MXIC MX28F2000TPC-12C4, MX28F2000TPC-90C4, MX28F2000TQC-12C4, MX28F2000TQC-90C4 Datasheet

FEATURES
MX28F2000T
2M-BIT [256K x 8] CMOS FLASH MEMORY
• 262,144 bytes by 8-bit organization
• Fast access time: 90/120 ns
• Low power consumption – 50mA maximum active current – 100uA maximum standby current
• Programming and erasing voltage 12V ± 5%
• Command register architecture – Byte Programming (15us typical) – Auto chip erase 5 seconds typical
(including preprogramming time)
– Block Erase
• Optimized high density blocked architecture – Eight 4-KB blocks – Fourteen 16-KB blocks
GENERAL DESCRIPTION
The MX28F2000T is a 2-mega bit Flash memory or­ganized as 256K bytes of 8 bits each. MXIC's Flash memories offer the most cost-effective and reliable read/write non-volatile random access memory. The MX28F2000T is packaged in 32-pin PDIP and PLCC . It is designed to be reprogrammed and erased in­system or in-standard EPROM programmers.
The standard MX28F2000T offers access times as fast as 90 ns, allowing operation of high-speed microprocessors without wait states. To eliminate bus contention, the MX28F2000T has separate chip enable (CE) and output enable (OE) controls.
MXIC's Flash memories augment EPROM function­ality with in-circuit electrical erasure and programming. The MX28F2000T uses a command register to manage this functionality, while maintaining a standard 32-pin pinout. The command register allows for 100% TTL level control inputs and fixed power supply levels during erase and programming, while maintaining maximum EPROM compatibility.
• Auto Erase (chip & block) and Auto Program – DATA polling – Toggle bit
• 10,000 minimum erase/program cycles
• Latch-up protected to 100mA from -1 to VCC+1V
• Advanced CMOS Flash memory technology
• Compatible with JEDEC-standard byte-wide 32-pin EPROM pinouts
• Package type: – 32-pin plastic DIP – 32-pin PLCC
MXIC Flash technology reliably stores memory con­tents even after 10,000 erase and program cycles. The MXIC cell is designed to optimize the erase and programming mechanisms. In addition, the combi­nation of advanced tunnel oxide processing and low internal electric fields for erase and programming operations produces reliable cycling. The MX28F2000T uses a 12.0V ± 5% VPP supply to perform the Auto Program/Erase algorithms.
The highest degree of latch-up protection is achieved with MXIC's proprietary non-epi process. Latch-up protection is proved for stresses up to 100 milliamps on address and data pin from -1V to VCC + 1V.
P/N: PM0472
1
REV. 1.0, Jun 13, 1997
MX28F2000P Block Address and Block Structure
MX28F2000T
A17~A0
3FFFFH
3F000H
3EFFFH
3E000H
3DFFFH
3D000H
3CFFFH
3C000H
3BFFFH
3B000H
3AFFFH
3A000H 39FFFH
39000H
38FFFH
38000H
37FFFH 34000H 33FFFH
30000H 2FFFFH
2C000H
2BFFFH
28000H 27FFFH
24000H 23FFFH
20000H 1FFFFH
1C000H
1BFFFH
18000H 17FFFH
14000H 13FFFH
10000H 0FFFFH
0C000H 0BFFFH
08000H 07FFFH
04000H 03FFFH
00000H
4-K byte 4-K byte
4-K byte
4-K byte
4-K byte 4-K byte 4-K byte
4-K byte
16-K byte
16-K byte
16-K byte
16-K byte
16-K byte
16-K byte
16-K byte
16-K byte
16-K byte
16-K byte
16-K byte
16-K byte
16-K byte
16-K byte
P/N: PM0472
2
REV. 1.0, Jun 13, 1997
PIN CONFIGURATIONS
MX28F2000T
32 PDIP
32 PLCC
VPP
1
A16
2
A15
3
A12
4
A7
5
A6
6
A5
7
A4
8
A3
9
A2
10
A1
11
A0
12
Q0
13
Q1
14
Q2
15
GND
16
A12
A15
4
5
A7 A6 A5 A4
MX28F2000T
9
A3 A2 A1 A0
13
Q0
14 17 20
VCC
32
WE
31
A17
30
A14
29
A13
28
A8
27
A9
26
A11
25
OE
24
A10
23
CE
22
MX28F2000T
A16
1
21 20 19 18 17
VPP
32
Q7 Q6 Q5 Q4 Q3
VCCWEA17
PIN DESCRIPTION:
SYMBOL PIN NAME
A0~A17 Address Input Q0~Q7 Data Input/Output CE Chip Enable Input OE Output Enable Input WE Write enable Pin VPP Program Supply Voltage VCC Power Supply Pin (+5V) GND Ground Pin
30
29
A14 A13 A8 A9
25
A11 OE A10 CE
21
Q7
P/N: PM0472
Q1
Q2
VSS
Q3Q4Q5
Q6
REV. 1.0, Jun 13, 1997
3
BLOCK DIAGRAM
MX28F2000T
CE
OE
WE
A0-A17
CONTROL INPUT
LOGIC
ADDRESS
LATCH
AND
BUFFER
PROGRAM/ERASE
HIGH VOLTAGE
X-DECODER
MX28F2000T
FLASH ARRA Y
Y-DECODER
Y-PASS GATE
SENSE
AMPLIFIER
PGM
DATA
HV
PROGRAM
DATA LATCH
ARRAY
SOURCE
HV
MODE LOGIC
STATE
REGISTER
COMMAND
DATA DECODER
COMMAND
DATA LATCH
P/N: PM0472
Q0-Q7
I/O BUFFER
REV. 1.0, Jun 13, 1997
4
MX28F2000T
AUTOMATIC PROGRAMMING
The MX28F2000T is byte programmable using the Automatic Programming algorithm. The Automatic Programming algorithm does not require the system to time out or verify the data programmed. The typical room temperature chip programming time of the MX28F2000T is less than 5 seconds.
