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-002 Minor edits and formatting throughout. June 2008
-003 Added Intel 82G41 GMCH September 2008
-004 Added Intel 82Q43 GMCH and 82Q45 GMCH September 2008
Description Date
§
5 Thermal and Mechanical Design Guidelines
Thermal and Mechanical Design Guidelines 6
Introduction
1 Introduction
As the complexity of computer systems increases, so do power dissipation
requirements. The additional power of next generation systems must be properly
dissipated. Heat can be dissipated using improved system cooling, selective use of
ducting, and/or passive heatsinks.
The objective of thermal management is to ensure that the temperatures of all
components in a system are maintained within functional limits. The functional
temperature limit is the range within which the electrical circuits can be expected to
meet specified performance requirements. Operation outside the functional limit can
degrade system performance, cause logic errors, or cause component and/or system
damage. Temperatures exceeding the maximum operating limits may result in
irreversible changes in the operating characteristics of the component.
This document is for the following devices:
®
• Intel
• Intel
• Intel
• Intel
P45 Chipset MCH (82P45 MCH)
®
P43 Chipset MCH (82P43 MCH)
®
G45 Chipset GMCH (82G45 GMCH)
®
G43 Chipset GMCH (82G43 GMCH)
• Intel® G41 Chipset GMCH (82G41 GMCH)
• Intel® Q45 Chipset GMCH (82Q45 GMCH)
• Intel® Q43 Chipset GMCH (82Q43 GMCH)
This document presents the conditions and requirements to properly design a cooling
solution for systems that implement the (G)MCH. Properly designed solutions provide
adequate cooling to maintain the (G)MCH case temperature at or below thermal
specifications. This is accomplished by providing a low local-ambient temperature,
ensuring adequate local airflow, and minimizing the case to local-ambient thermal
resistance. By maintaining the (G)MCH case temperature at or below those
recommended in this document, a system designer can ensure the proper
functionality, performance, and reliability of this component.
Note: Unless otherwise specified the information in this document applies to all
configurations of Intel
®
P45, P43, Q45, Q43, G45, G43, and G41 Chipsets. The Intel®
Q45, Q43, G45, G43, and G41 Chipsets are available with integrated graphics and
associated SDVO and digital display ports. In this document the integrated graphics
version is referred to as GMCH. In addition a version will be offered using discrete
graphics and is referred to as the MCH. The term (G)MCH will be used to when
referring to all configurations.
Note: In this document the Intel P45, P43, Q45, Q43, G45, and G43 Chipsets refer to the
combination of the (G)MCH and the Intel
®
ICH10. For ICH10 thermal details, refer to
the Intel® I/O Controller Hub 10 (ICH10) Thermal Design Guidelines. The Intel G41
Chipset refers to the combination of the GMCH and Intel ICH7. For ICH7 details, refer
to the Intel® I/O Controller Hub 7 (ICH7) Thermal Design Guidelines.
7 Thermal and Mechanical Design Guidelines
1.1 Terminology
Term Description
FC-BGA Flip Chip Ball Grid Array. A package type defined by a plastic substrate where a
die is mounted using an underfill C4 (Controlled Collapse Chip Connection)
attach style. The primary electrical interface is an array of solder balls attached
to the substrate opposite the die. Note that the device arrives at the customer
with solder balls attached.
Intel® ICH7 Intel® I/O Controller Hub 7. The chipset component that contains the primary
PCI interface, LPC interface, USB2, SATA, and/or other legacy functions.
Intel® ICH10 Intel® I/O Controller Hub 10. The chipset component that contains the primary
The (G)MCH is available in a 34 mm [1.34 in] x 34 mm [1.34 in] Flip Chip Ball Grid
Array (FC-BGA) package with 1254 solder balls. The die size is currently 10.80 mm
[0.425 in] x 9.06 mm [0.357 in] and is subject to change. A mechanical drawing of
the package is shown in
2.1.1 Non-Grid Array Package Ball Placement
The (G)MCH package utilizes a “balls anywhere” concept. Minimum ball pitch is
0.7 mm [0.028 in], but ball ordering does not follow a 0.7 mm grid. Board designers
should ensure correct ball placement when designing for the non-grid array pattern.
