Datasheet ML2264CCS, ML2264CCP, ML2264CCR Datasheet (Micro Linear Corporation)

May 1997
ML2264*
4-Channel High-Speed 8-Bit
A/D Converter with T/H (S/H)
GENERAL DESCRIPTION
The ML2264 is a high-speed, µP compatible, 4-channel 8-bit A/D converter with a conversion time of 680ns over the operating temperature range and supply voltage tolerance. The ML2264 operates from a single 5V supply and has an analog input range from GND to VCC.
The ML2264 has two different pin selectable modes. The T/H mode has an internal track and hold. The S/H mode has a true internal sample and hold and can digitize 0 to 5V sinusoidal signals as high as 500kHz.
The ML2264 digital interface has been designed so that the device appears as a memory location or I/O port to a µP. Analog input channels are selected by the latched and decoded multiplexer address inputs.
The ML2264 is an enhanced, pin compatible second source for the industry standard AD7824. The ML2264 enhancements are faster conversion time, parameters guaranteed over the supply tolerance and temperature range, improved digital interface timing, superior power supply rejection, and better latchup immunity on analog inputs.
FEATURES
Conversion time, WR-RD mode over temperature and
supply voltage tolerance
Track & Hold Mode ................................. 830ns max
Sample & Hold Mode .............................. 700ns max
Total unadjusted error..................... ±1/2 LSB or ±1 LSB
Capable of digitizing a 5V, 250kHz sine wave
4-analog input channels
No missing codes
0V to 5V analog input range with single 5V power
supply
No zero or full scale adjust required
Analog input protection ............................... 25mA min
Operates ratiometrically or with up to 5V voltage
reference
No external clock required
Power-on reset circuitry
Low power .......................................................100mW
Narrow 24-pin DIP, SOIC, or SSOP
Superior pin compatible replacement for AD7824
BLOCK DIAGRAM
VCC+V
A IN 1 A IN 2 A IN 3 A IN 4
4-CH MUX
ADDRESS
LATCH
DECODE
A0 A1
SAMPLE
&
HOLD
PIN CONNECTIONS
–V
REF
SH/TH
+V
REF
4-BIT
FLASH
A/D
(MSB)
–V
REF
+V
REF
4-BIT
–V
+
Σ
–V
D/A
REF
+V
REF
16
4-BIT
FLASH
A/D
REF
(LSB)
16
TIMING
CONTROL
INT CS WR/RDY RD SH/TH MODE
REF
&
GND
DECODE
LOGIC,
LATCH
THREE
OUTPUT
BUFFER
&
STATE
DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
A IN 4 A IN 3 A IN 2 A IN 1
MODE
DB0 DB1 DB2 DB3
RD
INT
GND
24-Pin DIP 24-Pin SOIC
24-Pin SSOP
1
2
3
4
5
6
7
8
9
10
11
12
TOP VIEW
24
23
22
21
20
19
18
17
16
15
14
13
V
CC
A IN 4
SH/TH
A IN 3
A0
A IN 2
A1
A IN 1
DB7
MODE
DB6 DB5 DB4 CS WR/RDY +V
REF
–V
REF
GND
DB0 DB1 DB2 DB3
RD
INT
1
2
3
4
5
6
7
8
9
10
11
12
TOP VIEW
*This Part Is End Of Life As Of August 1, 2000
24
23
22
21
20
19
18
17
16
15
14
13
V
CC
SH/TH A0 A1 DB7 DB6 DB5 DB4 CS WR/RDY +V
REF
–V
REF
1
ML2264
PIN DESCRIPTION
PIN# NAME FUNCTION PIN# NAME FUNCTION
1 A IN 4 Analog input 4. 2 A IN 3 Analog input 3. 3 A IN 2 Analog input 2. 4 A IN 1 Analog input 1. 5 MODE Mode select input.
MODE = GND: RD mode
MODE = VCC: WR-RD mode Pin has internal current source pulldown to GND.
6 DB0 Data output — bit 0 (LSB). 7 DB1 Data output — bit 1. 8 DB2 Data output — bit 2. 8 DB3 Data output — bit 3.
10 RD Read input. In RD mode, this pin
initiates a conversion. In WR-RD mode, this pin latches data into output latches. See Digital Interface section.
11 INT Interrupt output. This output signals
the end of a conversion and indicates that data is valid on the data outputs. See Digital Interface section.
12 GND Ground. 13 –V
REF
Negative reference voltage for A/D converter.
15 WR/RDY Write input or ready output. In WR-RD
mode, this pin is WR input. In RD mode, this pin is RDY open drain output. See Digital Interface section.
16 CS Chip select input. This pin must be
held low for the device to perform a
conversion. 17 DB4 Data output — bit 4. 18 DB5 Data output — bit 5. 19 DB6 Data output — bit 6. 20 DB7 Data output — bit 7 (MSB). 21 A1 Digital address input 1 that selects
analog input channel. See multiplexer
addressing section. 22 A0 Digital address input 0 that selects
analog input channel. See multiplexer
addressing section. 23 SH/TH S/H, T/H mode select. When SH/TH =
VCC, the device is in sample and hold
mode. When SH/TH = GND, the
device is in track and hold mode. Pin
has internal pulldown current source
to GND. 24 V
CC
Positive supply. +5 volts ± 5%.
14 +V
REF
Positive reference voltage for A/D converter.
ABSOLUTE MAXIMUM RATINGS
Absolute maximum ratings are those values beyond which the device could be permanently damaged. Absolute maximum ratings are stress ratings only and functional device operation is not implied.
