— 85/88 ns initial access
— 40 MHz with zero wait states, 20 ns clock-to-
data output synchronous-burst read mode
— 25 ns asynchronous-page read mode
— 4-, 8-, 16-, and contin uous-word burst mo de
— Buffered Enhanced Factory Programm ing
(BEFP) at 5 µs/byte (Typ)
— 1.8 V buffered program ming at 7 µs/b yte (Typ)
■ Architecture
— Multi-Level Cell Technology: Highest Density
at Lowest Cost
— Asymmetrically-blocked archit ecture
— Four 32-KByte parameter block s: top or
— 64/128/256/512-Mbit and 1-Gbit densities in
— 16-bit wide data bus
Flash Data Integrator optimized
Set compatible
package
Intel
® Easy BGA package
Intel® QUAD+ SCSP
PP
= V
SS
brings reliable, two-bit-per-cell storage technology to the embedded flash market segment.
Benefits include more density in less space, high-speed interface, lowest cost-per-bit NOR
device, and support for code and data storage. Features include high-performance synchronousburst read mode, fast asynchronous access times, low power, flexible security options, and three
industry standard package choices.
The P30 product family is manufactured using Intel
®
130 nm ETOX™ VIII process technology.
Order Number: 306666, Revision: 001
April 2005
INFORMATION IN THIS DOCUMENT IS PROVIDED IN CONNECTION WITH INTEL PRODUCTS. NO LICENSE, EXPRESS OR IMPLIED, BY
ESTOPPEL OR OTHERWISE, TO ANY INTELLECTUAL PROPERTY RIGHTS IS GRANTED BY THIS DOCUMENT. EXCEPT AS PROVIDED IN
INTEL'S TERMS AND CONDITIONS OF SALE FOR SUCH PRODUCTS, INTEL ASSUMES NO LIABILITY WHA TSOEVER, AND INTEL DISCLAIMS
ANY EXPRESS OR IMPLIED WARRANTY, RELATING TO SALE AND/OR USE OF INTEL PRODUCTS INCLUDING LIABILITY OR WARRANTIES
RELATING T O F ITNESS FOR A PARTICULAR PURPOSE, MERCHANTABILITY, OR INFRINGEMENT OF ANY PATENT, COPYRIGHT OR OTHER
INTELLECTUAL PROPERTY RIGHT. Intel products are not intended for use in medical, life saving, or life sustaining applications.
Intel may make changes to specifications and product descriptions at any time, without notice.
This document contains information on products in the design phase of development. The information here is subject to change without notice. Do not
finalize a design with this information.
StrataFlash® Embedded Memory (P30) Contact your local Intel sales office or your distributor to obtain the latest specifications and before placing
your product order.
Copies of documents which have an ordering number and are referenced in this document, or other Intel literature may be obtained by calling 1-800-
This document provides information about the Intel StrataFlash® Embedded Memory (P30) device
and describes its features, operation, and specifications.
1.1Nomenclature
1.8 V :VCC (core) voltage range of 1.7 V – 2.0 V
1-Gbit P30 Family
3.0 V :V
9.0 V :V
Block :A group of bits, bytes,1-Gbit P30 Family or words within the
Main block :An array block that is usually used to store code and/or data.
Parameter block :An array block that is usually used to store frequently changing
Top parameter device :A device with its parameter blocks located at the highest
Bottom parameter device :A device with its parameter blocks located at the lowest
1.2Acronyms
(I/O) voltage range of 1.7 V – 3.6 V
CCQ
voltage range of 8.5 V – 9.5 V
PP
flash memory array that erase simultaneously when the Erase
command is issued to the device. The 1-Gbit P30 Family has
two block sizes: 32-KByte and 128-KByte.
Main blocks are larger than parameter blocks.
data or small system parameters that traditionally would be
stored in EEPROM.
RFU :Reserved for Future Use
SR :Status Register
WSM :Write State Machine
1.3Conventions
VCC :Signal or voltage connection
:Signal or voltage level
V
CC
0x : Hexadecimal number prefix
0b : Binary number prefix
SR[4] :Denotes an individual register bit.
A[15:0] :Denotes a group of similarly named signals, such as address
A5 :Denotes one element of a signal group membership, such as
or data bus.
an individual address bit.
