Micron Technology EDW4032BABG Datasheet

4Gb: x16, x32 GDDR5 SGRAM

Features

GDDR5 SGRAM

EDW4032BABG – 8 Meg x 32 I/O x 16 banks, 16 Meg x 16 I/O x 16 banks
Features
• VDD = V
• 16 internal banks
• Four bank groups for tCCDL = 3 tCK
• 8n-bit prefetch architecture: 256-bit per array read or write access for x32; 128-bit for x16
• Burst length (BL): 8 only
• Programmable CAS latency: 7–25
• Programmable WRITE latency: 4–7
• Programmable CRC READ latency: 2–3
• Programmable CRC WRITE latency: 8–14
• Programmable EDC hold pattern for CDR
• Precharge: Auto option for each burst access
• Auto refresh and self refresh modes
• Refresh cycles: 16,384 cycles/32ms
• Interface: Pseudo open drain (POD-15) compatible outputs: 40Ω pull-down, 60Ω pull-up
• On-die termination (ODT): 60Ω or 120Ω (NOM)
• ODT and output driver strength auto calibration with external resistor ZQ pin: 120Ω
• Programmable termination and driver strength off­sets
• Selectable external or internal V programmable offsets for internal V
• Separate external V inputs
• TC = 0°C to +95°C
• x32/x16 mode configuration set at power-up with EDC pin
• Single-ended interface for data, address, and command
• Quarter data rate differential clock inputs CK_t, CK_c for address and commands
• Two half data rate differential clock inputs, WCK_t and WCK_c, each associated with two data bytes (DQ, DBI_n, EDC)
• DDR data (WCK) and addressing (CK)
• SDR command (CK)
• Write data mask function via address bus (single/ double byte mask)
• Data bus inversion (DBI) and address bus inversion (ABI)
• Input/output PLL on/off mode
• Duty cycle corrector (DCC) for data clock (WCK)
• Digital RAS lockout
= 1.6V/1.55V/1.5V ±3% and 1.35V ±3%
DDQ
for data inputs;
REF
REF
for address/command
REF
• Address training: Address input monitoring via DQ pins
• WCK2CK clock training: Phase information via EDC pins
• Data read and write training via read FIFO (FIFO depth = 6)
• Read FIFO pattern preloaded by LDFF command
• Direct write data load to read FIFO by WRTR com­mand
• Consecutive read of read FIFO by RDTR command
• Read/write data transmission integrity secured by cyclic redundancy check (CRC-8)
• Read/write EDC on/off mode
• Low power modes
• RDQS mode on EDC pin
• On-die temperature sensor with readout
• Automatic temperature sensor controlled self refresh rate
• Vendor ID, FIFO depth and density info fields for identification
• Mirror function with MF pin
• Boundary scan function with SEN pin
Options
1
Marking
• Organization – Density 40 – 128 Meg x 32 (words x bits) 32
• FBGA package – 170-ball (12mm x 14mm) BG
• Package environment code – Lead- and halogen-free
-F
(RoHS-compliant)
• Package media – Dry pack (tray) -D – Reel -R
• Timing – maximum data rate – 6.0 Gb/s, 5.0 Gb/s -60 – 7.0 Gb/s, 6.0 Gb/s -70 – 8.0 Gb/s, 6.0 Gb/s -80
• Operating temperature – Commercial (0°C TC +95°C) None
• Revision A
Note:
1. Not all options listed can be combined to define an offered product. Use the part catalog search on http://www.micron.com for available offerings.
09005aef858b7e92 4gb_gddr5_sgram_brief.pdf - Rev. E 6/17 EN
Products and specifications discussed herein are subject to change by Micron without notice.
1
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2014 Micron Technology, Inc. All rights reserved.
Figure 1: Part Numbering
Micron Memory
Type D = Packaged device
Product Family W = GDDR5 SGRAM
Density/Bank 40 = 4Gb/16-bank
Organization 32 = x32
Power Supply, Interface B = VDD = 1.6V/1.55V/1.5V
E D W 40 32 B A BG - 70 - -F D
Packing Media D = Dry pack (tray) R = Reel
Environment Code F = Lead-free (RoHS-compliant) and halogen-free
Speed
-60 = 6.0 Gb/s
-70 = 7.0 Gb/s
-80 = 8.0 Gb/s
Package BG = 170-ball FBGA, 12mm x 14mm
Revision
4Gb: x16, x32 GDDR5 SGRAM
Features
Note:
1. This Micron GDDR5 SGRAM is available in different speed bins. The operating range and AC timings of a faster speed bin are a superset of all slower speed bins. Therefore it is safe to use a faster bin device as a drop-in replacement of a slower bin device when operated within the supply voltage and frequency range of the slower bin device.