For exact ball locations relative to the package, refer to the IntelFamily Datasheet.
Table 1 provides static load specifications for the package. This mechanical maximum
load limit should not be exceeded during heatsink assembly, shipping conditions, or
standard use conditions. Also, any mechanical system or component testing should
not exceed the maximum limit. The package substrate should not be used as a
mechanical reference or load-bearing surface for the thermal and mechanical solution.
Table 1. Package Loading Specifications
Parameter Maximum Notes
Static
NOTES:
1. These specifications apply to uniform compressive loading in a direction normal to the
package.
2. This is the maximum force that can be applied by a heatsink retention clip. The clip
must also provide the minimum specified load on the package.
3. These specifications are based on limited testing for design characterization. Lo ading
limits are for the package only.
To ensure the package static load limit is not exceeded, the designer should
understand the post reflow package height. The following figure shows the nominal
post-reflow package height assumed for calculation of a heatsink clip preload of the
reference design. Refer to the package drawing in
analysis.
15 lbf
1,2,3
Appendix B to perform a detailed
Product Specifications
Figure 2. Package Height
2.3 Thermal Specifications
To ensure proper operation and reliability of the (G)MCH, the case temperature must
be at or below the maximum value specified in
thermal enhancements are required to dissipate the heat generated and maintain the
(G)MCH within specifications. Chapter 3 provides the thermal metrology guidelines for
case temperature measurements.
Table 2. System and component level
Thermal and Mechanical Design Guidelines 12
Product Specifications
2.3.1 Thermal Design Power (TDP)
2.3.1.1 Definition
Thermal design power (TDP) is the estimated power dissipation of the (G)MCH based
on normal operating conditions including V
case power intensive applications. This value is based on expected worst-case data
traffic patterns and usage of the chipset and does not represent a specific software
application. TDP attempts to account for expected increases in power due to variation
in (G)MCH current consumption due to silicon process variation, processor speed,
DRAM capacitive bus loading and temperature. However, since these variations are
subject to change, there is no assurance that all applications will not exceed the TDP
value.
The system designer must design a thermal solution for the (G)MCH such that it
maintains T
specification is a requirement for a sustained power level equal to TDP, and that
T
C-MAX
below T
C
the case temperature must be maintained at temperatures less than T
operating at power levels less than TDP. This temperature compliance is to ensure
component reliability. The TDP value can be used for thermal design if the thermal
protection mechanisms are enabled. The (G)MCH incorporate a hardware-based failsafe mechanism to keep the product temperature in spec in the event of unusually
strenuous usage above the TDP power.
for a sustained power level equal to TDP. Note that the
C-MAX
and T
CC
while executing real worst-
C-MAX
C-MAX
when
2.3.2 TDP Prediction Methodology
2.3.2.1 Pre-Silicon
To determine TDP for pre-silicon products in development, it is necessary to make
estimates based on analytical models. These models rely on knowledge of the past
(G)MCH power dissipation behavior along with knowledge of planned architectural and
process changes that may affect TDP. Knowledge of applications available today and
their ability to stress various aspects of the (G)MCH is also included in the model. The
projection for TDP assumes (G)MCH operation at T
accounts for normal manufacturing process variation.
2.3.2.2 Post-Silicon
Once the product silicon is available, post-silicon validation is performed to assess the
validity of pre-silicon projections. Testing is performed on both commercially available
and synthetic high power applications and power data is compared to pre-silicon
estimates. Post-silicon validation may result in a small adjustment to pre-silicon TDP
estimates.