Bit :Binary unit
Byte : Eight bits
Word : Two bytes, or sixteen bits
Kbit : 1024 bits
KByte : 1024 bytes
KWord : 1024 words
Mbit :1,048,576 bits
MByte : 1,048,576 bytes
MWord : 1,048,576 words
This section provides an overview of the features and capabilities of the 1-Gbit P30 Family device.
The P30 family provides density upgrades from 64-Mbit through 1-Gbit. This family of devices
provides high performance at low voltage on a 16-bit data bus. Individually erasable memory
blocks are sized for optimum code and data storage.
Upon initial power up or return from reset, the device defaults to asynchronous page-mode read.
Configuring the Read Configuration Register enables synchronous burst-mode reads. In
synchronous burst mode, output data is synchronized with a user-supplied clock signal. A WAIT
signal provides an easy CPU-to-flash memory synchronization.
In addition to the enhanced architecture and interface, the device incorporates technology that
enables fast factory program and erase operations. Designed for low-voltage systems, the 1-Gbit
P30 Family supports read operations with V
at 1.8 V or 9.0 V. Buffered Enhanced Factory Programming (BEFP) provides the fastest flash
V
PP
array programming performance with V
at 1.8 V, VCC and VPP can be tied together for a simple, ultra low power design. In addition to
voltage flexibility, a dedicated VPP connection provides complete data protection when V
.
V
PPLK
1-Gbit P30 Family
at 1.8 V, and erase and program operations with
CC
at 9.0 V, which increases factory throughput. With VPP
PP
PP
≤
A Command User Interface (CUI) is the interface between the system processor and all internal
operations of the device. An internal Write State Machine (WSM) automatically executes the
algorithms and timings necessary for block erase and program. A Status Register indicates erase or
program completion and any errors that may have occurred.
An industry-standard command sequence invokes program and erase automation. Each erase
operation erases one block. The Erase Suspend feature allows system software to pause an erase
cycle to read or program data in another block. Program Suspend allows system software to pause
programming to read other locations. Data is programmed in word increments (16 bits).
The 1-Gbit P30 Family’s protection register allows unique flash device identification that can be
used to increase system security. The individual Block Lock feature provides zero-latency block
locking and unlocking. In addition, the P30 device also has four pre-defined spaces in the main
array that can be configured as One-Time Programmable (OTP).
Package HeightA--1.200--0.047
StandoffA
Package Body ThicknessA
Lead Widthb0.1000.1500.2000.0040.0060.008
Lead Thicknessc0.1000.1500.2000.0040.0060.008
Package Body LengthD
Package Body WidthE13.80014.00014.2000.5430.5510.559
Lead Pitche-0.500--0.0197-
Terminal DimensionD19.80020.0020.2000.7800.7870.795
Lead Tip LengthL0.5000.6000.7000.0200.0240.028
Lead CountN-56--56Lead Tip Angle∅0°3°5°0°3°5°
Seating Plane CoplanarityY--0.100--0.004
Lead to Package OffsetZ0.1500.2500.3500. 0060.0100. 014
Top View - Ball side downBottom View - Ball Side Up
A1
87654321
A
B
C
D
E
F
G
H
A
Seating
Plane
Note: Drawi ng not to scale
Corner
S1
S2
b
e
Y
Table 2. Easy BGA Package Dimensions
Product Informa tion
Package Height (64/128/256-Mbit)
Package Height (512-Mbit)
Ball Height (64/128/256-Mbit)
Ball Height (512-Mbit)
Package Body Thickness (64/128/256-Mbit)
Package Body Thickness (512-Mbit)
Ball (Lead) Width
Package Body Width
Package Body Length
Pitch
Ball (Lead) Count
Seating Plane Coplanarity
Corner to Ball A1 Distance Along D
Corner to Ball A1 Distance Along E
Package HeightA--1.200--0.0472
Ball HeightA
Package Body ThicknessA
1
0.200--0.0079--
2
-0.860--0.0339Ball (Lead) Widthb0.3250.3750.4250.01280.01480.0167
Package Body Width D9.90010.00010.1000.38980.39370.3976