FBGA Part Marking Decoder

Due to space limitations, FBGA-packaged components have an abbreviated part marking that is different from the part number. For a quick conversion of an FBGA code, see the FBGA Part Marking Decoder on Micron’s web site: http://www.micron.com.
09005aef858b7e92 4gb_gddr5_sgram_brief.pdf - Rev. E 6/17 EN
2
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2014 Micron Technology, Inc. All rights reserved.

Ball Assignments and Descriptions

A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
T
U
(Top view)
GroundSupplyGDDR5AddressesData
1
V
SSQ
V
DDQ
V
SSQ
V
DDQ
V
SSQ
V
DDQ
V
DD
V
SS
MF
V
SS
V
DD
V
DDQ
V
SSQ
V
DDQ
V
SSQ
V
DDQ
V
SSQ
2
DQ1
DQ3
EDC0
DBI0_n
DQ5
DQ7
V
DDQ
V
SSQ
RESET_n
V
SSQ
V
DDQ
DQ31
DQ29
DBI3_n
EDC3
DQ27
DQ25
3
V
SSQ
V
DDQ
V
SSQ
V
DDQ
V
SSQ
V
DDQ
RAS_n
V
DDQ
CKE_n
V
DDQ
CAS_n
V
DDQ
V
SSQ
V
DDQ
V
SSQ
V
DDQ
V
SSQ
4
DQ0
DQ2
V
SSQ
WCK01_t
DQ4
DQ6
V
DD
A10, A0
ABI_n
A8, A7
V
DD
DQ30
DQ28
WCK23_t
V
SSQ
DQ26
DQ24
6 7 8 9 10
V
REFD
V
SS
V
DD
V
SS
V
DDQ
V
SSQ
V
SS
BA3, A3
SEN
BA1, A5
V
SS
V
SSQ
V
DDQ
V
SS
V
DD
V
SS
V
REFD
11
DQ8
DQ10
V
SSQ
V
DD
DQ12
DQ14
V
DD
BA0, A2
CK_c
BA2, A4
V
DD
DQ22
DQ20
V
DD
V
SSQ
DQ18
DQ16
12
V
SSQ
V
DDQ
V
SSQ
V
DDQ
V
SSQ
V
DDQ
CS_n
V
DDQ
CK_t
V
DDQ
WE_n
V
DDQ
V
SSQ
V
DDQ
V
SSQ
V
DDQ
V
SSQ
13
DQ9
DQ11
EDC1
DBI1_n
DQ13
DQ15
V
DDQ
V
SSQ
ZQ
V
SSQ
V
DDQ
DQ23
DQ21
DBI2_n
EDC2
DQ19
DQ17
14
V
SSQ
V
DDQ
V
SSQ
V
DDQ
V
SSQ
V
DDQ
V
DD
V
SS
V
REFC
V
SS
V
DD
V
DDQ
V
SSQ
V
DDQ
V
SSQ
V
DDQ
V
SSQ
5
NC
V
SS
V
DD
WCK01_c
V
DDQ
V
SSQ
V
SS
A9, A1
A12, A13
A11, A6
V
SS
V
SSQ
V
DDQ
WCK23_c
V
DD
V
SS
NC
Figure 2: 170-Ball FBGA – MF = 0 (Top View)
4Gb: x16, x32 GDDR5 SGRAM
Ball Assignments and Descriptions
09005aef858b7e92 4gb_gddr5_sgram_brief.pdf - Rev. E 6/17 EN
Note:
1. Balls shown with a heavy, solid outline are off in x16 mode.
3
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2014 Micron Technology, Inc. All rights reserved.
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