LeCroy AP034 Instruction Manual

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REVISION D — JANUARY 2000
Warranty
LeCroy warrants this oscilloscope accessory for normal use and operation within specifications for a period of three years from the date of shipment. Calibration after each 12 month interval is recommended to ensure performance to specification. Spare parts, replacement parts and repairs are warranted for 90 days. The instrument’s firmware has been thoroughly tested and thought to be functional, but is supplied without warranty of any kind covering detailed performance.
In exercising its warranty, LeCroy will repair or, at its option, replace any assembly returned within its warranty period to the Customer Service Department or an authorized service center. However, this will be done only if the product is determined by LeCroy’s examination to be defective because of workmanship or materials, and the defect is not caused by misuse, neglect, accident, abnormal conditions of operation, or damage resulting from attempted repair or modifications by a non-authorized service facility.
The customer will be responsible for the transportation and insurance charges for the return of products to the service facility. LeCroy will return all products under warranty with transportation prepaid.
This warranty replaces all other warranties, expressed or implied, including but not lim ited to any implied warranty of merchantability, fitness, or adequacy for any particular purposes or use. LeCroy shall not be liable for any special, incidental, or consequential damages, whether in contract or otherwise.
Corporate Headquarters
700 Chestnut Ridge Road Chestnut Ridge, NY 10977-6499 Tel: (914) 578-6020, Fax: (914) 578-5985
Internet: www.lecroy.com Copyright 2000, LeCroy Corporation. All rights reserved. Contents of this publication may not
be reproduced in any form without written permission of LeCroy Corporation. LeCroy, Easywave, SMART Trigger, PowerMeasure, and ProBus are registered trademarks
of LeCroy Corporation. AP034-OM-E Rev D 0100
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Table of Contents
Overview
Description .................................................................................................................................. 1-1
Applications ................................................................................................................................. 1-1
Conventions used in this Manual ................................................................................................ 1-2
Safety Information
Operator Safety ........................................................................................................................... 2-1
Operation
Connecting the Probe to the Test Instrument ............................................................................. 3-1
Connecting the Probe to the Test Circuit ......................................................................................3-1
Probe Input Loading .................................................................................................................... 3-4
Grounding the Probe ................................................................................................................... 3-4
Selecting the Proper Range ........................................................................................................ 3-6
Operation with LeCroy Oscilloscopes ......................................................................................... 3-7
AP034 Use with the ADPPS Power Supply...................................................................................3-8
Adding Offset ............................................................................................................................ 3-10
Autobalance .............................................................................................................................. 3-11
Designing Test Fixtures for the AP033 Probe ........................................................................... 3-12
Reference Information
Differential Mode and Common Mode ........................................................................................ 4-1
Differential Mode Range and Common Mode Range...................................................................4-1
Common Mode Rejection Ratio ................................................................................................... 4-2
Care and Maintenance
Cleaning ...................................................................................................................................... 5-1
Calibration Interval ...................................................................................................................... 5-1
Service Strategy .......................................................................................................................... 5-1
Troubleshooting .......................................................................................................................... 5-1
Trace Off Scale................................................................................................................5-1
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Incorrect Frequency Response........................................................................................5-2
DC Errors.........................................................................................................................5-3
Poor Common Mode Rejection.......................................................................................5-3
Returning a Defective Probe ....................................................................................................... 5-4
Replacement Parts ...................................................................................................................... 5-5
Matching Procedure for ÷10 Plug-On External Attenuator .......................................................... 5-8
Equipment Required .....................................................................................................................5-8
Procedure......................................................................................................................................5-9
Performance Verification
Test Equipment Required .............................................................................................................6-1
Preliminary Procedure...................................................................................................................6-3
Procedure......................................................................................................................................6-3
Check Gain Accuracy.......................................................................................................6-4
Check High Frequency CMRR.........................................................................................6-5
Check Low Frequency CMRR..........................................................................................6-8
Performance Verification Test Record........................................................................................6-11
Adjustment Procedure