. The TDP estimate also
C-MAX
13 Thermal and Mechanical Design Guidelines
2.3.3 Thermal Specifications
The data in Table 2 is based on post-silicon power measurements for the (G)MCH. The
TDP values are based on system configuration with two (2) DIMMs per channel, DDR3
(or DDR2) and the FSB operating at the top speed allowed by the chipset with a
processor operating at that system bus speed. Intel recommends designing the
(G)MCH thermal solution to the highest system bus speed and memory frequency for
maximum flexibility and reuse. The (G)MCH packages have poor heat transfer
capability into the board and have minimal thermal capability without thermal
solutions. Intel requires that system designers plan for an attached heatsink when
using the (G)MCH.
Table 2. Thermal Specifications
Product Specifications
Component Mem
Intel® G45
Type
DDR3 1333
Chipset
Intel® G43
DDR3 1333
Chipset
Intel® G41
DDR3 1333
Chipset
Intel® Q45 /
DDR3 1333
Q43 Chipset
Intel® Q45 /
DDR2 1333
Q43 Chipset
Intel® Q43
DDR3 1333
Chipset
Intel® P45
DDR3 1333
Chipset
Intel® P43
DDR3 1333
Chipset
NOTES:
1. Thermal specifications assume an attached heatsink is present.
2. Max Idle power is the worst case idle power in the system booted to Windows* with no
3. Intel
4. When an external graphic card is installed in a system with the Intel
5. The Idle and TDP numbers are assuming Internal Graphics is disabled on the Intel Q43
6. Idle data is measured on Intel P45, P43 Chipset when an external graphics card is
Sys
Bus
Speed
MT/s
MT/s
MT/s
MT/s
MT/s
MT/s
MT/s
MT/s
background applications running.
®
P45, P43, G45, G43, Q45, and Q43 Chipset TDP is measured with DDR3 (or
DDR2) with 2 channels, 2 DIMMs per channel and Max Idle power is measured with
DDR3 (or DDR2) with 2 channels, 1 DIMM per channel. Intel
Idle power are measured with DDR3 with 2 channels, 1 DIMM per channel.
Mem
Freq
1333
MT/s
1067
MT/s
1067
MT/s
1067
MT/s
800
MT/s
1067
MT/s
1333
MT/s
1067
MT/s
Max Idle
Power
(C1/C2
Enabled)
Max Idle
Power
(C3/C4
Enabled)
TDP T
C-MIN
T
C-MAX
Notes
9 W 7.7 W 24 W 0 °C 103°C 1,2,3,4
9 W 7.7 W 24 W 0 °C 103 °C 1,2,3,4
11.5 W N/A 25 W 0 °C 102 °C 1,2,3
6W 4.7 W 17 W 0 °C 105 °C 1,2,3
6W 4.7 W 17 W 0 °C 105 °C 1,2,3
5W 3.8 W 13 W 0 °C 105 °C 1,2,3,5
9 W 7.5 W 22 W 0 °C 103 °C 1,2,3,6
9 W 7.5 W 22 W 0 °C 103 °C 1,2,3,6
®
G41 Chipset TDP and Max
®
G45, G43
Chipsets, the TDP for these parts will drop to approximately 22 W. The GMCH will
detect the presence of the graphics card and disable the on-board graphics resulting in
the lower TDP for these components.
Chipset.
installed in a system wherein this card must support L0s /L1 ASPM.
Thermal and Mechanical Design Guidelines 14
Product Specifications
2.3.4 T
CONTROL
Limit
Intel® Quiet System Technology (Intel® QST) can monitor an embedded thermal
sensor. The maximum operating limit when monitoring this thermal sensor is T
For the (G)MCH this value is 99° C. This value should be programmed into the
appropriate register of Intel
®
QST, as the maximum sensor temperature for operation
of the (G)MCH.
2.4 Non-Critical to Function Solder Balls
Intel has defined selected solder joints of the (G)MCH as non-critical to function
(NCTF) when evaluating package solder joints post environmental testing. The
(G)MCH signals at NCTF locations are typically redundant ground or non-critical
reserved, so the loss of the solder joint continuity at end of life conditions will not
affect the overall product functionality.
the (G)MCH package.
