LeCroy HFP1000 User manual

LeCroy

HFP1000

High Frequency Probe

Instruction Manual

Revision F - February 2008

Warranty

(Note: This manual contains an updated Declaration of Conformity page. During this interim fix,
the revision number shown here does not match the ones shown in the footers of this manual).

LeCroy warrants this oscilloscope accessory for normal use and operation within specification for a period of one year from
the date of shipment. Spare parts, replacement parts and repairs are warranted for 90 days.

In exercising its warranty, LeCroy, at its option, will either repair or replace any assembly returned within its warranty period
to the Customer Service Department or an authorized service center. However, this will be done only if the product is deter­mined by LeCroy’s examination to be defective due to workmanship or materials, and the defect is not caused by misuse,
neglect, accident, abnormal conditions of operation, or damage resulting from attempted repair or modifications by a non­authorized service facility.

The customer will be responsible for the transportation and insurance charges for the return of products to the service facil­ity. LeCroy will return all products under warranty with transportation charges prepaid.

This warranty replaces all other warranties, expressed or implied, including but not limited to any implied warranty of mer­chantability, fitness or adequacy for any particular purposes or use. LeCroy shall not be liable for any special, incidental, or
consequential damages, whether in contract or otherwise.

Corporate Headquarters

700 Chestnut Ridge Road
Chestnut Ridge, NY 10977-6499
Tel: [phone], Fax: [phone]

Internet: www.lecroy.com

Copyright 2008 by LeCroy Corporation. All rights reserved.

LeCroy, ActiveDSO, JitterTrack, WavePro, WaveMaster, WaveSurfer, WaveLink, WaveExpert, WaveJet, and Waverunner
are registered trademarks of LeCroy Corporation. Other product or brand names are trademarks or requested trademarks
of their respective holders. Information in this publication supersedes all earlier versions. Specifications subject to change
without notice.

HFP1000-OM-E Rev F

Manufactured under a
tered Quality Management System
Visit www.lecroy.com to view the certifi­cate.

n ISO 90

00 Regis-

This electronic product is subject to dis­posal and recycling regulations that
vary by country and region. Many coun­tries prohibit the disposal of waste elec­tronic equipment in standard waste
receptacles.
For more information about proper dis­posal and recycling of your LeCroy
product, please visit www.lecroy.com/
recycle.

DECLARATION OF CONFORMITY

according to ISO/IEC Guide 22 and EN 45014:1998

Manufacturer’s Name:

Manufacturer’s Address:

herewith declare that

Product(s) Name: Active Voltage Probe
Model Number(s): HFP 3500, HFP2500, HFP1500, HFP1000

including all their options are in conformity with the provisions of the following EC directive(s), including
the latest amendments, and with national legislation implementing these directives:

and that conformity with Council Directive 73/23/EEC is based on

EN 61010-2-031:2002 Safety requirements for electrical equipment for measurement

control and lab

and that conformity with Council Directive 89/336/EEC is based on

EN 61326/A3:2003 EMC requirements for electrical equipment for measurement

control and laboratory use

Emissions EN 55011/A2:2002 Conducted and Radiated Emissions

Immunity EN 61000-4-2/A2:2001 Electrostatic Discharge

LeCroy Corporation

700 Chestnut Ridge Road
Chestnut Ridge, NY 10977
USA

73/23/EEC Low Voltage Directive
89/336/EEC EMC Directive

oratory use

Part 031: Particular requirements for
for electrical test and measurement

EN 61000-4-3/A1:2003 RF Radiated Electromagnetic Field
EN 61000-4-4:2004 Electrical Fast Transient/Burst
EN 61000-4-5/A1:2001 Surge
EN 61000-4-6/A1:2001 RF Conducted Electromagnetic Field

hand-held probe assemblies

By: David C. Graef European Contact:

Vice President & Chief Technology Officer Your local LeCroy Sales Office or

Place: LeCroy Corporation LeCroy Europe GmbH

700 Chestnut Ridge Road Waldhofer Str 104
Chestnut Ridge, NY 10977 D-69123 Heidelberg
USA Germany

Date: December 18, 2007 Tel: [phone]

Fax: [phone]

Warning: This is a Class A product. In a domestic environment this product may cause
radio interference, in which case the user may be required to take adequ ate measu res.

BLANK PAGE

iv HFP1000-OM-E Rev E

Contents

Table of Contents

Safety Information

Operator Safety .....................................................................................................1–1

Conventions Used in this Manual ..........................................................................1–1

Overview

Product Description ...............................................................................................2–1

Key Benefits ...........................................................................................................2–1

Standard Accessories ............................................................................................2–2

Optional Accessories .............................................................................................2–2

Features and Accessories

Probe Head ............................................................................................................3–1

AutoColor ID ..........................................................................................................3–1

Description of Standard and Optional Accessories ...............................................3–1

A. Tips ................................................................................................................3–2

B. Clips...............................................................................................................3–3

C. Leads.............................................................................................................3–4

D. Probe Holder .................................................................................................3–5

E. Cartridges ......................................................................................................3–6

Operation

Handling the Probe ................................................................................................4–1

Connecting the Probe to the Test Instrument ........................................................4–1

Connecting the Probe to the Test Circuit ...............................................................4–1

Operation with a LeCroy Oscilloscope ...................................................................4–1

Use with Non-LeCroy Instruments .........................................................................4–2

Use with Older LeCroy Instruments .......................................................................4–2

High Frequency Measurements

Input Loading .........................................................................................................5–1

Inductive Loading (Lead Length) ...........................................................................5–1

Capacitive Loading ................................................................................................5–3

Care and Maintenance

Cleaning .................................................................................................................6–1

Calibration Interval .................................................................................................6–1

Service Strategy ....................................................................................................6–1

Returning a Defective Probe ..................................................................................6–1

Replacement Parts ................................................................................................6–2

HFP1000-OM-E Rev E v

HFP1000 High Frequency Probe

Performance Verification

Test Equipment Required ......................................................................................7–1

Preliminary Procedure ...........................................................................................7–2

Functional Check ...................................................................................................7–3

Procedure ..............................................................................................................7–4

A. Output Zero Voltage ......................................................................................7–4

B. LF Attenuation Accuracy ...............................................................................7–5

Adjustment Procedure

Introduction ............................................................................................................8–1

Test Equipment Required ......................................................................................8–1

Preliminary Procedure ...........................................................................................8–2

Procedure ..............................................................................................................8–3

A. Adjust Output Zero ........................................................................................8–3

B. Verify Calibration ...........................................................................................8–4

Specifications

Nominal Characteristics .........................................................................................9–1

Warranted Characteristics .....................................................................................9–1

Typical Characteristics ..........................................................................................9–1

Environmental Characteristics ...............................................................................9–2

Physical Characteristics ........................................................................................9–2

Compliance and Certifications ...............................................................................9–4

Appendix A

Performance Verification Test Record .................................................................. A–1

Equipment Used: .................................................................................................. A–1

HFP1000 Test Record .......................................................................................... A–2

vi HFP1000-OM-E Rev E

Safety Information

1 Safety Information

OPERATOR SAFETY

To avoid personal injury and to prevent damage to the probe or any products connected to it,
review the following safety precautions. To avoid potential hazards, use the probe only as speci­fied.

