NEC 1SS303 DATA SHEET

DATA SHEET

p

SILICON SWITCHING DI ODE

1SS303

HIGH SPEED SWITCHING

SILICON EPITAXIAL DOUBLE DIODE : COMMON ANODE

FEATURES

• Low capacitance: Ct

• High speed switching: t

• Wide applications including switching, limitter, clipper.

• Double diode configuration assures economical use.

= 2.5 pF TYP.

= 4.0 ns MAX.

rr

ABSOLUTE MAXIMUM RATINGS

Maximum Voltages and Currents (TA = 25°C)
Peak Reverse Voltage V
DC Reverse Voltage V

Note

Surge Current (1
Surge Current (1
Peak Forward Current

s)

µ

s) I

µ

Note

Peak Forward Current I
Average Rectified Current

Note

Average Rectified Current I
Maximum Temperatures
Junction Temperature T
Storage Temperature Range T
Thermal Resistance
Junction to Ambient

Note

Junction to Ambient R

Both diodes loaded simultaneously.

Note

R

I

FSM

FSM

I

FM

FM

I

th(j-a)

th(j-a)

RM

R

O

O

j

stg

75 V
50 V

6.0 A

4.0 A
450 mA
300 mA
150 mA
100 mA

150 °C

–55 to + 150 °C

1.0 °C/mW

0.85 °C/mW

PACKAGE DIMENSIONS (Unit: mm)

2.1±0.1

1.25±0.1

2

+0.1

−0

0.65

0.3

2.0±0.20.9±0.1

0.3

0.65

1

Marking

0 to 0.1

3

+0.1

−0

0.3

+0.1

−0.05

0.15

CONNECTION DIAGRAM (Top View)

2

3

1

Marking : A4

1. Cathode

2. Cathode

3. Anode

ELECTRICAL CHARACTERISTICS (TA = 25°C)

CHARACTERISTICS SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT

Forward Voltage

Reverse Current I
Capacitance C
Reverse Recovery Time t

The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.

Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.

Document No. D16308EJ2V0DS00 (2nd edition)
(Previous No. DC-2100)
Date Published July 2002 NS CP(K)
Printed in Ja

an

F1

V
V
V

IF = 10 mA 0.72 1.0 V

F2

IF = 50 mA 0.88 1.1 V

F3

IF = 100 mA 1.0 1.2 V

R

VR = 50 V 0.1

t

VR = 0 V, f = 1.0 MHz 2.5 4.0 pF

rr

See Test Circuit. 4.0 ns

A

µ

©

1987

TYPICAL ELECTRICAL CURVES (TA = 25°C)

1SS303

100

50

20

10

5

2

1

- Forward Current - mA

F

I

0.5

0.2

0.1
0

0.2 0.4 0.6 0.8 1.0 1.2

20

FORWARD CURRENT vs.
FORWARD VOLTAGE

F

- Forward Voltage - V

V

TERMINAL CAPACITANCE vs.
REVERSE VOLTA GE

REVERSE CURRENT vs.
REVERSE VOLTA GE

100

50

20

10

5

2

- Reverse Current - µA

R

1

I

0.5

0.2
01020304050

R

- Reverse Voltage - V

V

REVERSE RECOVERY TIME vs.
FORWARD CURRENT

20

10

5

2

1

0.5

- Terminal Capacitance - pF

t

C

0.2

0.1

0.5 1 2 5 10 20 50 100

R

- Reverse Voltage - V

V

16

12

8

4

- Reverse Recovery Time - ns

rr

t

0 20 40 60 80 100

I

F

- Forward Current - mA

2

Data Sheet D16308EJ2V0DS

REVERSE RECOVERY TIME (trr) TEST CIRCUIT

1SS303

Pulse
Generator
(50 Ω)

DC
Source

0.02 µF D.U.T.

3 kΩ

+

−

F

= 10 mA, VR = 6.0 V, RL = 100 Ω

I
i

rr

= 0.1• I

Trigger

r

Sampling
Oscilloscope
(50 Ω)

Input Voltage
Waveform to Diode

V

F

0

V

R

Output Current
Waveform in Diode

I

F

0

I

r

0.1• I

r

rr

t

Data Sheet D16308EJ2V0DS

3

1SS303

•

The information in this document is current as of July, 2002. The information is subject to change
without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data
books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products
and/or types are available in every country. Please check with an NEC sales representative for
availability and additional information.

•

No part of this document may be copied or reproduced in any form or by any means without prior
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.

•

NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of
third parties by or arising from the use of NEC semiconductor products listed in this document or any other
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any
patents, copyrights or other intellectual property rights of NEC or others.

•

Descriptions of circuits, software and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these
circuits, software and information in the design of customer's equipment shall be done under the full
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third
parties arising from the use of these circuits, software and information.

•

While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers
agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
risks of damage to property or injury (including death) to persons arising from defects in NEC
semiconductor products, customers must incorporate sufficient safety measures in their design, such as
redundancy, fire-containment, and anti-failure features.

•

NEC semiconductor products are classified into the following three quality grades:
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products
developed based on a customer-designated "quality assurance program" for a specific application. The
recommended applications of a semiconductor product depend on its quality grade, as indicated below.
Customers must check the quality grade of each semiconductor product before using it in a particular
application.
"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio

and visual equipment, home electronic appliances, machine tools, personal electronic equipment
and industrial robots

"Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster

systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)

"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life

support systems and medical equipment for life support, etc.
The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not
intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness
to support a given application.
(Note)
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for

NEC (as defined above).

M8E 00. 4