Figure 3. Non-Critical to Function Solder Balls
Figure 3 identifies the NCTF solder joints of
CONTROL
.
§
15 Thermal and Mechanical Design Guidelines
Product Specifications
Thermal and Mechanical Design Guidelines 16
Thermal Metrology
3 Thermal Metrology
The system designer must measure temperatures in order to accurately determine the
thermal performance of the system. Intel has established guidelines for proper
techniques of measuring (G)MCH component case temperatures.
3.1 Case Temperature Measurements
To ensure functionality and reliability of the (G)MCH the TC must be maintained at or
below the maximum temperature listed in
at the geometric center of the die corresponds to T
care to ensure an accurate temperature reading.
Temperature differences between the temperature of a surface and the surrounding
local ambient air can introduce error in the measurements. The measurement errors
could be due to a poor thermal contact between the thermocouple bead and the
surface of the package, heat loss by radiation and/or convection, conduction through
thermocouple leads, or contact between the thermocouple cement and the heatsink
base (if a heatsink is used). To minimize these measurement errors a thermocouple
attach with a zero-degree methodology is recommended.
Table 2. The surface temperature measured
. Measuring TC requires special
C
3.1.1 Thermocouple Attach Methodology
1. Mill a 3.3 mm [0.13 in] diameter hole centered on bottom of the heatsink base.
The milled hole should be approximately 1.5 mm [0.06 in] deep.
2. Mill a 1.3 mm [0.05 in] wide slot, 0.5 mm [0.02 in] deep, from the centered hole
to one edge of the heatsink. The slot should be in the direction parallel to the
heatsink fins (see
3. Attach thermal interface material (TIM) to the bottom of the heatsink base.
4. Cut out portions of the TIM to make room for the thermocouple wire and bead.
The cutouts should match the slot and hole milled into the heatsink base.
5. Attach a 36 gauge or smaller K-type thermocouple bead to the center of the top
surface of the die using a cement with high thermal conductivity. During this step,
make sure no contact is present between the thermocouple cement and the
heatsink base because any contact will affect the thermocouple reading. It is
critical that the thermocouple bead makes contact with the die
Figure 4).
(see
6. Attach heatsink assembly to the (G)MCH, and route thermocouple wires out
through the milled slot.
Figure 5).
17 Thermal and Mechanical Design Guidelines
Thermal Metrology
Figure 4. 0° Angle Attach Methodology (top view, not to scale)
Figure 5. 0° Angle Attach Heatsink Modifications (generic heatsink side and bottom
view shown, not to scale)
Thermal and Mechanical Design Guidelines 18
Thermal Metrology
3.2 Airflow Characterization
Figure 6 describes the recommended location for air temperature measurements
measured relative to the component. For a more accurate measurement of the
average approach air temperature, Intel recommends averaging temperatures
recorded from two thermocouples spaced about 25 mm [1.0 in] apart. Locations for
both a single thermocouple and a pair of thermocouples are presented.
Airflow velocity can be measured using sensors that combine air velocity and
temperature measurements. Typical airflow sensor technology may include hot wire
anemometers.
Figure 6 provides guidance for airflow velocity measurement locations
which should be the same as used for temperature measurement. These locations are
for a typical JEDEC test setup and may not be compatible with chassis layouts due to
the proximity of the processor to the (G)MCH. The user may have to adjust the
locations for a specific chassis. Be aware that sensors may need to be aligned
perpendicular to the airflow velocity vector or an inaccurate measurement may result.
Measurements should be taken with the chassis fully sealed in its operational
configuration to achieve a representative airflow profile within the chassis.