Warning

For indoor use only. To avoid fire or personal injury, comply with the following:

Connect probe to the measurement instrument before connecting test leads to a voltage source.

Do not disconnect probe from instrument while test leads are connected to a voltage source.

Use of the probe and/or the oscilloscope it is connected to in a manner other than that specified
may impair the protection mechanisms.

Do not apply a potential to any input that exceeds the maximum rating of that input. (Section 9,
Specifications.)

When measuring high frequency signals, be sure to comply with the voltage vs. frequency derating
curve. (Section 9, Specifications.)

Do not use in wet or explosive atmospheres.

Do not use the probe if any part is damaged. All maintenance should be referred to qualified ser­vice personnel.

CONVENTIONS USED IN THIS MANUAL

The following conventions may appear in this manual:

Note

A Note contains information relating to the use of the product.

CAUTION

A Caution contains information that should be followed to avoid possible damage
to the instrument or the device under test.

HFP1000-OM-E Rev E 1–1

HFP1000 High Frequency Probe

WARNING

A Warning alerts you to a potential hazard. Failure to adhere to the statement in a
WARNING message could result in personal injury.

The following symbols may appear on the product:

CAUTION: Refer to
accompanying documents

This refers you to additional information contained in this manual. The corresponding information
in the manual is similarly denoted.

CAUTION: Risk of electric
shock

This is a reminder that high voltage may be present and that appropriate caution should be taken.

This is the symbol for earth ground.

###

1–2 HFP1000-OM-E Rev E

Overview

2 Overview

PRODUCT DESCRIPTION

The 1 GHz HFP1000 is a small, high frequency active probe designed to meet today’s increasing
demand for measurements on a variety of test points.

With low input capacitance and high input resistance, circuit loading is minimized.

The HFP1000 can be used with LeCroy’s WavePro™, Waverunner™ and LC series oscilloscope
with firmware version 8.7.0 or higher.

When the probe is used with any of these oscilloscopes, an AutoColor ID feature automatically illu­minates the probe head in the default trace color of the channel to which the probe is connected,
eliminating the need for color bands or other markers.

With the ProBus interface, the HFP1000 becomes an integral part of the oscilloscope. The probe
can be controlled from the oscilloscope’s front panel. The oscilloscope provides power to the
probe, so there is no need for a separate power supply or batteries.

When used in combination with an ADPPS power supply, the HFP1000 probe can be used with
non-LeCroy instruments. (See Section 4 for detailed operation with an ADPPS adapter).

Note:

The AutoColor ID feature will be disabled when the probe is used with an ADPPS
adapter or a LeCroy oscilloscope with firmware version lower than 8.7.0.

KEY BENEFITS

• High frequency performance

• Low input capacitance

• Wide dynamic range

• ProBus interface

• AutoColor feature matches the probe color to the oscilloscope’s default trace color

• Five interchangeable tips for probing a variety of test points (two standard, three
optional accessories)

• Replaceable probe tip socket

• Hands free probing with optional FreeHand Probe Holder

HFP1000-OM-E Rev E 2–1

HFP1000 High Frequency Probe

STANDARD ACCESSORIES

The HFP1000 probe is shipped with the following standard accessories:

Item: Quantity:

Straight Tip 4

Sharp Tip 4

Clip, 0.8 mm 2

Square Pin Ground Spring 1

Offset Pin 2

Short Right Angle Lead 1

Long Right Angle Lead 1

Short Single lead 1

Long Single Lead 1

Replaceable Cartridge 1

Instruction Manual 1

Certificate of calibration 1

OPTIONAL ACCESSORIES

The following items are available as optional accessories for the HFP1000 probe:

IC Lead Tip

SMD Discrete Tip

Bent Sharp Tip

Micro Clip

Ground Spring with Hook

FreeHand Probe Holder

High Frequency Cartridge

Soft Accessory Case

For part number information for standard and optional accessories refer to Section 6, Care and
Maintenance, Replaceable Parts List.

###

2–2 HFP1000-OM-E Rev E

Features and Accessories

3 Features and Accessories

The HFP1000 probe is provided with numerous features and accessories to make probing and
connecting to different test points easier than ever.

PROBE HEAD

The small, low mass probe head is designed for ease of
use and high performance.

Ground
Socket

Input socket

AUTOCOLOR ID

AutoColor ID LED

DESCRIPTION OF STANDARD AND OPTIONAL ACCESSORIES

The probe tip socket fits easily onto 0.025 inch square
pins for direct access to test points. Several different
adapters are available which connect directly in the
probe socket.

The probe tip socket has a removable tip cartridge for
easy replacement in case the probe socket gets dam­aged.

The ground socket will accept several different ground
leads to provide a short ground path for high frequency
performance.

The AutoColor ID consists of an LED inside the probe
head which illuminates the probe body in the default
trace color of the channel to which the probe is con­nected.

The AutoColor ID will only function when the probe is
connected to a LeCroy oscilloscope supplied with the
ProBus interface and firmware version 8.7.0 or higher.
The colors are correct when factory default color
scheme 1 is selected.

The following Tip and Clip accessories can be pushed
into the probe tip socket, ground socket or any other
socketed lead or adapter.

HFP1000-OM-E Rev E 3–1

HFP1000 High Frequency Probe

A. Tips

Straight Tip

The straight tip is rugged and designed for general
probing. Fits in either probe socket.

PACC-PT001, package of 4.

Sharp Tip

Rugged, titanium tip designed to connect to the small­est vias and small test points. Fits in either probe
socket.

