intersil ISL6207 DATA SHEET

®
ISL6207
Data Sheet December 2, 2005
High Voltage Synchronous Rectified Buck MOSFET Driver
The ISL6207 is a high frequency, dual MOSFET driver, optimized to drive two N-Channel power MOSFETs in a synchronous-rectified buck converter topology in mobile computing applications. This driver, combined with an Intersil Multi-Phase Buck PWM controller, such as ISL6223, ISL6215, and ISL6216, forms a complete single-stage core-voltage regulator solution for advanced mobile microprocessors.
The ISL6207 features 4A typical sink current for the lower gate driver. The 4A typical sink current is capable of holding the lower MOSFET gate during the Phase node rising edge to prevent the shoot-through power loss caused by the high dv/dt of the Phase node. The operation voltage matches the 30V breakdown voltage of the MOSFETs commonly used in mobile computer power supplies.
The ISL6207 also features a three-state PWM input that, working together with most of Intersil multiphase PWM controllers, will prevent a negative transient on the output voltage when the output is being shut down. This feature eliminates the Schottky diode, that is usually seen in a microprocessor power system for protecting the microprocessor, from reversed-output-voltage damage.
The ISL6207 has the capacity to efficiently switch power MOSFETs at frequencies up to 2MHz. Each driver is capable of driving a 3000pF load with a 15ns propagation delay and less than a 10ns transition time. This product implements bootstrapping on the upper gate with an internal bootstrap Schottky diode, reducing implementation cost, complexity, and allowing the use of higher performance, cost effective N-Channel MOSFETs. Adaptive shoot-through protection is integrated to prevent both MOSFETs from conducting simultaneously.
FN9075.8
Features
• Drives Two N-Channel MOSFETs
• Adaptive Shoot-Through Protection
• 30V Operation Voltage
•0.4Ω On-Resistance and 4A Sink Current Capability
• Supports High Switching Frequency
- Fast Output Rise Time
- Short Propagation Delays
• Three-State PWM Input for Power Stage Shutdown
• Internal Bootstrap Schottky Diode
• QFN Package:
- Compliant to JEDEC PUB95 MO-220 QFN - Quad Flat No Leads - Package Outline
- Near Chip Scale Package footprint, which improves PCB efficiency and has a thinner profile
• Pb-Free Plus Anneal Available (RoHS Compliant)
Applications
• Core Voltage Supplies for Intel and AMD® Mobile Microprocessors
• High Frequency Low Profile DC/DC Converters
• High Current Low Output Voltage DC/DC Converters
• High Input Voltage DC/DC Converters
Related Literature
• Technical Brief TB363 “Guidelines for Handling and Processing Moisture Sensitive Surface Mount Devices (SMDs)”
• Technical Brief TB389 “PCB Land Pattern Design and Surface Mount Guidelines for QFN Packages”
Pinouts
ISL6207 (SOIC-8)
TOP VIEW
UGATE
1
2
BOOT
3
PWM
4
GND
1
Copyright © Intersil Americas Inc. 2003-2005. All Rights Reserved. All other trademarks mentioned are the property of their respective owners.
Intel® is a registered trademark of Intel Corporation.
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 1-888-468-3774
| Intersil (and design) is a registered trademark of Intersil Americas Inc.
8
PHASE
7
EN
6
VCC
5
LGATE
AMD® is a registered trademark of Advanced Micro Devices, Inc.
BOOT
PWM
ISL6207 (QFN)
TOP VIEW
UGATE
7
8
1
2
43
GND
PHASE
LGATE
6
6
5
EN
VCC
ISL6207
Ordering Information
PART
NUMBER
ISL6207CB ISL6207CB -10 to 85 8 Lead SOIC M8.15
ISL6207CBZ (Note)
ISL6207CBZA (Note)
ISL6207CR 207C -10 to 85 8 Lead 3x3 QFN L8.3x3
ISL6207CRZ (Note)
ISL6207CRZA (Note)
ISL6207HBZ (Note)
ISL6207HRZ (Note)
Add “-T” suffix for tape and reel. NOTE: Intersil Pb-free plus anneal products employ special Pb-free material sets; molding compounds/die attach materials and 100% matte tin plate termination finish, which are RoHS compliant and compatible with both SnPb and Pb-free soldering operations. Intersil Pb-free products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020.
