Leica EM TXP User Manual

Leica EM TXP

Target Surfacing System

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Leica EM TXP – Target Surfacing

90° rotation view

Processing observation

Front face observation

The Leica EM TXP is a unique target preparation device especially
developed for cutting and polishing samples prior to examina tion by
SEM, TEM and LM techniques. It excels with challenging speci ­mens where pinpointing and preparing barely visible targets
becomes easy. Before the Leica EM TXP, sawing, milling, grinding
and polishing exactly to the target was often a very time-consuming
and difficult procedure as points of interest were easily missed and
specimens often difficult to handle due to their small size. With the
Leica EM TXP such samples can easily be prepared. Furthermore,
due to its versatility, the EM TXP is a very efficient tool for sample
pre-preparation prior to ion beam milling and ultramicrotomy.

Leica Design by W. Hölbl

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System

Stereomicroscopic target observation during the working process

With the specimen pivot arm the sample can be observed during
preparation at an angle between 0° and 60°, directly onto the front
face, or 90° to the front face for distance determination with an
eyepiece graticule. The Leica EM TXP features brilliant ring LED
top light and optimized backlight illumination for excellent viewing.

I Accurate location and preparation of microtargets

I

In-situ

observation with a stereomicroscope

I Multifunctional machine processing

I Automatic process control

I to produce a mirror-like surface quality

I Brightness control and segment selection

I of LED-ring illumination

Integrated Viewing System

Cross section of watch assembly
(processed without embedding)

Viewing with quarter ring illumination

Cross section of a tooth
(processed without embedding)

Viewing with full ring illumination