PACC-PT002, package of 4.

IC Lead Tip

Covered in insulation on all sides (except for a small
edge), this tip was designed to prevent shorting neigh­boring IC leads. The gold part of the tip is not insulated
and should touch the IC lead to be tested. It is one-size­fits-all and will work with any IC lead pitch. Fits in either
probe socket.

The IC Lead Tip is an optional accessory for the
HFP1000.

PACC-PT003, package of 4.

SMD Discrete Tip

The crescent shape of this tip is designed to fit tightly on
capacitors, resistors, transistors and other surface
mount components with discrete leads. Fits in either
probe socket.

The SMD Discrete Tip is an optional accessory for the
HFP1000.

PACC-PT004, package of 4.

3–2 HFP1000-OM-E Rev E

Bent Sharp Tip

B. Clips

Micro Clip (0.5 mm)

Features and Accessories

Made out of titanium, this tip is ideal for situations that
require the user to hold the probe parallel to the circuit
board under test. Also gives the user more control when
holding the probe like a pencil. Fits in either probe
socket.

The Bent Sharp Tip is an optional accessory for the
HFP1000.

PACC-PT005, package of 4.

A pincher like tip designed to hold onto fine pitch leads
and small components, commonly found in SMD ICs.
Fits in either probe socket, or can be used with a lead.

The Micro Clip is an optional accessory for the
HFP1000.

PACC-CL001, package of 4.

Clip (0.8 mm)

A pincher like tip designed to hold onto larger wires and
components than possible with the Micro Clip, including
through-hole mounted components.

This clip cannot be connected directly into either of the
probe head sockets; it must be connected to a lead.

PK006-4, package of 2.

Ground Spring with Hook

A flexible spring connected to a square pin that fits into
either of the probe head sockets. Designed to be used
as a ground lead, there is a hook on the end of the
spring so that it can probe general circuits.

The Ground Spring with Hook is an optional accessory
for the HFP1000.

PACC-LD001, package of 4.

HFP1000-OM-E Rev E 3–3

HFP1000 High Frequency Probe

Square Pin Ground Spring

A flexible spring connected to a square pin that fits into
either of the probe sockets. Designed to be attached to
a square pin on the circuit under test.

PACC-LD002, package of 4.

Offset Pin

The offset pin is designed to be attached to either socket
of the probe head. The offset pin is the highest quality
grounding solution and is recommended in high fre­quency applications.

405400003, package of 1.

C. Leads

While longer leads provide greater flexibility when connecting the probe to a circuit, the added
inductance may degrade the fidelity of high frequency signals. See Section 4 for additional infor­mation.

3–4 HFP1000-OM-E Rev E

Short and Long Right Angle Lead

Short and Long Single Lead

D. Probe Holder

FreeHand Probe Holder

Features and Accessories

This lead has a socket on one end and a bent square
pin on the other to connect to the input or ground socket
of the probe body, and may be used for general pur­pose probing.

PACC-LD003 (short), PACC-LD004 (long), packages
of 4.

This lead can be used for either ground or input lead.

It has a socket on one end and a square pin on the
other and may be used for general purpose probing.

PACC-LD005 (short), PACC-LD006 (long), packages
of 4.

FreeHand lets you focus on the oscilloscope screen
instead of on maintaining contact to multiple test points.
It allows the user to concentrate on what is really impor­tant – the waveform.

It is designed to keep most of the weight on the probe
tip and will prevent lost contact when a bump to the
table shakes the circuit under test.

Additionally, the HFP probe can be mounted horizon­tally or vertically in the FreeHand, giving added mea-
surement flexibility.

The FreeHand probe holder is an optional accessory for
the HFP1000.

PACC-MS001, package of 1.

HFP1000-OM-E Rev E 3–5

HFP1000 High Frequency Probe

To use the FreeHand probe holder

d

c

Installing probe into FreeHand

E. Cartridges

Replaceable Cartridge

1. Slide the probe cable through the slot on the bottom
of the translucent holder section.

2. Slide probe backwards in the probe holder.

If the input tip socket gets damaged, you don’t have to
replace the entire probe, because the HFP series active
probe has a removable tip socket cartridge.

PACC-MS002, package of 1.

High Frequency Cartridge

By having a fixed tip rather than a socket, the High Fre­quency cartridge is able to increase signal fidelity at
higher frequencies.

The High Frequency Cartridge is an optional accessory
for the HFP1000.

PACC-MS003, package of 1.

3–6 HFP1000-OM-E Rev E

Removal and Installation of the Replaceable Cartridge

To remove old cartridge:

1. Slide the cable strain relief over the cable away from
the probe body.

2. To release the latch, lift the part closest to the strain
relief away from the probe body and slide the car­tridge toward the strain relief.

Removing old cartridge

To install a new cartridge:

1. Slide the new cartridge onto the probe body until the
latch engages.

2. Slide the cable strain relief forward to cover the back
end of the probe body.

Installing new cartridge

Features and Accessories

Note:

The cable strain relief is polarized and fits over the probe body in
one direction only.

###

HFP1000-OM-E Rev E 3–7

HFP1000 High Frequency Probe

BLANK PAGE

3–8 HFP1000-OM-E Rev E

Operation

4 Operation

HANDLING THE PROBE

Exercise care when handling and storing the probe. Always handle the probe by the probe body or
compensation box. Avoid putting excessive strain or exposing the probe cable to sharp bends.

CONNECTING THE PROBE TO THE TEST INSTRUMENT

The HFP1000 probe has been designed for use with LeCroy’s WavePro™, Waverunner™ and LC
oscilloscopes equipped with the ProBus interface. When you attach the probe output connector to
the oscilloscope’s input connector, the oscilloscope will recognize the probe, provide proper termi­nation and activate the probe control functions in the user interface.

CONNECTING THE PROBE TO THE TEST CIRCUIT

To maintain the high performance capability of the probe in measurement applications, care must
be exercised in connecting the probe to the test circuit. Increasing the parasitic capacitance or
inductance in the input paths may introduce a “ring” or slow the rise time of fast signals. Input
leads which form a large loop area will pick up any radiated electromagnetic field which passes
through the loop and may induce noise into the probe input.

Using one of the available accessories makes the HFP1000 probe with its small profile and low
mass head ideally suited for applications in dense circuitry.

