1
Motorola IGBT Device Data
N–Channel Enhancement–Mode Silicon Gate
This IGBT contains a built–in free wheeling diode and a gate
protection zener diodes. Fast switching characteristics result in
efficient operation at higher frequencies. This device is ideally
suited for high frequency electronic ballasts.
• Built–In Free Wheeling Diode
• Built–In Gate Protection Zener Diodes
• Industry Standard Package (SOT223)
• High Speed E
off
: Typical 6.5 mJ @ IC = 0.3 A; TC = 125°C and
dV/dt = 1000 V/ms
• Robust High Voltage Termination
• Robust Turn–Off SOA
MAXIMUM RATINGS
(TJ = 25°C unless otherwise noted)
Parameters Symbol Value Unit
Collector–Emitter Voltage V
CES
600 Vdc
Collector–Gate Voltage (RGE = 1.0 MΩ) V
CGR
600 Vdc
Gate–Emitter Voltage — Continuous V
CGR
±15 Vdc
Collector Current — Continuous @ TC = 25°C
Collector Current — Continuous @ TC = 90°C
Collector Current — Repetitive Pulsed Current (1)
I
C25
I
C90
I
CM
0.5
0.3
2.0
Adc
Total Device Dissipation @ TC = 25°C P
D
1.0 Watt
Operating and Storage Junction Temperature Range TJ, T
stg
–55 to 150 °C
Thermal Resistance — Junction to Case – IGBT
Thermal Resistance — Junction to Ambient
R
θJC
R
θJA
30
150
°C/W
Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 5 seconds T
L
260 °C
UNCLAMPED DRAIN–TO–SOURCE AVALANCHE CHARACTERISTICS (T
C
≤ 150°C)
Single Pulse Drain–to–Source Avalanche
Energy – Starting @ TC = 25°C
Energy – Starting @ TC = 125°C
VCE = 100 V , VGE = 15 V, Peak IL = 2.0 A, L = 3.0 mH, RG = 25
W
E
AS
125
40
mJ
(1) Pulse width is limited by maximum junction temperature repetitive rating.
Designer’s Data for “Worst Case” Conditions— The Designer’s Data Sheet permits the design of most circuits entirely from the information presented. SOA Limit
curves — representing boundaries on device characteristics — are given to facilitate “worst case” design.
Designer’s is a trademark of Motorola, Inc.
REV 2
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by MMG05N60D/D
SEMICONDUCTOR TECHNICAL DATA
IGBT
0.5 A @ 25°C
600 V
CASE 318E–04
STYLE 13
TO–261A
1
2
3
4
1 = G
2 = 4 = C
3 = E
C
E
G
Motorola, Inc. 1998