Intel SSDSC2CW060A3K5, SSDSC2CW480A301, SSDSC2CW120A310, SSDSA2BW120A301, SSDSC2CW240A310 User Manual
...
Intel® Solid-State Drive 520 Series
Product Specification
Capacity: 60/120/180/240/480 GB
Components:
—Intel
®
25nm NAND Flash Memory
— Multi-Level Cell (MLC)
Form Factor: 2.5-inch
Thickness: 7 mm and 9.5 mm
— 7 mm: 120/180/240 GB
— 9.5 mm: 60/120/180/240/480 GB
Weight: Up to 78 grams
SATA 6Gb/s Bandwidth Performance
1
(Iometer* Queue Depth 32)
— Sustained Sequential Read: Up to 550 MB/s
— Sustained Sequential Write:Up to 520 MB/s
Read and Write IOPS
1
(Iometer Queue Depth 32)
— Random 4 KB Reads: Up to 50,000 IOPS
— Random 4 KB Writes: Up to 80,000 IOPS
Latency (average sequential)
—Read: 80 µs (TYP)
— Write: 85 µs (TYP)
Data Compression
AES 256-bit Encryption
End-to-End Data Protection
Compatibility
—Intel
—Intel
—Intel
—Intel
®
SSD T oolbo x with Intel® SSD Optimizer
®
Data Migration Software
®
Rapid Storage Technology
®
6 Series Express Chipsets
(with SATA 6Gb/s)
—SATA Revision 3.0
—ACS-2
— SSD-enhanced SMART ATA feature set
— Native Command Queuing (NCQ)
command set
— Data Set Management Command
Trim attribute
Power Management
— 5 V SATA Supply Rail
— SATA Link Power Management (LPM)
Power
— Active (MobileMark* 2007 Workload):
850 mW (TYP)
— Idle: 600 mW (TYP)
Temperature
—Operating: 0
— Non-Operating: -55
Reliability
— Uncorrectable Bit Error Rate (UBER):
< 1 sector per 10
o
C to 70o C
o
C to 95o C
16
bits read
— Mean Time Between Failures (MTBF):
1,200,000 hours
Shock (operating and non-operating):
2
1,500 G/0.5 msec
Vibration
— Operating: 2.17 G
— Non-operating: 3.13 G
Certifications and Declarations:
(5-700 Hz)
RMS
RMS
—UL*
—CE*
—C-Tick*
—BSMI*
—KCC*
—Microsoft* WHQL
— VCCI*
—SATA-IO*
Product Ecological Compliance
—RoHS*
(5-800 Hz)
1. Performance values vary by capacity.
2. Random 4 KB writes measured using out-of-box SSD.
Order Number: 325968-001US
February 2012
L
Ordering Information
Contact your local Intel sales representative for ordering information.
INFORMATION IN THIS DOCUMENT IS PROVIDED IN CONNECTION WITH INTEL PRODUCTS. NO LICENSE, EXPRESS OR IMPLIED, BY ESTOPPEL OR
OTHERWISE, TO ANY INTELLEC TUAL PRO PER TY RIGHTS IS GRANT ED BY THIS DOCUMENT. EXCEPT AS PROVIDED IN INTEL'S TERMS AND CONDITIONS
OF SALE FOR SUCH PRODUCTS, INTEL ASSUMES NO LIABILITY WHATSOEVER AND INTEL DISCLAIMS ANY EXPRESS OR IMPLIED WARRANTY, RELATING
TO SALE AND/OR USE OF INTEL PRODUCTS INCLUDING LIABILITY OR WARRANTIES RELATING TO FITNESS FOR A PARTICULAR PURPOSE,
MERCHANTABILITY, OR INFRINGEMENT OF ANY PATENT, COPYRIGHT OR OTHER INTELLECTUAL PROPERTY RIGHT.
UNLESS OTHERWISE AGREED IN WRITING BY INTEL, THE INTEL PRODUCTS ARE NOT DESIGNED NOR INTENDED FOR ANY APPLICATION IN WHICH THE
FAILURE OF THE INTEL PRODUCT COULD CREATE A SITUATION WHERE PERSONAL INJURY OR DEATH M AY OCCUR.
Intel may make changes to specifications and product descriptions at any time, without notice. Designers must not rely on the absence or characteristics
of any features or instructions marked "reserved" or "undefined." Intel reserves these for future definition and shall have no responsibility whatsoever
for conflicts or incompatibilities arising from future changes to them. The information here is subject to change without notice. Do not finalize a design
with this information.
The products described in this document may contain design defects or errors known as errata which may cause the product to deviate from published
specifications. Current characterized errata are available on request.
Contact your local Intel sales office or your distributor to obtain the latest specifications and before placing your product order.
Copies of documents which have an order number and are referenced in this document, or other Intel literature, may be obtained by calling 1-800-548-
4725, or go to: http://www.intel.com/design/literature.htm
Low Halogen applies only to brominated and chlorinated flame retardants (BFRs/CFRs) and PVC in the final product. Intel components as well as
purchased components on the finished assembly meet JS-709 requirements, and the PCB/substrate meet IEC 61249-2-21 requirements. The
replacement of halogenated flame retardants and/or PVC may not be better for the environment.
Intel and the Intel logo are trademarks of Intel Corporation in the U.S. and other countries.
*Other names and brands may be claimed as the property of others.
Copyright © 2012 Intel Corporation. Al l rights reserved.