OPERATION WITH A LECROY OSCILLOSCOPE

When the HFP1000 probe is connected to any LeCroy oscilloscope, the displayed scale factor and
measurement values will be automatically adjusted.

Control through the oscilloscope’s interface can be found in the ’Coupling’ menu of the channel to
which the probe is connected.

Turning the Volts/Div knob will control the oscilloscope’s scale factor to give full available dynamic
range up to 2 V/div.

USE WITH NON-LECROY INSTRUMENTS

The HFP1000 can be used with other instruments with the optional ADPPS power supply. The out­put of the ADPPS must be terminated into 50 Ω.

The AutoColor ID feature will be disabled when the probe is used with an ADPPS adapter.

USE WITH OLDER LECROY INSTRUMENTS

When used with LeCroy instruments with software version lower than 8.7.0, the oscilloscope will
provide the correct scale factor but no AutoColor ID.

With V/div settings greater than 2 V/div, it is possible to display clipped waveforms on screen.

###

HFP1000-OM-E Rev E 4–1

HFP1000 High Frequency Probe

BLANK PAGE

4–2 HFP1000-OM-E Rev E

High Frequency Measurements

5 High Frequency Measurements

INPUT LOADING

When you touch a probe to the circuit under test, the probe will affect your measurement because
of the probe’s input impedance introduced into the circuit. All probes present resistive, capacitive
and inductive loading.

INDUCTIVE LOADING (LEAD LENGTH)

A significant element in this circuit is the inductance shown in the input ground leads of the oscillo­scope probe.

Figure 5-1. Probe Input Equivalent Circuit

The ground lead is the primary return path for the current resulting from the input voltage acting on
the probe’s input impedance. The ground lead and input lead inductances act with the probe’s
input capacitance to form series L-C network. The impedance of a series LC network will drop dra­matically at its resonant frequency. This is the cause of the "ring" we often see after the leading
edge of pulses in measured waveforms. This effect is referred to as ground lead corruption.
Because it is impossible to eliminate either the L or C from this circuit, the method to improve
waveform fidelity is to raise the resonant frequency beyond the bandwidth of interest in the mea­surement.

The resonant frequency of a simple LC circuit can be represented by:

1

F

Resonance

The resonant frequency of a series LC circuit can be raised by decreasing the inductance, capaci­tance or both.

Since the input capacitance is already very low and cannot be reduced, you can only try to reduce
the inductance. This can be accomplished by using the shortest possible input lead as well as the
shortest possible ground lead.

For example, to obtain the shortest possible ground lead when measuring IC related signals,
attach a small piece of copper clad material to the top of the IC package and connect this to the

HFP1000-OM-E Rev E 5–1

------------------

=

2π LC

HFP1000 High Frequency Probe

package grounding wires. Using the shortest ground lead and input lead available makes probing
signals on the package easier and makes for the shortest lead length for the best signal fidelity.

To illustrate how dramatic this effect is, we will work a simple example.

Assuming an input capacitance of 0.7 pF and a total lead length (input and ground) of 2 inches
(inductance of ≈ 25 nH/inch) such a setup may cause ringing with a resonant frequency (f

) of:

0

BW

1

9–

0.7 10

0.35

--------------------­851MHz

851 MHz==

12–

×××

0.4 ns== =

-------------------------------------------------------------------

f

0

2π 50 10

This frequency is well within the passband of the probe and will therefore show up as part of the
measured signal at faster time/div settings.

To determine how fast a waveform to be measured can be without causing ringing on a probe like,
this divide the BW (ringing frequency) of the probe into 0.35:

0.35

t

rise

Any input signal with a rise time faster than 0.4 ns can cause ringing.

CAPACITIVE LOADING

Capacitive loading is usually the most troublesome of the three loading effects.

It can affect the rise time, bandwidth and delay time measurements.

At higher frequencies the capacitive loading can affect the amplitude as well as the waveshape of
the measured signal by introducing an exponential response to the waveform.

For a simple RC network the time constant of this exponential response is:

----------

t

rise

where C
resistance.

For a setup where C

0.385 ns, which will correspond to a bandwidth of 909 MHz, assuming no inductive loads.

5–2 HFP1000-OM-E Rev E

is the combined probe and circuit capacitance and R

total

= 0.7 pF and a source resistance is 250 Ω, the measured rise time will be

t

(t

=2.2 x 0.7 X 10

rise

-12

x 250 Ω = 0.385 ns)

2.2 C

× R

total

×=

total

is combined circuit and probe

total

High Frequency Measurements

(parallel combination of 250 Ω and 100 kΩ is still 250 Ω)

Input inductance

250 Ω

0.7 pF 100 kΩ

Source

Figure 5-2. Probe input equivalent circuit

To illustrate the effect of capacitive loading at higher frequencies:
At a frequency of 851 MHz the reactance of the 0.7 pF capacitance is 267 Ω, and at 1.0 GHz the

reactance has been lowered to 227 Ω

If, at a given frequency, the source impedance is large with respect to the input impedance, a mea­surable reduction in the output signal amplitude may occur.

V

out

V

Z

--------------------------------------

Z

probe

+

probeZsource

Vin×=

where: Z

Z

As an example:
At 851 MHz, where the probe input impedance has reduced to 267 Ω, and a source resistance of

250 Ω the probe output amplitude is reduced to:

HFP1000-OM-E Rev E 5–3

is the probe’s input impedance and

probe

is the source impedance

source

V

out

267

-----------------------­267 250+

###

×==

0.52 V

in

HFP1000 High Frequency Probe

BLANK PAGE

5–4 HFP1000-OM-E Rev E

Care and Maintenance

6 Care and Maintenance

CLEANING

The exterior of the probe and cable should be cleaned only using a soft cloth lightly moistened with
water or isopropyl alcohol. The use of abrasive agents, strong detergents, or other solvents may
damage the probe. Always ensure that the input leads are free of debris.

Note

The probe case is not sealed and should never be immersed in any fluid.

CALIBRATION INTERVAL

The recommended calibration interval is one year. (Performance Verification and Adjustment Pro­cedures are included in this manual.)

SERVICE STRATEGY

The HFP1000 probe utilizes fine pitch surface mount devices. It is therefore impractical to attempt
to repair in the field. Defective probes must be returned to a LeCroy service facility for diagnosis
and exchange. A defective probe under warranty will be replaced with a factory refurbished probe.
A probe that is not under warranty can be exchanged for a factory refurbished probe for a modest
fee. You must return the defective probe in order to receive credit for the probe core.