Introduction .................................................................................................................................. 7-1
Test Equipment Required .............................................................................................................7-2
Preliminary Procedure...................................................................................................................7-4
Procedure......................................................................................................................................7-7
Adjust Coarse DC Balance (R226) ..................................................................................7-7
Adjust Fine DC Balance (R304).......................................................................................7-8
Adjust Low Frequency CMRR (R7)..................................................................................7-9
Adjust Offset (R330) ......................................................................................................7-11
Adjust Gain (R322C)......................................................................................................7-13
Adjust Final Attenuator Compensation (C17) ................................................................7-14
Adjust Final Attenuator CMRR (C18A)...........................................................................7-15
Assemble Probe and Amplifier.......................................................................................7-16
Attenuator Matching and Final Check............................................................................7-17
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Specifications
Nominal Characteristics .............................................................................................................. 8-1
Warranted Electrical Characteristics ........................................................................................... 8-2
Typical Electrical Characteristics ................................................................................................ 8-3
General Characteristics ............................................................................................................... 8-5
Compliance and Certifications .................................................................................................... 8-6
Operator Safety.............................................................................................................................8-6
Standard Accessories ................................................................................................................. 8-7
Optional Accessories .................................................................................................................. 8-7
Oscilloscope Software Compatibility ........................................................................................... 8-7
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DESCRIPTION
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The AP034 is a wide-band, active differential pr obe. The probe features low noise, low input capacitance, high common mode rejection, and Field Effect Tr ansistor (FET ) buffer ed inputs in the probe head. The user-selectable offset gives the probe the flexibility to measure a large range of signal types. Plug-on attenuators and AC coupling accessories further extend the application range. Included interconnect accessories allow connection to surface mount and through-hole com ponents with minimal signal degradation. The input receptacles in the probe head are compatible with standard 0.025 in. (0.635 m m) square pins, which provide a convenient, low-cost method of creating device characterization test fixtures.
The probe is powered directly from a LeCroy oscilloscope through the ProBus interface. T he ProBus interface also allows local control of the probe through the os cilloscope user interface and remote control through the inter face buses, (G PIB, RS-232). The optional ADPPS power supply allows the AP034 to be used with other instruments such as spectrum analyzers, network analyzers, and oscilloscopes without ProBus interface.
APPLICATIONS
The AP034 Active Differential Probe is ideal for acquiring high­speed differential signals su ch as those found in disk drive read channels, differential LAN, video, etc. The probe can be used with spectrum analyzers to acquire signals in some RF systems (for example, balanced IF mixers in hand-held cellular telephones). The high impedance characteristics of both inputs allow you to use the probe as an FET probe to make single­ended measurements in digital systems without introducing a ground loop, as a conventional FET probe would.
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CONVENTIONS USED IN THIS MANUAL
The following conventions may appear in this manual:
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Note
A Note contains general information relating to the use of the product.
Caution
A Caution contains information that should to be followed to avoid possible damage to the instrument or the device under test.
WARNING
A Warning alerts you to potential injury to yourself. Failing to adhere to the statement in a WARNING message could result in bodily injury.
The following symbol may appear on the product: This symbol refers you to additional information contained in this
manual. The corres ponding inform ation in the m anual is denoted with the same symbol.
CAT I Overvoltage Installation Category per EN 61010-1
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OPERATOR SAFETY
The AP034 Active Differential Probe is intended to be used only with instruments that are connected to earth ground thr ough the input BNC connector. When you are using the probe with an ADPPS Power Supply Adapter, make sure the adapter is connected to a BNC connector that is grounded by the test instrument before connecting the probe inputs to the test circuit.
Do not use the probe in wet or explosive atmos pheres. Remove any contamination from the probe housing before connec ting the probe inputs to any circuit. Make sure that the surface of the probe head is completely dry before connecting the inputs.
Use of the probe, and/or the instrument it is connected to, in a manner other than that specified may impair the protection mechanisms.
Do not use the probe if any part is damaged. All maintenance should be referred to qualified service personnel.
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The input circuits in the AP034 Activ e Differ ential Probe incorporate components that protect the probe from damage resulting from electrostatic discharge (ESD). Keep in mind that this is an active probe, and it should be handled carefully to avoid damage. When using the AP034 Active Differential Probe, you are advised to take precautions against potential instrument damage due to ESD.
CONNECTING THE PROBE TO THE TEST INSTRUMENT
When you are using the AP034 Active Dif ferential Probe with a LeCroy Oscilloscope equipped with ProBus, attach the probe output connector to the oscilloscope input connector. The oscilloscope will recognize the probe, set the oscilloscope input termination to 50  DQG DFWLYDWH WKH SUREH FRQWURO IXQFWLRQV LQ the user interface.
