Maxim MAX1114BIDO, MAX1114BIBH, MAX1114AIDO, MAX1114AIBH Datasheet

19-1101; Rev 0; 6/96
EVALUATION KIT
AVAILABLE
8-Bit, 150Msps Flash ADC
_______________General Description
The MAX1114 is a monolithic, flash analog-to-digital converter (ADC) that can digitize a 2V analog input signal into 8-bit digital words at a typical 150Msps update rate.
For most applications, no external sample-and-hold is required for accurate conversion due to the device's narrow aperture time, wide bandwidth, and low input capacitance. A single standard -5.2V power supply is required to operate the MAX1114, with nominal 2.2W power dissipation. A special decoding scheme reduces metastable errors to 1LSB.
The part is packaged in a 42-pin ceramic sidebraze that is pin-compatible with the CX20116 and CXA1396D. The surface-mount 44-pin CERQUAD allows access to additional reference ladder taps, an overrange bit, and a data-ready output. For higher con­version rates, the pin-compatible 300Msps MAX1125 is available.
________________________Applications
Digital Oscilloscopes Transient Capture Radar, EW, ECM Direct RF Down-Conversion Medical Electronics
Ultrasound, CAT Instrumentation
_________________Pin Configurations
TOP VIEW
DGND AGND
V
EE
MINV
CLK CLK
V
EE
AGND AGND
VRBS VRBF
1 2 3 4
5 6 7 8 9
10
11
D7D6D5D4D3D2D1
D8 (MSB)
44
40
41
42
43
MAX1114
15
16
13
14
12
EE
V
VIN
VR1
AGND
AGND
CERQUAD
D0 (LSB)
DREADY
DGND
35
36
37
38
39
18
17
VR2
AGND
34
33
AGND
32
V
EE
31
LINV
30
N.C.
29
DRINV
28
N.C.
27
V
EE
26
AGND
25
AGND
24
VRTS
23
VRTF
22
20
21
19
EE
V
VIN
VR3
AGND
____________________________Features
Metastable Errors Reduced to 1LSB10pF Input Capacitance 210MHz Input Bandwidth150Msps Conversion Rate2.2W Typical Power DissipationSingle -5.2V Supply
______________Ordering Information
PART
MAX1114AIDO MAX1114BIDO MAX1114AIBH -20°C to +85°C MAX1114BIBH -20°C to +85°C 44 CERQUAD
Functional Diagram appears at end of data sheet.
TEMP. RANGE PIN-PACKAGE
-20°C to +85°C
-20°C to +85°C
42 Ceramic SB 42 Ceramic SB 44 CERQUAD
INL (LSBs)
±0.75
±1
±0.75
±1
____Pin Configurations (continued)
TOP VIEW
N.C.
42
VRTF
41
N.C.
40
V
EE
39
V
EE
38
N.C.
37
N.C.
36
AGND
35
VIN
34
AGND
33
VR2
32
AGND
31
VIN
30
AGND
29
N.C.
28
N.C.
27
V
26
EE
V
25
EE
N.C.
24
VRBF
23
N.C.
22
N.C.
LINV
AGND DGND
DO (LSB)
D7 (MSB)
DGND AGND
MINV
N.C. CLK CLK
V
1
EE
2 3
V
4
EE
5 6 7 8
D1
9
D2
10
D3
11
D4
12
D5
13
D6
14 15 16 17
V
EE
18 19 20 21
MAX1114
Ceramic SB
MAX1114
________________________________________________________________
Maxim Integrated Products
1
For free samples & the latest literature: http://www.maxim-ic.com, or phone 1-800-998-8800
8-Bit, 150Msps Flash ADC
ABSOLUTE MAXIMUM RATINGS
Negative Supply Voltage (VEETO GND) ..............-7.0V to +0.5V
Ground Voltage Differential...................................-0.5V to +0.5V
Analog Input Voltage ...............................................V
Reference Input Voltage..........................................V
Digital Input Voltage.................................................V
Reference Current V
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to
MAX1114
absolute maximum rating conditions for extended periods may affect device reliability.
RTF
to V
.........................................25mA
RBF
to +0.5V
EE
to +0.5V
EE
to +0.5V
EE
ELECTRICAL CHARACTERISTICS
(VEE= -5.2V, R unless otherwise noted.)
