data transfer using pipeline architecture. All inputs and
outputs signals refer to the rising edge of the clock
input.The 128Mb SDRAM is organized as follows.
Integrated Silicon Solution, Inc. — www.issi.com —
PRELIMINARY INFORMATION, Rev. 00C
01/20/05
1-800-379-4774
1
IS42S81600A, IS42S16800A, IS42S32400A
DEVICE OVERVIEW
The 128Mb SDRAM is a high speed CMOS, dynamic
random-access memory designed to operate in 3.3V VDD
and 3.3V VDDQ memory systems containing 134,217,728
bits. Internally configured as a quad-bank DRAM with a
synchronous interface. Each 33,554,432-bit bank is organized as 4,096 rows by 512 columns by 16 bits.
The 128Mb SDRAM includes an AUTO REFRESH MODE,
and a power-saving, power-down mode. All signals are
registered on the positive edge of the clock signal, CLK. All
inputs and outputs are LVTTL compatible.
The 128Mb SDRAM has the ability to synchronously burst
data at a high data rate with automatic column-address
generation, the ability to interleave between internal banks
to hide precharge time and the capability to randomly
change column addresses on each clock cycle during
burst access.
A self-timed row precharge initiated at the end of the burst
sequence is available with the AUTO PRECHARGE function enabled.
Precharge
one bank while accessing one of the
other three banks will hide the
seamless, high-speed, random-access operation.
SDRAM
a selected location and continuing for a programmed number of locations in a programmed sequence. The registration of an ACTIVE command begins accesses, followed by
a READ or WRITE command. The ACTIVE command in
conjunction with address bits registered are used to select
the bank and row to be accessed (BA0, BA1 select the
bank; A0-A11 select the row). The READ or WRITE
commands in conjunction with address bits registered are
used to select the starting column location for the burst
access.
Programmable READ or WRITE burst lengths consist of 1,
2, 4 and 8 locations or full page, with a burst terminate
option.
®
ISSI
precharge
read and write accesses are burst oriented starting at
cycles and provide
FUNCTIONAL BLOCK DIAGRAM (FOR 2MX16X4 BANKS ONLY)
CLK
CKE
CS
RAS
CAS
WE
A10
A11
A9
A8
A7
A6
A5
A4
A3
A2
A1
A0
BA0
BA1
COMMAND
DECODER
&
CLOCK
GENERATOR
ADDRESS
LATCH
12
ROW
ADDRESS LATCH
9
BURST COUNTER
ADDRESS BUFFER
MODE
REGISTER
COLUMN
COLUMN
REFRESH
CONTROLLER
12
MULTIPLEXER
REFRESH
CONTROLLER
REFRESH
COUNTER
ADDRESS
BUFFER
12
SELF
ROW
12
ROW DECODER
BANK CONTROL LOGIC
DATA IN
BUFFER
16
DATA OUT
BUFFER
1616
4096
4096
4096
4096
MEMORY CELL
SENSE AMP I/O GATE
512
(x 16)
COLUMN DECODER
9
16
2
ARRAY
BANK 0
DQML
DQMH
I/O 0-15
V
DD/VDDQ
Vss/V
ss
Q
2
Integrated Silicon Solution, Inc. — www.issi.com —
Integrated Silicon Solution, Inc. — www.issi.com —
PRELIMINARY INFORMATION Rev. 00C
01/20/05
WEWrite Enable
DQM0-DQM3x32 Input/Output Mask
VDDPower
VssGround
VDDQPower Supply for I/O Pin
VssQGround for I/O Pin
N CNo Connection
1-800-379-4774
5
IS42S81600A, IS42S16800A, IS42S32400A
PIN FUNCTIONS
SymbolTypeFunction (In Detail)
®
ISSI
A0-A11
BA0, BA1Input Pin
CAS
CKE
CLK
CS
DQML,
DQMHmode,DQML and DQMH control the output buffer. WhenDQML orDQMH is LOW, the
Input Pin
Input Pin
Input Pin
Input Pin
Input Pin
Input Pin
Address Inputs: A0-A11 are sampled during the ACTIVE
command (row-address A0-A11) and READ/WRITE command (A0-A9 (x8); A0-A8
(x16); A0-A7(x32) with A10 defining auto precharge) to select one location out of the
memory array in the respective bank. A10 is sampled during a PRECHARGE command
to determine if all banks are to be precharged (A10 HIGH) or bank selected by
BA0, BA1 (LOW). The address inputs also provide the op-code during a LOAD MODE
REGISTER command.
