International Rectifier IFRU 3710 ZPbF Service Manual

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PD - 95513A
S
D
G
Absolute Maximum Ratings
ID @ TC = 25°C
Contin uous Drain Current , V
@ 10V
ID @ TC = 100°C
Contin uous Drain Current , V
@ 10V
ID @ TC = 25°C
Contin uous Drain Current , V
@ 10V
IDMPulse d D r ai n C ur rent
c
PD @TC = 25°C
V
E
Single Pulse Av alanch e Energy
d
E
(Tested )
Single Pulse Avalanche Energy Tested Value
h
IARAvalanche Current
c
EARRepeti ti ve Avalanche En er gy
g
T
T
Thermal Resistance
R
R
Junction- to-Ambient (PCB moun t)
i
R
AUTOMOTIVE MOSFET
Features
l Advanced Process Technology l Ultra Low On-Resistance l 175°C Operating Temperature l Fast Switching l Repetitive Avalanche Allowed up to Tjmax l Lead-Free
Description
Specifically designed for Automotive applications, this HEXFET Power MOSFET utilizes the latest processing techniques to achieve extremely low on-resistance per silicon area. Additional features of this design are a 175°C junction operating tempera­ture, fast switching speed and improved repetitive avalanche rating . These features combine to make this design an extremely efficient and reliable device for use in Automotive applications and a wide variety of other applications.
Parameter Units
(Silicon Limited)
(Package Limited)
GS
AS (Thermally limited) AS
J STG
GS GS GS
Power Dissipati on W Linear D er a t i ng Factor W/°C
Gate-to-Sour c e V o ltage V
Operat i n g J unction and Storag e Temperature Range °C
Soldering Temperature, for 10 seconds Mounting Torque , 6- 32 or M3 screw
IRFR3710ZPbF IRFU3710ZPbF
HEXFET® Power MOSFET
V
DSS
R
®
D-Pak
IRFR3710Z
Max.
56 39
42 220 140
0.95
± 20
150 200
See Fig.12a, 12b, 15 , 16
-55 to + 175
300 (1. 6m m fr o m case )
y
in (1.1Nym)
10 lbf
DS(on)
ID = 42A
IRFU3710Z
= 18m
I-Pak
A
mJ
A
mJ
JC
θ
JA
θ
JA
θ
HEXFET® is a registered trademark of International Rectifier.
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Parameter Typ. Max. Units
Junction-to-Case ––– 1.05
––– 40 °C/W
Junction-to-Ambient ––– 110
12/03/04
IRFR/U3710ZPbF
S
D
G
S
D
Electrical Characteristics @ T
= 25°C (unless otherwise specified)
V
V
/∆T
R
mΩV
I
I
Q
Q
Q
t
t
t
t
L
L
C
C
C
C
C
C
eff.
Source-Drain Ratings and Characteristics
z
z
di/dt = 100A/µs
J
Parameter Min. Typ. Max. Units
(BR)DSS
(BR)DSS DS(on) GS(th)
gfs Forwa rd Transconductance 39 –– – ––– S
DSS
GSS
g gs gd
d(on) r d(off) f
D
S
iss oss rss oss oss oss
Drain-to-Sou rce Breakdown Volt a ge 100 ––– ––– V Breakdown Voltag e Temp. Coef ficient ––– 0.088 ––– V/°C
J
Stat ic D r ai n- to-Sour c e O n- R e s i s tance ––– 15 18 Gate Threshold Voltage 2.0 ––– 4.0 V
Drain-to-Sou rce Leakage Current ––– ––– 20 µA
––– ––– 250 Gate-to-Sour c e Fo r w ard Leakage ––– ––– 200 nA Gate-to-Sour c e R ev erse Leak a ge ––– – –– -200 Total Gate Charge ––– 69 100 Gate-to-Sour c e C ha r ge ––– 15 ––– nC Gate-to-Drai n ("Miller" ) Charge ––– 25 ––– Turn-On Delay Time ––– 14 ––– Rise Time ––– 43 ––– Turn-Off Delay Time ––– 53 ––– ns Fall Time ––– 42 ––– Internal Drain Inductance ––– 4.5 ––– Between lead,
Internal Source Inductance ––– 7.5 ––– from package
Input Capacitance ––– 2930 ––– Output Capacitance ––– 290 ––– Reverse Transf er C ap ac itance ––– 180 ––– pF Output Capacitance ––– 1200 ––– Output Capacitance ––– 180 ––– Effe c tive Out pu t Capacita nc e ––– 430 –––
Conditions
VGS = 0V, ID = 250µA Referen ce to 25°C, I
= 10V, ID = 33A
V
GS
VDS = VGS, ID = 250µA V
= 25V, ID = 33A
DS
V
= 100V, VGS = 0V
DS
= 100V, VGS = 0V, TJ = 125°C
V
DS
= 20V
V
GS
= -20V
V
GS
= 33A
I
D
= 80V
V
DS
VGS = 10V
e
VDD = 50V
= 33A
I
D
= 6.8
R
G
VGS = 10V
e
nH 6mm (0.25in.)
