MOTOROLA MC74HC03AFR1, MC74HC03AFR2, MC74HC03AN, MC74HC03AFEL, MC74HC03AFL1 Datasheet

...
Semiconductor Components Industries, LLC, 2000
March, 2000 – Rev. 8
1 Publication Order Number:
MC74HC03A/D
MC74HC03A
Quad 2-Input NAND Gate with Open-Drain Outputs
High–Performance Silicon–Gate CMOS
The HC03A NAND gate has, as its outputs, a high–performance MOS N–Channel transistor. This NAND gate can, therefore, with a suitable pullup resistor, be used in wired–AND applications. Having the output characteristic curves given in this data sheet, this device can be used as an LED driver or in any other application that only requires a sinking current.
Output Drive Capability: 10 LSTTL Loads With Suitable Pullup
Resistor
Outputs Directly Interface to CMOS, NMOS and TTL
High Noise Immunity Characteristic of CMOS Devices
Operating Voltage Range: 2 to 6V
Low Input Current: 1µA
In Compliance With the JEDEC Standard No. 7A Requirements
Chip Complexity: 28 FETs or 7 Equivalent Gates
DESIGN GUIDE
Criteria Value Unit
Internal Gate Count* 7.0 ea Internal Gate Propagation Delay 1.5 ns Internal Gate Power Dissipation 5.0 µW Speed Power Product 0.0075 pJ
* Equivalent to a two–input NAND gate
PIN 14 = V
CC
PIN 7 = GND * Denotes open–drain outputs
LOGIC DIAGRAM
3,6,8,11
Y*
1,4,9,12
A
2,5,10,13
B
OUTPUT
PROTECTION
DIODE
V
CC
Pinout: 14–Lead Packages (Top View)
1314 12 11 10 9 8
21 34567
V
CC
B4 A4 Y4 B3 A3 Y3
A1 B1 Y1 A2 B2 Y2 GND
Device Package Shipping
ORDERING INFORMATION
MC74HC03AN PDIP–14 2000 / Box MC74HC03AD SOIC–14
http://onsemi.com
55 / Rail
MC74HC03ADR2 SOIC–14 2500 / Reel
MARKING
DIAGRAMS
A = Assembly Location WL or L = Wafer Lot YY or Y = Year WW or W = Work Week
MC74HC03ADT TSSOP–14 96 / Rail MC74HC03ADTR2 TSSOP–14
2500 / Reel
TSSOP–14 DT SUFFIX
CASE 948G
HC
03A
ALYW
1
14
1
14
PDIP–14
N SUFFIX
CASE 646
MC74HC03AN
AWLYYWW
SOIC–14
D SUFFIX
CASE 751A
1
14
HC03A
AWLYWW
L L H H
L H L H
FUNCTION TABLE
Inputs Output
AB
Z Z Z L
Y
Z = High Impedance
MC74HC03A
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2
MAXIMUM RATINGS*
Symbol
Parameter
Value
Unit
V
CC
DC Supply Voltage (Referenced to GND)
– 0.5 to + 7.0
V
V
in
DC Input Voltage (Referenced to GND)
– 0.5 to VCC + 0.5
V
V
out
DC Output Voltage (Referenced to GND)
– 0.5 to VCC + 0.5
V
I
in
DC Input Current, per Pin
± 20
mA
I
out
DC Output Current, per Pin
± 25
mA
I
CC
DC Supply Current, VCC and GND Pins
± 50
mA
ÎÎ
Î
P
D
ОООООООООООО
Î
Power Dissipation in Still Air Plastic DIP†
SOIC Package†
TSSOP Package†
ÎÎÎ
Î
750 500 450
Î
Î
mW
T
stg
Storage Temperature
– 65 to + 150
_
C
ÎÎ
Î
T
L
ОООООООООООО
Î
Lead Temperature, 1 mm from Case for 10 Seconds
Plastic DIP, SOIC or TSSOP Package
ÎÎÎ
Î
260
Î
Î
_
C
*Maximum Ratings are those values beyond which damage to the device may occur.
Functional operation should be restricted to the Recommended Operating Conditions.
†Derating — Plastic DIP: – 10 mW/_C from 65_ to 125_C
SOIC Package: – 7 mW/_C from 65_ to 125_C TSSOP Package: – 6.1 mW/_C from 65_ to 125_C
For high frequency or heavy load considerations, see Chapter 2 of the ON Semiconductor High–Speed CMOS Data Book (DL129/D).
