MM54C89/MM74C89 64-Bit TRI-STATE Random Access Read/Write Memory
March 1988
MM54C89/MM74C89 64-Bit TRI-STATE
Random Access Read/Write Memory
General Description
The MM54C89/MM74C89 is a 16-word by 4-bit random access read/write memory. Inputs to the memory consist of
four address lines, four data input lines, a write
and a memory
are decoded internally to select each of the 16 possible
word locations. An internal address register latches the address information on the positive to negative transition of
the memory enable input. The four TRI-STATE data output
lines working in conjunction with the memory enable input
provide for easy memory expansion.
Address Operation: Address inputs must be stable t
or to the positive to negative transition of memory
is thus not necessary to hold address information stable for
more than t
ative transition of memory
Note: The timing is different than the DM7489 in that a positive to negative
transition of the memory
selected.
Write Operation: Information present at the data inputs is
written into the memory at the selected address by bringing
write
enable line. The four binary address inputs
after the memory is enabled (positive to neg-
HA
enable and memory enable low.
enable).
enable must occur for the memory to be
enable line
SA
enable.It
Logic and Connection Diagrams
Read Operation: The complement of the information which
was written into the memory is non-destructively read out at
the four outputs. This is accomplished by selecting the desired address and bringing memory
enable high.
When the device is writing or disabled the output assumes a
TRI-STATE (Hi-z) condition.
Features
Y
Wide supply voltage range3.0V to 15V
pri-
Y
Guaranteed noise margin1.0V
Y
High noise immunity0.45 VCC(typ.)
Y
Low powerfan out of 2
TTL compatibilitydriving 74L
Y
Low power consumption100 nW/package (typ.)
Y
Fast access time130 ns (typ.) at V
Y
TRI-STATE output
É
enable low and write
CC
Dual-In-Line Package
e
10V
Top View
Order Number MM54C89
or MM74C89
TL/F/5888– 1
TRI-STATEÉis a registered trademark of National Semiconductor Corporation.
C
1995 National Semiconductor CorporationRRD-B30M105/Printed in U. S. A.
TL/F/5888
TL/F/5888– 2
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Voltage at any Pin
Operating Temperature Range
MM54C89
MM74C89
Storage Temperature Range (TS)
b
0.3V to V
b
b
b
a
0.3V
CC
55§Ctoa125§C
40§Ctoa85§C
65§Ctoa150§C
Power Dissipation (P
Dual-In-Line700 mW
)
D
Small Outline500 mW
Operating V
Absolute Maximum V
Range3.0V to 15V
CC
CC
Lead Temperature (TL)
(Soldering, 10 seconds)260
18V
DC Electrical Characteristics Min/Max limits apply across temperature range, unless otherwise noted
SymbolParameterConditionsMinTypMaxUnits
CMOS TO CMOS
V
IN(1)
V
IN(0)
V
OUT(1)
V
OUT(0)
I
IN(1)
I
IN(0)
I
OZ
I
CC
Logical ‘‘1’’ Input VoltageV
Logical ‘‘0’’ Input VoltageV
Logical ‘‘1’’ Output VoltageV
Logical ‘‘0’’ Output VoltageV
Logical ‘‘1’’ Input CurrentV
Logical ‘‘0’’ Input CurrentV
Output Current in HighV
Impedance StateV
Supply CurrentV
CMOS/LPTTL INTERFACE
V
IN(1)
V
IN(0)
V
OUT(1)
V
OUT(0)
Logical ‘‘1’’ Input Voltage54C, V
Logical ‘‘0’’ Input Voltage54C, V
Logical ‘‘1’’ Output Voltage54C, V
Logical ‘‘0’’ Output Voltage54C, V
OUTPUT DRIVE (See 54C/74C Family Characteristics Data Sheet) (Short Circuit Current)
I
SOURCE
I
SOURCE
I
SINK
I
SINK
Note 1: ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed. Except for ‘‘Operating Range’’ they are not
meant to imply that the devices should be operated at these limits. The table of ‘‘Electrical Characteristics’’ provides conditions for actual device operation.
