64K x 18 Bit BurstRAM
Synchronous Fast Static RAM
With Burst Counter and Self–Timed Write
The MCM67B618A is a 1,179,648 bit synchronous fast static random access
memory designed to provide a burstable, high–performance, secondary cache
for the i486 and Pentium microprocessors. It is organized as 65,536 words
of 18 bits. The device integrates input registers, a 2–bit counter, high speed
SRAM, and high drive capability outputs onto a single monolithic circuit for reduced parts count implementation of cache data RAM applications. Synchronous design allows precise cycle control with the use of an external clock (K).
BiCMOS circuitry reduces the overall power consumption of the integrated functions for greater reliability .
Addresses (A0 – A15), data inputs (D0 – D17), and all control signals
except output enable (G
triggered noninverting registers.
Bursts can be initiated with either address status processor (ADSP
address status cache controller (ADSC
addresses can be generated internally by the MCM67B618A (burst
sequence imitates that of the i486 and Pentium) and controlled by the burst
address advance (ADV
tailed information on burst controls.
Write cycles are internally self–timed and are initiated by the rising edge
of the clock (K) input. This feature eliminates complex off–chip write pulse
generation and provides increased flexibility for incoming signals.
Dual write enables (L W
able bytes. LW
controls DQ0 – DQ8 (the lower bits), while UW controls
DQ9 – DQ17 (the upper bits).
This device is ideally suited for systems that require wide data bus
widths and cache memory . See Figure 2 for applications information.
BurstRAM is a trademark of Motorola, Inc.
i486 and Pentium are trademarks of Intel Corp.
REV 2
11/5/96
Motorola, Inc. 1996
MOTOROLA FASTSRAM
MCM67B618A
1
BLOCK DIAGRAM (See Note)
K
ADSC
ADSP
A0 – A15
UW
LW
E
G
DQ0 – DQ8
DQ9 – DQ17
ADV
CLR
ADDRESS
REGISTER
WRITE
REGISTER
ENABLE
REGISTER
9
9
BINARY
16
BURST LOGIC
Q0
A0
COUNTER
Q1
A1
A1 – A0
2
A2 – A15
A0
A1
′
′
INTERNAL
ADDRESS
16
DATA–IN
REGISTERS
99
18
64K
×
18
MEMORY
ARRAY
9
OUTPUT
BUFFER
9
NOTE: All registers are positive–edge triggered. The ADSC or ADSP signals control the duration of the burst and the start of the
next burst. When ADSP
is sampled low, any ongoing burst is interrupted and a read (independent of W and ADSC) is per-
formed using the new external address. Alternatively , an ADSP–initiated two cycle WRITE can be performed by asserting
and a valid address on the first cycle, then negating both ADSP and ADSC and asserting LW and/or UW with valid
ADSP
data on the second cycle (see Single Write Cycle in WRITE CYCLES timing diagram).
When ADSC
on W
After the first cycle of the burst, ADV
is advanced prior to the operation. When ADV
is sampled low (and ADSP is sampled high), any ongoing burst is interrupted and a read or write (dependent
) is performed using the new external address. Chip enable (E) is sampled only when a new base address is loaded.
controls subsequent burst cycles. When ADV is sampled low, the internal address
is sampled high, the internal address is not advanced, thus inserting a wait
state into the burst sequence accesses. Upon completion of a burst, the address will wrap around to its initial state. See
BURST SEQUENCE TABLE. Write refers to either or both byte write enables (L W
must meet setup and hold times for the low–to–high transition of clock (K).
ASYNCHRONOUS TRUTH TABLE (See Notes 1 and 2)
Operation
ReadLData Out
ReadHHigh–Z
WriteXHigh–Z — Data In
DeselectedXHigh–Z
NOTES:
1. X means Don’t Care.
2. For a write operation following a read operation, G
required setup time and held high through the input data hold time.
GI/O Status
must be high before the input data
ABSOLUTE MAXIMUM RATINGS (Voltages Referenced to V
Rating
Power Supply VoltageV
Voltage Relative to VSS for Any
Pin Except V
Output Current (per I/O)I
Power DissipationP
Temperature Under BiasT
Operating TemperatureT
Storage TemperatureT
NOTE: Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are
CC
exceeded. Functional operation should be restricted to RECOMMENDED OPERATING CONDITIONS. Exposure to higher than recommended voltages for
extended periods of time could affect device reliability.
SymbolValueUnit
CC
Vin, V
– 0.5 to VCC + 0.5V
out
out
D
bias
A
stg
= 0 V)
SS
– 0.5 to + 7.0V
± 30mA
1.6W
– 10 to + 85°C
0 to +70°C
– 55 to + 125°C
This device contains circuitry to protect the
inputs against damage due to high static voltages or electric fields; however, it is advised
that normal precautions be taken to avoid
application of any voltage higher than maximum rated voltages to this high–impedance
circuit.
This BiCMOS memory circuit has been
designed to meet the dc and ac specifications
shown in the tables, after thermal equilibrium
has been established.
This device contains circuitry that will ensure
the output devices are in High–Z at power up.
MOTOROLA FAST SRAM
MCM67B618A
3
DC OPERA TING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ± 5%, TA = 0 to + 70°C, Unless Otherwise Noted)
RECOMMENDED OPERATING CONDITIONS
Parameter
Supply Voltage (Operating Voltage Range)V
Input High VoltageV
Input Low VoltageV
*VIL (min) = – 0.5 V dc; VIL (min) = – 2.0 V ac (pulse width ≤ 20.0 ns) for I ≤ 20.0 mA.
**VIH (max) = VCC + 0.3 V dc; VIH (max) = VCC + 2.0 V ac (pulse width ≤ 20.0 ns) for I ≤ 20.0 mA.
(Voltages Referenced to VSS = 0 V)
SymbolMinMaxUnit
CC
IH
IL
4.755.25V
2.2VCC + 0.3
– 0.5*0.8V
**
V
DC CHARACTERISTICS AND SUPPLY CURRENTS
ParameterSymbolMinMaxUnit
Input Leakage Current (All Inputs, Vin = 0 to VCC)I
Output Leakage Current (G = VIH)I
AC Supply Current (G = VIH, E = VIL, I
VIL = 0.0 V and VIH ≥ 3.0 V, Cycle Time ≥ t
AC Standby Current (E = VIH, I
VIL = 0.0 V and VIH ≥ 3.0 V, Cycle Time ≥ t
Output Low Voltage (IOL = + 8.0 mA)V
Output High Voltage (IOH = – 4.0 mA)V
NOTE: Good decoupling of the local power supply should always be used. DC characteristics are guaranteed for all possible i486 and Pentium