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Agilent TS-5000 Functional Test System

System Software User’s Guide

Agilent Technologies

Notices

Caution

WARNING

No part of this manual may be reproduced in any form or by any means (including electronic storage and retrieval or translation into a foreign language) without prior agreement and written consent from Agilent Technologies, Inc. as governed by United States and international copyright laws.

Documentation History

All Editions and Updates of this manual and their creation date are listed below. The first Edition of the manual is Edition 1. The Edition number increments by 1 whenever the manual is revised. Updates, which are issued between Editions, contain replacement pages to correct or add additional information to the current Edition of the manual. Whenever a new Edition is created, it will contain all of the Update information for the previous Edition. Each new Edition or Update also includes a revised copy of this documentation history page.

Edition 1 (E8770-90000) July 1999

Edition 2 (E8770-90023) September 2000

Edition 3 (E8770-90033) January 2004

Edition 4 (E8770-90033) January 2006

Edition 4 (E8770-90033) April 2010

Edition 5 (E8770-90033) May 2011

Edition 6 (E8770-90033) August 2011

Edition 7 (E8770-90033) December 2012

Manual Part Number

E8770-90033

Printed in Malaysia

Agilent Technologies Microwave Products (Malaysia) Sdn. Bhd. Bayan Lepas Free Industrial Zone 11900 Penang, Malaysia

Warranty

The material contained in this document is provided “as is,” and is subject to being changed, without notice, in future editions. Further, to the maximum extent permitted by applicable law, Agilent disclaims all warranties, either express or implied, with regard to this manual and any information contained herein, including but not limited to the implied warranties of merchantability and fitness for a particular purpose. Agilent shall not be liable for errors or for incidental or consequential damages in connection with the furnishing, use, or performance of this document or of any information contained herein. Should Agilent and the user have a separate written agreement with warranty terms covering the material in this document that conflict with these terms, the warranty terms in the separate agreement shall control.

Technology Licenses

The hardware and/or software described in this document are furnished under a license and may be used or copied only in accordance with the terms of such license.

Restricted Rights Legend

If software is for use in the performance of a U.S. Government prime contract or subcontract, Software is delivered and licensed as “Commercial computer software” as defined in DFAR 252.227-7014 (June 1995), or as a “commercial item” as defined in FAR 2.101(a) or as “Restricted computer software” as defined in FAR

52.227-19 (June 1987) or any equivalent agency regulation or contract clause. Use,

duplication or disclosure of Software is subject to Agilent Technologies’ standard commercial license terms, and non-DOD Departments and Agencies of the U.S. Government will receive no greater than Restricted Rights as defined in FAR

52.227-19(c)(1-2) (June 1987). U.S. Government users will receive no greater than Limited Rights as defined in FAR 52.227-14 (June 1987) or DFAR 252.227-7015 (b)(2) (November 1995), as applicable in any technical data.

Safety Notices

A Caution notice denotes a hazard. It calls attention to an operating procedure, practice, or the like that, if not correctly performed or adhered to, could result in damage to the product or loss of important data. Do not proceed beyond a Caution notice until the indicated conditions are fully understood and met.

A WARNING notice denotes a hazard. It calls attention to an operating procedure, practice, or the like that, if not correctly performed or adhered to, could result in personal injury or death. Do not proceed beyond a WARNING notice until the indicated conditions are fully understood and met.

Safety Summary

WARNING

The following general safety precautions must be observed during all phases of operation of this system. Failure to comply with these precautions or with specific warnings elsewhere in this manual violates safety standards of design, manufacture, and intended use of the system. Agilent Technologies, Inc. assumes no liability for the customer's failure to comply with these requirements.

General

This product is provided with a protective earth terminal. The protective features of this product may be impaired if it is used in a manner not specified in the operation instructions.

Cleaning Instructions

Clean the system cabinet using a soft cloth dampened in water.

DO NOT REMOVE ANY SYSTEM COVER Operating personnel must not remove system covers. Component replacement and internal adjustments must be made only by qualified service personnel. Equipment that appears damaged or defective should be made inoperative and secured against unintended operation until they can be repaired by qualified service personnel.

Environmental Conditions

DO NOT OPERATE IN AN EXPLOSIVE ATMOSPHERE Do not operate the system in the presence of flammable gases or flames.

If the equipment in this system is used in a manner not specified by Agilent Technologies, the protection provided by the equipment may be impaired.

Unless otherwise noted in the specifications, this system is intended for indoor use in an installation category II, pollution degree 2 environment. It is designed to operate at a maximum relative humidity of 80% and at altitudes of up to 2000 meters. Refer to the specifications tables for the ac mains voltage requirements and ambient operating temperature range.

Before applying power

Verify that all safety precautions are taken. Note the external markings described in

“Safety Symbols and Regulatory Markings”on

page 4.

Safety and Support Information 3

Ground the System

WARNING

To minimize shock hazard, the instrument chassis and cover must be connected to an electrical protective earth ground. The instrument must be connected to the ac power mains through a grounded power cable, with the ground wire firmly connected to an electrical ground (safety ground) at the power outlet. Any interruption of the protective (grounding) conductor or disconnection of the protective earth terminal will cause a potential shock hazard that could result in personal injury.

The power cable ground wire must be connected to an electrical ground (safety ground) at the power outlet. Any interruption of the protective grounding will cause a potential shock hazard that could result in personal injury.

Fuses

Use only fuses with the required rated current, voltage, and specified type (normal blow, time delay). Do not use repaired fuses or short- circuited fuse holders. To do so could cause a shock or fire hazard.

CANNOT BE OPERATOR ACCESSIBLE: Cables and

connectors are considered inaccessible if a tool (e.g., screwdriver, wrench, socket, etc.) or a key (equipment in a locked cabinet) is required to gain access to them. Additionally, the operator cannot have access to a conductive surface connected to any cable conductor (High, Low or Guard).

ASSURE THE EQUIPMENT UNDER TEST HAS ADEQUATE INSULATION BETWEEN THE CABLE CONNECTIONS AND ANY OPERATOR- ACCESSIBLE PARTS (DOORS, COVERS, PANELS, SHIELDS, CASES, CABINETS, ETC.): Ve r i fy

there are multiple and sufficient protective means (rated for the voltages you are applying) to assure the operator will NOT come into contact with any energized conductor even if one of the protective means fails to work as intended. For example, the inner side of a case, cabinet, door, cover or panel can be covered with an insulating material as well as routing the test cables to the module’s front panel connectors through non- conductive, flexible conduit such as that used in electrical power distribution.

Operator Safety Information

MODULE CONNECTORS AND TEST SIGNAL CABLES CONNECTED TO THEM

4 Safety and Support Information

Safety Symbols and Regulatory Markings

Symbols and markings on the system, in manuals and on instruments alert you to

potential risks, provide information about conditions, and comply with international

Tab l e 1 Safety Symbols and Markings

Warning: risk of electric shock.

Caution: refer to accompanying documents.

Alternating current.

Both direct and alternating current.

Earth (ground) terminal

Protective earth (ground) terminal

Frame or chassis terminal

regulations. Table 1 and

Table 2 define the symbols and

markings you may encounter.

Terminal is at earth potential. Used for measurement and control circuits designed to be operated with one terminal at earth potential.

Switch setting indicator. O = Off, | = On.

Standby (supply); units with this symbol are not completely disconnected from ac mains when this switch is off. To completely disconnect the unit from ac mains, either disconnect the power cord, or have a qualified electrician install an external switch.

Tab l e 2 Regulatory Symbols Markings

The CE mark is a registered trademark of the European Community.

The CSA mark is a registered trademark of the Canadian Standards Association.

The C-tick mark is a registered trademark of the Spectrum Management Agency of Australia. This signifies compliance with the Australian EMC Framework regulations under the terms of the Radio Communications Act of 1992.

ISM 1-A This text indicates that the product is an Industrial Scientific and

Medical Group 1 Class A product (CISPR 11, Clause 4).

Safety and Support Information 5

Service and Support

Tab l e 2 Regulatory Symbols Markings

This product complies with the WEEE Directive (2002/96/EC) marking requirement. The affixed product label (see above) indicates that you must not discard this electrical/electronic product in domestic household waste.

Product Category: With reference to the equipment types in the WEEE directive Annex 1, this product is classified as a “Monitoring and Control instrumentation” product.

Do not dispose in domestic household waste

To return unwanted products, contact your local Agilent office, or see http://www.agilent.com/environment/product for more information.

Any adjustment, maintenance, or repair of this product must be performed by qualified personnel. Contact your customer engineer through your local Agilent Technologies Service Center.

http://www.agilent.com

Click the link to Te s t & Measurement. Select your

country from the drop- down menus. The Web page that appears next has contact information specific for your country.

Agilent on the Web

You can find information about technical and professional services, product support, and equipment repair and service on the Web:

Tab l e 3 Agilent Call Centers and Regional Headquarters

United States: Test and Measurement Call Center

(800) 829 4444(toll-free in US)

Canada: (877) 894 4414

Agilent by Phone

If you do not have access to the Internet, call one of the numbers in Table 3.

Europe: (41 22) 780 8111

Japan: Measurement Assistance Center

Latin America: 305 269 7500

Asia-Pacific: (85 22) 599 7777

6 Safety and Support Information

0120 (421) 345

Chapter 1

System Software Overview ........................................................................................... 9

Agilent TestExec SL..................................................................................................... 9

Testplans ..................................................................................................................... 10

Testgroup ............................................................................................................. 10

List of Statements ................................................................................................ 10

Test ...................................................................................................................... 10

Switching Action ................................................................................................. 10

Action .................................................................................................................. 10

Actions ........................................................................................................................ 11

System.ust File............................................................................................................ 11

Aliases ................................................................................................................. 12

Wires ................................................................................................................... 12

Modules ............................................................................................................... 12

System Configuration Editor ...................................................................................... 14

Chapter 2

How to Use the System Software ................................................................................ 15

Chapter Contents......................................................................................................... 15

Required Computer Hardware and Software..............................................................15

System Software Description...................................................................................... 16

Selecting Agilent TestExec SL ................................................................................... 17

Loading a Testplan...................................................................................................... 17

Creating a Testplan ..................................................................................................... 18

Using TS-5000 Supplied Actions ............................................................................... 19

Standard Action Types ........................................................................................ 20

Example Testplans .............................................................................................. 20

Adding an Action to a Testplan ........................................................................... 20

Using Software Debug Features ................................................................................. 23

Looping ............................................................................................................... 23

Single Stepping ................................................................................................... 24

Action Debug Messages ...................................................................................... 25

Watch Window .................................................................................................... 25

Instrument Debug Front Panels ........................................................................... 28

Fast Connection Selection ................................................................................... 40

Viewing Waveforms ........................................................................................... 45

Instrument Handlers.................................................................................................... 48

Using the Action Wizard To Develop ........................................................................ 49

Multithreading ............................................................................................................ 50

How Multithreading is working on a Testplan? .................................................50

Opening System Configuration Editor ....................................................................... 56

Adding an IVI-COM Module in System Configuration Editor.................................. 57

Contents 7

Adding a .Net Module in System Configuration Editor ............................................. 59

Chapter 3

Using the DMM and ARB ........................................................................................... 61

Chapter Contents......................................................................................................... 61

Triggered Voltage Measurement ................................................................................ 62

How to Trigger the DMM ................................................................................... 62

Using the Agilent E6173A Arbitrary Waveform Generator....................................... 65

Arbitrary Waveform Generator Description ....................................................... 65

How the Arb Generates Waveforms ................................................................... 65

Generating Arb Waveforms ................................................................................ 66

Memory Requirements for Downloading Waveforms ........................................ 86

Agilent E6173A Arbitrary Waveform Generator Error Messages ...................... 86

Chapter 4

Action Summary .......................................................................................................... 87

Index .............................................................................................................................. 177

8 Contents

This chapter contains a detailed overview of the system software. Chapter contents are:

Agilent TestExec SL

The Agilent TS-5000 System uses Agilent TestExec SL and system specific software to test the Unit Under Test (UUT). Agilent TestExec SL is a test executive designed for high-volume, high-throughput functional test applications. The other system specific software provides the communications between the test executive and system instruments.

Chapter 1

System Software Overview

• Agilent TestExec SL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . page 9

• Testplans . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . page 10

• Actions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . page 11

• System.ust File . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . page 11

• System Configuration Editor . . . . . . . . . . . . . . . . . . . . . . . . page 14

Agilent TestExec SL uses testplans (see “Testplans”) and actions (see “Actions”) to perform the tests. The actions are the building blocks from which the tests are created. The actions are called from a test which are executed in a testplan. The switching actions makes the connections from the system instruments, and/or loads on the load cards to the Unit Under Test (UUT). The switching actions are built into Agilent TestExec SL.

Both actions and switching actions are used in a testplan to run the tests. The testplan automatically closes the appropriate pin matrix and load card switches to make the connections, setup and execute the appropriate sources and detectors, and return any test results.

The switching information and the instrument types used in the system are located in the system.ust file (see information). This file is generated at the factory and is custom for each system. It has the necessary information for the switching actions to close the appropriate switches and for the other actions to communicate with the system instruments. Instrument data in the system.ust file can be generated and/or modified using the System Configuration Editor (see Configuration Editor” on page 14).

“System.ust File” on page 11 for more

“System

System Software Overview 9Chapter 1

Testplans

Start of

Program

Test

End of Testgroup

Testgroup

Statement

Switching Action

Action

Te s t N a m e

Test Description

(required if using a “Testgroup”)

Figure 1-1 shows a testplan and some of its components; an explanation follows the figure (see Loading a Testplan for an explanation on how to load a testplan).

Figure 1-1. Typical Testplan Components

Testgroup A named block of tests that can be executed in a predefined order. Each

testgroup in a testplan must have a unique name; no duplicate names are allowed.

List of Statements Test or flow control statements executed in the order shown.

Test A named series of actions that can be executed as a group. A test can contain

actions and switching actions. A test can have limit checking capabilities to determine if a test passes or fails. A test must have a unique name; no duplicate names are allowed.

Switching Action Actions that make connections from the instrument and loads to the Unit

Under Test. These actions are internal to Agilent TestExec SL. The switching information in these actions are determined by the data in the 'system.ust' file and the user-generated fixture.ust and uut.ust files.

Action The smallest component in a test or testgroup that can be called to perform

functions such as setting up an instrument, making measurements and prompting the user.

10 System Software Overview Chapter 1

Actions

The system comes with a set of supplied actions. These actions are used for such things as configuring instruments, making measurements and prompting users for inputs. You can also generate custom actions using the Action Wizard and an application program such as Visual C/C++.