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
ÎÎ
Max
Unit
V
CC
DC Supply Voltage (Referenced to GND)
2.0
ÎÎ
6.0
V
Vin, V
out
DC Input Voltage, Output Voltage (Referenced to GND)
0
ÎÎ
V
CC
V
T
A
Operating Temperature, All Package Types
– 55
ÎÎ
+ 125
_
C
ÎÎ
Î
tr, t
f
ООООООООООООО
Î
Input Rise and Fall Time VCC = 2.0 V
(Figure 1) VCC = 4.5 V
VCC = 6.0 V
Î
Î
0 0 0
ÎÎ
ÎÎ
1000
500 400
Î
Î
ns
DC CHARACTERISTICS (Voltages Referenced to GND)
V
Guaranteed Limit
Symbol Parameter Condition
CC
V
–55 to 25°C ≤85°C ≤125°C Unit
V
IH
Minimum High–Level Input Voltage
V
out
= 0.1V or VCC –0.1V
|I
out
| 20µA
2.0
3.0
4.5
6.0
1.50
2.10
3.15
4.20
1.50
2.10
3.15
4.20
1.50
2.10
3.15
4.20
V
V
IL
Maximum Low–Level Input Voltage
V
out
= 0.1V or VCC – 0.1V
|I
out
| 20µA
2.0
3.0
4.5
6.0
0.50
0.90
1.35
1.80
0.50
0.90
1.35
1.80
0.50
0.90
1.35
1.80
V
V
OL
Maximum Low–Level Output Voltage
V
out
= 0.1V or VCC – 0.1V
|I
out
| 20µA
2.0
4.5
6.0
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
V
Vin = VIH or VIL|I
out
| 2.4mA
|I
out
| 4.0mA
|I
out
| 5.2mA
3.0
4.5
6.0
0.26
0.26
0.26
0.33
0.33
0.33
0.40
0.40
0.40
I
in
Maximum Input Leakage Current Vin = VCC or GND 6.0 ±0.1 ±1.0 ±1.0 µA
I
CC
Maximum Quiescent Supply Current (per Package)
Vin = VCC or GND I
out
= 0µA
6.0 1.0 10 40 µA
I
OZ
Maximum Three–State Leakage Current
Output in High–Impedance State Vin = VIL or V
IH
V
out
= VCC or GND
6.0 ±0.5 ±5.0 ±10 µA
NOTE: Information on typical parametric values can be found in Chapter 2 of the ON Semiconductor High–Speed CMOS Data Book (DL129/D).
This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated voltages to this high–impedance cir­cuit. For proper operation, Vin and V
out
should be constrained to the
range GND v (Vin or V
out
) v VCC.
Unused inputs must always be tied to an appropriate logic voltage level (e.g., either GND or VCC). Unused outputs must be left open.
MC74HC03A
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AC CHARACTERISTICS (C
L
= 50pF, Input tr = tf = 6ns)
Guaranteed Limit
Symbol Parameter
V
CC
V
–55 to 25°C ≤85°C ≤125°C Unit
t
PLZ
,
t
PZL
Maximum Propagation Delay, Input A or B to Output Y (Figures 1 and 2)
2.0
3.0
4.5
6.0
120
45 24 20
150
60 30 26
180
75 36 31
ns
t
TLH
,
t
THL
Maximum Output Transition Time, Any Output (Figures 1 and 2)
2.0
3.0
4.5
6.0
75 27 15 13
95 32 19 16
110
36 22 19
ns
C
in
Maximum Input Capacitance 10 10 10 pF
C
out
Maximum Three–State Output Capacitance (Output in High–Impedance State)
10 10 10 pF
NOTE: For propagation delays with loads other than 50 pF, and information on typical parametric values, see Chapter 2 of the ON
Semiconductor High–Speed CMOS Data Book (DL129/D).
Typical @ 25°C, VCC = 5.0 V, VEE = 0 V
C
PD
Power Dissipation Capacitance (Per Buffer)*
8.0
pF
*Used to determine the no–load dynamic power consumption: PD = CPD V
CC
2
f + ICC VCC. For load considerations, see Chapter 2 of the
ON Semiconductor High–Speed CMOS Data Book (DL129/D).
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