§
19 Thermal and Mechanical Design Guidelines
Thermal Metrology
Thermal and Mechanical Design Guidelines 20
Reference Thermal Solution
4 Reference Thermal Solution
The design strategy for the reference thermal solution for the (G)MCH for use in ATX
platforms reuses the Intel
Wave Solder Heatsink (PWSHS), see
®
3 Series Chipsets reference thermal solution, Preload
Figure 18 and Figure 19. The ramp retainer, MB
anchors and the thermal interface material remains the same to meet the (G)MCH
thermal/mechanical requirements. The keep out zone remains the same as used with
the Intel 3 Series Chipsets, see
Figure 15.
The (G)MCH maximum TDP has been updated in Table 2. The TDP reduction may
allow system designers to lower thermal solution cost for McCreary and Boulder Creek
platforms. The reference design for the (G)MCH is a PWSHS which provides adequate
solder joint protection but may exceed thermal performance requirements in most
systems. Customers may save costs by reducing the heatsink size to meet the
lowered TDP.
The PWSHS reference design has the cross-cut dimension change from 3.75 mm to
3.90 mm (see
design (Intel
Note: The nominal height of (G)MCH package (see
Figure 7) to prevent the gapping issue for cross-products heatsink
®
3 Series Chipsets and Intel® 4 Series Chipsets).
Figure 2) is 0.25 mm lower compared to
Intel® 3 Series Chipsets package. Customers should analyze this gapping issue
resulting of thinner Intel® 4 Series Chipsets package (nominal height of 2.13 mm)
compared to Intel® 3 Series Chipsets package (nominal height of 2.38 mm) prior to
design.
Note: The PWSHS reference design retention requires zero gap (between anchor wire clip
and ramp retainer) to ensure effective top-side stiffening for solder joint protection.
This cross-cut dimension change design allows to be used on Intel
®
3 Series Chipsets
without assembly issue.
21 Thermal and Mechanical Design Guidelines
Reference Thermal Solution
Figure 7. Cross-Cut Dimension Change of PWSHS Reference Design
The BTX reference design for the (G)MCH will reuse the Z-clip heatsink and MB
anchors from the Intel
®
3 Series Chipsets thermal solution. The thermal interface
material and extrusion design requirements are being evaluated for changes
necessary to meet the (G)MCH thermal requirements. The keep out zone remains the
same as used with the Intel
®
3 Series Chipsets, see Figure 16.
This chapter provides detailed information on operating environment assumptions,
heatsink manufacturing, and mechanical reliability requirements for the (G)MCH.
4.1 Operating Environment
The operating environment of the (G)MCH will differ depending on system
configuration and motherboard layout. This section defines operating environment
boundary conditions that are typical for ATX and BTX form factors. The system
designer should perform analysis in the expected platform operating environment to
assess impact on thermal solution selection.
Thermal and Mechanical Design Guidelines 22
Reference Thermal Solution
4.1.1 ATX Form Factor Operating Environment
The (G)MCH reference design thermal solution has been optimized to meet all three
boundary conditions for 65W/95W/130W processor TDPs. The highest processor TDP
provide a boundary condition for the (G)MCH heatsink with higher air inlet speed and
temperature (T
temperature. The (G)MCH heatsink design is required to meet all of these boundary
conditions as specified in
Table 3. (G)MCH Heatsink Boundary Condition Summary in ATX Platforms
) while the lowest processor TDP provides lower air inlet speed and
A
Table 3.
Processor TDP
(TDP)
65 W245
95 W292
130 W341
Airflow Speed
(LFM)
Air Inlet Temperature
)
(T
A,
47.2 °C
50.0 °C
51.6 °C
In ATX platforms using the 130 W TDP processor, an airflow speed of 1.73 m/s
[341 lfm] is assumed to be approaching the heatsink at a 30° angle from the
processor thermal solution, see
ambient air temperature, T
Figure 8 and Figure 9 for more details. The local
, at the (G)MCH heatsink in an ATX platform is assumed to
A
be 51.6 °C for the (G)MCH. The airflow assumed above can be achieved by using a
processor heatsink providing omni directional airflow, such as a radial fin or “X”
pattern heatsink. Such a heatsink can deliver airflow to both the (G)MCH and other
areas like the voltage regulator, as shown in
Figure 10. In addition, (G)MCH board
placement should ensure that the (G)MCH heatsink is within the air exhaust area of
the processor heatsink.
