intersil ISL6142, ISL6152 DATA SHEET

®
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Data Sheet July 2004
Negative Voltage Hot Plug Controller
The ISL6142/52 are 14 pin, negative voltage hot plug controllers that allow a board to be safely inserted and removed from a live backplane. Inrush current is limited to a programmable value by controlling the gate voltage of an external N-channel pass transistor. The pass transistor is turned off if the input voltage is less than the Under-Voltage threshold, or greater than the Over­Voltage threshold. The PWRGD
/PWRGD outputs can be used to directly enable a power module. When the Gate and DRAIN voltages are both considered good the output is latched in the active state.
The IntelliTrip
TM
electronic circuit breaker and programmable current limit features protect the system against short circuits. When the Over-Current threshold is exceeded, the output current is limited for a time-out period before the circuit breaker trips and shuts down the FET. The time-out period is programmab le with an external capacitor connected to the CT pin. If the fault disappears before the programmed time-out, normal operation resumes. In addition, the IntelliTrip
TM
electronic circuit breaker has a fast Hard Fault shutdown, with a threshold set at 4 times the Over-Current trip point. When activated, the GATE is immediately turned off and then slowly turned back on for a single retry.
The IS+, IS-, and IS
pins combine to provide a load current
OUT
monitor feature that presents a scaled version of the load current at the IS by placing a resistor (R9) from IS
pin. Current to voltage conversion is accomplished
OUT
to the negative input (-48V).
OUT
Related Literature
• ISL6142/52EVAL1 Board Set, Document AN1000
• ISL6140/50EVAL1 Board Set, Document AN9967
• ISL6140/41EVAL1 Board Set, Document AN1020
• ISL6141/51 Hot Plug Controller, Document FN9079
• ISL6141/51 Hot Plug Controller, Document FN9039
• ISL6116 Hot Plug Controller, Document FN4778
NOTE: See www.intersil.com/hotplug for more information.
Pinout
ISL6142 OR ISL6152 (14 LEAD SOIC)
PWRGD
/PWRGD
FAULT
DIS
OV
UV
V
1
Top View
2
3
ISL6142/52
4
5
IS-
6
7
EE
14
V
DD
13
CT
IS
12
OUT
11
DRAIN
10
GATE
9
IS+
8
SENSE
FN9086.1
Typical Application
Logic
Supply
R10
R1 = 0.02Ω (1%) R2 = 10 R3 = 18K R4 = 549K R5 = 6.49KΩ
GND GND
V
DD
ISL6142/ISL6152
IS+
SENSE
R7
R8
R1
(1%)
(1%)
(10%)
-48V IN
(5%)
(5%)
R4
R5
R6
R9
(1%)
(1%)
FAULT
DIS IS
OUT
UV
OV
V
CT
IS-
EE
C3
R6 = 10KΩ (1%) R7 = R8 = 400 R9 = 4.99K R10 = 5.1K C1 = 150nF (25V)
PWRGD PWRGD
GATE DRAIN
R3
C1
C2
R2
Q1
C2 = 3.3nF (100V) C3 = 1500pF (25V) Q1 = IRF530 CL = 100uF (100V) RL = Equivalent load
LOAD
CL RL
-48V OUT
Features
• Operates from -20V to -80V (-100V Absolute Max Rating)
• Programmable Inrush Current
• Programmable Time-Out
• Programmable Current Limit
• Programmable Ov er-Voltage Protection
• Programmable Under-Voltage Protection
- 135 mV of hysteresis ~4.7V of hysteresis at the power supply
•V
Under-Voltage Lock-Out (UVLO) ~ 16.5V
DD
TM
• IntelliTrip severe and moderate faults
- Fast shutdown for short circuit faults with a single retry (fault
current > 4X current limit value).
•FAULT pin reports the occurrence of an Over-Current Time-Out
• Disable input control s GATE shutdo wn a nd resets Ov e r-Current fault latch
• Load Current Monitor Function
-IS
- A resistor from IS
conversion
• Power Good Control Output
- Output latched “good” when DRAIN and GATE voltage
thresholds are met.
-(PWRGD
- PWRGD active high: ISL6152 (H version)
• Pb-free available
Electronic Circuit Breaker distinguishes between
provides a scaled version of the load current
OUT
to -VIN provides current to voltage
OUT
active low: ISL6142 (L version)
Applications
• Vo IP (Voice over Internet Protocol) Servers
• Telecom systems at -48V
• Negative Power Supply Control
• +24V Wireless Base Station Power
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143
| Intersil and Design is a registered trademark of Intersil Americas Inc.
Copyright © Intersil Americas Inc. 2002, 2004, All Rights Reserved
Intellitrip™ is a trademark of Intersil Americas Inc.
ISL6142, ISL6152
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Ordering Information
PKG.
PART NUMBER TEMP. RANGE (oC) PACKAGE
ISL6142CB 0 to 70 14 Lead SOIC M14.15 ISL6142CBZA
(See Note) ISL6152CB 0 to 70 14 Lead SOIC M14.15 ISL6152CBZA
(See Note) ISL6142IB -40 to 85 14 Lead SOIC M14.15 ISL6142IBZA
(See Note) ISL6152IB -40 to 85 14 Lead SOIC M14.15 ISL6152IBZA
(See Note) *Add “-T” suffix to part number for tape and reel packaging.
NOTE: Intersil Pb-free products employ special Pb-free material sets; molding compounds/die attach materials and 100% matte tin plate termination finish, which is compatible with both SnPb and Pb-free soldering operations. Intersil Pb-free products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J Std-020B.
0 to 70 14 Lead SOIC
(Pb-free)
0 to 70 14 Lead SOIC
(Pb-free)
-40 to 85 14 Lead SOIC (Pb-free)
-40 to 85 14 Lead SOIC (Pb-free)
DWG. #
M14.15
M14.15
M14.15
M14.15
2
ISL6142, ISL6152 Block Diagram
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ISL6142, ISL6152
LOGIC SUPPLY
LOGIC INPUT
R10
C3
R4
R5
R6
GND
FAULT
UV
OV
DIS
CT
GND
V
DD
-
1.265V
+
+
V
EE
-
V
1.255V
+
­V
1.255V
+
­V
EE
-
+
EE
+
-
EE
UVLO
REGULATOR,
REFERENCES
UV
13V
OV
LOGIC,
TIMING,
GATE DRIVE
-
210mV
+
+
­V
EE
-
50mV
+
+
­V
EE
V
EE
13V
V
EE+5V
-
8.5V
+
+
-
V
V
EE
EE
HARD FAULT
GATE
CURRENT
LIMIT
REGULATOR
FAULT
DISABLE
TIMER
GATE
STOP
11. 1V
+
­V
1.3V
+
­V
8.0V
+
­V
-
+
PWRGD
EE
-
+
EE
-
+
EE
LATCH, LOGIC, OUTPUT DRIVE
(ISL6142)
PWRGD
(ISL6152)
CURRENT
TO ADC
-48V IN
R9
IS
OUT
SENSE
V
IS-
EE
R7
R8
IS+
SENSE
C1
R1
GATE DRAIN
C2
R3
R2
Q1
FIGURE 1. BLOCK DIAGRAM
3
LOAD
CL
RL
-48V OUT
ISL6142, ISL6152
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Pin Descriptions
PWRGD (ISL6142; L Version) Pin 1 - This digital output is an open-drain pull-down de vice and can be used to directly enable an external module. During start-up the DRAIN and GATE voltages are monitored with two separate comparators. The first comparator looks at the DRAIN pin v oltage compared to the internal V voltage drop across the exte rnal FET and sense resistor. When the DRAIN to V first of two conditions required for the po we r to be considered good are met. In addition, the GATE voltage monitored b y th e second comparator must be within approxima tely 2.5V of its normal operating voltage (13.6V). When both criteria are met the PWRGD active state, enabling the external module. When this occurs the two comparators discussed above no longer control the output. However a third comparator continues to monitor the DRAIN voltage, and will driv e the PWR GD the DRAIN voltage raises more than 8V abo ve V addition, any of the signals that shut off the GATE (Over­V oltag e , Unde r-Voltage, Under-Voltage Lock-Out, Over­Current time-out, pulling the DIS pin high, or powering down) will reset the latch and drive the PWRGD disable the module. In this case, the output pull-down device shuts off, and the pin becomes high impedance. Typically an external pull-up of some kind is u sed to pull the pin high (man y brick regulators have a pul l-up functi on built in).
PWRGD (ISL6152; H Version) Pin 1 - This digital output is used to provide an active high signal to enable an external module. The Power Good comparators are the same as described above, but the active state of the output is reversed (reference figure 37).