The action directory path is:

C:\Program Files\Agilent\TS-5000 System Software\actions

Actions are located in the following sub-directories:

Sub-Directory Action Type

arb Arbitrary Waveform Generator Actions

counter Counter Actions

dac D/A Converter Actions

dgn Diagnostics Actions

digitizer Digitizer Actions

dio Digital I/O Actions

dmm Digital Multimeter Actions

dso Digital Storage Oscilloscope

event Event Detector Actions

generic Miscellaneous Actions

mcm Measurement Control Module Actions

power Power Supply Actions

serial Serial Interface Actions

SerialProtocol Automotive Serial Protocol Actions

switch SLU and Switching Actions

vi Voltage / Current Source Actions

daq Data Acquisition Actions

esa Spectrum Analyzer Actions

esg Signal Generator Actions

System.ust File

The 'system.ust' file is created at the factory with the appropriate module/instrument and wiring data according to the system option. The file can be edited using the System Configuration Editor (see

System Software Overview 11Chapter 1

“System

Configuration Editor” on page 14) or the Topology Editor in Agilent

Alias Name

Alias Description

Reference Node

TestExec SL.

The data in the 'system.ust' file consists of modules/instruments and instrument nodes (i.e., connections at the 32-Pin Matrix and Instrument Multiplexer Module), and other nodes (connections at the 32-Pin Matrix Modules and load cards) using the Aliases, Wires, and Modules designations. The Module designations are used to determine the modules/instruments installed in the system, and the Aliases and Wires are used to generate switch paths.

A typical 'system.ust' file contains Aliases, Wires and Modules.

Aliases These are alternate names for reference nodes. The names are descriptive in

nature to easily identify the node. For example, the node name for the high current output of the Agilent 34401 or E1411 Digital Multimeter is called "IsrcHi".

Figure 1-2 shows typical Aliases in the 'system.ust' file.

Wires These are names for wires that connect to or between nodes. In some cases,

these names are the same aliases used for nodes. For example, the alias called "DVMIsrcHi" is often used for the wire name that connects to that

Figure 1-3 shows typical wires in the 'system.ust' file.

node.

Modules These are the names of the instruments in the system. For example, the name

"MCM" indicates that there is an Agilent E6171B Measurement control module in the system. The 'system.ust' file.

Figure 1-2. Typical Aliases

Figure 1-4 shows a few typical modules in the

12 System Software Overview Chapter 1

Figure 1-3. Typical Wires

Wire Name

Wire Description

Reference Node

Module Name

Module Description

Module Related Data

Figure 1-4. Typical Modules/Instruments

System Software Overview 13Chapter 1

System Configuration Editor

This editor can be used to add new modules/instruments or delete old modules/instruments to/from the system.ust file (see page 11 for information). It can add/delete any supported GPIB or VXI instruments, Pin Matrix Modules, and/or load cards.

The editor has the following functions:

• Shows all supported modules/instruments.

• Automatically detects all modules/instruments currently in the system

• Able to add new custom modules/instruments to the system.ust file

• Able to edit module/instrument parameters

Any of the supported and custom modules/instruments can be added to the system.ust file. Dependent on the system type and option (e.g., Test System Interface vs. Mass Interconnect), the System Configuration Editor automatically generates the appropriate wires and aliases (see File” on page 11 for information). The wiring, etc. data is located in a spreadsheet that is specifically generated for your system type and option.

The System Configuration Editor is available from the TestExec SL Toolbar or from a shortcut in the Desktop on the system PC controller. Refer to the System Configuration Editor’s online help for more details.

“System.ust File” on

“System.ust

14 System Software Overview Chapter 1

How to Use the System Software

Chapter Contents

Chapter 2

This chapter lists the needed software to run the system and shows some system specific software operation. The chapter is separated as follows:

• Required Computer Hardware and Software . . . . . . . . . . . . page 15

• System Software Description . . . . . . . . . . . . . . . . . . . . . . . . page 16

• Selecting Agilent TestExec SL . . . . . . . . . . . . . . . . . . . . . . . page 17

• Loading a Testplan . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . page 17

• Creating a Testplan . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . page 18

• Using TS-5000 Supplied Actions . . . . . . . . . . . . . . . . . . . . . page 19

• Using Software Debug Features . . . . . . . . . . . . . . . . . . . . . . page 23

• Instrument Handlers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . page 48

• Using the Action Wizard To Develop. . . . . . . . . . . . . . . . . . page 49

• Multithreading. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . page 50

Required Computer Hardware and Software

The following is a list of the computer hardware and software needed to run the Agilent TS-5000 Test System. All necessary software was factory installed on your system:

• IBM-compatible PC (at least a Pentium) with 256 MB of RAM,

1024x768 graphics, 100 MB of free disk space (20 MB for Agilent TestExec SL software).

• Microsoft

• Agilent TestExec SL software, Version 5.1 or later.

• Agilent TS-5000 Software version 5.1 or later.

Note For more detailed information about using the Agilent TestExec SL

software, refer to the software documentation

Windows® XP or 7 Microsoft® Windows® 64-Bit

How to Use the System Software 15Chapter 2

System Software Description

The Agilent TS-5000 System uses Agilent TestExec SL and system specific software to test the Unit Under Test. Agilent TestExec SL is a test executive designed for high-volume, high-throughput functional test applications. The other system specific software provides the communications between the test executive and system instruments.

Agilent TestExec SL uses testplans and actions to perform the tests. The actions are the building blocks from which the tests are created. The actions are called from a test which are executed in a testplan. The switching actions makes the connections from the system instruments, and/or loads on the load cards to the Unit Under Test. The switching actions are built into Agilent TestExec SL.

The switching information and the instrument types used in the system are located in the custom for each system. It has the necessary information for the switching actions to close the appropriate switches and for the other actions to communicate with the system instruments. Instrument data in the

system.ust file can be generated and/or modified using the System

Configuration Editor (see “TS-5000 System Integrator’s Manual”

system.ust file. This file is generated at the factory and is

“Using the System Configuration Editor” in the

16 How to Use the System Software Chapter 2

Selecting Agilent TestExec SL

3. Double Click on File Name or Select File Name and click on “Open”

1. Select “File” menu

2. Select “Open” Menu Item or press “Ctrl+O” buttons

The Agilent TestExec SL software is pre-installed on your PC controller’s hard drive. Start TestExec SL from this icon in the PC desktop:

You can also run TestExec SL by clicking:

Start | Programs | Agilent TestExec SL 7.0 | TestExec SL 7.0

Loading a Testplan

Figure 2-1. Agilent TestExec SL Main Screen and File Open Box

How to Use the System Software 17Chapter 2

Creating a Testplan

1. Click on “File” menu

2. Click on “New” menu item

3. Click on “Testplan” 4. Click on “OK”

5. Click on “Insert” menu

6. Click on one of the following: Test - inserts a new test Test Group - inserts a new testgroup Saved Test - inserts a test from a previously saved test library Other Statements - inserts a program statement

7A. Click to insert action

7B. Click to insert switching action

Figure 2-2 shows how to create a testplan.

Figure 2-2. Creating a Testplan

18 How to Use the System Software Chapter 2

Using TS-5000 Supplied Actions

The Agilent TS-5000 System with a set of standard actions supplied with the system. The action directory path is:

C:\Program Files\Agilent\TS-5000 System Software\actions

Actions are located in the following sub-directories:

Sub-Directory Action Type

arb Arbitrary Waveform Generator Actions

counter Counter Actions

dac D/A Converter Actions

dgn Diagnostics Actions

digitizer Digitizer Actions

dio Digital I/O Actions

dmm Digital Multimeter Actions

dso Digital Storage Oscilloscope Actions

event Event Detector Actions

generic Miscellaneous Actions

mcm Measurement Control Module Actions

power Power Supply Actions

serial Serial Interface Actions

SerialProtocol Automotive Serial Protocol Actions

switch SLU and Switching Actions

vi Voltage / Current Source Actions

daq Data Acquisition Actions

esa Spectrum Analyzer Actions

esg Signal Generator Actions

Note The actions are summarized in Chapter 4 of this manual. The actions are

documented in detail in the TS-5000 online help which is available from the TestExec SL Help menu.

How to Use the System Software 19Chapter 2

Standard Action

Types

The standard actions are generally organized around a specific instrument or module in the system. The actions are also separated into the types discussed below.

High-Level Actions These are actions that usually perform complete tests, such as setting up a

source and then making a measurement. These actions normally, but not always, use one or more of the Low-Level Actions.

Low-Level Actions These actions perform specific configuration or measurement function on a

particular instrument. The low-level actions give you more flexibility in configuring instruments and making the measurements than do the high-level actions. Low-Level actions are organized by instrument type and function. For example, an action that is to set up triggering for a voltmeter is a low-level action.

Example Testplans Example testplans to show how to use the actions are in the following

directory:

C:\Program Files\Agilent\TS-5000 System Software\testplan\examples

Adding an Action to

a Testplan

Do the following:

1. Open Agilent TestExec SL using the procedure in “Selecting Agilent TestExe c SL” on page 17.

2. Either create a new or open an old testplan, using the procedure in “Loading a Testplan” on page 17 or “Creating a Testplan” on page 18, respectively.

3. If using a new testplan, do the procedure in Figure 2-2 on page 18 to add a test. If using an old testplan, select the test into which you wish to add an action and continue with step 4.

4. Add an action to the test, as shown in Figure 2-3 and Figure 2-4.

There are two different actions that can be added, a regular action and a switching action. Figure 2-4 shows how to add a switching action.

Figure 2-3 shows how to add a regular action and

20 How to Use the System Software Chapter 2

1. Select the place to add the action

2. Click on “Insert”

3. Either click on “Step-by-Step Search” or “Quick Search” (“Quick Search” shows all actions in a column)

4. Select the action

5. Click on “OK” to

click on “Apply” to

Click on “Cancel” to close Click on “Detail” to open

add the action and close the window

add the action, but keep window open to add more actions

window without adding action Action Definition Editor

Figure 2-3. Adding an Action

How to Use the System Software 21Chapter 2

6. Select the place to add the switching action

8. Click on the “Value” field to view button with the three dots (. . .)

7. Click on “Insert Switching”

9. Click on the three dots

10. Click on arrow to view “Node Names”, then click on name to select it

11. Click on “OK” to

12. Repeat steps

select the node; use the same procedure for the “Ends At” nodes

8 to 11 to add other nodes

Figure 2-4. Adding a Switching Action

22 How to Use the System Software Chapter 2

Using Software Debug Features

1. Click on “Insert” Menu

2. Click on “Other Statements” menu item

3. Click on looping or other statement

4. Statement has been added; make any necessary changes

This section describes specific software features, unique to the Agilent TestExec debugging your tests and testplans. To enable Agilent TestExec procedure in

Looping The loop constructs are FOR / NEXT sequencer statements. For example, a

testplan developer would stop a testplan (if one is running), add

NEXT lines to the testplan and then restart the testplan from the beginning.

Refer to the Agilent TestExec SL documentation for additional information.

Figure 2-5 shows how to select and insert the looping statements into a testplan.

SL version 2.0 and later, that you will find helpful in creating and

“Selecting Agilent TestExec SL” on page 17, if not enabled.

SL, use the

FOR and

Figure 2-5. Selecting Looping and Other Statements

How to Use the System Software 23Chapter 2

Single Stepping Agilent TestExec SL adds the ability to single step the execution of the

1. Click on “Debug” menu.

2. Click on “Set Action Step” menu item

3. Foot symbol indicates that this step is to be paused

4. Click here to advance the test

Click on “Debug” and “Step Test” to advance the test

operations that make up a test. When stepping through the actions of a test, the system pauses at entry point calls for each action routine. Action stepping can be performed any time testplan execution is paused (as a result of operator pause or test breakpoint). The action step which is currently paused is listed in the trace window. Refer to the Agilent TestExec SL documentation for additional information.

Figure 2-6 shows how to select the single stepping

Figure 2-6. Selecting Action Stepping

24 How to Use the System Software Chapter 2

Action Debug

1. Click on “Insert” Menu.

2. Click on “Instrument”

menu item (or a different item, if so desired)

Messages

Agilent TestExec SL allows action routines to send strings to the same debug window that the system uses for the test trace output. Use the following API:

• UtaTrace (MessageString, MessageID)

-- MessageString is a string that will be sent to the trace window.

-- MessageID is an optional string that allows the messages to be group (as identified by MessageID). Note: currently, this parameter does not provide any functionality.

Watch Window Watch windows provide the ability to select ‘objects’ to dynamically

monitor as a testplan executes. Select an item to watch from a list, the item is added to the watch window list and is updated each time the testplan pauses. Items can be added or deleted at any time (as long as the testplan is not running).

The watch window can monitor 4 types of objects:

• Instruments

• Switching Node

• All Switching Nodes

• Symbols

Watch Window Menu

Selections

The following shows some typical example of the window.

Watch Window Menu Selections shows how to select one of the four Watch Window objects. The object to be selected, as shown in the figure, is the ‘instrument’ object. (The selection of the other objects is the same.)

Figure 2-7. Watch Window Menu Selections

How to Use the System Software 25Chapter 2

Watch Window

1. Click on the “dmm”, or a different, instrument to be watched

2. Click “OK” to enable the Watch Window

Instrument Status

Watch windows are available for many of the instruments in an Agilent TS-5000 system. The instruments that can be monitored are:

• Agilent E1328A or E1418A Digital to Analog Converter Module

(DAC)

• Agilent E1333A Counter Module

• Agilent E1411 Digit Multimeter Module (DMM)

• VXI Technology E1563A Analog to Digital Converter Module (ADC)

• Agilent E6171B Measurement Control Module (MCM)

• Agilent E6174A 32-Channel Event Detector Module

• Agilent 6642A, 6643A, 6652A, 6653A, 6673A Power Supplies

The displayed instrument states match the parameters of the instrument handler routines. For example the Agilent E1411 Digital Multimeter has the following routines which affect the state of the module:

• dmmConfFunction (dmm, Func, Range, Aperture);

• dmmConfCal (dmm, Linefreq, Autozero);

• dmmConfTrigIn (dmm, Trigselect, Trigcount, Delay);

• dmmConfSample (dmm, Sampsrc, Count, Period);

Figure 2-8 shows the menu box to select the instrument to be watched. The figure shows how to select the Digital Multimeter (dmm).

To add an instrument to the Watch Window, select the instrument type and press “OK”, as shown in as shown in Figure 2-9.

