MOTOROLA MGP11N60ED Datasheet

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SEMICONDUCTOR TECHNICAL DATA
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N–Channel Enhancement–Mode Silicon Gate
Industry Standard TO–220 Package
High Speed: E
= 60 mJ per Amp typical at 125°C
off
High Voltage Short Circuit Capability – 10 ms minimum at
125°C, 400 V
Low On–Voltage — 2.0 V typical at 8.0 A
Soft Recovery Free Wheeling Diode is included in the Package
Robust High Voltage Termination
ESD Protection Gate–Emitter Zener Diodes
. It also provides fast
CE(on)
G
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by MGP11N60ED/D

IGBT & DIODE IN TO–220
11 A @ 90°C 15 A @ 25°C
600 VOL TS
SHORT CIRCUIT RATED
LOW ON–VOLTAGE
C
G
C
E
E
CASE 221A–09
STYLE 9
TO–220AB
MAXIMUM RATINGS
Collector–Emitter Voltage V Collector–Gate Voltage (RGE = 1.0 M) V Gate–Emitter Voltage — Continuous V Collector Current — Continuous @ TC = 25°C
Total Power Dissipation @ TC = 25°C
Derate above 25°C Operating and Storage Junction Temperature Range TJ, T Short Circuit Withstand Time
(VCC = 400 Vdc, VGE = 15 Vdc, TJ = 125°C, RG = 20 ) Thermal Resistance — Junction to Case – IGBT
Maximum Lead Temperature for Soldering Purposes, 1/8 from case for 5 seconds T Mounting Torque, 6–32 or M3 screw
(1) Pulse width is limited by maximum junction temperature. Repetitive rating.
Designer’s Data for “Worst Case” Conditions — The Designer’s Data Sheet permits the design of most circuits entirely from the information presented. SOA Limit curves — representing boundaries on device characteristics — are given to facilitate “worst case” design.
Designer’s is a trademark of Motorola, Inc.
(TJ = 25°C unless otherwise noted)
Rating Symbol Value Unit
— Continuous @ TC = 90°C — Repetitive Pulsed Current (1)
— Junction to Case – Diode — Junction to Ambient
CES
CGR
GE
I
C25
I
C90
I
CM P
D
stg
t
sc
R
θJC
R
θJC
R
θJA
L
10 lbfSin (1.13 NSm)
600 Vdc 600 Vdc
±20 Vdc
15 11 22
96
0.77
–55 to 150 °C
10
1.3
2.3 65
260 °C
Adc
Apk
Watts
W/°C
m
°C/W
s
Motorola IGBT Device Data
Motorola, Inc. 1998
1
MGP11N60ED
)
f = 1.0 MHz)
)
R
G
)
)
R
G
T
J
125 C)
)
V
GE
Vdc)
ELECTRICAL CHARACTERISTICS
OFF CHARACTERISTICS
Collector–to–Emitter Breakdown Voltage
(VGE = 0 Vdc, IC = 250 µAdc) T emperature Coef ficient (Positive)
Zero Gate Voltage Collector Current
(VCE = 600 Vdc, VGE = 0 Vdc) (VCE = 600 Vdc, VGE = 0 Vdc, TJ = 125°C)
Gate–Body Leakage Current (VGE = ± 20 Vdc, VCE = 0 Vdc) I
ON CHARACTERISTICS (1)
Collector–to–Emitter On–State Voltage
(VGE = 15 Vdc, IC = 4.0 Adc) (VGE = 15 Vdc, IC = 4.0 Adc, TJ = 125°C) (VGE = 15 Vdc, IC = 8.0 Adc)
Gate Threshold Voltage
(VCE = VGE, IC = 1.0 mAdc) Threshold Temperature Coefficient (Negative)
Forward Transconductance (VCE = 10 Vdc, IC = 8.0 Adc) g
DYNAMIC CHARACTERISTICS
Input Capacitance Output Capacitance
Transfer Capacitance
SWITCHING CHARACTERISTICS (1)
Turn–On Delay Time Rise Time Turn–Off Delay Time Fall Time Turn–Off Switching Loss Turn–On Switching Loss E Total Switching Loss E Turn–On Delay Time Rise Time Turn–Off Delay Time Fall Time Turn–Off Switching Loss Turn–On Switching Loss E Total Switching Loss E Gate Charge
DIODE CHARACTERISTICS
Diode Forward Voltage Drop
(IEC = 3.25 Adc) (IEC = 3.25 Adc, TJ = 125°C) (IEC = 6.5 Adc)
(1) Pulse Test: Pulse Width 300 µs, Duty Cycle 2%. (continued)
(T
= 25°C unless otherwise noted)
J
Characteristic
(VCE = 25 Vdc, VGE = 0 Vdc,
(VCC = 360 Vdc, IC = 8.0 Adc,
VGE = 15 Vdc, L = 300 mH,
Energy losses include “tail”
(VCC = 360 Vdc, IC = 8.0 Adc,
VGE = 15 Vdc, L = 300 mH
Energy losses include “tail”
(VCC = 360 Vdc, IC = 8.0 Adc,
R
= 20 , T
= 20 Ω,
f = 1.0 MHz
R
= 20
= 20
V
= 15 Vdc
= 15
= 125°C
=
Symbol Min Typ Max Unit
V
(BR)CES
I
CES
GES
V
CE(on)
V
GE(th)
fe
C
ies
C
oes
C
res
t
d(on)
t
r
t
d(off)
t
f
E
off on
ts
t
d(on)
t
r
t
d(off)
t
f
E
off on
ts
Q
T
Q
1
Q
2
V
FEC
600
— —
50 µAdc
— — —
4.0 —
3.5 Mhos
779 pF — 81 — — 13
46 ns — 34 — — 102 — — 226 — — 0.32 0.40 mJ — 0.11 — — 0.43 — — 42 ns — 26 — — 214 — — 228 — — 0.48 mJ — 0.16 — — 0.64 — — 39.2 nC — 8.7 — — 17.4
— —
1.7
870
— —
1.6
1.5
2.0
6.0 10
1.63
1.24
2.0
— —
10
200
1.9 —
2.4
8.0 —
— —
2.3
mV/°C
µAdc
mV/°C
Vdc
Vdc
Vdc
Vdc
2
Motorola IGBT Device Data
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