When power is considered good (both DRAIN and GATE are normal) the output is latched in the active high state, the DMOS device (Q3) turns on and sinks current to V a 6.2K resistor. The base of Q2 is clamped to V off. If the external pull-up current is high enough (>1mA, for example), the voltage drop across th e resistor will be large enough to produce a logic high output and enable the e xternal module (in this example, 1mA x 6.2KΩ = 6.2V).
Note that for all H versions, although this is a digital pin functionally , the logic high lev el is determined by the external pull-up device, and the power supply to which it is connected; the IC will not clamp it below the V Therefore, if the external device does not have its own clamp, or if it would be damaged by a high voltage, an external clamp might be necessary.
If the power good latch is reset (GA TE turns off), the internal DMOS device (Q3) is turned off, and Q2 (NPN) turns on to clamp the output one diode drop above the DRAIN voltage to produce a logic low, indicating power is no longer good.
reference (1.3V); this measures the
PG
voltage drop is less than 1.3V, the
EE
output will transition low and be latched in the
output inactive if
. In
EE
output high to
through
EE
to turn it
EE
voltage.
DD
FAULT
Pin 2- This digital output is an open-drain, pull-down
device, referenced to V the Over-Current latch is set. It goes to a high impedance state when the fault latch is reset by toggling the UV or DIS pins. An external pull-up resistor to a logic supply (5V or less) is required; the fault outputs of multiple IC’s can be wire-OR’d together. If the pin is not used it should be left open.
DIS Pin 3 - This digital input disables the FET when driven to a logic high state. It has a weak internal pull-up device to an internal 5V rail (10µA), so an open pin will also act as a logic high. The input has a nominal trip point of 1.6 V while rising, and a hysteresis of 1.0V. The threshold voltage is referenced to V
, and is compatible with CMOS logic levels. A logic
EE
low will allow the GATE to turn on (assuming the 4 other conditions described in the GA TE section are also true). The DIS pin can also be used to reset the Over-Current latch when toggled high to low. If not used the pin should be tied to the negative supply rail (-V
OV (Over-Voltage) Pin 4 - This analog input compares the voltage on the pin to an internal voltage reference of 1.255 V (nominal). When the input goes above the reference the GATE pin is immediately pulled low to shut off the external FET . The built in 25mV hysteresis will k eep the GATE off until the OV pin drops below 1.230V (the nominal high to low threshold). A typical application will use an external resistor divider from V resistor divider can be used to set both OV and UV trip points to reduce component count.
UV (Under-Voltage) Pin 5 - This analog input compares the voltage on the pin to an internal comparator with a built in hysteresis of 135mv. When the UV input goes be low the nominal reference voltage of 1.120V, the GATE pin is immediately pulled low to shut off the external FET. The GATE will remain off until the UV pin rises above a 1.255V low to high threshold. A typical application will use an external resistor divider from V as desired. A three-resistor divider can be used to set both OV and UV trip points to reduce component count.
The UV pin is also used to reset the Over-Current latch. The pin must be cycled below 1.120V (nominal) and then above
1.255V (nominal) to clear the latch and initiate a normal start-up sequence.
IS- Pin 6 - This analog pin is the negative input of the current sense circuit. A sensing resistor (R7) is connected between this pin and the V defines the I sensing is not used in the application, the IS- pin should be tied directly to the IS+ pin and the node should be left floating.
to -VIN to set the OV trip level. A three-
DD
EE
SENSE
. It is pulled active low whenever
EE
).
IN
to -VIN to set the UV level
DD
side of resistor R1. The ratio of R1/R7
to IS
current scaling factor . If current
OUT
4
ISL6142, ISL6152
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VEE Pin 7 - This is the most Negative Supply Voltage, such as in a -48V system. Most of the other signals are referenced relative to this pin, e ven though it may be far aw a y from wh at is considered a GND reference.
SENSE Pin 8 - This analog input monitors the voltage drop across the external sense resistor to determine if the current flowing through it exceeds the programmed Over-Current trip point (50mV / Rsense). If the Over-Current threshold is exceeded, the circuit will regulate the current to maintain a nominal voltage drop of 50mV across the R1 sense resistor, also referred to as Rsense. If current is limited for more than the programmed time-out period the IntelliTrip circuit breaker will trip and turn off the FET.
A second comparator is employed to detect and respond quickly to hard faults. The threshold of this comparator is set approximately four times higher (210mV) than the Over­Current trip point. When the hard fault comparator threshold is exceeded the GATE is immediately (10µs typical) shut off (V
= VEE), the timer is reset, and a single retry (soft
GATE
start) is initiated. IS+ Pin 9 - This analog pin is the positive input of the current
sense circuit. A sensing resistor (R8) is connected between this pin and the output side of R1, which is also connected to the SENSE pin. It should match the IS- resistor (R7) as closely as possible (1%) to minimize output current error (IS
). If current sensing is not used in the application, the
OUT
IS+ pin should be tied directly to the IS- pin and the node should be left floating.
GATE Pin 10 - This analog output drives the gate of the external FET used as a pass transistor. The GATE pin is high (FET is on) when the following conditions are met:
•V
UVLO is above its trip point (~16.5V)
DD
• V oltage on the UV pin is above its trip point (1.255V)
• V oltage on the OV pin is below its trip point (1.255V)
• No Over-Current conditions are present.
• The Disable pin is low. If any of the 5 conditions are violated, the GATE pin will be
pulled low to shut off or regulate current through the FET. The GATE is latched off only when an Over-Current event exceeds the programmed time-out period.
TM
electronic
1.3v and 8.0V. At initial start-up the DRAIN to V differential must be less than 1.3V, and the GATE voltage must be within 2.5V of its normal operating voltage (13.6V) for power to be considered good. When both conditions are met, the PWRGD state. At this point only the 8V DRAIN comparator can control the PWRGD if the DRAIN voltage exceeds V
IS
Pin 12 - This analog pin is the output of the current
OUT
sense circuit. The current flowing out of this pin (IS proportional to the current flowing through the R1 sense resistor (I defined by the resistor ratio of R1/R7. Current to voltage conversion is accomplished by placing a resistor from this pin to -V the internal 13V regulator and should not exceed 600µA. The output voltage will clamp at approximately 8V. If current sensing is not used in the application the pin should be left open.
CT Pin 13 - This analog I/O pin is used to program the Over­Current Time-Out period with a capacitor connected to the negative supply rail (-V normal operation, the pin is pulled down to V current limiting, the capacitor is charged with a 20µA (nominal) current source. When the CT pin charges to 8.5V, it times out and the GATE is latched off. If the short circuit goes away prior to the time-out, the GATE will remain on. If no capacitor is connected, the time-out will be much quicker, with only the package pin capacitance (~ 5 to 10 pF) to charge. If no external capacitor is connected to the CT pin the time-out will occur in a few µsec. To set the desired time­out period use:
dt = (C * dV) / I = (C * 8.5) / 20 µA = 0.425*10
NOTE: The printed circuit board’s parasitic capacitance (CT pin to the negative input, -V calculating the value of C3 needed for the desired time-out.
VDD Pin 14 - This is the most positive Power Supply pin. It can range from the Under-Volta ge lockout threshold (16.5V) to +80V (Relative to V without damage to the IC.
SENSE
IN
/PWRGD output is latched into the active
/PWRGD output, and will drive it inactive
by more than 8.0V.
EE
). The scaling factor, IS
. The current flowing out of the pin is supplied by
which is equal to VEE). During
IN
) should be taken into consideration when
IN
). The pin can tolerate up to 100V
EE
OUT/ISENSE
EE
. During
EE
6
* C
voltage
) is
OUT
is
The GATE is driven high by a weak (-50µA nominal) pull-up current source, in order to slowly turn on the FET. It is driven low by a 70mA (nominal) pull-down device for three of the above shut-off conditions. A larger (350mA nominal) pull­down current shuts off the FET very quickly in the event of a hard fault where the sense pin voltage exceeds approximately 210mV.
DRAIN Pin 11 - This analog input monitors the voltage of the FET drain for the P ower Good function. The DRAIN input is tied to two comparators with internal reference voltages of
5
ISL6142, ISL6152
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.