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Caution
To use the AP034 Active Differ ential Probe with instrumentation not equipped with a ProBus interface, it is necessar y to use the ADPPS Power Supply. Attach the ADPPS connector to the probe output connector. The output connector of the ADPPS is a standard male BNC that can be directly connected to another instrument. If necessary, the output of the ADPPS can be interconnected with a 50 FRD[LDOFDEOH7RPLQLPL]HWKHHIIHFWV of skin loss, this cable should be 1 m or less in length. The AP034 Active Differential Probe is des igned to drive a 50 ORDG The gain will be uncalibrated if the output is not correctly terminated. If you are using the probe with an instrument with a high input impedance, place a 50 %1&LQOLQHWHUPLQDWRURQWKH instrument input before attaching the ADPPS.
CONNECTING THE PROBE TO THE TEST CIRCUIT
At the probe tip, two inputs and a ground connection are available for connecting the probe to a circuit under test. For accurate measurem ents, both the + and – inputs m ust always be
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connected to the test circuit. The ground connection is optional. Positive voltages applied to the + input relative to the – input will deflect the oscilloscope trace toward the top of the screen.
To maintain the high performance capability of the probe in measurement applic ations, user care in connecting the probe to the test circuit. Increasing the parasitic capacitance or inductance in the input paths may introduce a “ring,” or slow the rise time of fast signals. To m inimize these effects, use the shortest length possible when connecting the probe to the circuit under test. Input leads that form a large loop area (even shielded coaxial cables) will pick up any radiated magnetic field that passes through the loop, and may induce noise in the probe inputs. Because this signal will appear as a diffe rential mode signal, the probe’s common mode rejection will not remove it. You can greatly reduce this effect by using short interconnection leads, and twisting them together to minimize the loop area.
High common mode rejection requires precise matching of the relative gain or attenuation in the + and – input signal paths. Mismatches in additional parasitic capacitance, inductance, delay, and a source impedance differ ence between the + and – signal paths will lower the common mode rejection ratio. Therefore, it is desirable to us e the sam e length and type of wire and connectors for both input connections . W hen possible, try to connect the inputs to points in the circuit with approxim ately the same source impedance.
If AC coupling is desired, install the AC coupling accessory on the probe tip before connecting it to the test circuit. The low-
frequency cutoff (–3 dB point) of the AC coupler is approxim ately 16 Hz.
If the voltage in the test circuit exceeds the probes capability, add the external ÷10 or ÷20 attenuator* to the probe tip. If both the external attenuator and AC coupler are used, install the attenuator on the probe tip first, then install the AC coupler on the attenuator input.
* Note
The external attenuators are precisely adjusted during manufacturing to match the
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characteristics of the input of the probe with which they were shipped. The input characteristics of the external attenuator itself do not exactly match those of the probe. Therefore, using the ÷10 and ÷20 attenuators at the same time is not recommended. The scale factor encoding system will not operate correctly with both attenuators installed simultaneously.
The input characteristics of the AP034 1 GHz Active Differential Probe are significantly different than those of the AP033 500 MHz Active Differential Probe. The external attenuators are not interchangeable. The external attenuators currently supplied with the probes are labeled with the appropriate model number. The attenuators supplied with model AP033 probes prior to the introduction of the AP034 did not include the model number on the label. When using an external attenuator with the AP034 Active Differential Probe, make sure it is labeled “AP034.”
Interchanging non-compatible attenuators will not damage the probes; however, the transient response of the measured signals will be significantly in error.
In addition to being compatible with the included lead set, the probe input connectors will mate with standard 0.025 in. (0.635 mm) square pins in any rotational orientation. To avoid damaging the input connectors, do not attempt to insert connectors or wire larger than 0.036 in. (0.91 m m) in diameter. Avoid rotating square pins after they are inserted into the input connectors.
The included accessories simplify the task of connecting the probe to the test circuit:
Use the small (0.5 mm) mini clips with the flexible lead set when connecting to fine-pitch surface mount IC leads.
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PROBE INPUT LOADING
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The larger (0.8 mm) mini clips can be used to connect to through-hole leaded components.
