Maxim MAX1125BIDO, MAX1125BIBH, MAX1125AIDO, MAX1125AIBH Datasheet

19-1100; Rev 0; 6/96

EVALUATION KIT

AVAILABLE

8-Bit, 300Msps Flash ADC

_______________General Description

The MAX1125 is a monolithic, flash analog-to-digital converter (ADC) capable of digitizing a 2V analog input signal into 8-bit digital words at a typical 300Msps update rate.

For most applications, no external sample-and-hold is required for accurate conversion due to the device's narrow aperture time, wide bandwidth, and low input capacitance. A single standard -5.2V power supply is required to operate the MAX1125, with nominal 2.2W power dissipation. A special decoding scheme reduces metastable errors to 1LSB.

The part is packaged in a 42-pin ceramic sidebraze that is pin compatible with the CX20116 and CX41396D. The surface-mount 44-pin CERQUAD package allows access to additional reference ladder taps, an overrange bit, and a data-ready output. The pincompatible 150Msps MAX1114 is also available.

________________________Applications

Digital Oscilloscopes Transient Capture Radar, EW, ECM Direct RF Down-Conversion Medical Electronics

Ultrasound, CAT Instrumentation

_________________Pin Configurations

TOP VIEW

DGND AGND

MINV

CLK CLK

AGND AGND

VRBS VRBF

D7D6D5D4D3D2D1

D8 (MSB)

1 2 3 4

5 6 7 8 9

10 11

MAX1125

VIN

VR1

AGND

CERQUAD



D0 (LSB)

DREADY

VR2

AGND

DGND

AGND

LINV

N.C.

DRINV

N.C. V



AGND

VRTS

VRTF

VIN

VR3

AGND

____________________________Features

♦ Metastable Errors Reduced to 1LSB ♦ 10pF Input Capacitance ♦ 210MHz Input Bandwidth ♦ 300Msps Conversion Rate ♦ 2.2W Typical Power Dissipation ♦ Single -5.2V Supply

______________Ordering Information

PART

MAX1125AIDO MAX1125BIDO MAX1125AIBH -20°C to +85°C MAX1125BIBH -20°C to +85°C 44 CERQUAD ±1

Functional Diagram appears at end of data sheet.

TEMP. RANGE PIN-PACKAGE

-20°C to +85°C

42 Ceramic SB 42 Ceramic SB 44 CERQUAD

INL (LSBs)

±0.75

±1

±0.75

____Pin Configurations (continued)

TOP VIEW

N.C.

42

VRTF

41

N.C.

40



39



38

N.C.

37

N.C.

36

AGND

35

VIN

34

AGND

33

VR2

32

AGND

31

VIN

30

AGND

29

N.C.

28

N.C.

27



26



25

N.C.

24

VRBF

23

N.C.

N.C.

LINV

AGND DGND

DO (LSB)

D7 (MSB)

DGND AGND

MINV

N.C. CLK CLK



1

2 3



4

5 6 7 8

D1

9

D2

10

D3

11

D4

12

D5

13

D6

14 15 16 17



18 19 20 21

MAX1125

Ceramic SB

MAX1125

________________________________________________________________

Maxim Integrated Products

For free samples & the latest literature: http://www.maxim-ic.com, or phone 1-800-998-8800

8-Bit, 300Msps Flash ADC

ABSOLUTE MAXIMUM RATINGS

Negative Supply Voltage (VEETO GND) ..............-7.0V to +0.5V

Ground Voltage Differential...................................-0.5V to +0.5V

Analog Input Voltage...............................................V

Reference Input Voltage..........................................V

Digital Input Voltage ................................................V

Reference Current V

Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to

MAX1125

absolute maximum rating conditions for extended periods may affect device reliability.

RTF

to V

........................................25mA

RBF

to +0.5V

ELECTRICAL CHARACTERISTICS

(VEE= -5.2V, R unless otherwise noted.)

DC ACCURACY

ANALOG INPUT

REFERENCE INPUT

TIMING CHARACTERISTICS

CLK-to-Data Ready Delay

= 50Ω, VRBF = -2.00V, VR2 = -1.00V, VRTF = 0.00V, f

SOURCE

CONDITIONSPARAMETER

RT RB

(tD)

TEST

LEVEL

Digital Output Current ...........................................0mA to -30mA

Operating Temperature Range ...........................-25°C to +85°C

Junction Temperature......................................................+150°C

Storage Temperature Range.............................-65°C to +150°C

Lead Temperature (soldering, 10sec).............................+300°C

= 150MHz, 50% Duty Cycle, TA= T

CLK

MAX1125A

MIN TYP MAX

VI VI

GuaranteedNo Missing Codes

IV IV VI

V V

V V V

V V V V V

MAX1125B

MIN TYP MAX

-0.95 ±0.80 +0.95

-0.95 +0.95 Guaranteed

-30 +30

-2.0 0.0 10 15

250 500

1,000

210 335

100 200 300

250 300

2.4 2

2.0 5

1.5

MIN

to T

MAX

UNITS

LSB-0.75 ±0.60 +0.75Integral Linearity LSB-0.75 +0.75Differential Linearity

mV-30 +30Offset Error V mV-30 +30Offset Error V

V-2.0 0.0Input Voltage Range pF10Over full input rangeInput Capacitance kΩ15Input Resistance