AUTOMATIC CHIP ERASE
The device may be erased using the Automatic Erase algorithm. The Automatic Erase algorithm automati­cally programs the entire array prior to electrical erase. The timing and verification of electrical erase are controlled internal to the device.
AUTOMATIC BLOCK ERASE
The MX28F2000T is block(s) erasable using MXIC's Auto Block Erase algorithm. Block erase modes allow blocks of the array to be erased in one erase cycle. The Automatic Block Erase algorithm automatically programs the specified block(s) prior to electrical erase. The timing and verification of electrical erase are controlled internal to the device.
AUTOMATIC PROGRAMMING ALGORITHM
MXIC's Automatic Programming algorithm requires the user to only write a program set-up command and a program command (program data and address). The device automatically times the programming pulse width, provides the program verify, and counts the number of sequences. A status bit similar to DATA polling and a status bit toggling between consecutive read cycles, provide feedback to the user as to the status of the programming operation.
AUTOMATIC ERASE ALGORITHM
MXIC's Automatic Erase algorithm requires the user to only write an erase set-up command and erase com­mand. The device will automatically pre-program and verify the entire array. Then the device automatically times the erase pulse width, provides the erase verify, and counts the number of sequences. A status bit similar to DATA polling and a status bit toggling between consecutive read cycles, provide feedback to the user as to the status of the erase operation.
Commands are written to the command register using standard microprocessor write timings. Register con­tents serve as inputs to an internal state-machine which controls the erase and programming circuitry. During write cycles, the command register internally latches address and data needed for the programming and erase operations. For system design simplifica­tion, the MX28F2000T is designed to support either WE or CE controlled writes. During a system write cycle, addresses are latched on the falling edge of WE or CE whichever occurs last. Data is latched on the rising edge of WE or CE whichever occur first. To simplify the following discussion, the WE pin is used as the write cycle control pin throughout the rest of this text. All setup and hold times are with respect to the WE signal.
MXIC's Flash technology combines years of EPROM experience to produce the highest levels of quality, relia­bility, and cost effectiveness. The MX28F2000P electri­cally erases all bits simultaneously using Fowler-Nord­heim tunneling. The bytes are programmed one byte at a time using the EPROM programming mechanism of hot electron injection.
P/N: PM0472
5
REV. 1.0, Jun 13, 1997
MX28F2000T
TABLE 1. COMMAND DEFINITIONS
COMMAND BUS FIRST BUS CYCLE SECOND BUS CYCLE
CYCLES OPERATION ADDRESS DATA OPERATION ADDRESS DATA
Read Memory 1 Write X 00H Read Identified codes 2 Write X 90H Read IA ID Setup auto erase/ 2 Write X 30H Write X 30H
auto erase (chip) Setup auto erase/ 2 Write X 20H Write EA D0H
auto erase (block)
Setup auto program/ 2 Write X 40H Write PA PD program
Setup Erase/ 2 Write X 20H Write X 20H Erase (chip)
Setup Erase/ 2 Write X 60H Write EA 60H Erase (block)
Erase verify 2 Write EVA A0H Read X EVD Reset 2 Write X FFH Write X FFH
Note:
IA = Identifier address EA = Block of memory location to be erased PA = Address of memory location to be pro-
grammed
ID = Data read from location IA during device iden-
tification PD = Data to be programmed at location PA EVA = Address of memory location to be read during
erase verify. EVD = Data read from location EVA during erase
verify.
Auto modes have the build-in enchanced features. Please use the auto erase mode whenever it is.
