64K x 18 Bit Asynchronous/
Latched Address Fast Static RAM
The MCM67A618B is a 1,179,648 bit latched address static random access
memory organized as 65,536 words of 18 bits. The device integrates a 64K x 18
SRAM core with advanced peripheral circuitry consisting of address and data input latches, active low chip enable, separate upper and lower byte write strobes,
and a fast output enable. This device has increased output drive capability supported by multiple power pins.
Address, data in, and chip enable latches are provided. When latch enables
(AL for address and chip enables and DL for data in) are high, the address, data
in, and chip enable latches are in the transparent state. If latch enables are tied
high the device can be used as an asynchronous SRAM. When latch enables are
low the address, data in, and chip enable latches are in the latched state. This
input latch simplifies read and write cycles by guaranteeing address and data–in
hold time in a simple fashion.
Dual write enables (LW
writeable bytes. LW
and UW) are provided to allow individually
controls DQ0 – DQ8 (the lower bits) while UW
controls DQ9 – DQ17 (the upper bits).
Six pair of power and ground pins have been utilized and placed on
the package for maximum performance.
The MCM67A618B will be available in a 52–pin plastic leaded chip
carrier (PLCC).
This device is ideally suited for systems that require wide data bus
widths, cache memory , and tag RAMs.
• Single 5 V
± 5% Power Supply
• Fast Access Times: 10/12/15 ns Max
• Byte Writeable via Dual Write Enables
• Separate Data Input Latch for Simplified Write Cycles
All power supply and ground pins must be connected for proper operation of the device.
This document contains information on a new product. Specifications and information herein are subject to change without notice.
REV 2
7/16/97
Motorola, Inc. 1997
MOTOROLA FASTSRAM
MCM67A618B
1
BLOCK DIAGRAM
E
AL
A0 – A15
16
LATCH
LATCH
16
MEMORY ARRAY
64K x 18
99
WRITE AMP
CONTROL
LW
UWG
18
OUTPUT
BUFFER
18
18
DQ0 – DQ17
18
LATCH
DL
TRUTH TABLE
Supply
ELWUWAL*DL*GMode
HXXXXXDeselected CycleI
LXXLXXRead or Write Using Latched AddressesI
LXXHXXRead or Write Using Unlatched AddressesI
LHHXXLRead CycleI
LHHXXHRead CycleI
LLLXLXWrite Both Bytes Using Latched Data InI
LLLXHXWrite Both Bytes Using Unlatched Data InI
LLHXXXWrite Cycle, Lower ByteI
LHLXXXWrite Cycle, Lower ByteI
*E and Addresses satisfy the specified setup and hold times for the falling edge of AL. Data–in satisfies the specified setup
*and hold times for falling edge of DL.
NOTE: This truth table shows the application of each function. Combinations of these functions are valid.
Current
SB
CC
CC
CC
CC
CC
CC
CC
CC
I/O
Status
High–Z
—
—
Data Out
High–Z
High–Z
High–Z
High–Z
High–Z
ABSOLUTE MAXIMUM RATINGS (Voltages Referenced to V
Rating
Power Supply VoltageV
Voltage Relative to VSS for Any
Pin Except V
Output Current (per I/O)I
Power DissipationP
Temperature Under BiasT
Ambient TemperatureT
Storage TemperatureT
NOTE: Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are
CC
exceeded. Functional operation should be restricted to RECOMMENDED OPERATING CONDITIONS. Exposure to higher than recommended voltages for
extended periods of time could affect device reliability.
SymbolValueUnit
CC
Vin, V
out
bias
stg
– 0.5 to VCC + 0.5V
out
D
A
– 55 to + 125°C
= 0)
SS
– 0.5 to 7.0V
± 30
1.6W
– 10 to + 85°C
0 to + 70°C
mA
MCM67A618B
2
This device contains circuitry to protect the
inputs against damage due to high static
voltages or electric fields; however, it is advised
that normal precautions be taken to avoid
application of any voltage higher than maximum rated voltages to this high–impedance
circuit.
This BiCMOS memory circuit has been
designed to meet the dc and ac specifications
shown in the tables, after thermal equilibrium
has been established.
This device contains circuitry that will ensure
the output devices are in High–Z at power up.
MOTOROLA FAST SRAM
DC OPERA TING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ± 5%, TA = 0 to + 70°C, Unless Otherwise Noted)
RECOMMENDED OPERATING CONDITIONS
Parameter
Supply Voltage (Operating Voltage Range)V
Input High VoltageV
Input Low VoltageV
*VIL (min) = – 0.5 V dc; VIL (min) = – 2.0 V ac (pulse width ≤ 20 ns) for I ≤ 20.0 mA.
**VIH (max) = VCC + 0.3 V dc; VIH (max) = VCC + 2.0 V ac (pulse width ≤ 20 ns) for I ≤ 20.0 mA.
(Voltages referenced to VSS = 0 V)
SymbolMinMaxUnit
DC CHARACTERISTICS
ParameterSymbolMinMaxUnit
Input Leakage Current (All Inputs, Vin = 0 to VCC)I
Output Leakage Current (G = VIH)I
AC Supply Current (Device Selected, All Outputs Open,MCM67A618B–10
Freq = Max, VCC = Max)MCM67A618B–12
MCM67A618B–15
CMOS Standby Supply Current (Device Deselected,
Freq = 0, VDD = Max, All Inputs Static at CMOS Levels
Vin ≤ VSS + 0.2 V or ≥ VCC – 0.2 V)
AC Standby Supply Current (Device Deselected, MCM67A618B–10
Freq = Max, VDD = Max, All Inputs Toggling at CMOS Levels
Vin ≤ VSS + 0.2 V or ≥ VCC – 0.2 V)
Output Low Voltage (IOL = + 8.0 mA)V
Output High Voltage (IOH = – 4.0 mA)V
lkg(I)
lkg(O)
I
CCA
I
SB2
I
SB4
CC
IH
IL
OL
OH
4.755.25V
2.2
– 0.5*
—± 1.0µA
—± 1.0µA
—TBDmA
—TBDmA
—TBDmA
—0.4V
2.43.3V
VCC + 0.3**
0.8V
V
CAPACITANCE (f = 1.0 MHz, dV = 3.0 V, T
Characteristic
Input CapacitanceC
Input/Output CapacitanceC
= 25°C, Periodically Sampled Rather Than 100% Tested)
A
SymbolTypMaxUnit
in
I/O
45pF
68pF
MOTOROLA FAST SRAM
MCM67A618B
3
AC OPERA TING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ± 5%, TA = 0 to + 70°C, Unless Otherwise Noted)