HY51V(S)18163HG/HGL
1M x 16Bit EDO DRAM
This document is a general product description and is subject to change without notice. Hyundai Electronics does not assume any
responsibility for use of circuits described. No patent licenses are implied.
Rev.0.1/Apr.01
DESCRIPTION
FEATURES
• Fast access time and cycle time
ORDERING INFORMATION
Part No tRAC tCAC tRC tHPC
HY51V(S)18163HG/HGL-5 50ns 13ns 84ns 20ns
HY51V(S)18163HG/HGL-6 60ns 15ns 104ns 25ns
HY51V(S)18163HG/HGL-7 70ns 18ns 124ns 30ns
50ns 60ns 70ns
Active 684mW 612mW 540mW
Standby
7.2mW(CMOS level Max)
0.83mW (L-version : Max)
Part Number Access Time Package
HY51V(S)18163HGJ/HG(L)J-5
HY51V(S)18163HGJ/HG(L)J-6
HY51V(S)18163HGJ/HG(L)J-7
50ns
60ns
70ns
400mil 42pin SOJ
HY51V(S)18163HGT/HG(L)T-5
HY51V(S)18163HGT/HG(L)T-6
HY51V(S)18163HGT/HG(L)T-7
50ns
60ns
70ns
400mil 44(50)pin TSOP-II
PRELIMINARY
The HY51V(S)18163HG/HGL is the new generation dynamic RAM organized 1,048,576 words x 16bit.
HY51V(S)18163HG/HGL has realized higher density, higher performance and various functions by utilizing advanced CMOS process technology. The HY51V(S)18163HG/HGL offers Extended Data Out PageMode as a high speed access mode. Multiplexed address inputs permit the HY51V(S)18163HG/HGL to be
packaged in standard 400mil 42pin SOJ and 44(50) pin TSOP-II. The package size provides high system
bit densities and is compatible with widely available automated testing and insertion equipment.
• Extended Data Out Mode capability
• Read-modify-write capability
• Multi-bit parallel test capability
• TTL(3.3V) compatible inputs and outputs
• /RAS only, CAS-before-/RAS, Hidden and self
refresh(L-version) capability
• JEDEC standard pinout
• 42pin plastic SOJ / 44(50)pin TSOP-II (400mil)
• Single power supply of 3.3V +/- 0.3V
• Battery back up operation(L-version)
• 2CAS byte control
• Power dissipation
• Refresh cycle
Part No Ref Normal L-part
HY51V18163HG 1K 16ms
HY51V18163HGL 1K 128ms
(S) : Self refresh, (L) : Low power