
Test Fixtures
Device Compatibility 3323A 3327 8006 8007 8008 8009
Sheet Resistance ■■
Volume Resistance ■■
Axial Devices ■■
Chip Devices ■
T0 18 Packages 4-Lead ■
T0 5 Packages 4-Lead ■
Dual In-Line Packages ≤24-Lead ■
Prototyping Board ■
Instrument Compatibility 3323A 3327 8006 8007 8008 8009
Characterization Systems 4200-SCS ■■
DMMs 197A ■■
Nanovoltmeters 2182 ■
Sources 213 ■■
SMUs 236 ■■■
Picoammeters 428 ■■■
C-V Meters 590 ■■
Electrometers 6514 ■■■
Switching Matrix
LCZ Meters 3321 ■■
2000, 2001, 2002, 2010 ■■
707A, 708A, 7072, 7172, 7174A ■■
All test fixtures are available with an Extended Warranty.
8-Lead ■
≤28-Lead ■
≤48-Lead ■
220 ■■
224 ■■
228A ■■
230 ■■
263 ■■
237 ■■■
238 ■■■
485 ■■■
486 ■■■
487 ■■■
595 ■■
6517A ■■■■
3322 ■■
3330 ■■
Model 3323A Direct Test Fixture
The Model 3323A is designed for component
measurement by directly inserting the component
into the fixture. It can accommodate axial-lead
components or radial-lead components without
bending the component leads.
For use with: LCZ Meters.
Test fixtures
Model 3327 Chip Component Test Fixture
The Model 3327 Chip Component Test Fixture provides a convenient method for testing the impedance of chip (i.e., SMD) components. The springloaded plunger provides consistent contact pressure for measuring low impedance devices and low
predictable stray capacitance for measuring low
capacitive devices.
For use with: LCZ Meters.
1.888.KEITHLEY (U.S. only)
www.keithley.com
A GREATER MEASURE OF CONFIDENCE
INSTRUMENT ACCESSORIES

Test Fixtures
Model 8006 Component Test Fixture
The Model 8006 Component Test Fixture
was designed specifically for making sensitive measurements on standard package devices with minimal setup time. Individual components may be
connected to one of eight device sockets, including axial, 4-, 8-, 10-, and 12-lead T0, and 28-pin
DIPs. Instrumentation can be easily integrated
through the 3-lug triax, BNC, or binding post con-
Test fixtures
nectors on the rear panel.
Signals from the test instruments are accessible at
the test fixture’s front panel. Mini jumper cables
are provided to connect the signal to the appropriate device socket, which is also located on the
front panel. This unique patch-board design allows
for maximum versatility and the fastest possible
setup times.
The 8006 Test Fixture maintains accuracy throughout the test circuit with greater than 100TΩ
14
(10
Ω) path isolation, 4-wire connections, guarded jumpers, gold contacts and interconnects, and
less than 100fA offset current. A hinged lid covers
the component panel to provide a light-tight and
shielded measurement.
on Dual In-line Packages (DIPs) of 0.3 or 0.6 inch
centers and up to 48 pins with the 24- or 48-pin
socket. The prototyping board can be installed on
the front panel for customized testing of packages
with up to 72 pins.
Accuracy is maintained to the DUT with isolation
of more than 1TΩ. Offset current for the 8007 is
less than 1pA, while maximum signal voltage is
200V with 1A peak current. A hinged cover provides light-tight and shielded measurements. 72
ferrite beads are also included for custom applications when DC tests are performed on active
devices and some decoupling is required.
Supplied with interlock cable, phototyping
board, and two input cables (each terminated
with twelve 3-slot triax plugs).
Model 8008 Resistivity Chamber
The 8008 Resistivity Chamber is a guarded
test fixture for measuring volume and surface resistivities. It assures good electrostatic shielding and
high insulation resistance up to 1100V.
The 8008 accommodates sheet samples 64
to 102mm (2
3.2mm (
1
⁄2 to 4 in) in diameter and up to
1
⁄
8 in) thick. It maintains good sample con-
tact with uniform 1 pound pressure on smooth
parallel samples. A lid switch activates the voltage
disable input on the rear panel of the 487 or SMU.
The 8008 permits direct measurement of volume
resistivity up to 10
thick) and surface resistivity up to 10
18
Ω-cm (on samples 0.1cm
17
Ω/square in
accordance with ASTM procedures.
Supplied with necessary cables to use with 487
or 236, 237 and 238.
Model 8009 Resistivity Chamber
The Model 8009 is a guarded test fixture for measuring volume and surface resistivities. It assures
good electrostatic shielding and high insulation
resistance up to 1100V. The 8009 is designed for
safe operation with the 6517A. Opening the lid of
the 8009 automatically turns off the 6517A voltage
source. The 8009 accommodates sheet samples
from 64mm to 102mm (2
and up to 3.2mm (
1
⁄
2 to 4 in) in diameter
1
⁄8 in) thick. It maintains good
sample contact with uniform pressure (from 6 to
10 lbs depending on thickness) on smooth parallel
samples.
With the front panel switch on the 8009, toggle
between volume and surface resistivity, with the
6517A configured to calculate and display the
appropriate result automatically. The 8009 permits
direct measurement of volume resistivity up to
18
10
Ω-cm (on samples 0.1cm thick) and surface
resistivity up to 10
17
Ω/square, in accordance with
ASTM procedures.
Supplied with necessary cables to use with
6517A, including Model 8607 Safety HV Dual
Test Leads
ENVIRONMENTAL LIMITS: Operating: –30° to +85°C, 65% R.H.
up to 35°C, derate 3% R.H./°C above 35°C. Storage: –25° to
+85°C.
DIMENSIONS: 108mm high × 165mm wide × 140mm deep (4
in × 61⁄2 in × 51⁄2 in).
WEIGHT: 1.45kg (3.19 lbs).
1
⁄4
Model 8007 Semiconductor Test Fixture
The 8007 Semiconductor Test Fixture assures accurate measurement data for DC characterization of
packaged devices. This test fixture provides a convenient means of making sensitive measurements
1.888.KEITHLEY (U.S. only)
INSTRUMENT ACCESSORIES
www.keithley.com
ENVIRONMENTAL LIMITS: Operating: –25° to +85°C, 70% R.H.
up to 35°C. Storage: –25° to +85°C.
DIMENSIONS: 108mm high × 165mm wide × 140mm deep (4
in × 61⁄2 in × 51⁄2 in).
WEIGHT: 1.45kg (3.19 lbs).
A GREATER MEASURE OF CONFIDENCE
1
⁄4