The MX27C1000A is a 5V only, 1M-bit, One Time
Programmable Read Only Memory. It is organized as
128K words by 8 bits per word, operates from a single +
5 volt supply, has a static standby mode, and features
fast single address location programming. All programming signals are TTL levels, requiring a single pulse. For
programming outside from the system, existing EPROM
PIN CONFIGURATIONS
32 PDIP/SOP
VCC
32
PGM
31
NC
30
A14
29
A13
28
A8
27
A9
26
A11
25
OE
24
A10
23
CE
22
Q7
21
Q6
20
Q5
19
Q4
18
Q3
17
32
OE
31
A10
30
CE
29
Q7
28
Q6
27
Q5
26
Q4
25
Q3
24
GND
23
Q2
22
Q1
21
Q0
20
A0
19
A1
18
A2
17
A3
32 TSOP
A9
A8
NC
A7
A6
A5
A4
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
A11
A13
A14
PGM
VCC
VPP
A16
A15
A12
VPP
A16
A15
A12
GND
A7
A6
A5
A4
A3
A2
A1
A0
Q0
Q1
Q2
1
2
3
4
5
6
7
8
9
10
MX27C1000A
11
12
13
14
15
16
MX27C1000A
• Operating current: 30mA
• Standby current: 100uA
• Package type:
- 32 pin plastic DIP
- 32 pin PLCC
- 32 pin SOP
- 32 pin TSOP
programmers may be used. The MX27C1000A supports
an intelligent fast programming algorithm which can
result in programming time of less than thirty seconds.
This One Time Programmable Read Only is packaged in
industry standard 32 pin dual-in-line packages, 32 lead
PLCC, 32 lead SOP and 32 lead TSOP packages.
32 PLCC
A12
A15
A16
VPP
VCC
PGM
NC
4
5
A7
A6
A5
A4
9
A3
A2
A1
A0
13
Q0
141720
Q1
PIN DESCRIPTION
SYMBOLPIN NAME
A0~A16Address Input
Q0~Q7Data Input/Output
CEChip Enable Input
OEOutput Enable Input
PGMProgrammable Enable Input
VPPProgram Supply Voltage
N CNo Internal Connection
VC CPower Supply Pin (+5V)
GN DGround Pin
1
32
MX27C1000A
Q2
Q3Q4Q5
GND
30
A14
29
A13
A8
A9
A11
25
OE
A10
CE
Q7
21
Q6
P/N: PM0733
1
REV. 1.1, JUL. 19, 2001
MX27C1000A
BLOCK DIAGRAM
CE
PGM
OE
A0~A16
ADDRESS
INPUTS
VCC
GND
.
.
.
.
.
.
.
.
CONTROL
LOGIC
Y-DECODER
X-DECODER
VPP
OUTPUT
BUFFERS
.
Y-SELECT
.
.
.
1M BIT
.
.
.
.
CELL
MAXTRIX
Q0~Q17
FUNCTIONAL DESCRIPTION
THE PROGRAMMING OF THE MX27C1000A
When the MX27C1000A is delivered, or it is erased,
the chip has all 1M bits in the "ONE" or HIGH state.
"ZEROs" are loaded into the MX27C1000 through the
procedure of programming.
For programming, the data to be programmed is applied
with 8 bits in parallel to the data pins.
Vcc must be applied simultaneously or before Vpp, and
removed simultaneously or after Vpp. When
programming an MXIC OTP ROM, a 01.uF capacitor
is required across Vpp and ground to suppress spurious
voltage transients which may damage the device.
FAST PROGRAMMING
PROGRAM INHIBIT MODE
Programming of multiple MX27C1000As in parallel with
different data is also easily accomplished by using the
Program Inhibit Mode. Except for CE and OE, all like
inputs of the parallel MX27C1000A may be common.
A TTL low-level program pulse applied to an
MX27C1000A CE input with VPP = 12.5 ± 0.5 V and
PGM LOW will program that MX27C1000A. A high-level
CE input inhibits the other MX27C1000As from being
programmed.
PROGRAM VERIFY MODE
Verification should be performed on the programmed bits
to determine that they were correctly programmed. The
verification should be performed with OE and CE at VIL,
PGM at VIH, and VPP at its programming voltage.
AUTO IDENTIFY MODE
The auto identify mode allows the reading out of a binary
code from an EPROM that will identify its manufacturer
and device type. This mode is intended for use by
programming equipment for the purpose of automatically
matching the device to be programmed with its
corresponding programming algorithm. This mode is
functional in the 25°C ± 5°C ambient temperature range
that is required when programming the MX27C1000A.
To activate this mode, the programming equipment must
force 12.0 ± 0.5 V on address line A9 of the device.
Two identifier bytes may then be sequenced from the
device outputs by toggling address line A0 from VIL to
VIH. All other address lines must be held at VIL during
auto identify mode.
The device is set up in the fast programming mode when
the programming voltage VPP = 12.75V is applied, with
VCC = 6.25 V and PGM = VIL(or OE = VIH) (Algorithm
is shown in Figure 1). The programming is achieved
by applying a single TTL low level 10us pulse to the
PGM input after addresses and data line are stable. If
the data is not verified, an additional pulse is applied
for a maximum of 25 pulses. This process is repeated
while sequencing through each address of the device.