The offset round pins can be used for hand-held probing applications. Reposition the pins by rotating them to obtain the required spacing.
Attaching any probe to a test circuit will add some loading. In most applications, the high impedance of the AP034 Active Differential Probe inputs im parts an insignificant load to the test circuit. However at very high frequencies, the capacitive reactance of the probes input capacitance may load the circuit enough to affect meas urement accuracy. The equivalent model of the probe input circuits is shown below:
GROUNDING THE PROBE
+
0.1 pF
1.5 pF
1 M
Figure 1. AP034 Equivalent Input Model
The single lead along with one of the larger (0.8 mm) m ini clips can be used to ground the probe to the test circuit. Insert the pin end of the lead into the receptacle marked:
Note
Do not use the attenuator encoding receptacle (unmarked socket near the – input) to ground the probe. Connecting to the encoding receptacle will not provide adequate grounding, and may result in in correct scale factor indication.
-
1.5 pF 1 M
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In most cases it is not necessary to ground the probe to the circuit under test. However, if the test circuit is isolated from earth ground, it is usually necessary to connect the probe ground to a point in the circuit. Grounding test circuits that are referenc ed to earth ground may improve the fidelity of high-frequency components in the waveforms. The potential for improvement with grounding will vary depending on the common mode source impedance. However, connecting the probe ground to a circuit that is referenced to earth ground c an create a ground loop that may add noise to low-amplitude signals*. Rejection of high­frequency common mode signals is improved when the probe head is ungrounded.
The best recomm endation for connecting or not connecting the probe ground is to try both configurations and select the one that performs the best.
Note
The AP034 Active Differential Probe transmits the measured signal differentially through the probe cable. This essentially eliminates signal degradation from ground loop effects within the probe. However, creating a ground loop may introduce signal distortions in the test circuit itself, or in any coaxial cable between the ADPPS power supply and the test instrument.
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SELECTING THE PROPER RANGE
The AP034 Active Differential Probe has a fixed gain of X1 (unity). Use of the ÷10 or ÷20 external attenuators reduces the amplitude of the input signal when it is necess ary to extend the dynamic operating range of the probe. Attenuating the input signal increases both the differential mode range and comm on mode range of the probe.
Refer to the block diagram below.
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ControlProbe
+
1
-
1
By using the plug-on attenuator, you can extend the attenuation range to ÷20. Do not use the ÷10 and ÷20 plug-on attenuators simultaneously. The maxim um ranges are given in the f ollowing table:
Table 1. AP034 Dynamic ranges and i nput capacitance at different attenuator
Common Mode Range Differential Mode Range *
X1
Σ
+
V
Offs
Σ
X1
Figure 2. AP034 Block Diagram
settings
÷1
Attenuation
(Probe Only)
±16 V ±42 V ±42 V
±400 mV ±4 V ±8 V
*Offset moves the center point of this range.
Attenuation
+
-
÷10
X1
50
÷20
Attenuation
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When us ing a differential probe or amplifier, be ca reful to avoid exceeding the common mode range. Because the common mode signal is rejected by the differential probe, and is not displayed, changes in the amplitude of the common mode component are not apparent to the user. Exceeding the c omm on mode range may introduce distortion into the AP034 output.
Circuitry in the probe detects the presence of either attenuator, and displays the effective gain of the probe on the probe front panel.
OPERATION WITH LECROY OSCILLOSCOPES
When the AP034 probe is connected to a LeCroy oscilloscope equipped with ProBus interface, the displayed scale fac tor will be adjusted to account for the effective gain of the probe. The channel O
FFSET knob will control the probe offset, rather than the
offset at the oscilloscope input. The probe contr ol menu can be activated by pressing the COUPLING button while the channel to which the probe is attached is selected.
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Figure 3. AP034 Probe Control Menu
When the AP034 Active Differential Probe is first connected to the oscilloscope, the following message will appear: WARNING: Probe offset buttons are locked. This alerts you that offset control m ust be m ade through the os cilloscope, rather than through the buttons located on the probe. It does not indicate a failure in the probe or oscilloscope.
Correct display of scale factor with the ÷20 attenuator installed and correct operation of probe offset require that software version 8.1 or higher be loaded. Refer to the manual section Oscilloscope Software Compatibility for additional information.
