intersil CA3338, CA3338A DATA SHEET

®
CA3338, CA3338A
Data Sheet July 2004
CMOS Video Speed, 8-Bit, 50 MSPS, R2R D/A Converters
The CA3338 family are CMOS/SOS high speed R2R voltage output digital-to-analog converters. They can operate from a single +5V supply, at video speeds, and can produce “rail-to-rail” output swings. Internal level shifters and a pin for an optional second supply provide for an output range below digital ground. The data complement control allows the inversion of input data while the latch enable control provides either feedthrough or latched operation. Both ends of the R2R ladder network are available externally and may be modulated for gain or offset adjustments. In addition, “glitch” energy has been kept very low by segmenting and thermometer encoding of the upper 3 bits.
The CA3338 is manufactured on a sapphire substrate to give low dynamic power dissipation, low output capacitance, and inherent latch-up resistance.
Ordering Information
PART
NUMBER
CA3338E ±1.0 LSB -40 to 85 16 Ld PDIP E16.3
CA3338EZ (Note)
LINEARITY
(INL, DNL)
±1.0 LSB -40 to 85 16 Ld PDIP
TEMP.
RANGE ( ° C ) PACKAGE
(Pb-free)
PKG.
DWG. #
E16.3
FN1850.4
Features
• CMOS/SOS Low Power
• R2R Output, Segmented for Low “Glitch”
• CMOS/TTL Compatible Inputs
1
• Fast Settling: (Typ) to
/2 LSB . . . . . . . . . . . . . . . . . . 20ns
• Feedthrough Latch for Clocked or Unclocked Use
• Accuracy (Typ) . . . . . . . . . . . . . . . . . . . . . . . . . . ±0.5 LSB
• Data Complement Control
• High Update Rate (Typ) . . . . . . . . . . . . . . . . . . . . . 50MHz
• Unipolar or Bipolar Operation
• Pb-free Available
Applications
• TV/Video Display
• High Speed Oscilloscope Display
• Digital Waveform Generator
• Direct Digital Synthesis
Pinout
CA3338, CA3338A
(PDIP, SOIC)
TOP VIEW
CA3338AE ±0.75 LSB -40 to 85 16 Ld PDIP E16.3
CA3338AEZ (Note)
CA3338M ±1.0 LSB -40 to 85 16 Ld SOIC M16.3
CA3338MZ (Note)
CA3338AM ±0.75 LSB -40 to 85 16 Ld SOIC M16.3
CA3338AMZ (Note)
Intersil Pb-free products employ special Pb-free material sets; molding compounds/die attach materials and 100% matte tin plate termination finish, which is compatible with both SnPb and Pb-free soldering operations. Intersil Pb-free products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J Std-020B.
±0.75 LSB -40 to 85 16 Ld PDIP
(Pb-free)
±1.0 LSB -40 to 85 16 Ld SOIC
(Pb-free)
±0.75 LSB -40 to 85 16 Ld SOIC
(Pb-free)
E16.3
M16.3
M16.3
V
1
D7
2
D6
3
D5
4
D4
5
D3 D2
6 7
D1
8
V
SS
16 15 14 13 12 11 10
9
DD
LE COMP V
REF
V
OUT
V
REF
V
EE
D0
+
-
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143
Copyright Harris Corporation 1997. Copyright Intersil Americas Inc. 2003, 2004. All Rights Reserved
| Intersil (and design) is a registered trademark of Intersil Americas Inc.
All other trademarks mentioned are the property of their respective owners.
