Motorola MLD1N06CL Datasheet

1
Motorola TMOS Power MOSFET Transistor Device Data
  
SMARTDISCRETES
Internally Clamped, Current Limited N–Channel Logic Level Power MOSFET
This logic level power MOSFET features current limiting for short circuit protection, integrated Gate–Source clamping for ESD protection and integral Gate–Drain clamping for over–voltage protection and Sensefet technology for low on–resistance. No additional gate series resistance is required when interfacing to the output of a MCU, but a 40 k gate pulldown resistor is recommended to avoid a floating gate condition.
The internal Gate–Source and Gate–Drain clamps allow the device to be applied without use of external transient suppression components. The Gate–Source clamp protects the MOSFET input from e lectrostatic v oltage s tress up t o 2.0 kV. The Gate–Drain clamp protects the MOSFET drain from the avalanche stress that occurs with inductive loads. Their unique design provides voltage clamping that is essentially independent of operating temperature.
The MLD1N06CL is fabricated using Motorola’s SMARTDISCRETES technology which combines the advantages of a power MOSFET output device with the on–chip protective circuitry that can be obtained from a standard MOSFET process. This approach offers an economical means of providing protection to power MOSFETs from harsh automotive and industrial environments. SMARTDISCRETES devices are specified over a wide tempera­ture range from –50°C to 150°C.
MAXIMUM RATINGS
(TJ = 25°C unless otherwise noted)
Rating
Symbol Value Unit
Drain–to–Source Voltage V
DSS
Clamped Vdc
Drain–to–Gate Voltage (RGS = 1.0 M) V
DGR
Clamped Vdc
Gate–to–Source Voltage — Continuous V
GS
±10 Vdc
Drain Current — Continuous
— Single Pulse
I
D
I
DM
Self–limited
1.8
Adc Apk
Total Power Dissipation P
D
40 Watts
Operating and Storage Temperature Range TJ, T
stg
–50 to 150 °C
Electrostatic Discharge Voltage (Human Model) ESD 2.0 kV
THERMAL CHARACTERISTICS
Thermal Resistance — Junction to Case
— Junction to Ambient — Junction to Ambient (1)
R
θJC
R
θJA
R
θJA
3.12 100
71.4
°C/W
Maximum Lead Temperature for Soldering Purposes,
1/8 from case for 5 sec.
T
L
260 °C
UNCLAMPED DRAIN–TO–SOURCE AVALANCHE CHARACTERISTICS
Single Pulse Drain–to–Source Avalanche Energy
Starting TJ = 25°C
E
AS
80 mJ
(1) When surface mounted to an FR4 board using the minimum recommended pad size. SMARTDISCRETES is a trademark of Motorola, Inc.
Designer’s Data for “Worst Case” Conditions —The Designer’s Data Sheet permits the design of most circuits entirely from the information presented. SOA Limit curves — representing boundaries on device characteristics — are given to facilitate “worst case” design.
Preferred devices are Motorola recommended choices for future use and best overall value.
Order this document
by MLD1N06CL/D
MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
MLD1N06CL
Motorola Preferred Device
VOLTAGE CLAMPED
CURRENT LIMITING
MOSFET
62 VOLTS (CLAMPED)
R
DS(on)
= 0.75 OHMS
CASE 369A–13, Style 2
DPAK Surface Mount
D
G
S
R1
R2
Motorola, Inc. 1996
MLD1N06CL
2
Motorola TMOS Power MOSFET Transistor Device Data
ELECTRICAL CHARACTERISTICS
(TC = 25°C unless otherwise noted)
Characteristic
Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Internally Clamped)
(ID = 20 mAdc, VGS = 0 Vdc) (ID = 20 mAdc, VGS = 0 Vdc, TJ = 150°C)
V
(BR)DSS
59 59
62 62
65 65
Vdc
Zero Gate Voltage Drain Current
(VDS = 45 Vdc, VGS = 0 Vdc) (VDS = 45 Vdc, VGS = 0 Vdc, TJ = 150°C)
I
DSS
— —
0.6
6.0
5.0 20
µAdc
Gate–Source Leakage Current
(VG = 5.0 Vdc, VDS = 0 Vdc) (VG = 5.0 Vdc, VDS = 0 Vdc, TJ = 150°C)
I
GSS
— —
0.5
1.0
5.0 20
µAdc
ON CHARACTERISTICS(1)
Gate Threshold Voltage
(ID = 250 µAdc, VDS = VGS) (ID = 250 µAdc, VDS = VGS, TJ = 150°C)
V
GS(th)
1.0
0.6
1.5 —
2.0
1.6
Vdc
Static Drain–to–Source On–Resistance
(ID = 1.0 Adc, VGS = 4.0 Vdc) (ID = 1.0 Adc, VGS = 5.0 Vdc) (ID = 1.0 Adc, VGS = 4.0 Vdc, TJ = 150°C) (ID = 1.0 Adc, VGS = 5.0 Vdc, TJ = 150°C)
R
DS(on)
— — — —
0.63
0.59
1.1
1.0
0.75
0.75
1.9
1.8
Ohms
Static Source–to–Drain Diode Voltage (IS = 1.0 Adc, VGS = 0 Vdc) V
SD
1.1 1.5 Vdc
Static Drain Current Limit
(VGS = 5.0 Vdc, VDS = 10 Vdc) (VGS = 5.0 Vdc, VDS = 10 Vdc, TJ = 150°C)
I
D(lim)
2.0
1.1
2.3
1.3
2.75
1.8
Adc
Forward Transconductance (ID = 1.0 Adc, VDS = 10 Vdc) g
FS
1.0 1.4 mhos
RESISTIVE SWITCHING CHARACTERISTICS(2)
Turn–On Delay Time
t
d(on)
1.2 2.0
Rise Time
DD
= 25 Vdc, ID = 1.0 Adc,
t
r
4.0 6.0
Turn–Off Delay Time
(VDD = 25 Vdc, ID = 1.0 Adc,
V
GS(on)
= 5.0 Vdc, RGS = 50 Ohms)
t
d(off)
4.0 6.0
Fall Time t
f
3.0 5.0
INTERNAL PACKAGE INDUCTANCE
Internal Drain Inductance
(Measured from drain lead 0.25” from package to center of die)
L
D
4.5
nH
Internal Source Inductance
(Measured from the source lead 0.25” from package to source bond pad)
L
S
7.5
nH
(1) Pulse Test: Pulse Width 300 µs, Duty Cycle 2%. (2) Switching characteristics are independent of operating junction temperature.
2 4 6 8
4
1
0
3
2
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
10 V
8 V
4 V
VGS = 3 V
0
, DRAIN CURRENT (AMPS)I
D
6 V
–50°C
0 2 4 6 8
4
1
0
3
2
VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
, DRAIN CURRENT (AMPS)I
D
25°C
VDS ≥ 7.5 V
TJ = 150°C
TJ = 25°C
(V
ns
Figure 1. Output Characteristics Figure 2. Transfer Function
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