Absolute Maximum Ratings Thermal Information
Supply Voltage (VDD to VEE). . . . . . . . . . . . . . . . . . . .-0.3V to 100V
DRAIN, PWRGD
UV, OV Input Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . .-0.3V to 60V
SENSE, GATE Voltage . . . . . . . . . . . . . . . . . . . . . . . . . -0.3V to 20V
, DIS, IS+, IS-, IS
FAULT ESD Rating
Human Body Model (Per MIL-STD-883 Method 3015.7). . .2000V
, PWRGD Voltage. . . . . . . . . . . . . . .-0.3V to 100V
, CT . . . . . . . . . . . . . . . . . -0.3V to 8.0V
OUT
Thermal Resistance (Typical, Note 1) θ
14 Lead SOIC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70
Maximum Junction Temperature (Plastic Package) . . . . . . . .150
Maximum Storage Temperature Range. . . . . . . . . . -65
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . .300
Operating Conditions
Temperature Range (Industrial) . . . . . . . . . . . . . . . . . -40oC to 85oC
Temperature Range (Commercial). . . . . . . . . . . . . . . . . 0
Supply Voltage Range (Typical). . . . . . . . . . . . . . . . . . . 36V to 72V
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTES:
is measured with the component mounted on a high effective thermal conductivity test board in free air. See Tech Brief TB379 for details.
1. θ
JA
2. PWRGD is referenced to DRAIN; V
PWRGD-VDRAIN
o
C to 70oC
= 0V.
(oC/W)
JA
o
C to 150oC
o
o
C
C
Electrical Specifications V
PARAMETER SYMBOL DC PARAMETRIC V
PIN
DD
Supply Operating Range V Supply Current I
UVLO High V UVLO Low V UVLO hysteresis 1.9 V
GATE PIN
GATE Pin Pull-Up Current I GATE Pin Pull-Down Current I GATE Pin Pull-Down Current I GATE Pin Pull-Down Current I External Gate Drive (at 20V, at 80V) ∆V GATE High Threshold (PWRGD
SENSE PIN
Current Limit Trip Voltage V Hard Fault Trip Voltage HFTV HFTV = (V SENSE Pin Current I
UV PIN
UV Pin High Threshold Voltage V UV Pin Low Threshold Voltage V UV Pin Hysteresis V
= +48V, VEE = +0V Unless Otherwise Specified. All tests are over the full temperature range; either
DD
Commercial (0
/PWRGD active) V
o
C to 70oC) or Industrial (-40oC to 85oC). Typical specs are at 25oC.
TEST CONDITIONS MIN TYP MAX UNITS
DD
UV = 3V; OV = VEE; SENSE = VEE; VDD =
DD
80V
UVLOHVDD
UVLOLVDD
PU PD1 PD2 PD3
GATE(VGATE - VEE)
GH
CL
SENSEVSENSE
UVH
UVL
UVHY
Low to High transition 15 16.7 19 V High to Low transition 13 15.0 17 V
GATE Drive on, V GATE Drive off, UV or OV false 70 mA GATE Drive off, Over-Current Time-Out 70 mA GATE Drive off; Hard Fault, Vsense > 210mv 350 mA
V
VCL = (V
UV Low to High Transition 1.240 1.255 1.270 V UV High to Low Transition 1.105 1.120 1.145 V
- V
GATE
= 50mV - 0 -0.5 µA
GATE = VEE
, 20V <=VDD <=80V 12 13.6 15 V
GATE
- VEE) 405060mV
SENSE
- VEE) 210 mV
SENSE
20 - 80 V
-30 -50 -60 µA
2.6 4.0 mA
2.5 V
135 mV
6
ISL6142, ISL6152
www.BDTIC.com/Intersil
Electrical Specifications V
= +48V, VEE = +0V Unless Otherwise Specified. All tests are over the full temperature range; either
DD
Commercial (0
o
C to 70oC) or Industrial (-40oC to 85oC). Typical specs are at 25oC. (Continued)
PARAMETER SYMBOL
UV Pin Input Current I
OV pin
OV Pin High Threshold Voltage V OV Pin Low Threshold Voltage V OV Pin Hysteresis V OV Pin Input Current I
DRAIN Pin
Power Good Threshold (Enable PWRGD
/PWRGD
Output) Drain Input Bias Current I DRAIN Pin Comparator Trip Point
(PWRGD
ISL6142 (PWRGD
PWRGD
/PWRGD Inactive)
Pin: L Version)
Output Low Voltage V
Output Leakage I
ISL6152 (PWRGD Pin: H Version)
INUVVUV
OVH OVL
OVHY
INOVVOV
V
PG
DRAINVDRAIN
VDH
OL1
V
OL5
OH
= V
OV Low to High Transition 1.235 1.255 1.275 V OV High to Low Transition 1.215 1.230 1.255 V
= V
V
DRAIN
V
DRAIN
(V
DRAIN
(V
DRAIN
V
DRAIN
TEST CONDITIONS MIN TYP MAX UNITS
EE
- -0.05 -0.5 µA
25 mV
EE
- V
EE
- -0.05 -0.5 µA
0.80 1.30 2.00 V
= 48V 10 38 60 µA
- V
> 8.0V 7.0 8.0V 9.0 V
EE
- V
< V
EE)
- V
< V
EE)
= 48V, V
PG; IOUT PG; IOUT
PWRGD
= 1mA - 0.3 0.8 V
= 5mA - 1.50 3.0 V
= 80V - 0.05 10 µA
PWRGD Output Low Voltage (PWRGD-DRAIN) V PWRGD Output Impedance R
OL
OUT
V
DRAIN
(V
DRAIN
= 5V, I
- V
EE)
= 1mA - 0.80 1.0 V
OUT
< V
PG
4.5 6.2 7.5 k DIS PIN DIS Pin High Threshold Voltage V DIS Pin Low Threshold Voltage V DIS Pin Hysteresis V DIS Pin Input High Leakage I DIS Pin Input Low Current I
PIN
FAULT
FAULT
Output Voltage VF Output Leakage IF
FAULT
DISH
DISHY DISINH DISINL
DIS Low to High Transition 1.60 2.20 3.00 V DIS High to Low Transition 1.1 1.50 V
DISL
DIS Hysteresis 1.0 V Input Voltage = 5V 0.1 1.0 µA Input Voltage = 0V 10 µA
I = 1.6 mA 0.4 V
VOL
V = 5.0V 10 µA
IOH
CT PIN
CT Pin Charging Current I CT Pin Input Threshold V
IS PINS (IS-, IS+, IS
IS
Error VSENSE = 50mV, R7 = 400Ω, R8 = 404Ω 2.0 %
OUT
Error VSENSE = 200mV, R7 = 400Ω, R8 = 404Ω 1.0 %
IS
OUT
OUT
)
CTINLVCT
CT
= 0V 20 µA
7.5 8.5 9.5 V
ISOUT Offset Current VSENSE = 0.0mV, R7 = 400Ω, R8 = 404Ω 4.5 µA Output Voltage Range (IS
Pin) 058V
OUT
7
ISL6142, ISL6152
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Electrical Specifications V
PARAMETER SYMBOL
AC TIMING
OV High to GATE Low t OV Low to GATE High t UV Low to GATE Low t UV High to GATE High t DIS Low to GATE Low t DIS High to GATE High t GATE Low (Over-Current) to FAULT IS
Rise Time t
OUT
Fall Time t
IS
OUT
SENSE High to GATE Low t Current Limit to GATE Low t
Hard Fault to GATE Low (200mV comparator) Typical GATE shutdown based on application ckt. Guaranteed by design.
= +48V, VEE = +0V Unless Otherwise Specified. All tests are over the full temperature range; either
DD
Commercial (0
Low t
o
C to 70oC) or Industrial (-40oC to 85oC). Typical specs are at 25oC. (Continued)
TEST CONDITIONS MIN TYP MAX UNITS
PHLOV PLHOV PHLUV PLHUV
PHLDIS PLHDIS
PHLGF
PHLSENSE
PHLCB
t
PHLHF
Figures 2A, 3A 0.6 1.6 3.0 µs Figures 2A, 3A 1.0 7.8 12.0 µs Figures 2A, 3B 0.6 1.3 3.0 µs Figures 2A, 3B 1.0 8.4 12.0 µs Figure 2A, 7 0.6 µs Figure 2A, 7 2.5 µs Figure 2A, 8 0.5 µs Figure 2A, 12 1.2 µs
R
Figure 2A, 12 4.0 µs
F
Figures 2A, 9 1 3 µs Figures 2B, 11, Effective Capacitance During
Test = 2550pF Figures 10, 20, 33 10.0 µs
1200 µs
ISL6142 (L Version)
DRAIN Low to PWRGD DRAIN High to PWRGD GATE High to PWRGD
ISL6152 (H Version)
DRAIN Low to (PWRGD-DRAIN) High (Active) t DRAIN High to (PWRGD GATE High to (PWRGD-DRAIN) High (Active) t
Low (Active) t
High (Inactive) t
Low (Active) t
-DRAIN) Low (Inactive) t
PHLDL PLHDH
PHLGH
PLHDL PHLDH
PLHGH
Figures 2A, 4A 0.1 3.1 5.0 µs Figure 2A, 6A 0.2 µs Figures 2A, 5A 1.0 µs
Figures 2A, 4B 0.1 0.2 5.0 µs Figure 2A, 6B 0.5 µs Figures 2A, 5B 0.4 µs
8
?
