PD - 95513A
Contin uous Drain Current , V
Contin uous Drain Current , V
Contin uous Drain Current , V
IDMPulse d D r ai n C ur rent
Single Pulse Av alanch e Energy
Single Pulse Avalanche Energy Tested Value
EARRepeti ti ve Avalanche En er gy
Junction- to-Ambient (PCB moun t)
AUTOMOTIVE MOSFET
Features
l Advanced Process Technology
l Ultra Low On-Resistance
l 175°C Operating Temperature
l Fast Switching
l Repetitive Avalanche Allowed up to Tjmax
l Lead-Free
Description
Specifically designed for Automotive applications, this HEXFET
Power MOSFET utilizes the latest processing techniques to
achieve extremely low on-resistance per silicon area. Additional
features of this design are a 175°C junction operating temperature, fast switching speed and improved repetitive avalanche
rating . These features combine to make this design an extremely
efficient and reliable device for use in Automotive applications and
a wide variety of other applications.
Parameter Units
(Silicon Limited)
(Package Limited)
GS
AS (Thermally limited)
AS
J
STG
GS
GS
GS
Power Dissipati on W
Linear D er a t i ng Factor W/°C
Gate-to-Sour c e V o ltage V
Operat i n g J unction and
Storag e Temperature Range °C
Soldering Temperature, for 10 seconds
Mounting Torque , 6- 32 or M3 screw
IRFR3710ZPbF
IRFU3710ZPbF
HEXFET® Power MOSFET
V
= 100V
DSS
R
®
D-Pak
IRFR3710Z
Max.
56
39
42
220
140
0.95
± 20
150
200
See Fig.12a, 12b, 15 , 16
-55 to + 175
300 (1. 6m m fr o m case )
y
in (1.1Nym)
10 lbf
DS(on)
ID = 42A
IRFU3710Z
= 18mΩ
I-Pak
A
mJ
A
mJ
JC
θ
JA
θ
JA
θ
HEXFET® is a registered trademark of International Rectifier.
www.irf.com 1
Parameter Typ. Max. Units
Junction-to-Case ––– 1.05
––– 40 °C/W
Junction-to-Ambient ––– 110
12/03/04
IRFR/U3710ZPbF
Electrical Characteristics @ T
= 25°C (unless otherwise specified)
Source-Drain Ratings and Characteristics
J
Parameter Min. Typ. Max. Units
(BR)DSS
∆
(BR)DSS
DS(on)
GS(th)
gfs Forwa rd Transconductance 39 –– – ––– S
DSS
GSS
g
gs
gd
d(on)
r
d(off)
f
D
S
iss
oss
rss
oss
oss
oss
Drain-to-Sou rce Breakdown Volt a ge 100 ––– ––– V
Breakdown Voltag e Temp. Coef ficient ––– 0.088 ––– V/°C
J
Stat ic D r ai n- to-Sour c e O n- R e s i s tance ––– 15 18
Gate Threshold Voltage 2.0 ––– 4.0 V
Drain-to-Sou rce Leakage Current ––– ––– 20 µA
––– ––– 250
Gate-to-Sour c e Fo r w ard Leakage ––– ––– 200 nA
Gate-to-Sour c e R ev erse Leak a ge ––– – –– -200
Total Gate Charge ––– 69 100
Gate-to-Sour c e C ha r ge ––– 15 ––– nC
Gate-to-Drai n ("Miller" ) Charge ––– 25 –––
Turn-On Delay Time ––– 14 –––
Rise Time ––– 43 –––
Turn-Off Delay Time ––– 53 ––– ns
Fall Time ––– 42 –––
Internal Drain Inductance ––– 4.5 ––– Between lead,
Internal Source Inductance ––– 7.5 ––– from package
Input Capacitance ––– 2930 –––
Output Capacitance ––– 290 –––
Reverse Transf er C ap ac itance ––– 180 ––– pF
Output Capacitance ––– 1200 –––
Output Capacitance ––– 180 –––
Effe c tive Out pu t Capacita nc e ––– 430 –––
Conditions
VGS = 0V, ID = 250µA
Referen ce to 25°C, I
= 10V, ID = 33A
V
GS
VDS = VGS, ID = 250µA
V
= 25V, ID = 33A
DS
V
= 100V, VGS = 0V
DS
= 100V, VGS = 0V, TJ = 125°C
V
DS
= 20V
V
GS
= -20V
V
GS
= 33A
I
D
= 80V
V
DS
VGS = 10V
e
VDD = 50V
= 33A
I
D
Ω
= 6.8
R
G
VGS = 10V
e
nH 6mm (0.25in.)