Supply Voltage, VCC................................................. 6.5V
Voltage
Logic Inputs ................................. –0.3V to VCC + 0.3V
Analog Inputs .............................. –0.3V to VCC + 0.3V
Input Current per Pin (Note 2) .............................. ±25mA
Storage Temperature .............................. –65°C to +150°C
Package Dissipation
at TA = 25°C (Board Mount) .............................875mW
Lead Temperature (Soldering 10 sec.)
Dual-In-Line Package (Plastic)............................ 260°C
Dual-In-Line Package (Ceramic)......................... 300°C
SOIC
Vapor Phase (60 sec.) ..................................... 215°C
Infrared (15 sec.) ............................................ 220°C
OPERATING CONDITIONS
Supply Voltage, VCC............................ 4.5VDC to 6.0V
Temperature Range (Note 3) ................. T
ML2264CCS ML2264CCP
ML2264CCR ........................................... 0°C to +70°C
MIN
- TA - T
DC
MAX
2
ML2264
ELECTRICAL CHARACTERISTICS
Unless otherwise specified, TA = T
PARAMETER NOTES CONDITIONS MIN (NOTE 3) MAX UNITS Converter
Total Unadjusted Error
ML2264CXX 4, 6 ±1 LSB
Integral Linearity Error
ML2264CXX 4, 6 ±1 LSB
Differential Linearity Error
ML2264CXX 4 ±1 LSB
Full Scale Error
ML2264CXX 4 ±1 LSB
Zero Scale Error
ML2264CXX 4 ±1 LSB Channel to Channel Mismatch 4 ±1/4 LSB +V
Voltage Range 5 –V
REF
–V
Voltage Range 5 GND–0.1 +V
REF
Reference Input Resistance 4 1 2.5 4 k ý Analog Input Range 4, 7 GND–0.1 VCC+0.1 V Power Supply Sensitivity 4 DC ±1/32 ±1/4 LSB
Analog Input Leakage Current, 4 ON Channel = V OFF Channel OFF Channel = 0V
Analog Input Leakage Current, 4 ON Channel = 0V –1 µA ON Channel OFF Channel = V
Analog Input Capacitance During Acquisition Period 45 pF
Digital and DC
V
, Logical “1” Input Voltage 4 WR, RD, CS, A0, A1 2.0 V
IN(1)
V
, Logical “0” Input Voltage 4 WR, RD, CS, A0, A1 0.8 V
IN(0)
I
, Logical “1” Input Current 4 VIH = V
IN(1)
I
, Logical “0” Input Current 4 VIL = GND WR, RD, CS –1 µA
IN(0)
MIN
to T
, VCC = +V
MAX
= 5V ± 5%, and –V
REF
= GND (Note 1)
REF
ML2264XCX
TYP
VCC+0.1 V
V
=5V ± 5%, V
CC
REF
REF
= 4.50V
100mVp-p ±1/16 LSB 100kHz sine on VCC, VIN = 0
CC
–1 µA
ON Channel = 0V 1 µA OFF Channel = V
ON Channel = V
CC
CC
CC
OFF Channel = 0V
MODE, SH/TH VCC–0.5 V
MODE, SH/TH 0.5 V
CC
WR, RD, CS, A0, A1 1 µA MODE, SH/TH 15 50 150 µA
MODE, SH/TH –20 µA
REF
V
A
3
ML2264
ELECTRICAL CHARACTERISTICS (Continued)
Unless otherwise specified, TA = T CL = 100pF. (Note 1)
PARAMETER NOTES CONDITIONS MIN (NOTE 3) MAX UNITS Digital and DC (Continued)
V Output Voltage
V Output Voltage
I Current
C Capacitance
C Capacitance
I
AC and Dynamic Performance (Note 9)
t Read Mode
t Write-Read Mode Edge to INT,
SNR, Signal to Noise Ratio VIN = 5V, 250kHz 48 dB
HD, Harmonic Distortion V
IMD, Intermodulation Distortion fa = 2.5V, 250kHz –60 dB
FR, Frequency Response V
SR, Slew Rate Tracking 5 SH/TH = V
t Setup Time (Track & Hold Operation)
, Logical “1” 4 I
OUT(1)
, Logical “0” 4 I
OUT(0)
, Three-State Output 4 V
OUT
, Logic Output 5pF
OUT
, Logic Input 5pF
IN
, Supply Current 4 CS = WR = RD = “1”, 18 mA
CC
, Conversion Time, 4 RD to INT, MODE = 0V 1020 ns
CRD
, Conversion Time, 4, 8 WR Falling SH/TH = V
CWR-RD
, Multiplexer Address 4 SH/TH = GND, Figure 1 0 ns
AS
MIN
to T
, VCC = +V
MAX
= 5V ± 5%, and –V
REF
= GND, and timing measured at 1.4V,
REF
ML2264XCX
TYP
= –2mA 4.0 V
OUT
= 2mA 0.4 V
OUT
= 0V –1 µA
OUT
= V
V
OUT
CC
No Output Load
CC
< t
t
RD
MODE = V
, SH/TH = GND 830 ns
INT
CC
Noise is sum of all nonfundamental components from 0–500kHz. SH/TH = V f
SAMPLING
= 5V, 250kHz –63 dB
IN
, MODE = V
CC