Bank Select Address: BA0 and BA1 defines which bank the ACTIVE, READ, WRITE or
PRECHARGE command is being applied.
CAS, in conjunction with the RAS and WE, forms the device command. See the
"Command Truth Table" for details on device commands.
The CKE input determines whether the CLK input is enabled. The next rising edge of the
CLK signal will be valid when is CKE HIGH and invalid when LOW. When CKE is LOW,
the device will be in either power-down mode, clock suspend mode, or self refresh
mode.
CKE is an asynchronous i
CLK is the master clock input for this device. Except for CKE, all inputs to this device
are acquired in synchronization with the rising edge of this pin.
The CS input determines whether command input is enabled within the device.
Command input is enabled when CS is LOW, and disabled with CS is HIGH. The device
remains in the previous state when CS is HIGH.
DQML and DQMH control the lower and upper bytes of the I/O buffers. In read
corresponding buffer byte is enabled, and when HIGH, disabled. The outputs go to the
HIGH impedance state whenDQML/DQMH is HIGH. This function corresponds to OE
in conventional DRAMs. In write mode,DQML and DQMH control the input buffer.
WhenDQML or DQMH is LOW, the corresponding buffer byte is enabled, and data can
be written to the device. WhenDQML or DQMH is HIGH, input data is masked and
cannot be written to the device.
nput.
DQM0-DQM3
DQ MInput PinFor IS42S81600A only.
RAS
WE
VDDQ
VDD
VSSQ
VSS
6
Input PinFor IS42S32400A only
Input Pin
Input Pin
Power Supply Pin
Power Supply Pin
Power Supply Pin
Power Supply Pin
RAS, in conjunction with CAS and WE, forms the device command. See the "Command
Truth Table" item for details on device commands.
WE, in conjunction with RAS and CAS, forms the device command. See the "Command
Truth Table" item for details on device commands.
VDDQ is the output buffer power supply.
VDD is the device internal power supply.
VSSQ is the output buffer ground.
VSS is the device internal ground.
Integrated Silicon Solution, Inc. — www.issi.com —
PRELIMINARY INFORMATION Rev. 00C
1-800-379-4774
01/20/05
IS42S81600A, IS42S16800A, IS42S32400A
GENERAL DESCRIPTION
READ
The READ command selects the bank from BA0, BA1
inputs and starts a burst read access to an active row.
Inputs A0-A9 (x8); A0-A8 (x16); A0-A7 (x32) provides the
starting column location. When A10 is HIGH, this command
functions as an AUTO PRECHARGE command. When the
auto precharge is selected, the row being accessed will be
precharged at the end of the READ burst. The row will
remain open for subsequent accesses when AUTO
PRECHARGE is not selected. DQ’s read data is subject to
the logic level on the DQM inputs two clocks earlier. When
a given DQM signal was registered HIGH, the corresponding DQ’s will be High-Z two clocks later. DQ’s will provide
valid data when the DQM signal was registered LOW.
WRITE
A burst write access to an active row is initiated with the
WRITE command. BA0, BA1 inputs selects the bank, and
the starting column location is provided by inputs A0-A9
(x8); A0-A8 (x16); A0-A7 (x32). Whether or not AUTOPRECHARGE is used is determined by A10.
The row being accessed will be precharged at the end of the
WRITE burst, if AUTO PRECHARGE is selected. If AUTO
PRECHARGE is not selected, the row will remain open for
subsequent accesses.
A memory array is written with corresponding input data on
DQ’s and DQM input logic level appearing at the same time.
Data will be written to memory when DQM signal is LOW.
When DQM is HIGH, the corresponding data inputs will be
ignored, and a WRITE will not be executed to that byte/
column location.
