(V)
DD
DD
47
10
5.0
1.0
0.5
IDD vs VDD (Main System Clock: 4.19 MHz Crystal Resonator)
PCC = 0011
PCC = 0010
PCC = 0001
PCC = 0000
Main system clock
HALT mode + 32 kHz oscillation
µµ
µ
PD75P3116
µµ
(T
A
= 25°C)
(mA)
DD
0.1
Supply current I
0.05
0.01
0.005
Subsystem clock operation
mode (SOS.1 = 0)
Subsystem clock HALT mode
(SOS.1 = 0) and
main system clock STOP mode
+ 32 kHz oscillation (SOS.1 = 0)
Main system clock STOP
mode + 32 kHz oscillation
(SOS.1 = 1)
and subsystem
mode (SOS.1 = 1)
XT1XT2X1X2
Crystal resonator
4.19 MHz
22 pF22 pF22 pF22 pF
clock HALT
Crystal resonator
32.768 kHz
330 kΩ
48
V
V
DD
0.001
012345678
Supply voltage VDD (V)
Data Sheet U11369EJ3V0DS
DD
11. PACKAGE DRAWINGS
64-PIN PLASTIC QFP (14x14)
µ
PD75P3116
A
B
49
48
33
32
detail of lead end
S
C D
64
Q
1
16
17
R
F
G
M
I
H
P
J
K
S
SN
L
M
NOTE
Each lead centerline is located within 0.15 mm of
its true position (T.P.) at maximum material condition.
Data Sheet U11369EJ3V0DS
ITEM MILLIMETERS
A
17.6±0.4
B
14.0±0.2
C14.0± 0.2
D
17.6±0.4
F1.0
G
1.0
H0.37
I0.15
J
K
L
M0.17
N
P
Q
R
S
+0.08
-0.07
0.8 (T.P.)
1.8±0.2
0.8±0.2
+0.08
-0.07
0.10
2.55±0.1
0.1±0.1
5°±5°
2.85 MAX.
P64GC-80-AB8-5
49
64-PIN PLASTIC LQFP (12x12)
A
B
µ
PD75P3116
48
49
33
32
detail of lead end
S
CD
R
64
Q
1
16
17
F
G
M
I
H
P
J
K
S
SN
L
M
NOTE
Each lead centerline is located within 0.13 mm of
its true position (T.P.) at maximum material condition.
ITEM MILLIMETERS
14.8±0.4
A
12.0±0.2
B
C12.0± 0.2
14.8±0.4
D
F1.125
1.125
G
H0.32± 0.08
0.13
I
J
0.65 (T.P.)
K
1.4±0.2
L
0.6±0.2
M0.17
N
P
Q
R
S
+0.08
-0.07
0.10
1.4±0.1
0.125±0.075
5°±5°
1.7 MAX.
P64GK-65-8A8-3
50
Data Sheet U11369EJ3V0DS
64-PIN PLASTIC LQFP (14x14)
A
B
4833
49
32
µ
PD75P3116
detail of lead end
S
P
64
1
16
F
G
M
I
H
SN
NOTE
Each lead centerline is located within 0.20 mm of
its true position (T.P.) at maximum material condition.
17
CD
R
T
L
U
Q
J
ITEM MILLIMETERS
17.2±0.2
A
14.0±0.2
K
S
M
B
C14.0± 0.2
17.2±0.2
D
F1.0
1.0
G
H0.37
I0.20
J
K
L
M0.17
N
P
Q
R
S
T0.25
U0.886± 0.15
+0.08
-0.07
0.8 (T.P.)
1.6±0.2
0.8
+0.03
-0.06
0.10
1.4±0.1
0.127±0.075
+4°
3°
-3°
1.7 MAX.
P64GC-80-8BS
Data Sheet U11369EJ3V0DS
51
µ
PD75P3116
12. RECOMMENDED SOLDERING CONDITIONS
The µPD75P3116 should be soldered and mounted under the conditions recommended in the table below.