Intel® Solid-State Drive 520 Series
Product Specification February 2012
2 Order Number: 325968-001US
Intel® Solid-State Drive 520 Series
Contents
1.0 Overview...................................................................................................................5
2.0 Product Specifications ...............................................................................................6
2.1 Capacity ............................................................................................................6
2.2 Performance.......................................................................................................6
2.3 Electrical Characteristics.......................................................................................8
2.4 Environmental Conditions........................................... .. .. ... .. ........................... ......8
2.5 Product Regulatory Compliance.............................................................................9
2.6 Reliability.........................................................................................................10
2.7 Hot Plug Support...............................................................................................10
3.0 Mechanical Information...........................................................................................11
4.0 Pin and Signal Descriptions .....................................................................................13
4.1 Pin Locations ....................................................................................................13
4.2 Signal Descriptions.......................................... .. ......................... .. .. .. .................13
4.2.1 Connector Pin Signal Definitions ............................................................... 13
4.2.2 Power Pin Signal Definitions.....................................................................14
5.0 Supported Command Sets........................................................................................15
5.1 ATA General Feature Command Set.....................................................................15
5.2 Power Management...........................................................................................15
5.3 Security Mode Feature Set..................................................................................16
5.4 SMART Command Set........................................................................................16
5.4.1 SMART Attributes ...................................................................................17
5.4.2 SMART Logs ..........................................................................................19
5.5 Device Statistics.................................................... .. .. ........................................19
5.6 SMART Command Transport (SCT) ......................................................................20
5.7 Data Set Management Command Set...................................................................20
5.8 Host Protected Area Command Set......................................................................20
5.9 48-Bit Address Command Set .............................................................................20
5.10 General Purpose Log Command Set.....................................................................21
5.11 Native Command Queuing..................................................................................21
5.12 Software Settings Preservation............................................................................21
5.13 SATA Link Power Management (LPM)...................................................................21
6.0 Certifications and Declarations................................................................................22
7.0 References ..............................................................................................................23
8.0 Terms and Acronyms ...............................................................................................23
9.0 Revision History ......................................................................................................24
A IDENTIFY DEVICE Command Data ...........................................................................25
February 2012 Product Specification
Order Number: 325968-001US 3
Intel® Solid-State Drive 520 Series
Intel® Solid-State Drive 520 Series
®
Solid-State Drive 520 Series
Intel
Product Specification February 2012
4 Order Number: 325968-001US
Intel® Solid-State Drive 520 Series
1.0 Overview
This document describes the specifications and capabilities of the Intel® Solid-State
Drive 520 Series (Intel
®
SSD 520 Series)1.
The Intel SSD 520 Series delivers leading performance for Serial Advanced Technology
Attachment (SATA)-based computers in capacities ranging up to 480 GB.
By combining Intel's leading 25nm NAND flash memory technology with SATA 6Gb/s
interface support, the Intel SSD 520 Series delivers sequential read speeds of up to
550 MB/s and sequential write speeds of up to 520 MB/s.
The industry-standard 2.5-inch form factor enables interchangeability with existing
hard disk drives (HDDs) and native SATA HDD drop-in replacement with the enhanced
performance, reliability, and ruggedness offered by an SSD.
As compared to standard SATA HDDs, Intel SSD 520 Series offers these key features:
• High I/O and throughput performance
• Increased system responsiveness
• High reliability
• Enhanced ruggedness
The Intel SSD 520 Series also offers additional key features such as:
• Advanced Encryption Standard (AES) 256-bit Encryption
AES 256-bit encryption is an industry standard in data security, providing a
hardware-based mechanism for encryption and decryption of user data. Utilizing a
256-bit encryption key, AES encryption — whe n combined with an ATA drive
password — helps protect user data.
• End-to-End Data Protection
End-to-end data protection helps protect data from being corrupted across the data
path by using cyclic redundancy check (CRC), parity, and error correction code
(ECC) checks in the data path from the host interface to the NAND, and back.
• Data Compression
Data compression helps improve performance and endurance by automatically
compressing information sent to the SSD so that less data has to be processed and
stored on the NAND. The amount of data that can be compressed depends on the
type of data.
1. The Intel SSD 520 Series is currently not validated for data center usage.
February 2012 Product Specification
Order Number: 325968-001US 5
Intel® Solid-State Drive 520 Series
®
Intel
Intel® Solid-State Drive 520 Series
Solid-State Drive 520 Series
2.0 Product Specifications
2.1 Capacity
Table 1. User Addressable Sectors
Intel SSD 520 Series
60 GB 117,231,408
120 GB 234,441,648
180 GB 351,651,888
240 GB 468,862,128
480 GB 937,703,088
Notes: 1 GB = 1,000,000,000 bytes; 1 sector = 512 bytes.
LBA count shown represents total user storage capacity and will remain the same throughout the life of the drive.
The total usable capacity of the SSD may be less than the total physical capacity because a small portion of the capacity is
used for NAND flash management and maintenance purposes.
(Total User Addressable Sectors in LBA Mode)
2.2 Performance
Unformatted Capacity
The data compression engine in the Intel SSD 520 Series controller optimizes
performance based on the data pattern of the workload.
This section provides both compressible and incompressible Input/Output Operations
Per Second (IOPS) and sustained sequential read and write bandwidth specifications.
Table 2. Compressible Performance
Specification Unit
Random 4 KB Read
Random 4 KB Write (up to)
Random 4 KB Write (TYP)
Sequential Read (up to)
SATA 6Gb/s
SATA 3Gb/s
Sequential Write
SATA 6Gb/s
SATA 3Gb/s
Notes:
(up to) IOPS 15,000 25,000 50,000 50,000 50,000
1
2
3
3
(up to)
1. Random 4 KB write performance measured using out-of-box SSD.
2. Performance measured using Iometer* with Queue Depth 32. Measurements are performed on
8 GB of Logical Block Address (LBA) range on a full SSD.
3. Performance measured using Iometer with Queue Depth 32.
IOPS 80,000 80,000 80,000 80,000 50,000
IOPS 23,000 40,000 60,000 60,000 42,000
MB/s 550
MB/s 475
Intel SSD 520 Series
60 GB 120 GB 180 GB 240 GB 480 GB
280
245
550
280
500
260
550
280
520
260
550
280
520
260
550
280
520
260
®
Solid-State Drive 520 Series
Intel
Product Specification February 2012
6 Order Number: 325968-001US
Intel® Solid-State Drive 520 Series
Table 3. Incompressible Performance
Specification Unit
Random 4 KB Read
(up to) IOPS
Random 4 KB Write (up to ) IOPS
Sequential Read (up to) MB/s
Sequential Write (up to) MB/s
Notes:
1. Performance measured using Iometer with Queue Depth 32. Measurements are performed on
8 GB of Logical Block Address (LBA) range.
2. Performance measured with incompressible data using AS-SSD* benchmark, where
MB/s = 1,048,576 bytes/second.