P/N: PM0472
6
REV. 1.0, Jun 13, 1997
MX28F2000T
COMMAND DEFINITIONS
When low voltage is applied to the VPP pin, the con­tents of the command register default to 00H, enabling read-only operation.
Placing high voltage on the VPP pin enables read/write operations. Device operations are selected by writing specific data patterns into the command register. Ta­ble 1 defines these MX28F2000T register commands. Table 2 defines the bus operations of MX28F2000T.
TABLE 2. MX28F2000T BUS OPERATIONS
OPERATION VPP(1) A0 A9 CE OE WE DQ0-DQ7 READ-ONLY Read VPPL A0 A9 VIL VIL VIH Data Out
Output Disable VPPL X X VIL VIH VIH Tri-State Standby VPPL X X VIH X X Tri-State Read Silicon ID (Mfr)(2) VPPL VIL VID(3) VIL VIL VIH Data = C2H Read Silicon ID (Device)(2) VPPL VIH VID(3) VIL VIL VIH Data = 3CH
READ/WRITE Read VPPH A0 A9 VIL VIL VIH Data Out(4)
Standby(5) VPPH X X VIH X X Tri-State Write VPPH A0 A9 VIL VIH VIL Data In(6)
NOTES:
1. VPPL may be grounded, a no-connect with a resistor tied
to ground, or < VCC + 2.0V. VPPH is the programming voltage specified for the device. When VPP = VPPL, memory contents can be read but not written or erased.
2. Manufacturer and device codes may also be accessed
via a command register write sequence. Refer to Table
1. All other addresses don't care.
3. VID is the Silicon-ID-Read high voltage.(11.5V to 13v)
4. Read operations with VPP = VPPH may access array data or Silicon ID codes.
5. With VPP at high voltage, the standby current equals ICC + IPP (standby).
6. Refer to Table 1 for valid Data-In during a write operation.
7. X can be VIL or VIH.
P/N: PM0472
7
REV. 1.0, Jun 13, 1997
MX28F2000T
READ COMMAND
While VPP is high, for erasure and programming, memory contents can also be accessed via the read command. The read operation is initiated by writing 00H into the command register. Microprocessor read cycles retrieve array data. The device remains en­abled for reads until the command register contents are altered.
The default contents of the register upon VPP power­up is 00H. This default value ensures that no spurious alteration of memory contents occurs during the VPP power transition. Where the VPP supply is hard-wired to the MX28F2000T, the device powers up and remains enabled for reads until the command register contents are changed.
SILICON-ID-READ COMMAND
Flash-memories are intended for use in applications where the local CPU alters memory contents. As such, manufacturer- and device-codes must be accessible while the device resides in the target system. PROM programmers typically access signature codes by rais­ing A9 to a high voltage. However, multiplexing high voltage onto address lines is not a desired system­design practice.
pattern. When the device is automatically verified to contain an all-zero pattern, a self-timed chip erase and verify begin. The erase and verify operations are complete when the data on DQ7 is "1" at which time the device returns to the Read mode. The system is not required to provide any control or timing during these operations.
When using the Automatic Chip Erase algorithm, note that the erase automatically terminates when adequate erase margin has been achieved for the memory array(no erase verify command is required). The margin voltages are internally generated in the same manner as when the standard erase verify command is used.
The Automatic set-up erase command is a command­only operation that stages the device for automatic electrical erasure of all bytes in the array. Automatic set-up erase is performed by writing 30H to the command register.
To command automatic chip erase, the command 30H must be written again to the command register. The automatic chip erase begins on the rising edge of the WE and terminates when the data on DQ7 is "1" and the data on DQ6 stops toggling for two consecutive read cycles, at which time the device returns to the Read mode.
The MX28F2000T contains a Silicon-ID-Read opera­tion to supplement traditional PROM-programming methodology. The operation is initiated by writing 90H into the command register. Following the command write, a read cycle from address 0000H retrieves the manufacturer code of C2H. A read cycle from address 0001H returns the device code of 3CH.
SET-UP AUTOMATIC CHIP ERASE/ERASE COMMANDS
The automatic chip erase does not require the device to be entirely pre-programmed prior to excuting the Automatic set-up erase command and Automatic chip erase command. Upon executing the Automatic chip erase command, the device automatically will program and verify the entire memory for an all-zero data
P/N: PM0472
SET-UP AUTOMATIC BLOCK ERASE/ERASE COMMANDS
The automatic block erase does not require the device to be entirely pre-programmed prior to executing the Automatic set-up block erase command and Automatic block erase command. Upon executing the Automatic block erase command, the device automati­cally will program and verify the block(s) memory for an all-zero data pattern. The system is not required to provide any controls or timing during these operations.