For details of recommended soldering conditions, refer to the information document Semiconductor Device
Mounting Technology Manual (C10535E).
For soldering methods and conditions other than those recommended below, contact an NEC Sales representative.
Table 12-1. Surface Mounting Type Soldering Conditions (1/2)
• 2.93, 5.86, 46.9 kHz
(Main system clock: during 6.0 MHz operation)
• 64-pin plastic LQFP
(14 × 14)
µ
PD75P3116
Data Sheet U11369EJ3V0DS
55
µ
PD75P3116
APPENDIX B. DEVELOPMENT TOOLS
The following development tools have been provided for system development using the µPD75P3116.
In the 75XL Series, a common relocatable assembler is used in combination with a device file dedicated to each model.
RA75X relocatable assemblerHost MachinePart Number
OSSupply Medium
PC-9800 SeriesMS-DOS
IBM PC/AT™Refer to OS for3.5" 2HC
or compatiblesIBM PCs
Device fileHost MachinePart Number
OSSupply Medium
PC-9800 SeriesMS-DOS3.5" 2HD
IBM PC/ATRefer to OS for3.5" 2HC
or compatiblesIBM PCs
TM
Ver.3.30 to
Note
Ver.6.2
Ver.3.30 to
Note
Ver.6.2
3.5" 2HD
(Product Name)
µ
S5A13RA75X
µ
S7B13RA75X
(Product Name)
µ
S5A13DF753108
µ
S7B13DF753108
Note Ver. 5.00 and later include a task swapping function, but this function cannot be used in this software.
Remark Operation of the assembler and device file is guaranteed only when using the host machine and OS described
above.
56
Data Sheet U11369EJ3V0DS
µ
PD75P3116
PROM Write Tools
HardwarePG-1500This is a PROM writer that can program a single-chip microcontroller with PROM in stand-alone
mode or under the control of a host machine when connected with the supplied accessory board
and optional programmer adapter.
It can also program typical PROMs in capacities ranging from 256 Kb to 4 Mb.
PA-75P3116GCThis is a PROM programmer adapter for the µPD75P3116GC-AB8.
It can be used when connected to the PG-1500.
PA-75P3116GKThis is a PROM programmer adapter for the µPD75P3116GK-8A8.
It can be used when connected to the PG-1500.
PA-75P3116GC-8BS This is a PROM programmer adapter for the µPD75P3116GC-8BS.
It can be used when connected to the PG-1500.
SoftwarePG-1500 controllerConnects the PG-1500 to the host machine via serial and parallel interfaces and controls the
PG-1500 on the host machine.
Host machinePart number
OSSupply medium
PC-9800 SeriesMS-DOS3.5" 2HD
Ver.3.30 to
Note
Ver.6.2
IBM PC/ATRefer to OS for3.5" 2HD
or compatibleIBM PCs
(Product name)
µ
S5A13PG1500
µ
S7B13PG1500
Note Ver. 5.00 and later include a task swapping function, but this function cannot be used in this software.
Remark Operation of the PG-1500 controller is guaranteed only when using the host machine and OS described above.
Data Sheet U11369EJ3V0DS
57
Debugging Tools
An in-circuit emulator (IE-75001-R) is provided as a program debugging tool for the µPD75P3116.
The system configuration using this in-circuit emulator is shown below.
µ
PD75P3116
HardwareIE-75001-RThe IE-75001-R is an in-circuit emulator to be used for hardware and software debugging during
IE-75300-R-EMThis is an emulation board for evaluating application systems using the µPD75P3116.
EP-753108GC-RThis is an emulation probe for the µPD75P3116GC.
EV-9200GC-64It includes a 64-pin conversion socket (EV-9200GC-64) to facilitate connection with the target
EP-753108GK-RThis is an emulation probe for the
TGK-064SBWIt includes a 64-pin conversion adapter (TGK-064SBW) to facilitate connection with the target
Note 1
SoftwareIE control programThis program can control the IE-75001-R on a host machine when connected to the IE-75001-R
development of application systems using the 75X or 75XL Series products.
