Intel SSDSC2CW060A3K5, SSDSC2CW480A301, SSDSC2CW120A310, SSDSA2BW120A301, SSDSC2CW240A310, SSDSC2CW480A310 User Manual

Intel® Solid-State Drive 520 Series

Capacity: 60/120/180/240/480 GB

Components:

—Intel® 25nm NAND Flash Memory

—Multi-Level Cell (MLC)

Form Factor: 2.5-inch

Thickness: 7 mm and 9.5 mm

—7 mm: 120/180/240 GB

—9.5 mm: 60/120/180/240/480 GB

Weight: Up to 78 grams

SATA 6Gb/s Bandwidth Performance1 (Iometer* Queue Depth 32)

—Sustained Sequential Read: Up to 550 MB/s

—Sustained Sequential Write: Up to 520 MB/s

Read and Write IOPS1 (Iometer Queue Depth 32)

—Random 4 KB Reads: Up to 50,000 IOPS

—Random 4 KB Writes: Up to 80,000 IOPS2

Latency (average sequential)

—Read: 80 µs (TYP)

—Write: 85 µs (TYP)

Data Compression

AES 256-bit Encryption

End-to-End Data Protection

Compatibility

—Intel® SSD Toolbox with Intel® SSD Optimizer

—Intel® Data Migration Software

—Intel® Rapid Storage Technology

—Intel® 6 Series Express Chipsets (with SATA 6Gb/s)

—SATA Revision 3.0

—ACS-2

—SSD-enhanced SMART ATA feature set

—Native Command Queuing (NCQ) command set

—Data Set Management Command Trim attribute

Product Specification

Power Management

—5 V SATA Supply Rail

—SATA Link Power Management (LPM)

Power

—Active (MobileMark* 2007 Workload): 850 mW (TYP)

—Idle: 600 mW (TYP)

Temperature

—Operating: 0o C to 70o C

—Non-Operating: -55o C to 95o C

Reliability

—Uncorrectable Bit Error Rate (UBER): < 1 sector per 1016 bits read

—Mean Time Between Failures (MTBF): 1,200,000 hours

Shock (operating and non-operating): 1,500 G/0.5 msec

Vibration

—Operating: 2.17 GRMS (5-700 Hz)

—Non-operating: 3.13 GRMS (5-800 Hz)

Certifications and Declarations:

—UL*

—CE*

—C-Tick*

—BSMI*

—KCC*

—Microsoft* WHQL

—VCCI*

—SATA-IO*

Product Ecological Compliance

—RoHS*

1.Performance values vary by capacity.

2.Random 4 KB writes measured using out-of-box SSD.

Order Number: 325968-001US

February 2012

Ordering Information

Contact your local Intel sales representative for ordering information.

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Contact your local Intel sales office or your distributor to obtain the latest specifications and before placing your product order.

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Copyright © 2012 Intel Corporation. All rights reserved.

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Intel® Solid-State Drive 520 Series

Contents

1.0	Overview ...................................................................................................................			5
2.0	Product Specifications ...............................................................................................			6
	2.1	Capacity ............................................................................................................		6
	2.2	Performance .......................................................................................................		6
	2.3	Electrical Characteristics.......................................................................................		8
	2.4	Environmental Conditions .....................................................................................		8
	2.5	Product Regulatory Compliance .............................................................................		9
	2.6	Reliability .........................................................................................................		10
	2.7	Hot Plug Support...............................................................................................		10
3.0	Mechanical Information...........................................................................................			11
4.0	Pin and Signal Descriptions .....................................................................................			13
	4.1	Pin Locations ....................................................................................................		13
	4.2	Signal Descriptions ............................................................................................		13
		4.2.1 Connector Pin Signal Definitions ...............................................................		13
		4.2.2 Power Pin Signal Definitions.....................................................................		14
5.0	Supported Command Sets........................................................................................			15
	5.1	ATA General Feature Command Set .....................................................................		15
	5.2	Power Management ...........................................................................................		15
	5.3	Security Mode Feature Set..................................................................................		16
	5.4	SMART Command Set ........................................................................................		16
		5.4.1	SMART Attributes ...................................................................................	17
		5.4.2	SMART Logs ..........................................................................................	19
	5.5	Device Statistics................................................................................................		19
	5.6	SMART Command Transport (SCT) ......................................................................		20
	5.7	Data Set Management Command Set...................................................................		20
	5.8	Host Protected Area Command Set ......................................................................		20
	5.9	48-Bit Address Command Set .............................................................................		20
	5.10	General Purpose Log Command Set .....................................................................		21
	5.11	Native Command Queuing ..................................................................................		21
	5.12	Software Settings Preservation............................................................................		21
	5.13	SATA Link Power Management (LPM) ...................................................................		21
6.0	Certifications and Declarations ................................................................................			22
7.0	References ..............................................................................................................			23
8.0	Terms and Acronyms ...............................................................................................			23
9.0	Revision History ......................................................................................................			24
A	IDENTIFY DEVICE Command Data ...........................................................................			25

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Intel® Solid-State Drive 520 Series

Intel® Solid-State Drive 520 Series
Product Specification	February 2012
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Intel® Solid-State Drive 520 Series

1.0Overview

This document describes the specifications and capabilities of the Intel® Solid-State Drive 520 Series (Intel® SSD 520 Series)1.

