MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
Product Preview
32K x 8 Bit Static Random
Access Memory
The MCM6706B is a 262,144 bit static random access memory organized as
32,768 words of 8 bits. Static design eliminates the need for external clocks or
timing strobes.
Output enable (G
flexibility and eliminates bus contention problems.
The MCM6706B is available in a 300 mil, 28–lead surface–mount SOJ
package.
• Single 5.0 V ± 10% Power Supply
• Fully Static — No Clock or Timing Strobes Necessary
• All Inputs and Outputs Are TTL Compatible
• Three State Outputs
• Fast Access Times: MCM6706B–8 = 8 ns
A
A
A
A
A
A
A
A
DQ
DQ
) is a special control feature that provides increased system
MCM6706B–10 = 10 ns
MCM6706B–12 = 12 ns
BLOCK DIAGRAM
ROW
DECODER
INPUT
DATA
CONTROL
MEMORY MATRIX
(256 ROWS
128 x 8 COLUMNS)
COLUMN I/O
COLUMN DECODER
AAAAAAA
Order this document
by MCM6706B/D
MCM6706B
28
1
PIN ASSIGNMENT
A
1
A
2
A
3
A
4
A
5
A
6
A
7
AA
8
A
9
A
10
DQ
11
DQ
12
DQ
13
V
SS
14
PIN NAMES
A Address Input. . . . . . . . . . . . . . . . . . . .
W Write Enable. . . . . . . . . . . . . . . . . . . .
E Chip Enable. . . . . . . . . . . . . . . . . . . . . .
G
DQ Data Input/Output. . . . . . . . . . . . . . .
V
CC
V
SS
J PACKAGE
300 MIL SOJ
CASE 810B–03
28
27
26
25
24
23
22
21
20
19
18
17
16
15
+ 5.0 V Power Supply. . . . . . . . . .
V
CC
W
A
A
A
A
G
E
DQ
DQ
DQ
DQ
DQ
Output Enable. . . . . . . . . . . . . . . . . . .
Ground. . . . . . . . . . . . . . . . . . . . . . .
E
W
G
This document contains information on a new product under development. Motorola reserves the right to change or discontinue this product without notice.
REV 1
10/9/96
Motorola, Inc. 1996
MOTOROLA FAST SRAM
MCM6706B
1
TRUTH TABLE (X = Don’t Care)
E
H X X Not Selected High–Z —
L H H Read High–Z —
L L H Read D
L X L Write D
G W Mode I/O Pin Cycle
out
in
Read Cycle
Write Cycle
ABSOLUTE MAXIMUM RATINGS (See Note)
Rating
Power Supply Voltage V
Voltage Relative to VSS for Any Pin
Except V
Output Current I
Power Dissipation P
Temperature Under Bias T
Operating Temperature T
Storage Temperature — Plastic T
NOTE: Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are
CC
exceeded. Functional operation should be restricted to RECOMMENDED OPERATING CONDITIONS. Exposure to higher than recommended voltages for
extended periods of time could affect device reliability.
Symbol Value Unit
– 0.5 to + 7.0 V
– 0.5 to VCC + 0.5 V
± 30 mA
2.0 W
– 10 to + 85 °C
0 to + 70 °C
– 55 to + 125 °C
Vin, V
out
bias
CC
out
D
A
stg
DC OPERA TING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ± 10%, TA = 0 to 70°C, Unless Otherwise Noted)
This device contains circuitry to protect the
inputs against damage due to high static voltages or electric fields; however, it is advised
that normal precautions be taken to avoid application of any voltage higher than maximum
rated voltages to this high–impedance circuit.
This BiCMOS memory circuit has been designed to meet the dc and ac specifications
shown in the tables, after thermal equilibrium
has been established. The circuit is in a test
socket or mounted on a printed circuit board
and transverse air flow of at least 500 linear feet
per minute is maintained.
RECOMMENDED OPERATING CONDITIONS
Parameter Symbol Min Typ Max Unit
Supply Voltage (Operating Voltage Range) V
Input High Voltage V
Input Low Voltage V
*VIH (max) = VCC + 0.3 V dc; VIH (max) = VCC + 2.0 V ac (pulse width ≤ 2.0 ns) or I ≤ 30.0 mA.