The IE-75001-R is used in combination with an emulation board (IE-75300-R-EM) and
emulation probe (EP-753108GC-R or EP-753108GK-R) (both sold separately).
Highly efficient debugging can be performed when connected to the host machine and PROM
programmer.
It is used in combination with the IE-75001-R.
When being used, it is connected with the IE-75001-R and the IE-75300-R-EM.
system.
µ
PD75P3116GK.
When being used, it is connected with the IE-75001-R and the IE-75300-R-EM.
system.
via an RS-232C or Centronics interface.
Host machinePart number
OSSupply medium
PC-9800 SeriesMS-DOS3.5" 2HD
Ver.3.30 to
Note 2
Ver.6.2
IBM PC/ATRefer to OS for3.5" 2HC
or compatibleIBM PCs
(Product name)
µ
S5A13IE75X
µ
S7B13IE75X
Notes 1.This is a product of TOKYO ELETECH CORPORATION.
Contact: Daimaru Kogyo, Ltd. Tokyo Electronic Department (TEL: +81-3-3820-7112)
Osaka Electronic Department (TEL: +81-6-6244-6672)
2.Ver. 5.00 and later include a task swapping function, but this function cannot be used in this software.
Remarks 1. Operation of the IE control program is guaranteed only when using the host machine and OS
described above.
µ
2.The
PD753104, 753106, 753108, and 75P3116 are generically called the µPD753108 Subseries.
58
Data Sheet U11369EJ3V0DS
µ
PD75P3116
OS for IBM PCs
The following operating systems for IBM PCs are supported.
OSVersion
PC DOS
TM
MS-DOSVer.5.0 to 6.2
IBM DOS
TM
Note Only English mode is supported.
Caution Ver. 5.0 and later include a task swapping function, but this function cannot be used in this software.
Ver.3.1 to 6.3
Note
J6.1/V
5.0/V
J5.02/V
Note
to 6.2/V
Note
to J6.3/V
Note
Note
Data Sheet U11369EJ3V0DS
59
Package Drawing and Recommended Footprint of Conversion Socket (EV-9200GC-64)
Dimensions of mount pad for EV-9200 and that for target
device (QFP) may be different in some parts. For the
recommended mount pad dimensions for QFP, refer to
"SEMICONDUCTOR DEVICE MOUNTING
TECHNOLOGY MANUAL" (C10535E).
0.583
+0.002
0.031 × 0.591=0.472
–0.001
+0.002
0.031 × 0.591=0.472
–0.001
0.583
0.768
+0.004
0.236
–0.003
+0.004
0.236
–0.003
+0.001
0.197
–0.002
φ
0.093
φ
0.087
φ
0.062
+0.001
–0.002
+0.004
–0.005
+0.001
–0.002
+0.003
–0.002
+0.003
–0.002
Data Sheet U11369EJ3V0DS
61
Package Drawing of Conversion Adapter (TGK-064SBW)
Caution The related documents listed above are subject to change without notice. Be sure to use the
latest version of each document for designing.
Data Sheet U11369EJ3V0DS
65
µ
PD75P3116
Other Related Documents
Document NameDocument No.
SEMICONDUCTOR SELECTION GUIDE – Products & Packages –X13769E
Semiconductor Device Mounting Technology ManualC10535E
Quality Grades on NEC Semiconductor DevicesC11531E
NEC Semiconductor Device Reliability/Quality Control SystemC10983E
Guide to Prevent Damage for Semiconductor Devices by Electrostatic Discharge (ESD)C11892E
Caution The related documents listed above are subject to change without notice. Be sure to use the
latest version of each document for designing.
