IOR IRF7821 User Manual

Applications
A
l High Frequency Point-of-Load
Synchronous Buck Converter for Applications in Networking & Computing Systems.
Benefits
DS(on)
at 4.5V V
GS
and Current
HEXFET® Power MOSFET
V
DSS
30V 9.1mW@V
1
S
2
S
3
S
4
Top View
8
7
6
5
R
DS(on)
A
D
D
D
DG
PD - 94579B
IRF7821
max Qg(typ.)
= 10V 9.3nC
GS
SO-8
Absolute Maximum Ratings
V
DS
V
GS
@ TA = 25°C
I
D
@ TA = 70°C
I
D
I
DM
PD @TA = 25°C
@TA = 70°C
P
D
T
J
T
STG
Parameter Units
Drain-to-Source Voltage V Gate-to-Source Voltage Continuous Drain Current, V Continuous Drain Current, V Pulsed Drain Current Power Dissipation Power Dissipation
Linear Derating Factor W/°C Operating Junction and °C
Storage Temperature Range
c f f
@ 10V
GS
@ 10V
GS
Max.
30
± 20
13.6 11
100
2.5
1.6
0.02
-55 to + 155
A
W
Thermal Resistance
Parameter Typ. Max. Units
R
θJL
R
θJA
Junction-to-Drain Lead Junction-to-Ambient
fg
g
––– 20 °C/W ––– 50
Notes through  are on page 10
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1/14/03
IRF7821
/
Static @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units
BV
DSS
∆ΒV
DSS
R
DS(on)
V
GS(th)
V
GS(th)
I
DSS
I
GSS
gfs Forward Transconductance 22 ––– ––– S Q
g
Q
gs1
Q
gs2
Q
gd
Q
godr
Q
sw
Q
oss
t
d(on)
t
r
t
d(off)
t
f
C
iss
C
oss
C
rss
Drain-to-Source Breakdown Voltage 30 ––– ––– V
T
Breakdown Voltage Temp. Coefficient ––– 0.025 ––– V/°C
J
Static Drain-to-Source On-Resistance ––– 7.0 9.1
––– 9.5 12.5 Gate Threshold Voltage 1.0 ––– ––– V Gate Threshold Voltage Coeffic i ent ––– - 4.9 ––– mV/°C Drain-to-Source Leakage Current ––– ––– 1.0 µA
––– ––– 150 Gate-to-Source Forward Leakage ––– ––– 100 nA Gate-to-Source Reverse Leakage ––– ––– -100
Total Gate Charge ––– 9.3 14 Pre-Vth Gate-to-Source Charge ––– 2.5 ––– Post-Vth Gate-to-Sourc e Charge ––– 0.8 ––– nC Gate-to-Drain Charge ––– 2.9 ––– Gate Charge Overdrive ––– 3.1 ––– See Fig. 16 Switch Charge (Q
gs2
+ Qgd)
––– 3.7 ––– Output Charge ––– 6.1 ––– nC Turn-On Delay Time ––– 6.3 ––– Rise Time ––– 2.7 ––– Turn-Off Delay Time ––– 9.7 ––– ns Fall Time ––– 7.3 ––– Input Capacitance ––– 1010 ––– Output Capacitance ––– 360 ––– pF Reverse Transfer Capacitance ––– 110 –––
VGS = 0V, ID = 250µA Reference to 25°C, I V
m
= 10V, ID = 13A
GS
= 4.5V, ID = 10A
V
GS
V
= VGS, ID = 250µA
DS
= 24V, VGS = 0V
V
DS
V
= 24V, VGS = 0V, TJ = 125°C
DS
V
= 20V
GS
V
= -20V
GS
V
= 15V, ID = 10A
DS
= 15V
V
DS
VGS = 4.5V
= 10A
I
D
V
= 10V, VGS = 0V
DS
V
= 15V, VGS = 4.5V
DD
ID = 10A Clamped Inductive Load
V
= 0V
GS
V
= 15V
DS
ƒ = 1.0MHz
Conditions
= 1mA
D
e
e
e
Avalanche Characteristics
E
AS
I
AR
Single Pulse Avalanche Energy Avalanche Current
c
dh
Parameter Units
Typ.
––– –––
Max.
44 10
mJ
A
Diode Characteristics
Parameter Min. Typ. Max. Units
I
S
Continuous Source Current ––– ––– 3.1 (Body Diode) A
I
SM
V
SD
t
rr
Q
rr
Pulsed Source Current ––– ––– 100 (Body Diode)
ch
Diode Forward Voltage ––– ––– 1.0 V Reverse Recovery Time ––– 28 42 ns Reverse Recovery Charge ––– 23 35 nC
MOSFET symbol showing the
integral reverse p-n junction diode.
TJ = 25°C, IS = 10A, VGS = 0V
= 25°C, IF = 10A, VDD = 10V
T
J
di/dt = 100A/µs
Conditions
e
e
2 www.irf.com
IRF7821
100
) A
(
t
n
e
r
10
r
u C e
c
r
u
o S
-
o
t
-
1
n
i
a
r D
,
D
I
2.5V
20µs PULSE WIDTH Tj = 25°C
0.1
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
100.0
TJ = 150°C
)
Α
(
t
n
e
r
10.0
r
u C e
c
r
u
o S
-
o
t
-
1.0
n
i
a
r D
,
D
I
0.1
2.0 3.0 4.0 5.0 6.0
TJ = 25°C
V
= 15V
DS
20µs PULSE WIDTH
VGS, Gate-to-Source Voltage (V)
VGS
TOP 10V
4.5V
3.7V
3.5V
3.3V
3.0V
2.7V BOTTOM 2.5V
100
) A
(
t
n
e
r
r
u C e
c
r
10
u
o S
-
o
t
-
n
i
a
r D
,
D
I
2.5V
20µs PULSE WIDTH
VGS
TOP 10V
4.5V
3.7V
3.5V
3.3V
3.0V
2.7V BOTTOM 2.5V
Tj = 150°C
1
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
2.0
e
c
n
a
t
s
i
s
e R n O e
c
r
u
o S
-
o
t
-
n
i
a
r D
,
)
n
o
( S D
R
ID = 13A V
= 10V
GS
1.5
)
d
e
z
i
l
a m
r
o N
(
1.0
0.5
-60 -40 -20 0 20 40 60 80 100 120 140 160
TJ , Junction Temperature (°C)
Fig 3. Typical Transfer Characteristics
Fig 4. Normalized On-Resistance
Vs. Temperature
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