= 1.0 MHz
CC
THD is sum of 2–5th harmonics relative to fundamental. SH/TH = V f
SAMPLING
, MODE = V
CC
= 1.0 MHz
CC
fb = 2.5V, 248kHz IMB is (fa + fb), (fa – fb), (2fa + fb), (2fa – fb), (fa + 2fb), or (fa – 2fb) relative to fundamental. SH/TH = V f
SAMPLING
= 5V, 0–250kHz Relative to 1kHz ±0.1 dB
IN
SH/TH = V f
SAMPLING
, MODE = V
CC
= 1.0 MHz
, MODE = V
CC
= 1.0 MHz
CC
CC
CC
SH/TH = GND 0.25 V/µs
1µA
700 ns
4.0 V/µs
4
ML2264
ELECTRICAL CHARACTERISTICS (Continued)
Unless otherwise specified, TA = T CL = 100pF. (Note 1)
PARAMETER NOTES CONDITIONS MIN (NOTE 3) MAX UNITS AC and Dynamic Performance (Note 9) (Continued)
t
, Multiplexer Address 4 SH/TH = GND, Figure 1 60 ns
AH
Hold Time (Track & Hold Operation) t
, Multiplexer Address 4 SH/TH = VCC, Figure 2 225 ns
AS
Setup Time (Sample & Hold Operation) t
, Multiplexer Address 4 SH/TH = VCC, Figure 2 60 ns
AH
Hold Time (Sample & Hold Operation)
AC Performance Read Mode (Pin 5 = 0V), Figure 4
t
, CS to RDY Delay 4 0 60 ns
RDY
t
, RD Low to RDY Delay 4, 9 Figure 3 1020 ns
RDD
t
, CS to RD, WR Setup Time 4 0 ns
CSS
t
, CS to RD, WR Hold Time 4 0 ns
CSH
t
, Conversion Time — 4, 9 1020 ns
CRD
RD Low to INT low t
, Data Access Time 4 t
ACC0
RD to Data Valid t
, RD Pulse Width 4 t
RDPW
t
, RD to INT Delay 4, 9 0 65 ns
INTH
t
, Data Hold Time — 5, 9 Figure 3 0 50 ns
DH
RD Rising Edge to Data High Impedance State
t
, Delay Time Between 4, 9 Sample & Hold Mode, 300 ns
P
Conversions — INT Low SH/TH = V to RD Low
AC Performance Write-Read Mode (Pin 5 = 5V), Figures 5 and 6
t
, CS to RD, WR Setup Time 4 0 ns
CSS
t
, CS to RD, WR Hold Time 4 0 ns
CSH
tWR, WR Pulse Width 4 SH/TH = V
t
, Read Time — WR 4tRD < t
RD
High to RD Low Delay tRI, RD to INT Delay 4, 9 tRD < t t
, Data Access Time 4 tRD < t
ACC1
RD Low to Data Valid t
WR Falling Edge to INT Low
, Conversion Time 4, 8, 9 tRD < t
CWR-RD
MIN
to T
, VCC = +V
MAX
= 5V ± 5%, and –V
REF
= GND, and timing measured at 1.4V,
REF
ML2264XCX
TYP
CC
–10 t
CRD
+30 ns
CRD
+20 ns
CRD
Track & Hold Mode, 240 ns SH/TH = GND
CC
190 50K ns
5 SH/TH = GND 320 50K ns
275 ns
0 235 ns 0 240 ns
700 ns
5, 8, 9 t
RD
INTL
INTL
INTL
, SH/TH = V
INTL
< t
, SH/TH = GND 830 ns
INTL
CC
5
ML2264
ELECTRICAL CHARACTERISTICS (Continued)
Unless otherwise specified, TA = T CL = 100pF. (Note 1)
PARAMETER NOTES CONDITIONS MIN (NOTE 3) MAX UNITS AC Performance Write-Read Mode (Pin 5 = 5V) Figures 5 and 6 (Continued)
t
, Internal Comparison 4, 9 tRD > t
INTL
Time — WR Rising Edge to INT Low
, Data Access Time 4 tRD > t
t
ACC2
RD to Data Valid
, Data Hold Time — 5, 9 Figure 3 0 50 ns
t
DH
RD Rising Edge to Data High Impedance State
t
, RD to INT Delay 4, 9 0 65 ns
INTH
t
, Delay Time Between 4, 9 Sample & Hold Mode, 300 ns
P
Conversions — INT Low SH/TH = V to WR Low
t
, WR to INT Delay 4, 9 Standalone Mode 0 90 ns
IHWR
tID, INTØ to Data Valid Delay 4, 9 Standalone Mode 0 20 ns
MIN
to T
, VCC = +V
MAX
= 5V ± 5%, and –V
REF
= GND, and timing measured at 1.4V,
REF
ML2264XCX
TYP
INTL
INTL
CC
050ns
Track & Hold Mode, 240 ns SH/TH = GND
620 ns
Note 1: Limits are guaranteed by 100% testing, sampling, or correlation with worst-case test conditions. Note 2: When the voltage at any pin exceeds the power supply rails (V Note 3: Typicals are parametric norm at 25°C. Note 4: Parameter guaranteed and 100% production tested. Note 5: Parameter guaranteed. Parameters not 100% tested are not in outgoing quality level calculation. Note 6: Total unadjusted error includes offset, full scale, linearity, sample and hold, and multiplexer errors. Total unadjusted error is tested at the minimum specified times
for WR, RD, t (cycle time of 1000ns).