PRECHARGE
The PRECHARGE command is used to deactivate the open
row in a particular bank or the open row in all banks. BA0,
BA1 can be used to select which bank is precharged or they
are treated as “Don’t Care”. A10 determined whether one or
all banks are precharged. After executing this command,
the next command for the selected banks(s) is executed
after passage of the period tRP, which is the period required
for bank precharging. Once a bank has been precharged,
it is in the idle state and must be activated prior to any READ
or WRITE commands being issued to that bank.
AUTO PRECHARGE
The AUTO PRECHARGE function ensures that the precharge
is initiated at the earliest valid stage within a burst. This
function allows for individual-bank precharge without requiring an explicit command. A10 to enable the AUTO
PRECHARGE function in conjunction with a specific READ
or WRITE command. For each individual READ or WRITE
command, auto precharge is either enabled or disabled.
AUTO PRECHARGE does not apply except in full-page
burst mode. Upon completion of the READ or WRITE burst,
a precharge of the bank/row that is addressed is automatically performed.
AUTO REFRESH COMMAND
This command executes the AUTO REFRESH operation.
The row address and bank to be refreshed are automatically
generated during this operation. The stipulated period (tRC) is
required for a single refresh operation, and no other commands can be executed during this period. This command is
executed at least 4096 times for every 64ms. During an
AUTO REFRESH command, address bits are “Don’t Care”.
This command corresponds to CBR Auto-refresh.
BURST TERMINATE
The BURST TERMINATE command forcibly terminates the
burst read and write operations by truncating either fixedlength or full-page bursts and the most recently registered
READ or WRITE command prior to the BURST TERMINATE.
COMMAND INHIBIT
COMMAND INHIBIT prevents new commands from being
executed. Operations in progress are not affected, apart
from whether the CLK signal is enabled
NO OPERATION
When CS is low, the NOP command prevents unwanted
commands from being registered during idle or wait states.
LOAD MODE REGISTER
During the LOAD MODE REGISTER command the mode
register is loaded from A0-A11. This command can only be
issued when all banks are idle.
ACTIVE COMMAND
When the ACTIVE COMMAND is activated, BA0, BA1
inputs selects a bank to be accessed, and the address
inputs on A0-A11 selects the row. Until a PRECHARGE
command is issued to the bank, the row remains open for
accesses.
®
ISSI
Integrated Silicon Solution, Inc. — www.issi.com —
PRELIMINARY INFORMATION Rev. 00C
01/20/05
1-800-379-4774
7
IS42S81600A, IS42S16800A, IS42S32400A
ISSI
COMMAND TRUTH TABLE
CKEA11
Function Symboln – 1n
Device deselectH×H×××××××
No operationH×LHHH×××
Burst stopHHLHHL××××
ReadH×LHLHVVLV
Read with auto precharge H×LHLHVVHV
WriteH×LHLLVVLV
Write with auto precharge H×LHLLVVHV
Bank activateH×LLHHV VVV
Precharge select bankH×LLHLVVL×
Precharge all banksH×LLHL××H×
Mode register setH ×LLLLLLLV
Note: H=VIH, L=VIL x= VIH or VIL, V = Valid Data, BA= Bank Address, CA+Column Address, RA=Row Address, OC= Op-Code
10
Integrated Silicon Solution, Inc. — www.issi.com —
PRELIMINARY INFORMATION Rev. 00C
1-800-379-4774
01/20/05