and center of die contact VGS = 0V
= 25V
V
DS
ƒ = 1.0MHz VGS = 0V, VDS = 1.0V, ƒ = 1.0MH VGS = 0V, VDS = 80V, ƒ = 1. 0M H VGS = 0V, VDS = 0V to 80V
D
e
= 1mA
G
f
Paramete r Min . Typ. Max. Uni ts
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Contin uous Source Cu rrent ––– ––– 56 (Body Diode) A
Pulsed Source Current ––– ––– 220 (Body Diode)
Diode Forward Voltage ––– ––– 1.3 V Reverse Recovery Time ––– 35 53 ns Reverse Recovery Charge ––– 41 62 nC Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
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c
Conditions
MOSFET symbol showing the
integral reverse p-n junct ion diode.
T
= 25°C, IS = 33A, VGS = 0V
J
TJ = 25°C, IF = 33A, VDD = 50V
e
e
IRFR/U3710ZPbF
1000
TOP 15V
) A
(
t
n
e
r
r
u C e
c
r
u
o S
-
o
t
-
n
i
a
r D
,
D
I
100
10
BOTTOM 4.0V
VGS 10V
6.0V
5.0V
4.8V
4.5V
4.3V
4.0V 60µs PULSE WIDTH
1
Tj = 25°C
0.1 1 10 100 VDS, Drain-to-Sour ce Voltage (V)
1000
1000
) A
(
100
t
n
e
r
r
u C e
c
r
10
u
o S
-
o
t
-
n
i
a
r D
,
D
I
TOP 15V
BOTTOM 4.0V
1
VGS 10V
6.0V
5.0V
4.8V
4.5V
4.3V
4.0V
60µs PULSE WIDTH Tj = 175°C
0.1
0.1 1 10 100 VDS, Drain-to-Sour ce Voltage (V)
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
100
)
)
Α
(
t
n
e
r
100
r
u C e
c
r
u
o S
-
o
t
-
n
10
i
a
r D
,
D
I
TJ = 175°C
TJ = 25°C
V
= 25V
DS
60µs PULSE WIDTH
1.0 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
VGS, Gate-to-Source Voltage (V)
Fig 3. Typical Transfer Characteristics
S
(
80
e
c
n
a
t
c
u
d
60
n
o
c
s
n
a
r T
40
d
r
a w
r
o F
20
,
s
f
G
TJ = 25°C
TJ = 175°C
V
0
0 1020304050607080
ID,Drain-to-Source Current (A)
Fig 4. Typical Forward Transconductance
DS
= 10V
vs. Drain Current
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IRFR/U3710ZPbF
100000
10000
) F
p
(
e
c
n
a
t
i
1000
c
a
p
a C
, C
100
10
V
= 0V, f = 1 MHZ
GS
C
= C
= C
= C
+ Cgd, C
gs
gd
+ C
ds
ds
gd
C
iss
C
oss
C
rss
iss
C
rss
C
oss
1 10 100
VDS, Drain-to-Sour ce Voltage (V)
Fig 5. Typical Capacitance vs.
Drain-to-Source Voltage
1000.00
) A
(
t
100.00
n
e
r
r
u C n
i
a
r D e
s
r
e
v
e R
,
D S
I
10.00
1.00
0.10
TJ = 175°C
TJ = 25°C
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 VSD, Source-to-Drai n Voltage (V)
SHORTED
V
GS
= 0V
) V
( e
g
a
t
l
o V
e
c
r
u
o S
-
o
t
-
e
t
a G
, V
12.0 ID= 33A
10.0
8.0
6.0
4.0
S G
2.0
0.0 0 1020304050607080
VDS= 80V VDS= 50V VDS= 20V
Q
Total G ate Charge (nC)
G
Fig 6. Typical Gate Charge vs.
Gate-to-Source Voltage
1000
) A
(
t
100
n
e
r
r
u C e
c
r
u
10
o S
-
o
t
-
n
i
a
r D
1
,
D
I
Tc = 25°C Tj = 175°C Single Pulse
0.1 1 10 100 1000
OPERATION IN THIS AREA LIMITED BY RDS(on)
100µsec
1msec
10msec
VDS, Drain-to-Sour ce Voltage (V)
Fig 7. Typical Source-Drain Diode
Fig 8. Maximum Safe Operating Area
Forward Voltage
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