Figure 2-9 also shows the expanded tree view that shows the status of the ‘dmm’ parameters. The instruments display their state in a tree view. This allows a logical grouping of states and reduces the amount of data displayed by placing less important states in lower levels of the tree.

Figure 2-8. The Watch Window is then displayed,

Figure 2-8. Selecting an Instrument to be Watched

26 How to Use the System Software Chapter 2

Shows that the “dmm” is watched

Click here to see the expanded view of the parameters (see below)

This is an expanded view of the dmm (Agilent E1411 Digital Multimeter) parameters

Figure 2-9. Agilent E1411B Digital Multimeter Watch Window with

Parameters

How to Use the System Software 27Chapter 2

Instrument Debug

Front Panels

Agilent TestExec SL provides a series of debug instrument front panels for the Agilent TS-5000 system instruments. The debug panels provide two main features:

• The ability to interactively view the current Unit Under test (UUT)

state

• The ability to interactively view the current state of points within the

system.

Debug Panel Types The following debug panels are supplied with the system, dependent on the

modules/instrument currently installed in the system.

• Agilent E1411B Digital Multimeter . . . . . . . . . . . . . . . . . . . page 30

• Agilent E1328A & E1418A Digital to Analog Converter . . page 32

• Agilent E1333A Counter . . . . . . . . . . . . . . . . . . . . . . . . . . . page 33

• VXI Technology E1563A Digitizer . . . . . . . . . . . . . . . . . . . page 35

• Agilent E6171B Measurement Control Module . . . . . . . . . . page 36

• Agilent E6174A Event Detector . . . . . . . . . . . . . . . . . . . . . . page 37

• Agilent E6198A Switch/Load Unit. . . . . . . . . . . . . . . . . . . . page 38

• Agilent 6642A, 6643A, 6652A, 6653A, 6673A Power Supplies

page 39

Debug Panel Features All of the debug panels provide the following features:

• Changes on the instrument front panel are not made until either:

-- you initiate a measurement (for detectors) or

-- you press the “Apply” button (for sources)

The instrument state memory is modified in the instrument handler at this time (since this is when the instrument handler is called; Instrument Handlers on page 48 for information about handlers).

See

• If the instrument is connected in the Agilent TS-5000 system through

switching, the front panel provides a section which allows you to define the switching path. Either select a UUT pin to connect to directly or define a custom switch path.

Connecting to the UUT pin is the easiest way to select a switch path; you select an ABus pin and the UUT pin. If the instrument has both the high and low terminals connected to the switch matrix, then both pins need to be defined. The low terminal is connected to UUTCommon by default and does not need to be selected, if you use the default. The UUT option is available if you have defined a UUT switching configuration file. In addition to the UUT pins, the system automatically adds the option to measure an ABus pin only. This will allows you to inject a signal on the front of the system and measure it using the instrumentation within the system.

• The state of the system is saved upon entering a pause state and is

restored when entering the run state. This allows the panels to be used

28 How to Use the System Software Chapter 2

without affecting the testplan.

1. Click on “View” menu

2. Click “Instrument” menu item

1. Select the Instrument of which the Debug Panel is to be displayed

2. Click “OK” to enable the Debug Panel

Selecting the Debug

Panel

Debug Front Panel Selection and Select an Instrument from the Debug Front Panel Selection show how to enable the debug instrument front panels.

Figure 2-10. Debug Front Panel Selection

Figure 2-11. Select an Instrument from the Debug Front Panel Selection

The following sections show and explain the different debug instrument panels.

How to Use the System Software 29Chapter 2

Agilent E1411B Digital

Multimeter

An instrument box which connects to the Agilent E6171 Measurement Control Module, such as the Agilent E1411 DMM, usually has two different dialog boxes which depend on the type of path selected (as shown in

Agilent E1411 DMM Debug Front Panel (showing Path Selection)A and Agilent E1411 DMM Debug Front Panel (showing Path Selection)B). This allows you to either connect to the pin on the UUT (Agilent E1411 DMM Debug Front Panel (showing Path Selection)A) or select any point within the system by defining a custom switching path (Agilent E1411 DMM Debug Front Panel (showing Path Selection)B). The custom switching is applied on top of the current switching state, so to undo a switching path you need to define a ‘disconnect’ path.

Figure 2-12. Agilent E1411 DMM Debug Front Panel (showing Path Selection)

The debug panel boxes and buttons do the following:

Function:

Choose ACV, DCV, Ohms, Ohms - Offset Compensated The measurement is made in auto range and medium resolution.

Switching Path:

The debug panel supports the selection of the switching path. The panel switches both high and low connections of voltage sense and the high and low connection of the current terminals. The sense connections are connected in parallel with the high and low terminals. You specify the high or low terminal and the system automatically connects the associated sense terminal.

Measurement Results:

Press the “Single” button to initiate a single measurement; press the “Continuous” button to initiate a series of measurements. The continuous button is modified to a “Stop” button once pressed. When the dialog box is brought up, the measurement results box is blank.

Switching Action Editor:

This button enables the editor to select the switching paths for the

30 How to Use the System Software Chapter 2

Digital Multimeter. See “Fast Connection Selection” on page 40 for a description on how to use the editor.

Execute:

This button starts a measurement.

Close:

This button closes the debug panel.

System Interface

The setting of the Digital Multimeter function uses the following actions:

dmmMeasureDCV, dmmMeasureACV, dmmMeasureOhms

The above actions also return the results of a measurement.

How to Use the System Software 31Chapter 2

Agilent E1328A &

E1418A Digital to Analog

Converter

Agilent E1328A and E1418A DAC Debug Front Panel shows the dialog box for controlling the Agilent E1328/E1418 Digital-to-Analog Converter (DAC) Module.

Figure 2-13. Agilent E1328A and E1418A DAC Debug Front Panel

The debug panel boxes and buttons do the following:

Voltage or Current:

You have the option to specify the output voltage or current for each channel of the DAC. The ‘Type’ selection sets the voltage or current mode and defines contents of the input field.

Dependent on the type selected, enter the voltage value/current value into the Voltage/Current field.

(Note the E1328A cannot programmatically select the voltage or current option.)

Update Output:

This button changes the output setting.

Close:

This button closes the debug panel.

System Interface

The setting of the DAC uses the following action routine:

dac16i_setup

32 How to Use the System Software Chapter 2

Agilent E1333A Counter Agilent E1333 Counter Debug Front Panel shows the dialog box for Agilent

E1333A Counter. Only the UUT connection screen is shown. The custom path selection is the same used by the Digital Multimeter (see on page 30).

Figure 2-12

Figure 2-14. Agilent E1333 Counter Debug Front Panel

The debug panel boxes and buttons do the following:

Function:

Choose Frequency, Period, Positive Pulse Width, Negative Pulse Width, Totalize

Input, Coupling, Input Impedance:

Allows you to set input functions. The setting of each function is sent before a measurement is made.

Switching Path:

The counter panel supports the selection of a switching path. The counter switches only the high connections of the output. The low connections are automatically connected to system ground.

How to Use the System Software 33Chapter 2

Measurement Results:

Select the “Single” button to initiate a single measurement or the “Continuous” button to initiate a series of measurements. The continuous button is changed to a “Stop” button, once pressed.

Note that when the dialog box is brought up, the measurement results box is blank.

Execute:

This button starts a measurement.

Close:

This button closes the debug panel.

System Interface

The setting of the counter function will use the following action routines:

ctrMeasureFrequency, ctrMeasurePeriod, ctrMeasurePulseWidth, ctrMeasureTimeInterval, ctrMeasureTotalize

The measurement uses the level trigger specified in the dialog box (using the slider control), a default range and default resolution.

The input section uses the following action routine:

ctrMeasureInControls

34 How to Use the System Software Chapter 2

VXI Technology E1563A

Digitizer

Figure 2-15 shows the debug front panel for the VXI Technology E1563A Digitizer. Only the UUT connection screen is shown. The custom path selection is the same as for the Agilent E1411B Digital Multimeter (see “Agilent E1411B Digital Multimeter” on page 30).

Figure 2-15. VXI Technology E1563A Digitizer Debug Front Panel

The debug panel boxes and buttons do the following:

Time Base and Range:

The range and timebase can be modified by selecting the “arrow” keys on the side and bottom of the waveform. To update the display, take a new measurement.

The time base allows the following range of selections:

50 nS to 20 Sec in 1, 2, 5 steps

the range has the following selections:

0.1 to 100 volts in 1, 2, 5 steps. When the dialog box is brought up, the combo box contains the current time base and range. All of the setting for the digitizer are saved until an actual sweep is initiated.

Input and Triggering:

These two sections allow you to set a variety of input and trigger functions. The setting of each function is sent when a measurement is made.

Switching Path:

The debug panel supports the selection of a switching path. The digitizer switches both the high and low connections of the output.

How to Use the System Software 35Chapter 2

Waveform Display:

Select the “Single” button to generates a single waveform display or the “Continuous” button to generate a continuous update of waveforms. The display updates at a rate of >10

Close:

This button closes the debug panel.

System Interface

The setting of the digitizer function will use the following action routines:adcConfArm, dcConfFreq, adcConfInControls, adcIsSet, adcGetResults

update/sec.

Agilent E6171B

Measurement Control

Module

Figure 2-16. Agilent E6171B Measurement Control Module Debug Front Panel

Agilent E6171B Measurement Control Module Debug Front Panel shows the dialog box for controlling the Agilent E6171B Measurement Control Module.

The debug panel boxes and buttons do the following:

Voltage or Current:

You have the option to specify the output voltage or current for each channel of the MCM. The ‘Type’ selection sets the voltage or current mode.

Dependent on the type selected, enter the voltage value or current value into the Voltage or Current field, respectively.

Expected Current (when enabled by the Type-Current):

Defines the expected current of the MCM (or VI, i.e., Voltage/Current) source.

Update Output:

This button changes the output source of the MCM.

Close:

This button closes the debug panel.

System Interface

The setting of the counter function will use the following action routines:

viSetSourceDCI, viSetSourceDCV, viSet

36 How to Use the System Software Chapter 2

Agilent E6174A Event

Detector

Agilent E6174A Event Detector Debug Front Panel shows the dialog box for controlling the Event Detector Module.

Figure 2-17. Agilent E6174A Event Detector Debug Front Panel

The debug panel boxes and buttons do the following:

Clock Frequency:

Select the clock rate of the event detector module.

Edge Trigger, External Gating and Number of Events:

Specifies the type of edge triggering to be used and external gating. The text box defines the number of events to be logged before a measurement is complete.

Event Display:

The event detector can generate either a single display or a continuous update of events. The table provides a simple list view of the event and it’s time stamp. The column width can be adjust by dragging the line which separates the titles.

Execute:

This button starts a measurement.

Close:

This button closes the debug panel.

System Interface

The setting of the event detector will use the following action routines:

eventMeasure

How to Use the System Software 37Chapter 2

Agilent E6198A

Switch/Load Unit

Agilent E6198A Switch/Load Unit Debug Front Panel shows the dialog box for controlling the Switch/Load Unit.

Figure 2-18. Agilent E6198A Switch/Load Unit Debug Front Panel

The debug panel boxes and buttons do the following:

Digital I/O Read:

Reads a value from the Agilent E6198 switch/load unit digital input ports. Fixture ID is value from Fix_ID(0..7) of access connector J104 and Spare is value from Spare_DigIn(0..7) of access connector J104.

Digital I/O Write:

Write a value to the Agilent E6198 switch/load unit digital output ports. Open Collector writes to output port on the switch/load unit backplane. Spare writes to output Spare_DigOut(0..7) on backplane connector J104.

Digital to Analog Converter DAC #1/DAC #2:

Change the voltage, gain, and offset values used to set the DAC voltage in the switch/load unit for both DAC #1 and DAC #2.

System Interface

The setting of the switch/load unit will use the following action routines: digitalWriteSU, digitalReadSU, dacSetDCVSU, dacSetGainOffsetSU

38 How to Use the System Software Chapter 2

Agilent 6642A, 6643A,

6652A, 6653A, 6673A

Power Supplies

Power Supply Debug Front Panel shows the dialog box for controlling the Agilent 6642A, 6643A, 6653A, 6673A Power Supplies. You can specify the output voltage or current for each channel of the Power Supply. You must specify a protection voltage greater than the voltage setting.

Figure 2-19. Power Supply Debug Front Panel

The debug panel boxes and buttons do the following:

Voltage/Current:

Specifies the output voltage or current for each channel of the power supplies. The ‘Type’ selection sets the voltage or current mode.

Dependent on the type selected, enter the voltage value or current value into the Voltage or Current field, respectively.

Update Output:

This button changes the power supply output.

Close:

This button closes the debug panel.

System Interface

The setting of the counter function uses the following action routines:

psConfVI, psSet, psIsSet, psConnect, psDisconnect

How to Use the System Software 39Chapter 2

Fast Connection

Selection

You can select a switching path to a module/instrument either by selecting pins on the Unit Under Test (UUT) (see “Switching Path” box in E1411 DMM Debug Front Panel (showing Path Selection)A on page 30) or by creating a custom path using the Switching Action Editor (see “Switching Action Editor” button in Path Selection)B on page 30).

Agilent E1411 DMM Debug Front Panel (showing

Agilent

Specifying Unit Under

Test Pin s

Creating a User Defined

Switching Path

When selecting UUT pins, you normally specify from 1 to 4 connections, depending on the module/instrument. For example, for the Digital Multimeter (DMM), you define these four connections: high, low, high current sense, and low current sense. The Counter only has only a high connection.

The software works backwards though the switching configuration and generates a switching path which connects to ABusx, depending on the option selected. For example, a typical connection from ABus1 to the high input of the Digital Multimeter would be: [DVMHi ABus1 VISrcHi]

User defined switching paths are created using the “Select Switching Path” screen which is enabled by the “Switching Action Editor” button (see Agilent E1411 DMM Debug Front Panel (showing Path Selection)B on page

30). The “Select Switching Path” screen shows two different fields, the ‘Connect’ and ‘Disconnect’ fields. All paths added or listed in the ‘Connect’ field are always connected. All paths added or listed in the ‘Disconnect’ field are always disconnected. Note that the fields are blank, if no paths have previously been added.

To add/edit/delete a path, first enable the “Select Switching Path” screen using an appropriate instrument panel, as shown in uses the Agilent E1411B Digital Multimeter instrument panel.

The following shows how to add/edit/delete a path.

