International Rectifier JANTXV2N6766, JANTX2N6766 Datasheet

HEXFET
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®
POWER MOSFET
Provisional Data Sheet No. PD-9.338D
JANTX2N6766
JANTXV2N6766
[REF:MIL-PRF-19500/543]
[GENERIC:IRF250]
N-CHANNEL
200 V olt, 0.085
HEXFET technology is the key to International Rectifier’s advanced line of power MOSFET transistors. The effi­cient geometry achieves very low on-state resistance combined with high transconductance.
HEXFET transistors also feature all of the well-establish advantages of MOSFETs, such as voltage control, very fast switching, ease of paralleling and electrical param­eter temperature stability . They are well-suited for appli­cations such as switching power supplies, motor controls, inverters, choppers, audio amplifiers, and high energy pulse circuits, and virtually any application where high reliability is required.
ΩΩ
HEXFET
ΩΩ
Product Summary
Part Number BVDSS RDS(on) ID
JANTX2N6766
JANTXV2N6766
Features:
Avalanche Energy Rating
Dynamic dv/dt Rating
Simple Drive Requirements
Hermetically Sealed
Absolute Maximum Ratings
Parameter JANTX2N6766, JANTXV2N6766 Units
ID @ VGS = 10V, TC = 25°C Continuous Drain Current 30
ID @ VGS = 10V, TC = 100°C Continuous Drain Current 19
I
DM
PD @ TC = 25°C Max. Power Dissipation 150 W
V
GS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt 5.0
T
J
T
STG
Pulsed Drain Current 120
Linear Derating Factor 1.2 W/K Gate-to-Source Voltage ±20 V Single Pulse Avalanche Energy 500 mJ Avalanche Current 30 A Repetitive Avalanche Energy 15 mJ
Operating Junction -55 to 150 Storage T emperature Range
Lead Temperature 300
Weight 11.5 (typical) g
200V
(0.063 in. (1.6mm) from
case for 10.5 seconds)
0.085
A
V/ns
o
C
30A
JANTX2N6766, JANTXV2N6766 Device
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Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)
Parameter Min. Typ. Max. Units Test Conditions
BV
DSS
BV R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
D
L
S
C
iss
C
oss
C
rss
DSS
Drain-to-Source Breakdown Voltage 200 V VGS = 0V, ID = 1.0 mA
/TJTemperature Coefficient of Breakdown 0.29 V/°C Reference to 25°C, ID = 1.0 mA
Voltage Static Drain-to-Source — 0.085 VGS = 10V, ID = 19A On-State Resistance 0.090 VGS = 10V, ID = 30A Gate Threshold Voltage 2.0 4.0 V VDS = VGS, ID = 250µA Forward Transconductance 9.0 S ( )VDS > 15V, IDS = 19A Zero Gate Voltage Drain Current 25 VDS = 0.8 x Max Rating,VGS = 0V
250 VDS = 0.8 x Max Rating
Gate-to-Source Leakage Forward 100 VGS = 20V Gate-to-Source Leakage Reverse -100 VGS = -20V Total Gate Charge 55 115 VGS = 10V, ID = 30A Gate-to-Source Charge 8 22 VDS = Max. Rating x 0.5 Gate-to-Drain (“Miller”) Charge 30 60 see figures 6 and 13 Turn-On Delay T ime 35 VDD = 100V, ID = 30A, Rise Time 190 RG = 3.5, VGS = 10V Turn-Off Delay Time 170 Fall Time 13 0 see figure 10 Internal Drain Inductance 5.0
Internal Source Inductance 13
Input Capacitance 3500 VGS = 0V, VDS = 25V Output Capacitance 700 f = 1.0 MHz Reverse Transfer Capacitance 110 see figure 5
µA
nA
nC
ns
Measured from the drain lead, 6mm (0.25 in.) from package to center of die.
nH
Measured from the source lead, 6mm (0.25 in.) from package to source bonding pad.
pF
VGS = 0V, TJ = 125°C
Modified MOSFET symbol showing the internal inductances.
Source-Drain Diode Ratings and Characteristics
Parameter Min. Typ. Max. Units Test Conditions
I
Continuous Source Current (Body Diode) 30 Modified MOSFET symbol showing the
S
I
Pulse Source Current (Body Diode) 120 integral reverse p-n junction rectifier.
SM
V
Diode Forward Voltage 1.9 V Tj = 25°C, IS = 30A, VGS = 0V
SD
t
Reverse Recovery Time 95 0 ns Tj = 25°C, IF = 30A, di/dt 100A/µs
rr
Q
Reverse Recovery Charge 9.0 µCV
RR
t
Forward Turn-On Time
on
Intrinsic turn-on time is negligible. T urn-on speed is substantially controlled by LS + LD.
Thermal Resistance
Parameter Min. Typ. Max. Units Test Conditions
R R
thJC thJA
Junction-to-Case — 0.83 Junction-to-Ambient 48 K/W Typical socket mount
A
50V
DD
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