IS42S81600A, IS42S16800A, IS42S32400A
ISSI
FUNCTIONAL TRUTH TABLE Continued:
CSCS
RAS RAS
CS
RAS
CSCS
RAS RAS
Read with autoH ××××DESLContinue burst to end Precharging
PrechargeLHHHxNOPContinue burst to end Precharging
LHHL×BSTILLEGAL
LHLHBA, CA, A10READ/READAILLEGAL
LHLLBA, CA, A10WRIT/ WRITAILLEGAL
LLHHBA, RAACTILLEGAL
LLHLBA, A10PRE/PALLILLEGAL
LLLH×REFILLEGAL
LLLLOC, BAMRS/EMRSILLEGAL
Write with AutoH × ×××DESLContinue burst to end -Write
Prechargerecovering with auto precharge
LHHH×NOPContinue burst to end -Write
LHHL×BSTILLEGAL
LHLHBA, CA, A10READ/READAILLEGAL
LHLLBA, CA, A10WRIT/ WRITAILLEGAL
LLHHBA, RAACTILLEGAL
LLHLBA, A10PRE/PALLILLEGAL
LLLH×REFILLEGAL
LLLLOC, BAMRS/EMRSILLEGAL
PrechargingH××××DESLNop Enter idle after tRP
LHHH×NOPNop Enter idle after tRP
LHHL×BSTILLEGAL
LHLHBA, CA, A10READ/READAILLEGAL
LHLLBA, CA, A10WRIT/WRITAILLEGAL
LLHHBA, RAACTILLEGAL
LLHLBA, A10PRE/PALLNop Enter idle after tRP
LLLH×REFILLEGAL
LLLLOC, BAMRS/EMRSILLEGAL
Row ActivatingH ××××DESLNop Enter bank active after tRCD
LHHH×NOPNop Enter bank active after tRCD
LHHL×BSTILLEGAL
LHLHBA, CA, A10READ/READAILLEGAL
LHLLBA, CA, A10WRIT/WRITAILLEGAL
LLHHBA, RAACTILLEGAL
LLHLBA, A10PRE/PALLILLEGAL
LLLH×REFILLEGAL
LLLLOC, BAMRS/EMRSILLEGAL
CASCAS
WE WE
CAS
WEAddressCommandAction
CASCAS
WE WE
(2)
(2)
(2)
(2)
recoveringwith auto precharge
(2)
(2)
(2)
(2)
(2)
(2)
(2)
(2)
(2)
(2,8)
(2)
®
Note: H=VIH, L=VIL x= VIH or VIL, V = Valid Data, BA= Bank Address, CA+Column Address, RA=Row Address, OC= Op-Code
Integrated Silicon Solution, Inc. — www.issi.com —
PRELIMINARY INFORMATION Rev. 00C
01/20/05
1-800-379-4774
11
IS42S81600A, IS42S16800A, IS42S32400A
ISSI
FUNCTIONAL TRUTH TABLE Continued:
CSCS
RAS RAS
CASCAS
CS
RAS
CSCS
RAS RAS
Write RecoveringH × ×××DESLNop Enter row active after tDPL
LHHH×NOPNop Enter row active after tDPL
LHHL×BSTNop Enter row active after tDPL
LHLHBA, CA, A10READ/READABegin read
LHLLBA, CA, A10WRIT/ WRITABegin new write
LLHHBA, RAACTILLEGAL
LLHLBA, A10PRE/PALLILLEGAL
LLLH×REFILLEGAL
LLLLOC, BAMRS/EMRSILLEGAL
Write RecoveringH××××DESLNop Enter precharge after tDPL
with AutoLHHH×NOPNop Enter precharge after tDPL
PrechargeLHHL×BSTNop Enter row active after tDPL
LHLHBA, CA, A10READ/READAILLEGAL
LHLLBA, CA, A10WRIT/WRITAILLEGAL
LLHHBA, RAACTILLEGAL
LLHLBA, A10PRE/PALLILLEGAL
LLLH ×R EFILLEGAL
LLLLOC, BAMRS/EMRSILLEGAL
RefreshH×× ××DESLEnter idle after tRC1
LHHH ×NOPNop Enter idle after tRC1
LHHL×BSTNop Enter idle after tRC1
LHLHBA, CA, A10EAD/READAILLEGAL
LHLLBA, CA, A10WRIT/WRITAILLEGAL
LLHHBA, RAACTILLEGAL
LLHLBA, A10PRE/PALLILLEGAL
LLLH×REFILLEGAL
LLLLOC, BAMRS/EMRSILLEGAL
Mode RegisterH × ×× ×DESLNop Enter idle after tRSC
AccessingLHHH×NOPNop Enter idle after tRSC
LHHL×BSTNop Enter idle after tRSC
LHLHBA, CA, A10READ/READAILLEGAL
LHLLBA, CA, A10WRIT/WRITAILLEGAL
LLHHBA, RAACTILLEGAL
LLHLBA, A10PRE/PALLILLEGAL
LLLH×REFILLEGAL
LLLLOC, BAMRS/EMRSILLEGAL
WE WE
CAS
WEAddressCommandAction
CASCAS
WE WE
(6)
(2)
(2)
(2, 6)
(2)
(2)
®
Note: H=VIH, L=VIL x= VIH or VIL, V = Valid Data, BA= Bank Address, CA+Column Address, RA=Row Address, OC= Op-Code
12
Integrated Silicon Solution, Inc. — www.issi.com —
PRELIMINARY INFORMATION Rev. 00C
1-800-379-4774
01/20/05
IS42S81600A, IS42S16800A, IS42S32400A
ISSI
FUNCTIONAL TRUTH TABLE Continued:
Notes:
1. All entries assume that CKE is active (CKEn-1=CKEn=H).
2. Illegal to bank in specified states; Function may be legal in the bank indicated by Bank Address (BA), depending on the
state of that bank.
3. Illegal if tRCD is not satisfied.
4. Illegal if tRAS is not satisfied.
5. Must satisfy burst interrupt condition.
6. Must satisfy bus contention, bus turn around, and/or write recovery requirements.
7. Must mask preceding data which don’t satisfy tDPL.
8. Illegal if tRRD is not satisfied.
®
Integrated Silicon Solution, Inc. — www.issi.com —
PRELIMINARY INFORMATION Rev. 00C
01/20/05
1-800-379-4774
13
IS42S81600A, IS42S16800A, IS42S32400A
STATE DIAGRAM
Extended
Mode
Register
Set
SELF
Mode
Register
Set
EMRS
MRS
IDLE
SELF exit
REF
®
ISSI
Self
Refresh
CBR (Auto)
Refresh
WRITE
SUSPEND
WRITEA
SUSPEND
CKE
CKE
CKE
Write
Deep
Power
Down
WRITE
WRITEA
DPD
DPD Exit
BST
Write
Write with
RRE (Precharge term
ACT
Row
Active
Auto Precharge
Read
Auto Precharge
Write
ination)
CKE
CKE
CKE
CKE
BST
Read
Read with
READ
READA
PRE (Precharge termination)
Power
Down
Active
Power
Down
Read
CKE
CKECKE
CKE
CKE
READ
SUSPEND
READA
SUSPEND
14
POWER
ON
Precharge
Precharge
Automatic sequence
Manual Input
Integrated Silicon Solution, Inc. — www.issi.com —
PRELIMINARY INFORMATION Rev. 00C
1-800-379-4774
01/20/05
IS42S81600A, IS42S16800A, IS42S32400A
®
ISSI
ABSOLUTE MAXIMUM RATINGS
(1)
SymbolParametersRatingUnit
VDDMAXMaximum Supply Voltage–0.5 to +4.6V
VDDQ
MAXMaximum Supply Voltage for Output Buffer0.5 to +4.6V
VINInput Voltage–0.5 to +4.6V
VOUTOutput Voltage–0.5 to +4.6V
PDMAXAllowable Power Dissipation1W
ICSOutput Shorted Current50mA
TOPROperating TemperatureCom.0 to +70° C
Ind.–40 to +85
TSTGStorage Temperature–55 to +125°C
Notes:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to
the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect reliability.
2. All voltages are referenced to Vss.
DC RECOMMENDED OPERATING CONDITIONS
(2)
(At TA = 0 to +70°C)
SymbolParameterMin.Typ.Max.Unit
VDDSupply Voltage3.03.33.6V
VDDQI/O Supply Voltage3.03.33.6V
(1)
VIH
(2)
VIL
Note:
IH (max) = VDDQ +1.5V (PULSEWIDTH < 5NS).