Figure 2-20. The figure

40 How to Use the System Software Chapter 2

Figure 2-20. Enabling the “Select Switching Path” Screen

1. Select “Custom Switching” radio button

2. Click on “Switching Action Editor” to select the next “Select Switching Path” window

Adding a New Path

To add a new path, first determine the end nodes or points in the path. Then use the “Switching Action Editor” to find a path using the intermediate nodes between the end notes or points.

For example, to connect the Hi input of the Agilent E1411B Digital Multimeter (DMM) to the Hi output of the Agilent E6171 Measurement Control Module (MCM), you must know the node names for these connections. Also, since the DMM has no direct connections to the VI source or MCM, it must connect using ABusx. Thus, the nodes for this path would be: [DVMHi

ABus1 VISrcHi].

Before adding a new path, first use the procedure in Figure 2-20 to enable the “Select Switching Path” screen. Then use the procedure in Figure 2-21 to add the path.

Editing a Switching Path

To edit a path, first use the procedure in Figure 2-20 to enable the “Select Switching Path” screen, if the screen is not enabled. Then use the procedure

Figure 2-22 to edit the path.

Deleting a Path

To delete a path, first use the procedure in Figure 2-20 to enable the “Select Switching Path” screen, if the screen is not enabled. Then use the procedure

Figure 2-23 to delete the path.

How to Use the System Software 41Chapter 2

2. Choose a node name to be used in the path

3. Click “Select” to select the node; perform

4. Click on “OK” to add the node and close

5. Click on “OK” to return to the instrument

To add another path, click “Add Path” again,

This is the newly added path

1. Click to add a path to the “Connect” field to enable the “Switching Path Editor”

Click to add a path to the “Disconnect” field to enable the “Switching Path Editor”

(e.g., “DVMHi”)

step B and this step to select all nodes used in the path

the “Switching Path Editor”

before clicking on “OK”

panel

Figure 2-21. Adding a New Switching Path

42 How to Use the System Software Chapter 2

1. Click on the Switch Path to be edited

2. Click the “Edit Path” button.

3. Select the Node to be changed by

4. Click on “OK” to make the changes and

5. Click one “OK” to return to the instrument

clicking on “Back Up” until the node to be changed has been deleted; then click on “Select” to add the new node and continue adding the previously deleted nodes you wish to keep

panel

close the “Switching Path Editor”

Figure 2-22. Editing a Switching Path

How to Use the System Software 43Chapter 2

Figure 2-23. Deleting a Switching Path

1. Click on the Path to be deleted

2. Click on “Delete Path” to delete the path

3. Click on “OK” to return to the instrument panel

44 How to Use the System Software Chapter 2

Viewing Waveforms A ‘Waveform’ data type is available in the “ADC_Analyze_Wave”

Click on the parameter value to select it then click on the dots (...) to enable the waveform editor

High-Level Action. This data type includes a graphical viewer for data. Sample Testplan Showing Waveform Data Type shows a sample testplan using the “ADC_Analyze_Wave” Action with the Waveform parameter. Range Data on the Waveform Display Graphical Editor and Sample Waveform Display show the waveform editor, and Figure 2-27 shows the waveform display.

Figure 2-24. Sample Testplan Showing Waveform Data Type

How to Use the System Software 45Chapter 2

Figure 2-25. Range Data on the Waveform Display Graphical Editor

Set Start and Stop

Set the number of

time value for waveform

points on the waveform

Click to add range data

Click to add amplitude data

Add amplitude data here

Click to view waveform (see next figure)

46 How to Use the System Software Chapter 2

Figure 2-26. Amplitude Data on the Waveform Display Graphical Editor

Figure 2-27. Sample Waveform Display

Click on “OK” to store waveform

How to Use the System Software 47Chapter 2

Instrument Handlers

User Actions

Instrument Handler

Driver

Instrument Handlers are a layer of software between Agilent TestExec SL and standard instrument drivers (see Handlers are designed to be called from C/C++ code action.

Instrument handlers contain functions written in C code that are organized by instrument type and function, and require parameters relevant to the function. For example, the call to set up triggering for a voltmeter is:

Figure 2-28). In general, Instrument

Figure 2-28. Software Layers

Note Instrument handlers are maintained constant in different TS-5000 software

dmmConfTrigIn (dmm, trigselect, count, delay);

Function dmmConfTrigIn accepts four parameters: dmm, trigselect, count, and delay. The generic name of the function is of the instrument, in this case specific name of the function.

releases, which is not the case with the drivers. Thus, use instrument handlers for actions whenever possible.

dmm, is added as a prefix to form the full,

ConfTrigIn, and the name

48 How to Use the System Software Chapter 2

Using the Action Wizard To Develop

1. Click on “Tools” menu

2. Click on “Action Wizard” menu item.

The Agilent TestExec SL application used in the TS-5000 System comes with a program called Action Wizard to develop actions. The Action Wizard automatically runs through the steps necessary to develop an action. The wizard also includes a help file with more detailed instructions and information on how to use the wizard.

To run the “Action Wizard”, use the procedure in Figure 2-29.

Note Actions are the smallest components of a test and are used to setup and

execute instruments, perform cleanup functions, and to make measurements.

Figure 2-29. Selecting and Running the Action Wizard

How to Use the System Software 49Chapter 2

Multithreading

Multithreading is an execution model which allows multiple threads to exist within a single process. It contains more than one unit of execution in a single process. In the context of TestExec SL, multithreading is the capability of running more than one thread. These threads share the process's resources but are able to execute independently.

A thread is a basic unit of execution. A single thread executes a series of application instructions, following a single path of logic through the application. All applications have at least one thread, but you can design your applications to use multiple threads, with each thread executing separate logic.

This capability becomes useful when a process thread stalls due to necessary data that are not yet available or when switching to another thread will yield a better result. In a single threaded program, once the main execution thread is blocked the whole application comes to a standstill. However, with multithreading, blocked programs can be moved from the main execution to a separate thread and can be concurrently executed with the main execution. This allows the application to stay responsive while executing tasks in the background. Multithreading can lead to improved performance as many threads are executed concurrently.

However, there are always disadvantages to complex application like this. Executing a multithreaded test can be more difficult than a typical test as there can be time related defects. In order for the operating system to track a large number of threads, it is going to consume processor time. If there are too many threads, then each thread may not be given enough time to execute during its time slice. In addition, each thread is scheduled for execution less frequently due to the volume and time slice committed to each thread.

How Multithreading

is working on a

Testplan?

50 How to Use the System Software Chapter 2

a. Creating a Thread Safe Action

Thread safe is a concept that can be applied in multithreading. A piece of code is thread-safe, if it functions correctly during simultaneous execution in multiple threads. By using thread-safe routines, the risk that one thread will interfere and modify data elements of another thread is eliminated by circumventing potential data race situations with coordinated access to shared data.

For a thread to be thread-safe, it first must behave correctly in a single-threaded environment. Furthermore, for a thread to be thread-safe, it must continue to behave correctly when accessed from multiple threads, regardless of the scheduling or interleaving of the execution threads by the runtime environment and without any additional synchronization on the part of the calling code. The effect is that operations on a thread-safe object will appear in a fixed, globally consistent order to all threads.

The thread safe declaration is introduced as an indicator. By default, an action is not thread safe and is indicated by a visual cue.

Figure 2-30. Symbol of thread safe declaration

If you do not wish to see a visual cue next to non-thread safe action, click Options | Testplan Options and in the Threading tab, uncheck the Mark non-thread-safe action checkbox.

Note: If check “Force testplan to run in sequential mode” checkbox, all testplans will run in sequential mode. For multithreading mode, the checkbox must be unchecked.

Figure 2-31. Testplan Option for Mark non-thread-safe action

To create a thread safe action,

1. Double-click an action and the Action Definition Editor window will appear.

2. Enter "thread_safe" under Keywords.

3. Click Add.

You should now be able to see thread_safe in the right column. Take note of the highlighted areas.

How to Use the System Software 51Chapter 2

Figure 2-32. Action Defination Editor

4. The visual cue will disappear once the action has been declared as thread safe.

Figure 2-33. Disappear Thread Safe’s symbol

b. Settings for a Threaded Test

To thread a test, select the Threading tab and check the Thread This Test checkbox. A threaded visual cue will appear next to the test once the test has been threaded, as shown below.

52 How to Use the System Software Chapter 2

Figure 2-34. Thread This Test

c. Using Resource Locking

Resource locking is the process of protecting data in a multiprocessing environment. It means at the same point of time only one thread can access to this method of created object. Unless the lock is released after completion of the code, the next routine or iteration cannot enter the block. In the context of TestExec SL, resources that can be locked are switching paths, instrument handlers, action access, and reference parameters.

TestExec SL supports two types of resource locking which are full locking and partial locking. By implementing multithreaded tests and choosing the correct resource locking that fits your test, you can easily control the sharing of instruments and synchronize multiple UUTs. In full locking mode, TestExec SL will automatically perform locking on all objects underneath the test objects which are switching paths, instrument handlers, action access, and reference parameters. In partial locking mode, TestExec SL allows you to manually apply one or more of the above mentioned locks to the object(s).

Resource locking can be applied to each of the containing objects under the test object. Tests can be manually locked by selecting the Threading tab. Click the Lock All Test Objects checkbox for a full lock or click an individual lock to choose your preferred lock. The visual cues for full locking and partial locking slightly differ in color.

How to Use the System Software 53Chapter 2

Figure 2-35. Lock All Test Objects

Figure 2-36. Lock Test Objects partially

d. Using the Wait Thread Statement

One way to think of the wait thread statement is to imagine an item of data such as an integer variable as if it were a field in a database. If you do not have some locking mechanism in the database you stand a chance of corruption to the data.

Thus, one user might retrieve the data and perform a calculation and write back the data. If in the meantime someone else has retrieved the data, performed the calculation and written it back, the second user's calculations will be lost when the first person writes back to the database. In the way that a database has to handle updates at unpredictable times, so a multithreaded program has to cater for this possibility. TestExec SL has a wait thread statement especially to resolve matters like this.

54 How to Use the System Software Chapter 2

The Wait Thread statement allows you to block remaining statements from execution prior to completion of threaded tests statement in the Wait For column.

To insert a Wait Thread statement, click Insert | Wait Thread in TestExec SLs menu bar. The maximum timeout value is used to specify the maximum duration a Wait Thread statement would need to wait for the threads. A timeout of 0 ms means the program will wait forever until all the waited threaded tests have completed execution.

The below testplan shows that NewWaitthread needs to wait for NewTest1 to complete execution.

Figure 2-37. Wait Thread statment

Using Wait Thread Statement in Loop, For...In and For...To...Step Statements

It is recommended to insert Wait Thread statement right before Next statement in Loop, For...In and For...To...Step statements if threaded tests exists within these statements. The Wait Thread statement needs to wait for all threaded tests within the Loop and For Loop statements, otherwise, the results might be unexpected.

Using Wait Thread Statement for Throughput Multiplier Threaded Test Statement

It is also recommended to insert Wait Thread statement after a throughput multiplier threaded test statement to wait for all the threads running for all the UUTs to complete execution before proceeding on with next statement.

How to Use the System Software 55Chapter 2

Using Wait Thread Statement in Testgroup Statement

A Wait Thread statement should be inserted right before end testgroup statement if threaded tests exist within the testgroup statement. The Wait Thread statement needs to wait for all threaded tests within the testgroup, otherwise, the results might be unexpected.

Using Wait Thread Statement in Sequence Library

A Wait Thread statement should be inserted as the last statement of a sequence library (local or external) if threaded tests exist in the sequence library. The Wait Thread statement is to ensure all the threaded tests in the sequence library have completed their execution before returning to Main sequence. If the Wait Thread statement is not inserted, threads in the sequence library might be still running upon returning to Main sequence.

e. Using Timeout

A specified period of time that will be allowed to elapse in a system before a the next specified event is to take place. TestExec SL allows you to specify a timeout value as well as the behavior of the timeout. The timeout value is set in the Wait Thread statement while it's behavior is set in Testplan Options.

In Options | Testplan Options, a new Threading tab has been added to allow users to specify the behavior of the timeout. There are three options you can choose from:

• Generate exception

• Generate error message on report window and continue execute

• Prompt timeout dialog

Threaded objects are killed when timeout is exceeded. This timeout feature is the simplest method of preventing of deadlocks.

Opening System Configuration Editor

1. Start System Configuration Editor from this icon on the PC desktop:

You can also run System Configuration Editor by clicking:

Start | All Programs | Agilent TS-5000 System Software 7.1.2

56 How to Use the System Software Chapter 2

Adding an IVI-COM Module in System Configuration Editor

Note This feature will only be available for TS-5000 7.1 Service Pack 3 or

newer.

1. When System Configuration Editor opens, all devices that are supported by current configuration will be shown by default.

To add a Standard IVI-COM module, double click its selection available under the Device ID column as show below.

How to Use the System Software 57Chapter 2

2. The window Configure Module will pop-up.

58 How to Use the System Software Chapter 2

Adding a .Net Module in System Configuration Editor

1. When System Configuration Editor opens, all devices that are supported by current configuration will be shown by default.

To add a Standard DotNet module, double click its selection available under the Device ID column as show below.

How to Use the System Software 59Chapter 2

2. The window Configure Module will pop-up.

60 How to Use the System Software Chapter 2

Chapter Contents

Chapter 3

Using the DMM and ARB

This chapter describes how to trigger the DMM and how to use the ARB. The chapter is separated as follows:

• Triggered Voltage Measurement . . . . . . . . . . . . . . . . . . . . . . page 62

• Using the Agilent E6173A Arbitrary Waveform Generator . page 65

Using the DMM and ARB 61Chapter 3

Triggered Voltage Measurement

The Agilent E1411B Multimeter (DMM) can be triggered by a signal on the VXI Mainframe’s backplane. This signal uses one of the TTL (i.e., TTL0 to TTL7) trigger lines.

How to Trigger the

DMM

Testplan ‘dmmtrig.tpa’ shows how the DMM is triggered using the Agilent E6174A Arbitrary Waveform Generator (Arb). The Arb is also used to generate the signal measured by the DMM. The testplan also demonstrates how to use the Agilent E6171B Measurement Control Module’s (MCM) analog comparator. The testplan is in the following directory:

C:\Program Files\Agilent\TS-5000 System Software\testplan\examples

The Arb generates a ±5V 10 Hz square wave as the trigger signal. This method uses the analog comparator of the MCM to send the trigger to the DMM using the VXI Mainframe's backplane (see connections in

Figure 3-1

and Figure 3-2).