Table 4. Latency
Specification
1
Latency
Read
Write
Power On To Ready
2
Intel SSD 520 Series
60 GB 120 GB 180 GB 240 GB 480 GB
12,000
18,000
6,900
22,000
430
475
80
85
1
2
1
2
1
2
1
2
24,000
35,000
13,000
42,000
550
515
150
170
1
2
1
2
1
2
1
2
46,000
56,000
13,000
54,000
550
485
170
240
1
2
1
2
1
2
1
2
46,000
56,000
16,500
60,000
550
515
235
295
1
46,000
2
56,000
1
2
1
2
1
2
9,500
36,000
550
500
275
235
Intel SSD 520 Series
60 GB 120 GB 180 GB 240 GB 480 GB
80 µs (TYP)
85 µs (TYP)
2 s (TYP)
1
2
1
2
1
2
1
2
Notes: 1. Based on sequential 4 KB using Iometer with Queue Depth 1 workload with compressible (non-random) data pattern.
Write Cache Enabled.
2. Power On To Ready time assumes proper shutdown.
February 2012 Product Specification
Order Number: 325968-001US 7
Intel® Solid-State Drive 520 Series
®
Intel
Intel® Solid-State Drive 520 Series
Solid-State Drive 520 Series
2.3 Electrical Characteristics
Table 5. Operating Voltage and Power Consumption
Electrical Characteristics Value
Operating Voltage for 5 V (±5%)
Min
Max
Power Consumption (TYP)
Active
Idle
1
2
Notes:
1. Active power measured during execution of MobileMark* 2007 with SATA Link Power Management (LPM) enabled.
2. Idle power defined as SSD at idle with SATA Link Power Management (LPM) enabled.
4.75 V
5.25 V
850 mW
600 mW
2.4 Environmental Conditions
Table 6. Temperature, Shock, Vibration
Temperature Range
Case Temperature
Operating
Non-operating
Temperature Gradient
Operating
Non-operating
1
30 (TYP) oC/hr
30 (TYP)
Humidity
Operating
Non-operating
Shock and Vibration Range
2
Shock
Operating
Non-operating
Vibration
Operating
Non-operating
3
1,500 G (Max) at 0.5 msec
1,500 G (Max) at 0.5 msec
2.17 G
RMS
3.13 G
RMS
Notes:
1. Temperature gradient measured without condensation.
2. Shock specifications assume the SSD is mounted securely with the input vibration applied to the drive-mounting screws.
Stimulus may be applied in the X, Y or Z axis. Shock specification is measured using Root Mean Squared (RMS) value.
3. Vibration specifications assume the SSD is mounted securely with the input vibration applied to the drive-mounting
screws. Stimulus may be applied in the X, Y or Z axis. Vibration specification is measured using Root Mean Squared (RMS)
value.
o
0 – 70
C
o
o
C
C/hr
-55 – 95
5 – 95 %
5 – 95 %
(5-700 Hz) Max
(5-800 Hz) Max
®
Solid-State Drive 520 Series
Intel
Product Specification February 2012
8 Order Number: 325968-001US
Intel® Solid-State Drive 520 Series
2.5 Product Regulatory Compliance
The Intel SSD 520 Series meets or exceeds the regulatory or certification requirements
in Table 7.
Table 7. Product Regulatory Compliance Specifications
Title Description
European Union Low Voltage
Directive (LVD) 2006/95/EC
UL/CSA 60950-1, Second Edition
CAN/CSA-C22.2 No. 60950-1-07
Second Edition
CFR Title 47 Part 15 Radio Frequency Devices - Subpart B (Unintentional Radiators) USA
ICES-003 Issue 4 Interference Causing Equipment Standard Canada
EN 55022:2006
CNS 14348:2006
VCCI V3/2010.04
KN22 (2008-5)
CISPR 22:2006
EN 55024:1998
KN24 (2008-5)
EN 60950-1 2nd edition for Information Technology Equipment Safety - Part 1: General Requirements
Information Technology Equipment - Safety - Part 1:
General Requirements
Information technology equipment Radio disturbance characteristics Limits and methods of measurement
Information technology equipment Radio disturbance characteristics Limits and methods of measurement
Information technology equipment Radio disturbance characteristics Limits and methods of measurement
Information technology equipment Radio disturbance characteristics Limits and methods of measurement
Information technology equipment Radio disturbance characteristics Limits and methods of measurement
Information technology equipment Immunity characteristics Limits and methods of measurement (CISPR 24:1997, modified)
Information technology equipment Immunity characteristics Limits and methods of measurement (CISPR 24:1997, modified)
Region for which
conformity declared
European Union
USA/Canada
European Union
Taiwan
Japan
Korea
International
European Union
Korea
February 2012 Product Specification
Order Number: 325968-001US 9
Intel® Solid-State Drive 520 Series
®
Intel
Intel® Solid-State Drive 520 Series
Solid-State Drive 520 Series
2.6 Reliability
The Intel SSD 520 Series meets or exceeds SSD endurance and data retention
requirements as specified in the JESD218 specification.
Reliability specifications are listed in Table 8.