Functional Diagram
CA3338, CA3338ACA3338, CA3338A
V
DD
LE
COMP
D7
D6
D5
D4
D3
D2
D1
D0
V
SS
16
8R
15
3-BIT
14
1
2
3
4
5
6
7
9
8
LEVEL
SHIFTERS
TO 7-LINE
THERMOMETER
ENCODER
FEEDTHROUGH
LATCHES
8R
8R
8R
4R
4R
2R
2R
2R
2R
2R
2R
R 160
R
R
R
R
R
R
R
2R
13
V
+
REF
12
V
OUT
11
V
-
REF
10
V
EE
2
CA3338, CA3338A
Absolute Maximum Ratings Thermal Information
DC Supply-Voltage Range. . . . . . . . . . . . . . . . . . . . . . .-0.5V to +8V
(V
- VSS or VDD - VEE, Whichever is Greater)
DD
Input Voltage Range
Digital Inputs (LE, COMP D0 - D7). . . . V
Analog Pins (V
DC Input Current
REF
+, V
REF
-, V
OUT
) . . . .VDD - 8V to VDD + 0.5V
- 0.5V to VDD + 0.5V
SS
Digital Inputs (LE, COMP, D0 - D7) . . . . . . . . . . . . . . . . . . ±20mA
Recommended Supply Voltage Range . . . . . . . . . . . . .4.5V to 7.5V
Thermal Resistance (Typical, Note 1) θ
PDIP Package . . . . . . . . . . . . . . . . . . . 90 N/A
SOIC Package . . . . . . . . . . . . . . . . . . . 100 N/A
Maximum Junction Temperature
Plastic Packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .150
Maximum Storage Temperature Range, T
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . .300
(SOIC - Lead Tips Only)
Operating Conditions
Temperature Range (TA)
Plastic Package, E suffix, M suffix . . . . . . . . . . . . . . -40
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
is measured with the component mounted on an evaluation PC board in free air.
1. θ
JA
o
C to 85oC
(oC/W) θJC (oC/W)
JA
. . . . -65oC to 150oC
STG
o
o
C
C
Electrical Specifications T
= 25oC, VDD = 5V, V
A
Unless Otherwise Specified
REF
+ = 4.608V, VSS = VEE = V
- = GND, LE Clocked at 20MHz, RL 1 MΩ,
REF
PARAMETER TEST CONDITIONS MIN TYP MAX UNITS
ACCURACY
Resolution 8 - - Bits Integral Linearity Error See Figure 4
CA3338 - - ±1LSB CA3338A - - ±0.75 LSB
Differential Linearity Error See Figure 4
CA3338 - - ±0.75 LSB CA3338A - - ±0.5 LSB
Gain Error Input Code = FF
, See Figure 3
HEX
CA3338 - - ±0.75 LSB CA3338A - - ±0.5 LSB
Offset Error Input Code = 00
; See Figure 3 - - ±0.25 LSB
HEX
DIGITAL INPUT TIMING
Update Rate To Maintain Update Rate V Set Up Time t Set Up Time t Hold Time t Latch Pulse Width t Latch Pulse Width t
SU1 SU2
H
W W
OUTPUT PARAMETERS R Output Delay t Output Delay t Rise Time t Settling Time t
D1 D2
r
S
Output Impedance V
REF
For Low Glitch - -2 - ns For Data Store - 8 - ns For Data Store - 5 - ns For Data Store - 5 - ns V
REF
Adjusted for 1V
L
From LE Edge - 25 - ns From Data Changing - 22 - ns 10% to 90% of Output - 4 - ns 10% to Settling to 1/2 LSB - 20 - ns
REF
1
/2 LSB Settling DC 50 - MHz
- = VEE = -2.5V, V
- = VEE = -2.5V, V Output
P-P
+ = +2.5V DC 20 - MHz
REF
+ = +2.5V - 25 - ns
REF
+ = 6V, VDD = 6V 120 160 200 Glitch Area - 150 - pV/s Glitch Area V
- = VEE = -2.5V,V
REF
+ = +2.5V - 250 - pV/s
REF
3
CA3338, CA3338A
Electrical Specifications T
= 25oC, VDD = 5V, V
A
+ = 4.608V, VSS = VEE = V
REF
- = GND, LE Clocked at 20MHz, RL 1 MΩ,
REF
Unless Otherwise Specified (Continued)
PARAMETER TEST CONDITIONS MIN TYP MAX UNITS
REFERENCE VOLTAGE
+ Range (+) Full Scale, Note 2 V
V
REF
V
- Range (-) Full Scale, Note 2 V
REF
V
+ Input Current V
REF
+ = 6V, VDD = 6V - 40 50 mA
REF
- + 3 - V
REF
EE
-V
DD
+ - 3 V
REF
SUPPLY VOLTAGE
Static I
DD
or I
EE
LE = Low, D0 - D7 = High - 100 220 µA
LE = Low, D0 - D7 = Low - - 100 µA Dynamic I Dynamic I V
Rejection 50kHz Sine Wave Applied - 3 - mV/V
DD
V
Rejection 50kHz Sine Wave Applied - 1 - mV/V
EE
DD DD
or I or I
EE EE
V
= 10MHz, 0V to 5V Square Wave - 20 - mA
OUT
V
= 10MHz, ±2.5V Square Wave - 25 - mA
OUT
DIGITAL INPUTS D0 - D7, LE, COMP High Level Input Voltage Note 2 2 - - V Low Level Input Voltage Note 2 - - 0.8 V Leakage Current - ±1 ±5 µA Capacitance - 5 - pF
TEMPERATURE COEFFICIENTS
Output Impedance - 200 - ppm/×
NOTE:
2. Parameter not tested. but guaranteed by design or characterization.
V
o
C
4
Pin Descriptions
CA3338, CA3338A
PIN NAME DESCRIPTION
1 D7 Most Significant Bit 2 D6 Input 3D5 Data 4D4 Bits 5 D3 (High = True) 6D2 7D1 8V
9D0Least Significant Bit. Input Data Bit 10 V 11
V
12 V 13
V
14 COMP Data Complement Control input. Active High 15 LE Latch Enable Input. Active Low 16 V
Digital Ground
SS
Analog Ground
EE
Reference Voltage Negative Input
-
REF
Analog Output
OUT
Reference Voltage Positive Input
+
REF
Digital Power Supply, +5V
DD
Digital Signal Path
The digital inputs (LE, COMP, and D0 - D7) are of TTL compatible HCT High Speed CMOS design: the loading is essentially capacitive and the logic threshold is typically
1.5V. The 8 data bits, D0 (weighted 2
are applied to Exclusive OR gates (see Functional Diagram). The COMP (data complement) control provides the second input to the gates: if COMP is high, the data bits will be inverted as they pass through.
0
) through D7 (weighted 27),
INPUT
DAT A
LATCH
ENABLE
t
D1
t
D2
OUTPUT
VOLTAGE
FIGURE 2. DATA AND LATCH ENABLE TO OUTPUT TIMING
90%
t
r
10%
t
S
1
/2 LSB
1
/2 LSB
Latch Operation
Data is fed from input to output while LE is low: LE should be tied low for non-clocked operation.
Non-clocked operation or changing data while LE is low is not recommended for applications requiring low output “glitch” energy: there is no guarantee of the simultaneous changing of input data or the equal propagation delay of all bits through the converter. Several parameters are given if the converter is to be used in either of these modes: t gives the delay from the input changing to the output changing (10%), while t
and tH give the set up and hold
SU2
times (referred to LE rising edge) needed to latch data. See Figures 1 and 2.
Clocked operation is needed for low “glitch” energy use. Data must meet the given t
set up time to the LE falling edge,
SU1
and the tH hold time from the LE rising edge. The delay to the output changing, t
, is now referred to the LE falling
D1
edge.
D2
The input data and the LE (latch enable) signals are next applied to a level shifter. The inputs, operating between the levels of V
and VSS, are shifted to operate between V
DD
DD
and VEE. VEE optionally at ground or at a negative voltage, will be discussed under bipolar operation. All further logic elements except the output drivers operate from the V and V
supplies.
EE
DD
The upper 3 bits of data, D5 through D7, are input to a 3-to-7 line bar graph encoder. The encoder outputs and D0 through D4 are applied to a feedthrough latch, which is controlled by LE (latch enable).
INPUT DATA
t
SU1
LATCHED LATCHED
LATCH
ENABLE
FIGURE 1. DATA TO LATCH ENABLE TIMING
t
W
DAT A
FEEDTHROUGH
t
t
H
SU2
5
There is no need for a square wave LE clock; LE must only meet the minimum t
pulse width for successful latch
W
operation. Generally, output timing (desired accuracy of settling) sets the upper limit of usable clock frequency.
Output Structure
The latches feed data to a row of high current CMOS drivers, which in turn feed a modified R2R ladder network.
The “N” channel (pull down) transistor of each driver plus the bottom “2R” resistor are returned to V scale reference. The “P” channel (pull up) transistor of each driver is returned to V
In unipolar operation, V
+, the (+) full-scale reference.
REF
- would typically be returned to
REF
analog ground, but may be raised above ground (see specifications). There is substantial code dependent current that flows from V specifications), so V
REF
+ to V
REF
- (see V
REF
- should have a low impedance path
to ground.
- this is the (-) full-
REF
+ input current in
REF
CA3338, CA3338A
In bipolar operation, V voltage (the maximum voltage rating to V observed). V
, which supplies the gate potential for the
EE
- would be returned to a negative
REF
must be
DD
output drivers, must be returned to a point at least as negative as V
-. Note that the maximum clocking speed
REF
decreases when the bipolar mode is used.