The testplan configures the MCM analog comparator to trigger at 0 volts. Setting the “trigedge” parameter in the “viConfCompare” action to “0” (positive edge detection), causes negative going backplane trigger when the input signal makes a low to high (positive going) transition through the trigger threshold. Setting the “trigedge” parameter in the “viConfCompare” action set to “1” (negative edge detection), causes triggers when the input signal makes a high to low (negative going) transition.

The following is a review of the testplan

Test/Action Name Description

test: Dmm Init Initializes the Digital Multimeter.

dmmConfCal Disables autozero and set the power line frequency.

dmmIsSet Waits for setup to complete.

test: Arb 1 pgm Configures Arb and outputs a 10 Hz +5V Square wave.

arbReset Reset the Arbitrary Waveform Generator (Arb) to its turn-on state.

arbConfOutControls Configures the Arb’s output circuitry.

Arb_Dl_Std_Waveform Download a 10 Hz square wave into the Arb.

arbInitiate Start outputting the waveform.

Arb_Select_Wave_By_Name Select waveform downloaded above.

test: VI Config0 (+5) Configures MCM’s analog comparator to trigger at 0V and a low to high (positive

transition) trigger.

viConfCompare Configures the comparator. The “trigedge” parameter value (0) causes a

backplane trigger when the input signal makes a low to high (positive going) transition trough trigger threshold.

viIsSet Waits for setup to complete.

Test: Meas V - Trigger Trigger DMM and measure trigger voltage.

62 Using the DMM and ARB Chapter 3

Test/Action Name Description

Switching Make the necessary switching to setup the Arb to DMM measurements and

dmmMeasureTrigVoltage Configures DMM for a measurement using the backplane TTL trigger line 0.

dmmGetResults Make the measurement and return the reading.

test: VI Config1 (-5) Configures MCM’s analog comparator to trigger at 0V and a high to low (negative

viConfCompare Configures the comparator. The “trigedge” parameter value (0) causes a negative

viIsSet Waits for setup to complete.

test Meas V - Expanded Trigger DMM and measure trigger voltage.

Switching Make the necessary switching to setup the Arb to DMM measurements and

DelayMillisecond Wait for switching to complete.

dmmInitiate Initiates a reading cycle.

dmmGetResults Make the measurement and return the reading.

trigger signal paths.

transition) trigger.

going backplane trigger when the input signal makes a high to low (negative going) transition trough trigger threshold.

trigger signal paths.

Figure 3-1. Trigger Connections

Using the DMM and ARB 63Chapter 3

Figure 3-2. Switch Paths Listing

64 Using the DMM and ARB Chapter 3

Using the Agilent E6173A Arbitrary Waveform Generator

The following describes the Agilent E6173A Arbitrary Waveform generator and how to use it.

Arbitrary Waveform

Generator

Description

How the Arb

Generates

Waveforms

The Agilent E6173A Arbitrary Waveform Generator (Arb), formerly the Agilent Z2471A, is a register-based, two channel signal generator whose channels are isolated from each other and from ground. The factory default configuration connects first channel to the Agilent E6171 Measurement Control Module (MCM).

You can amplify channel one's output using the MCM's V/I amplifier/current source. You can connect channel two directly to your Unit Under Test (UUT) or use one of the unassigned MCM inputs. The Arb can also switch to any UUT pin by switching to Aux ports, if using the default system pins.

The Arb can output standard waveforms, such as sine, square, triangle, knock, or crank of a specified frequency, amplitude, and offset, and custom arbitrary waveforms defined by the user.

The Arb generates waveforms using pre-defined or user defined segment and sequence data.

The segments of a waveform are the voltage levels of each point on the waveform. The sequence consists of a group of pre-defined or user defined number of segments. To generate a waveform, the Arb outputs the sequence, consisting of the defined number of segments, using a pre-defined time.

Figure 3-3 shows a typical example of a waveform.

The number of segments output (i.e., how often they occur) and the time of the Arb’s internal clock (i.e., segment duration time) determines the time or frequency of the waveform to be output. The Arb’s internal clock time is

µS. Either single or multiple clock cycles can be used to set the appropriate

2 frequency. Selecting the clock cycles is usually known as selecting the “dwell” count.

For example, a waveform consisting of 250 segments using two 2 uS clock cycles (or 2 dwell counts), outputs a 1 kHz waveform, shown as follows:

250 * (0.000002 * 2) = 250 * 0.000004 = 0.001 S = 1 kHz

In addition to the 2 µS clock, the Arb also has a 100 nS counter that can be used to add time in 100 nS steps to the 2 µS clock cycles. This is used to generate frequency accurate waveforms.The counter is normally set using the “clock adjust” function. Note: Segment time = (Dwell + 1) * (2 µS + (clock adjust * 0.1 µS)).

Both the segment data and sequence data is downloaded into the Arb’s memory using the standard actions supplied with the system. These actions can be used to download both standard (pre-defined) waveforms and user defined waveforms.

Using the DMM and ARB 65Chapter 3

Note For more information about the waveform timing, refer to the

Segment

Sequence

Segments

(voltage

values)

Duration

Agilent E6173A Arbitrary Waveform Generator User’s Manual.

Figure 3-3. Typical Waveform using Segments and Sequence

Generating Arb

Waveforms

Note DO NOT use the “Arb_Dl_xxx” actions with the older “ArbSetSegment”

Note When selecting different downloaded waveforms, usually when there are

There are several methods to generate Arb waveforms using the standard actions. You can generate standard waveforms, such as sine, pulse, and triangle waveforms, or you can create custom waveforms.

Many actions have been developed for high throughput operations. These actions are generally named “Arb_Dl_xxx” where the “Dl” indicates the actions with the high throughput capability (see

“In all testplans, the Arb connects to the Analog Bus ABus1. To view the output, connect an oscilloscope to the ABus 1 connector at the front of the system. Be sure to make the necessary connection to the Mass Interconnect/Express Connect so the interlock is shorted in order to use the system (see the appropriate documentation). Instead of an oscilloscope, you can also use an VXI Technology E1563A Digitizer to read the waveforms and display them using the appropriate actions.” below).

and/or “ArbSetSequence” actions on the same Arb channel.

66 Using the DMM and ARB Chapter 3

major frequency differences, the first few cycles of a newly selected waveform may appear to be distorted. The reason is that the previous waveform must complete, but the new “clock adjust” is already in effect, which may change the timing of the last cycles of the previous waveform.

The following explains the methods used. For each method, there is a testplan available it. The testplans are located in the following directory:

C:\Program Files\Agilent\TS-5000 System Software\testplan\examples

In all testplans, the Arb connects to the Analog Bus ABus1. To view the output, connect an oscilloscope to the ABus 1 connector at the front of the system. Be sure to make the necessary connection to the Mass Interconnect/Express Connect so the interlock is shorted in order to use the system (see the appropriate documentation). Instead of an oscilloscope, you can also use an VXI Technology E1563A Digitizer to read the waveforms and display them using the appropriate actions.

Downloading and

Executing Waveforms

Using the “Arb_Dl_xxx”

Actions

Note When initializing the Arb for output using the “arbInitiate” action, the Arb

Using the “Arb_Dl_xxx” actions to download standard or user defined waveforms gives you the highest throughput capability. Using these actions, the waveforms are downloaded the first time the testplan is run. The waveforms remain in memory and can then be selected any time during testplan execution. The only time new waveforms are downloaded is when a testplan is modified.

Each downloaded waveform needs a unique name to keep track of the waveform. This name can then be used to call a particular waveform in any part of the testplan as many times as needed. Since both waveform data and other parameters, such as output voltage are also included with a name, the waveform will be output the same way every time it is selected.

outputs the last downloaded waveform, if “Arb_Select_Wave_By_Name” is not called before “arbInitiate”. Use the waveform names in the ‘waveform_name’ parameters of the of “Arb_Dl_xxx” actions to select them.

A typical sequence to generate a waveform is as follows:

1. Setup Arb using the “arbConfOutControls” action.

2. Send the setup data to the Arb using the “arbSet” action.

3. Download waveform data using the “Arb_Dl_xxx” action; use a unique waveform name in the ‘waveform_name’ parameter.

4. Initialize the Arb to output the waveform using the “arbInitiate” action.

5. Select the downloaded waveform using the “Arb_Select_Wave_By_Name” action using the waveform name in the “Arb_Dl_xxx” action.

Using the DMM and ARB 67Chapter 3

Generating Standard

Waveforms

The following shows how to download standard waveforms for output using the standard actions. For high throughput capability, use the “Arb_Dl_xxx” actions.

Downloading a Standard Waveform

Use the “Arb_Dl_Std_Waveform” action to download the waveform and the “Arb_Select_Wave_By_Name” action to select the waveform. In this case, the same waveform name is referenced by both actions to select the waveform for output.

Using this method, a waveform can be selected on-the-fly to allow fast waveform access. This is because the waveform has previously been generated and stored in memory. All that is needed is to select the waveform to output it.

An example to download and then select a waveform is as follows. In the example, a waveform is generated and stored using a particular name (i.e., “Arbwave1”). Once this waveform is generated, it can then be selected in any part of the testplan.

Generate the waveform using Arb_Dl_Std_Waveform with the waveform name = “Arbwave1” (parameter: ‘waveform_name’ = Arbwave1).

to select the waveform, set:

waveform name of an Arb_Select_Wave_By_Name action = “Arbwave1” (parameter: ‘waveform_name’ = Arbwave1) and then execute that action.

Note The waveform names are NOT case sensitive.

Using the above actions allow you to download and store several different waveforms into the Arb that can be selected in different parts of the testplan. One way to do this is to download several different waveforms with different names at the beginning of the testplan and then select the different waveforms throughout the testplan.

An example to use different downloaded waveforms in different parts of a testplan is as follows:

Test1: Arb_Dl_Std_Waveform: ‘waveform_name’ = sine

Arb_Dl_Std_Waveform: ‘waveform_name’ = square Arb_Dl_Std_Waveform: ‘waveform_name’ = triangle

•

Test2: Arb_Select_Wave_By_Name: ‘waveform_name’ = triangle

•

Test3: Arb_Select_Wave_By_Name: ‘waveform_name’ = sine

•

68 Using the DMM and ARB Chapter 3

•

Test4: Arb_Select_Wave_By_Name: ‘waveform_name’ = square

Testplan ‘arbdown_name.tpa’ illustrates how to download a 1 kHz sine wave, 2 kHz square wave, and 4 kHz triangle wave. A review of the testplan is below.

Test Group/Test/Action Name Description

testgroup Arb download waveforms Downloads standard waveforms.

Switching Connect Arb channel 1 output to ABus1 and UUT Common.

test setup Arb Setup arb output circuitry.

arbConfOutControls Configures Arb’s output circuitry.

arbSet Sends setup data to Arb.

test download sine wave Downloads the standard sine wave to the Arb.

Arb_Dl_Std_Waveform Downloads a sine wave into the Arb. The ‘function’ parameter is set to “0” to

download a sine wave.

The ‘waveform_name’ parameter is set to “sine” to give the downloaded

waveform that name.

The ‘frequency’ parameter is set for a 1 kHz waveform. The ‘Vpeak’ parameter is set for a 5 V peak waveform. The ‘waveform_name’ parameter is set to

test download square wave Downloads the standard pulse wave to the Arb.

Arb_Dl_Std_Waveform Downloads a square wave into the Arb. The ‘function’ parameter is set to

test download triangle wave Downloads the standard triangle wave to the Arb.

Arb_Dl_Std_Waveform Downloads a triangle wave into the Arb. The ‘function’ parameter is set to

test output waveforms This test executes the downloaded waveforms.

arbInitiate Initialize the Arb to output the waveform. Start outputting the waveform. The

DialogOkay This optional action is used here to view the current waveform (i.e., triangle

Arb_Select_Wave_By_Name Selects and outputs the waveform using the name entered in the

“1” to download a pulse.

The ‘waveform_name’ parameter is set to “square” to give the

downloaded waveform that name.

The ‘duty_cycle’ parameter is set to “0.5” so the pulse function

downloads a square wave.

The ‘frequency’ parameter is set for a 2 kHz waveform. The ‘Vpeak’ parameter is set for a 5 V peak waveform.

“2” to download a triangle wave.

The ‘waveform_name’ parameter is set to “triangle” to give the

downloaded waveform that name.

The ‘frequency’ parameter is set for a 4 kHz waveform. The ‘Vpeak’ parameter is set for a 5 V peak waveform.

Arb at this time outputs the last downloaded waveform (i.e., “triangle”).

wave).

‘waveform_name’ parameter (i.e., “sine”). Since this is the name of the ‘waveform_name’ parameter of the “Arb_Dl_Std_Waveform” action in “test download sine wave”, a sine wave is output by the Arb.

DialogOkay This optional action is used here to view the current waveform (i.e., sine

wave).

Using the DMM and ARB 69Chapter 3

Test Group/Test/Action Name Description

Arb_Select_Wave_By_Name Selects and outputs the waveform using the name entered in the

DialogOkay This optional action is used here to view the current waveform (i.e., square

Arb_Select_Wave_By_Name Selects and outputs the waveform using the name entered in the

DialogOkay This optional action is used here to view the current waveform (i.e., triangle

‘waveform_name’ parameter (i.e., “square”). Since this is the name of the ‘waveform_name’ parameter of the “Arb_Dl_Std_Waveform” action in “test download sine wave”, a square wave is output by the Arb.

wave).

‘waveform_name’ parameter (i.e., “triangle”). Since this is the name of the ‘waveform_name’ parameter of the “Arb_Dl_Std_Waveform” action in “test download sine wave”, a triangle wave is output by the Arb.

wave).

Outputting a Standard Waveform Immediately

The “Arb_Output_Std_Waveform” action can also be used to generate and output standard waveforms. This action enables the Arb to output a sine, pulse, or triangle wave. Unlike the “Arb_Dl_Waveform” action, this action does not require “arbIntiate” to enable it to output a waveform, however, it also has the high throughput capability of the “Arb_Dl_Waveform” action. “Arb_Output_Std_Waveform” can be used in any part of the testplan.

Testplan ‘arboutputstd.tpa’ illustrates how to output a 1 kHz sine wave, 2 kHz square wave, and a 4 kHz triangle wave. A review of the testplan is below.

Test Group/Test/Action Name Description

testgroup Arb output std waveforms Outputs standard waveforms.

Switching Connect Arb channel 1 output to ABus1 and UUT Common.

test output sine Output sine wave.

Arb_Output_Std_Waveform Immediately outputs a sine wave; ‘function’ parameter is set to “0”.

DialogOkay This optional action is used here to view the current waveform (i.e., sine

test output square Output square wave.