1. V
2. VIL (min) = -1.5V (PULSEWIDTH < 5NS).
Input High Voltage2.0—VDDQ + 0.3V
Input Low Voltage-0.3—+0.8V
CAPACITANCE CHARACTERISTICS (At TA = 0 to +25°C, VDD = VDDQ= 3.3 ± 0.3V, f = 1 MHz)
Integrated Silicon Solution, Inc. — www.issi.com —
PRELIMINARY INFORMATION Rev. 00C
01/20/05
1-800-379-4774
15
IS42S81600A, IS42S16800A, IS42S32400A
ISSI
DC ELECTRICAL CHARACTERISTICS (Recommended Operation Conditions unless otherwise noted.)
Symbol ParameterTest ConditionSpeed Min.Max.Unit
I
ILInput Leakage Current0V ≤ VIN≤ VCC, with pins other than–55µA
the tested pin at 0V
IOLOutput Leakage CurrentOutput is disabled, 0V ≤ VOUT≤ VCC–55µA
VOHOutput High Voltage LevelIOUT = –2 mA2. 4—V
VOLOutput Low Voltage LevelIOUT = +2 mA—0. 4V
1. These are the values at the minimum cycle time. Since the currents are transient, these values decrease as the cycle time
increases. Also note that a bypass capacitor of at least 0.01 µF should be inserted between V
chip to suppress power supply voltage noise (voltage drops) due to these transient currents.
DD1 and IDD4 depend on the output load. The maximum values for Icc1 and Icc4 are obtained with the output open state.
2. I
(1,2)
(1)
One Bank Operation,Com.-6—170mA
Com.-7—160mA
Burst Length=1Ind.-7—170m A
tRC≥ tRC (min.)Com.-10—140mA
IOUT = 0mAInd.-10—150m A
Ind.——45mA
Ind.——35mA
Com.-6—165mA
IOUT = 0mAInd.-7—160mA
Com.-10—140mA
Ind.-10—150mA
Com.-6—330mA
Ind.-7—330mA
Com.-10—270mA
Ind.-10—300mA
Ind.——3mA
DD and Vss for each memory
16
Integrated Silicon Solution, Inc. — www.issi.com —
PRELIMINARY INFORMATION Rev. 00C
1-800-379-4774
01/20/05
IS42S81600A, IS42S16800A, IS42S32400A
®
ISSI
AC ELECTRICAL CHARACTERISTICS
(1,2,3)
-6-7-10
SymbolParameterMin.Max.Min.Max.Min.MaxUnits
CK3Clock Cycle TimeCAS Latency = 36—7—1 0—n s
t
tCK2CAS Latency = 2——10—10—ns
t
AC3Access Time From CLK
(4)
CAS Latency = 3—5.4—5.4—7ns
tAC2CAS Latency = 2———6—9ns
tCHICLK HIGH Level Width2.5—2.5—3.5—n s
tCLCLK LOW Level Width2.5—2.5—3.5—ns
OH3Output Data Hold TimeCAS Latency = 32.5—2.5—2.5—ns
t
tOH2CAS Latency = 22.5—2.5—2.5—ns
tLZOutput LOW Impedance Time0—0—0—ns
HZ3Output HIGH Impedance Time
t
(5)
CAS Latency = 3—6—6—7ns
tHZ2CAS Latency = 2—6—6—9n s
(2,3)
(2,3)
(2,3)
(2,3)
(2,3)
(2,3)
(2,3)
(2,3)
1.5—1.5—2.0—n s
0.8—0.8—1—ns
1.5—1.5—2.0—n s
0.8—0.8—1—ns
1.5—1.5—2.0—n s
0.8—0.8—1—ns
1CLK+3
—
1CLK+3
—
1CLK+3
—ns
1.5—1.5—2.0—n s
0.8—0.8—1—ns
tDSInput Data Setup Time
tDHInput Data Hold Time
tASAddress Setup Time
tAHAddress Hold Time
tCKSCKE Setup Time
tCKHCKE Hold Time
tCKACKE to CLK Recovery Delay Time
tCSCommand Setup Time (CS, RAS, CAS, WE, DQM)
tCHCommand Hold Time (CS, RAS, CAS, WE, DQM)
tRCCommand Period (REF to REF / ACT to ACT)60—63—70—n s
tRASCommand Period (ACT to PRE)37
120,000
37
120,000
44
120,000
tRPCommand Period (PRE to ACT)18—18—20—n s
tRCDActive Command To Read / Write Command Delay Time1 8—18—20—n s
tRRDCommand Period (ACT [0] to ACT[1])12—14—15—n s
tDPL3Input Data To PrechargeCAS Latency = 32CLK—2CLK—2CLK—ns
Command Delay time
tDPL2CAS Latency = 22CLK—2CLK—2CLK—ns
tDAL3Input Data To Active / Refresh CAS Latency = 3
2CLK+tRP
—
2CLK+tRP
—
2CLK+tRP
—ns
Command Delay time (During Auto-Precharge)
tDAL2CAS Latency = 2
2CLK+tRP
—
2CLK+tRP
—
2CLK+tRP
—ns
tTTransition Time0.5300.5300.530ns
tREFRefresh Cycle Time (4096)—64—64—64ms
Notes:
1. When power is first applied, memory operation should be started 100 µs after V
Also note that the power-on sequence must be executed before starting memory operation.
