Intersil Corporation HI5808 Datasheet

HI5808
Data Sheet February 1999 File Number 4233.4
12-Bit, 10 MSPS A/D Converter
The HI5808 is a monolithic, 12-bit, Analog-to-Digital Converter fabricated in Intersil’sHBC10BiCMOS process.It is designed for high speed, high resolution applications where wide bandwidth and low power consumption are essential.
The HI5808 is designed in a fully differential pipelined architecture with a front end differential-in-differential-out sample-and-hold (S/H). The HI5808 has e xcellent dynamic performance while consuming 325mW power at 10 MSPS.
The 100MHz full power input bandwidth is ideal for communication systems and document scanner applications. Dataoutputlatchesare provided which present valid data to the output bus with a latency of 3 clock cycles. The digital outputs have a separate supply pin which can be powered from a 3V to 5V supply.
Ordering Information
PART
NUMBER
HI5808BIB 10 MSPS -40 to 85 28 Ld SOIC M28.3 HI5808EVAL1 25 Evaluation Board
SAMPLE
RATE
TEMP.
RANGE (oC) PACKAGE
PKG.
NO.
Features
• Sampling Rate . . . . . . . . . . . . . . . . . . . . . . . . . . 10 MSPS
•Low Power
• Internal Sample and Hold
• Fully Differential Architecture
• Full Power Input Bandwidth . . . . . . . . . . . . . . . . . 100MHz
• Low Distortion
• Internal Voltage Reference
• TTL/CMOS Compatible Digital I/O
• Digital Outputs . . . . . . . . . . . . . . . . . . . . . . . . . 5V to 3.0V
Applications
• Digital Communication Systems
• Undersampling Digital IF
• Document Scanners
• Additional Reference Documents
- AN9214 Using Intersil High Speed A/D Converters
- AN9724 Using the HI5808EVAL1 Evaluation Board
Pinout
DV D
GND1
DV D
GND1
AV A
V
ROUT
A AV
CLK
CC1
CC1
CC
GND
VIN+
VIN-
V
DC
V
RIN
GND
CC
10 11 12 13 14
1 2 3 4 5 6 7 8 9
HI5808 (SOIC)
TOP VIEW
D0
28
D1
27
D2
26
D3
25
D4
24
D5
23 22
DV
CC2
D
21
GND2
D6
20
D7
19
D8
18
D9
17
D10
16
D11
15
117
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143
| Copyright © Intersil Corporation 1999
Functional Block Diagram
HI5808
V
DC
V
IN
VIN+
-
S/H
+
X8
+
X8
BIAS
STAGE 1
4-BIT
FLASH
4-BIT
DAC
-
STAGE 3
4-BIT
FLASH
4-BIT
DAC
-
CLOCK
REF
AND
DIGITAL DELAY
DIGITAL ERROR CORRECTION
CLK
V
ROUT
V
RIN
DV
CC2
D11 (MSB) D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 (LSB)
AV
Typical Applications Schematic
V
ROUT
V
RIN
A
GND
A
GND
D
GND1
D
GND1
D
GND2
V
IN
VIN-
CLOCK
+
VIN+ (8) VDC(10) V
IN
CLK (1)
STAGE 4
4-BIT
FLASH
CCAGNDDVCC1DGND1
(LSB) (28) D0
(27) D1 (26) D2
(11)
(25) D3
(12)
(24) D4
(7)
(23) D5
(13)
(20) D6
(3)
(19) D7
(5)
(18) D8
(21)
(17) D9
(16) D10
(MSB) (15) D11
(4) DV (2) DV
(22) DV
- (9)
(6) AV
(14) AV
HI5808
CC1 CC1
CC2
CC CC
D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 D10 D11
0.1µF
0.1µF
D
GND
+
10µF
+
10µF
D
GND2
A
GND
+5V
10µF AND 0.1µF CAPS ARE PLACED AS CLOSE TO PART AS POSSIBLE
+5V
BNC
118
HI5808
Absolute Maximum Ratings Thermal Information
Supply Voltage, AVCC or DVCC to A D
GND
to A
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.3V
GND
Digital I/O Pins. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .D
Analog I/O Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A
Operating Conditions
Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . . -40oC to 85oC
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. θJA is measured with the component mounted on an evaluation PC board in free air.