Table 8. Reliability Specifications
Parameter Value
Uncorrectable Bit Error Rate (UBER)
Uncorrectable bit error rate will not exceed one sector in the
specified number of bits read. In the unlikely event of a
nonrecoverable read error, the SSD will report it as a read failure to
the host; the sector in error is considered corrupt and is not
returned to the host.
Mean Time Between Failures (MTBF)
Mean Time Between Failures is estimated based on Telcordia*
methodology and demonstrated through Reliability Demonstration
Test (RDT).
Minimum Useful Life/Endurance Rating
The SSD will have a minimum of five years of useful life under
typical client workloads with up to 20 GB of host writes per day.
Insertion Cycles
The SSD supports up to 250 insertion/removal cycles on SATA/
power cable.
< 1 sector per 10
1,200,000 hours
5 years
250 insertion/removal cycles
16
bits read
2.7 Hot Plug Support
Hot Plug insertion and removal is supported in the presence of a proper connector and
appropriate operation system, as described in the SATA 3.0 specification.
This product supports asynchronous signal recovery and issues an unsolicited COMINIT
when first mated with a powered connector to guarantee reliable detection by a host
system without hardware device detection.
®
Solid-State Drive 520 Series
Intel
Product Specification February 2012
10 Order Number: 325968-001US
Intel® Solid-State Drive 520 Series
3.0 Mechanical Information
Figure 1 shows the physical package information for the 7mm height 2.5-inch
Intel SSD 520 Series. All dimensions are in millimeters.
Figure 1. Dimensions for 7mm 2.5-inch Form Factor
February 2012 Product Specification
Order Number: 325968-001US 11
Intel® Solid-State Drive 520 Series
Figure 2 shows the physical package information for the 9.5mm height 2.5-inch
Intel SSD 520 Series. All dimensions are in millimeters.
Figure 2. Dimensions for 9.5mm 2.5-inch Form Factor
®
Intel
Intel® Solid-State Drive 520 Series
Solid-State Drive 520 Series
®
Solid-State Drive 520 Series
Intel
Product Specification February 2012
12 Order Number: 325968-001US
Intel® Solid-State Drive 520 Series
4.0 Pin and Signal Descriptions
4.1 Pin Locations
Figure 3. Layout of Signal and Power Segment Pins
Signal Segment S1 Power Segment P1
Note: 2.5-inch connector supports in-built latching capability.
4.2 Signal Descriptions
4.2.1 Connector Pin Signal Definitions
Table 9. Serial ATA Connector Pin Signal Definitions
Pin Function Definition
S1 Ground 1st mate
S2 A+
S3 AS4 Ground 1st mate
S5 BS6 B+
S7 Ground 1st mate
Note: Key and spacing separate signal and power segments.
Differential signal pair A
Differential signal pair B
February 2012 Product Specification
Order Number: 325968-001US 13
Intel® Solid-State Drive 520 Series
®
Intel
Intel® Solid-State Drive 520 Series
Solid-State Drive 520 Series
4.2.2 Power Pin Signal Definitions
Table 10. Serial ATA Power Pin Definitions
1
Pin
2
P1
2
P2
2
P3
3,4
P4
3
P5
3
P6
3,5
P7
3,5
P8
3,5
P9
3
P10
6
P11
3, 4
P12
2
P13
2
P14
2
P15
Notes:
1. All pins are in a single row, with a 1.27 mm (0.050-inch) pitch.
2. Pins P1, P2 and P3 are connected together; Pins P13, P14 and P15 are connected together. Although they are not
connected internally to the device, the host may apply voltage on these pins.
3. The mating sequence is:
V
33
V
33
V
33
Ground 1st Mate
Ground 1st Mate
Ground 1st Mate
V
5
V
5
V
5
Ground 1st Mate
DAS Device Activity Signal 2nd Mate
Ground 1st Mate
V
12
V
12
V
12
• Ground pins P4-P6, P10, P12 and the 5V power pin P7.
4. Ground connectors P4 and P12 may contact before the other 1st mate pins in both the power and signal connectors to
5. Power pins P7, P8, and P9 are internally connected to one another within the device.
6. The host may ground P11 if it is not used for Device Activity Signal (DAS).
• Signal pins and the rest of the 5V power pins P8-P9.
discharge ESD in a suitably configured backplane connector.
Name Definition Mating Order
3.3 V Power; not used 2nd Mate
3.3 V Power; not used 2nd Mate
3.3 V Power; not used 1st Mate
5 V Power 1st Mate
5 V Power 2nd Mate
5 V Power 2nd Mate
12 V Power; not used 1st Mate
12 V Power; not used 2nd Mate
12 V Power; not used 2nd Mate
®
Solid-State Drive 520 Series
Intel
Product Specification February 2012
14 Order Number: 325968-001US
Intel® Solid-State Drive 520 Series
5.0 Supported Command Sets
The Intel SSD 520 Series supports all mandatory Advanced Technology Attachment
(ATA) and Serial ATA (SATA) commands defined in the ACS-2 and SATA Revision 3.0
specifications. The mandatory and optional commands are defined in this section.
5.1 ATA General Feature Command Set
General Feature command set (non-PACKET), which consists of:
• EXECUTE DEVICE DIAGNOSTIC
• FLUSH CACHE
•IDENTIFY DEVICE
Note: See Appendix A, “IDENTIFY DEVICE Command Data” on page 25 for details on the sector data
• READ DMA
•READ SECTOR(S)
•READ VERIFY SECTOR(S)
•SEEK
• SET FEATURES
•WRITE DMA
•WRITE SECTOR(S)
•READ MULTIPLE
• SET MULTIPLE MODE
•WRITE MULTIPLE
returned after issuing an IDENTIFY DEVICE command.