Package Body Length E7.9008.0008.1000.31100.31500.3189
Pitch e-0.800--0.0315Ball (L ead) Count N-8 8--88Seating Plane CoplanarityY--0.100--0.0039
Corner to Ball A1 Distance Along E S
Corner to Ball A1 Distance Along D S
Package HeightA--1.0 00--0.039 4
Ball HeightA10.117--0.0046-Package Body ThicknessA2-0.740--0.0291Ball (Lead) Widthb0.3000.3500.4000.01180.01380.0157
Package Body LengthD10.90011.0011.1000.42910.43310.4370
Package Body WidthE7.9008.008.1000.31100.31500.3189
Pitch e-0.80--0.0315Ball (Lead) Count N-88--88Seating Plane CoplanarityY--0.1 00--0.003 9
Corner to Ball A1 Distance Along E S11.1001.2001.3000.04330.047 20.0512
Corner to Ball A1 Distance Along D S21.0001.1001.2000.03940.04330.04 7 2
Package HeightA--1.200--0.0472
Ball HeightA10.200--0.0079-Package Body ThicknessA2-0.860--0.0339Ball (Lead) Widthb0.3250.3750.4250.01280.01480.0167
Package Body Length D10.90011.00011.1000.42910.43310.4370
Package Body Width E7.9008.0008.1000.31100.31500.3189
Pitch e-0.800--0.0315B a ll (Lead) Count N-88--8 8Seating Plane CoplanarityY--0.100--0.0039
C o rner to Ball A1 Distance Along E S11. 1001. 2001.30 00.04330. 04720. 0512
C o rner to Ball A1 Distance Along D S21.0001. 1001.20 00.03940. 04330. 047 2
Package HeightA--1.400--0.0551
Ball HeightA10.200--0.0079-Package Body ThicknessA2-1.070--0.0421Ball (Lead) Widthb0.3250.3750.4250.01280.01480.0167
Package Body Length D10.90011.00011.1000.42910.43310.4370
Package Body Width E10.90011.00011.1000.42910.43310.4370
Pitch e-0.800--0.0315Ball (Lead) Count N-88--88Seating Plane CoplanarityY--0.100--0.0039
Corner to Ball A1 Distance A long E S12.6002.7002.8000.10240.10630.1102
Corner to Ball A1 Distance A long D S21.0001.1001.2000.03940.04330.0472
512-Mbit: A[ 25 :1 ].
See Table 5 on page22 and Figure 10 on p age23 for 512-Mbit addressing.
DATA INPUT/OUTPUTS : Inputs data and commands during write cycles; outputs dat a during
memory, Status Register, Protection Register, and Read Configuration Register reads. Data balls
float when the CE# or OE# are deasserted. Data is in ternally latched during writes.
ADDRESS VALID: Active low input. During synchronous read operations, addresses are latched on
the rising edge of ADV#, or on the next valid CLK edge with ADV# low, whichever occurs first.
In asynchronous mode, the address is latched when ADV# going high or continuously flows through
if ADV# is held low.
WARNING: Designs not using ADV# must tie it to VSS to allow addresses to flow through.
FLASH CHIP ENABLE: Active low input. CE# low selects the associated flash memory die. When
asserted, f lash internal control logic, i nput buffers, decoders, and sen s e amplifiers are active. When
deasserted, the associated flash die is deselected, power is reduced to standby lev els, data and
WAIT outputs are placed in high-Z state.
WARNING: All chip enables must be high when device is not in use.
CLOCK: Synchronizes the device with the syste m’s bus frequency in synchronous-read mode.
During synchronous read operations, addresses ar e latched on the rising edge of ADV#, or on the
next valid CLK edge with ADV# low, whichever occurs first.
WARNING: Designs not using CLK for synchronous read mode must tie it to VCCQ or VSS.
OUTPUT ENABLE: Active low input. OE# low enables the device’s output data buffers during read
cycles. OE# high places the data outputs and W AIT in High-Z.
RESET: Active low input. RST# resets internal automation and inhibits write operations. This
provides data protection during power transitions. RST# high enables normal operation. Exit from
reset places the device in asynchronous read array mode.
WAIT: Indicates data valid in synchronous array or non-array burst reads. Read Configuration
Register bit 10 (RCR[10], WT) determines its polarity when asserted. WAIT’s active output is V
when CE# and OE# are VIL. WAIT is high-Z if CE# or OE# is VIH.