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Test Circuit and Timing Diagrams
ISL6142, ISL6152
.
5V
V
DIS
13.6V
0V
2V
0V
GATE
5K
5K
PWRGD
FAULT
V
OV
V
UV
400
V
OV
UV
EE
1
2
3
ISL6142
4
5
6
7
FIGURE 2A. TYPICAL TEST CIRCUIT
1.255V 1.230V
1V
t
PHLOV
t
PLHOV
14
13
12
11
10
9
8
V
DD
4.99K
DRAIN
GATE
404
SENSE
+
-
48V
V
V
SENSE
1V
DRAIN
5V
V
5K
OV
V
5K
UV
PWRGD
FAU LT
OV
UV
V
EE
1
2
3
ISL6142
4
5
6
7
FIGURE 2B. TEST CIRCUIT FOR TIMEOUT
2V
1.125V 1.255V
0V
13.6V
1V
0V
t
PHLUV
UV Pin
GATE
14
13
12
11
10
9
8
V
CT
DRAIN
GATE
SENSE
t
PLHUV
DD
0.1K
9.0K
0.90K
+
48V
-
V
DRAIN
1V
FIGURE 3A. OV TO GATE TIMING
DRAIN
PWRGD
FIGURE 4A. DRAIN TO PWRGD
V
- V
GATE
= 0V
GATE
GATE
PWRGD
FIGURE 3B. UV TO GATE TIMING
FIGURE 3. OV AND UV TO GATE TIMING
DRAIN
PG
1.3V
V
EE
t
PHLDL
1.3V
1.0V
V
PG
PWRGD
t
PLHDL
V
1.0V
ACTIVE TIMING (ISL6142) FIGURE 4B. DRAIN TO PWRGD ACTIVE TIMING (ISL6152)
FIGURE 4. DRAIN TO PWRGD
13.6V
V
2.5V
1.0V
t
PHLGH
GH
/PWRGD TIMING
V
GATE
GATE
PWRGD
- V
V
PWRGD
GATE
- V
= 0V
DRAIN
1.0V
= 0V
2.5V
t
PLHGH
V
13.6V
GH
FIGURE 5A. GATE TO PWRGD
ACTIVE (ISL6142)
FIGURE 5B. GATE TO PWRGD ACTIVE (ISL6152)
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Test Circuit and Timing Diagrams (Continued)
- VEE = 8.0V
V
DRAIN
8.0V
1.0V
t
PLHDH
VEE - V
DRAIN
= 0V
V
DH
DRAIN
PWRGD
VEE - V
DRAIN
= 0V
DRAIN
PWRGD
V
- VEE = 8.0V
V
DH
DRAIN
8.0V
1.0V
V
PWRGD
t
PHLDH
- V
DRAIN
= 0V
FIGURE 6A. DRAIN HIGH T O PWRGD ( INA CTI VE) HIGH
(ISL6142)
FIGURE 6. DRAIN TO PWRGD
3V
DIS
GATE
0V
13.6V
0V
1.50V
t
PHLDIS
1V
t
PLHDIS
2.2V
1V
FIGURE 6B. DRAIN HIGH TO PWRGD (INACTIVE) LOW
(ISL6152)
/PWRGD INACTIVE TIMING
V
- V
GATE
t
= 0V
1.4V
PHLF
1.0V
GATE
GATE
FAULT
FIGURE 7. DISABLE TO GATE TIMING (ISL6142/52) FIGURE 8. FAULT TO GATE TIMING (ISL6142/52)
0V
13.6V
SENSE
GATE
50mV
t
PHLSENSE
~4V (depends on FET threshold)
0V
13.6V
SENSE
GATE
210mV
t
PHLHF
V
EE
FIGURE 9. SENSE TO GATE (CURRENT LIMIT) TIMING FIGURE 10. SENSE TO GATE (HARD FAULT) TIMING
V
UV
GATE
1.0V
t
PHLCB
1.0V
SENSE
V
OUT
Over-Current Time-Out
FIGURE 11. CURRENT LIMIT TO GATE TIMING FIGURE 12. OUTPUT CURRENT RISE AND FALL TIME
10
10%
t
90%
R
90%
10%
t
F
Typical Performance Curves
y
0
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ISL6142, ISL6152
4.5 4
3.5 3
2.5 2
IDD (mA)
1.5 1
0.5 0
10 20 30 40 50 60 70 80 90 100
Suppl
FIGURE 13. SUPPLY CURRENT VS. SUPPLY VOLTAGE (25oC) FIGURE 14. GATE VOLTAGE VS SUPPLY VOLTAGE (25oC)
2.75
2.7
2.65
2.6
2.55
2.5
2.45
IDD (mA)
2.4
2.35
2.3
2.25
-40-20 0 20406080100
FIGURE 15. SUPPLY CURRENT VS TEMPERATURE, V
Voltage (VDD)
Temperature (C)
DD
= 80V
16
14
12
10
8
6
4
Gate Voltage (V)
2
0
10 20 30 40 50 60 70 80 100
Supply Voltage (VDD)
14
13.9
13.8
13.7
13.6
13.5
Gate Voltage (V)
13.4
13.3
-40-20 0 20406080100
Temperature (C)
FIGURE 16. GATE VOLTAGE VS TEMPERATURE V
DD
= 48V
50 49 48 47 46 45 44 43
Gate Current (uA)
42 41
-40-20 0 2040608010
Gate Voltage (V)
14
13.9
= 80V
V
13.8
13.7
DD
VDD = 20V
13.6
13.5
13.4
-40-20 0 20406080100
Temperature (C)
FIGURE 17. GATE VOLTAGE VS TEMPERATURE FIGURE 18. GATE PULL-UP CURRENT VS TEMPERATURE
11
Temperature (C)
0
0
ISL6142, ISL6152
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90 80 70 60 50 40 30 20 10
0
Gate Pull Down Current (mA)
-40 -20 0 20 40 60 80 10
Temperature (C)
FIGURE 19. GATE PULL-DOWN CURRENT
(UV/OV/TIME-OUT) VS TEMPERATURE
54
52
50
48
46
44
Trip Voltage (mv)
42
40
-40-20 0 204060 80100
450 400 350 300 250 200 150 100
50
0
Gate Pull Down Current (mA)
-40 -20 0 20 40 60 80 10
Temperature (C)
FIGURE 20. HARD FAULT GATE PULL-DOWN CURRENT VS
TEMPERATURE
1.6
5mA
1.4
1.2
1
0.8
0.6
0.4
1mA
0.2
Output Low Voltage (V)
0
-40-20 0 20406080100
Temperature (C)
FIGURE 21. OVER-CURRENT TRIP VOL TAGE VS
TEMPERATURE
2
1.5
1
0.5
Trip Voltage (V)
0
-40-20 0 20 406080100
Temperature (C)
FIGURE 23. DRAIN to PWRGD
VS TEMPERATURE
/ PWRGD TRIP V OL TAGE (VPG)
Temperature (C)
FIGURE 22. PWRGD (ISL6142) VOL VS TEMPERATURE
6.8
6.7
6.6
6.5
6.4
6.3
6.2
Impedance (KOhms)
6.1
-40 -20 0 20 40 60 80 100
FIGURE 24. PWRGD (ISL6152) OUTPUT IMPEDANCE VS
TEMPERATURE
(1 ma)
Temperature (C)
12
ISL6142, ISL6152
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6
5
4
3
2
ISOUT Error (uA)
1
0
50 100 150 200
SENSE Pin Voltage (mV)
FIGURE 25. IS
4.475
4.47
4.465
4.46
4.455
4.45
4.445
4.44
ISOUT Offset Current (uA)
4.435
-40-20 0 20406080100
ERROR VS SENSE PIN VOLTAGE FIGURE 26. IS
OUT
VSENSE = 0V
Temperature (C)
-40oC
85oC
2.5
-40oC
2
1.5
1
ISOUT Error (%)
0.5
0
20.5
19.5
18.5
17.5
CT Charging Current (uA)
85oC
050100150
SENSE pin Voltage (mV)
ERROR VS SENSE PIN VOLTAGE
OUT
20
19
18
17
-40-20 0 204060 80100
Temperature (C)
FIGURE 27. ISOUT OFFSET CURRENT VS TEMPERATURE FIGURE 28. CT CHARGING CURRENT VS TEMPERATURE
13
Applications Information
www.BDTIC.com/Intersil
GND GND
ISL6142, ISL6152
FAULT
DIS
Logic Supply
R4
R10
IS
UV
OUT
R5
OV
R6
V
ADC
Q2
R9
C3
-48V IN
FIGURE 29. TYPICAL APPLICATION WITH MINIMUM COMPONENTS
Typical Values for a representative system; which assumes:
43V to 71V supply range; 48 nominal; UV = 43V; OV = 71V
EE
V
DD
PWRGD
ISL6142
IS- IS+CT
R7
R8
R1
SENSE GATE DRAIN
C1
R2
R3
C2
Q1
-48V OUT
Quick Guide to Choosing Component Values
(See fig 29 for reference)
CL
RL
1A of typical current draw; 2.5 Amp Over-Current 100µF of load capacitance (CL); equivalent RL of 48
(R = V/I = 48V/1A) R1: 0.02 (1%) R2: 10 (5%) R3: 18k (5%) R4: 549k (1%) R5: 6.49k (1%) R6: 10k (1%) R7/R8: 400 (1%) R9: 4.99K (1%) R10: 5.10K (10%) C1: 150nF (25V) C2: 3.3nF (100V) C3: 1500pF (25V) Q1: IRF530 (100V, 17A, 0.11Ω) Q2: N-Channel logic FET
This section will describe the minimum components needed for a typical application, and will show how to select component values. Note that “typical” values may only be good for this application; the user may have to select alternate component values to optimize performance for other applications. Each block will then have more detailed explanation of how the device works, and alternatives.