RETURNING A DEFECTIVE PROBE

The procedure for returning a defective probe is as follows:

Contact your local LeCroy sales representative to find out where to return the product. All returned
products should be identified by model number and serial number. Provide your name and contact
number and if possible describe the defect or failure. In case of products returned to the factory, a
Return Authorization Number (RAN) should be used. The RAN can be established by contacting
your nearest LeCroy office, or the New York Customer Care Center.

Return shipment should be made prepaid. LeCroy cannot accept COD or Collect Return ship­ments. We recommend air-freighting. It is important that the RAN be clearly shown on the outside
of the shipping package for prompt redirection to the appropriate department.

1. Contact your local LeCroy sales or service representative to obtain a Return Authorization
Number.

2. Remove all accessories from the probe. Do not include the manual.

3. Pack the probe in its case, surrounded by the original packing material (or equivalent) and
box.

4. Label the case with a tag containing

• The RAN

HFP1000-OM-E Rev E 6–1

HFP1000 High Frequency Probe

• Name and address of the owner

• Probe model and serial number

• Description of failure

5. Package the probe case in a cardboard shipping box with adequate padding to avoid damage
in transit.

6. Mark the outside of the box with the shipping address given to you by the LeCroy representa­tive; be sure to add the following:

• ATTN: <RAN assigned by the LeCroy representative>

• FRAGILE

7. Insure the item for the replacement cost of the probe.

8. Ship the package to the appropriate address.

REPLACEMENT PARTS

The probe connection accessories and other common parts can be ordered through the regional
customer care centers. Refer to list below for LeCroy part numbers. Defective probes can be
replaced on an exchange basis. The replacement exchange probe will have been factory repaired,
inspected and calibrated to the same standards as a new product. In order to obtain an exchange
probe, you must return the defective probe. The returned probe should be sent back to the
regional customer care center without any accessories, manual or case.

6–2 HFP1000-OM-E Rev E

HFP1000

Care and Maintenance

PACC-MS002

PACC-MS003 (HF)

Drawing Not To Scale

Figure 6-1. Replaceable Parts Selected by Input and Ground Accessory

(Some accessories may be optional and not included with the probe)

PACC-PT001

PACC-PT002

PACC-PT003

PACC-PT004

PACC-PT005

PACC-CL001

PACC-LD005 (short)

PACC-LD006 (long)

Table 6-1. Replaceable Parts List

Item LeCroy P/N

405400003

PACC-LD001

PACC-LD002

PACC-LD003 (short)

PACC-LD004 (long)

PK006-4

Replacement

Quantity

Straight Tip PACC-PT001 4

Sharp Tip PACC-PT002 4

IC Lead Tip PACC-PT003 4

SMD Discrete Tip PACC-PT004 4

Bent Sharp Tip PACC-PT005 4

Micro Clip PACC-CL001 4

Clip PK006-4 2

Ground Spring with Hook PACC-LD001 4

HFP1000-OM-E Rev E 6–3

HFP1000 High Frequency Probe

Item LeCroy P/N

Square Pin Ground Spring PACC-LD002 4

Offset Pin 405400003 1

Short Right Angle Lead PACC-LD003 4

Long Right Angle Lead PACC-LD004 4

Short Single Lead PACC-LD005 4

Long Single Lead PACC-LD006 4

FreeHand Probe Holder PACC-MS001 1

Replaceable Cartridge PACC-MS002 1

Low C Cartridge PACC-MS003 1

Soft Accessory case SAC-01 1

Instruction Manual HFP1500-OM-E 1

Replacement

Quantity

###

6–4 HFP1000-OM-E Rev E

Performance Verification

7 Performance Verification

This procedure can be used to verify the warranted characteristics of the HFP1000 High Fre­quency Probe.

The recommended calibration interval for the model HFP1000 is one year. The complete perfor­mance verification procedure should be performed as the first step of annual calibration. Test
results can be recorded on a photocopy of the Test Record provided in Appendix A at the end of
the manual.

Performance verification can be completed without removing the probe covers or exposing the
user to hazardous voltages. Adjustment should only be attempted if a parameter measured in the
Performance Verification Procedure is outside the specification limits.

Note:

Adjustment should only be performed by qualified personnel.

This procedure tests the following specifications:

• Output Zero Voltage

• LF Attenuation Accuracy

TEST EQUIPMENT REQUIRED

Table 7-1 lists the test equipment and accessories (or their equivalents) that are required for per­formance verification of the HFP1000 Probe.

This procedure has been developed to minimize the number of calibrated test instruments
required.

Only the parameters listed in boldface in the "Minimum requirements" column must be calibrated
to the accuracy indicated.

Because the input and output connectors types may vary on different brands and models of test
instruments, additional adapters or cables may be required.

Table 7-1. List of Required Equipment

Description Minimum Requirements Test Equipment Examples

Digital Oscilloscope ProBus interface LeCroy WavePro960 or

LeCroy LT344

Digital Multimeter (DMM)
with test probe leads

Function Generator Sine Wave output amplitude adjust-

HFP1000-OM-E Rev E 7–1

4.5 digit

DC: 0.1% Accuracy
AC: 0.1% accuracy

able to 14.14 Vp-p (5 Vrms) into
1 MΩ at 70 Hz

Agilent Technologies 34401A or
Fluke 8842A-09

Agilent Technologies 33120A or
Stanford Research Model DS340

HFP1000 High Frequency Probe

Description Minimum Requirements Test Equipment Examples

BNC Coaxial Cable (2 ea.) Male to Male, 50 Ω, 36" Cable Pomona 2249-C-36 or

Pomona 5697-36

BNC Tee Connector Male to Dual Female Pomona 3285

Calibration Fixture ProBus Extender Cable LeCroy PROBUS-CF01

Terminator, Precision, BNC 50 Ω ± 0.05% LeCroy TERM-CF01

Banana Plug Adapter (2 ea.) Female BNC to Dual Banana Plug Pomona 1269

BNC to Mini-grabber BNC Male to Mini-grabber Cable, 36" Pomona 5187-C-36

PRELIMINARY PROCEDURE

1. Connect the HFP1000 probe to the female end of the ProBus Extension Cable. Connect the
male end of the ProBus Extension Cable to channel 1 of the oscilloscope.

