International Rectifier JANTX2N6800, JANTXV2N6800 Datasheet

HEXFET
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®
POWER MOSFET
Provisional Data Sheet No. PD-9.432B
JANTX2N6800
JANTXV2N6800
[REF:MIL-PRF-19500/557]
[GENERIC:IRFF330]
N-CHANNEL
400 Volt, 1.0
HEXFET technology is the key to International Rectifier’s advanced line of power MOSFET transis­tors. The efficient geometry achieves very low on­state resistance combined with high transconductance.
HEXFET transistors also feature all of the well-es­tablish advantages of MOSFETs, such as voltage control, very fast switching, ease of paralleling and electrical parameter temperature stability. They are well-suited for applications such as switching power supplies, motor controls, inverters, choppers, audio amplifiers, and high energy pulse circuits, and virtu­ally any application where high reliability is required.
ΩΩ
HEXFET
ΩΩ
Product Summary
Part Number BVDSS RDS(on) ID
JANTX2N6800
JANTXV2N6800
Features:
Avalanche Energy Rating
Dynamic dv/dt Rating
Simple Drive Requirements
Hermetically Sealed
Absolute Maximum Ratings
Parameter JANTX2N6800, JANTXV2N6800 Units
ID @ VGS = 10V, TC = 25°C Continuous Drain Current 3.0
ID @ VGS = 10V , TC = 100°C Continuous Drain Current 2.0
I
DM
PD @ TC = 25°C Max. Power Dissipation 25 W
V
GS
dv/dt Peak Diode Recovery dv/dt 4.0
T
J
T
STG
Pulsed Drain Current 12.0
Linear Derating Factor 0.20 W/K Gate-to-Source Voltage ±20 V
Operating Junction -55 to 150 Storage Temperature Range Lead Temperature 300
Weight 0.98 (typical) g
(0.063 in. (1.6mm) from
case for 10.5 seconds)
1.0400V
3.0A
A
V/ns
o
C
JANTX2N6800, JANTXV2N6800 Device
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Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)
Parameter Min. Typ. Max. Units Test Conditions
BV
DSS
BV R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
D
L
S
C
iss
C
oss
C
rss
DSS
Drain-to-Source Breakdown Voltage 400 V VGS = 0V, ID = 1.0 mA
/TJTemperature Coefficient of Breakdown 0.37 V/°C Reference to 25°C, ID = 1.0 mA
Voltage Static Drain-to-Source 1.0 VGS = 10V, ID = 2.0A On-State Resistance 1.15 VGS = 10V, ID = 3.0A Gate Threshold Voltage 2 . 0 4.0 V VDS = VGS, ID = 250µA Forward Transconductance 2.0 S ( )VDS > 15V, IDS = 2.0A Zero Gate Voltage Drain Current 25 VDS = 0.8 x Max Rating,VGS = 0V
250 VDS = 0.8 x Max Rating
Gate-to-Source Leakage Forward 100 VGS = 20V Gate-to-Source Leakage Reverse -100 VGS = -20V Total Gate Charge 19.1 33 VGS = 10V, ID = 3.0A Gate-to-Source Charge 1.0 5.8 VDS = Max. Rating x 0.5 Gate-to-Drain (“Miller”) Charge 6.7 19.9 see figures 6 and 13 Turn-On Delay T ime 30 VDD = 200V, ID = 3.0A, Rise Time 35 RG = 7.5, VGS = 10V Turn-Off Delay Time 55 Fall Time 35 see figure 10 Internal Drain Inductance 5.0
Internal Source Inductance 15
Input Capacitance 6 20 VGS = 0V, VDS = 25V Output Capacitance 200 f = 1.0 MHz Reverse Transfer Capacitance 75 see figure 5
µA
nA
nC
ns
Measured from the drain lead, 6mm (0.25 in.) from package to center of die.
nH
Measured from the source lead, 6mm (0.25 in.) from package to source bonding pad.
pF
VGS = 0V, TJ = 125°C
Modified MOSFET symbol showing the internal inductances.
Source-Drain Diode Ratings and Characteristics
Parameter Min. Typ. Max. Units Test Conditions
I
Continuous Source Current (Body Diode) 3.0 Modified MOSFET symbol showing the
S
I
Pulse Source Current (Body Diode) 12.0 integral reverse p-n junction rectifier.
SM
V
Diode Forward Voltage 1.4 V Tj = 25°C, IS = 3.0A, VGS = 0V
SD
t
Reverse Recovery Time 700 ns Tj = 25°C, IF = 3.0A, di/dt 100A/µs
rr
Q
Reverse Recovery Charge 6.2 µCV
RR
t
Forward Turn-On Time
on
Intrinsic turn-on time is negligible. T urn-on speed is substantially controlled by LS + LD.
Thermal Resistance
Parameter Min. Typ. Max. Units Test Conditions
R R
thJC thJA
Junction-to-Case 5.0 Junction-to-Ambient 175 K/W Typical socket mount
A
50V
DD
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