Static Characteristics
The ideal 8-bit D/A would hav e an output eq ual to V an input code of 00 equal to 255/256 of V code of FF
HEX
(zero scale output), and an output
HEX
+ (referred to V
REF
-) with an input
REF
(full scale output). The difference between the ideal and actual values of these two par ameters are the OFFSET and GAIN errors, respectively; see Figure 3.
If the code into an 8-bit D/A is changed by 1 count, the output should change by 1/255 (full scale output - zero scale output). A deviation from this step size is a diff erential linearity error, see Figure 4. Note that the error is expressed in fractions of the ideal step size (usually called an LSB). Also note that if the (-) differential linearity error is less (in absolute numbers) than 1 LSB, the device is monotonic. (The output will always increase for increasing code or decrease for decreasing code).
If the code into an 8-bit D/A is at any value, say “N”, the output voltage should be N/255 of the full scale output (referred to the zero scale output). Any deviation from that output is an integral linearity error, usually expressed in LSBs. See Figure 4.
Note that OFFSET and GAIN errors do not affect integral linearity, as the linearity is referenced to actual zero and full scale outputs, not ideal. Absolute accuracy would have to also take these errors into account.
­255/256
REF
+ - V
254/256
REF
253/256
3/256
2/256
1/256
0
OUTPUT VOLTAGE AS A FRACTION OF V
00 01 02 03 FD FE FF
FIGURE 3. D/A OFFSET AND GAIN ERROR
= IDEAL TRANSFER CURVE = ACTUAL TRANSFER CURVE
OFFSET
ERROR
(SHOWN +)
INPUT CODE IN HEXADECIMAL (COMP = LOW)
GAIN ERROR
(SHOWN -)
REF
- with
STRAIGHT LINE FROM “0” SCALE TO FULL SCALE
= IDEAL TRANSFER CURVE = ACTUAL TRANSFER CURVE
OUTPUT VOLTAGE
0
00
FIGURE 4. D/A INTEGRAL AND DIFFERENTIAL LINEARITY
A
C
ERROR
VOLTAGE
INTEGRAL LINEARITY
ERROR (SHOWN -)
B
A = IDEAL STEP SIZE (1/255 OF FULL
SCALE -“0” SCALE VOLTAGE) B - A = +DIFFERENTIAL LINEARITY ERROR C - A = -DIFFERENTIAL LINEARITY ERROR
INPUT CODE
Dynamic Characteristics
Keeping the full-scale range (V possible gives the best linearity and lowest “glitch” energy (referred to 1V). This provides the best “P” and “N” channel gate drives (hence saturation resistance) and propagation delays. The V
REF
+ (and V
REF
well bypassed as near the chip as possible. “Glitch” energy is defined as a spu rious voltage that occu rs as
the output is changed from one voltage to another. In a binary input converter, it is usually highe st at the most significa nt bit transition (7F
HEX
to 80
for an 8 bit device), and can be
HEX
measured by displaying the output as the input co de alternates around that point. The “glitch” energy is the area between the actual output display and an ideal one L SB step voltage (subtracting negative area from positi ve), at either the positive or negative-going step. It is usually expressed in pV/s .
The CA3338 uses a modified R2R ladder, whe re the 3 mo st significant bits drive a bar graph decoder and 7 equally weighted resistors. This makes the “glitch” energy at each scale transition (1F
HEX
to 20 essentially equal, and far less than the MSB transition would otherwise display.
For the purpose of comparison to other converters, the output should be resistively divided to 1V full scale. Figure 5 shows a typical hook-up for checking “glitch” energy or settling time .
The settling time of the A/D is mainly a function of the output resistance (approxi ma tely 160 i n par allel w ith the load resistance) and the load plus internal chip capacitance. Both “glitch” energy and settling time measurements require v e ry good circuit and probe grounding: a probe tip connector such as Tektronix part number 131-0258-00 is recommended.
REF
+ - V
-) as high as
REF
- if bipolar) terminal should be
HEX
, 3F
HEX
to 40
HEX
, etc.)