Note that heatsink orientation alone does not guarantee that airflow speed
will be achieved. The system integrator should use analytical or experimental means
to determine whether a system design provides adequate airflow speed for a
particular (G)MCH heatsink.
The thermal designer must carefully select the location to measure airflow to get a
representative sampling. ATX platforms need to be designed for the worst-case
thermal environment, typically assumed to be 35 °C ambient temperature external to
the system measured at sea level.
23 Thermal and Mechanical Design Guidelines
Figure 8. ATX Boundary Conditions
Reference Thermal Solution
Thermal and Mechanical Design Guidelines 24
Reference Thermal Solution
Figure 9. Side View of ATX Boundary Conditions
Figure 10. Processor Heatsink Orientation to Provide Airflow to (G)MCH Heatsink on an
ATX Platform
Airflow Direction
GMCH Heatsink
GMCH Heatsink
Airflow Direction
Airflow Direction
TOP VIEW
TOP VIEW
Airflow Direction
Airflow Direction
Airflow Directi on
Omni Directional Flow
Omni Directional Flow
Processor Heatsink
Processor Heatsink
(Fan not Shown)
(Fan not Shown)
Airflow Direction
Airflow Direction
Other methods exist for providing airflow to the (G)MCH heatsink, including the use of
system fans and/or ducting, or the use of an attached fan (active heatsink).
25 Thermal and Mechanical Design Guidelines
Reference Thermal Solution
4.1.2 Balanced Technology Extended (BTX) Form Factor
Operating Environment
This section provides operating environment conditions based on what has been
exhibited on the Intel BTX Entertainment PC reference design, refer to the Balanced Technology Extended (BTX) Entertainment PC Case Study for detail system study. On
a BTX platform, the (G)MCH obtains in-line airflow directly from the processor thermal
module. Since the processor thermal module provides lower inlet temperature airflow
to the processor, reduced inlet ambient temperatures are also often seen at the
(G)MCH as compared to ATX. An example of how airflow is delivered to the (G)MCH
on a BTX platform is shown in
A set of three system level boundary conditions will be established to determine
(G)MCH thermal solution requirement.
• Low external ambient (23 °C)/ idle power for the components (Case 3). This
covers the system idle acoustic condition
• Low external ambient (23 °C)/ TDP for the components (Case 2). The TMA fan
speed is limited by the thermistor in the fan hub.
• High ambient (35 °C)/ TDP for the components (Case 1). This covers the
maximum TMA fan speed condition.
Figure 11.
The values in
Table 4 correspond to the ePC configuration. For more details on the
TMA airflow set points, refer to the Balanced Technology Extended (BTX) System
Design Guide.
Table 4. (G)MCH Heatsink Boundary Condition Summary in BTX Platforms
Case Processor TDP
Case 1
Case 2
Case 3
(TDP)
65W 43.0 194
65W 38.2 117
65W 34.7 29.5
TA into MCH heatsink
(°C)
Airflow into the (G)MCH
heatsink
(LFM)
Note: The customer should analyze their system design to verify their applicable boundary
conditions prior to design. The thermal designer must carefully select the location to
measure airflow to get a representative sampling. BTX platforms need to be designed
for the worst-case thermal environment, typically assumed to be 35 °C ambient
temperature external to the system measured at sea level.
Note: The risk of the solder ball fracture can be minimized with good chassis structure
design on a BTX platform, refer to the Balanced Technology Extended (BTX) Chassis Design Guide (or Balanced Technology Extended (BTX) System Design Guide) for
detail chassis mechanical design.