PAR T
MARKING
ISL6207CBZ -10 to 85 8 Lead SOIC
ISL6207CBZ -10 to 85 8 Lead SOIC
07CZ -10 to 85 8 Lead 3x3 QFN
07CZ -10 to 85 8 Lead 3x3 QFN
TEMP.
RANGE (°C) PACKAGE
(Pb-free)
(Pb-free)
(Pb-free)
(Pb-free)
ISL6207HBZ -10 to 100 8 Ld SOIC (Pb-
free)
07HZ -10 to 100 8 Ld 3x3 QFN
(Pb-free)
PKG.
DWG. #
M8.15
M8.15
L8.3x3
L8.3x3
M8.15
L8.3x3
ISL6207 Block Diagram
VCC
EN
PWM
VCC
10K
10K
CONTROL
LOGIC
SHOOT-
THROUGH
PROTECTION
VCC
THERMAL PAD (FOR QFN PACKAGE ONLY)
BOOT
UGATE
PHASE
LGATE
GND
2
FN9075.8
December 2, 2005
ISL6207
Typical Application - Two Phase Converter Using ISL6207 Gate Drivers
V
BAT
+5V
+5V
DRIVE
ISL6207
BOOT
UGATE
PHASE
LGATE
V
BAT
PGOOD
VID
+5V
FB
VSEN
CONTROL
VCC
MAIN
COMP
PWM1
PWM2
ISEN1
ISEN2
VCC
EN
PWM
+5V
+V
CORE
FS
DACOUT
GND
EN
PWM
VCC
DRIVE
ISL6207
BOOT
UGATE
PHASE
LGATE
3
FN9075.8
December 2, 2005
ISL6207
Absolute Maximum Ratings Thermal Information
Supply Voltage (VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3V to 7V
Input Voltage (V
BOOT Voltage (V BOOT to PHASE Voltage (V
PHASE Voltage . . . . . . . . . . . . . GND - 0.3V (DC) to V
. . . . . . . . . GND - 5V (<100ns Pulse Width, 10µJ) to V
UGATE Voltage . . . . . . . . . . V
. . . . . . .V
LGATE Voltage . . . . . . . . . . . . . . GND - 0.3V (DC) to V
PHASE
. . . . . . . . . . . GND - 2V (<100ns Pulse Width, 4µJ) to V
Ambient Temperature Range . . . . . . . . . . . . . . . . . . . -40°C to 125°C
, V
EN
BOOT
- 4V (<200ns Pulse Width, 20µJ) to V
). . . . . . . . . . . . . . . -0.3V to VCC + 0.3V
PWM
). . . . . . . . . . . . . . . . . . . . . . . . -0.3V to 36V
BOOT-PHASE
PHASE
) . . . . . . . . . . . -0.3V to 7V
- 0.3V (DC) to V
BOOT
BOOT BOOT BOOT
VCC VCC
+ 0.3V
+ 0.3V + 0.3V + 0.3V + 0.3V + 0.3V
Recommended Operating Conditions
Ambient Temperature Range . . . . . . . . . . . . . . . . . . . -10°C to 100°C
Maximum Operating Junction Temperature . . . . . . . . . . . . . . 125°C
Supply Voltage, V
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5V ±10%
CC
NOTES:
1. The Phase Voltage is capable of withstanding -7V when the BOOT pin is at GND. is measured with the component mounted on a high effective thermal conductivity test board in free air. See Tech Brief TB379 for details.
2. θ
JA
3. θ
is measured in free air with the component mounted on a high effective thermal conductivity test board with “direct attach” features. See
JA
Tech Brief TB379.
4. For θ
, the “case temp” location is the center of the exposed metal pad on the package underside.
JC
Electrical Specifications Recommended Operating Conditions, Unless Otherwise Noted.