2. Measured with t
3. Assumed input rise and fall time (t
considered and (t
4. Access time is measured at 1.5V with the load shown in the figure below.
5. The time t
when the output is in the high impedance state.
T = 1 ns. If clock rising time is longer than 1ns, (tR /2 - 0.5) ns should be added to the parameter.
R & tF) = 1ns. If tR and tF are longer than 1ns, transient time compensation should be
R + tF) / 2-1 ns should be added to the parameter.
HZ (max.) is defined as the time required for the output voltage to transition by ± 200 mV from VOH (min.) or VOL (max.)
DD and VDDQ reach their stipulated voltages.
ns
Integrated Silicon Solution, Inc. — www.issi.com —
PRELIMINARY INFORMATION Rev. 00C
01/20/05
1-800-379-4774
17
IS42S81600A, IS42S16800A, IS42S32400A
ISSI
OPERATING FREQUENCY / LATENCY RELATIONSHIPS
SYMBOLPARAMETER- 6-7-10.UNITS
—Clock Cycle Time671 0ns
—Operating Frequency166143100MHz
tCCDREAD/WRITE command to READ/WRITE command111cycle
tCKEDCKE to clock disable or power-down entry mode111cycle
tPEDCKE to clock enable or power-down exit setup mode111cycle
tDQDDQM to input data delay000cycle
tDQMDQM to data mask during WRITEs000cycle
tDQZDQM to data high-impedance during READs222cycle
tDWDWRITE command to input data delay000cycle
tDALData-in to ACTIVE command544cycle
tDPLData-in to PRECHARGE command222cycle
tBDLLast data-in to burst STOP command111cycle
®
tCDLLast data-in to new READ/WRITE command111cycle
tRDLLast data-in to PRECHARGE command222cycle
tMRDLOAD MODE REGISTER command222cycle
to ACTIVE or REFRESH command
tROHData-out to high-impedance fromCL = 3333cycle
PRECHARGE commandCL = 2222
18
Integrated Silicon Solution, Inc. — www.issi.com —
PRELIMINARY INFORMATION Rev. 00C
1-800-379-4774
01/20/05
IS42S81600A, IS42S16800A, IS42S32400A
AC TEST CONDITIONS
Input LoadOutput Load
t
CK
CLK
INPUT
3.0V
1.5V
0V
3.0V
1.5V
0V
t
t
OH
CS
CHI
t
t
CH
t
AC
t
CL
Output
Z
= 50Ω
®
ISSI
1.5V
50Ω
30 pF
OUTPUT
1.5V1.5V
AC TEST CONDITIONS
ParameterUnit
AC High Level Input Voltage/Low Level Input Voltage3.0V to 0V
Input Rise and Fall Times1 ns
Input Timing Reference Level1.5V
Output Timing Measurement Reference Level1.5V
Integrated Silicon Solution, Inc. — www.issi.com —
PRELIMINARY INFORMATION Rev. 00C
01/20/05
1-800-379-4774
19
Loading...
+ 42 hidden pages
You need points to download manuals.
1 point = 1 manual.
You can buy points or you can get point for every manual you upload.