AP034 USE WITH THE ADPPS POWER SUPPLY
The optional ADPPS Power Supply allows the AP034 Active Differential Probe to be used with instruments that are not equipped with the ProBus interface. When used with the ADPPS, the AP034 must be terminated into 50  ,I WKH WHVW LQVWUXPHQW input impedance is not 50  LQVHUW D   LQOLQH WHUPLQDWRU between the ADPPS and the instrument input. If a coaxial extension cable is used, the terminator should be located at the instrument end of the cable. Note that the additional parasitic losses of extension cables may reduce the usable bandwidth of the system below the AP034 specification.
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Note:
To prevent signal distortion, it is necessary to keep the AP034 output less than 400 mV at all times.
With the ProBus interface (see note on following page), the oscilloscope O Without the ProBus, it is acceptable to use the oscilloscope to position the waveform at high sensitivities , but it is a practic e that can lead to erroneous measurements when the probe output exceeds ±400 mV. Therefore, when the ADPPS is used, it is preferable to use the AP034 offset function to perform all waveform positioning.
The AP034 offset allows you to measure signals up to 2.0 V (1.6 V of offset plus 400 mV of output signal). With accessory plug-on attenuators, the effective offset is increased, and input signals of 20 V (÷10) or 40 V (÷20) may be viewed. The peak
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FFSET control actually controls the AP034 offset.
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signal that can be viewed at any equivalent scale factor is the Input Differential Mode Range plus the off set used. See Adding Offset on the following page.
When using the AP034 with the ADPPS power supply on oscilloscopes without ProBus interface, use the following table to select the desired effec tive volts per division and determine the offset available.
Equivalent
Scale
Oscilloscope Scale Factor
Factor
2 mV/Div 2 mV/Div
5 mV/Div 5 mV/Div 10 mV/Div 10 mV/Div 20 mV/Div 20 mV/Div 50 mV/Div 50 mV/Div
100 mV/Div 100 mV/Div 200 mV/Div 20 mV/Div 500 mV/Div 50 mV/Div
1 V/Div 100 mV/Div 2 V/Div 100 mV/Div
Table 2. Recommended AP034 and Os cilloscope settings to obt ain desired
AP034
Attenuation
Common
Mode Range
÷1 ±16V ±8 mV ÷1 ±16 V ±20 mV ÷1 ±16 V ±40 mV ÷1 ±16 V ±80 mV ÷1 ±16 V ±200 mV ÷1 ±16 V ±400 mV
1
÷10 ÷10 ÷10 ÷20
1
1
1
1 2
3
±42 V ±800 mV ±42 V ±2 V ±42 V ±4 V ±42 V ±8 V
Attenuation obtained using t he external ÷10 or ÷20 attenuator. Input differential mode range displayed is limi ted by ±4 divisions of vertic al scale on oscilloscope. Limited by probe output and ±4 divisions of vertical scale on oscilloscope. Oscilloscope OFFSET and POSITI ON must be set to zero.
equivalent Volts/Divi sion
Input
Differential
Mode Range
2
2
2
2
2
3
2
2
3
3
Maximum
Offset
Maximum
Observable
Signal with
Offset
±1.6 V ±1.608 V ±1.6 V ±1.620 V ±1.6 V ±1.640 V ±1.6 V ±1.680 V ±1.6 V ±1.800 V ±1.6 V ±2.0 V
±16 V ±16.8 V ±16 V ±18 V ±16 V ±20 V ±32 V ±40 V
Input Noise
(nV/Hz),
Typical
35 35 35 35 35
35 350 350 350 700
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ADDING OFFSET
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The AP034 Active Differential Probe has true differential offset capability. This allows you to remove a DC bias voltage from the differential input signal while maintaining DC coupling. By using probe offset rather than the P the full dynamic range of the probe remains centered around the offset level.