The Intel SSD 520 Series also supports the following optional commands:
• READ BUFFFER
• WRITE BUFFER
•NOP
• DOWNLOAD MICROCODE
5.2 Power Management
The Intel SSD 520 Series supports several power management feature sets as defined
by the ATA specification: general Power Management feature set, Advanced Power
Management feature set, and Power-Up In Standby (PUIS) feature set.
The Advanced Power Management and PUIS features can be enabled or disabled using
the SET FEATURES command.
The Power Management feature set includes the following commands:
•CHECK POWER MODE
•IDLE
•IDLE IMMEDIATE
• SLEEP
•STANDBY
•STANDBY IMMEDIATE
February 2012 Product Specification
Order Number: 325968-001US 15
Intel® Solid-State Drive 520 Series
5.3 Security Mode Feature Set
The Intel SSD 520 Series supports the Security Mode command set, which consists of:
• SECURITY SET PASSWORD
•SECURITY UNLOCK
• SECURITY ERASE PREPARE
• SECURITY ERASE UNIT
•SECURITY FREEZE LOCK
• SECURITY D ISABLE PASSWORD
5.4 SMART Command Set
The Intel SSD 520 Series supports the SMART command set, which consists of:
•SMART READ DATA
• SMART READ ATTRIBUTE THRESHOLDS
• SMART ENABLE/DISABLE ATTRIBUTE AUTOSAVE
• SMART SAVE ATTRIBUTE VALUES
• SMART EXECUTE OFF-LINE IMMEDIATE
• SMART READ LOG SECTOR
• SMART WRITE LOG SECTOR
• SMART ENABLE OPERATIONS
• SMART DISABLE OPERATIONS
• SMART RETURN STATUS
®
Intel
Intel® Solid-State Drive 520 Series
Solid-State Drive 520 Series
®
Solid-State Drive 520 Series
Intel
Product Specification February 2012
16 Order Number: 325968-001US
Intel® Solid-State Drive 520 Series
5.4.1 SMART Attributes
Table 11 lists the SMART attributes supported by the Intel SSD 520 Series; Table 12 on
page 19 lists the corresponding status flags and threshold settings.
Table 11. SMART Attributes
ID Attribute
Re-allocated Sector Count
05h
09h
0Ch
AAhAvailable Reserved Space 110011 10
ABh
ACh
AEh
B8h
BBh
The raw value of this attribute shows the
number of retired blocks since leaving the
factory (grown defect count).
Power-On Hours Count
The raw value reports two values: the first
4 bytes report the cumulative number of
power-on hours over the life of the device,
the remaining bytes report the number of
milliseconds since the last hour increment.
The On/Off status of the Device Initiated
Power Management (DIPM) feature will
affect the number of hours reported. If DIPM
is turned On, the recorded value for
power-on hours does not include the time
that the device is in a "slumber" state. If
DIPM is turned Off, the recorded value for
power-on hours should match the clock
time, as all three device states are counted:
active, idle and slumber.
Power Cycle Count
The raw value of this attribute reports the
cumulative number of power cycle events
over the life of the device.
Program Fail Count
The raw value of this attribute shows total
count of program fails and the normalized
value, beginning at 100, shows the percent
remaining of allowable program fails.
Erase Fail Count
The raw value of this attribute shows total
count of erase fails and the normalized
value, beginning at 100, shows the percent
remaining of allowable erase fails.
Unexpected Power Loss
The raw value of this attribute reports the
cumulative number of unsafe (unclean)
shutdown events over the life of the device.
An unsafe shutdown occurs whenever the
device is powered off without STANDBY
IMMEDIATE being the last command
End-to-End Error Detection Count
Reports number of errors encountered
during end-to-end error detection within the
SSD data path.
Uncorrectable Error Count
The raw value shows the count of errors
that could not be recovered using Error
Correction Code (ECC).
SP EC ER PE OC PW
110010 0 (none)
110010 0 (none)
110010 0 (none)
110010 0 (none)
110010 0 (none)
110010 0 (none)
110011 90
110010 0 (none)
Status Flags
1
Threshold
February 2012 Product Specification
Order Number: 325968-001US 17
Intel® Solid-State Drive 520 Series
Table 11. SMART Attributes (Continued)
ID Attribute
Power-Off Retract Count (Unsafe Shutdown
Count)
The raw value of this attribute reports the
C0h
E1h
E2h
E3h
E4h
E8h
E9h
F1h
F2h
F9h
cumulative number of unsafe (unclean)
shutdown events over the life of the device.
An unsafe shutdown occurs whenever the
device is powered off without STANDBY
IMMEDIATE being the last command.
Host Writes
The raw value of this attribute reports the
total number of sectors written by the host
system. The raw value is increased by 1 for
every 65,536 sectors (32MB) written by
the host.
Timed Workload Media We ar
Measures the wear seen by the SSD (since
reset of the workload timer, attribute E4h),
as a percentage of the maximum rated
cycles.
Timed Workload Host Read/Write Ratio
Shows the percentage of I/O operations
that are read operations (since reset of the
workload timer, attribute E4h).
Timed Workload Timer
Measures the elapsed time (number of
minutes since starting this workload timer).
Available Reserved Space
This attribute reports the number of reserve
blocks remaining. The normalized value
begins at 100 (64h), which corresponds to
100 percent availability of the reserved
space. The threshold value for this attribute
is 10 percent availability.
Media Wearout Indicator
This attribute reports the number of cycles
the NAND media has undergone. The
normalized value declines linearly from 100
to 1 as the average erase cycle count
increases from 0 to the maximum rated
cycles.
Once the normalized value reaches 1, the
number will not decrease, although it is likely
that significant additional wear can be put
on the device.
Total LBAs Written
The raw value of this attribute reports the
total number of sectors written by the host
system. The raw value is increased by 1 for
every 65,536 sectors (32MB) written by
the host.
Total LBAs Read
The raw value of this attribute reports the
total number of sectors read by the host
system. The raw value is increased by 1 for
every 65,536 sectors (32MB) read by
the host.