Note 7: For –V
diode drop below ground or one diode drop greater than the V cause this input diode to conduct — especially at elevated temperatures, and cause errors for analog inputs near full scale. The spec allows 100mV forward bias of either diode. This means that as long as the analog V an absolute 0V
loading. Note 8: Conversion time, write-read mode = t Note 9: Defined from the time an output crosses 0.8V or 2.4V.
, and tP. For example, for the ML2264XCX in the sample and hold mode, WR/RD mode: tWR = 190ns, tRD = 275ns with a frequency of 1.000MHz
R1
• VIN the digital output code will be 0000 0000. Two on-chip diodes are tied to the analog input which will forward conduct for analog input voltages one
REF
to 5VDC input voltage range will therefore require a minimum supply voltage of 4.900VDC over temperature variations, initial tolerance and
DC
+ tRD + tRI.
WR
IN
< GND or VIN > VCC) the absolute value of current at that pin should be limited to 25mA or less.
IN
supply. Be careful, during testing at low VCC levels (4.5V), as high level analog inputs (5V) can
CC
or V
does not exceed the supply voltage by more than 100mV, the output code will be correct. To achieve
REF
6
ML2264
A0, A1
RD
ADDR VALID
t
AH
t
AS
A0, A1
WR
t
AS
a) RD Mode (Pin 5 = GND)
ADDR VALID
t
AH
b) WR-RD Mode (Pin 5 = VCC)
Figure 1. Analog Multiplexer Address Timing for Track & Hold Mode (Pin 23 = GND)
CS
t
A0, A1
AS
ADDR VALID
t
AH
Figure 2. Analog Multiplexer Address Timing for Sample & Hold Mode (Pin 23 = VCC)
t
DATA
OUTPUT
DATA
OUTPUT
10pF
10pF
V
GND
V
OH
GND
V
GND
V
V
CC
CC
CC
OL
OUTPUT
5k
V
CC
5k
ENABLE
OUTPUT
OUTPUT
ENABLE
OUTPUT
50%
10%
50%
10%
f
90%
t
1H
VOH – 100mV
t
f
90%
t
0H
VOL + 100mV
Figure 3. High Impedance Test Circuits and Waveforms
7
ML2264
CS
t
t
t
RDD
t
CRD
t
ACC0
RDPW
RD
RDY
INT
DB0–DB7
*In SAMPLE & HOLD mode a pull up resistor on RDY should not be used unless CSØ is • 20ns before RDØ.
t
RDY
t
CSS
CSH
t
P
WITH EXTERNAL PULL-UP
t
INTH
VALID
DATA
t
DH
Figure 4. RD Mode Timing
CS
CS
t
t
ACC1
CSH
t
RD
t
P
t
RI
VALID
DATA
t
WR
t
RD
INT
DB0–DB7
CSS
t
WR
Figure 6. WR-RD Mode Timing (tRD < t
DH
t
INTH
INTL
)
WR
RD
INT
DB0–DB7
t
WR
t
CSS
t
CSH
t
INTL
t
P
t
RD
VALID
DATA
t
ACC2
Figure 5. WR-RD Mode Timing (tRD > t
INTL
t
INTL
t
WR
t
INTH
t
DH
INT
DB0–DB7
WR
t
IHWR
t
P
t
ID
VALID
DATA
Figure 7. WR-RD Mode Stand-Alone Timing CS = RD = 0
)
8
ML2264
1.0 FUNCTIONAL DESCRIPTION
The ML2264 uses a two stage flash technique for A/D conversion. This technique first performs a 4 bit flash conversion on VIN to determine the 4 MSB’s. These 4 MSB’s are then cycled through an internal DAC to recreate the analog input. This reconstructed analog input signal from the DAC is then subtracted from the input, and the difference voltage is converted by a second 4 bit flash conversion, providing the 4 LSB’s of the output data word.
1.1 MULTIPLEXER ADDRESSING The ML2264 contains a 4-channel single ended analog
multiplexer. A particular input channel is selected by using the address inputs A0 and A1. The relationship between the address inputs, A0 and A1, and the analog input selected is shown in Table 1.
Selected
Analog Channel A0 A1
A IN 1 0 0 A IN 2 1 0 A IN 3 0 1 A IN 4 1 1
Table 1. Multiplexer Address Decoding
The address inputs are latched into the ML2264 on the falling edge of the RD, WR, or CS depending on the state of pins SH/TH and mode as shown in Table 2.
Address Latching
Signal Mode Operation Mode
RDØ GND GND
WRØ V
CSØ GND V CSØ V
In the Sample & Hold mode of operation CS is used as the address latch enable, allowing for continuous conversions without addressing a given analog input for each conversion.
The Track & Hold mode of operation requires an analog input to be addressed and latched for each conversion that the ML2264 performs.
1.2 ANALOG INPUTS The analog input on the ML2264 behaves differently than
inputs on conventional converters. The analog input current requirements change while the conversion is in progress, and the amount of input current depends on what cycle the converter is in.
Address Input
CC
CC
Table 2.
GND
CC
V
CC
The equivalent input circuit for the converter is shown in Figure 8. When the conversion starts in the T/H mode (WRØ in the WR-RD mode or RDØ in the RD mode) S1, S4 and S6 close and S3 opens. This period is known as the acquisition period where the MSB flash converter tracks the input signal and the LSB flash converter samples it. During this period, VIN is connected to the 16 MSB and 15 LSB comparators. Thus 38pF of input capacitance must be charged up through the combined RON resistance of the internal analog switches plus any external source resistance, RS. In addition, there is a stray capacitance of approximately 11pF that needs to be charged through the external source resistance RS. This period ends in the WR­RD mode when WR or by an internal timer in the RD mode. At this point S1 and S4 open and the analog input at VIN is no longer being sampled; thus during this time the analog voltage on VIN does not affect converter performance.