R4, R5, R6 - together set the Under-Voltage (UV) and Over­Voltag e (OV) trip points. When the power supply ramps up and down, these trip points (and their hysteresis) will determine when the GATE is allowed to turn on and off (UV and OV do not control the PWRGD input power supply is divided down such that when the voltage on the OV pin is belo w its threshold and the UV pin is above its threshold their comparator outputs will be in the proper state signaling the supply is within its desired operating range, allowing the GATE to turn on. The equations below define the comparator thresholds for an increasing (in magnitude) supply voltage.
R4R5R
V
UV
V
OV
++〈〉
-----------------------------------------
R
R4R5R
++〈〉
-----------------------------------------
6
+()
5R6
6
()
R
6
1.255×=
1.255×=
/ PWRGD output). The
(EQ. 1)
(EQ. 2)
14
ISL6142, ISL6152
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The values of R4 = 549K, R5 = 6.49K, and R6 = 10K shown in figure 29 set the Under-Voltage threshold at 43V, and the Over-Voltage, turn off threshold to 71V. The Under-Voltage (UV) comparator has a hysteresis of 135mv’s (4.6V of hysteresis on the supply) which correlates to a 38.4V turn off voltage. The Over-Voltage comparator has a 25mv hysteresis (1.4V of hysteresis on the supply) which translates to a turn on voltage (supply decreasing) of approximately 69.6V.
Q1 - is the FET that connects the input supply voltage to the output load, when properly enabled. It needs to be selected based on several criteria:
• Maximum voltage expected on the input supply (including transients) as well as transients on the output side.
• Maximum current and power dissipation expected during normal operation, usually at a level just below the current limit threshold.
• Power dissipation and/or safe-operating-area considerations during current limiting and single retry events.
• Other considerations include the GATE voltage threshold which affects the r
(which in turn, affects the
DS(ON)
voltage drop across the FET during normal operation), and the maximum gate voltage allowed (the IC’s GATE output is clamped to ~14V).
R1 - is the Over-Current sense resistor also referred to as R
. If the input current is high enough, such that the
SENSE
voltage drop across R1 exceeds the SENSE comparator trip point (50mV nominal), the GATE pin will be pulled lower (to ~4V) and current will be regulated to 50mV/Rsense for the programmed time-out period which is set by C3. The Over­Current threshold is defined in Equation 3 below. If the time­out period is exceeded the Over-Current latch will be set and the FET will be turned off to protect the load from excessive current. A typical value for R1 is 0.02Ω, which sets an Over­Current trip point of; I
= V/R = 0.05/0.02 = 2.5 Amps. To
OC
select the appropriate value for R1, the user must first determine at what level of current it should trip, take into account worst case variations for the trip point (50mV ±10mV = ±20%), and the tolerances of the resistor (typically 1% or 5%). Note that the Over-Current threshold should be set above the inrush current level plus the expected load current to avoid activating the current limit and time-out circuitry during start-up. If the power good output (PWRGD
/PWRGD) is used to enable an external module, the desired inrush current only needs to be considered. One rule of thumb is to set the Over-Current threshold 2-3 times higher than the normal operating current.
50mv
I
------------------- -=
OC
R
sense
(EQ. 3)
The physical layout of the R1 sense resistor is critical to avoid the possibility of false ov er current e v ents. Since it is in the main input-to-output path, the traces should be wide enough to support both the normal current, and currents up to the over-current trip point. The trace routing between the
R1 resistor, and the V
and SENSE pins should be direct
EE
and as short as possible with zero current in the sense lines. Note that in figure 30 the traces from each side of the R1 resistor also connect to the R8 (IS+), and R7 (IS-) current sensing resistors.
CORRECT
To V
EE
and R7
To SENSE
and R8
FIGURE 30. SENSE RESISTOR LAYOUT GUIDELINES
SENSE RESISTOR
INCORRECT
CURRENT
CL - is the sum of all load capacitances, including the load’s input capacitance itself. Its value is usually determined by the needs of the load circuitry, and not the hot plug (although there can be interaction). For example, if the load is a regulator, then the capacitance may be chosen based on the input requirements of that circuit (holding regulation under current spikes or loading, filtering noise, etc.) The value chosen will affect the peak inrush current. Note that in the case of a regulator, there may be capacitors on the output of that circuit as well; these need to be added into the capacitance calculation during inrush (unless the regulator is delayed from operation by the PWRGD
/PWRGD signal).
RL - is the equivalent resistive value of the load and determines the normal operating current delivered through the FET. It also affects some dynamic conditions (such as the discharge time of the load capacitors during a power­down). A typical value might be 48 (I=V/R = 48/48 = 1A).
R2, C1, R3, C2 - are related to the GATE driver, as it controls the inrush current.
R2 prevents high frequency oscillations; 10 is a typical value. R2 = 10Ω.
R3 and C2 act as a feedback network to control the inrush current as shown in equation 4, where CL is the load capacitance (including module input capacitance), and I
PU
is
the GATE pin charging current, nominally 50µA.
I
inrushIPU
-------
×=
C
2
(EQ. 4)
C
L
Begin by choosing a value of acceptable inrush current for the system, and then solve for C2.
15
ISL6142, ISL6152
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C1 and R3 prevent Q1 from turning on momentarily when power is first applied. Without them, C2 would pull the gate of Q1 up to a voltage roughly equal to V
*C2/Cgs(Q1)
EE
(where Cgs is the FET gate-source capacitance) before the ISL6142/52 could power up and actively pull the gate low. Place C1 in parallel with the gate capacitance of Q1; isolate them from C2 by R3.
C1 =[(Vinmax - Vth)/Vth] * (C2+Cgd) - where Vth is the FET’s minimum gate threshold, Vinmax is the maximum operating input voltage, and Cgd is the FET gate-drain capacitance.
R3 - its value is not critical, a typical value of 18kΩ is recommended but values down to 1K can be used. Lower values of R3 will add delay to gate turn-on for hot insertion and the single retry event following a hard fault.
R7/R8/R9 - are used to sense the load current (R7/R8) and convert the scaled output current (IS
) to a voltage (R9)
OUT
that would typically be the input signal to an A to D converter. R7 is connected between -IS and the R1 sense resistor.
These two resistors set the I Rsense resistor) to IS
scaling factor based on equation 5
OUT
(current through the
SENSE
below . R8 does not effect the scaling factor but should match R7 to minimize IS
error. Their tolera nce should be +/-1%,
OUT
which will typically result in an output current error of less than 5% for a full scale co ndition. The tr ace layout is also critical to obtain optimum performance. The traces connecting these resistors to the device pins (IS+ and IS-) and to th e R1 sense resistor should be kept as short as possible, match in length, and be isolated from the main current flow as illustrated in figure 30.
response of the current sense circuit for the Over-Current Time-out and hard fault single retry events.
R10 - is a pull-up resistor for the open drain FAULT
output pin which goes active low when the Over-Current latch is set (Over-Current Time-Out). The output signal is referenced to V
and the resistor is connected to a positive voltage, 5V or
EE
less, with respect to V
. A typical value of 5KΩ is
EE
recommended. A fault indicator LED can be placed in series with the pull-up resistor if desired. The resistor value should be selected such that it will allow enough current to drive the LED adequately (brightness).