Total NAND Writes
Raw value reports the number of writes to
NAND in 1 GB increments.
®
Intel
Intel® Solid-State Drive 520 Series
Solid-State Drive 520 Series
Status Flags
SP EC ER PE OC PW
1
Threshold
110010 0 (none)
110010 0 (none)
110010 0 (none)
110010 0 (none)
110010 0 (none)
110011 10
110010 0 (none)
110010 0 (none)
110010 0 (none)
110010 0 (none)
®
Solid-State Drive 520 Series
Intel
Product Specification February 2012
18 Order Number: 325968-001US
Intel® Solid-State Drive 520 Series
Table 12 defines the SMART Attribute status flags.
Table 12. SMART Attribute Status Flags
Status
Flag
SP Self-preserving attribute Not a self-preserving attribute Self-preserving attribute
EC Event count attribute Not an event count attribute Event count attribute
ER Error rate attribute Not an error rate attribute Error rate attribute
PE Performance attribute Not a performance attribute Performance attribute
OC Online collection attribute Collected only during offline activity
PW Pre-fail warranty attribute Advisory Pre-fail
Description Value = 0 Value = 1
5.4.2 SMART Logs
The Intel SSD 520 Series implements the following Log Addresses: 00h, 02h, 03h, 06h,
and 07h.
The Intel SSD 520 Series implements host vendor specific logs (addresses 80h-9Fh) as
read and write scratchpads, where the default value is zero (0). Intel SSD 520 Series
does not write any specific values to these logs unless directed by the host through the
appropriate commands.
The Intel SSD 520 Series also implements a device vendor specific log at address A9h
as a read-only log area with a default value of zero (0).
5.5 Device Statistics
In addition to the SMART attribute structure, statistics pertaining to the operation and
health of the Intel SSD 520 Series can be reported to the host on request through the
Device Statistics log as defined in the ATA specification.
Collected during both offline and
online activity
The Device Statistics log is a read-only GPL/SMART log located at read log address
0x04 and is accessible using READ LOG EXT, READ LOG DMA EXT or SMART READ LOG
commands.
Table 13 lists the Device Statistics supported by the Intel SSD 520 Series.
Table 13. Device Statistics Log
Page Offset Description
0x00 - List of Supported Pages -
0x08 Power Cycle Count 0Ch
0x10 Power-On Hours 09h
0x18 Logical Sectors Written E1h
0x01 - General Statistics
0x04 - General Errors Statistics
0x06 - Transport Statistics
0x20
0x28 Logical Sectors Read F2h
0x30
0x08 Num Reported Uncorrectable Errors BBh
0x10
0x08 Num Hardware Resets -
0x10 Num ASR Events 0x18 Num Interface CRC Errors -
Num Write Commands - incremented
by one for every host write command
Num Read Commands - incremented
by one for every host write command
Num Resets Between Command
Acceptance and Completion
Equivalent SMART attribute if
applicable
-
-
-
February 2012 Product Specification
Order Number: 325968-001US 19
Intel® Solid-State Drive 520 Series
Table 13. Device Statistics Log (Continued)
®
Intel
Intel® Solid-State Drive 520 Series
Solid-State Drive 520 Series
Page Offset Description
0x07 - Solid State Device Statistics 0x08 Pe rcentage Used Endurance Indicator
5.6 SMART Command Transport (SCT)
With SMART Command Transport (SCT), a host can send commands and data to an
SSD and receive status and data from an SSD using standard write/read commands to
manipulate two SMART Logs:
• Log Address E0h ("SCT Command/Status") — used to send commands and retrieve
status
• Log Address E1h ("SCT Data Transfer") — used to transport data
5.7 Data Set Management Command Set
The Intel SSD 520 Series supports the Data Set Management command set Trim
attribute, which consists of:
• DATA SET MANAGEMENT
5.8 Host Protected Area Command Set
The Intel SSD 520 Series supports the Host Protected Area command set, which
consists of:
• READ NATIVE MAX ADDRESS
•SET MAX ADDRESS
• READ NATIVE MAX ADDRESS EXT
• SET MAX ADDRESS EXT
Equivalent SMART attribute if
This statistic counts up from 0
rather than down from 100, and
may go beyond 100 for drives that
exceed their expected lifetime.
applicable
E9h
5.9 48-Bit Address Command Set
The Intel SSD 520 Series supports the 48-bit Address command set, which consists of:
• FLUSH CACHE EXT
•READ DMA EXT
• READ NATIVE MAX ADDRESS
• READ NATIVE MAX ADDRESS EXT
• READ SECTOR(S) EXT
• READ VERIFY SECTOR(S) EXT
• SET MAX ADDRESS EXT
•WRITE DMA EXT
•WRITE MULTIPLE EXT
• WRITE SECTOR(S) EXT
®
Solid-State Drive 520 Series
Intel
Product Specification February 2012
20 Order Number: 325968-001US
Intel® Solid-State Drive 520 Series
5.10 General Purpose Log Command Set
The Intel SSD 520 Series supports the General Purpose Log command set, which
consists of:
• READ LOG EXT
•WRITE LOG EXT
• READ LOG DMA EXT
•WRITE LOG DMA EXT
5.11 Native Command Queuing
The Intel SSD 520 Series supports the Native Command Queuing (NCQ) command set,
which includes:
• READ FPDMA QUEUED
•WRITE FPDMA QUEUED
Note: With a maximum queue depth equal to 32.
5.12 Software Settings Preservation
The Intel SSD 520 Series supports the SET FEATURES parameter to enable/disable the
preservation of software settings.
5.13 SATA Link Power Management (LPM)
The Intel SSD 520 Series supports the SET FEATURES parameter to enable Device
Initiated Power Management (DIPM). The SSD also supports Host Initiated Power
Management (HIPM).