1
/8
6
CLOCK
8 DATA BITS
+5V
1-7, 9
CA3338, CA3338A
CA3338
R1
+5V +2.5V
-2.5V
R2
PROBE TIP OR BNC CONNECTOR
R3
REMOTE V
OUT
15
LE
D0 - D7
16
V
DD
+
14
COMP
8
V
SS
12
V
OUT
13
V
+
REF
11
-
V
REF
10
V
EE
+
+
DIGITAL
GROUND
FUNCTION CONNECTOR R1 R2 R3 V
ANALOG GROUND
OUT (P-P)
Oscilloscope Display Probe Tip 82 62Ω N/C 1V Match 93 Cable BNC 75 160 93 1V Match 75 Cable BNC 18 130 75 1V Match 50Cable BNC Short 75 50 0 79V
NOTES:
3. V
OUT(P-P)
4. All drawn capacitors are 0.1µF multilayer ceramic/4.7µF tantalum.
is approximate, and will vary as R
of D/A varies.
OUT
5. Dashed connections are for unipolar operation. Solid connection are for bipolar operation.
FIGURE 5. CA3338 DYNAMIC TEST CIRCUIT
+6V
4.7µF TAN +
5pF
11
6
0.1µF CER.
+
0.1µF CER.
4.7µF TAN
UP TO 5 OUTPUT LINES FOR R = 75, 3 LINES FOR R = 50
R
= ±1.5V
V
OUT
R
V
R
PEAK
V
R
CA3338
15
16
14
8
LE
D0 - D7
V
DD
COMP V
SS
V
12
OUT
13
V
+
REF
11
-
V
REF
10
V
EE
CLOCK
8 DATA
BITS
+5V
1-7, 9
4.7µF
+
TAN
0.1µF CER.
NOTES:
1. Both V bypassed within
+ pin and 392 resistor should be
REF
1
/4 inch.
2. Keep nodal capacitance at CA3450 pin 3 as
+3.00V AT 25mA
1k
+
4.7µF TAN
0.1µF CER.
392
1%
10k
ADJUST OFFSET
7, 8
14
3
392
1%
9
+
CA3450
­4, 5, 12, 13
-6V
low as possible.
3. V
Range = ±3V at CA3450.
OUT
FIGURE 6. CA3338 AND CA3450 FOR DRIVING MULTIPLE COAXIAL LINES
OUT
OUT
1
N
7
CA3338, CA3338A
TABLE 1. OUTPUT VOLTAGE vs INPUT CODE AND V
V
+
REF
V
-
REF
STEP SIZE
Input Code 11111111 111111102=FE
10000001 100000002=80 011111112=7F
00000001 000000002=00
2
2
2
=FF
=81
=01
HEX HEX
HEX HEX
HEX
HEX HEX
5.12V 0
0.0200V
5.1000V
5.0800
2.5800
2.5600
2.5400
0.0200
0.0000
5.00V
0.0195V
4.9805V
4.9610
2.5195
2.5000
2.4805
0.0195
0.0000
0
4.608V 0
0.0180V
4.5900V
4.5720
2.3220
2.3040
2.2860
0.0180
0.0000
-2.56V
0.0200V
2.5400V
2.5200
0.0200
0.0000
- 0.0200
-2.5400
-2.5600
2.56V
REF
2.50V
-2.50V
0.0195V
2.4805V
2.4610
0.0195
0.0000
-0.0195
-2.4805
-2.5000
Applications
The output of the CA3338 can be resistively divided to match a doubly terminated 50 or 75 line, although peak-to-peak swings of less than 1V may result. The output magnitude will also vary with the converter’s output impedance. Figure 5 shows such an application. Note that because of the HCT input structure, the CA3338 could be operated up to +7.5V V V
+ supplies and still accept 0V to 5V CMOS input voltages.
REF
If larger voltage swings or better accuracy is desired, a high speed output buffer, such as the HA-5033, HA-2542, or CA3450, can be employed. Figure 6 shows a typical application, with the output capable of driving ±2V into multiple 50terminated lines.
DD
and
Operating and Handling Considerations
HANDLING
All inputs and outputs of CMOS devices have a network for electrostatic protection during handling. Recommended handling practices for CMOS devices are described in AN6525. “Guide to Better Handling and Operation of CMOS Integrated Circuits.”
OPERATING
OPERATING VOLTAGE
During operation near the maximum supply voltage limit, care should be taken to avoid or suppress power supply turn-on and turn-off transients, power supply ripple, or ground noise; any of these conditions must not cause the absolute maximum ratings to be exceeded.