µA250 500Input Current V/µs1,000Input Slew Rate MHz210VIN = full scaleLarge Signal Bandwidth MHz335IN = 500mVp-pSmall Signal Bandwidth

Ω100 200 300Ladder Resistance

MHz10Reference Bandwidth

Msps250 300Maximum Sample Rate

ns2.4Clock to Data Delay

ps/°C2Output Delay TEMPCO

ns2.0

ps5Aperture Jitter

ns1.5Acquisition Time

2 _______________________________________________________________________________________

8-Bit, 300Msps Flash ADC

ELECTRICAL CHARACTERISTICS (continued)

(VEE= -5.2V, R unless otherwise noted.)

DYNAMIC PERFORMANCE

Signal-to-Noise Ratio

Total Harmonic Distortion

Signal-to-Noise and Distortion (SINAD)

DIGITAL INPUTS

Digital Input High Voltage

(MINV, LINV)

Digital Input Low Voltage

(MINV, LINV)

Clock Synchronous Input Currents

DIGITAL OUTPUTS

POWER-SUPPLY REQUIREMENTS

TEST LEVEL CODES

All electrical characteristics are subject to the following conditions:

All parameters having min/max specifications are guaranteed. The Test Level column indicates the specific device testing actually performed during production and Quality Assurance inspection. Any blank section in the data column indicates that the specification is not tested at the specified condition.

Unless otherwise noted, all tests are pulsed; therefore, Tj= TC= TA.

= 50Ω, VRBF = -2.00V, VR2 = -1.00V, VRTF = 0.00V, f

SOURCE

CONDITIONSPARAMETER

FIN= 100MHz

PWL

PWH

TEST

LEVEL

TEST LEVEL

III IV

VI VI VI VI VI VI

VI VI

I I

TEST PROCEDURE

100% production tested at the specified temperature. 100% production tested at T

specified temperatures. QA sample tested only at the specified temperatures. Parameter is guaranteed (but not tested) by design and

characterization data. Parameter is a typical value for information purposes only. 100% production tested at T

over specified temperature range.

= 150MHz, 50% Duty Cycle, TA= T

CLK

MAX1114A

MIN TYP MAX

45 47FIN= 3.58MHz 39 42

-48 -52FIN= 3.58MHz

-40 -43FIN= 100MHz 44 46FIN= 3.58MHz 37 39FIN= 100MHz

to T

MIN

MAX1114B

MIN TYP MAX

44 46 38 41

-46 -50

-39 -42 42 44 35 37

-1.1 -0.7

-2.0 -1.5

2 1.8 2 1.8

-1.1

-1.5

2.4

425 550

2.2 2.9

= +25°C, and sample tested at the

= +25°C. Parameter is guaranteed

MAX

UNITS

V-1.1 -0.7

V-2.0 -1.5

µA40

ns2 1.8Clock Low Width, T ns2 1.8Clock High Width, T

V-1.150Ωto -2VDigital Output High Voltage V-1.550Ω to -2VDigital Output Low Voltage

ns2.4

mA425 550TA= +25 °CSupply Current

W2.2 2.9TA= +25 °CPower Dissipation

MAX1125

_______________________________________________________________________________________

8-Bit, 300Msps Flash ADC

__________________________________________Typical Operating Characteristics



MAX1125

fs = 250Msps

50 48 46 44

SNR (dB)

40 38



36 34

1 10 100

SIGNAL-TO-NOISE AND DISTORTION

50 48



46 44 42

SINAD (dB)



36 34

1 10 100

SIGNAL-TO-NOISE RATIO

vs. INPUT FREQUENCY

INPUT FREQUENCY (MHz)

vs. INPUT FREQUENCY

= 250Msps



INPUT FREQUENCY (MHz)

TOTAL HARMONIC DISTORTION

vs. INPUT FREQUENCY

fs = 250Msps

MAX1125 -01



70 65 60 55 50

THD (dB)

45 40



35 30

1 10 100

INPUT FREQUENCY (MHz)



MAX1125 -02

SNR, THD, SINAD

vs. TEMPERATURE

MAX1125 -03



SNR, THD, SINAD (dB)

= 250Msps

= 100MHz

SINAD

-40 -20

 80

SNR

20 40

TEMPERATURE (°C)

THD

MAX1125 -04

4 _______________________________________________________________________________________

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