66
Data Sheet U11369EJ3V0DS
[MEMO]
µ
PD75P3116
Data Sheet U11369EJ3V0DS
67
NOTES FOR CMOS DEVICES
1PRECAUTION AGAINST ESD FOR SEMICONDUCTORS
Note:
Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and
ultimately degrade the device operation. Steps must be taken to stop generation of static electricity
as much as possible, and quickly dissipate it once, when it has occurred. Environmental control
must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using
insulators that easily build static electricity. Semiconductor devices must be stored and transported
in an anti-static container, static shielding bag or conductive material. All test and measurement
tools including work bench and floor should be grounded. The operator should be grounded using
wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need
to be taken for PW boards with semiconductor devices on it.
2HANDLING OF UNUSED INPUT PINS FOR CMOS
Note:
No connection for CMOS device inputs can be cause of malfunction. If no connection is provided
to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence
causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels
of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused
DD
pin should be connected to V
being an output pin. All handling related to the unused pins must be judged device by device and
related specifications governing the devices.
or GND with a resistor, if it is considered to have a possibility of
µ
PD75P3116
3STATUS BEFORE INITIALIZATION OF MOS DEVICES
Note:
Power-on does not necessarily define initial status of MOS device. Production process of MOS
does not define the initial operation status of the device. Immediately after the power source is
turned ON, the devices with reset function have not yet been initialized. Hence, power-on does
not guarantee out-pin levels, I/O settings or contents of registers. Device is not initialized until the
reset signal is received. Reset operation must be executed immediately after power-on for devices
having reset function.
68
Data Sheet U11369EJ3V0DS
µ
PD75P3116
Regional Information
Some information contained in this document may vary from country to country. Before using any NEC
product in your application, pIease contact the NEC office in your country to obtain a list of authorized
representatives and distributors. They will verify:
•
Device availability
•
Ordering information
•
Product release schedule
•
Availability of related technical literature
•
Development environment specifications (for example, specifications for third-party tools and
components, host computers, power plugs, AC supply voltages, and so forth)
•
Network requirements
In addition, trademarks, registered trademarks, export restrictions, and other legal issues may also vary
from country to country.
NEC Electronics Inc. (U.S.)
Santa Clara, California
Tel: 408-588-6000
800-366-9782
Fax: 408-588-6130
800-729-9288
NEC do Brasil S.A.
Electron Devices Division
Guarulhos-SP, Brasil
Tel: 11-6462-6810
Fax: 11-6462-6829
QTOP is a trademark of NEC Corporation.
MS-DOS is either a registered trademark or a trademark of Microsoft Corporation in the United States and/or
other countries.
IBM DOS, PC/AT, and PC DOS are trademarks of International Business Machines Corporation.
The export of this product from Japan is regulated by the Japanese government. To export this product may be prohibited
without governmental license, the need for which must be judged by the customer. The export or re-export of this product
from a country other than Japan may also be prohibited without a license from that country. Please call an NEC sales
representative.
•
The information in this document is current as of November, 2001. The information is subject to
change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or
data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all
products and/or types are available in every country. Please check with an NEC sales representative
for availability and additional information.
•
No part of this document may be copied or reproduced in any form or by any means without prior
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
•
NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of
third parties by or arising from the use of NEC semiconductor products listed in this document or any other
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any
patents, copyrights or other intellectual property rights of NEC or others.
•
Descriptions of circuits, software and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these
circuits, software and information in the design of customer's equipment shall be done under the full
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third
parties arising from the use of these circuits, software and information.
•
While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers
agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
risks of damage to property or injury (including death) to persons arising from defects in NEC
semiconductor products, customers must incorporate sufficient safety measures in their design, such as
redundancy, fire-containment, and anti-failure features.
•
NEC semiconductor products are classified into the following three quality grades:
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products
developed based on a customer-designated "quality assurance program" for a specific application. The
recommended applications of a semiconductor product depend on its quality grade, as indicated below.
Customers must check the quality grade of each semiconductor product before using it in a particular
application.
"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio
and visual equipment, home electronic appliances, machine tools, personal electronic equipment
and industrial robots
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems and medical equipment for life support, etc.
The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not
intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness
to support a given application.
(Note)
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
NEC (as defined above).
M8E 00. 4
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