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
VCC SUPPLY CURRENT
Bias Supply Current I
Bias Supply Current I
VCC
VCC
BOOTSTRAP DIODE
Forward Voltage V
PWM INPUT
Input Current I
PWM
PWM Three-State Rising Threshold V
PWM Three-State Falling Threshold V
Three-State Shutdown Holdoff Time V
EN INPUT
EN LOW Threshold 1.0 - - V
EN HIGH Threshold --2.0V
SWITCHING TIME
UGATE Rise Time (Note 5) t
LGATE Rise Time (Note 5) t
UGATE Fall Time (Note 5) t
LGATE Fall Time (Note 5) t
UGATE Turn-Off Propagation Delay t
LGATE Turn-Off Propagation Delay t
RUGATEVVCC
RLGATE
FUGATEVVCC
FLGATEVVCC
PDLUGATEVVCC
PDLLGATEVVCC
EN = LOW - - 5.0 µA
PWM pin floating, V
V
F
= 5V, forward bias current = 2mA 0.45 0.60 0.65 V
VCC
V
= 5V - 250 - µA
PWM
V
= 0V - -250 - µA
PWM
= 5V - - 1.7 V
VCC
= 5V 3.3 - - V
VCC
= 5V, temperature = 25°C - 300 - ns
VCC
= 5V, 3nF Load - 8 - ns
V
= 5V, 3nF Load - 8 - ns
VCC
= 5V, 3nF Load - 8 - ns
= 5V, 3nF Load - 4 - ns
= 5V, Outputs Unloaded - 18 - ns
= 5V, Outputs Unloaded - 15 - ns
Thermal Resistance (Typical) θ
(°C/W) θJC (°C/W)
JA
SOIC Package (Note 2) . . . . . . . . . . . . 110 N/A
QFN Package (Notes 3, 4). . . . . . . . . . 95 36
Maximum Junction Temperature (Plastic Package) . . . . . . . . 150°C
Maximum Storage Temperature Range. . . . . . . . . . . -65°C to 150°C
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . . 300°C
(SOIC - Lead Tips Only)
= 5V - 30 - µA
VCC
4
FN9075.8
December 2, 2005
ISL6207
Electrical Specifications Recommended Operating Conditions, Unless Otherwise Noted. (Continued)
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
UGATE Turn-On Propagation Delay t
LGATE Turn-On Propagation Delay t
OUTPUT
Upper Drive Source Resistance R
Upper Driver Source Current (Note 5) I
Upper Drive Sink Resistance R
Upper Driver Sink Current (Note 5) I
Lower Drive Source Resistance R
Lower Driver Source Current (Note 5) I
Lower Drive Sink Resistance R
Lower Driver Sink Current (Note 5) I
NOTE:
5. Guaranteed by characterization, not 100% tested in production.
PDHUGATEVVCC
PDHLGATEVVCC
UGATE
UGATE
UGATE
UGATE
LGATE
LGATE
LGATE
LGATE
= 5V, Outputs Unloaded 10 20 30 ns
= 5V, Outputs Unloaded 10 20 30 ns
500mA Source Current - 1.0 2.5
-10°C to 85°C - 1.0 2.2
V
UGATE-PHASE
500mA Sink Current - 1.0 2.5
-10°C to 85°C - 1.0 2.2
V
UGATE-PHASE
500mA Source Current - 1.0 2.5
-10°C to 85°C - 1.0 2.2
V
LGATE
500mA Sink Current - 0.4 1.0
-10°C to 85°C - 0.4 0.8
V
LGATE
= 2.5V - 2.0 - A
= 2.5V - 2.0 - A
= 2.5V - 2.0 - A
= 2.5V - 4.0 - A
Functional Pin Description
UGATE (Pin 1 for SOIC-8, Pin 8 for QFN)
The UGATE pin is the upper gate drive output. Connect to the gate of high-side power N-Channel MOSFET.
BOOT (Pin 2 for SOIC-8, Pin 1 for QFN)
BOOT is the floating bootstrap supply pin for the upper gate drive. Connect the bootstrap capacitor between this pin and the PHASE pin. The bootstrap capacitor provides the charge to turn on the upper MOSFET. See the Bootstrap Diode and Capacitor section under DESCRIPTION for guidance in choosing the appropriate capacitor value.
PWM (Pin 3 for SOIC-8, Pin 2 for QFN)
The PWM signal is the control input for the driver. The PWM signal can enter three distinct states during operation, see the three-state PWM Input section under DESCRIPTION for further details. Connect this pin to the PWM output of the controller. In addition, place a 500k resistor to ground from this pin. This allows for proper three-state operation under all start-up conditions.
GND (Pin 4 for SOIC-8, Pin 3 for QFN)
GND is the ground pin. All signals are referenced to this node.
LGATE (Pin 5 for SOIC-8, Pin 4 for QFN)
LGATE is the lower gate drive output. Connect to gate of the low-side power N-Channel MOSFET.
VCC (Pin 6 for SOIC-8, Pin 5 for QFN)
Connect the VCC pin to a +5V bias supply. Place a high quality bypass capacitor from this pin to GND.
EN (Pin 7 for SOIC-8, Pin 6 for QFN)
EN is the enable input pin. Connect this pin to HIGH to enable, and LOW to disable, the IC. When disabled, the IC draws less than 1µA bias current.
