Microsemi Corporation MX043J, MX043G Datasheet

MX043G
2830 S. Fairview St.
POWER MOSFET
Santa Ana, CA 92704 PH: (714) 979-8220 FAX: (714) 966-5256
Features
Harris FSC260R die
total dose: 100 kRAD(Si) within pre-radiation parameter limits
dose rate: 3 x 109 RAD(Si)/sec @ 80%BV
dose rate: 2 x 10
neutron: 1013 neutrons/cm2 within pre-radiation parameter limits
photocurrent: 17 nA/RAD(Si)/sec typical
rated Safe Operating Area Curve for Single event Effects
rugged polysilicon gate cell structure with ultrafast body diode
low inductance surface mount power package available with “J-leads”
(MX043J) or “gullwing-leads” (MX043G)
very low thermal resistance
reverse polarity available upon request add suffix “R”st
RAD(Si)/sec @ ID IDM typical
DSS
typical
MX043J
200 Volts
44 Amps
50 m
RADIATION
HARDENED
SEGR-RESISTANT
N-CHANNEL
ENHANCEMENT
MODE
Maximum Ratings @ 25°C (unless otherwise
DESCRIPTION SYMBOL MAX. UNIT
Drain-to-Source Breakdown Voltage (Gate Shorted to Source)
@ TJ 25°C
Drain-to-Gate Breakdown Voltage @ T
25°C, RGS= 1 M BV
J
Continuous Gate-to-Source Voltage V Transient Gate-to-Source Voltage V Continuous Drain Current Tj= 25°C
Tj= 100°C
Peak Drain Current, pulse width limited by T
Jmax
Repetitive Avalanche Current I Repetitive Avalanche Energy E Single Pulse Avalanche Energy E Power Dissipation P Junction Temperature Range T
Storage Temperature Range T Continuous Source Current (Body Diode) I
Pulse Source Current (Body Diode) I Thermal Resistance, Junction to Case
Weight - grams
BV
I
DSS
DGR
GS
GSM
I
D25
D100
I
DM
AR
AR AS
D
j stg S
SM
θ
JC
200 Volts
200 Volts +/-20 Volts +/-30 Volts
44 28
132 Amps
44 Amps tbd mJ tbd mJ
300 Watts
-55 to +125
-55 to +125 44 Amps
132 Amps
0.25
Amps
°C °C
°C/W
SINGLE EVENT Ion Species typical LET (MeV/mg/cm) EFFECTS Ni 26 43 -20V 200V
SAFE Br 37 36 -5V 200V
OPERATING Br 37 36 -10V 160V
AREA Br 37 36 -15V 100V
(SEESOA) Br 37 36 -20V 40V
Notes
(1) Pulse test, t 300 µs, duty cycle δ 2% (2) Microsemi Corp. does not manufacture the mosfet die; contact company for details.
Datasheet# MSC0857
typical range (µ)
VGS VDSmax
MX043J
MX043G
Electrical Parameters @ 25°C (unless otherwise specified)
DESCRIPTION SYMBOL CONDITIONS MIN TYP. MAX UNIT
Drain-to-Source Breakdown Voltage (Gate Shorted to Source) Temperature Coefficient of the Drain-to-Source Breakdown Voltage Gate Threshold Voltage V
Gate-to-Source Leakage Current
Drain-to-Source Leakage Current (Zero Gate Voltage Drain Current) I Static Drain-to-Source On-State Resistance (1) R
Forward Transconductance (1) g
BV
BV
DSS
DSS
GS(th)
I
GSS
DSS
DS(on)
fs
/T
VGS = 0 V, ID = 1 mA 200 V
J
VDS = VGS, ID = 1 mA, TJ = 25°C TJ = 125°C TJ = -55°C VGS = ± 20 VDC, VDS = 0 TJ = 25°C TJ = 125°C VDS =0.8•BV
= 0 V TJ = 125°C
VGS
DSS TJ
VGS= 12V, ID= 28A TJ = 25°C ID= 25A TJ = 125°C
1.5
0.5
-
= 25°C
tbd V/°C
±100 ±200
0.043-0.050
0.093
VDS 10 V; ID = 50 A 26 32 S
4.0
-
5.0
25
250
V V V
nA
µA µA
Ω Ω
Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Total Gate Charge Gate-to-Source Charge Gate-to-Drain (Miller) Charge Body Diode Forward Voltage (1) V
Reverse Recovery Time (Body Diode) t
Mechanical Outline ShelFit
Q
C
T
t
C
C
d(off)
Q Q
oss
rss
d(on)
t
r
t
f
g(on)
gs gd
rr
V
= 0 V, VDS = 25 V, f = 1 MHz 4400
GS
pF 900 280
VGS = 12 V, VDS = 100 V,
ID = 44 A, RG = 2.35
40 95
ns
100
25
VGS = 12 V, VDS = 100V, ID = 44 A 160
30 83
180
38 93
nC
IF = IS, VGS = 0 V 0.6 - 1.8 V
IF = 10 A, -di/dt = 100 A/µs, TJ =25 °C 560 ns
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