As shown above, the critical period for charging up the analog input occurs when the MSB and LSB comparators are sampling the input, known as the acquisition period. The source of the external signal on VIN must adequately charge up the analog voltage during the acquisition period. To do this, the input must settle within the required analog accuracy tolerance at least 50ns before the end of the acquisition period so that the MSB comparators have adequate time to make the correct decision. If more time is needed due to finite charging or settling time of the external source, the WR low period can be extended in WR-RD mode. In RD mode, since the acquisition time is fixed by internal delays, the burden is on the external source to charge up and settle the input adequately.
When the ML2264 operates in the S/H mode (pin 23 = VCC) both the MSB and the LSB flash converter perform a true sample and hold operation during the acquisition or sampling period. This period starts after the falling edge of INT and ends with the falling edge of WR in the WR-RD mode or the falling edge of RD in the RD mode. The duration of this period is user controlled and must satisfy a minimum of tP.
During this period S1, S3, S4 and S6 close, therefore 46pF of input capacitance must be charged up in addition to the 11pF of stray capacitance.
1.3 TRACK AND HOLD vs. SAMPLE AND HOLD The MSB Flash Converter of the ML2264 in T/H mode has
a track and hold mechanism for sampling the input. The input is attached to the MSB comparators directly in the MSB compare cycle, or acquisition period. When the MSB compare cycle ends, the state of the MSB comparators is latched. The LSB Flash Converter always performs a S/H operation. Thus, the analog input signal can be changing during the MSB compare cycle, or acquisition period, and
9
ML2264
the MSB comparators will be tracking it as long as the slew rate of the analog input is slow enough so that the MSB comparators can respond. The ML2264 can track and hold signals with slew rates as high as 0.25V/µs (16kHz @ 5 volts) without sacrificing conversion accuracy.
The ML2264 in S/H mode does not have the slew rate limitation of the T/H mode since an internal sample and hold acquires the analog signal, holds it internally, and then performs a conversion. Since this is a true sample and hold function, the S/H mode can theoretically digitize signals of frequencies much higher than the T/H mode. The ML2264 in S/H mode can digitize signals of frequencies as high as 250kHz @ 5V (slew rates as high as 4V/µs) without sacrificing conversion accuracy. In most applications, the S/H mode is more desirable than T/H mode because of the better dynamic performance.
11pF
R
S
V
IN
R
ON
4K
TO MS
LADDER
16 MSB COMPARATORS
R
ON
6.4K
TO LS
LADDER
S1
S2
S4
S5
15 LSB COMPARATORS
1pF
1.34pF
0.65pF
1pF
1pF
1.2K R
ON
S3
3.6K R
ON
S6
1.3.1 Converter — T/H Mode The operating sequence for the WR-RD mode is illustrated
in Figure 9a. Initially, the internal comparators are auto­zeroed while WR is high. A conversion is initiated by the falling edge of WR. While WR is low, the MSB comparators are tracking the analog input and comparing this voltage against voltages from the internal resistor ladder. At the same time, the input is being acquired or sampled by LSB comparators. On the rising edge of WR, the MSB comparator results are latched, and the LSB acquisition time is ended by closing the sampling switch to the LSB comparators. While WR is high, the LSB comparators then compare the residual input voltage against internal voltages from the resistor ladder to determine the 4 LSB’s. When the LSB comparison or conversion is complete, INT goes low and latches the conversion result into the output latches. Then, the comparators are auto-zeroed while WR is high before another conversion can start.
The operating sequence for RD mode, is similar to that described above for the WR-RD mode, except the conversion is initiated by the falling edge of RD, and the MSB and LSB conversions are generated by internal clock edges that are generated while RD is low.
Figure 8. Converter Equivalent Input Circuit
1.3.2 Converter — S/H Mode The operating sequence for S/H mode is illustrated in
Figure 9b. Notice that it is similar to T/H mode described above except this mode has a true sample and hold function. The falling edge of INT closes the sampling switch and starts the acquisition period where the analog input is sampled at the same time all comparators are auto-zeroed. The falling edge of WR opens the internal sampling switch, ends the acquisition period, and starts the conversion on the internally sample and held signal. The MSB comparators make their decisions while WR is low. On the rising edge of WR, the MSB comparator results are latched. The LSB comparators make their decision when WR is high. When the LSB comparison or conversion is complete, INT goes low and latches the conversion result into the output buffers. Then, the acquisition period begins again and the converter is ready for the next conversion.
The operating sequence for the RD mode is the same as the WR-RD mode, except the conversion is initiated by the falling edge of RD, and the MSB and LSB conversions are generated by internal clock edges that are generated while RD is low.
10
(a) S/H Mode
FULL SCALE TRANSITION
OUTPUT
CODE
11111111
11111110
11111101
00000011
00000010
00000001 00000000
0
1LSB
2LSB’S
3LSB’S
FS FS – 1LSB
AIN, INPUT VOLTAGE (IN TERMS OF LSB’S)
ML2264
WR
(a) T/H Mode
WR
ACQUISITION OR SAMPLING PERIOD. ALL COMPARATORS AUTOZEROED.
CONVERSION STARTS. V
IN
ENDS. HOLD TIME STARTS.