When the block(s) is automatically verified to contain an all-zero pattern, a self-timed block erase and verify begin. The erase and verify operations are complete when the data on DQ7 is "1" and the data on DQ6 stops toggling for two consecutive read cycles, at which time the device returns to the Read mode. The system is not required to provide any control or timing during these operations.
REV. 1.0, Jun 13, 1997
8
MX28F2000T
When using the Automatic Block Erase algorithm, note that the erase automatically terminates when adequate erase margin has been achieved for the memory array (no erase verify command is required). The margin voltages are internally generated in the same manner as when the standard erase verify command is used.
The Automatic set-up block erase command is a com­mand only operation that stages the device for auto­matic electrical erasure of selected blocks in the array. Automatic set-up block erase is performed by writing 20H to the command register.
To enter automatic block erase, the user must write the command D0H to the command register. Block addresses are loaded into internal register on the 2nd falling edge of WE. Each successive block load cycles, started by the falling edge of WE, must begin within 30us from the rising edge of the preceding WE. Otherwise, the loading period ends and internal auto block erase cycle starts. When the data on DQ7 is "1" and the data on DQ6 stops toggling for two consecutive read cycles, at which time auto erase ends and the device returns to the Read mode.
Refer to page 2 for detailed block address.
SET-UP AUTOMATIC PROGRAM/PROGRAM COMMANDS
RESET COMMAND
A reset command is provided as a means to safely abort the erase- or program-command sequences. Following either set-up command (erase or program) with two consecutive writes of FFH will safely abort the operation. Memory contents will not be altered. Should program-fail or erase-fail happen, two consecutive writes of FFH will reset the device to abort the operation. A valid command must then be written to place the device in the desired state.
WRITE OPERATON STATUS
TOGGLE BIT-DQ6
The MX28F2000T features a "Toggle Bit" as a method to indicate to the host sytem that the Auto Program/ Erase algorithms are either in progress or completed.
While the Automatic Program or Erase algorithm is in progress, successive attempts to read data from the device will result in DQ6 toggling between one and zero. Once the Automatic Program or Erase algorithm is completed, DQ6 will stop toggling and valid data will be read. The toggle bit is valid after the rising edge of the second WE pulse of the two write pulse sequences.
The Automatic Set-up Program is a command-only operation that stages the device for automatic pro­gramming. Automatic Set-up Program is performed by writing 40H to the command register.
Once the Automatic Set-up Program operation is per­formed, the next WE pulse causes a transition to an active programming operation. Addresses are internally latched on the falling edge of the WE pulse. Data is internally latched on the rising edge of the WE pulse. The rising edge of WE also begins the programming operation. The system is not required to provide further controls or timings. The device will automatically provide an adequate internally generated program pulse and verify margin. The automatic programming operation is completed when the data read on DQ6 stops toggling for two consecutive read cycles and the data on DQ7 and DQ6 are equivalent to data written to these two bits, at which time the device returns to the Read mode (no program verify command is required).
P/N: PM0472
DATA POLLING-DQ7
The MX28F2000T also features Data Polling as a method to indicate to the host system that the Automatic Program or Erase algorithms are either in progress or completed.
While the Automatic Programming algorithm is in op­eration, an attempt to read the device will produce the complement data of the data last written to DQ7. Upon completion of the Automatic Program algorithm an attempt to read the device will produce the true data last written to DQ7. The Data Polling feature is valid after the rising edge of the second WE pulse of the two write pulse sequences.
REV. 1.0, Jun 13, 1997
9
While the Automatic Erase algorithm is in operation, DQ7 will read "0" until the erase operation is com­pleted. Upon completion of the erase operation, the data on DQ7 will read "1". The Data Polling feature is valid after the rising edge of the second WE pulse of two write pulse sequences.
The Data Polling feature is active during Automatic Program/Erase algorithms.
POWER-UP SEQUENCE
The MX28F2000T powers up in the Read only mode. In addition, the memory contents may only be altered after successful completion of a two-step command sequence. Power up sequence is not required.
SYSTEM CONSIDERATIONS
MX28F2000T
During the switch between active and standby condi­tions, transient current peaks are produced on the rising and falling edges of Chip Enable. The magnitude of these transient current peaks is dependent on the output capacitance loading of the device. At a minimum, a 0.1uF ceramic capacitor (high frequency, low inherent inductance) should be used on each device between VCC and GND, and between VPP and GND to minimize transient effects. In addition, to overcome the voltage drop caused by the inductive effects of the printed circuit board traces on FLASH memory arrays, a 4.7uF bulk electrolytic capacitor should be used between VCC and GND for each eight devices. The location of the capacitor should be close to where the power supply is con­nected to the array.
P/N: PM0472
10
REV. 1.0, Jun 13, 1997
Loading...
+ 21 hidden pages