PHASE (Pin 8 for SOIC-8, Pin 7 for QFN)
Connect the PHASE pin to the source of the upper MOSFET and the drain of the lower MOSFET. This pin provides a return path for the upper gate driver.
Description
Operation
Designed for speed, the ISL6207 dual MOSFET driver controls both high-side and low-side N-Channel FETs from one externally provided PWM signal.
A rising edge on PWM initiates the turn-off of the lower MOSFET (see Timing Diagram). After a short propagation delay [t
PDLLGATE
times [t
FLGATE
section. Adaptive shoot-through circuitry monitors the LGATE voltage and determines the upper gate delay time [t
PDHUGATE
below 1V. This prevents both the lower and upper MOSFETs from conducting simultaneously, or shoot-through. Once this delay period is completed, the upper gate drive begins to rise [t
RUGATE
], and the upper MOSFET turns on.
], the lower gate begins to fall. Typical fall
] are provided in the Electrical Specifications
], based on how quickly the LGATE voltage drops
5
FN9075.8
December 2, 2005
ISL6207
PWM
UGATE
LGATE
t
PDLLGATE
t
FLGATE
t
PDHUGATE
1V
t
RUGATE
FIGURE 1. TIMING DIAGRAM
A falling transition on PWM indicates the turn-off of the upper MOSFET and the turn-on of the lower MOSFET. A short propagation delay [t
PDLUGATE
upper gate begins to fall [t
] is encountered before the
FUGATE
]. Again, the adaptive shoot­through circuitry determines the lower gate delay time t
PDHLGATE
. The upper MOSFET gate-to-source voltage is
monitored, and the lower gate is allowed to rise, after the
upper MOSFET gate-to-source voltage drops below 1V. Th e
lower gate then rises [t
RLGATE
], turning on the lower
MOSFET.
This driver is optimized for converters with large step down ratio, such as those used in a mobile-computer core voltage regulator. The lower MOSFET is usually sized much larger.
This driver is optimized for converters with large step down compared to the upper MOSFET because the lower MOSFET conducts for a much longer time in a switching period. The lower gate driver is therefore sized much larger to meet this application requirement. The 0.4 on-resistance and 4A sink current capability enable the lower gate driver to absorb the current injected to the lower gate through the drain-to-gate capacitor of the lower MOSFET and prevent a shoot through caused by the high dv/dt of the phase node.
Three-State PWM Input
A unique feature of the ISL6207 and other Intersil drivers is the addition of a shutdown window to the PWM input. If the PWM signal enters and remains within the shutdown window for a set holdoff time, the output drivers are disabled and both MOSFET gates are pulled and held low. The shutdown state is removed when the PWM signal moves outside the shutdown window. Otherwise, the PWM rising and falling thresholds outlined in the ELECTRICAL SPECIFICATIONS determine when the lower and upper gates are enabled. During start-up, PWM should be in the three-state position (1/2 V elements for PWM are not active until V
). However, with rising VCC, the active tracking
CC
> 1.2V, which
CC
t
PDLUGATE
t
FUGATE
1V
t
RLGATE
t
PDHLGATE
leaves PWM in a high impedance (undetermined) state; therefore, a 500k resistor must be place from the PWM pin to GND.
Adaptive Shoot-Through Protection
Both drivers incorporate adaptive shoot-through protection to prevent upper and lower MOSFETs from conducting simultaneously and shorting the input supply. This is accomplished by ensuring the falling gate has turned off one MOSFET before the other is allowed to turn on.
During turn-off of the lower MOSFET, the LGATE voltage is monitored until it reaches a 1V threshold, at which time the UGATE is released to rise. Adaptive shoot-through circuitry monitors the upper MOSFET gate-to-source voltage during UGATE turn-off. Once the upper MOSFET gate-to-source voltage has dropped below a threshold of 1V, the LGATE is allowed to rise.
Internal Bootstrap Diode
This driver features an internal bootstrap Schottky diode. Simply adding an external capacitor across the BOOT and PHASE pins completes the bootstrap circuit.
The bootstrap capacitor must have a maximum voltage rating above the maximum battery voltage plus 5V. The bootstrap capacitor can be chosen from the following equation:
Q
GATE
C
BOOT
where Q charge the gate of the upper MOSFET. The ∆V defined as the allowable droop in the rail of the upper drive.