2. Turn the oscilloscope on and allow at least 30 minutes warm-up time for the HFP1000 and test
equipment before performing the Verification Procedure.

3. Turn on the other test equipment and allow these to warm up for the time recommended by the
manufacturer.

4. While the instruments are reaching operating temperature, make a photocopy of the Perfor­mance Verification Test Record (located in Appendix A), and fill in the necessary data.

5. Select the channel to which the probe is connected. Set the oscilloscope scale factor to 20
mV/div.

6. Disconnect the ProBus Extender Cable from the oscilloscope. Verify that the scale factor
changes from 20 mV/div to 2 mV/div.

7. Re-connect the ProBus extender Cable to the oscilloscope.

The warranted characteristics of the HFP1000 are valid at any temperature within the Environmen­tal Characteristics listed in the Specifications. However, some of the other test equipment used to
verify the performance may have environmental limitations required to meet the accuracy needed
for the procedure. Make sure that the ambient conditions meet the requirements of all the test
instruments used in his procedure.

Note

The correct operation of the HFP1000 controls requires software version 8.7.0 or
higher. The software version in the test oscilloscope can be verified by pushing
SCOPE STATUS, then selecting the System menu option.

Contact your local LeCroy representative if the software in your oscilloscope
requires updating.

7–2 HFP1000-OM-E Rev E

Performance Verification

FUNCTIONAL CHECK

The functional check will verify the basic operation of the probe functions.

It is recommended the Functional Check be performed prior to the Performance Verification Pro­cedure.

1. Return to the factory default settings by:

a. Pressing the oscilloscope’s front panel PANELS button.

b. From the Menu buttons press FROM DEFAULT SETUP.

3. Select Channel 1 and enter the Coupling menu.

4. Verify that Probe sensed (HFP1000) is displayed on the right hand menu.

5. If the trace colors have been reassigned or you are unsure, restore the default colors by press­ing the following menus: DISPLAY, More Display Setup, Color Scheme and in the Color
Scheme menu press 1.

6. Verify that the probe head LED shows basically the same color as the channel 1 trace color.

7. Disconnect the probe from channel 1 and connect respectively to channel 2, 3 and 4.

8. Verify that in each case the LED color corresponds to the trace color of the channel to which
the probe is connected.

PROCEDURE

A. Output Zero Voltage

1. Connect one end of a BNC cable to the female BNC connector on the probe end of the ProBus
extender cable. Connect the precision 50 Ω terminator to the other end of the BNC cable.

2. Connect the banana plugs of the Precision terminator to the input of the DMM. Make sure that
the plug corresponding to the BNC shield (marked "Ground") is connected to the LO or COM-
MON input of the DMM. Refer to figure 7-1 for setup information.

HFP1000-OM-E Rev E 7–3

HFP1000 High Frequency Probe

LeCroy
Oscilloscope

ProBus Extender Cable

HFP1000 Probe

HFP2500

DMM

Precision 50Ω
Terminator

Figure 7-1. Output Zero Voltage Test Setup

3. Set the OFFSET on the oscilloscope to zero, as indicated by on-screen display.

4. Set the DMM to read DC Volt on the most sensitive range.

5. Record the voltage measured on the DMM to 10 µV resolution as ’Output Zero Voltage’ in the

Test record.

6. Check that the voltage indicated by the DMM is between ±800 µV.

7. Disconnect the DMM from the precision 50 Ω terminator. Leave the remaining setup in place

for the next step.

7–4 HFP1000-OM-E Rev E

Performance Verification

B. LF Attenuation Accuracy

1. Connect the BNC end of the BNC to mini-grabber cable to a female end of the BNC tee
adapter. (Refer to figure 7-2)

Function Generator

LeCroy Oscilloscope

ProBus Extender Cable

DMM

HFP1000 Probe

HFP2500HFP2500

Precision 50Ω
Terminator

Figure 7-2. LF Attenuation Accuracy Test Setup

2. Carefully insert the Straight Tips (supplied in accessory kit) into the sockets of the probe head.
Attach the red lead of the mini-grabber to the signal input and the black lead to the ground
input of the probe head.

3. Connect the BNC tee to the output of the function generator. (Use a 50 Ω termination if the
function generator requires such a load).

4. Attach a BNC cable to the unused female port of the BNC tee and connect a dual banana plug
adapter to the other end of the cable and plug the dual banana plug adapter into the DMM
input. Make sure the side of the banana plug adapter corresponding to the BNC shield
(marked "GROUND") is connected to the LOW or COMMON input of the DMM.

5. Set the DMM to read AC volt and set the range to measure 5.0 Vrms.

6. Set the mode of the function generator to sine wave, the frequency to 70 Hz and the output
amplitude to 5 Vrms ±10 mV as measured on the DMM.

HFP1000-OM-E Rev E 7–5

HFP1000 High Frequency Probe

7. Record the output voltage to 1 mV resolution as ’Generator Output Voltage’ in the Test Record.
Be careful not to alter the output amplitude after the reading is recorded.

8. Divide the reading recorded in step B-7 by 10 and record the result with 100 µV resolution as
’Expected Output Voltage, top range" in the Test Record.

9. Remove the banana plug adapter, connected to the function generator, from the DMM and
connect the precision 50 Ω terminator to the DMM, making sure that the banana plug side
marked ’GROUND" is connected to the LOW or COMMON input of the DMM.

10. After the DMM reading has stabilized, record the reading to 100 µV resolution as ’Measured
Output Voltage, top range’ in the Test Record.

11. Calculate the error by dividing the measured top range output voltage recorded in step B10 by
the expected top range output voltage recorded in step B-8. Subtract 1 from this ratio and mul­tiply by 100% to get the error in percent.

Measured Output Voltage

⎛⎞

Error

12. Record the calculated error to two decimal places (±0.xx%) as ’Gain Error, top range’ in the
test record.

--------------------------------------------------------------

=

⎝⎠

Expected Output Voltage

1–

100%

×

13. Verify that the error is less than ±1.0 %.

14. Disconnect the precision 50 Ω terminator from the DMM.

15. Connect the banana plug adapter connected via a BNC cable to the BNC tee at the function
generator to the DMM. Verify that the side of the plug marked ’Ground’ is connected to the
LOW or COMMON input of the DMM.

16. Adjust the sine wave generator output amplitude to approximately 2.5 Vrms as measured on
the DMM.

17. Record the reading to 1 mV resolution as ’Generator Output Voltage, mid range’ in the Test
Record. Be careful not to alter the output amplitude after the reading is recorded.