Output Source CurrentV
(P-Channel)T
Output Source CurrentV
(P-Channel)T
Output Sink CurrentV
(N-Channel)T
Output Sink CurrentV
(N-Channel)T
e
5.0V3.5V
CC
e
10V8.0V
V
CC
e
5.0V1.5V
CC
e
10V2.0V
V
CC
CC
V
CC
CC
V
CC
CC
CC
CC
CC
CC
74C, V
74C, V
74C, V
74C, V
CC
e
A
CC
e
A
CC
e
A
CC
e
A
e
e
e
e
e
e
e
e
e
e
e
e
e
25§C
25§C
25§C
25§C
eb
5.0V, I
10V, I
5.0V, I
10V, I
15V, V
15V, V
15V, Ve15V0.0051.0mA
15V, V
10 mA4.5V
O
eb
10 mA9.0V
O
ea
10 mA0.5V
O
ea
10 mA1.0V
O
e
15V
IN
e
0V
IN
e
0V
O
b
1.0
b
1.0
b
0.0051.0mA
b
0.005mA
b
0.005mA
15V0.05300mA
e
4.5VV
CC
e
4.75VV
CC
e
4.5V0.8V
CC
e
4.75V0.8V
CC
e
CC
e
CC
e
CC
e
CC
5.0V, V
10V, V
5.0V, V
10V, V
4.5V, I
4.75V, I
4.5V, I
4.75V, I
OUT
OUT
OUT
OUT
eb
360 mA2.4V
O
eb
360 mA2.4V
O
ea
360 mA0.4V
O
ea
360 mA0.4V
O
e
0V
e
0V
e
V
CC
e
V
CC
b
1.5V
CC
b
1.5V
CC
b
1.75
b
8.0
b
3.3mA
b
15mA
1.753.6mA
8.016mA
C
§
AC Electrical Characteristics* T
e
A
25§C, C
e
50 pF, unless otherwise noted
L
SymbolParameterConditionsMinTypMaxUnits
t
pd
t
ACC
t
SA
t
HA
t
ME
Propagation Delay fromV
Memory EnableV
Access Time fromV
Address InputV
Address Setup TimeV
Address Hold TimeV
Memory Enable Pulse WidthV
e
5V270500ns
CC
e
10V100220ns
CC
e
5V350650ns
CC
e
10V130280ns
CC
e
5V150ns
CC
e
10V60ns
V
CC
e
5V60ns
CC
e
10V40ns
V
CC
e
5V400250ns
CC
e
10V15090ns
V
CC
2
AC Electrical Characteristics* T
e
A
25§C, C
e
50 pF, unless otherwise noted (Continued)
L
SymbolParameterConditionsMinTypMaxUnits
t
SR
t
WS
t
WE
t
HD
t
SD
t1H,t
t1H,t
C
IN
C
OUT
C
PD
*AC Parameters are guaranteed by DC correlated testing.
Note 2: Capacitance is guaranteed by periodic testing.
Note 3: C
AN-90.