INPUT SIGNALS
To prevent damage to the input protection circuit, input signals should never be greater than V Input currents must not exceed 20mA even when the power supply is off.
UNUSED INPUTS
A connection must be provided at every input terminal. All unused input terminals must be connected to either V GND, whichever is appropriate.
nor less than VSS.
DD
CC
or
8
Dual-In-Line Plastic Packages (PDIP)
CA3338, CA3338A
N
D1
-C-
E1
-B-
A1
A2
E
A
L
e
C
C
L
e
A
C
e
B
INDEX
AREA
BASE
PLANE
SEATING
PLANE
D1
B1
12 3 N/2
-A­D
e
B
0.010 (0.25) C AM BS
NOTES:
1. Controlling Dimensions: INCH. In case of conflict between English and Metric dimensions, the inch dimensions control.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of Publication No. 95.
4. Dimensions A, A1 and L are measured with the package seated in JE­DEC seating plane gauge GS-3.
5. D, D1, and E1 dimensions do not include mold flash or protrusions. Mold flash or protrusions shall not exceed 0.010 inch (0.25mm).
6. E and are measured with the leads constrained to be perpendic-
7. e
e
A
ular to datum .
and eC are measured at the lead tips with the leads unconstrained.
B
e
must be zero or greater.
C
-C-
8. B1 maximum dimensions do not include dambar protrusions. Dambar protrusions shall not exceed 0.010 inch (0.25mm).
9. N is the maximum number of terminal positions.
10. Corner leads (1, N, N/2 and N/2 + 1) for E8.3, E16.3, E18.3, E28.3, E42.6 will have a B1 dimension of 0.030 - 0.045 inch (0.76 - 1.14mm).
E16.3 (JEDEC MS-001-BB ISSUE D)
16 LEAD DUAL-IN-LINE PLASTIC PACKAGE
INCHES MILLIMETERS
SYMBOL
A - 0.210 - 5.33 4 A1 0.015 - 0.39 - 4 A2 0.115 0.195 2.93 4.95 -
B 0.014 0.022 0.356 0.558 ­B1 0.045 0.070 1.15 1.77 8, 10
C 0.008 0.014 0.204 0.355 -
D 0.735 0.775 18.66 19.68 5
D1 0.005 - 0.13 - 5
E 0.300 0.325 7.62 8.25 6 E1 0.240 0.280 6.10 7.11 5
e 0.100 BSC 2.54 BSC -
e
A
e
B
0.300 BSC 7.62 BSC 6
- 0.430 - 10.92 7
L 0.115 0.150 2.93 3.81 4
N16 169
NOTESMIN MAX MIN MAX
Rev. 0 12/93
9
CA3338, CA3338A
Small Outline Plastic Packages (SOIC)
N
INDEX AREA
123
-A­D
e
B
0.25(0.010) C AM BS
E
-B-
SEA TING PLANE
A
-C-
M
0.25(0.010) BM M
H
α
µ
A1
0.10(0.004)
L
h x 45
o
C
NOTES:
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of Publication Number 95.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate burrs. Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006 inch) per side.
4. Dimension “E” does not include interlead flash or protrusions. Interlead flash and protrusions shall not exceed 0.25mm (0.010 inch) per side.
5. The chamfer on the body is optional. If it is not present, a visual index feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater above the seating plane, shall not exceed a maximum value of 0.61mm (0.024 inch)
10. Controlling dimension: MILLIMETER. Converted inch dimensions are not necessarily exact.
M16.3 (JEDEC MS-013-AA ISSUE C)
16 LEAD WIDE BODY SMALL OUTLINE PLASTIC PACKAGE
INCHES MILLIMETERS
SYMBOL
A 0.0926 0.1043 2.35 2.65 -
A1 0.0040 0.0118 0.10 0.30 -
B 0.013 0.0200 0.33 0.51 9 C 0.0091 0.0125 0.23 0.32 ­D 0.3977 0.4133 10.10 10.50 3 E 0.2914 0.2992 7.40 7.60 4 e 0.050 BSC 1.27 BSC ­H 0.394 0.419 10.00 10.65 ­h 0.010 0.029 0.25 0.75 5 L 0.016 0.050 0.40 1.27 6 N16 167
o
α
0
o
8
o
0
o
8
Rev. 0 12/93
NOTESMIN MAX MIN MAX
-
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