18. Divide the reading recorded in step B-17 by 10.

19. Record the result to 100 µV resolution as ’Expected Output Voltage, mid range’ in the test
record.

20. Remove the banana plug adapter from the DMM and connect the precision 50 Ω terminator to
the DMM, making sure that the banana plug side marked ’GROUND" is connected to the LOW
or COMMON input of the DMM.

21. After the DMM has stabilized, record the reading to 100 µV resolution as ’Measured Output
Voltage, mid range’ in the Test record.

22. Calculate the error by dividing the measured mid range output voltage recorded in step B-21

7–6 HFP1000-OM-E Rev E

Performance Verification

by the expected mid range output voltage recorded in step B-19. Subtract 1 from this ratio and
multiply by 100% to get the error in percent.

Measured Output Voltage

⎛⎞

Error

23. Record the calculated error to two decimal places (±0.xx %) as ’Gain Error, mid range’ in the
Test record.

24. Verify that the mid range gain error is less than ±1.0%

This completes the Performance Verification of the HFP1000. Complete and file the Test Record,
as required to support your internal calibration procedure.

Apply suitable calibration label to the HFP1000 housing as required.

--------------------------------------------------------------

=

⎝⎠

Expected Output Voltage

###

1–

100%

×

HFP1000-OM-E Rev E 7–7

HFP1000 High Frequency Probe

BLANK PAGE

7–8 HFP1000-OM-E Rev E

Adjustment Procedure

8 Adjustment Procedure

INTRODUCTION

You can use this procedure to adjust the HFP1000 probe to meet the warranted specifications.
This procedure should only be performed if the probe fails to meet the Performance verification
tests for Output Zero.

Gain which affects LF attenuation accuracy cannot be adjusted during routine calibration. Probes
which fail LF attenuation accuracy during performance verification must be returned to the factory
for rework.

If the probe cannot be adjusted to meet the Performance verification limits, repair may be neces­sary.

To assure probe accuracy, check the calibration of the HFP1000 every 1000 hours or once a year
if used infrequently. Before calibration, thoroughly clean and inspect the probe as outlined in the
Care and Maintenance section.

To assure the probe will meet the published specifications over the entire temperature range,
adjustment must be performed in a controlled ambient environment with temperature of
23 °C ±5 °C.

Caution

The adjustment procedure will require removal of the probe control circuitry cover.
This cover is part of the ESD protection system of the HFP1000. To protect the
probe, you should perform the entire procedure on a static dissipating work sur­face. Wear an antistatic wrist strap and follow standard static control procedures.

TEST EQUIPMENT REQUIRED

Table 8-1 lists the test equipment and accessories (or their equivalents) that are required for com­plete calibration of the HFP1000 Probe. Specifications given for the test equipment are the mini­mum necessary for accurate calibration. All test equipment is assumed to be correctly calibrated
and operating within the specification listed. Detailed operating instructions for the test equipment
are not given in this procedure. refer to the test equipment manual if more information is needed

If alternate test equipment is substituted, control settings or calibration equipment setups may
need to be altered.

HFP1000-OM-E Rev E 8–1

HFP1000 High Frequency Probe

Table 8-1. List of Required Equipment

Description Minimum Requirements Test Equipment Examples

Digital Oscilloscope ProBus interface LeCroy LT344 or

LeCroy LC584

Digital Multimeter (DMM)
with test probe leads

BNC Coaxial Cable (2 ea.) Male to Male, 50 Ω, 36" Cable Pomona 2249-C-36 or

Calibration Fixture ProBus Extender Cable LeCroy PROBUS-CF01

Terminator, Precision, BNC 50 Ω ± 0.05% LeCroy TERM-CF01

4.5 digit
DC: 0.1% Accuracy
AC: 0.1% accuracy

Agilent Technologies 34401A or
Fluke 8842A-09

Pomona 5697-36

PRELIMINARY PROCEDURE

1. Remove the two screws that secure the plastic cover on the cable end of the ProBus interface
housing.

2. Gently pull on the probe cable to slide the circuit board assembly from the metal housing.

3. Connect the HFP1000 probe to the female end of the ProBus extension cable, being careful to
line up all six pins of the probe connector. Connect the male end of the ProBus extension
cable to channel 1 of the oscilloscope.

4. Apply power to the oscilloscope and test equipment.

5. Allow at least 30 minutes warm-up time for the HFP1000 and test equipment before starting
the calibration procedure.

PROCEDURE

A. Adjust Output Zero

1. Connect one end of a BNC cable to the probe end of the ProBus extension cable. Connect the
Precision 50 Ω Terminator to the other end of the BNC cable.

2. Connect the banana plugs of the precision 50 Ω terminator to the input of the DMM. Make sure
the plug corresponding to the BNC shield (marked ’Ground’) is connected to the LO or COM-

MON input of the DMM. Refer to figure 8-1 for setup information.

8–2 HFP1000-OM-E Rev E

Adjustment Procedure

LeCroy
Oscilloscope

ProBus Extender Cable

HFP1000 Probe

HFP2500

DMM

Precision 50Ω
Terminator

Figure 8-1. Output Zero Voltage Adjustment Setup

3. Select the channel to which the probe and ProBus extender is connected. Set OFFSET on the
oscilloscope to zero as indicated on the on-screen display.

4. Set the DMM to read DC Volt on the most sensitive range.

5. Verify that the probe inputs are not connected to any signal.

6. Adjust OUTPUT ZERO on the board until the DMM reads 0 V ±100 µV. Refer to figure 8-2 for
adjustment location.

OUTPUT ZEROOUTPUT ZERO

Figure 8-2a. Adjustment Location S/N 100 and higher.

HFP1000-OM-E Rev E 8–3

HFP1000 High Frequency Probe

Output Zero

Figure 8-2b. Adjustment Location S/N below 1000.

7. Disconnect the probe from the ProBus extender and re-install the circuit board into the probe
case, being careful to align the ProBus interface connector with the opening on the other end
of the probe.

B. Verify Calibration

Repeat the Performance Verification procedure to ensure compliance with the warranted specifi­cations.

Apply a calibration sticker, if required, in accordance with your quality control procedures.

###

8–4 HFP1000-OM-E Rev E

Specifications

9 Specifications

NOMINAL CHARACTERISTICS

Nominal characteristics describe parameters and attributes that are guaranteed by design, but do
not have associated tolerances.