Write Enable SetupV
Time for a ReadV
Write Enable SetupV
Time for a WriteV
Write Enable Pulse WidthV
Data Input Hold TimeV
Data Input SetupV
Propagation Delay from a LogicalV
0H
‘‘1’’ or Logical ‘‘0’’ to the HighV
Impedance State from
Memory Enable
Propagation Delay from a LogicalV
0H
‘‘1’’ or Logical ‘‘0’’ to the HighV
Impedance State from
Write Enable
Input CapacityAny Input (Note 2)5pF
Output CapacityAny Output (Note 2)6.5pF
Power Dissipation Capacity(Note 3)230pF
determines the no load AC power consumption of any CMOS device. For complete explanation see 54C/74C Family Characteristics application note,
PD
e
5V0ns
CC
e
10V0ns
CC
e
5Vt
CC
e
10Vt
CC
e
CC
e
V
CC
e
CC
e
V
CC
e
CC
e
V
CC
e
CC
e
CC
e
CC
e
CC
e
5V, t
10V, t
5V50ns
10V25ns
5V50ns
10V25ns
5V, C
10V, C
50V, C
10V, C
0300160ns
WS
e
010060ns
WS
e
L
e
L
e
L
e
L
5 pF, R
5 pF, R
5 pF, R
5 pF, R
e
10k180300ns
L
e
10k
L
e
10k180300ns
L
e
10k85120ns
L
b
85120ns
ME
ME
ns
ns
AC Electrical Characteristics* Guaranteed across the specified temperature range, C
MM54C89MM74C89
ParameterConditionsT
t
PD
t
ACC
t
SA
t
HA
t
ME
t
WE
t
HD
*AC Parameters are guaranteed by DC correlated testing.
e
V
5V700600ns
CC
e
10V310265ns
V
CC
e
15V250210ns
V
CC
e
V
5V910780ns
CC
e
V
10V400345ns
CC
e
15V320270ns
V
CC
e
V
5V210180ns
CC
e
10V9080ns
V
CC
e
15V7060ns
V
CC
e
V
5V8070ns
CC
e
10V5550ns
V
CC
e
15V4540ns
V
CC
e
V
5V560480ns
CC
e
10V210180ns
V
CC
e
V
15V170150ns
CC
e
V
5V420360ns
CC
e
10V140120ns
V
CC
e
15V110100ns
V
CC
e
V
5V7060ns
CC
e
10V3530ns
V
CC
e
V
15V3025ns
CC
eb
55§Ctoa125§CT
A
MinMaxMinMax
eb
40§Ctoa85§CUnits
A
e
50 pF
L
3
AC Electrical Characteristics*
Guaranteed across the specified temperature range, C
ParameterConditionsT
t
SD
t1H,t
0H
*AC Parameters are guaranteed by DC correlated testing.
e
V
5V7060ns
CC
e
10V3530ns
V
CC
e
15V3025ns
V
CC
e
V
5V420360ns
CC
e
V
CC
e
V
CC
10V, C
15V, R
e
5 pF170145ns
L
e
10 kX135115ns
L
Truth Table
MEWEOperationCondition of Outputs
LLWriteTRI-STATE
LHReadComplement of Selected Word
HLInhibit, StorageTRI-STATE
HHInhibit, StorageTRI-STATE
AC Test Circuits
t
0H
TL/F/5888– 4
e
50 pF (Continued)
L
MM54C89MM74C89
eb
55§Ctoa125§CT
A
eb
40§Ctoa85§CUnits
A
MinMaxMinMax
t
1H
TL/F/5888– 3
Switching Time Waveforms
t
0H
Read Cycle
TL/F/5888– 5
TL/F/5888– 7
t
1H
TL/F/5888– 6
Write Cycle
TL/F/5888– 8
4
Switching Time Waveforms (Continued)
Read Modify Write Cycle
e
Note: t
60 ns
r
e
t
10 ns
f
TL/F/5888– 9
5
Physical Dimensions inches (millimeters)
Ceramic Dual-In-Line Package (J)
Order Number MM54C89J or MM74C89J
NS Package Number J16A
Molded Dual-In-Line Package (N)
Order Number MM54C89N or MM74C89N
NS Package Number N16E
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:
MM54C89/MM74C89 64-Bit TRI-STATE Random Access Read/Write Memory
1. Life support devices or systems are devices or2. A critical component is any component of a life
systems which, (a) are intended for surgical implantsupport device or system whose failure to perform can
into the body, or (b) support or sustain life, and whosebe reasonably expected to cause the failure of the life
failure to perform, when properly used in accordancesupport device or system, or to affect its safety or
with instructions for use provided in the labeling, caneffectiveness.
be reasonably expected to result in a significant injury
to the user.
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