Arb_Output_Std_Waveform Immediately outputs a square wave; ‘function’ parameter is set to “1” (pule)

DialogOkay This optional action is used here to view the current waveform (i.e., square

test output triangle Output triangle wave.

Arb_Output_Std_Waveform Immediately outputs a triangle wave; ‘function’ parameter is set to “2”.

DialogOkay This optional action is used here to view the current waveform (i.e., triangle

wave).

and ‘duty_cycle’ parameter is set to “0.5” for the “pulse” function to output the square wave.

wave).

70 Using the DMM and ARB Chapter 3

Downloading a Standard Phase Shifted or Burst Modulated Waveform

Use the “Arb_Dl_Ext_Waveform” action for phase shifted and burst modulated waveforms. This action has the following functionality:

1. Square wave generation

2. Positive and negative ramp generation

3. Positive and negative pulse generation

4. Burst modulation

5. Phase shift

6. Pulse width for positive and negative pulses, and burst pulses.

To correctly generate a waveform, it is important to understand how to set some of this action’s different parameters. These are explained as follows:

frequency - Specifies the output frequency if the waveform is NOT a

“burst” waveform (‘F_burst’ parameter set to “0”). If “burst” is used, this is the frequency of the burst wave, as shown in

Figure 3-4. (Note: “burst” can not be used in the positive or negative pulse functions; i.e., functions 5 or 6, respectively).

Tpulse_width - Sets the pulse width of the positive or negative pulses

function (for functions 5 and 6, respectively) or sets the width, in seconds, of the burst wave, as shown in

Figure 3-4. If used with

“burst”, the pulse width must be less than 100 mS.

F_burst - If set to “0”, no “burst” is generated. Otherwise, this sets the

waveform frequency that is to be modulated by the burst wave (the burst wave frequency is set by the ‘frequency’ parameter), as shown in Figure 3-4.

phase_shift - Specifies the amount of phase shift in a waveform in

degrees, relative to a non-phase shifted version of itself.

force_seg_count - If set to “0”, the frequency accuracy is generated

using the 2 µS clock cycles plus any number of 100 nS clock cycles needed to make the frequency accurate. This is illustrated in the following formula:

segments = (1 / frequency) / (2 µS + (100 nS * clockadj))

where ‘clockadj’ is used to add 1 or more 100 nS ticks to the 2 µS clock.

If this parameter is set to “1” (or “-1”), the number of segments closest to the frequency value will be used, without using ‘clockadj’. Only the 2 µS clock is used without the 100 nS clock. This is illustrated in the following formula:

segments = 1 / (frequency * 2 µS)

Using the DMM and ARB 71Chapter 3

Waveform Frequency (‘F_burst’ parameter)

freq*

width*

* width = Pulse Width in seconds (‘Tpulse_width’ parameter)

freq = Burst Frequency in Hz (‘frequency’ parameter)

Normally, ‘force_seg_count’ is used (set to “1” or “-1”) if you wish to have the segment counts of two waveforms be a multiple of each other to guarantee phase lock. However, this method uses more segment memory since the number of segments determines the frequency.

Figure 3-4. Typical Burst Waveform

Testplan ‘arbburst.tpa’ illustrates how to generate a burst modulated waveform, with waveform frequency set to 30 kHz, burst frequency set to 1 kHz, and burst pulse width set to 0.0001 seconds. A review of the testplan is below.

Test Group/Test/Action Name Description

testgroup Arb burst waveform Outputs a burst waveform.

Switching Connect Arb channel 1 output to ABus1 and UUT Common.

test setup Arb Setup arb output circuitry.

arbConfOutControls Configures Arb’s output circuitry.

arbSet Sends setup data to Arb.

test download burst Setup arb to download a burst waveform.

Arb_Dl_Ext_Waveform Setup a burst waveform with waveform frequency set to 30 kHz (‘F_burst’

test output waveform Selects and outputs a burst waveform by name.

arbInitiate Initialize the Arb to output the waveform. Start outputting the waveform. The

Arb_Select_Wave_By_Name Selects and outputs the waveform using the name entered in the

parameter), burst frequency of 1 kHz (‘frequency’ parameter), and a burst pulse width of 100

Arb at this time outputs the last downloaded waveform.

‘waveform_name’ parameter (i.e., “wave1”).

µS (‘Tpulse_width’ parameter).

DialogOkay This optional action is used here to view the current waveform (i.e., forward

and reverse sweep).

72 Using the DMM and ARB Chapter 3

Downloading a Swept Sine Waveform

The “Arb_Dl_Swept_Sine” and “Arb_Dl_Swept_Sine_Ex” actions perform frequency sweeps of sine waves. The “Arb_Dl_Swept_Sine” action only sweeps in the forward direction. The “Arb_Dl_Swept_Sine_Ex” action can sweep in both forward and reverse directions with a selectable delay between sweeps (i.e., last frequency remain for the selected time).

Testplan ‘arbsweep.tpa’ illustrates how to output a sine wave sweep using both actions. In one test, the sine wave sweeps from 1 kHz to 2 kHz with a sweep time of 0.5 seconds. In another test, the sine wave sweeps from 1 kHz to 2 kHz in both forward and backwards directions with a sweep time of 0.2 seconds. In the The latter test, the last frequency is held for 0.5 seconds before the next sweeps is initiated. A review of the testplan is below.

Note The number of segments needed to generate the swept sine waves depend

on the frequency span between the start and end frequencies, and the sweep time. Large spans and/or sweep times could exceed the maximum allowable segments.

Test Group/Test/Action Name Description

testgroup Arb sine sweeps Sweeps Arb sine waves.

Switching Connect Arb channel 1 output to ABus1 and UUT Common.

test setup Arb Setup arb output circuitry.

arbConfOutControls Configures Arb’s output circuitry.

arbSet Sends setup data to Arb.

test setup forward sweep Sweeps a sine wave in the forward direction.

Arb_Dl_Swept_Sine Downloads a sine wave for a forward sweep from 1 kHz to 2 kHz for a time

of 0.5 seconds.

test setup forward & reverse sweeps Sweeps a sine wave in both forward and reverse direction.

Arb_Dl_Swept_Sine_Ex Downloads a sine wave for a forward and reverse sweep from 1 kHz to 2

kHz for a time of 0.2 seconds with a delay of 0.5 seconds between sweeps.

test execute sweeps Execute both sweeps.

arbInitiate Initialize the Arb to output the waveform. Start outputting the waveform. The

Arb at this time outputs the last downloaded waveform (i.e., forward and reverse sweep).

Arb_Select_Wave_By_Name Selects and outputs the waveform using the name entered in the

‘waveform_name’ parameter (i.e., “wave1”).

DialogOkay This optional action is used here to view the current waveform (i.e., forward

sweep).

Arb_Select_Wave_By_Name Selects and outputs the waveform using the name entered in the

‘waveform_name’ parameter (i.e., “wave2”).

DialogOkay This optional action is used here to view the current waveform (i.e., forward

and reverse sweep).

Using the DMM and ARB 73Chapter 3

Note Use the Watch Window to determine the amount of segment memory used

by the swept sine waveforms.

Generating Custom

Waveforms

Custom waveforms can be generated using the “Arb_Dl_Waveform_Data” action and or the “Arb_Dl_Custom_Waveform” actions.

Downloading a Data Type Custom Waveform

The “Arb_Dl_Waveform_Data” action uses a ‘Waveform’ type array variable called “Waveform” to generate a custom waveform. The variable stores both the segments of the waveform (i.e., amplitude) and the time all segments are to be executed (i.e., waveform frequency).

Figure 3-5 shows the data used to generate the waveform shown in the bottom part of the figure. The segment data of the waveform is stored in the array part of the “Waveform” parameter. (You can view the resultant waveform by clicking on the “View Waveform” button, as shown in 3-5.)

How to download custom data type waveforms is shown in testplan

arbcustom_data.tpa’. The waveform is a 1 kHz (1 mS), 2 V peak ramp,

‘ consisting of 21 segments. A review of the testplan is below.

Test Group/Test/Action Name Description

testgroup download custom waveform Downloads a user generated data type custom waveform.

Switching Connect Arb channel 1 output to ABus1 and UUT Common.

test setup Arb Setup arb output circuitry.

Figure

arbConfOutControls Configures Arb’s output circuitry.

arbSet Sends setup data to Arb.

test download custom waveforms Downloads custom waveforms to Arb.

Arb_Dl_Waveform_Data Downloads data type waveform into Arb. The waveform data is the data

stored into the ‘Waveform’ variable (see Figure 3-5 for typical waveform data).

The ‘waveform_name’ parameter is set to “wave1” to give the

downloaded waveform that name.

The maximum value in the ‘Waveform’ array variable is “2.0000000000”

which makes the peak Waveform voltage 2.0 V.

The Star and /Stop values in the ‘Waveform’ array are set to “0.0000000000” and “.0010000000”, respectively. This outputs a 1 kHz waveform (Stop - Start = .0010000000 - 0.0000000000 = 1 mS or 1 kHz).

test output custom waveform This test executes the downloaded waveform. Although the Arb outputs the

arbInitiate Initialize the Arb to output the waveform. Start outputting the waveform.

waveform from the previous test (after ‘arbinitiate’ in “test download custom waveform”), this test is to show that the waveform can be selected in any part of the testplan. The Arb normally outputs the last downloaded waveform, whether a custom waveform or a standard waveform, but can output a different waveform in any part of the testplan using the action in this test.

74 Using the DMM and ARB Chapter 3

Test Group/Test/Action Name Description

Parameter Name

Parameter Type

Click on “View Waveform” to view resultant waveform (see next figure)

Click on “Range” to add time values

Click on “Amplitude” to see amplitude data

Amplitude data

“Start” and “Stop” times of the waveform (Stop - Start = Total Time e.g. 0.001-0.00 = 1 mS or 1 kHz); this results in a segment time of 47.62 μS

The number of points or segments

on the waveform

Arb_Select_Wave_By_Name Selects and outputs the waveform using the name entered in the

‘waveform_name’ parameter (i.e., “wave1”) This is the same name as the name in the ‘waveform_name’ parameter of the “Arb_Dl_Waveform_Data” action.

DialogOkay This optional action is used here to view waveform.

Figure 3-5. Generating a Data Type Waveform

Using the DMM and ARB 75Chapter 3

Figure 3-6. Arb Waveform

The values in this example produces a 2 Vpeak, 1 kHz ramp, as shown below; the waveform was generated

Note: The Arb output looks more “staircased” on an oscilloscpe due to the 47.62 µS/segment time.

0.0

0.1

0.2

0.3

0.4

0.5

0.6

0.7

0.8

0.9

1.0

1.1

1.2

1.3

1.4

1.5

1.6

1.7

1.8

1.9

2.0

using the following values

and Stop / Start values of

0.000 / 0.001

Downloading User Defined Waveforms

This “Arb_Dl_Custom_Waveform” action uses several double and single dimensioned array type parameters to set the voltage segments, sequences, markers, dwell, next sequences, and other values to download and generate user defined custom waveforms.

Figure 3-3 shows a typical custom waveform. The figure shows a triangle waveform that shows the relationship between the segments, sequence, and segment execution time.

76 Using the DMM and ARB Chapter 3

different parameters of the action. This is explained as follows:

voltage - Specifies the voltage value of the waveform segments for one

or more sequences (voltage range is ±16.4 V). This is a double dimensioned array where the column is the sequence number and the rows are the segment numbers.

marker - Specifies a marker on the selected segment in a valid sequence.

The marker pulse will only be output if the sequence is non zero. The marker signal always appears on the Arb’s front panel BNC connector. It can also be routed to the VXI TTL backplane. typical example on how to specify markers.

Figure 3-7 shows a typical example.

To generate a waveform, it is important to understand how to set the

Figure 3-8 shows a

nr_sequence - Specifies the number of sequences to be downloaded.

This value must be “1” or above, or no waveform will be downloaded. If more than one sequence is available and the parameter is set to “1”, only the waveform using the first sequence is downloaded.

next_sequence - Specifies which sequence is to be downloaded next. An

example is in

Figure 3-9.

sequence_repeat - Specifies if the sequence is to be repeated (i.e., value

is set to “1” or more), as shown in

Figure 3-10.

nr_segments - Specifies the number of segments for each sequence. If

the number of specified segments is lower than the number of segments entered in the corresponding sequence of the ‘voltage’ parameter, only the number of segments specified here will be downloaded.

Figure 3-11 shows a typical example.

segment_dwell - Specifies for how many 2 µS clock cycles each

segment of a sequence is to be output. Normally, each segment is output in a single 2 µS clock cycle (if the parameter is set to “0”), which is a dwell count of “0”. Setting the ‘segment_dwell’ to a number above zero, the clock cycles will increase by that new number plus a single clock cycle.

Since the number of segments and the duration time of the segments determines the waveform frequency, each additional number added to ‘segment_dwell’ lowers the waveform frequency.

For example, if the dwell count is 0, for a 20 segment waveform, the total time the segments are output is:

20 * 2 µS = 40 µS = a frequency of 25 kHz

Changing the dwell count to 49, changes the time and resultant waveform frequency to:

20 * ((49 * 2 µS) + 2 µS) = 20 * ((98 µS) + 2 µS) = 20 * 100 µS =

0.002 S = a frequency of 500 Hz.

An example of using the ‘segment_dwell’ parameter is in Figure 3-12. In the figure, the dwell count is 49 for two 20 segment sequences which gives a total waveform frequency of 250 Hz.

Using the DMM and ARB 77Chapter 3

Figure 3-7. Segment/Sequence Array Values

Sequence Number 1

Segment Numbers

Segment voltage values

Sequence Number 2

Sequence Numbers

Segment Numbers

Markers

78 Using the DMM and ARB Chapter 3

Figure 3-8. Typical Marker Values

First Sequence points

Second Sequence points

to Second Sequence

to First Sequence

Second Sequence is repeated 1 times

Figure 3-9. Typical Next Sequence Values

Figure 3-10. Typical Repeat Sequence Value

Using the DMM and ARB 79Chapter 3

20 segments in

20 segments in Second Sequence

First Sequence

Waveform time for both sequences is: total of (segments * clock time for each sequence) =

Since both sequence time is the same, the total time = 2 * 0.002 = 0.004 = 250 Hz

Dwell count of 49 for 20 segments in First Sequence

Dwell count of 49 for 20 segments in Second Sequence

20 * ((49 * 0.000002) + 0.000002) = 20 * (0.000098 + 0.000002) = 20 * 0.0001 = 0.002 per sequence

Figure 3-11. Typical Segment Number Value

Figure 3-12. Typical Segment Number Value

80 Using the DMM and ARB Chapter 3

How to download custom waveforms is shown in testplan

arbcustom_user.tpa’. A review of the testplan is as follows:

‘

Test Group/Test/Action Name Description

testgroup download custom waveform Downloads user generated custom waveforms.