GND
or D
. . . . . . . . . +6.0V
GND
GND GND
to DV to AV
CC CC
Thermal Resistance (Typical, Note 1) θJA (oC/W)
SOIC Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . . .150oC
Maximum Storage Temperature Range. . . . . . . . . . -65oC to 150oC
Lead Temperature (Soldering, 10s) . . . . . . . . . . . . . . . . . . . . .300oC
(SOIC - Lead Tips Only)
Electrical Specifications AV
= DV
CC
T
= -40oC to 85oC, Differential Analog Input, Typical Values are Test Results at 25oC,
A
CC1
= DV
= +5V, fS = 10 MSPS at 50% Duty Cycle, V
CC2
= 3.5V, CL = 10pF,
RIN
Unless Otherwise Specified
HI5808BIB
-40oC TO 85oC
PARAMETER TEST CONDITIONS
UNITSMIN TYP MAX
ACCURACY
Resolution 12 - - Bits Integral Linearity Error, INL fIN = DC - ±1 ±2 LSB Differential Linearity Error, DNL
fIN = DC - ±0.5 ±1 LSB
(Guaranteed No Missing Codes) Offset Error, V
OS
fIN = DC - 19 - LSB
Full Scale Error, FSE fIN = DC - 32 - LSB
DYNAMIC CHARACTERISTICS
Minimum Conversion Rate No Missing Codes - 0.5 - MSPS Maximum Conversion Rate No Missing Codes 10 - - MSPS Effective Number of Bits, ENOB fIN = 1MHz 10.0 10.8 - Bits Signal to Noise and Distortion Ratio, SINAD fIN = 1MHz - 66.5 - dB
RMS Signal
--------------------------------------------------------------
=
RMS Noise + Distortion
Signal to Noise Ratio, SNR fIN = 1MHz - 67.3 - dB
RMS Signal
-------------------------------
=
RMS Noise Total Harmonic Distortion, THD fIN = 1MHz - -75 - dBc 2nd Harmonic Distortion fIN = 1MHz - -80 dBc 3rd Harmonic Distortion fIN = 1MHz - -77 - dBc Spurious Free Dynamic Range, SFDR fIN = 1MHz - 77 - dBc Intermodulation Distortion, IMD f1 = 1MHz, f2 = 1.02MHz - -65 - dBc Transient Response - 1 - Cycle Over-Voltage Recovery 0.2V Overdrive - 2 - Cycle
ANALOG INPUT
Maximum Peak-to-PeakDifferential Analog Input Range (VIN+-
- ±2.0 - V
VIN-) Maximum Peak-to-Peak Single-Ended Analog Input Range - 4.0 - V Analog Input Resistance, R Analog Input Capacitance, C
IN
IN
(Notes 2, 3) 1 - - M
-10- pF Analog Input Bias Current, IB+ or IB- (Note 3) -10 - +10 µA Differential Analog Input Bias Current
I
= (IB+ - IB-)
B DIFF
- ±0.5 - µA
Full Power Input Bandwidth, FPBW - 100 - MHz
119
HI5808
Electrical Specifications AV
CC
= DV
CC1
= DV
= +5V, fS = 10 MSPS at 50% Duty Cycle, V
CC2
= 3.5V, CL = 10pF,
RIN
TA = -40oC to 85oC, Differential Analog Input, Typical Values are Test Results at 25oC, Unless Otherwise Specified (Continued)
HI5808BIB
-40oC TO 85oC
PARAMETER TEST CONDITIONS
UNITSMIN TYP MAX
Analog Input Common Mode Voltage Range (VIN+ + VIN-)/2 Differential Mode (Note 2) 1 2.3 4 V
INTERNAL VOLTAGE REFERENCE
Reference Output Voltage, V
(Loaded) - 3.5 - V
ROUT
Reference Output Current --1mA Reference Temperature Coefficient - 50 - ppm/oC
REFERENCE VOLTAGE INPUT
Reference Voltage Input, V
RIN
Total Reference Resistance, R
L
- 3.5 - V
- 7.8 - k Reference Current - 450 - µA
DC BIAS VOLTAGE
DC Bias Voltage Output, V
DC
- 2.3 - V Max Output Current (Not To Exceed) - - 1 mA
DIGITAL INPUTS (CLK)
Input Logic High Voltage, V Input Logic Low Voltage, V Input Logic High Current, I Input Logic Low Current, I Input Capacitance, C
IN
IH
IL
V
IH
IL
= 5V - - 10.0 µA
CLK
V
= 0V - - 10.0 µA
CLK
2.0 - - V
- - 0.8 V
-7-pF
DIGITAL OUTPUTS (D0-D11)
Output Logic Sink Current, I
OL
Output Logic Source Current, I
Output Capacitance, C
OUT
OH
VO = 0.4V (Note 2) 1.6 - - mA DV
= 3.0V, VO = 0.4V - 1.6 - mA
CC3
VO = 2.4V (Note 2) -0.2 - - mA DV
= 3.0V, VO = 2.4V - -0.2 - mA
CC3
-5-pF
TIMING CHARACTERISTICS
Aperture Delay, t Aperture Jitter, t
AP
AJ
Data Output Delay, t Data Output Hold, t Data Latency, t
LAT
OD
H
For a Valid Sample (Note 2) - - 3 Cycles
-5-ns
- 5 - ps (RMS)
-8-ns
-8-ns
Clock Pulse Width (Low) 10 MSPS Clock 45 50 55 ns Clock Pulse Width (High) 10 MSPS Clock 45 50 55 ns
POWER SUPPLY CHARACTERISTICS
Total Supply Current, I
CC
Analog Supply Current, AI Digital Supply Current, DI Output Supply Current, DI
CC
CC1
CC2
VIN+ - VIN- = 2V - 65 73 mA VIN+ - VIN- = 2V - 46 - mA VIN+ - VIN- = 2V - 17 - mA
VIN+ - VIN- = 2V - 2 - mA Power Dissipation VIN+ - VIN- = 2V - 325 365 mW Offset Error PSRR, V
OS
AVCCor DVCC = 5V ±5% - 2 - LSB Gain Error PSRR, FSE AVCC or DVCC = 5V ±5% - 30 - LSB
NOTES:
2. Parameter guaranteed by design or characterization and not production tested.
3. With the clock off (clock low, hold mode).
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