As an example, suppose an upper MOSFET has a gate charge, Q the drive voltage over a PWM cycle is 200mV. One will find that a bootstrap capacitance of at least 0.125µF is required.
------------------------
V
BOOT
is the amount of gate charge required to fully
GATE
, of 25nC at 5V and also assume the droop in
GATE
BOOT
term is
6
FN9075.8
December 2, 2005
ISL6207
The next larger standard value capacitance is 0.22µF. A good quality ceramic capacitor is recommended.
2.0
1.8
1.6
1.4
1.2
(µF)
1.0
BOOT
0.8
C
0.6
0.4
0.2 20nC
0.0
0.0 0.40.1 0.2 0.3 0.5 0.6 0.7 0.8 0.9 1.0
FIGURE 2. BOOTSTRAP CAPACITANCE vs BOOT RIPPLE
VOLTAGE
Q
GATE
50nC
= 100nC
V
BOOT
(V)
Power Dissipation
Package power dissipation is mainly a function of the switching frequency and total gate charge of the selected MOSFETs. Calculating the power dissipation in the driver for a desired application is critical to ensuring safe operation. Exceeding the maximum allowable power dissipation level will push the IC beyond the maximum recommended
operating junction temperature of 125°C. The maximum
allowable IC power dissipation for the SO-8 package is approximately 800mW. When designing the driver into an application, it is recommended that the following calculation
be performed to ensure safe operation at the desired frequency for the selected MOSFETs. The power dissipated by the driver is approximated as:
Pf
where f and V and Q
MOSFET selection and any external capacitance added to
the gate pins. The I of the driver and is typically negligible.
1.5V
QUVLQ
sw
sw
represent the upper and lower gate rail voltage. QU
L
is the upper and lower gate charge determined by
L
+()I
U
L
is the switching frequency of the PWM signal. VU
DDQ VCC
V
+=
DDQ
CC
product is the quiescent power
1000
QU=100nC
POWER (mW)
900
800
700
600
500
400
300
200
100
=200nC
Q
L
0
0800200 400 600 1000 1200 1400 1600 1800 2000
FIGURE 3. POWER DISSIPATION vs FREQUENCY
QU=50nC
Q
=100nC
L
FREQUENCY (kHz)
=50nC
Q
U
QL=50nC
QU=20nC
Q
L
=50nC
Layout Considerations
Reducing Phase Ring
The parasitic inductances of the PCB and power devices (both upper and lower FETs) could cause increased PHASE ringing, which may lead to voltages that exceed the absolute maximum rating of the devices. When PHASE rings below ground, the negative voltage could add charge to the bootstrap capacitor through the internal bootstrap diode. Under worst-case conditions, the added charge could overstress the BOOT and/or PHASE pins. To prevent this from happening, the user should perform a careful layout inspection to reduce trace inductances, and select low lead inductance MOSFETs and drivers. D packaged MOSFETs have high parasitic lead inductances, as opposed to SOIC-8. If higher inductance MOSFETs must be used, a Schottky diode is recommended across the lower MOSFET to clamp negative PHASE ring.
A good layout would help reduce the ringing on the phase and gate nodes significantly:
• Avoid using vias for decoupling components where possible, especially in the BOOT-to-PHASE path. Little or no use of vias for VCC and GND is also recommended. Decoupling loops should be short.
• All power traces (UGATE, PHASE, LGATE, GND, VCC) should be short and wide, and avoid using vias. If vias must be used, two or more vias per layer transition is recommended.
2
PAK and DPAK
• Keep the SOURCE of the upper FET as close as thermally possible to the DRAIN of the lower FET.
• Keep the connection in between the SOURCE of lower FET and power ground wide and short.
• Input capacitors should be placed as close to the DRAIN of the upper FET and the SOURCE of the lower FET as thermally possible.
7
FN9075.8
December 2, 2005
Note: Refer to Intersil Tech Brief TB447 for more information.
Thermal Management
For maximum thermal performance in high current, high switching frequency applications, connecting the thermal pad of the QFN part to the power ground with multiple vias, or placing a low noise copper plane underneath the SOIC part is recommended. This heat spreading allows the part to achieve its full thermal potential.