ALL COMPARATORS AUTOZEROED.
CONVERSION STARTS.
MSB COMPARATORS DECIDING.
SAMPLING
ACQUISITION PERIOD. MSB COMPARATORS ARE TRACKING V
IN
COMPARATORS ARE SAMPLING V
IN
. LSB
.
LSB COMPARATORS DECIDING.
MSB COMPARATOR RESULTS ARE LATCHED.
LSB COMPARATORS DECIDING.
VIN SAMPLING ENDS. MSB COMPARATOR RESULTS ARE LATCHED.
RD BROUGHT LOW LATCHES LSB COMPARATOR RESULTS AND BRINGS INT LOW.
RD BROUGHT LOW LATCHES LSB COMPARATOR RESULTS AND BRINGS INT LOW.
Figure 9. Operating Sequence (WR-RD Mode)
1.4 REFERENCE The +V
REF
and –V
inputs are the reference voltages that
REF
determine the full scale and zero input voltages, respectively, for the A/D converter. Thus, +V
defines
REF
the analog input which produces a full scale output and –V
defines the analog input which produces an output
REF
code of all zeroes. The transfer function for the A/D converter is shown in Figure 10.
+V
and –V
REF
and VCC. This means that the reference voltages can be offset from GND and the difference between +V –V
– can be made small to increase the resolution of the
REF
can be set to any voltage between GND
REF
REF
conversion. Note that the total unadjusted error increases when [+V
REF
– (–V
)] decreases.
REF
1.5 POWER SUPPLY AND REFERENCE DECOUPLING A 0.1µF ceramic disc capacitor is recommended to bypass
VCC to GND, using as short a lead length as possible. If REF+ and REF– inputs are driven by long lines, they
should be bypassed by 0.1µF ceramic disc capacitors at the reference input pins.
+ and
Figure 10. A/D Transfer Characteristic
11
ML2264
1.6 DYNAMIC PERFORMANCE
1.6.1 Sinusoidal Inputs Since the ML2264 has an internal sample and hold, the
device can digitize high frequency sinusoids with little or no signal degradations. Using the Nyquist criteria, the highest frequency input to the converter could theoretically be 1/2 the sampling rate (fS). Any frequency components above fS/2 will be aliased below fS/2. In most applications, these aliased components cause unacceptable distortion and must be filtered out of the input. If the input frequency is too close to fS/2, then the requirements on the anti-alias filter become difficult to impossible to realize with standard component and tolerances. In most practical applications, the highest input frequency has to be limited to 1/3 to 1/4 of f
MAX
in order to relax the filtering requirements enough to make a realizable anti-alias filter.
The maximum sampling rate (f WR-RD mode, (tRD < t
f
=
max
tttt
WR RD RI P
f
=
max
190 275 235 300
f
= 1.000 MHz
max
1
+++
ns ns ns ns
+++
) can be calculated as follows:
INTL
1
) for the ML2264 in the
max
tWR = Write Pulse Width tRD = Delay Time between WR and RD Pulses tRI = RD to INT Delay
In applications where aliased frequency components are acceptable and filtering of the input signal is not needed, or where a filter with a steep amplitude response is available, the user can apply an input sinusoid higher than 250kHz to the device. Note, however, that as the input frequency increases above 500kHz, dynamic performance degradation will occur due to the finite bandwidth of the internal sample and hold.
The Figure 11 plots are 4096 point FFT’s of the ML2264 converting a 257kHz and a 491kHz, 0 to 4.5V, low distortion sine wave input. The ML2264 samples and digitizes at its specified accuracy, dynamic input signals with frequency components up to the Nyquist frequency (one-half the sampling rate). The output spectra yields precise measure-ments of the input signal level, harmonic components, and signal to noise ratio up to the 8-bit level. The near ideal signal to noise ratio is maintained independent of increasing analog input frequencies to 500kHz.
1.6.2 Signal-To-Noise Ratio Signal-to-noise ratio (SNR) is the measured signal to noise
at the output of the converter. The signal is the rms magnitude of the fundamental. Noise is the rms sum of all the nonfundamental signals up to half the sampling frequency. SNR is dependent on the number of quantization levels used in the digitization process; the more the levels, the smaller the quantization noise. The theoretical SNR for a sine wave is given by
SNR = (6.02N + 1.76) dB
where N is the number of bits. Thus for ideal 8-bit converter, SNR = 49.92 dB.
tP = Delay Time between Conversions This permits a maximum sampling rate of 1MHz for the
ML2264. The dynamic performance specifications (SNR, HD, IMD, and FR) for the ML2264 are all specified at
1.6.3 HARMONIC DISTORTION Harmonic distortion is the ratio of the rms sum of
harmonics to the fundamental. Total harmonic distortion (THD) of the ML2264 is defined as
250kHz, which is approximately 1/4 of the sampling rate, fS.
0
–10
SNR 48.4dB HD –62.87dB
–20
V
= V
CC
T
–30
–40
–50
–60
–70
–80
MAGNITUDE (dB)
–90
–100
–110
–120
= 25 C
A
REF
= 5.0V
4002000
FREQUENCY (kHz)
0
–10
SNR 49.1dB HD –58.33dB
–20
V
= V
CC
T
–30
–40
–50
–60
–70
–80
MAGNITUDE (dB)
–90
–100
–110
–120
= 25 C
A
REF
= 5.0V
4002000
FREQUENCY (kHz)
a) Output Spectrum with fIN = 257kHz, fS = 1MHz b) Output Spectrum with fIN = 491kHz, fS = 1MHz
12
Figure 11. Dynamic Performance, Sample and Hold Mode
ML2264
2
()VVVV
+++
2
20
log
3
2
V
1
425
2
12
where V1 is the rms amplitude of the fundamental and V2, V3, V4, V5 are the rms amplitudes of the individual harmonics.