C3 - is the capacitor used to program the current limit time­out period. When the Over-Current threshold is exceeded a 20µA (nominal) current source will charge the C3 capacitor from V
to approximately 8.5V. When the voltage on the CT
EE
pin exceeds the 8.5V threshold, the GATE pin will immediately be pulled low with a 70ma pull down device, the Over-Current latch will be set, and the FET will be turned off. If the Over-Current condition goes away befor e the time-out period expires, the CT pin will be pulled back down to V
EE
, and normal operation will resume. Note that any parasitic capacitance from the CT pin to -V
will effectively add to
IN
C3. This additional capacitance should be taken into account when calculating the C3 value needed for the desired time­out period.
The value of C3 can be calculated using equation 6 where dt is the time-out period, dv is the CT pin threshold, and I
CT
is
the capacitor charging current.
C3
dt
------
dv
timeout
×
----------------------
I
CT
8.5V
20
6–
×10×==
(EQ. 6
R9 is used to convert the IS connected between the IS
current to voltage and is
OUT
pin and -VIN. The current
OUT
flowing through the resistor (EQ. 5) should not e xceed 600µA and the voltage on the CT pin will clamp at appro xi mately 8V.
R
SENSE
IS
OUTISENSE
-----------------------
×=
R7
(EQ. 5)
To select the appropriate resistor values for the application the user must first define the R1 sense resistor value and the maximum load current to be detected/measured. The value of R7 should then be selected such that the maximum IS
OUT
current is in the 400-500µA range. For example, if the user wanted to detect and measure fault currents up to the hard fault comparator trip point (10A); the maximum IS
OUT
current using the application components in figure 23 would be [10A x (.02/400] = 500µA. The value of R9 should be set to accommodate the dynamic range of the A to D converter. For this example, a 5K resistor would produce a full scale input voltage to the converter of 2.5V (500µA x 5KΩ). Figures 32 and 33 illustrate the typical output voltage
Q2- is an N-channel logic FET used to drive the disable pin (DIS). The DIS pin is used to enable/disable the external pass transistor (Q1) by turning the GATE drive voltage on or off. The DIS pin can also be used to reset the Over-Current latch by toggling the pin high and then low. When Q2 is off, the DIS pin is pulled high with an internal 500K resistor, connected to an internal +5V (V
+ 5V) supply rail (10µA).
EE
In this condition the GATE pin is low, and Q1 is turned off. When Q2 is on, the DIS pin is pulled low to V
allowing the
EE
GATE pin to pull up and turn on Q1. The gate of Q2 will typically be driven low (<1.5V) or High (>3.0V) with external logic circuitry referenced to the negative input (-V
Low-side Application
IN
).
Although this IC was designed for -48V systems, it can also be used as a low-side switch for positive 48V systems; the operation and components are usually similar. One possible difference is the kind of level shifting that may be nee ded to interface logic signals to the IC. Fo r e xample , man y of the IC functions are referenced to the IC substrate, connected to the V
pin, but this pin may be considered -48V or GND,
EE
depending upon the polarity of the system. Also, the input or output logic (running at 5V or 3.3V or even lo w er) might be
16
ISL6142, ISL6152
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externally referenced to either VDD or VEE of the IC, instead of GND.
Inrush Current Control
The primary function of the ISL6142/52 hot plug controller is to control the inrush current. When a board is plugged into a live backplane , the input cap acito rs of the board’s power supply circuit can produce large current transients as they charge up. This can cause glitches on the system po we r supply (which can affect other boards!), as w ell as possibly cause some permanent damage to the power supply.
The key to allo wing boards to be inserted into a live bac kplane is to turn on the power to the board in a controlled manner, usually by limiting the current allow ed to flow through a FET switch, until the input capacitors are fully charged. At that point, the FET is fully on, for the smallest voltage drop across it. Figure 31 illustrates the typical inrush current response for a hot insertion under the following conditions:
V
= -48V, Rsense = 0.02W
IN
Current limit = 50mV / 0.02 = 2.5A C1 = 150nF, C2 = 3.3nF, R3 = 18k CL = 100µF, R L = 50, I I
= 50µA (100µF / 3.3nF) = 1.5A
inrush
After the contact bounce subsides the UVLO and UV criteria are quickly met and the GATE begins to ramp up. As the GATE reaches approximately 4V with respect to the source, the FET begins to turn on allowing current to charge the 100µF load capacitor . As the drain to source v oltage begins to drop, the feedback network of C2 and R3 hold the GA TE constant, in this case limiting the current to approximately
1.5A. When the DRAIN voltage completes its r amp do w n, the load current remains constant at approximately 1.0A as the GATE voltage increases to its final value.
= 48V / 50 ~1.0A
LOAD
excessive supply or fault currents. The IntelliTrip circuit breaker is capable of detecting both hard faults, and less severe Ov er-Current co nditions. The Over-Current trip point is determined by R1 (EQ. 3) also referred to as Rsense. When the voltage across this resi stor exceeds 50mV, the current limit regulator will turn on, and the GATE will be pulled lower (to ~4V) to regulate current through the FET at 50mV/Rsense. If the fault persists and current limiting exceeds the progr ammed time-out period, the FET will be turned off by discharging the GATE pin to V the Over-Current latch and the PWRGD transition to the inactive state, indicating p o w er is no longer good. To clear the latch and initiate a normal start-up sequence, the user must either pow er down the system (below the UVLO voltage), toggle the UV pin belo w and abov e its threshold (usually with an external transistor), or toggle the DIS pin high to low . Figure 32 shows the Over-Current shut down and current limiting response for a 10 short to ground on the output. Prior to the short circuit the output load is 110 producing an operating current of about 0.44A (48V/110Ω). A 10 short is then applied to the output causing an initial fault current of 4.8A. This produces a voltage drop across the
0.02 sense resistor of approximately 95mV, roughly two times the Over-Current threshold of 50mV. The GATE is quickly pulled low to limit the current to 2.5A (50mV/Rsense) and the timer is enabled. The f ault conditi on persists for the duration of the programmed time-out period (C3 = 1500pF) and the GATE is latched off in about 740µs. There is a short filter (3µs nominal) on the comparator, so current tr ansients shorter than this will be ignored. Longer transients will initiate the GATE pull down, current limiting, and the timer. If the fault current goes awa y be fore the time-out period expires the device will ex it the current limiti ng mode and resume normal operation.
/PWRGD output will
TM
electronic
. This will set
EE
FIGURE 31. HOT INSERTION INRUSH CURRENT LIMITING,
DISABLE PIN TIED TO V
EE
Electronic Circuit Breaker/Current Limit
The ISL6142/52 allows the user to program both the current limit and the time-out period to protect the system against
17
FIGURE 32. CURRENT LIMITING AND TIME-OUT
In addition to current limiting and programmable time-out, there is a hard fault comparator to respond to short circuits with an immediate GATE shutdown (typically 10µs) and a single retry. The trip point of this comparator is set ~4 times
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(210mV) higher than the Over-Current threshold of 50mV. If the hard fault comparator trip point is exceeded, a hard pull down current (350mA) is enabled to quickly pull down the GATE and momentarily turn off the FET. The fast shutdown resets the timer and is followed by a soft start, single retry event. If the fault is still present after the GATE is slowly turned on, the current limit regulator will trip (sense pin voltage > 50mV), turn on the timer, and limit the current to 50mV/Rsense. If the fault remains and the time-out period is exceeded the GATE pin will be latched low. Note: Since the timer starts when the SENSE pin exceeds the 50mV threshold, then depending on the speed of the current transient exceeding 200mV; it’s possible that the current limit time-out and shutdown can occur before the hard fault comparator trips (and thus no retry). Figure 33 illustrates the hard fault response with a ze ro ohm short circuit at the output.
within its expected operating range and the GATE will be allowed to turn on, or remain on. If the UV pin voltage drops below its high to low threshold, or the OV pin voltage increases above its low to high threshold, the GATE pin will be pulled low, turning off the FET until the supply is back within tolerance.
The OV and UV inputs are high impedance, so the value of the external resistor divider is not critical with respect to input current. Therefore, the next consideration is total current; the resistors will always draw current, equal to the supply voltage divided by the total resistance of the divider (R4+R5+R6) so the values should be chosen high enough to get an acceptable current. However, to the extent that the noise on the power supply can be transmitted to the pins, the resistor values might be chosen to be lower . A filter capacitor from UV to -V transients need to be filtered. (Note that even some transients which could momentarily shut off the GATE might recover fast enough such that the GATE or the output current does not even see the interruption).