February 2012 Product Specification
Order Number: 325968-001US 21
Intel® Solid-State Drive 520 Series
®
Intel
Intel® Solid-State Drive 520 Series
Solid-State Drive 520 Series
6.0 Certifications and Declarations
Table 14 describes the Device Certifications supported by the Intel SSD 520 Series.
Table 14. Device Certifications and Declarations
Certification Description
CE Compliant
UL Certified
C-Tick Compliant
BSMI Compliant
KCC
Microsoft WHQL Microsoft Windows Hardware Quality Labs
RoHS Compliant Restriction of Hazardous Substance Directive
VCCI
SATA-IO Indicates certified logo program from Serial ATA International Organization.
Low Halogen
Low Voltage DIRECTIVE 2006/95/EC OF THE EUROPEAN PARLIAMENT AND OF THE COUNCIL
of 12 December 2006, and EMC Directive 2004/108/EC OF THE EUROPEAN PARLIAMENT AND OF
THE COUNCIL of 15 December 2004.
Certified Underwriters Laboratories, Inc. Bi-National Component Recognition; UL 60950-1, 2nd
Edition, 2007-03-27 (Information Technology Equipment - Safety - Part 1: General Requirements)
CSA C22.2 No. 60950-1-07, 2nd Edition, 2007-03 (Information Technology Equipment - Safety -
Part 1: General Requirem ents)
Compliance with the Australia/New Zealand Standard AS/NZS3548 and Electromagnetic
Compatibility (EMC) Framework requirements of the Australian Communication Authority (ACA).
Compliance to the Taiwan EMC standard CNS 13438: Information technology equipment - Radio
disturbance Characteristics - limits and methods of measurement, as amended on June 1, 2006, is
harmonized with CISPR 22: 2005.04.
Compliance with paragraph 1 of Article 11 of the Electromagnetic Compatibility Control Regulation
and meets the Electromagnetic Compatibility (EMC) Framework requirements of the Radio R esearch
Laboratory (RRL) Ministry of Information and Communication Republic of Korea.
Voluntary Control Council for Interface to cope with disturbance problems caused by personal
computers or facsimile.
Applies only to brominated and chlorinated flame retardants (BFRs/CFRs) and PVC in the final
product. Intel components as well as purchased components on the finished assembly meet JS-709
requirements, and the PCB/substrate meet IEC 61249-2-21 requirements. The replacement of
halogenated flame retardants and/or PVC may not be better for the environment.
®
Solid-State Drive 520 Series
Intel
Product Specification February 2012
22 Order Number: 325968-001US
Intel® Solid-State Drive 520 Series
7.0 References
Table 15 identifies the standards information referenced in this document.
Table 15. Standards References
Date or
Rev. #
Sept 2010
Dec 2008 VCCI http://www.vcci.jp/vcci_e/
June 2009 RoHS
August 2009 ACS-2 Specification http://www.t13.org/
June 2009 Serial ATA Revision 3.0 http://www.sata-io.org/
May 2006 SFF-8223, 2.5-inch Drive w/Serial Attachment Connector http://www.sffcommittee.org/
May 2005 SFF-8201, 2.5-inch drive form factor http://www.sffcommittee.org/
Solid-State Drive (SSD) Requi rements and Endura nce Test Method
(JESD218)
Compliance with EN 55022:1998 Information technology
equipment - Radio disturbance characteristics - Limits and
methods of measurement CISPR 22:1997 (Modified)
Title Location
http://www.jedec.org/standardsdocuments/docs/jesd218/
http://qdms.intel.com/
Click Search MDDS Database and search
for material description datasheet
http://www.iec.ch/
8.0 Terms and Acronyms
Table 16 defines the terms and acronyms used in this document.
Table 16. Glossary of Terms and Acronyms
Term Definition
ATA Advanced Technology Attachment
DAS Device Activity Signal
DIPM Device Initiated Power Management
DMA Direct Memory Access
EXT Extended
FPDMA First Party Direct Memory Access
GB
HDD Hard Disk Drive
HIPM Host Initiated Power Management
I/O Input/Output
IOPS Input/Output Operations Per Second
KB Kilobyte (1,024 bytes)
LBA Logical Block Address
LPM Link Power Management
MB Megabyte (1,000,000 bytes)
MLC Multi-level Cell
MTBF Mean Time Between Failures
Gigabyte (1,000,000,000 bytes)
Note: The total usable capacity of the SSD may be less than the total physical capacity because a
small portion of the capacity is used for NAND flash management and maintenance purposes.
February 2012 Product Specification
Order Number: 325968-001US 23
Intel® Solid-State Drive 520 Series
Table 16. Glossary of Terms and Acronyms (Continued)
Term Definition
NCQ Native Command Queuing
NOP No Operation
PIO Programmed Input/Output
RDT Reliability Demonstration Test
RMS Root Mean Squared
SATA Serial Advanced Technology Attachment
SMART Self-Monitoring, Analysis and Reporting Technology
SSD Solid-State Drive
TYP Typical
UBER Uncorrectable Bit Error Rate
9.0 Revision History
®
Intel
Intel® Solid-State Drive 520 Series
Solid-State Drive 520 Series
Date Revision Description
February 2012 001 Initial release.
®
Solid-State Drive 520 Series
Intel
Product Specification February 2012
24 Order Number: 325968-001US
Intel® Solid-State Drive 520 Series
Appendix A IDENTIFY DEVICE Command Data
Table 17 details the sector data returned after issuing an IDENTIFY DEVICE command.