** VIL (min) = – 0.5 V dc @ 30.0 mA; VIL (min) = – 2.0 V ac (pulse width ≤ 2.0 ns) or I ≤ 30.0 mA.
CC
IH
IL
4.5 5.0 5.5 V
2.2 —
– 0.5**
— 0.8 V
DC CHARACTERISTICS
Parameter Symbol Min Max Unit
Input Leakage Current (All Inputs, Vin = 0 to VCC) I
Output Leakage Current (E = VIH or G = VIH, V
Output High Voltage (IOH = – 4.0 mA) V
Output Low Voltage (IOL = + 8.0 mA) V
= 0 to VCC) I
out
lkg(I)
lkg(O)
OH
OL
— ± 1.0 µA
— ± 1.0 µA
2.4 — V
— 0.4 V
POWER SUPPLY CURRENTS
Parameter Symbol 6706B–8 6706B–10 6706B–12 Unit Notes
AC Active Supply Current
(I
= 0 mA, VCC = max, f = f
out
AC Standby Current (E = VIH, VCC = max, f = f
CMOS Standby Current (VCC = max, f = 0 MHz,
E
≥ VCC – 0.2 V, Vin ≤ VSS, or ≥ VCC – 0.2 V)
NOTES:
1. Reference AC Operating Conditions and Characteristics for input and timing (VIH/VIL, tr/tf, pulse level 0 to 3 V, VIH = 3 V).
2. All addresses transition simultaneously low (LSB) and then high (MSB).
3. Data states are all zero.
max
)
) I
max
I
CCA
SB1
I
SB2
195 185 175 mA 1, 2, 3
75 70 65 mA 1, 2, 3
20 20 20 mA
VCC + 0.3*
V
MCM6706B
2
MOTOROLA FAST SRAM
CAPACITANCE (f = 1.0 MHz, dV = 3.0 V, T
Address Input Capacitance C
Control Pin Input Capacitance (E, G, W) C
I/O Capacitance C
= 25°C, Periodically Sampled Rather Than 100% Tested)
A
Parameter
Symbol Max Unit
in
in
out
5 pF
6 pF
6 pF
AC OPERA TING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ± 10%, TA = 0 to + 70°C, Unless Otherwise Noted)
Input Timing Measurement Reference Level 1.5 V. . . . . . . . . . . . . . .
Input Pulse Levels 0 to 3.0 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Rise/Fall Time 2 ns. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
READ CYCLE (See Notes 1 and 2)
Parameter Symbol Min Max Min Max Min Max Unit Notes
Read Cycle Time t
Address Access Time t
Chip Enable Access Time t
Output Enable Access Time t
Output Hold from Address Change t
Chip Enable Low to Output Active t
Chip Enable High to Output High–Z t
Output Enable Low to Output Active t
Output Enable High to Output High–Z t
NOTES:
1. W
is high for read cycle.
2. Product sensitivites to noise require proper grounding and decoupling of power supplies as well as minimization or elimination of bus
contention conditions during read and write cycles.
3. All read cycle timing is referenced from the last valid address to the first transitioning address.
4. At any given voltage and temperature, t
device to device.
5. Transition is measured 200 mV from steady–state voltage with load of Figure 1b.
6. This parameter is sampled and not 100% tested.
7. Device is continuously selected (E
8. Addresses valid prior to or coincident with E
EHQZ
= VIL, G = VIL).
going low.
AVAV
AVQV
ELQV
GLQV
AXQX
ELQX
EHQZ
GLQX
GHQZ
max < t
ELQX
Output Timing Measurement Reference Level 1.5 V. . . . . . . . . . . . .
Output Load See Figure 1a. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
MCM6706B–8 MCM6706B–10 MCM6706B–12
8 — 10 — 12 — ns 3
— 8 — 10 — 12 ns
— 8 — 10 — 12 ns
— 4 — 5 — 6 ns
3 — 3 — 3 — ns
1 — 1 — 1 — ns 4 ,5, 6
— 4.5 — 5 — 6 ns 4, 5, 6
0 — 0 — 0 — ns 4, 5, 6
— 4 — 5 — 6 ns 4, 5, 6
min, and t
GHQZ
max < t
min, both for a given device and from
GLQX
OUTPUT
Z0 = 50
Ω
(a) (b)
MOTOROLA FAST SRAM
RL = 50
VL = 1.5 V
Ω
+5 V
OUTPUT
255
Ω
Figure 1. AC Test Loads
480
5 pF
TIMING LIMITS
The table of timing values shows either a
Ω
minimum or a maximum limit for each parameter. Input requirements are specified from
the external system point of view. Thus, address setup time is shown as a minimum
since the system must supply at least that
much time. On the other hand, responses
from the memory are specified from the device point of view. Thus, the access time is
shown as a maximum since the device never
provides data later than that time.
MCM6706B
3