Switching Connect Arb channel 1 output to ABus1 and UUT Common.

test setup Arb Setup arb output circuitry.

arbConfOutControls Configures Arb’s output circuitry.

arbSet Sends setup data to Arb.

test download custom waveforms Downloads the custom waveforms to Arb.

Arb_Dl_Custom_Waveform Downloads two ramps (one positive the other negative going) to the Arb to

output a triangle waveform.

The number of segments is 20 for each waveform.

The waveforms require 2 sequences.

The ‘segment_dwell’ is set to 49 for both waveforms to output at 250 Hz.

test execute waveforms Executes custom waveforms.

arbInitiate Initialize the Arb to output the waveforms. Start outputting the waveform.

Arb_Select_Wave_By_Name Selects and outputs the waveform using the name entered in the

DialogOkay This optional action is used here to view waveform.

‘waveform_name’ parameter (i.e., “wave1”) This is the same name as the name in the ‘waveform_name’ parameter of the “Arb_Dl_Custom_Waveform” action.

Using the DMM and ARB 81Chapter 3

Generating Custom

Waveforms From a Data

File

This is similar to generating a data type custom waveform using the “Arb_Dl_Waveform_Data” action, except in this case the waveform data comes from a data file using the “WaveformDataRead” action. The following shows how to download custom waveform data from a file and other pertinent information.

Downloading from a File

The following shows how the actions are used:

1. The “WaveformDataRead” action reads the data from a file and stores it into its ‘Waveform” variable (at first run of the testplan only).

2. The data is then stored into the ‘Waveform’ variable of the “Arb_Dl_Waveform_Data” action.

3. The data is downloaded into the Arb and output whenever the “Arb_Select_Wave_By_Name” action selects the appropriate waveform name.

To perform the correct operation, the following must take place:

• The “WaveformDataRead” action must be referenced to the data file

using the file name.

Normally, “WaveformDataRead” action reads the data file when the testplan is first run (i.e., the System RunCount = 0). After that, the data file will not be read.

Figure 3-13 shows how the file is referenced.

• The waveform time/frequency must be set by the ‘SampleTime’

parameter in the “WaveformDataRead” action. how to set the waveform time/frequency using the ‘SampleTime’ parameter.

Figure 3-13 shows

• The ‘Waveform’ variable in the “Arb_Dl_Waveform_Data” action

must be referenced to the ‘Waveform’ variable in the “WaveformDataRead” action using symbols. to create a symbol in the “WaveformDataRead” action and Figure 3-15 shows how to reference to the symbol in the “Arb-Dl_Waveform_Data” action.

Figure 3-14 shows how

• The data in the file must be in such a format that each line is a data

point or segment of the waveforms. The following is a typical example on how data is stored into the file:

0.0000000000

0.1000000000

0.2000000000

•

0.5000000000

82 Using the DMM and ARB Chapter 3

Note A data file using this format can be generated by an E1563A Digitizer using

Enter file name and path here

Enter waveform time/frequency here (e.g., “SampleTime’ of

0.000047619 = frequency of 1 kHz (0.000047619 * 21) = 0.001 S; 1 / 0.001 = 1 kHz)

an appropriate action or the using the “WaveformDataWrite” or other supplied standard action.

How to download a custom data type waveform is shown in testplan

arbcustom_file.tpa’. The downloaded waveform is a 1 kHz (1.0 mS),

‘ 2

V peak ramp, consisting of 21 segments. A review of the testplan is as

follows:.

Test Group/Test/Action Name Description

testgroup Arb waveform from file Downloads a waveform from a file.

Switching Connect Arb channel 1 output to ABus1 and UUT Common.

test setup Arb Setup arb output circuitry.

arbConfOutControls Configures Arb’s output circuitry.

arbSet Sends setup data to Arb.

test get and download data Gets download waveform data from file and downloads the data to the Arb.

WaveformDataRead Reads data from file and store it in an array variable.

Arb_Dl_Waveform_Data Download the data into the Arb that was read from the file to generate a

data type waveform.

The ‘waveform_name’ parameter is set to “wave1” to give the

downloaded waveform that name.

The waveform time or frequency is set to 1 kHz using the ‘SampleTime’

parameter value in the “WaveformDataRead” action where frequency = 1 / (sample time * number of samples) = 1 / (0.000047619 * 21 = 0.001 S =

kHz

test output custom waveform Executes the downloaded waveform.

arbInitiate Initialize the Arb to output the waveforms. Start outputting the waveform.

Arb_Select_Wave_By_Name Selects and outputs the waveform using the name entered in the

‘waveform_name’ parameter (i.e., “wave1”) This is the same name as the name in the ‘waveform_name’ parameter of the “Arb_Dl_Waveform_Data” action.

DialogOkay This optional action is used here to view waveform.

Figure 3-13. Entering File Name and Sample Time

Using the DMM and ARB 83Chapter 3

1. Click on action name to select the “WaveformDataRead” action

2. Click on ‘Waveform’ name using the right mouse button

3. Click on “Reference a New Symbol” menu item

4. Click on “In Sequence Locals” menu item

E. Enter a name to reference the waveform data

5. Select data type (Waveform)

6. Add description (optional)

7. Click on “OK”

Figure 3-14. Create a Symbol for the “WaveformDataRead” Action

84 Using the DMM and ARB Chapter 3

1. Click on action name to select the “Arb_Dl_Waveform_Data” action

2. Click on “Reference a Symbol” menu item

3. The program automatically selects a symbol. If only one symbol is stored, it selects that symbol. If more than one symbol is stores, you must select the symbol, as shown in steps D to F

4. Click on parameter value to select the parameter

5. Click on the arrow to select the symbol (you can also click on

6. Click on the appropriate symbol name

the three dots to select it, but a different procedure is used)

to select it

Figure 3-15. Reference a Symbol in the “Arb_Dl_Waveform_Data” Action

Using the DMM and ARB 85Chapter 3

Creating a Data File

The data file is an ASCI file that contains waveform data. You can add data manually where each segment data point is a line in the file. You can also use the “WaveformDataWrite” action to store the data into the file. For example, you can use the action to store a waveform read by the E1563A A/D Converter into a file, then download the file to the Arb and output.

Memory

Requirements for

Downloading

Waveforms

Note It it becomes necessary to use the “arbReleaseWaveforms” action, place the

Agilent E6173A

Arbitrary Waveform

Generator Error

Messages

For the Arb to achieve high throughput, it downloads into memory all waveforms to be used in the testplan. A waveform can then be output in any part of the testplan.

The Arbis limited on how many waveforms can be stored, depending on the size of the waveforms. Normally, the Arb has sufficient memory for all the waveforms in a testplan unless the testplans use a very large number of waveforms or several long waveforms. The Arb driver then generates an error; normally an “ E6173A Arbitrary Waveform Generator Error Messages” below).

In case of a memory overflow, the only way for the Arb to receive new waveforms is to remove the current waveforms from memory. To do this, use the “arbReleaseWaveforms” action. This action will then remove all waveforms downloaded for the selected channel.

action both at the beginning of the testplan and at the point where more waveforms need to be added.

The following lists the error numbers in hex and corresponding error messages the Arb can generate. Use the messages to troubleshoot the testplan or Arb, if needed.

Table 3-1. Agilent E6173A Error Codes and Descriptions

Error Number Description

21 Unimplemented function call

22 Timeout waiting for arbStop

23 Illegal segment voltage

24 Segment count too big during download

25 Segment range error (setSegment)

26 Sequence range error (setSequence)

27 Illegal trigger input

28 Not channel 1 or 2

29 Sequence function without a segment fn

2A Segment funct. without a sequence fn

2B Couldn't find specified download ID

2C Sequence count too big during download

Segment count too big during download” error (see “Agilent

86 Using the DMM and ARB Chapter 3

Chapter 4

Action Summary

This chapter summarizes the TestExec SL actions supplied with the Agilent TS-5000 System. The action directory path is:

C:\Program Files\Agilent\TS-5000 System Software\actions

Actions are located in sub-directories and summarized in the following tables:

Sub-Directory Table and Action Type

arb

Table 4-1, “arb (Arbitrary Waveform Generator) Actions”

counter

dac

daq

dgn

digitizer

dio

dmm

dso

eload

esa

esg

event

generic

mcm

msginst

power

serial

Table 4-2, “Counter Actions”

Table 4-3, “dac (D/A Converter) Actions”

Table 4-4, “daq (Digital Acquisition) Actions”

Table 4-5, “dgn (Diagnostic) Actions”

Table 4-6, “digitizer Actions”

Table 4-7, “dio (Digital I/O) Actions”

Table 4-8, “DMM Actions”

Table 4-9, “DSO Actions”

Table 4-10, “Electronic Load Actions”

Table 4-11, “Spectrum Analyzer Actions”

Table 4-12, “Signal Generator Actions”

Table 4-13, “Event Detector Actions”

Table 4-14, “Miscellaneous Actions”

Table 4-15, “Measurement Control Module Actions”

Table 4-16, “msginst Actions”

Table 4-17, “Power Supply Actions”

Table 4-18, “Serial Interface Actions”

SerialProtocols

switch

esa

esg

Table 4-19, “Automotive Serial Protocol Actions”

Table 4-20, “SLU and Switching Actions”

Table 4-21, “Voltage/Current Source Actions”

Table 4-22, “Spectrum Analyzer Actions”

Table 4-23, “Signal Generator Actions”

Note This chapter contains action summaries. The actions are documented in

detail in the TS5000 online help. This help is available from the Help menu in TestExec SL.

Action Summary 87Chapter 4

Table 4-1. arb (Arbitrary Waveform Generator) Actions

Actions Descriptions

AgAwg3352xErrorQuery

AgAwg3352xGetBurstProperties

AgAwg3352xGetOutputProperties

AgAwg3352xOutputArbWaveform

AgAwg3352xOutputStdWaveform

AgAwg3352xPreset This action presets the 33522A/33521A parameter.

AgAwg3352xQueryCmd This action sends a SCPI query command to the instrument.

AgAwg3352xReset This action sends the command string *RST to the instrument.

AgAwg3352xSelfTest

AgAwg3352xSendCmd This action sends a SCPI command to the instrument.

AgAwg3352xSendSoftwareTrigger

AgAwg3352xSetBurstProperties

AgAwg3352xSetOutputEnable

AgAwg3352xSetOutputProperties

AgAwg3352xSetTrigger

Agt33220GetBurstProperties

Agt33220GetOutputProperties

Agt33220MsgReceive

Agt33220MsgSend Sends SCPI commands via the IAgilent33220System interface.

Agt33220MsgSendReceive

Agt33220OutputArbWaveform

agt33220OutputWaveform High level action to generate a basic waveform.

Agt33220PutBurstProperties Sets the values of the IAgilent33220Burst interface properties.

Agt33220SetOutputProperties Sets the values of the IAgilent33220Output interface properties.

Agt33220SetTrigger Sets up the trigger source.

Agt33220SoftTrigger This action will trigger the 33220.

Queries the instrument and returns instrument specific error information.

This action gets the burst properties in the 33522A/33521A arbitrary waveform generator.

This action gets the output properties in the 33522A/33521A arbitrary waveform generator.

This action sets up, downloads and enables an arbitrary waveform at the output of 33522A/33521A.

This action generates a basic waveform and enables the waveform at the output of 33522A/33521A.

This action sets the instrument to run self test, waits for test completion, and queries the results.

This action sends a software trigger to the instrument to trigger a sweep or burst from the remote interface only if the bus (software) trigger source is currently selected.

This action sets the burst properties of the 33522A/33521A arbitrary waveform generator.

This action configures whether the signal the 33522A/33521A produces appears at the front-panel output connector for the selected channel.

This action sets the output properties in the 33522A/33521A arbitrary waveform generator.

This action configures the trigger source and slope of the 33522A/33521A arbitrary waveform generator.

Returns the values of the IAgilent33220Burst interface properties.

Returns the values of the IAgilent33220Output interface properties.

Receives SCPI commands via the IAgilent33220System interface.

88 Action Summary Chapter 4

Table 4-1. arb (Arbitrary Waveform Generator) Actions (continued)

Actions Descriptions

Arb_Download_Deluxe

High-Level Action: Not recommended for use in new testplans (Use "Arb_Dl_Ext_Waveform" or "Arb_Dl_Custom_Waveform"). Downloads a sine, square, or triangle waveform of specified frequency, amplitude, offset and phase to the Agilent E6173 Arb. For backwards compatibility, waveforms are numbered and must start at 0. Use "Arb_Select_Waveform" or "Arb_Select_Synced_Waveform" with this routine.

Usage:

1. Call "arbConfTrigIn" to select trigger if syncing multiple cards.

2. Call "arbConfOutControls" to select the Arb output controls.

3. Call "arbSet" action to make output control changes take effect.

4. Call this action as many times as necessary to download the data. Be sure to increment the "waveform_nr" parameter by "1" for each download, starting with number "0".

5. Call "arbInitiate" to start waveform generation.

6. Call "Arb_Select_Waveform" to output the waveform as set by "waveform_nr".

Notes:

1. Do all downloads for a given channel before switching to another Arb channel.

2. "waveform_nr" MUST start with 0 and increment by 1 until done; the waveforms are selected by this number.

3. The last waveform downloaded will be the one that is started when calling "arbInitiate". After that, waveforms can be selected on the fly using the number in the "waveform_nr" parameter.

4. Do not mix Arb_Download_Deluxe with "arbSetSegment" or "arbSetSequence" Action unless they program different Arb channels.

5. To use channel 2, change the "arb" parameter to "@hwconfig.arb2".

Action Summary 89Chapter 4

Table 4-1. arb (Arbitrary Waveform Generator) Actions (continued)

Actions Descriptions

High-Level Action: Not recommended for use in new testplans

(use "Arb_Dl_Std_Waveform" or "Arb_Dl_Ext_Waveform"). Downloads a sine, square, triangle, knock, or crank waveform of specified frequency, amplitude, and offset to the Agilent E6173 Arbitrary Waveform Generator (Arb). Also allows duty cycle for pulse trains. For a DC level, set frequency to 0 Hz. For backwards compatibility, waveforms are numbered and must start at 0.

