CM200TU-5F
MITSUBISHI IGBT MODULES
CM200TU-5F
HIGH POWER SWITCHING USE
¡IC...................................................................200A
CES ............................................................250V
¡V
¡Insulated Type
¡6-elements in a pack
APPLICATION
Inverters for battery power source
OUTLINE DRAWING & CIRCUIT DIAGRAM
CM
N
21.7
EEE
GGGEE
U
12
2.8
11 21.7 11 21.7 11
±0.25
102
80
Tc measured point
GuP
EuP
GvP
EvP
GwP
EwP
5–M5NUTS
7.1
107
90
12
11
GGG
12 12
23
LABEL
23
V
±0.25
21.7
23
12
Dimensions in mm
4–φ5.5
MOUNTING HOLES
(4)
P
14.411
11
GuN
EuN
GvN
EvN
48.5 17 3.75
GwN
EwN
E
W
3.75
0.8
Tc measured point
4
0.5
+1
29
–0.5
P
26 8.1
GUP
E
U
P
U
G
U
N
EUN
N
G
E
G
EVN
V
P
W
P
G
E
V
P
W
P
V
V
W
G
N
W
N
EWN
CIRCUIT DIAGRAM
Sep. 2000
MAXIMUM RATINGS (Tj = 25°C)
MITSUBISHI IGBT MODULES
CM200TU-5F
HIGH POWER SWITCHING USE
Symbol Parameter
CES
V
VGES
IC
ICM
IE (
IEM (
PC (
Tj
Tstg
Viso
Collector-emitter voltage
Gate-emitter voltage
Collector current
Note 1
)
Emitter current
Note 1
)
Maximum collector dissipation
Note 3
)
Junction temperature
Storage temperature
Isolation voltage
—
Torque strength
—
Weight
ELECTRICAL CHARACTERISTICS
Symbol
ICES
GE(th)
V
IGES
VCE(sat)
Cies
Coes
Cres
QG
td(on)
tr
td(off)
tf
trr (
Qrr (
VEC(
Rth(j-c)Q
th(j-c)R
R
th(c-f)
R
Rth(j-c’)Q
Note 1. IE, VEC, trr, Qrr and die/dt represent characteristics of the anti-parallel, emitter to collector free-wheel diode. (FWDi).
1 : Tc measured point is indicated in OUTLINE DRAWING.
*
2 : Typical value is measured by using Shin-etsu Silicone “G-746”.
*
3 : If you use this value, Rth(f-a) should be measured just under the chips.
*
Collector cutoff current
Gate-emitter threshold voltage
Gate leakage current
Collector to emitter saturation voltage
Input capacitance
Output capacitance
Reverse transfer capacitance
Total gate charge
Turn-on delay time
Turn-on rise time
Turn-off delay time
Turn-off fall time
Reverse recovery time
Note 1
)
Reverse recovery charge
Note 1
)
Emitter-collector voltage
Note 1
)
Thermal resistance
Contact thermal resistance
Thermal resistance
2. Pulse width and repetition rate should be such that the device junction temp. (T
3. Junction temperature (T
4. Pulse width and repetition rate should be such as to cause negligible temperature rise.
Parameter
*1
*3
j) should not increase beyond 150°C.
G-E Short
C-E Short
C = 25°C
T
Pulse (Note 2)
C = 25°C
T
Pulse (Note 2)
C = 25°C
T
Main Terminal to base plate, AC 1 min.
Main Terminal M5
Mounting holes M5
Typical value
(Tj = 25°C)
VCE = VCES, VGE = 0V
C = 20mA, VCE = 10V
I
V
GE = VCES, VCE = 0V
j = 25°C
T
j = 125°C
T
V
CE = 10V
GE = 0V
V
CC = 100V, IC = 200A, VGE = 10V
V
V
CC = 100V, IC = 200A
GE1 = VGE2 = 10V
V
G = 13Ω, Inductive load switching operation
R
E = 200A
I
I
E = 200A, VGE = 0V
IGBT part (1/6 module)
FWDi part (1/6 module)
Case to fin, Thermal compoundapplied
Tc measured point is just under the chips
Conditions UnitRatings
Test conditions
Min. Max.
—
3.0 5.0
—
I
C = 200A, VGE = 10V
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
*2
(1/6 module)
—
—
j) does not exceed Tjmax rating.
250
±20
200
400
200
400
600
–40 ~ +150
–40 ~ +125
2500
2.5 ~ 3.5
2.5 ~ 3.5
680
Limits
Typ.
—
4.0 V
—
1.2
1.1
—
—
—
1500
—
—
—
—
—
10.0
—
—
—
0.09
—
0.5
1.7
—
55
3.5
1.9
—
600
300
900
500
250
—
2.0
0.21
0.47
—
0.16
V
V
A
A
W
°C
°C
V
N • m
N • m
g
Unit
1
mA
µA
V
nF
nC
ns
ns
µC
V
°C/W
Sep. 2000