Finally, take into account whether the resistor values are readily available, or need to be custom ordered. Tolerances of 1% are recommended for accuracy . Note that f o r a typical 48V system (with a 43V to 72V range), the 43V or 72V is being divided down to 1.255V , a significant scaling f actor . For UV, the ratio is roughly 35 times; every 3mV change on the UV pin represents roughly 0.1V change of power supply voltage. Conv ersely, an error of 3mV (due to the resistors, for example) results in an error of 0.1V for the supply trip point. The OV ratio is around 60. So the accuracy of the resistors comes into play.
or OV to -VIN is a possibility, if certain
IN
FIGURE 33. HARD FAULT SHUTDOWN AND RETRY
As in the Over-Current Time-Out response discussed previously, the supply is set at -48V and the current limit is set at 2.5A. After the initial gate shutdown (10µs) a soft start is initiated with the short circuit still present. As the GATE slowly turns on the current ramps up and exceeds the Over­Current threshold (50mV) enabling the timer and current limiting (2.5A). The fault remains for the duration of the time­out period and the GATE pin is quickly pulled low and latched off.
Applications: OV and UV
The UV and OV pins can be used to detect Over-Voltage and Under-Voltage conditions on the input supply and quickly shut down the external FET to protect the system. Each pin is tied to an internal comparator with a nominal reference of
1.255V. A resistor divider between the V typically used to set the trip points on the UV and OV pins. If the voltage on the UV pin is above its threshold and the voltage on the OV pin is below its threshold, the supply is
(gnd) and -VIN is
DD
The hysteresis of the comparators is also multiplied by the scale factor of 35 for the UV pin (35 * 135mV = 4.7V of hysteresis at the power supply) and 60 for the OV pin (60 * 25mV = 1.5V of hysteresis at the power supply).
With the three resistors, the UV equation is based on the simple resistor divider:
1.255 = V
= 1.255 [(R4 + R5 + R6)/(R5 + R6)]
V
UV
Similarly, for OV:
1.255 = V
= 1.255 [(R4 + R5 + R6)/(R6)]
V
OV
Note that there are two equations, but 3 unknowns. Because of the scale factor , R4 ha s to be m uch bigge r than the other two; chose its value first, to set the current (f or e xample , 50V / 500k draws 100µA), and then the other two will be in the 10k range. Solv e the tw o equations for two unknowns. Note that some iteration may be necessary to select values that meet the requirement, and are also readily av ailab l e standard values.
The three resistor divider (R4, R5, R6) is the recommended approach for most applications, but if acceptable v alues can’t
[(R5 + R6)/(R4 + R5 + R6)] or
UV
[(R6)/(R4 + R5 + R6)] or
OV
18
ISL6142, ISL6152
www.BDTIC.com/Intersil
be found, then consider 2 separate resistor dividers (one for each pin, both from V
to -VIN). This also allows the user to
DD
adjust or trim either trip point independently. Some applications employ a short pin ground on the connector tied to R4 to ensure the hot plug device is fully powered up before the UV and OV pins (tied to the short pin ground) are biased. This ensures proper control of the GATE is maintained during power up. This is not a requirement for the ISL6142/52 however the circuit will perform properly if a short pin scheme is implemented (reference Figure 38).
Applications: PWRGD/PWRGD
The PWRGD/PWRGD outputs are typically used to directly enable a power module, such as a DC/DC converter. The PWRGD enable (L version), and PWRGD (ISL6152) for those with an active high enable (H version). The modules usually have a pull-up device built-in, as well as an internal clamp. If not, an external pull-up resistor may be needed. If the pin is not used, it can be left open.
For both versions at initial start-up, when the DRAIN to V voltage differential is less than 1.3V and the GATE voltage is within 2.5V (V power is considered good and the PWRGD will go active. At this point the output is latched and the comparators above no longer control the output. However a second DRAIN comparator remains active and will drive the PWRGD exceeds V the signals that shut off the GATE (Over-Voltage, Und er­Voltage; Under-Voltage-Lock-Out; Over-Current Time-Out, disable pin high, or powering down). In this case the PWRGD no longer good.
ISL6142 (L version; Figure 34): Under normal conditions (DRAIN voltage - V the Q2 DMOS will turn on, pulling PWRGD module.
When any of the 5 conditions occur that turn off the GATE (OV, UV, UVLO, Over-Current Time-Out, disable pin high) the PWRGD latch is reset and the Q2 DMOS device will shut off (high impedance). The pin will quickly be pulled high by the external module (or an optional pull-up resistor or equivalent) which in turn will disable it. If a pull-up resistor is used, it can be connected to any supply voltage that doesn’t exceed the IC pin maximum ratings on the high end, but is high enough to give acceptable logic levels to whatever
(ISL6142) is used for modules with active low
EE
) of its normal operating voltage (13.6V),
GH
/PWRGD pins
/PWRGD output inactive if the DRAIN voltage
by more than 8V. The latch is reset by any of
EE
/PWRGD output will go inactive, indicating power is
< VPG, and ∆V
EE
GATE
- V
GATE
< VGH)
low, enab ling the
signal it is driving. An external clamp may be used to limit the voltage range.
V
GATE
V
GH
-
+
GATE
V
PG
+
-
V
EE
V
DH
+
-
V
EE
FIGURE 34. ACTIVE LOW ENABLE MODULE
The PWRGD
VDD
(SECTION OF) ISL6142
(L VERSION)
-
PWRGD
+
+
-
LATCH
Q2
LOGIC
V
EE
+
-
DRAIN
can also drive an opto-coupler (such as a
CL
+
VIN+
VOUT+
ON
/OFF
ACTIVE LOW
ENABLE MODULE
VIN-
VOUT-
4N25), as shown in Figure 35 or LED (Figure 36). In both cases, they are on (active) when power is good. Resistors R13 or R14 are chosen based on the supply voltage, and the amount of current needed by the loads.
V
DD
(SECTION OF) ISL6142
(L VERSION)
LOGIC
LATCH
COMP ARATORS
FIGURE 35. ACTIVE LOW ENABLE OPTO-ISOLATOR
V
DD
(SECTION OF) ISL6142
(L VERSION)
LOGIC LATCH
COMP ARATORS
FIGURE 36. ACTIVE LOW ENABLE LED
Q2
Q2
PWRGD
V
EE
V
EE
DRAIN
PWRGD
DRAIN
R13
PWRGD
OPTO
R14
LED (GREEN)
ISL6152 (H version; Figure 37): Under normal conditions (DRAIN voltage - V
< VPG, and ∆V
EE
GATE
- V
GATE
< VGH), the Q3 DMOS will be on, shorting the bottom of the internal resistor to V
, turning Q2 off. If the pull-up current from the
EE
external module is high enough, the voltage drop across the
6.2k resistor will look like a logic high (relativ e to DRAIN). Note that the module is only ref eren ced to DRAIN, not V
EE
19
ISL6142, ISL6152
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(but under normal conditions, the FET is on, and the DRAIN and V
are almost the same voltage).
EE
When any of the 5 conditions occur that turn off the GA TE, the Q3 DMOS turns off, and the resistor and Q2 clamp the PWRGD pin to one diode drop (~0.7V) above the DRAIN pin. This should be able to pull low against the module pull-up current, and disable the module.
VDD
V
GATE
GATE
(SECTION OF) ISL6152
V
GH
-
+
(H VERSION)
-
6.2K
+
V
PG
+
+
-
-
V
EE
V
DH
+
+
-
V
EE
FIGURE 37. ACTIVE HIGH ENABLE MODULE
LATCH
LOGIC
-
DRAIN
Q3
Q2
V
EE
PWRGD
CL
+
VIN+
VOUT+
ON/OFF
ACTIVE HIGH
ENABLE
MODULE
VIN-
VOUT-
Applications: GATE Pin
To help protect the external FET, the outp ut of the GATE pin is internally clamped; up to an 80V supply and will not be any higher than 15V. Under normal operation when the supply voltage is above 20V, the GATE voltage will be regulated to a nominal 13.6V above V
EE
.
a high enough input voltage (remember that current through the RPG 6.2k resistor generates the high voltage level; see Figure 34).
The input capacitance of the brick is chosen to match its system requirements, such as filtering noise, and maintaining regulation under varying loads. Note that this input capacitance appears as the load capacitance of the ISL6142/52.
The brick’s output capacitance is also determined by the system, including load regulation considerations. Howe v er, it can affect the ISL6142/52, depending upon how it is enabled. For example, if the PWRGD
/PWRGD signal is not used to enable the brick, the following could occur. Sometime during the inrush current time, as the main power supply starts charging the brick input capacitors, the brick itself will start working, and start charging its output capacitors and load; that current has to be added to the inrush current. In some cases, the sum could exceed the Over-Current threshold, which could shut down the system if the time-out period is exceeded! Therefore, whenever practical, it is advantageous to use the PWRGD
/PWRGD output to keep the brick off at least until the input caps are charged up, and then start-up the brick to charge its output caps.
