The MCM67H618B is a 1,179,648 bit synchronous fast static random access
memory designed to provide a burstable, high–performance, secondary cache
for the i486 and Pentium microprocessors. It is organized as 65,536 words
of 18 bits, fabricated with Motorola’s high–performance silicon–gate BiCMOS
technology. The device integrates input registers, a 2–bit counter, high speed
SRAM, and high drive capability outputs onto a single monolithic circuit for
reduced parts count implementation of cache data RAM applications. Synchronous design allows precise cycle control with the use of an external clock
(K). BiCMOS circuitry reduces the overall power consumption of the integrated
functions for greater reliability .
Addresses (A0 – A15), data inputs (D0 – D17), and all control signals
except output enable (G
edge–triggered noninverting registers.
Bursts can be initiated with either address status processor (ADSP
or address status cache controller (ADSC
burst addresses can be generated internally by the MCM67H618B
(burst sequence imitates that of the i486 and Pentium) and controlled
by the burst address advance (ADV
vide more detailed information on burst controls.
Write cycles are internally self–timed and are initiated by the rising
edge of the clock (K) input. This feature eliminates complex off–chip
write pulse generation and provides increased flexibility for incoming
signals.
Dual write enables (LW
writeable bytes. LW controls DQ0 – DQ8 (the lower bits), while UW
controls DQ9 – DQ17 (the upper bits).
This device is ideally suited for systems that require wide data bus
widths and cache memory . See Figure 2 for applications information.
This document contains information on a new product. Specifications and information herein are subject to change without notice.
REV 1
7/15/97
Motorola, Inc. 1997
MOTOROLA FASTSRAM
MCM67H618B
1
BLOCK DIAGRAM (See Note)
ADV
K
ADSC
ADSP
A0 – A15
UW
LW
E
G
DQ0 – DQ8
DQ9 – DQ17
NOTE: All registers are positive–edge triggered. The ADSC or ADSP signals control the duration of the burst and the start of the
9
9
next burst. When ADSP
ADDRESS
REGISTER
WRITE
REGISTER
ENABLE
REGISTER
and E are sampled low, any ongoing burst is interrupted and a read (independent of W and ADSC)
CLR
is performed using the new external address. Alternatively, an ADSP
BURST LOGIC
Q0
BINARY
COUNTER
Q1
A1 – A0
16
INTERNAL
ADDRESS
A0
′
A0
A1
2
A1
A2 – A15
′
16
18
DATA–IN
REGISTERS
99
64K x 18
MEMORY
ARRAY
9
OUTPUT
BUFFER
9
–initiated two cycle WRITE can be performed by
asserting ADSP, E, and a valid address on the first cycle, then negating both ADSP and ADSC and asserting LW and/or
with valid data on the second cycle (see Single Write Cycle in WRITE CYCLES timing diagram). Note that when E and
UW
ADSC are high, ADSP is ignored — the external address is not registered in this case.
When ADSC
is sampled low (and ADSP is sampled high), any ongoing burst is interrupted and a read or write (dependent
on W) is performed using the new external address. Chip enable (E) is sampled only when a new base address is loaded.
After the first cycle of the burst, ADV
is advanced prior to the operation. When ADV
controls subsequent burst cycles. When ADV is sampled low, the internal address
is sampled high, the internal address is not advanced, thus inserting a wait
state into the burst sequence accesses. Upon completion of a burst, the address will wrap around to its initial state. See
BURST SEQUENCE TABLE. Write refers to either or both byte write enables (L W
must meet setup and hold times for the low–to–high transition of clock (K).
ASYNCHRONOUS TRUTH TABLE (See Notes 1 and 2)
Operation
ReadLData Out
ReadHHigh–Z
WriteXHigh–Z — Data In
DeselectedXHigh–Z
NOTES:
1. X means Don’t Care.
2. For a write operation following a read operation, G
required setup time and held high through the input data hold time.
GI/O Status
must be high before the input data
ABSOLUTE MAXIMUM RATINGS (Voltages Referenced to V
Rating
Power Supply VoltageV
Voltage Relative to VSS for Any Pin
Except V
Output Current (per I/O)I
Power DissipationP
Temperature Under BiasT
Ambient TemperatureT
Storage TemperatureT
NOTE: Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are
CC
exceeded. Functional operation should be restricted to RECOMMENDED OPERATING CONDITIONS. Exposure to higher than recommended voltages for
extended periods of time could affect device reliability.
SymbolValueUnit
CC
Vin, V
out
bias
A
stg
– 0.5 to VCC + 0.5V
out
D
= 0 V)
SS
– 0.5 to + 7.0V
± 30mA
1.6W
– 10 to + 85°C
0 to +70°C
– 55 to + 125°C
This device contains circuitry to protect the
inputs against damage due to high static voltages or electric fields; however, it is advised that
normal precautions be taken to avoid application
of any voltage higher than maximum rated voltages to this high–impedance circuit.
This BiCMOS memory circuit has been
designed to meet the dc and ac specifications
shown in the tables, after thermal equilibrium
has been established.
This device contains circuitry that will
ensure the output devices are in High–Z at
power up.
MOTOROLA FAST SRAM
MCM67H618B
3
DC OPERA TING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ± 5%, TA = 0 to + 70°C, Unless Otherwise Noted)
RECOMMENDED OPERATING CONDITIONS
Parameter
Supply Voltage (Operating Voltage Range)V
Input High VoltageV
Input Low VoltageV
*VIL (min) = – 0.5 V dc; VIL (min) = – 2.0 V ac (pulse width ≤ 20.0 ns) for I ≤ 20.0 mA.
**VIH (max) = VCC + 0.3 V dc; VIH (max) = VCC + 2.0 V ac (pulse width ≤ 20.0 ns) for I ≤ 20.0 mA.
(Voltages Referenced to VSS = 0 V)
SymbolMinMaxUnit
CC
IH
IL
4.755.25V
2.2VCC + 0.3**V
– 0.5*0.8V
DC CHARACTERISTICS AND SUPPLY CURRENTS
ParameterSymbolMinMaxUnit
Input Leakage Current (All Inputs, Vin = 0 to VCC)I
Output Leakage Current (G = VIH)I
AC Supply Current (Device Selected, All Outputs Open,MCM67H618B–9
Freq = Max)MCM67H618B–10
MCM67H618B–12
CMOS Standby Supply Current (Device Deselected, Freq = 0, VCC = Max,
All Inputs Static at CMOS Levels Vin ≤ VSS + 0.2 V or ≥ VCC – 0.2 V)
Clock Running (Device Deselected, Freq = Max, VCC = Max,
All Inputs Toggling at CMOS Levels Vin ≤ VSS + 0.2 V or ≥ VCC – 0.2 V)
Output Low Voltage (IOL = + 8.0 mA)V
Output High Voltage (IOH = – 4.0 mA)V
NOTE: Good decoupling of the local power supply should always be used. DC characteristics are guaranteed for all possible i486 and Pentium
bus cycles.
lkg(I)
lkg(O)
I
CCA
I
SB2
I
SB4
OL
OH
—± 1.0µA
—± 1.0µA
—TBDmA
—TBDmA
—TBDmA
—0.4V
2.43.3V
CAPACITANCE (f = 1.0 MHz, dV = 3.0 V, T
Parameter
Input CapacitanceC
Input/Output CapacitanceC
= 25°C, Periodically Sampled Rather Than 100% Tested)
A
SymbolTypMaxUnit
in
I/O
45pF
68pF
MCM67H618B
4
MOTOROLA FAST SRAM
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