Table 17. Returned Sector Data
Word
0 F 0040h General configuration bit-significant information
1 X 3FFFh Obsolete - Number of logical cylinders (16,383)
2 V C837h Specific configuration
3 X 0010h Obsolete - Number of logical heads (16)
4-5 X 0h Retired
6 X 003Fh Obsolete - Number of logical sectors per logical track (63)
7-8 V 0h Reserved for assignment by the CompactFlash* Association (CFA)
9X 0hRetired
10-19 F varies Serial number (20 ASCII characters)
20-21 X 0h Retired
22 X 0h Obsolete
23-26 F varies Firmware revision (8 ASCII characters)
27-46 F varies Model number (Intel
47 F 8010h
48 F 4000h Reserved
49 F 2F00h Capabilities
50 F 4000h Capabilities
51-52 X 0h Obsolete
53 F 0007h Words 88 and 70:64 valid
54 X 3FFFh Obsolete - Number of logical cylinders (16,383)
55 X 0010h Obsolete - Number of logical heads (16)
56 X 003Fh Obsolete - Number of logical sectors per logical track (63)
57-58 X 00FBFC10h Obsolete
59 V 0110h Number of sectors transferred per interrupt on multiple commands
60-61 F varies Total number of user-addressable sectors
62 X 0h Obsolete
63 F 0007h Multi-word DMA modes supported/selected
64 F 0003h PIO modes supported
65 F 0078h Minimum multiword DMA transfer cycle time per word
66 F 0078h Manufacturer’s recommended multiword DMA transfer cycle time
67 F 0078h Minimum PIO transfer cycle time without flow control
68 F 0078h Minimum PIO transfer cycle time with IORDY flow control
69 F 4000h Additional Supported
70 F 0h Reserved
71-74 F 0h Reserved for IDENTIFY PACKET DEVICE command
F = Fixed
V = Variable
X = Both
Default Value Description
®
Solid-State Drive)
7:0—Maximum number of sectors transferred per interrupt on multiple
commands
February 2012 Product Specification
Order Number: 325968-001US 25
Intel® Solid-State Drive 520 Series
®
Intel
Intel® Solid-State Drive 520 Series
Solid-State Drive 520 Series
Table 17. Returned Sector Data (Continued)
F = Fixed
Word
75 F 001Fh Queue depth
76 F 470Eh Serial ATA capabilities
77 F 0006h Reserved for future Serial ATA definition
78 F 004Ch Serial ATA features supported
79 V 0040h Serial ATA features enabled
80 F 03FCh Major version number
81 F 0110h Minor version number
82 F 746Bh Command set supported
83 F 7469h Command sets supported
84 F 6163h Command set/feature supported extension
85 V 7469h Command set/feature enabled
86 V B449h Command set/feature enabled
87 V 6163h Command set/feature default
88 V 407Fh Ultra DMA Modes
89 F 0002h Time required for security erase unit completion
90 F 0001h Time required for enhanced security erase completion
91 V 00FEh Current advanced power management value
92 V FFFEh Master Password Revision Code
93 F 0h
94 V 0h Vendor’s recommended and actual acoustic management value
95 F 0h Stream minimum request size
96 V 0h Streaming transfer time - DMA
97 V 0h Streaming access latency - DMA and PIO
98-99 F 0h Streaming performance granularity
100-103 V varies Maximum user LBA for 48-bit address feature set
104 V 0h Streaming transfer time - PIO
105 F 0001h Reserved
106 F 4000h Physical sector size / logical sector size
107 F 0h Inter-seek delay for ISO-7779 acoustic testing in microseconds
108-111 F varies Unique ID
112-115 F 0h Reserved for world wide name extension to 128 bits
116 V 0h Reserved for technical report
117-118 F 0h Words per logical sector
119 F 401Ch Supported settings
120 F 401Ch Command set/feature enabled/supported
121-126 F 0h Reserved
127 F 0h Removable Media Status Notification feature set support
128 V 0021h Security status
129-159 X varies Vendor-specific
V = Variable
X = Both
Default Value Description
Hardware reset result: the contents of bits (12:0) of this word shall
change only during the execution of a hardware reset
®
Solid-State Drive 520 Series
Intel
Product Specification February 2012
26 Order Number: 325968-001US
Intel® Solid-State Drive 520 Series
Table 17. Returned Sector Data (Continued)
F = Fixed
Word
160 F 0h CompactFlash Association (CFA) power mode 1
161-168 X 0h Reserved for assignment by the CFA
169 X 0001h Data set management Trim attribute support
170-173 F 0h Additional Product Identifier
174-175 F 0h Reserved
176-205 V 0h Current media serial number
206 X 0021h SCT Command Transport
207-208 X 0h Reserved
209 X 4000h Alignment of logical blocks within a physical block
210-211 X 0h Write-Read-Verify Sector Count Mode 3 (DWord)
212-213 X 00000100h Write-Read-Verify Sector Count Mode 2 (DWord)
214 X 0h NV Cache Capabilities
215-216 X 0h NV Cache Size in Logical Blocks (DWord)
217 X 0001h Nominal media rotation rate
218 X 0h Reserved
219 X 0h NV Cache Options
220 X 0h Write-Read-Verify feature set
221 X 0h Reserved
222 X 103Fh Transport major version number
223 X 0h Transport minor version number
224-229 X 0h Reserved
230-233 X 0h Extended Number of User Addressable Sectors (QWord)
234 X 0h
235 X 0h
236-254 X 0h Reserved
255 X varies Integrity word
V = Variable
X = Both
Default Value Description
Minimum number of 512-byte data blocks per DOWNLOAD MICROCODE
command for mode 03h
Maximum number of 512-byte data blocks per DOWNLOAD MICROCODE
command for mode 03h
Notes: F = Fixed. The content of the word is fixed and does not change. For removable media devices, these values may change
when media is removed or changed.
V = Variable. The state of at least one bit in a word is variable and may change depending on the state of the device or
the commands executed by the device.
X = F or V. The content of the word may be fixed or variable.
February 2012 Product Specification
Order Number: 325968-001US 27
Intel® Solid-State Drive 520 Series
Loading...