V
OH
• In synchronous arr ay or non-array read modes, WAIT indicates invalid data when asserted and
valid data when deasserted.
• In asy n ch ro nous page mo de , an d al l w rite modes, WAIT is de a s se rt e d .
WRITE ENABLE: Active low input. WE# controls writes to the device. Address and data are latc hed
on the rising edge of WE#.
WRITE PROTECT: Active low input. WP# low enables the lock-down mechanism. Blocks in lockdown cannot be unlocked with the Unlock command. WP# high overrides the lock-down function
enabling blocks to be erased or programmed using software commands.
Erase and Progr am Power: A valid voltage on this pin all ows erasing or progr amming. Memory
level of V
IH
PP
≤ V
contents cannot be altered when V
should not be attempted.
= VCC for in-system prog r am and er ase oper at ions. To accommodate resist or o r di ode dr op s
Set V
PP
from the syste m supply, the V
min to perform in-system flash modif ication. VPP may be 0 V during read operations.
can be applied to main blocks for 1000 cy cles maximum and to par ameter blocks for 2500
V
PPH
VPP can be connected to 9 V for a cumulative total not to ex ceed 80 hours. Extended use of
cycles.
this pin at 9 V may reduce block cycling capabili ty.
. Block erase and program at invalid VPP voltages
PPLK
can be as low as V
PP
Device Core Power Supply: Core (logic) source voltage. Writes to the flash array are inhibited when
≤ V
V
CC
. Operations at invalid VCC voltages should not be attempted.
Table 3. TSOP and Easy BGA Signal Descriptions (Sheet 2 of 2)
SymbolTypeName and Function
VCCQPowerOutput Power Supply: Output-driver source voltage.
VSSPowerGround: Con nect to system ground. Do not float any VSS connection.
RFU—
DU—Do Not Use: Do not connect to any other signal, or power supply; must be left floating.
NC—No Connect: No internal connection; can be driven or floated.
Reserved for Fu ture Use: Reserve d by In tel f or fu ture de vice f uncti onali ty and enh ancemen t. T hese
should be treated in the same way as a Do Not Use (DU) signal.
Table 4. QUAD+ SCSP Signal Descriptions (Sheet 1 of 2)
512-Mbit: A[24:0].
See Table 6 on page 22, Figure 11 on page23, and Figure 12 on page 23 for 512-Mbit and 1-Gbit
addressing.
DA TA INPUT/OUTPUTS: Inputs data and command s dur in g w rit e cy c le s ; ou tp uts data dur i n g
memory, Status Register, Protection Register, and Read Configuration Register reads. Data balls
float when the CE# or OE# are deasserted. Data is internally latched during writes.
ADDRESS VALID: Active low input. During synchronous re ad operations, addresses are latched on
the rising edge of ADV#, or on the next valid CLK edge wit h AD V# low, whichever occurs first.
In asynchronous mode, the address is latched when ADV# going high or continuously flows through
if ADV# is held lo w.
WARNING: Designs not using ADV# must tie it to VSS to allow addresses to flow through.
FLASH CHIP ENABLE: Active low input . CE# low selects the associated flash memory die. When
asserted, flash internal control logic, input buffers, decod ers, and sense amplifiers are active. When
deasserted, the associated flash die is deselected , power is reduced to standby levels, data and
WAIT outputs are placed in high-Z state.
See Table 6 on page 22 for CE# assignment definitions.
WARNING: All chip enables must be high when device is not in use.
CLOCK: Synchronizes the device with the system’s bus frequency in synchronous-read mode.
During synchronous read operations, addresses are latched on the rising edge of ADV#, or on t he
next valid CLK edge with ADV# low, whichever occurs first.
WARNING: Designs not using CLK for synchronous read mode must tie it to VCCQ or VSS.
OUTPUT ENABLE: Active low input. OE# low enables the device’s output data buffers during read
cycles. OE# high places the data outpu ts and WAIT in High-Z.
F1-OE# and F2-OE # should be tied together for all densities.
RESET: Active low input. RS T# resets internal automation and inhibits write operations. This
provides data protection during power transitions. RST# high enables normal operation. Exit from
reset places th e device in asynchronous read array mode.
