Motorola MCM6706BJ12R, MCM6706BJ8, MCM6706BJ8R, MCM6706BJ10R, MCM6706BJ12 Datasheet

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MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
Product Preview
32K x 8 Bit Static Random Access Memory
The MCM6706B is a 262,144 bit static random access memory organized as 32,768 words of 8 bits. Static design eliminates the need for external clocks or timing strobes.
Output enable (G flexibility and eliminates bus contention problems.
The MCM6706B is available in a 300 mil, 28–lead surface–mount SOJ package.
Single 5.0 V ± 10% Power Supply
Fully Static — No Clock or Timing Strobes Necessary
All Inputs and Outputs Are TTL Compatible
Three State Outputs
Fast Access Times: MCM6706B–8 = 8 ns
A A A
A A A A A
DQ
DQ
) is a special control feature that provides increased system
MCM6706B–10 = 10 ns MCM6706B–12 = 12 ns
BLOCK DIAGRAM
ROW
DECODER
INPUT
DATA
CONTROL
MEMORY MATRIX
(256 ROWS
128 x 8 COLUMNS)
COLUMN I/O
COLUMN DECODER
AAAAAAA
Order this document
by MCM6706B/D
MCM6706B
28
1
PIN ASSIGNMENT
A
1
A
2
A
3
A
4
A
5
A
6
A
7
AA
8
A
9
A
10
DQ
11
DQ
12
DQ
13
V
SS
14
PIN NAMES
A Address Input. . . . . . . . . . . . . . . . . . . .
W Write Enable. . . . . . . . . . . . . . . . . . . .
E Chip Enable. . . . . . . . . . . . . . . . . . . . . .
G
DQ Data Input/Output. . . . . . . . . . . . . . .
V
CC
V
SS
J PACKAGE
300 MIL SOJ
CASE 810B–03
28 27 26 25 24
23 22 21 20 19 18 17 16 15
+ 5.0 V Power Supply. . . . . . . . . .
V
CC
W A A A A G
E DQ DQ
DQ DQ DQ
Output Enable. . . . . . . . . . . . . . . . . . .
Ground. . . . . . . . . . . . . . . . . . . . . . .
E
W
G
This document contains information on a new product under development. Motorola reserves the right to change or discontinue this product without notice.
REV 1 10/9/96
Motorola, Inc. 1996
MOTOROLA FAST SRAM
MCM6706B
1
TRUTH TABLE (X = Don’t Care)
E
H X X Not Selected High–Z — L H H Read High–Z — L L H Read D L X L Write D
G W Mode I/O Pin Cycle
out
in
Read Cycle Write Cycle
ABSOLUTE MAXIMUM RATINGS (See Note)
Rating
Power Supply Voltage V Voltage Relative to VSS for Any Pin
Except V Output Current I Power Dissipation P Temperature Under Bias T Operating Temperature T Storage Temperature — Plastic T
NOTE: Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are
CC
exceeded. Functional operation should be restricted to RECOMMENDED OPER­ATING CONDITIONS. Exposure to higher than recommended voltages for extended periods of time could affect device reliability.
Symbol Value Unit
– 0.5 to + 7.0 V
– 0.5 to VCC + 0.5 V
± 30 mA
2.0 W
– 10 to + 85 °C
0 to + 70 °C
– 55 to + 125 °C
Vin, V
out
bias
CC
out
D
A
stg
DC OPERA TING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ± 10%, TA = 0 to 70°C, Unless Otherwise Noted)
This device contains circuitry to protect the inputs against damage due to high static volt­ages or electric fields; however, it is advised that normal precautions be taken to avoid appli­cation of any voltage higher than maximum rated voltages to this high–impedance circuit.
This BiCMOS memory circuit has been de­signed to meet the dc and ac specifications shown in the tables, after thermal equilibrium has been established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow of at least 500 linear feet per minute is maintained.
RECOMMENDED OPERATING CONDITIONS
Parameter Symbol Min Typ Max Unit
Supply Voltage (Operating Voltage Range) V Input High Voltage V Input Low Voltage V *VIH (max) = VCC + 0.3 V dc; VIH (max) = VCC + 2.0 V ac (pulse width 2.0 ns) or I 30.0 mA.