Thermal and Mechanical Design Guidelines 26
Reference Thermal Solution
Figure 11. Processor Heatsink Orientation to Provide Airflow to (G)MCH Heatsink on a
Balanced Technology Extended (BTX) Platform
BTX Thermal
Airflow Direction
GMCH
Top View
Module Assembly
over processor
4.2 Reference Design Mechanical Envelope
The motherboard component keep-out restrictions for the (G)MCH on an ATX platform
are included in
restrictions for the (G)MCH on a BTX platform are included in Appendix B, Figure 16.
Appendix B, Figure 15. The motherboard component keep-out
4.3 Thermal Solution Assembly
The reference thermal solution for the (G)MCH for an ATX chassis is shown in
Figure 12 and is an aluminum extruded heatsink that uses two ramp retainers, a wire
preload clip, and four motherboard anchors. Refer to
drawings. The heatsink is attached to the motherboard by assembling the anchors into
the board, placing the heatsink, with the wire preload clip over the (G)MCH and
anchors at each of the corners, and securing the plastic ramp retainers through the
anchor loops before snapping each retainer into the fin gap. Leave the wire preload
clip loose in the extrusion during the wave solder process. The assembly is then sent
through the wave process. Post wave, the wire preload clip is snapped into place on
the hooks located on each of the ramp retainers. The clip provides the mechanical
preload to the package. This mechanical preload is necessary to provide both
sufficient pressure to minimize thermal contact resistance and improvement for solder
ball joint reliability. The mechanical stiffness and orientation of the extruded heat sink
also provides protection to reduce solder ball reliability risk. A thermal interface
material (Honeywell PCM45F) is pre-applied to the heatsink bottom over an area
which contacts the package die.
The design concept for the (G)MCH in a BTX chassis is shown in
heatsink is aluminum extruded and utilizes a Z-clip for attach. The clip is secured to
the system motherboard via two solder down anchors around the (G)MCH. The clip
helps to provide a mechanical preload to the package via the heatsink. A thermal
interface material (Honeywell PCM45F) will be pre-applied to the heatsink bottom over
an area in contact with the package die.
Note: To minimize solder ball joint reliability risk, the BTX Z-clip heatsink is intended to be
used with the Support Retention Mechanism (SRM) described in the Balanced Technology Extended (BTX) Interface Specification. For additional information on
designing the BTX chassis to minimize solder ball joint reliability, refer to the Balanced Technology Extended (BTX) Chassis Design Guide.
Appendix B for the mechanical
Figure 13. The
27 Thermal and Mechanical Design Guidelines
Reference Thermal Solution
Figure 12. Design Concept for ATX (G)MCH Heatsink — Installed on Board
The environmental reliability requirements for the reference thermal solution are
shown in
Validation test plans should be defined by the user based on anticipated use
conditions and resulting reliability requirements.
The ATX testing will be performed with the sample board mounted on a test fixture
and includes a processor heatsink with a mass of 550g. The test profiles are
unpackaged board level limits.
• Power Spectral Density (PSD) Profile: 3.13 g RMS
• Non-Operating, -40 °C to +70 °C Thermal
Criteria
Visual\Electrical
Check
Visual/Electrical
Check
Performance
2
The current plan for BTX reference solution testing is to mount the sample board
mounted in a representative BTX chassis with a thermal module assembly having a
mass of 900g. The test profiles are unpackaged system level limits.
• Power Spectral Density (PSD) Profile: 2.20 g RMS
• Non-Operating, -40 °C to +70 °C Thermal
Criteria2
Visual\Electrical
Check
Visual/Electrical
Check
Performance
§
Thermal and Mechanical Design Guidelines 30
Enabled Suppliers
Appendix A Enabled Suppliers
Enabled suppliers for the (G)MCH reference thermal solution are listed in Table 7 and
Table 8. The supplier contact information is listed in Table 9.
Note: These vendors and devices are listed by Intel as a convenience to Intel's general
customer base, but Intel does not make any representations or warranties whatsoever
regarding quality, reliability, functionality, or compatibility of these devices. This list
and/or these devices may be subject to change without notice.
Table 7. ATX Intel Reference Heatsink Enabled Suppliers for (G)MCH