WAIT: Indicates data valid in synchronous array or non-ar ray burst reads. Read C onfiguration
Register bit 10 (RCR[10], WT) determines its po larity when asserted. WAIT’s active output is V
when CE# and OE# are VIL. WAIT is high-Z if CE # or O E# is VIH.
V
OH
• In synchronous array or non-array read modes, WAIT indicates inva lid data when asserted and
valid data when deasserted.
• In asynchronous page mode, and all w rite modes, WAI T is deasserted.
WRITE ENABLE: Active low in put. WE# controls writes to the device. Address and data are latched
on the rising edg e of WE#.
Table 4. QUAD+ SCSP Signal Descriptions (Sheet 2 of 2)
SymbolTypeName and Func tio n
WP#Input
VPP
Power/
lnput
VCCPower
VCCQPowerOutput Power Supply: Output-driver source voltage.
VSSPower Ground: Connect to system ground. Do not float any VSS connection.
RFU—
DU—Do Not Use: Do not connect to any other signal, or power supply; must be left floating.
NC—No Connect: No internal connection; can be driven or floated.
WRITE PROTECT: Active low input. WP# low enables the lock-down mechanism. Blocks in lockdown cannot be unlocked with the Unlock command. WP# high overrides the lock-down function
enabling blocks to be erased or programmed using software commands.
Erase and Progr am Power: A valid voltage on this pin all ows erasing or progr amming. Memory
level of V
IH
PP
≤ V
contents cannot be altered when V
should not be attempted.
= VCC for in-system prog r am and er ase oper at ions. To accommodate resist or o r di ode dr op s
Set V
PP
from the syste m supply, the V
min to perform in-system flash modif ication. VPP may be 0 V during read operations.
can be applied to main blocks for 1000 cy cles maximum and to par ameter blocks for 2500
V
PPH
VPP can be connected to 9 V for a cumulative total not to ex ceed 80 hours. Extended use of
cycles.
this pin at 9 V may reduce block cycling capabili ty.
. Block erase and program at invalid VPP voltages
PPLK
can be as low as V
PP
min. VPP must remain abov e V
PPL
Device Core Power Supply: Core (logic) source voltage. Writes to the flash array are inhibited when
≤ V
V
CC
. Operations at invalid VCC voltages should not be attempted.
LKO
Reserved for Future Use: Reserved by Intel for fut ure devi ce fun ctional ity a nd enha ncement. These
should be treated in the same way as a Do Not Use (DU) signa l.
PPL
4.3SCSP Configurations
Table 5. Stacked Easy BGA Chip Select Logic
Stack Combination
1-dieF1-CE#2-dieF1-CE# + A25 (V
Table 6. QUAD+ SCSP Chip Select Logic
Stack
Combination
1-dieF1-CE#--2-dieF1-CE# + A24 (V
4-dieF1-CE# + A24 (V
Warning:Stressing the device beyond the “Absolute Maximum Ratings” may cause permanent damage.
These are stress ratings only.
ParameterMaximum RatingNotes
Temperat ur e under bias–40 °C to +85 °C1
Storage temperatur e–65 °C to +125 °C
Voltage on any signal (except VCC, VPP)–0.5 V to +4.1 V2
VPP voltage–0.2 V to +10 V2,3,4
VCC voltage–0.2 V to +2.5 V2
VCCQ voltage–0.2 V to +4.1 V2
Output short circuit current100 mA5
Notes:
1.Temperature for 1-Gbit SCSP is –30 °C to +85 °C.
2.Voltages shown are specifie d with respect to V
signals and –0.2V on V
periods < 20 ns. Maximum DC voltage on V
overshoot to V
+ 0.5V, which, during transitions, may overshoot to V
is V
3.Maximum DC voltage on V
4.Program/erase voltage is typically 1.7 V – 2.0 V. 9.0 V can be applied for 80 hours maximum total, to
5.Output shorted for no mor e than one second. No more than one output shorted at a time.
CCQ
any blocks for 1000 cycles maximum. 9.0 V program/erase voltage may reduce block cycling
capability.
+ 2.0 V for periods < 20 ns. Maximum DC voltage on input/output signals and V
CC
, V
CC
, and VPP. During transitions, this level may undershoot to –2.0 V for