The Intel SSD 520 Series delivers leading performance for Serial Advanced Technology Attachment (SATA)-based computers in capacities ranging up to 480 GB.

By combining Intel's leading 25nm NAND flash memory technology with SATA 6Gb/s interface support, the Intel SSD 520 Series delivers sequential read speeds of up to 550 MB/s and sequential write speeds of up to 520 MB/s.

The industry-standard 2.5-inch form factor enables interchangeability with existing hard disk drives (HDDs) and native SATA HDD drop-in replacement with the enhanced performance, reliability, and ruggedness offered by an SSD.

As compared to standard SATA HDDs, Intel SSD 520 Series offers these key features:

•High I/O and throughput performance

•Increased system responsiveness

•High reliability

•Enhanced ruggedness

The Intel SSD 520 Series also offers additional key features such as:

•Advanced Encryption Standard (AES) 256-bit Encryption

AES 256-bit encryption is an industry standard in data security, providing a hardware-based mechanism for encryption and decryption of user data. Utilizing a 256-bit encryption key, AES encryption — when combined with an ATA drive password — helps protect user data.

•End-to-End Data Protection

End-to-end data protection helps protect data from being corrupted across the data path by using cyclic redundancy check (CRC), parity, and error correction code (ECC) checks in the data path from the host interface to the NAND, and back.

•Data Compression

Data compression helps improve performance and endurance by automatically compressing information sent to the SSD so that less data has to be processed and stored on the NAND. The amount of data that can be compressed depends on the type of data.

1. The Intel SSD 520 Series is currently not validated for data center usage.

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Intel® Solid-State Drive 520 Series

2.0Product Specifications

2.1Capacity

Table 1.	User Addressable Sectors
	Intel SSD 520 Series		Unformatted Capacity
			(Total User Addressable Sectors in LBA Mode)
	60 GB		117,231,408
	120 GB		234,441,648
	180 GB		351,651,888
	240 GB		468,862,128
	480 GB		937,703,088

Notes: 1 GB = 1,000,000,000 bytes; 1 sector = 512 bytes.

LBA count shown represents total user storage capacity and will remain the same throughout the life of the drive.

The total usable capacity of the SSD may be less than the total physical capacity because a small portion of the capacity is used for NAND flash management and maintenance purposes.

2.2Performance

The data compression engine in the Intel SSD 520 Series controller optimizes performance based on the data pattern of the workload.

This section provides both compressible and incompressible Input/Output Operations Per Second (IOPS) and sustained sequential read and write bandwidth specifications.

Table 2.	Compressible Performance
Specification		Unit				Intel SSD 520 Series
				60 GB	120 GB		180 GB		240 GB	480 GB
Random 4 KB Read (up to)		IOPS		15,000	25,000		50,000		50,000	50,000
Random 4 KB Write (up to)1		IOPS		80,000	80,000		80,000		80,000	50,000
Random 4 KB Write (TYP)2		IOPS		23,000	40,000		60,000		60,000	42,000
Sequential Read (up to)3
SATA 6Gb/s		MB/s		550	550		550		550	550
SATA 3Gb/s				280	280		280		280	280
Sequential Write (up to)3
SATA 6Gb/s		MB/s		475	500		520		520	520
SATA 3Gb/s				245	260		260		260	260

Notes:

1.Random 4 KB write performance measured using out-of-box SSD.

2.Performance measured using Iometer* with Queue Depth 32. Measurements are performed on 8 GB of Logical Block Address (LBA) range on a full SSD.

3.Performance measured using Iometer with Queue Depth 32.