DC ACCURACY
ANALOG INPUT
REFERENCE INPUT
TIMING CHARACTERISTICS
CLK-to-Data Ready Delay
= 50, VRBF = -2.00V, VR2 = -1.00V, VRTF = 0.00V, f
SOURCE
TEST
LEVEL
(tD)
CLK CLK
CONDITIONSPARAMETER
= 100 kHzIntegral Linearity = 100 kHzDifferential Linearity
Digital Output Current ...........................................0mA to -30mA
Operating Temperature Range ...........................-25°C to +85°C
Junction Temperature......................................................+150°C
Storage Temperature Range.............................-65°C to +150°C
Lead Temperature (soldering, 10sec).............................+300°C
= 150MHz, 50% Duty Cycle, TA= T
CLK
MAX1114A
MIN TYP MAX
VI VI
GuaranteedNo missing codes
IV IV VI
V V
VI
V V V
VI
V
VI
V V V V V
MAX1114B
MIN TYP MAX
-0.95 ±0.80 +0.95
-0.95 +0.95 Guaranteed
-30 +30
-30 +30
-2.0 0.0 10 15
250 500
1,000
210 335
100 200 300
10
125 150
2.4 2
2.0 5
1.5
MIN
to T
MAX
UNITS
LSB-0.75 ±0.60 +0.75f LSB-0.75 +0.75f
mV-30 +30Offset Error VRT mV-30 +30Offset Error VRB
V-2.0 0.0Input Voltage Range pF10Over full input rangeInput Capacitance k15Input Resistance
µA250 500Input Current V/µs1,000Input Slew Rate MHz210VIN = full scaleLarge-Signal Bandwidth MHz335IN = 500mVp-pSmall-Signal Bandwidth
100 200 300Ladder Resistance
MHz10Reference Bandwidth
Msps125 150Maximum Sample Rate
ns2.4Clock to Data Delay
ps/°C2Output Delay Tempco
ns2.0
ps5Aperture Jitter
ns1.5Acquisition Time
,
2 _______________________________________________________________________________________
8-Bit, 150Msps Flash ADC
ELECTRICAL CHARACTERISTICS (continued)
VEE= -5.2V, R unless otherwise noted.)
DYNAMIC PERFORMANCE
Signal-to-Noise Ratio
Total Harmonic Distortion
Signal-to-Noise and Distortion (SINAD)
DIGITAL INPUTS
Digital Input High Voltage
(MINV, LINV)
Digital Input Low Voltage
(MINV, LINV)
Clock Synchronous Input Currents
DIGITAL OUTPUTS
POWER SUPPLY REQUIREMENTS
TEST LEVEL CODES
All electrical characteristics are subject to the following conditions:
All parameters having min/max specifications are guaranteed. The Test Level column indicates the specific device testing actually performed during production and Quality Assurance inspection. Any blank section in the data column indicates that the specification is not tested at the specified condition.
Unless otherwise noted, all tests are pulsed; therefore, T
= TC= TA.
j
= 50, VRBF = -2.00V, VR2 = -1.00V, VRTF = 0.00V, f
SOURCE
CONDITIONSPARAMETER
fIN= 50MHz
PWL
PWH
TEST
LEVEL
TEST LEVEL
I II
III IV
V
VI
VI VI VI VI VI VI
VI
VI
V
VI VI
VI VI
V
I I
= 150MHz, 50% Duty Cycle, TA= T
CLK
MAX1114A
MIN TYP MAX
46 48fIN= 3.58MHz 42 46
-48 -52fIN= 3.58MHz
-40 -44fIN= 50MHz 45 48fIN= 3.58MHz 39 42fIN= 50MHz
TEST PROCEDURE
100% production tested at the specified temperature. 100% production tested at T
specified temperatures. QA sample tested only at the specified temperatures. Parameter is guaranteed (but not tested) by design and
characterization data. Parameter is a typical value for information purposes only. 100% production tested at T
over specified temperature range.
MAX1114B
MIN TYP MAX
45 47 40 44
-46 -50
-39 -43 43 46 37 40
-1.1 -0.7
-2.0 -1.5
40
43 43
-1.1
2.4
425 550
2.2 2.9
= +25°C, and sample tested at the
A
= +25°C. Parameter is guaranteed
A
MIN
-1.5
to T
UNITS
dB
dB
dB dB
µA40
ns43Clock Low Width, T ns43Clock High Width, T
ns2.4
mA425 550TA= +25°CSupply Current
W2.2 2.9TA= +25°CPower Dissipation
MAX1114
,
MAX
V-1.1 -0.7
V-2.0 -1.5
V-1.150to -2VDigital Output High Voltage V-1.550to -2VDigital Output Low Voltage
_______________________________________________________________________________________
3
8-Bit, 150Msps Flash ADC
__________________________________________Typical Operating Characteristics
(Circuit of Figure 1, TA= +25°C, unless otherwise noted.)
52
MAX1114
fs = 125Msps
50 48 46
44
42
SNR (dB)
40 38
36 34
1 10 100
SIGNAL-TO-NOISE AND DISTORTION
52
fs = 125Msps
50 48 46 44 42
SINAD (dB)
40 38
36 34
1 10 100
SIGNAL-TO-NOISE RATIO
vs. INPUT FREQUENCY
INPUT FREQUENCY (MHz)
vs. INPUT FREQUENCY
INPUT FREQUENCY (MHz)
MAX1114 -01
MAX1114 -03
TOTAL HARMONIC DISTORTION
vs. INPUT FREQUENCY
52
fs = 125Msps
50 48 46 44 42
THD (dB)
40 38
36 34
1 10 100
INPUT FREQUENCY (MHz)
MAX1114 -02
SNR, THD, SINAD
vs. TEMPERATURE
50
SNR
45
40
SNR, THD, SINAD (dB)
35
fs = 125Msps
= 50MHz
f
IN
30
-40 -20
80
0
TEMPERATURE (°C)
THD
SINAD
20 40
MAX1114 -04
60
4 _______________________________________________________________________________________
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