Typical brick regulators include models such as Lucent JW050A1-E or Vicor VI-J30-CY. These are nominal -48V input, and 5V outputs, with some isolation between the input and output.
Applications: “Brick” Regulators
One of the typical loads used are DC/DC regulators, some commonly known as “brick” regulators, (partly due to their shape, and because it can be considered a “building block” of a system). For a given input voltage range, there are usually whole families of different output voltages and current ranges. There are also various standardized sizes and pinouts, starting with the original “full” brick, and since getting smaller (half-bricks and quarter-bricks are now common).
Other common features may include: all components (except some filter capacitors) are self-contained in a molded plastic package; external pins for connections; and often an ENABLE input pin to turn it on or off. A hot plug IC, such as the ISL6142 is often used to gate power to a brick, as well as turn it on.
Many bricks have both logic polarities availab le (Enab le high or low input); select the ISL6142 (L-version) or ISL6152 (H­version) to match. There is little difference between them, although the L-version output is usually simpler to interface.
The Enable input often has a pull-up resistor or current source, or equivalent built in; care must be taken in the ISL6152 (H version) output that the given current will create
Applications: Optional Components
In addition to the typical application, and the variations already mentioned, there are a few other possible components that might be used in specific cases. See Figure 38 for some possibilities.
If the input power supply exceeds the 100V absolute maximum rating, even for a short transient, that could cause permanent damage to the IC, as well as other components on the board. If this cannot be guaranteed, a voltage suppressor (such as the SMAT70A, D1) is recommended. When placed from V voltage.
If transients on the input power supply occur when the supply is near either the OV or UV trip points, the GATE could turn on or off momentarily. One possible solution is to add a filter cap C4 to the V R11. A large value of R11 is better for the filtering, but be aware of the voltage drop across it. For example, a 1k resistor, with 2.4mA of I dissipate 2.4mW. Since the UV and OV comparators are referenced with respect to V but the GATE clamp voltage could be offset by the voltage across the extra resistor.
to -VIN on the board, it will clamp the
DD
pin, through isolation resistor
DD
would have 2.4V across it and
DD
they should not be affected,
EE,
20
ISL6142, ISL6152
www.BDTIC.com/Intersil
The switch SW1 is shown as a simple push button. It can be replaced by an active switch, such as an NPN or NFET; the principle is the same; pull the UV node below its trip point, and then release it (toggle low). To connect an NFET, for example, the DRAIN goes to UV; the source to -V GATE is the input; if it goes high (relative to -V
, and the
IN
), it turns the
IN
NFET on, and UV is pulled low. Just make sure the NFET resistance is low compared to the resistor divider, so that it has no problem pulling down against it.
GND (SHORT PIN)
GND
Logic Supply
(VEE+5V)
R10
FAU LT
DIS IS
OUT
UV
OV
C3
-48V IN
D1*
Logic Input
R4
R5
C4*
TO
ADC
R6
R9
SW1*
Q2
FIGURE 38. ISL6142/52 OPTIONAL COMPONENTS (SHOWN WITH *)
R12 is a pull-up resistor for PWRGD
, if there is no other component acting as a pull-up device. The value of R12 is determined by how much current is needed when the pin is pulled low (also affected by the V
voltage); and it should
DD
be pulled low enough for a good logic low level. An LED can also be placed in series with R12, if desired. In that case, the criteria is the LED brightness versus current.
GND
R11*
V
DD
PWRGD
R12*
ISL6142
V
IS- IS+CT
EE
R7
R1
SENSE GATE DRAIN
C1
R8
Q1
R2
R3
C2
CL
RL
-48V OUT
Applications: Layout Considerations
For the minimum application, there are 10 resistors, 3 capacitors, one IC and 2 FETs. A sample layout is shown in Figure 39. It assumes the IC is 8-SOIC; Q1 is in a D2P AK (or similar SMD-220 package).
Although GND planes are common with multi-level PCBs, for a -48V system, the -48V rails (both input and output) act more like a GND than the top 0V rail (mainly because the IC signals are mostly referenced to the lower rail). So if separate planes for each voltage are not an option, consider prioritizing the bottom rails first.
Note that with the placement shown, most of the signal lines are short, and there should be minimal interaction between them.
Although decoupling capacitors across the IC supply pins are often recommended in general, this application may not need one, nor even tolerate one. For one thing, a decoupling cap would add to (or be swamped out by) any other input capacitance; it also needs to be charged up when power is applied. But more importantly, there are no high speed (or any) input signals to the IC that need to be conditioned. If still
desired, consider the isolation resistor R10, as shown in figure 38.
NOTE:
1. Layout scale is approximate; routing lines are just for illustration purposes; they do not necessarily conform to normal PCB design rules. High current buses are wider, shown with parallel lines.
2. Approximate size of the above layout is 0.8 x 0.8 inches, excluding Q1 (D2PAK or similar SMD-220 package).
3. R1 sense resistor is size 2512; all other R’s and C’s shown are 0805; they can all potentially use smaller footprints, if desired.
4. The RL and CL are not shown on the layout.
5. Vias are needed to connect R4 and V of the board, and R8 to pin 9; all other routing can be on the top level.
6. PWRGD
signal is not used here.
to GND on the bottom
DD
21
ISL6142, ISL6152
www.BDTIC.com/Intersil
BOM (Bill Of Materials)
R1 = 0.02 (5%)
R2 =10.0 (5%)
R3 = 18.0K (10%)
R4 = 549K (1%)
R5 = 6.49K (1%)
R6 = 10.0K (1%)
R7 = R8 = 400Ω (1%)
GND
-48V
IN
LOGIC IN
-48V
-48V
+5V
IN
IN
GND
G
S
R10
D
R6
R5
R4
R9 = 4.99K (1%)
R10 = 5.10K (10%)
C1 = 150nF (25V)
C2 = 3.3nF (100V)
C3 = 1500pF (25V)
Q1 = IRF530 (100V, 17A, 0.11)
Q2 = N-channel Logic FEFT
GND
TO V
DD
R9
C3
1 PG
2 FLT
3 DIS
ISL6142
4 OV
5 UV
6 IS-
7 VEE
R7
VDD 14
CT 13
IS
O 12
D 11
G 10
IS+ 9
S 8
C2
GATE
R3
R2
C1
R8
TO PIN 9
SOURCE
NFET
DRAIN
-48V OUT
-48V IN R1
FIGURE 39. ISL6142 SAMPLE LAYOUT (NOT TO SCALE)
22
ISL6142, ISL6152
www.BDTIC.com/Intersil
ISL6142, ISL6152
Small Outline Plastic Packages (SOIC)
N
INDEX AREA
123
-A­D
e
B
0.25(0.010) C AM BS
NOTES:
1. Symbols are defined in the “MO Series Symbol List” in Section
2.2 of Publication Number 95.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate burrs. Mold flash, protrusion and gate burrs shall not exceed
0.15mm (0.006 inch) per side.
4. Dimension “E” does not include interlead flash or protrusions. Interlead flash and protrusions shall not exceed 0.25mm (0.010 inch) per side.
5. The chamfer on the body is optional. If it is not present, a visual index feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or great­er above the seating plane, shall not exceed a maximum value of 0.61mm (0.024 inch).
10. Controlling dimension: MILLIMETER. Converted inch dimen­sions are not necessarily exact.
E
-B-
SEATING PLANE
A
-C-
M
0.25(0.010) BM M
H
α
µ
A1
0.10(0.004)
L
h x 45
o
M14.15 (JEDEC MS-012-AB ISSUE C)
14 LEAD NARROW BODY SMALL OUTLINE PLASTIC PACKAGE
INCHES MILLIMETERS
SYMBOL
A 0.0532 0.0688 1.35 1.75 -
A1 0.0040 0.0098 0.10 0.25 -
B 0.013 0.020 0.33 0.51 9 C 0.0075 0.0098 0.19 0.25 ­D 0.1890 0.1968 4.80 5.00 3 E 0.1497 0.1574 3.80 4.00 4 e 0.050 BSC 1.27 BSC -
C
H 0.2284 0.2440 5.80 6.20 ­h 0.0099 0.0196 0.25 0.50 5 L 0.016 0.050 0.40 1.27 6 N8 87
o
α
0
o
8
o
0
o
8
Rev. 0 12/93
NOTESMIN MAX MIN MAX
-
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is cautioned to ver ify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third par ties which may result from its use. No license is granted b y implica tion or ot herw ise un der any patent or patent rights of Intersil or its subsidiaries.
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