When the programming mode is completed, the data in
all address is verified at VCC = VPP = 5V ± 10%.
P/N: PM0733
Byte 0 ( A0 = VIL) represents the manufacturer code,
and byte 1 (A0 = VIH), the device identifier code. For
the MX27C1000A, these two identifier bytes are given
in the Mode Select Table. All identifiers for manufacturer
and device codes will possess odd parity, with the MSB
(DQ7) defined as the parity bit.
READ MODE
The MX27C1000A has two control functions, both of
which must be logically satisfied in order to obtain data
at the outputs. Chip Enable (CE) is the power control
and should be used for device selection. Output Enable
REV. 1.1, JUL. 19, 2001
2
MX27C1000A
(OE) is the output control and should be used to gate
data to the output pins, independent of device selection.
Assuming that addresses are stable, address access
time (tACC) is equal to the delay from CE to output (tCE).
Data is available at the outputs tQE after the falling edge
of OE, assuming that CE has been LOW and addresses
have been stable for at least tACC - tQE.
STANDBY MODE
The MX27C1000A has a CMOS standby mode which
reduces the maximum VCC current to 100 uA. It is
placed in CMOS standby when CE is at VCC ± 0.3 V.
The MX27C1000A also has a TTL-standby mode which
reduces the maximum VCC current to 1.5 mA. It is
placed in TTL-standby when CE is at VIH. When in
standby mode, the outputs are in a high-impedance
state, independent of the OE input.
TWO-LINE OUTPUT CONTROL FUNCTION
To accommodate multiple memory connections, a twoline control function is provided to allow for:
1. Low memory power dissipation,
2. Assurance that output bus contention will not occur.
It is recommended that CE be decoded and used as
the primary device-selecting function, while OE be made
a common connection to all devices in the array and
connected to the READ line from the system control
bus. This assures that all deselected memory devices
are in their low-power standby mode and that the output
pins are only active when data is desired from a particular
memory device.
SYSTEM CONSIDERATIONS
During the switch between active and standby
conditions, transient current peaks are produced on the
rising and falling edges of Chip Enable. The magnitude
of these transient current peaks is dependent on the
output capacitance loading of the device. At a minimum,
a 0.1 uF ceramic capacitor (high frequency, low inherent
inductance) should be used on each device between
VCC and GND to minimize transient effects. In addition,
to overcome the voltage drop caused by the inductive
effects of the printed circuit board traces on EPROM
arrays, a 4.7 uF bulk electrolytic capacitor should be
used between VCC and GND for each eight devices.
The location of the capacitor should be close to where
the power supply is connected to the array.
MODE SELECT TABLE
PINS
MODECEOEPGMA0A9VP POUTPUTS
ReadVI LVI LXXXVCCDOUT
Output DisableVILVIHXXXVCCHigh Z
Standby (TTL)VIHXXXXVCCHigh Z
Standby (CMOS)VCC±0.3VXXXXVCCHigh Z
ProgramVILVIHVILXXVPPDIN
Program VerifyVILVILVIHXXVPPDOUT
Program InhibitVIHXXXXVPPHigh Z
Manufacturer Code(3)VILVILXVILVHVCCC2H
Device Code(27C1000)(3)VILVILXVIHVHVCCCAH
NOTES:
1. VH = 12.0 V ± 0.5 V
2. X = Either VIH or VIL
3. A1 - A8 = A10 - A16 = VIL(For auto select)
4. See DC Programming Characteristics for VPP voltage during programming.
P/N: PM0733
3
REV. 1.1, JUL. 19, 2001
FIGURE 1. FAST PROGRAMMING FLOWCHART
MX27C1000A
ST ART
ADDRESS = FIRST LOCATION
VCC = 6.25V
VPP = 12.75V
X = 0
PROGRAM ONE 10us PULSE
INTERACTIVE
SECTION
VERIFY SECTION
INCREMENT ADDRESS
FAIL
NO
INCREMENT X
X = 25?
NO
VERIFY BYTE
?
PASS
LAST ADDRESS
YES
VCC = VPP = 5.25V
VERIFY ALL BYTES
?
PASS
DEVICE PASSED
YES
FAIL
FAIL
DEVICE FAILED
P/N: PM0733
4
REV. 1.1, JUL. 19, 2001
SWITCHING TEST CIRCUITS
MX27C1000A
DEVICE
UNDER
TEST
CL = 100 pF including jig capacitance
SWITCHING TEST WAVEFORMS
AC driving levels
AC TESTING: AC driving levels are 2.4V/0.4V for commercial grade.
Input pulse rise and fall times are equal to or less than 10ns.
INPUT
CL
2.0V
0.8V
6.2K ohm
TEST POINTS
1.8K ohm
DIODES = IN3064
OR EQUIVALENT
2.0V
0.8V
OUTPUT
+5V
P/N: PM0733
5
REV. 1.1, JUL. 19, 2001
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