HI3338
August 1997
Features
• CMOS Low Power (Typ). . . . . . . . . . . . . . . . . . . .100mW
• R2R Output, Segmented for Low “Glitch”
• CMOS/TTL Compatible Inputs
• Fast Settling (Typ) . . . . . . . . . . . . . . . . .20ns to
1
• Feedthrough Latch for Clocked or Unclocked Use
• Accuracy (Typ). . . . . . . . . . . . . . . . . . . . . . . . . ±0.5 LSB
• Data Complement Control
• High Update Rate (Typ). . . . . . . . . . . . . . . . . . . . 50MHz
• Unipolar or Bipolar Operation
• Linearity (INL):
- HI3338KIP . . . . . . . . . . . . . . . . . . . . . . . . . . ±0.75 LSB
- HI3338KIB . . . . . . . . . . . . . . . . . . . . . . . . . . ±0.75 LSB
Applications
• TV/Video Display
• High Speed Oscilloscope Display
• Digital Waveform Generator
• Direct Digital Frequency Synthesis
• Wireless Communication
/2 LSB
8-Bit, CMOS R2R D/A Converter
Description
The HI3338 family are CMOS high speed R2R voltage
output digital-to-analog converters. They can operate from a
single +5V supply, at video speeds, and can produce
“rail-to-rail” output swings. Internal level shifters and a pin for
an optional second supply provide for an output range below
digital ground.
The data complement control allows the inversion of input
data while the latch enable control provides either
feedthrough or latched operation. Both ends of the R2R ladder network are available externally and may be modulated
for gain or offset adjustments. In addition, “glitch” energy has
been kept very low by segmenting and thermometer encoding of the upper 3 bits.
The HI3338 is manufactured to give low dynamic power
dissipation, low output capacitance, and inherent latch-up
resistance.
Ordering Information
TEMP.
PART NUMBER
HI3338KIP -40 to 85 16 Ld PDIP E16.3
HI3338KIB -40 to 85 16 Ld SOIC M16.3
RANGE (oC) PACKAGE PKG. NO.
Pinout
HI3338
(PDIP, SOIC)
TOP VIEW
V
1
D7
2
D6
3
D5
4
D4
5
D3
6
D2
7
D1
8
V
SS
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
http://www.intersil.com or 407-727-9207
| Copyright © Intersil Corporation 1999
10-1464
16
15
14
13
12
11
10
9
DD
LE
COMP
V
REF
V
OUT
V
REF
V
EE
D0
+
-
File Number 4134.1
Functional Diagram
HI3338
V
DD
LE
COMP
D7
D6
D5
D4
D3
D2
D1
D0
V
SS
16
8R
15
3-BIT
14
1
2
3
4
5
6
7
9
8
LEVEL
SHIFTERS
TO 7-LINE
THERMOMETER
ENCODER
FEEDTHROUGH
LATCHES
8R
8R
8R
4R
4R
2R
2R
2R
2R
2R
2R
R ≅160Ω
R
R
R
R
R
R
R
2R
13
V
+
REF
12
V
OUT
11
V
-
REF
10
V
EE
Die Characteristics
DIE DIMENSIONS:
2,740µm x 3,310µm x 530 ±50µm
METALLIZATION:
Type: Al with 0.8% Si
Thickness: 11k
GLASSIVATION:
Type: 3% PSG
Thickness: 13k
Å ±1kÅ
Å ±2.6kÅ
10-1465
HI3338
Absolute Maximum Ratings Thermal Information
DC Supply-Voltage Range . . . . . . . . . . . . . . . . . . . . . . -0.5V to +8V
(VDD - VSS or VDD - VEE, Whichever Is Greater)
Input Voltage Range
Digital Inputs (LE, COMP D0 - D7). . . . VSS - 0.5V to VDD + 0.5V
Analog Pins (V
REF
+, V
REF
-, V
). . . . VDD - 8V to VDD + 0.5V
OUT
DC Input Current
Digital Inputs (LE, COMP, D0 - D7). . . . . . . . . . . . . . . . . . ±20mA
Recommended Supply Voltage Range. . . . . . . . . . . . . .4.5V to 7.5V
Operating Conditions
Temperature Range (TA) . . . . . . . . . . . . . . . . . . . . . . -40oC to 85oC
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
Thermal Resistance (Typical) θJA (oC/W)
PDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
SOIC Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100
Maximum Junction Temperature. . . . . . . . . . . . . . . . . . . . . . . 150oC
Maximum Storage Temperature Range, T
. . . . .-65oC to 150oC
STG
Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . . . 300oC
(SOIC - Lead Tips Only)
Electrical Specifications T
= 25oC, VDD = 5V, V
A
+ = 4.608V, VSS = VEE = V
REF
- = GND, LE clocked at 20MHz, RL≥ 1MΩ,
REF
Unless Otherwise Specified
PARAMETER TEST CONDITIONS MIN TYP MAX UNITS
ACCURACY
Resolution 8 - - Bits
Integral Linearity Error See Figure 4 - - ±0.75 LSB
Differential Linearity Error See Figure 4 - - ±0.5 LSB
Gain Error Input Code = FF
Offset Error Input Code = 00
, See Figure 3 - - ±0.5 LSB
HEX
, See Figure 3 - - ±0.25 LSB
HEX
DIGITAL INPUT TIMING
Update Rate To Maintain1/2 LSB Settling DC 50 - MHz
Update Rate V
Set Up Time t
Set Up Time t
Hold Time t
Latch Pulse Width t
Latch Pulse Width t
SU1
SU2
H
W
W
OUTPUT PARAMETERS RL Adjusted for 1V
Output Delay t
Output Delay t
Rise Time t
Settling Time t
D1
D2
r
S
Output Impedance V
- = VEE = -2.5V, V
REF
+ = +2.5V DC 20 - MHz
REF
For Low Glitch - -2 - ns
For Data Store - 8 - ns
For Data Store - 5 - ns
For Data Store - 5 - ns
V
- = VEE = -2.5V, V
REF
P-P
+ = +2.5V - 25 - ns
REF
Output
From LE Edge - 25 - ns
From Data Changing - 22 - ns
10% to 90% of Output - 4 - ns
10% to Settling to1/2 LSB - 20 - ns
+ = 6V, VDD = 6V 120 160 200 Ω
REF
Glitch Area - 150 - pV-s
Glitch Area V
- = VEE = -2.5V, V
REF
+ = +2.5V - 250 - pV-s
REF
REFERENCE VOLTAGE
V
+ Range (+) Full Scale (Note 1) V
REF
V
- Range (-) Full Scale (Note 1) V
REF
10-1466
- + 3 - V
REF
EE
-V
DD
+ - 3 V
REF
V