and center of die contact
VGS = 0V
= 25V
V
DS
ƒ = 1.0MHz
VGS = 0V, VDS = 1.0V, ƒ = 1.0MH
VGS = 0V, VDS = 80V, ƒ = 1. 0M H
VGS = 0V, VDS = 0V to 80V
D
e
= 1mA
G
f
Paramete r Min . Typ. Max. Uni ts
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Contin uous Source Cu rrent ––– ––– 56
(Body Diode) A
Pulsed Source Current ––– ––– 220
(Body Diode)
Diode Forward Voltage ––– ––– 1.3 V
Reverse Recovery Time ––– 35 53 ns
Reverse Recovery Charge ––– 41 62 nC
Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
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c
Conditions
MOSFET symbol
showing the
integral reverse
p-n junct ion diode.
T
= 25°C, IS = 33A, VGS = 0V
J
TJ = 25°C, IF = 33A, VDD = 50V
e
e
IRFR/U3710ZPbF
1000
TOP 15V
)
A
(
t
n
e
r
r
u
C
e
c
r
u
o
S
-
o
t
-
n
i
a
r
D
,
D
I
100
10
BOTTOM 4.0V
VGS
10V
6.0V
5.0V
4.8V
4.5V
4.3V
4.0V
60µs PULSE WIDTH
1
Tj = 25°C
0.1 1 10 100
VDS, Drain-to-Sour ce Voltage (V)
1000
1000
)
A
(
100
t
n
e
r
r
u
C
e
c
r
10
u
o
S
-
o
t
-
n
i
a
r
D
,
D
I
TOP 15V
BOTTOM 4.0V
1
VGS
10V
6.0V
5.0V
4.8V
4.5V
4.3V
4.0V
60µs PULSE WIDTH
Tj = 175°C
0.1
0.1 1 10 100
VDS, Drain-to-Sour ce Voltage (V)
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
100
)
)
Α
(
t
n
e
r
100
r
u
C
e
c
r
u
o
S
-
o
t
-
n
10
i
a
r
D
,
D
I
TJ = 175°C
TJ = 25°C
V
= 25V
DS
60µs PULSE WIDTH
1.0
2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
VGS, Gate-to-Source Voltage (V)
Fig 3. Typical Transfer Characteristics
S
(
80
e
c
n
a
t
c
u
d
60
n
o
c
s
n
a
r
T
40
d
r
a
w
r
o
F
20
,
s
f
G
TJ = 25°C
TJ = 175°C
V
0
0 1020304050607080
ID,Drain-to-Source Current (A)
Fig 4. Typical Forward Transconductance
DS
= 10V
vs. Drain Current
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IRFR/U3710ZPbF
100000
10000
)
F
p
(
e
c
n
a
t
i
1000
c
a
p
a
C
,
C
100
10
V
= 0V, f = 1 MHZ
GS
C
= C
= C
= C
+ Cgd, C
gs
gd
+ C
ds
ds
gd
C
iss
C
oss
C
rss
iss
C
rss
C
oss
1 10 100
VDS, Drain-to-Sour ce Voltage (V)
Fig 5. Typical Capacitance vs.
Drain-to-Source Voltage
1000.00
)
A
(
t
100.00
n
e
r
r
u
C
n
i
a
r
D
e
s
r
e
v
e
R
,
D
S
I
10.00
1.00
0.10
TJ = 175°C
TJ = 25°C
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
VSD, Source-to-Drai n Voltage (V)
SHORTED
V
GS
= 0V
)
V
(
e
g
a
t
l
o
V
e
c
r
u
o
S
-
o
t
-
e
t
a
G
,
V
12.0
ID= 33A
10.0
8.0
6.0
4.0
S
G
2.0
0.0
0 1020304050607080
VDS= 80V
VDS= 50V
VDS= 20V
Q
Total G ate Charge (nC)
G
Fig 6. Typical Gate Charge vs.
Gate-to-Source Voltage
1000
)
A
(
t
100
n
e
r
r
u
C
e
c
r
u
10
o
S
-
o
t
-
n
i
a
r
D
1
,
D
I
Tc = 25°C
Tj = 175°C
Single Pulse
0.1
1 10 100 1000
OPERATION IN THIS AREA
LIMITED BY RDS(on)
100µsec
1msec
10msec
VDS, Drain-to-Sour ce Voltage (V)
Fig 7. Typical Source-Drain Diode
Fig 8. Maximum Safe Operating Area
Forward Voltage
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