Suppressing MOSFET Gate Leakage
With VCC at ground potential, UGATE and LGATE are high impedance. In this state, any stray leakage has the potential to deliver charge to either gate. If UGATE receives sufficient charge to bias the device on (Note: Internal circuitry prevents leakage currents from charging above 1.8V), a low impedance path will be connected between the MOSFET drain and PHASE. If the input power supply is present and active, the system could see potentially damaging currents. Worst-case leakage currents are on the order of pico-amps; therefore, a 10k resistor, connected from UGATE to PHASE, is more than sufficient to bleed off any stray leakage current. This resistor will not affect the normal performance of the driver or reduce its efficiency.
ISL6207
8
FN9075.8
December 2, 2005
ISL6207
Quad Flat No-Lead Plastic Package (QFN) Micro Lead Frame Plastic Package (MLFP)
L8.3x3
8 LEAD QUAD FLAT NO-LEAD PLASTIC PACKAGE (COMPLIANT TO JEDEC MO-220VEEC ISSUE C)
MILLIMETERS
SYMBOL
A 0.80 0.90 1.00 -
A1 - - 0.05 -
A2 - - 1.00 9
A3 0.20 REF 9
b 0.23 0.28 0.38 5, 8
D 3.00 BSC -
D1 2.75 BSC 9
D2 0.25 1.10 1.25 7, 8
E 3.00 BSC -
E1 2.75 BSC 9
E2 0.25 1.10 1.25 7, 8
e 0.65 BSC -
k0.25 - -
L 0.35 0.60 0.75 8
L1 - - 0.15 10
N82
Nd 2 3
Ne 2 3
P- -0.609
θ --129
NOTES:
Intersil Lead Free products employ special lead free material sets; molding compounds / die attach materials and 100% matte tin plate termination finish, which is compatible with both SnPb and lead free soldering operations. Intersil Lead Free products are MSL classified at lead free peak reflow temperatures that meet or exceed the lead free requirements of IPC/JEDEC J Std-020B.
1. Dimensioning and tolerancing conform to ASME Y14.5-1994.
2. N is the number of terminals.
3. Nd and Ne refer to the number of terminals on each D and E.
4. All dimensions are in millimeters. Angles are in degrees.
5. Dimension b applies to the metallized terminal and is measured between 0.15mm and 0.30mm from the terminal tip.
6. The configuration of the pin #1 identifier is optional, but must be located within the zone indicated. The pin #1 identifier may be either a mold or mark feature.
7. Dimensions D2 and E2 are for the exposed pads which provide improved electrical and thermal performance.
8. Nominal dimensions are provided to assist with PCB Land Pattern Design efforts, see Intersil Technical Brief TB389.
9. Features and dimensions A2, A3, D1, E1, P & θ are present when Anvil singulation method is used and not present for saw singulation.
10. Depending on the method of lead termination at the edge of the package, a maximum 0.15mm pull back (L1) maybe present. L minus L1 to be equal to or greater than 0.3mm.
NOTESMIN NOMINAL MAX
Rev. 1 10/02
9
FN9075.8
December 2, 2005
Small Outline Plastic Packages (SOIC)
ISL6207
N
INDEX AREA
123
-A-
E
-B-
SEATING PLANE
D
A
-C-
0.25(0.010) BM M
H
L
h x 45°
α
e
B
0.25(0.010) C AM BS
M
NOTES:
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of Publication Number 95.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate burrs. Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006 inch) per side.
4. Dimension “E” does not include interlead flash or protrusions. Inter­lead flash and protrusions shall not exceed 0.25mm (0.010 inch) per side.
5. The chamfer on the body is optional. If it is not present, a visual index feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater above the seating plane, shall not exceed a maximum value of
0.61mm (0.024 inch).
10. Controlling dimension: MILLIMETER. Converted inch dimensions are not necessarily exact.
A1
C
0.10(0.004)
M8.15 (JEDEC MS-012-AA ISSUE C)
8 LEAD NARROW BODY SMALL OUTLINE PLASTIC PACKAGE
INCHES MILLIMETERS
SYMBOL
A 0.0532 0.0688 1.35 1.75 -
A1 0.0040 0.0098 0.10 0.25 -
B 0.013 0.020 0.33 0.51 9 C 0.0075 0.0098 0.19 0.25 ­D 0.1890 0.1968 4.80 5.00 3 E 0.1497 0.1574 3.80 4.00 4 e 0.050 BSC 1.27 BSC ­H 0.2284 0.2440 5.80 6.20 ­h 0.0099 0.0196 0.25 0.50 5 L 0.016 0.050 0.40 1.27 6 N8 87
α
-
NOTESMIN MAX MIN MAX
Rev. 1 6/05
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
10
FN9075.8
December 2, 2005
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