Usage:

1. Call "arbConfOutControls" to select the Arb output controls.

2. Call "arbSet" action to make output control changes take

3. Call this action as many times as necessary to download the

4. Call "Arb_Disable_Download" to disable the downloading of

Arb_Download

arbSetClkAdjust

arbConfWaveform arb

5. Call "arbInitiate" to start waveform generation.

6. Call "Arb_Select_Waveform" or

Notes:

1. Do all downloads for a given channel before switching to

2. "waveform_nr" MUST start with 0 and increment by 1 until

3. The last waveform downloaded will be the one that is started

4. Do not mix Arb_Download with "arbSetSegment" or

5. To use channel 2, change the "arb" parameter to

Low-Level Action: Change a channel's clock timing on the fly.

Notes:

1. Action is channel independent. Clock timing changes

2. To use channel 2, change the "arb" parameter to

effect.

data. Be sure to increment the "waveform_nr" parameter by "1" for each download, starting with number "0".

data.

"Arb_Select_Synced_Waveforms" to output the waveform as set by "waveform_nr".

another Arb channel.

done; the waveforms are selected by this number.

when calling "arbInitiate". After that, waveforms can be selected on the fly using the number in the "waveform_nr" parameter.

"arbSetSequence" Action unless they program different Arb channels.

"@hwconfig.arb2".

immediately. It is not synchronized to any point on the waveform. Clock Adjust is always overwritten during any of the waveform select actions.

"@hwconfig.arb2".

90 Action Summary Chapter 4

Table 4-1. arb (Arbitrary Waveform Generator) Actions (continued)

Actions Descriptions

Arb_Disable_Download

Arb_Dl_Custom_Waveform

High-Level Action: Not recommended for use in new testplans. Disables the "Arb_Download", "Arb_Download_Waveform" and "Arb_Download_Deluxe" actions. Use this action after all the "Arb_Download_xxx" actions in a testplan to avoid download overhead to the Agilent E6173 Arb on later testplan executions. Downloads are automatically re-enabled when a testplan is loaded or edited.

Usage:

1. Call the "Arb_Download" Action to download the waveform.

2. Call this action to disable the download.

Notes:

Any download actions encountered in the testplan after this action executes are ignored.

High-Level Action: Downloads a custom, user defined waveform consisting of up to 10 sequences with 50 segments per sequence to the Agilent E6173 Arb. Use "Arb_Select_Wave_By_Name" or "Arb_Select_Synced_Waves_By_Name" with this routine.

Usage:

1. Call "arbConfTrigIn" to select trigger if syncing multiple cards.

2. Call "arbConfOutControls" to select the Arb output controls.

3. Call "arbSet" action to make output control changes take effect.

4. Call this action as many times as necessary to download the data. Be sure "waveform_name" parameter is unique for each download.

5. Call "arbInitiate" to start waveform generation.

6. Call "Arb_Select_Wave_By_Name" to output the waveform as set by "waveform_name".

Notes:

1. The last waveform downloaded will be the one that is started when calling "arbInitiate". After that, waveforms can be selected on the fly using the name in the "waveform_name" parameter.

2. Do not mix this action with "arbSetSegment" or "arbSetSequence" Action unless they program different Arb channels.

3. To use channel 2, change the "arb" parameter to "@hwconfig.arb2".

Action Summary 91Chapter 4

Table 4-1. arb (Arbitrary Waveform Generator) Actions (continued)

Actions Descriptions

Arb_Dl_Waveform_Data

High-Level Action: Downloads a waveform data type to the Agilent E6173 Arbitrary Waveform Generator (Arb). Waveform sample data is downloaded as segments with sample_time = (Stop-Start)/Sample_count, where Stop and Start are the waveform times and Sample_count is the number of samples in the waveform. Waveforms should be given a unique and descriptive name.

Usage:

1. Call "arbConfOutControls" to select the Arb output controls.

2. Call "arbSet" to transfer configuration settings to the arb hardware.

3. Call this action or the other "Arb_Dl_xxx" Action as many times as needed to download custom or standard waveforms.

4. Call "Arb_Initiate" to start waveform generation.

5. Call "'Arb_Select_Wave_By_Name" or "Arb_Select_Synced_Waves_By_Name" to switch between waveforms.

a. If Periodic = 1, the waveform will be generated as a

continuos periodic waveform.

b. If Periodic = 0, Repeat is used as a count of how many times

to repeat the waveform.

c. Marker sets the sample index for an arb marker signal for

triggering (use arbConfTrigOut to configure).

d. If Marker = -1, no marker is set. (Sample index starts with 0.)

Notes:

This action cannot be used with "arbSetSegement" or "arbSetSequence" on the same arb channel.

92 Action Summary Chapter 4

Table 4-1. arb (Arbitrary Waveform Generator) Actions (continued)

Actions Descriptions

Arb_Dl_Ext_Waveform

Arb_Dl_Swept_Sine

High-Level Action: Downloads a sine, square, or triangle waveform of specified frequency, amplitude, offset and phase (with optional burst modulation) to the Agilent E6173 Arb. Use "Arb_Select_Wave_By_Name" or "Arb_Select_Synced_Waves_By_Name" with this routine.

Usage:

1. Call "arbConfTrigIn" to select trigger if syncing multiple cards.

2. Call "arbConfOutControls" to select the Arb output controls.

3. Call "arbSet" action to make output control changes take effect.

4. Call this action as many times as necessary to download the data. Be sure "waveform_name" parameter is unique for each download.

5. Call "arbInitiate" to start waveform generation.

6. Call "Arb_Select_Wave_By_Name" to output the waveform as set by "waveform_name".

Notes:

1. The last waveform downloaded will be the one that is started when calling "arbInitiate". After that, waveforms can be selected on the fly using the name in the "waveform_name" parameter.

2. Do not mix this action with "arbSetSegment" or "arbSetSequence" actions unless they program different Arb channels.

3. To use channel 2, change the "arb" parameter to "@hwconfig.arb2".

High-Level Action: Downloads a basic swept sine waveform of specified frequency, amplitude, and offset to the Agilent E6173 Arbitrary Waveform Generator (Arb).

Usage:

1. Call "arbConfOutControls" to set the state of the Arb output amplifier parameters for this channel.

2. Call "arbSet" to transfer configuration settings to the arb hardware.

3. Call this action as many times as necessary to download the data. Be sure the "waveform_name" parameter is unique.

4. Call "arbInitiate" to start waveform generation.

5. Call "Arb_Select_Wave_By_Name" or "Arb_Select_Synced_Waves_By_Name" to output the waveform as set by "waveform_name".

Notes:

1. The last waveform downloaded will be the one that is started when calling "arbInitiate". After that, waveforms can be selected on the fly using the name in the "waveform_name" parameter.

2. Do not mix Arb_Dl_xxx actions with "arbSetSegment" or "arbSetSequence" actions unless they program different Arb channels.

3. To use channel 2, change the "arb" parameter to "@hwconfig.arb2".

Action Summary 93Chapter 4

Table 4-1. arb (Arbitrary Waveform Generator) Actions (continued)

Actions Descriptions

Arb_Dl_Swept_Sine_Ex

High-Level Action: Downloads a swept sine waveform of specified frequency, amplitude, and offset to the Agilent E6173 Arbitrary Waveform Generator (Arb). Allows adjustment of advanced parameters such as reverse sweep time and F_end hold time.

Usage:

1. Call "arbConfOutControls" to set the state of the Arb output amplifier parameters for this channel.

2. Call "arbSet" to transfer configuration settings to the arb hardware.

3. Call this action as many times as necessary to download the data. Be sure the "waveform_name" parameter is unique.

4. Call "arbInitiate" to start waveform generation.

5. Call "Arb_Select_Wave_By_Name" or "Arb_Select_Synced_Waves_By_Name" to output the waveform as set by "waveform_name".

Notes:

1. The last waveform downloaded will be the one that is started when calling "arbInitiate". After that, waveforms can be selected on the fly using the name in the "waveform_name" parameter.

2. Do not mix Arb_Dl_xxx actions with "arbSetSegment" or "arbSetSequence" actions unless they program different Arb channels.

3. To use channel 2, change the "arb" parameter to "@hwconfig.arb2".

94 Action Summary Chapter 4

Table 4-1. arb (Arbitrary Waveform Generator) Actions (continued)

Actions Descriptions

Arb_Dl_Std_Waveform

High-Level Action: Downloads a sine, square/pulse or triangle waveform of specified frequency, amplitude, and offset to the Agilent E6173 Arbitrary Waveform Generator (Arb). Also allows duty cycle adjustment for pulse trains.

Usage:

1. Call "arbConfOutControls" to set the state of the Arb output amplifier parameters for this channel.

2. Call "arbSet" to transfer configuration settings to the arb hardware.

3. Call this action as many times as necessary to download the data. Be sure the "waveform_name" parameter is unique.

4. Call "arbInitiate" to start waveform generation.

5. Call "Arb_Select_Wave_By_Name" or "Arb_Select_Synced_Waves_By_Name" to output the waveform as set by "waveform_name".

Notes:

1. For a DC level, set frequency to 0 Hz.

2. The last waveform downloaded will be the one that is started when calling "arbInitiate". After that, waveforms can be selected on the fly using the name in the "waveform_name" parameter.

3. Do not mix Arb_Dl_xxx actions with "arbSetSegment" or "arbSetSequence" actions unless they program different Arb channels.

4. To use channel 2, change the "arb" parameter to "@hwconfig.arb2".

5. This action uses the same waveform generation algorithm as "Arb_Download" did.

Action Summary 95Chapter 4

Table 4-1. arb (Arbitrary Waveform Generator) Actions (continued)

Actions Descriptions

High-Level Action: Not recommended for use in new testplans

(use "Arb_Dl_Waveform_Data"). Downloads a waveform data type to the Agilent E6173 Arbitrary Waveform Generator (Arb). Waveform sample data is downloaded as segments with sample_time = (Stop-Start)/Sample_count, where Stop and Start are the waveform times and Sample_count is the number of samples in the waveform. For backwards compatibility, waveforms are numbered and must start at 0.

Usage:

1. Call "arbConfOutControls" to select the Arb output controls.

2. Call "arbSet" action to make output control changes take effect.

3. Call this action or the "Arb_Download" Action as many times as needed to download custom or standard waveforms.

Arb_Download_Waveform

Arb_Enable_Download

Arb_DL_Datafile High-Level Action: Creates a waveform from a data file.

arbInitiate

4. Call "Arb_Initiate" to start waveform generation.

5. Call "'Arb_Select_Waveform" or "Arb_Select_Synced_Waveform" to switch between waveforms.(selected by waveform number).

a. If Periodic = 1, the waveform will be generated as a

continuos periodic waveform.

b. If Periodic = 0, Repeat is used as a count of how many times

to repeat the waveform.

c. Marker sets the sample index for an arb marker signal for

triggering (use arbConfTrigOut to configure).

d. If Marker = -1, no marker is set (Sample index starts with 0).

Notes:

This action cannot be used with "arbSetSegement" or "arbSetSequence" on the same arb channel.

High-Level Action: Not recommended for use in new testplans. Enables the "Arb_Download" Action. Use it to re-enable the "Arb_Download" Action to download data to the Agilent E6173 Arb. This action is not commonly used during normal testplan execution. Downloads are automatically enabled when a testplan is loaded or edited.

HP TS-5000 schematic

Specifications and Main Features

Frequently Asked Questions

User Manual

Safety Summary

General

Cleaning Instructions

Environmental Conditions

Before applying power

Ground the System

Fuses

Operator Safety Information

Safety Symbols and Regulatory Markings

Tab l e 1 Safety Symbols and Markings

Tab l e 2 Regulatory Symbols Markings

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Contents

Agilent TestExec SL

Testplans

Test

Testgroup

Switching Action

Action

Figure 1-1. Typical Testplan Components

List of Statements Test or flow control statements executed in the order shown.

Actions

System.ust File

Aliases These are alternate names for reference nodes. The names are descriptive in

Wires These are names for wires that connect to or between nodes. In some cases,

Modules These are the names of the instruments in the system. For example, the name

Figure 1-2. Typical Aliases

Figure 1-3. Typical Wires

Figure 1-4. Typical Modules/Instruments

System Configuration Editor

Chapter Contents

Required Computer Hardware and Software

System Software Description

Selecting Agilent TestExec SL

Loading a Testplan

Figure 2-1. Agilent TestExec SL Main Screen and File Open Box

Creating a Testplan

Figure 2-2. Creating a Testplan

Using TS-5000 Supplied Actions

High-Level Actions These are actions that usually perform complete tests, such as setting up a

Low-Level Actions These actions perform specific configuration or measurement function on a

Example Testplans Example testplans to show how to use the actions are in the following

1. Open Agilent TestExec SL using the procedure in “Selecting Agilent TestExe c SL” on page 17.

2. Either create a new or open an old testplan, using the procedure in “Loading a Testplan” on page 17 or “Creating a Testplan” on page 18, respectively.

3. If using a new testplan, do the procedure in Figure 2-2 on page 18 to add a test. If using an old testplan, select the test into which you wish to add an action and continue with step 4.

Figure 2-3. Adding an Action

Figure 2-4. Adding a Switching Action

Using Software Debug Features

Looping The loop constructs are FOR / NEXT sequencer statements. For example, a

Figure 2-5. Selecting Looping and Other Statements

Single Stepping Agilent TestExec SL adds the ability to single step the execution of the

Figure 2-6. Selecting Action Stepping

Watch Window Watch windows provide the ability to select ‘objects’ to dynamically

Figure 2-7. Watch Window Menu Selections

Figure 2-8. Selecting an Instrument to be Watched

Debug Panel Types The following debug panels are supplied with the system, dependent on the

Debug Panel Features All of the debug panels provide the following features:

Figure 2-10. Debug Front Panel Selection

Figure 2-11. Select an Instrument from the Debug Front Panel Selection

Figure 2-12. Agilent E1411 DMM Debug Front Panel (showing Path Selection)

System Interface

Figure 2-13. Agilent E1328A and E1418A DAC Debug Front Panel

System Interface

Agilent E1333A Counter Agilent E1333 Counter Debug Front Panel shows the dialog box for Agilent

Figure 2-14. Agilent E1333 Counter Debug Front Panel

System Interface

Figure 2-15. VXI Technology E1563A Digitizer Debug Front Panel

System Interface

Figure 2-16. Agilent E6171B Measurement Control Module Debug Front Panel

System Interface

Figure 2-17. Agilent E6174A Event Detector Debug Front Panel

System Interface

Figure 2-18. Agilent E6198A Switch/Load Unit Debug Front Panel