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Intel® Solid-State Drive 520 Series

Table 3.	Incompressible Performance
Specification		Unit			Intel SSD 520 Series
			60 GB	120 GB		180 GB		240 GB	480 GB
Random 4 KB Read (up to)		IOPS	12,0001	24,0001		46,0001		46,0001	46,0001
			18,0002	35,0002		56,0002		56,0002	56,0002
Random 4 KB Write (up to)		IOPS	6,9001	13,0001		13,0001		16,5001	9,5001
			22,0002	42,0002		54,0002		60,0002	36,0002
Sequential Read (up to)		MB/s	4301	5501		5501		5501	5501
			4752	5152		4852		5152	5002
Sequential Write (up to)		MB/s	801	1501		1701		2351	2751
			852	1702		2402		2952	2352

Notes:

1.Performance measured using Iometer with Queue Depth 32. Measurements are performed on 8 GB of Logical Block Address (LBA) range.

2.Performance measured with incompressible data using AS-SSD* benchmark, where MB/s = 1,048,576 bytes/second.

Table 4.	Latency
Specification				Intel SSD 520 Series
		60 GB	120 GB		180 GB		240 GB	480 GB
Latency1
Read					80 µs (TYP)
Write					85 µs (TYP)
Power On To Ready2					2 s (TYP)

Notes: 1. Based on sequential 4 KB using Iometer with Queue Depth 1 workload with compressible (non-random) data pattern. Write Cache Enabled.

2. Power On To Ready time assumes proper shutdown.

	Intel® Solid-State Drive 520 Series
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Intel® Solid-State Drive 520 Series

2.3Electrical Characteristics

Table 5.	Operating Voltage and Power Consumption
Electrical Characteristics			Value
Operating Voltage for 5 V (±5%)
Min			4.75 V
Max			5.25 V
Power Consumption (TYP)
Active1			850 mW
Idle2			600 mW

Notes:

1.Active power measured during execution of MobileMark* 2007 with SATA Link Power Management (LPM) enabled.

2.Idle power defined as SSD at idle with SATA Link Power Management (LPM) enabled.

2.4Environmental Conditions

Table 6.	Temperature, Shock, Vibration
Temperature		Range
Case Temperature		0 – 70 oC
Operating
Non-operating		-55 – 95 oC
Temperature Gradient1		30 (TYP) oC/hr
Operating
Non-operating		30 (TYP) oC/hr
Humidity
Operating		5 – 95 %
Non-operating		5 – 95 %
Shock and Vibration		Range
Shock2
Operating		1,500 G (Max) at 0.5 msec
Non-operating		1,500 G (Max) at 0.5 msec
Vibration3
Operating		2.17 GRMS (5-700 Hz) Max
Non-operating		3.13 GRMS (5-800 Hz) Max

Notes:

1.Temperature gradient measured without condensation.

2.Shock specifications assume the SSD is mounted securely with the input vibration applied to the drive-mounting screws. Stimulus may be applied in the X, Y or Z axis. Shock specification is measured using Root Mean Squared (RMS) value.

3.Vibration specifications assume the SSD is mounted securely with the input vibration applied to the drive-mounting screws. Stimulus may be applied in the X, Y or Z axis. Vibration specification is measured using Root Mean Squared (RMS) value.

Intel® Solid-State Drive 520 Series
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Intel® Solid-State Drive 520 Series

2.5Product Regulatory Compliance

The Intel SSD 520 Series meets or exceeds the regulatory or certification requirements in Table 7.

	Table 7.	Product Regulatory Compliance Specifications
	Title		Description	Region for which
				conformity declared
	European Union Low Voltage		EN 60950-1 2nd edition for Information Technology Equipment -	European Union
	Directive (LVD) 2006/95/EC		Safety - Part 1: General Requirements
	UL/CSA 60950-1, Second Edition		Information Technology Equipment - Safety - Part 1:
	CAN/CSA-C22.2 No. 60950-1-07			USA/Canada
			General Requirements
	Second Edition
	CFR Title 47 Part 15		Radio Frequency Devices - Subpart B (Unintentional Radiators)	USA
	ICES-003 Issue 4		Interference Causing Equipment Standard	Canada
			Information technology equipment -
	EN 55022:2006		Radio disturbance characteristics -	European Union
			Limits and methods of measurement
			Information technology equipment -
	CNS 14348:2006		Radio disturbance characteristics -	Taiwan
			Limits and methods of measurement
			Information technology equipment -
	VCCI V3/2010.04		Radio disturbance characteristics -	Japan
			Limits and methods of measurement
			Information technology equipment -
	KN22 (2008-5)		Radio disturbance characteristics -	Korea
			Limits and methods of measurement
			Information technology equipment -
	CISPR 22:2006		Radio disturbance characteristics -	International
			Limits and methods of measurement
			Information technology equipment -
	EN 55024:1998		Immunity characteristics -	European Union
			Limits and methods of measurement (CISPR 24:1997, modified)
			Information technology equipment -
	KN24 (2008-5)		Immunity characteristics -	Korea
			Limits and methods of measurement (CISPR 24:1997, modified)

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