1.6.2 Signal-To-Noise Ratio Signal-to-noise ratio (SNR) is the measured signal to noise
at the output of the converter. The signal is the rms magnitude of the fundamental. Noise is the rms sum of all the nonfundamental signals up to half the sampling frequency. SNR is dependent on the number of quantization levels used in the digitization process; the more the levels, the smaller the quantization noise. The theoretical SNR for a sine wave is given by
SNR = (6.02N + 1.76) dB where N is the number of bits. Thus for ideal 8-bit
converter, SNR = 49.92 dB.
1.6.3 HARMONIC DISTORTION Harmonic distortion is the ratio of the rms sum of
harmonics to the fundamental. Total harmonic distortion (THD) of the ML2264 is defined as
on the falling edge of RD. While RD is low, the MSB and LSB decisions are made with internally generated clock edges. When the conversion is complete, RDY goes high and INT goes low signaling the end of the conversion. After INT goes low, the data outputs go from high impedance to active state with valid output data. Data stays valid until either RD or CS goes high. When either signal goes high, the output data lines return to the high impedance state and INT returns high.
1.7.2 WR-RD Mode In the WR-RD mode, the WR/RDY pin is configured as the
WR input. In this mode, WR initiates the conversion and RD controls reading the output data. This can be done in
several ways, described below.
1.7.3 WR-RD Mode — Using Internal Delay (tRD > t
INTL
)
The timing is shown in Figure 5. To do a conversion, CS must be low to select the device. Then, WR falling edge triggers the conversion. While WR is low, the MSB comparison is made. When WR returns high the LSB decision is made. After some internal delay, INT goes low indicating end of conversion. Valid data will appear on DB0–7 when RD is pulled low. INT is then reset by the rising edge of either CS or RD.
2
()VVVV
+++
2
20
log
3
2
V
1
425
2
12
where V1 is the rms amplitude of the fundamental and V2, V3, V4, V5 are the rms amplitudes of the individual harmonics.
1.6.4 Intermodulation Distortion With inputs consisting of sine waves at two frequencies,
fA and fB, any active device with nonlinearities will create distortion products, of order (m + n), at sum and difference frequencies of mfA + nfB, where m, n = 0, 1, 2, 3 … Intermodulation terms are those for which m or n is not equal to zero. The (IMD) intermodulation distortion specification includes the second order terms (fA + fB) and fA – fB) and the third order terms (2fA + fB), (2fA – fB), (fA + 2fB), and (fA – 2fB) only.
1.7 DIGITAL INTERFACE The ML2264 has two basic interface modes, RD and WR-
RD, which are selected by the MODE input pin.
1.7.1 RD Mode In the RD mode, WR/RDY pin is configured as the RDY
output. The read mode performs a conversion with a single RD pulse. This allows the µP to start a conversion, wait, and then read data with a single read instruction.
The timing for the RD mode is shown in Figure 4. To do a conversion, CS must be low to select the device. After CS goes low, the RDY output goes low indicating that the device is ready to do a conversion. The conversion starts
1.7.4 WR-RD Mode — Reading Before Delay (tRD < t
INTL
)
The internally generated delay for the LSB decision when tRD > t tolerances of t
is longer than necessary due to circuit design
INTL
delay. If desired, a faster conversion
INTL
will result without loss of accuracy by bringing RD low within the minimum time specified for tRD. The timing diagram for this mode is shown in Figure 6. WR is the same as when tRD > t
. But in this case, RD is brought
INTL
low tRD ns after WR rising edge and before INT. INT goes low indicating an end of conversion after the falling edge of RD and is reset on the rising edge of RD or CS. When RD is brought low before INT goes low the data bus always remains in the high-impedance state until INTØ.
1.7.5 WR-RD Mode — Stand Alone Operation Stand alone operation can be implemented by tying CS
and RD low as shown in Figure 7. WR initiates a conversion as before. When WR is low, the MSB comparison is made. When, WR goes high, the LSB comparison is made. Since RD is already low, the output data will appear automatically at end of conversion. Since RD is always low, INT is reset on rising edge of WR and goes low at end of conversion.
1.7.6 Power-On Reset When power is first applied, an internal power-on reset
and timer circuit inhibits the CS input and resets the internal circuitry to prevent the ML2264 from starting in an unknown state. During this period of approximately 3µs, INT remains high and the data bus is in the high­impedance state.
