
PRELIMINARY DATA SHEET
MOS FIELD EFFECT TRANSISTOR
SWITCHING
N-CHANNEL POWER MOS FET
INDUSTRIAL USE
2SK3431
DESCRIPTION
The 2SK3431 is N-channel MOS Field Effect Transistor
designed for high current switching applications.
FEATURES
•Super low on-state resistance:
DS(on)1
= 5.6 mΩ MAX. (VGS = 10 V, ID = 42 A)
R
★
DS(on)2
= 8.9 mΩ MAX. (VGS = 4 V, ID = 42 A)
R
★
•Low C
iss
iss
: C
= 6100 pF TYP.
•Built-in gate protection diode
ABSOLUTE MAXIMUM RATINGS (TA = 25°C)
GSS
D(DC)
D(pulse)
I
AS
I
E
DSS
T
T
ch
stg
AS
Drain to Source Voltage V
Gate to Source Voltage V
Drain Current (DC) I
Drain Current (pulse)
Total Power Dissipation (T
Total Power Dissipation (T
Channel Temperature T
Storage Temperature T
★
Single Avalanche Current
Single Avalanche Energy
★
Notes 1.
PW ≤ 10
2.
Starting Tch = 25 °C, RG = 25 Ω, VGS = 20 V → 0 V
Note1
C
= 25°C) P
A
= 25°C) P
Note2
Note2
µ
s, Duty cycle ≤ 1 %
ORDERING INFORMATION
PART NUMBER PACKAGE
40 V
20 V
±
83 A
±
332 A
±
100 W
1.5 W
150 °C
–55 to +150 °C
65 A
423 mJ
2SK3431
2SK3431-S
2SK3431-Z
TO-220AB
TO-262
TO-220SMD
(TO-220AB)
(TO-262)
(TO-220SMD)
THERMAL RESISTANCE
Channel to Case Rth(ch-C) 1.25
Channel to Ambient Rth(ch-A) 83.3
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No. D14600EJ1V0DS00 (1st edition)
Date Published March 2000 NS CP(K)
Printed in Japan
The mark ★ shows major revised points.
C/W
°
C/W
°
©
1999, 2000

ELECTRICAL CHARACTERISTICS (TA = 25 °C)
CHARACTERISTICS SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT
2SK3431
Drain to Source On-state Resi stance R
★
Gate to Source Cut-off Voltage V
★
Forward Transfer Admittance | yfs |VDS = 10 V, ID = 42 A3060S
Drain Leakage Current I
Gate to Source Leakage Current I
★
Input Capacitance C
Output Capacitance C
★
Reverse Transfer Capacitance C
★
Turn-on Delay Time t
★
Rise Time t
★
Turn-off Delay Time t
★
Fall Time t
★
Total Gate Charge Q
★
Gate to Source Charge Q
★
Gate to Drain Charge Q
Body Diode Forward Voltage V
★
Reverse Recovery Time t
★
Reverse Recovery Charge Q
DS(on)1VGS
DS(on)2VGS
R
GS(off)VDS
DSS
GSS
iss
oss
rss
d(on)ID
r
d(off)
f
G
GS
GD
F(S-D)IF
rr
rr
= 10 V, ID = 42 A4.55.6m
= 4 V, ID = 42 A6.28.9m
Ω
Ω
= 10 V, ID = 1 mA 1.5 2.0 2.5 V
VDS = 40 V, VGS = 0 V10
VGS = ±20 V, VDS = 0 V
10
±
A
µ
A
µ
VDS = 10 V, VGS = 0 V, f = 1 MHz 6100 pF
1400 pF
700 pF
= 42 A, V
RG = 10
GS(on)
= 10 V, VDD = 20 V, 120 ns
Ω
1800 ns
350 ns
440 ns
ID = 83 A , VDD = 32 V, VGS = 10 V 110 nC
18 nC
31 nC
= 83 A, VGS = 0 V1.0V
IF = 83 A, VGS = 0 V, 65 ns
di/dt = 100 A/µ s 110 nC
TEST CIRCUIT 1 AVALANCHE CAPABILITY
PG.
VGS = 20 → 0 V
V
G
R
DD
= 25 Ω
50 Ω
I
D
D.U.T.
I
AS
BV
DSS
V
DS
Starting T
L
DD
V
ch
TEST CIRCUIT 3 GATE CHARGE
D.U.T.
I
G
PG.
= 2 mA
50 Ω
R
L
V
DD
TEST CIRCUIT 2 SWITCHING TIME
D.U.T.
R
PG.
V
GS
0
τ
τ = 1 µs
Duty Cycle ≤ 1 %
G
V
V
GS
Wave Form
I
D
Wave Form
GS
10 %
0
I
D
10 %10
0
t
d(on)
V
90
%
I
trt
t
on
GS(on)
D
d(off)tf
%
90
90
%
%
t
off
L
R
V
DD
2
Preliminary Data Sheet D14600EJ1V0DS00