** VIL (min) = – 0.5 V dc @ 30.0 mA; VIL (min) = – 2.0 V ac (pulse width 2.0 ns) or I 30.0 mA.
CC
IH
IL
4.5 5.0 5.5 V
2.2
– 0.5**
0.8 V
DC CHARACTERISTICS
Parameter Symbol Min Max Unit
Input Leakage Current (All Inputs, Vin = 0 to VCC) I Output Leakage Current (E = VIH or G = VIH, V Output High Voltage (IOH = – 4.0 mA) V Output Low Voltage (IOL = + 8.0 mA) V
= 0 to VCC) I
out
lkg(I)
lkg(O)
OH
OL
± 1.0 µA — ± 1.0 µA
2.4 V — 0.4 V
POWER SUPPLY CURRENTS
Parameter Symbol 6706B–8 6706B–10 6706B–12 Unit Notes
AC Active Supply Current
(I
= 0 mA, VCC = max, f = f
out
AC Standby Current (E = VIH, VCC = max, f = f CMOS Standby Current (VCC = max, f = 0 MHz,
E
VCC – 0.2 V, Vin VSS, or VCC – 0.2 V)
NOTES:
1. Reference AC Operating Conditions and Characteristics for input and timing (VIH/VIL, tr/tf, pulse level 0 to 3 V, VIH = 3 V).
2. All addresses transition simultaneously low (LSB) and then high (MSB).
3. Data states are all zero.
max
)
) I
max
I
CCA
SB1
I
SB2
195 185 175 mA 1, 2, 3
75 70 65 mA 1, 2, 3 20 20 20 mA
VCC + 0.3*
V
MCM6706B 2
MOTOROLA FAST SRAM
CAPACITANCE (f = 1.0 MHz, dV = 3.0 V, T
Address Input Capacitance C Control Pin Input Capacitance (E, G, W) C I/O Capacitance C
= 25°C, Periodically Sampled Rather Than 100% Tested)
A
Parameter
Symbol Max Unit
in in
out
5 pF 6 pF 6 pF
AC OPERA TING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ± 10%, TA = 0 to + 70°C, Unless Otherwise Noted)
Input Timing Measurement Reference Level 1.5 V. . . . . . . . . . . . . . .
Input Pulse Levels 0 to 3.0 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Rise/Fall Time 2 ns. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
READ CYCLE (See Notes 1 and 2)
Parameter Symbol Min Max Min Max Min Max Unit Notes
Read Cycle Time t Address Access Time t Chip Enable Access Time t Output Enable Access Time t Output Hold from Address Change t Chip Enable Low to Output Active t Chip Enable High to Output High–Z t Output Enable Low to Output Active t Output Enable High to Output High–Z t
NOTES:
1. W
is high for read cycle.
2. Product sensitivites to noise require proper grounding and decoupling of power supplies as well as minimization or elimination of bus contention conditions during read and write cycles.
3. All read cycle timing is referenced from the last valid address to the first transitioning address.
4. At any given voltage and temperature, t device to device.
5. Transition is measured 200 mV from steady–state voltage with load of Figure 1b.
6. This parameter is sampled and not 100% tested.
7. Device is continuously selected (E
8. Addresses valid prior to or coincident with E
EHQZ
= VIL, G = VIL).
going low.
AVAV AVQV ELQV GLQV AXQX ELQX EHQZ GLQX
GHQZ
max < t
ELQX
Output Timing Measurement Reference Level 1.5 V. . . . . . . . . . . . .
Output Load See Figure 1a. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
MCM6706B–8 MCM6706B–10 MCM6706B–12
8 10 12 ns 3 — 8 10 12 ns — 8 10 12 ns — 4 5 6 ns
3 3 3 ns
1 1 1 ns 4 ,5, 6 — 4.5 5 6 ns 4, 5, 6
0 0 0 ns 4, 5, 6 — 4 5 6 ns 4, 5, 6
min, and t
GHQZ
max < t
min, both for a given device and from
GLQX
OUTPUT
Z0 = 50
(a) (b)
MOTOROLA FAST SRAM
RL = 50
VL = 1.5 V
+5 V
OUTPUT
255
Figure 1. AC Test Loads
480
5 pF
TIMING LIMITS
The table of timing values shows either a
minimum or a maximum limit for each param­eter. Input requirements are specified from the external system point of view. Thus, ad­dress setup time is shown as a minimum since the system must supply at least that much time. On the other hand, responses from the memory are specified from the de­vice point of view. Thus, the access time is shown as a maximum since the device never provides data later than that time.
MCM6706B
3
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