Input Dynamic range ±8 V

Maximum Input Voltage 40 V
Intended Output Load 50 Ω
Attenuation ÷10

Output Connector ProBus

Interface ProBus

Oscilloscope Full Compatibility LeCroy oscilloscope with firm-

1

Subject to input voltage vs. frequency derating. See figure 9-1.

WARRANTED CHARACTERISTICS

1

ware version 8.7.0 or higher

Warranted characteristics are parameters with guaranteed performance. Unless otherwise noted,
tests are provided in the Performance Verification Procedure for all warranted specifications.

Low Frequency Attenuation ±1% plus uncertainty of 50 Ω
Accuracy termination

Output Zero ≤ 8 mV referred to the input

TYPICAL CHARACTERISTICS

Typical characteristics are parameters with no guaranteed performance. Tests for typical charac­teristics are not provided in the Performance Verification Procedure.

Output Zero ≤ 4 mV, referred to the input

Bandwidth (Probe only) 1 GHz

Input Capacitance 0.7 pF
DC Input Resistance 100 kΩ

ENVIRONMENTAL CHARACTERISTICS

Temperature, operating 0 °C to 50 °C

Temperature, non-operating -40 °C to 71 °C

HFP1000-OM-E Rev E 9–1

HFP1000 High Frequency Probe

Relative Humidity 80% max up to 31 °C, decreas-

Altitude up to 2000 m

PHYSICAL CHARACTERISTICS

Probe Head Size:

Length 61 mm (2.4 in)
Width 7.3 mm (0.29 in)
Height 13.1 mm (0.52 in)

Cable Length 1.3 m (51.1 in)

Weight:

Probe only 100 g (3.5 oz.)
Shipping 0.85 kg (1.87 labs)

Input Sockets Signal and ground sockets are

ing linearly to 45% max at 50 °C

compatible with 0.635 mm
(0.025 in) square pins, and

0.91 mm (0.036 in) maximum
diameter round pins

100

Maximum

1 GHz

Non-destruct
Range

10 GHz

Volts
Pk-Pk

40

16

10

1

1 MHz

10 MHz

Maximum
Operating
Range

100 MHz

Frequency

Figure 9-1. Input Voltage vs. Frequency

9–2 HFP1000-OM-E Rev E

COMPLIANCE AND CERTIFICATIONS

CE Declaration of Conformity

Low Voltage Directive: EN 61010-2-031:2002

Safety requirements for electrical equipment for mea­surement control and laboratory use.

Part 031:
Particular requirements for hand-held probe assemblies
for electrical measurement and test.

EMC Directive: EN 61326/A3:2003

EMC requirements for electrical equipment for measure­ment control and laboratory use.

Electromagnetic Emissions: EN 55011/A2:2002 Class A Radiated Emissions.

Electromagnetic Immunity: EN 61000-4-2/A2:2001 Electrostatic Discharge.

(Air/Contact Discharge: 8 kV/4 kV)

Specifications

EN 61000-4-3/A1:2003 RF Radiated Electromagnetic

Field (80 MHz to 1 GHz; 3 V/m)

HFP1000-OM-E Rev E 9–3

HFP1000 High Frequency Probe

Toxic or Hazardous Substances and Elements

)

Polybrominated

Biphenyls

(PBB)

Part Name Lead

(Pb)

PCBAs X O X X X X

Mechanical Hardware O O X O O O

Sheet Metal O O X O O O

Plastic Parts O O O O X X

Protective Case O O O O X X

Cable Assemblies X O X O X X

Probe Tips X O X O X X

O: Indicates that this toxic or hazardous substance contained in all of the homogeneous materials for this part is below the limit
requirement specified in SJ/T11363-2006.

X: Indicates that this toxic or hazardous substance contained in at least one of the homogenous materials used for this part is
above the limit requirement specified in SJ/T11363-2006.

Mercury

(Hg)

Cadmium

(Cd)

Hexavalent

Chromium

6+

(Cr

Polybrominated
Diphenyl Ethers

(PBDE)

EFUP (Environmental Friendly Use Period) Use Conditions: refer to the environmental conditions stated in the Specifica­tions section of this manual.

###

9–4 HFP1000-OM-E Rev E

Appendix A

Appendix A

PERFORMANCE VERIFICATION TEST RECORD

This record can be used to record the results of measurements made during the performance ver­ification of the HFP1000 High Frequency Probe.

Photocopy this page and record the results on the copy. File the completed record as required by
applicable internal quality procedures.

The section in the test record corresponds to the parameters tested in the performance verification
procedure. The numbers preceding the individual data records correspond to the steps in the pro­cedure that require the recording of data. Results to be recorded in the column labeled "Test
Result" are the actual specification limit check. The test limits are included in all of these steps.
Other measurements and the results of intermediate calculations that support the limit check are to
be recorded in the column labeled "Intermediate Results".

Permission is granted to reproduce these pages for the purpose of recording test results.

Probe Model: HFP1000

Serial Number: _______________________________________

Asset or Tracking Number: _______________________________________

Date: _______________________________________

Technician: _______________________________________

EQUIPMENT USED:

MODEL SERIAL

NUMBER

OSCILLOSCOPE

DIGITAL MULTIMETER

FUNCTION GENERATOR

1

The function generator used in this Performance Verification Procedure is used for making relative measurements. The
output of the generator is measured with a DMM or oscilloscope in this procedure. Thus, the generator is not required to
be calibrated.

HFP1000-OM-E Rev E A–1

1

CALIBRATION

DUE DATE

N/A

HFP1000 High Frequency Probe

HFP1000 TEST RECORD

Step Description Intermediate data Test Result

Output Zero Voltage

A-5 Output Zero Voltage (Test limit ≤± 800 µV) _____________ V

LF Attenuation Accuracy

B-7 Generator Output Voltage ________________ V

B-8 Expected Output Voltage, top range ________________ V

B-10 Measured Output Voltage, top range ________________ V
B-12 Gain Error, top range (Test limit ≤± 1.0%) _____________ %

B-17 Generator Output Voltage ________________ V

B-19 Expected Output Voltage, mid range ________________ V

B-21 Measured Output Voltage, mid range ________________ V
B-23 Gain Error, mid range (Test limit ≤± 1.0%) _____________ %

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A–2 HFP1000-OM-E Rev E