13
ML2264
2.0 TYPICAL APPLICATIONS
5V
+15V
DC
*
+
–15V
*NO PROTECTION REQUIRED IF INPUT CURRENT <25mA
*
DC
A
IN
ML2264
V
CC
+
0.1µF
Figure 12. Protecting the Input
ML2264
V
CC
A
0 VIN V
CC
IN
+V
REF
–V
REF
GND
+
0.1µF
Figure 13. Using VCC as Reference for
Ratiometric Operation
5V
68008
ML2264
CS A0 A1
INT
RD
DB7 DB0
DATA
ADDRESS
DECODE
AS
DTACK
R/W
DB7 DB0
Figure 15. 68000 Type Interface to ML2264
5V
50K
V
IN
25K
+
ML2264
A IN 1 A IN 2 A IN 3 A IN 4
0 VIN 4.5
+
0.1µF
4.50V
µP
V
REFOUT
ML2340
D/A
WITH
REFERENCE
+V
ML2264
REF
Figure 14. Using External Reference of D/A
Figure 16. ±2.5V Analog Input Range
12V
V
CC
A IN 1
V
OUT
A IN 2 A IN 3 A IN 4
ML2264 8051
CS A0 A1
WR
RD
INT
DB7 DB0
DATA
P3, 1 P3, 2 P3, 3 P3, 4 P3, 5 P3, 6
P1, 7 P1, 0
Figure 17. 8051 Interface to ML2264
14
2.0 TYPICAL APPLICATIONS (Continued)
ML2264
A IN 1 A IN 2 A IN 3 A IN 4
DB7 DB0
ML2264
INT
RD
A0 A1
WR
CS
CLOCK
SOURCE
OR
TIMER
V
OUT
DATA
ADDRESS
DECODE
DB7 DB0
ML2341
D/A
CS
WR
Figure 18. TMS320 Interface with D/A Output
V
CC
DB7 DB0
INT DEN
HEN
TMS320
/E14 C15
PA0 PA1 PA2 WE
(5VDC)
ANALOG
SOURCES
20k
1k
3k
4k
1k
24k
ZERO ADJ
FS ADJ
+V
CC
CC
+
0.1µF
+
0.1µF
A IN 1 A IN 2 A IN 3 A IN 4
–V
+
0.85V
+
0.15V
REF
ML2264
REF
V
CC
+
0.1µF
Figure 19. Operating with a Ratiometric Analog Signal of 15% of VCC to 85% of V
CC
15
ML2264
PHYSICAL DIMENSIONS inches (millimeters)
Package: P24N
24-Pin Narrow PDIP
1.240 - 1.260
(31.49 - 32.01)
24
0.070 MIN (1.77 MIN) (4 PLACES)
0.170 MAX (4.32 MAX)
0.125 MIN
(3.18 MIN)
24
PIN 1 ID
1
0.600 - 0.614
(15.24 - 15.60)
0.050 - 0.065 (1.27 - 1.65)
0.016 - 0.022 (0.40 - 0.56)
0.100 BSC (2.54 BSC)
Package: S24
24-Pin SOIC
0.240 - 0.270 (6.09 - 6.86)
SEATING PLANE
0.015 MIN (0.38 MIN)
0.295 - 0.325 (7.49 - 8.26)
0º - 15º
0.008 - 0.012 (0.20 - 0.31)
16
0.024 - 0.034 (0.61 - 0.86)
(4 PLACES)
0.090 - 0.094 (2.28 - 2.39)
0.291 - 0.301 (7.39 - 7.65)
PIN 1 ID
1
0.050 BSC (1.27 BSC)
0.012 - 0.020 (0.30 - 0.51)
0.095 - 0.107 (2.41 - 2.72)
SEATING PLANE
0.398 - 0.412
(10.11 - 10.47)
0.005 - 0.013 (0.13 - 0.33)
0º - 8º
0.022 - 0.042 (0.56 - 1.07)
0.009 - 0.013 (0.22 - 0.33)
PHYSICAL DIMENSIONS inches (millimeters) (Continued)
Package: R24
24-Pin SSOP
0.318 - 0.328 (8.08 - 8.33)
24
ML2264
0.066 - 0.070 (1.68 - 1.78)
1
PIN 1 ID
0.026 BSC (0.65 BSC)
0.009 - 0.015 (0.23 - 0.38)
0.205 - 0.213 (5.20 - 5.40)
0.068 - 0.078 (1.73 - 1.98)
SEATING PLANE
0.301 - 0.313 (7.65 - 7.95)
0.002 - 0.008 (0.05 - 0.20)
0º - 8º
0.022 - 0.038 (0.55 - 0.95)
0.004 - 0.008 (0.10 - 0.20)
ORDERING INFORMATION
TOTAL TEMPERATURE
PART NUMBER UNADJUSTED ERROR RANGE PACKAGE
ML2264CCP (Obsolete) 0°C to +70°C Molded DIP (P24)
ML2264CCS (End Of Life) ±1 LSB 0°C to +70°C Molded SOIC (S24)
ML2264CCR (Obsolete) 0°C to +70°C Molded SSOP (R24)
© Micro Linear 1997 is a registered trademark of Micro Linear Corporation Products described in this document may be covered by one or more of the following patents, U.S.: 4,897,611; 4,964,026; 5,027,116; 5,281,862; 5,283,483; 5,418,502; 5,508,570; 5,510,727; 5,523,940; 5,546,017; 5,559,470; 5,565,761; 5,592,128; 5,594,376; Japan: 2598946; 2619299. Other patents are pending.
Micro Linear reserves the right to make changes to any product herein to improve reliability, function or design. Micro Linear does not assume any liability arising out of the application or use of any product described herein, neither does it convey any license under its patent right nor the rights of others. The circuits contained in this data sheet are offered as possible applications only. Micro Linear makes no warranties or representations as to whether the illustrated circuits infringe any intellectual property rights of others, and will accept no responsibility or liability for use of any application herein. The customer is urged to consult with appropriate legal counsel before deciding on a particular application.
2092 Concourse Drive
San Jose, CA 95131
Tel: 408/433-5200
Fax: 408/432-0295
DS2264-01
17
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