OSITION control on the oscilloscope,
+700 mV
+500 mV
+300 mV
0 mV
Input Differential
Waveform
+700 mV
+500 mV +400 mV +300 mV
0 mV
-400 mV
Waveform clipped
+700 mV
±400 mV window re-centered around the probe offset.
with no offset
+500 mV
+300 mV
±400 mV centered at 0 V
Figure 4. Effect of Dif f erential Offset
0 mV
Offset used to re-center the differential dynami c range around +500 mV
When the AP034 Active Differential Probe is used with a LeCroy oscilloscope equipped with ProBus interface, the probe offset can be controlled with the channel O
FFSET knob.* The buttons on
the probe housing will be disabled. When used with the ADPPS Power Supply on instruments that
lack ProBus support, of fset can be c ontrolled with the buttons on the probes front panel. The offset can be returned to zero at any time by briefly pressing both the Î and Ï O same time. Pres sing both the Î and Ï O
FFSET buttons at the
FFSET buttons for more
than 2 seconds will initiate an Autobalance cycle.
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*Note
Probe offset is controlled with the channel
O
FFSET knob in oscilloscope software versions
8.1.0 or higher. The current offset value is
AUTOBALANCE
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displayed above the graticule for a few seconds after a change is made by turning the knob (refer to Figure 3). In prior software versions, the channel O oscilloscope input rather than the probe offset. When the AP034 Active Differential Probe is used with LeCroy oscilloscopes with older software versions, it is important that the channel offset (controlled by the channel O remain set to 0.0000 V. Moving the displayed waveform with the channel offset rather than probe offset will not re-center the dynamic operating range of the probe. Offsetting the trace with the oscilloscope channel offset introduces the possibility of erroneous waveforms that result from overloading the probe.
The AP034 Active Differential Probe incorporates an Autobalance function to remove the DC offset from the output. Autobalance must be invoked by you. When power is first applied, the probe will return to the internal values resulting from the last Autobalance cycle. For Autobalance to function properly, all signals must be removed from the input.
FFSET knob adjusted the offset of the
FFSET knob)
After several minutes of warmup, or when the probe is exposed to a large shift in ambient tem perature, s ome DC off set dr ift m ay occur from thermal ef fects in the am plifier cir cuitry. To initiate an Autobalance cycle, remove the probe from the test circuit and select the AUTOBALANCE menu selection in the oscilloscope COUPLING menu for the channel the probe is c onnected to. If the probe is being used with the ADPPS power supply, remove the input signal, then push and hold both O
FFSET buttons for two
seconds. The AP034 must be terminated into 50 IRUVXFFHVVIXO Autobalance.
Upon successful completion of the Autobalanc e c ycle, all three of the EFFECTIVE GAIN indicators will be briefly illuminated. If an input signal is present during auto balance and the routine fails , the EFFECTIVE GAIN indicators will not illuminate. The probe will then revert to the offset values resulting from the last
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successful completion of the Autobalance cycle. In many situations, this will be adequate to make routine measurements.
DESIGNING TEST FIXTURES FOR THE AP034 PROBE
Often it is desirable to connect the probe directly to user­fabricated test fixtures, such as those used for semiconductor characterization. To facilitate use with custom test fixtures, the input receptacles used in the AP034 probe are compatible with commercially available 0.025 in. (0.635 mm) square pins. The receptacles do not require a specif ic rotational orientation for the square pin. The dimensions listed below can be used as a layout guide for a test fixture circuit board. T he recomm ended insertion depth of the pins is 0.100 in. (2.5 mm) to 0.200 in. (5.0 mm).
Top View
Looking toward circuit board
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Side View
0.100”-
0.200
0.110
0.105
0.170
0.100
Figure 5. Layout dimensions f or test fixtures
0.025 REF.
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DIFFERENTIAL MODE AND COMMON MODE
Differential probes amplify the voltage difference that appears between the + and – inputs. This voltage is referred to as the Differential Mode or Normal Mode voltage. The voltage component that is refer enced to earth ground, and is identic al on both inputs, is rejected by the amplifier. This voltage is referred to as the Common Mode voltage, because it is common to both inputs. The common mode voltage can be expressed as:
V
VCM =
DIFFERENTIAL MODE RANGE AND COMMON MODE RANGE
The Differential Mode Range is the max imum signal that can be applied between the + and – inputs without overloading the probe amplifier, resulting in “clipping” or distortion of the waveform measured by the oscilloscope.
+Input
+ V
2
-Input
The Common Mode Range is the max imum voltage with respect to earth ground that can be applied to either input. Exceeding the common mode range can result in unpredictable results. Because the Common Mode s ignal is normally rejected, and is not displayed on the oscilloscope, you need to be careful to avoid accidentally exceeding the common mode range.
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